CN110456201B - Power cycle acceleration test device of MMC sub-module and control method thereof - Google Patents
Power cycle acceleration test device of MMC sub-module and control method thereof Download PDFInfo
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Abstract
The invention discloses a power cycle acceleration test device of an MMC sub-module and a control method thereof, wherein the power cycle acceleration test device comprises a tested unit, an accompanying test unit, a reactance unit, a first detection unit, a second detection unit, a signal generation unit and a comparison unit; the tested unit is electrically connected to two ends of the test assisting unit in parallel; the first end of the reactance unit is connected with the first end of the tested unit, and the second end of the reactance unit is connected with the first end of the test assisting unit; the first detection unit and the second detection unit are electrically connected with the tested unit; the first end of the signal generating unit is connected with the second end of the tested unit, and the second end of the signal generating unit is connected with the first end of the comparing unit; the second end of the comparison unit is connected with the third end of the reactance unit, the third end of the comparison unit is connected with the second end of the test accompanying unit, and the structure can effectively solve the problem that the test result consistent with the aging characteristic of the sub-module under the actual working condition cannot be obtained only by testing and researching a single IGBT in the prior art.
Description
Technical Field
The invention relates to the technical field of power transmission and distribution, in particular to a power cycle acceleration test device of an MMC sub-module and a control method thereof.
Background
The power sub-module is the minimum energy storage and function unit of the modular multilevel converter system, the aging degree of the sub-module directly represents the operation health state of the modular multilevel converter system, and the reliable operation of the sub-module is the basis for ensuring the operation reliability of the high-power electronic converter system. From the operation condition of the flexible direct current transmission project which is put into operation at present, due to the lack of a fault prediction and diagnosis mechanism aiming at the sub-modules, the guarantee work of the project operation reliability is in a passive and unfavorable position.
At present, documents show that foreign scholars monitor the change of parameters such as threshold voltage, on-state saturation voltage drop, crusting thermal resistance and the like of the IGBT through an accelerated aging test, and perform statistical analysis on test data so as to evaluate the residual life of the IGBT and predict the time of fault occurrence. Discrete device of semiconductor device part 9: insulated Gate Bipolar Transistors (IGBTs) have been described and specified for IGBT durability and reliability tests and test methods therefor. The test and research of a single IGBT device are focused on, besides the IGBT, the MMC sub-module also comprises various devices such as a capacitor, a diode, an energy-taking power supply and a control board card, the working modes and the spatial arrangement of different devices can influence the current and voltage distribution and the heat dissipation characteristic in the sub-module and the pressure distribution among contact surfaces, and therefore, the test and research of only the single IGBT cannot obtain the test result consistent with the aging characteristic of the sub-module under the actual working condition.
Disclosure of Invention
The embodiment of the invention provides a power cycle acceleration test device of an MMC sub-module and a control method thereof, which can effectively solve the problem that a test result consistent with the aging characteristic of the sub-module under the actual working condition cannot be obtained due to the fact that only a single IGBT is tested and researched in the prior art.
The embodiment of the invention provides a power cycle acceleration test device of an MMC sub-module, which comprises a tested unit, an accompanying test unit, a reactance unit, a first detection unit, a second detection unit, a signal generation unit and a comparison unit, wherein the tested unit is connected with the accompanying test unit through a power supply;
the unit under test comprises a first IGBT and a second IGBT; the test accompanying unit comprises a third IGBT and a fourth IGBT;
the tested unit is electrically connected to two ends of the test accompanying unit in parallel; a first end of the reactance unit is connected with a connection point between the first IGBT and the second IGBT, and a second end of the reactance unit is connected with a connection point between the third IGBT and the fourth IGBT; the first detection unit and the second detection unit are electrically connected with the tested unit; the first end of the signal generating unit is connected with the input end of the tested unit, and the second end of the signal generating unit is connected with the first end of the comparing unit; the second end of the comparison unit is connected with the second end of the reactance unit, and the third end of the comparison unit is connected with the input end of the test assistant unit.
