CN212255563U

CN212255563U - Parallel module dipulse current-sharing test system

Info

Publication number: CN212255563U
Application number: CN202020560806.7U
Authority: CN
Inventors: 李经纬; 郭长东; 张宝生; 刘�东; 张永红
Original assignee: Shanghai Sigriner Step Electric Co Ltd
Current assignee: Shanghai Sigriner Step Electric Co Ltd
Priority date: 2020-04-15
Filing date: 2020-04-15
Publication date: 2020-12-29
Anticipated expiration: 2030-04-15

Abstract

The utility model relates to a test system discloses a test system that parallelly connected module dipulse flow equalized. The utility model discloses in, the test system that parallelly connected module dipulse flow equalized contains: the high-capacity power supply, the bus capacitor unit, the main power supply board, the driving board card, the control board card and the oscilloscope are arranged; the high-capacity power supply is used for supplying power to the whole test system, and also has the function of limiting the current and the voltage, the high-capacity power supply is a direct-current power supply, the bus capacitor unit is composed of a charging resistor, an assembly busbar and a power indicator lamp, and the driving board card is composed of a DCDC (direct current DC) and a module driving circuit. Compared with the prior art, the utility model discloses a parallelly connected scheme of cooperation module increases a short circuit inductance, and this inductance can effectively reduce the test error about the problem of flow equalizing of the module that brings in the parallel test, has improved the reliability of test.

Description

Parallel module dipulse current-sharing test system

Technical Field

The utility model relates to a test system, in particular to test system that parallelly connected module dipulse flow equalized.

Background

The test system of the IGBT (Insulated Gate Bipolar Transistor) module includes a single module test system and a parallel module test system, but the inventor finds that the single module test system has low test efficiency, and the parallel module test system has higher test efficiency than the single module test system, but has a phenomenon of non-uniform current. For example, patent document (CN208125878U) discloses a double-pulse test platform, comprising: the device comprises a detection module, a detection module and a control module, wherein the detection module comprises an element test circuit and a pulse test circuit, the element test circuit and the pulse test circuit are respectively connected with an element to be tested, the element test circuit is used for performing failure test on the element to be tested, and the pulse test circuit is used for performing double-pulse test on the element to be tested; the driving module is connected with the element to be tested and provides a double-pulse test signal for the element to be tested; the signal output end of the control module is respectively in communication connection with the element test circuit, the pulse test circuit and the driving module; the signal input end of the control module is connected with the element to be tested so as to obtain the test result of the element to be tested. Above-mentioned utility model's dipulse test platform can solve among the prior art because the test element that awaits measuring became invalid, leads to the problem that dipulse test platform damaged, but the problem that does not flow equalize appears easily in the in-process of test, causes the test to appear the error.

SUMMERY OF THE UTILITY MODEL

An object of the utility model is to provide a test system that parallelly connected module dipulse flow equalized, through increasing a short circuit inductance, and guarantee the isometric isoparametric of inductance, this inductance can effectively reduce the test error of the module about the problem of flow equalizing brought in the parallel test, has improved the reliability of test.

In order to solve the above technical problem, the utility model discloses an embodiment provides a test system that parallelly connected module dipulse flow equalized, test system contains: the high-capacity power supply, the bus capacitor unit, the main power supply board, the driving board card, the control board card and the oscilloscope are arranged;

the high-capacity power supply is a direct-current power supply and is used for supplying power to the whole test system and performing a current-limiting function;

the bus capacitor unit comprises a charging resistor, an assembly bus and a power indicator light;

the drive board card comprises a DCDC and a module drive circuit, wherein the module drive circuit is composed of a power supply U, an inductor L, a Rogowski coil, an upper bridge arm, a lower bridge arm and a plurality of IGBTs, and the power supply U, the Rogowski coil and the plurality of IGBTs are connected in series to form a loop.

In addition, the charging resistor is used for playing a current limiting role and preventing the bus from being charged too fast to cause hidden dangers in a system or safety.

In addition, the assembled busbar is used for being matched with different parallel modules for testing.

In addition, the power indicator light is used for indicating the residual voltage on the assembled busbar after the whole system is turned off.

In addition, the main power board is used for supplying power to the driving board card and the control board card, respectively provides a 5V power supply for the control board card, and provides a +/-15V power supply for the driving board.

In addition, the oscilloscope is used for converting signals Vce, Ic and Vge into images.

In addition, the inductor L, the upper and lower bridge arms and the IGBT are connected with the other upper and lower bridge arms in parallel.

In addition, the bus capacitor unit, the main power panel, the driving board card, the control board card and the oscilloscope are all electrically connected with the high-capacity power supply.

In addition, the control board card sends a pulse signal for driving the board card, and the duty ratio and the pulse number of the pulse are adjusted.

In addition, the inductance L in the test system is equal in length and the like.

The utility model has the advantages that:

by adding the short-circuit inductor and ensuring equal-length isoparametric parameters of the inductor, the inductor can effectively reduce the test error of the module about the current sharing problem brought in the parallel test, and the test reliability is improved.

Drawings

FIG. 1 is a block diagram of a test system of the present invention;

fig. 2 is a circuit diagram of a module driving circuit according to the present invention;

fig. 3 is a waveform diagram of the middle test system of the present invention.