As an improvement of the above scheme, the unit under test comprises a first capacitor, a first IGBT, a first diode, a second IGBT and a second diode;
the first IGBT is connected with the first diode in an inverse parallel mode, and the second IGBT is connected with the second diode in an inverse parallel mode; the first capacitor is connected in parallel to two ends of the first IGBT and the second IGBT which are connected in series;
the first detection unit is connected in parallel to two ends of the first IGBT, and the second detection unit is connected in parallel to two ends of the second IGBT;
the emitter of the first IGBT and the collector of the second IGBT are both connected with the connection point between the first IGBT and the second IGBT;
and the gate pole of the first IGBT and the gate pole of the second IGBT are both connected with the input end of the tested unit.
As an improvement of the above scheme, the test assisting unit comprises a second capacitor, a third IGBT, a third diode, a fourth IGBT and a fourth diode;
the third IGBT is connected with the third diode in an inverse parallel mode, and the fourth IGBT is connected with the fourth diode in an inverse parallel mode; the second capacitor is connected in parallel to two ends of the third IGBT and the fourth IGBT which are connected in series;
an emitter of the third IGBT and a collector of the fourth IGBT are both connected with a connection point between the third IGBT and the fourth IGBT;
and the gate pole of the third IGBT and the gate pole of the fourth IGBT are both connected with the input end of the accompanying test unit.
As an improvement of the above scheme, the device further comprises an energy supplementing power supply;
the energy supplementing power supply is connected to two ends of the tested unit and the accompanying unit in parallel.
As an improvement of the scheme, the energy supplementing power supply is provided with a current output end used for being connected with the tested unit and the test assisting unit, and a current input end used for being connected with an alternating current three-phase incoming line;
the energy supplementing power supply also comprises a rectifying module and a transformer; one end of the rectifying module is connected with the current output end, and the other end of the rectifying module is connected with the first end of the transformer; the second end of the transformer is connected with the current input end.
As an improvement of the above scheme, the first detection unit and the second detection unit comprise a water-cooling heat dissipation system;
the first detection unit and the second detection unit further comprise one or more of a shell temperature detection unit, a device tube voltage drop detection unit and a dynamic parameter detection unit.
As an improvement of the above scheme, the device further comprises a current transformer;
the reactance unit is connected with the comparison unit through the current transformer.
Another embodiment of the present invention correspondingly provides a power cycle acceleration control method for an MMC sub-module, which is applicable to any one of the power cycle acceleration test apparatuses for an MMC sub-module described above, and the method specifically includes:
adjusting the current load of the unit to be tested through the signal generating unit; wherein the current load is a sine half-wave current;
comparing the acquired current load value of the signal generation unit with the feedback current value of the reactance unit through a comparison unit, and triggering an auxiliary test unit according to a comparison result so as to enable the MMC sub-module to perform a power aging test at a preset aging rate;
and obtaining a test result through the first detection unit and the second detection unit, and obtaining the aging characteristic of the sub-module at the preset aging rate according to the test result.
As an improvement of the above scheme, the comparing unit compares the collected current load value of the signal generating unit with the feedback current value of the reactance unit, and triggers the test assisting unit according to the comparison result, so that the MMC submodule performs a power aging test at a preset aging rate, specifically including:
when the current load of the tested unit is sinusoidal positive half-cycle current, the first IGBT is switched on, the second IGBT is switched off, the difference value between the current load value corresponding to the sinusoidal positive half-cycle current and the feedback current value is calculated, and the difference value is compared with a preset deviation threshold value; wherein the deviation threshold comprises a positive deviation threshold and a negative deviation threshold;
when the difference value is larger than the positive deviation threshold value, the comparison unit outputs a first trigger signal and sends the first trigger signal to an accompanying unit, so that a third IGBT of the accompanying unit is turned off, and a fourth IGBT of the accompanying unit is turned on;
when the difference value is smaller than the negative deviation threshold value, the comparison unit outputs a second trigger signal and sends the second trigger signal to the test assisting unit, so that the third IGBT of the test assisting unit is turned on, and the fourth IGBT is turned off.