Detailed Description

In order to make the objects, technical solutions and advantages of the present invention clearer, the following will explain in detail each embodiment of the present invention with reference to the accompanying drawings. However, it will be appreciated by those of ordinary skill in the art that in various embodiments of the invention, numerous technical details are set forth in order to provide a better understanding of the present application. However, the technical solutions claimed in the claims of the present application can be implemented without these technical details and with various changes and modifications based on the following embodiments.

The utility model provides a test system that parallelly connected module dipulse flow equalized. As shown in fig. 1 and fig. 2, the parallel module dual-pulse current sharing test system includes: the high-capacity power supply, the bus capacitor unit, the main power supply board, the driving board card, the control board card and the oscilloscope are arranged;

the driving board card comprises a DCDC and a module driving circuit, wherein the module driving circuit consists of a power supply U, an inductor L, a Rogowski coil, an upper bridge arm, a lower bridge arm, two diodes and two IGBTs, and the power supply U, the Rogowski coil and the two IGBTs are connected in series to form a loop.

Furthermore, the charging resistor is used for playing a current limiting role and preventing the bus from being charged too fast to cause hidden dangers in a system or safety.

Further, the assembled busbar is used for matching different parallel modules for testing.

Further, the power indicator light is used for indicating the residual voltage on the assembled busbar after the whole system is turned off.

Furthermore, the main power panel is used for supplying power to the driving board card and the control board card, and respectively provides a 5V power supply for the control board card and a +/-15V power supply for the driving board.

Further, the oscilloscope is used for converting the signals Vce, Ic and Vge into images.

Furthermore, the inductor L, the upper bridge arm, the lower bridge arm and the IGBT are connected with the other upper bridge arm and the other lower bridge arm in parallel, and the voltage of the upper bridge arm and the lower bridge arm in the parallel circuit is measured by a high-voltage isolation probe to obtain V_ceVoltage, the voltage of the IGBT of the parallel line is measured V by a common probe_geA voltage.

Furthermore, the bus capacitor unit, the main power board, the driving board, the control board and the oscilloscope are all electrically connected with the high-capacity power supply.

Further, the control board sends a pulse signal to the driving board, and the duty ratio and the pulse number of the pulse are adjusted.

Further, the inductance L in the test system is equal in length and equal in parameter.

The experimental principle process of the parallel module double-pulse current-sharing test system is as follows:

as shown in fig. 3, at time t0, the diode emits the first pulse, the IGBT to be tested is turned on in saturation, the power source U is applied to the load inductor L, the current of the inductor L rises linearly, and the current expression is: at time t1, the value of the inductor current is determined by the power supply U and the inductor L, when both the power supply U and the inductor L are determined, the value of the current is determined by t1, and the longer the time, the larger the current; the value of the current can be set autonomously; at the time t1, the IGBT to be tested is turned off, the current of the inductor L flows continuously through the upper tube diode, the current is slowly attenuated, and the current probe is placed at the emitter of the lower tube diode, so that when the diode flows continuously, the IGBT is turned off, and the current cannot be seen on the oscilloscope; at the time t2, the rising edge of the third pulse arrives, the IGBT to be detected is conducted again, the freewheeling diode enters reverse recovery, the reverse recovery current can pass through the IGBT, and the current can be captured on the current probe; at the time t2, the key point is to observe the turn-on process of the IGBT; the reverse recovery current, the form of which directly affects many important indicators of the commutation process; at the time t3, the IGBT to be tested is turned off again, the current is large at the time, a fixed voltage spike can be generated due to the existence of the stray inductance of the bus, and the key point is to observe the turn-off process of the IGBT at the time t 3; voltage spikes are important monitoring objects.

It will be understood by those skilled in the art that the foregoing embodiments are specific examples of the invention, and that various changes in form and details may be made therein without departing from the spirit and scope of the invention in its practical application.

Claims

1. A parallel module dipulse current sharing test system, comprising: the high-capacity power supply, the bus capacitor unit, the main power supply board, the driving board card, the control board card and the oscilloscope are arranged;

2. The parallel module dipulse current sharing test system of claim 1, wherein said charging resistor is configured to limit a charging current of said bus capacitor unit.

3. The parallel module dipulse current sharing test system of claim 1, wherein said assembled busbar is adapted to cooperate with different parallel modules for testing.

4. The parallel module dipulse current sharing test system of claim 1, wherein the power indicator light is configured to indicate a remaining voltage on the assembled busbar after the test system is turned off.

5. The parallel module dipulse current sharing test system of claim 1, wherein the main power board is used for supplying power to the drive board and the control board, respectively providing 5V power to the control board and ± 15V power to the drive board.

6. The system according to claim 1, wherein the oscilloscope is configured to convert signals Vce, Ic, and Vge into images.

7. The parallel module dipulse current sharing test system of claim 1, wherein the inductor L, the upper and lower bridge arms, and the IGBT are connected in parallel with the other upper and lower bridge arms.

8. The parallel module dipulse current sharing test system of claim 1, wherein the bus capacitor unit, the main power board, the driver board, the control board, and the oscilloscope are all electrically connected to a high capacity power supply.

9. The parallel module double-pulse current sharing test system according to claim 1, wherein the control board sends a pulse signal to the driving board to adjust a duty ratio and a pulse number of the pulse.

10. The parallel module dipulse current sharing test system of claim 1, wherein the inductances L in said test system are of equal length and equal parameters.