As an improvement of the above, the method further comprises:
and adjusting the amplitude and the period of the current load, and adjusting the size of the deviation threshold value in the reactance unit and the comparison unit, so that the MMC sub-module performs power aging tests at different preset aging rates.
Compared with the prior art, the power cycle acceleration test device of the MMC sub-module and the control method thereof disclosed by the embodiment of the invention comprise a tested unit, an accompanying test unit, a reactance unit, a first detection unit, a second detection unit, a signal generation unit and a comparison unit, wherein the tested unit is electrically connected with two ends of the accompanying test unit in parallel, the first end of the reactance unit is connected with a connection point between the first IGBT and the second IGBT, the second end of the reactance unit is connected with the input end of the accompanying test unit, the first detection unit and the second detection unit are electrically connected with the tested unit, the first end of the signal generation unit is connected with the input end of the tested unit, the second end of the signal generation unit is connected with the first end of the comparison unit, the second end of the comparison unit is connected with the second end of the reactance unit, the third end of the comparison unit is connected with the input end of the test accompanying unit, the structure is adopted, the current load of the tested unit can be adjusted through the signal generating unit, the comparison unit is used for comparing the collected current load value of the signal generating unit with the feedback current value of the reactance unit, the test accompanying unit is triggered according to the comparison result, so that the MMC sub-module is subjected to power aging test at a preset aging rate, the test result is obtained through the first detection unit and the second detection unit, the sub-module aging characteristic at the preset aging rate is obtained according to the test result, and the problem that the test result consistent with the aging sub-module characteristic under the actual working condition cannot be obtained due to the fact that the test and research are carried out only on a single IGBT in the prior art is effectively solved, the power cycle acceleration test device and the control method thereof which take the sub-modules as experimental objects can be provided, so that the operation reliability of the modular multilevel converter system can be ensured.
Drawings
Fig. 1 is a schematic structural diagram of a power cycle acceleration test apparatus of an MMC sub-module according to an embodiment of the present invention;
fig. 2 is a schematic flowchart of a power cycle acceleration control method for an MMC sub-module according to a second embodiment of the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Example one
Referring to fig. 1, which is a schematic structural diagram of a power cycle acceleration test apparatus of an MMC sub-module according to an embodiment of the present invention, the power cycle acceleration test apparatus of the MMC sub-module includes a unit under test 11, an accompanying test unit 12, a reactance unit 13, a first detection unit 14, a second detection unit 15, a signal generation unit 16, and a comparison unit 17;
the unit under test 11 is electrically connected in parallel at two ends of the unit under test 12; a first end of the reactance unit 13 is connected with a first end of the tested unit 11, and a second end of the reactance unit 13 is connected with a first end of the test assisting unit 12; the first detection unit 14 and the second detection unit 15 are both electrically connected with the unit under test 11; a first end of the signal generating unit 16 is connected with a second end of the unit under test 11, and a second end of the signal generating unit 16 is connected with a first end of the comparing unit 17; the second end of the comparing unit 17 is connected with the third end of the reactance unit 13, and the third end of the comparing unit 17 is connected with the second end of the test assistant unit 12.
It should be noted that the signal generating unit 16 may be a device, such as a signal generator, having electrical signals providing various frequencies, waveforms and output levels. In order to realize the function of the signal generating unit 16 for adjusting the sinusoidal half-wave current load of the unit under test, in the present embodiment, the signal generating unit 16 may be a sinusoidal signal generator. The comparison unit 17 may be a device, such as a comparator, that compares two data items based on a preset threshold value and then outputs a high level or a low level. In order to realize that the comparing unit 17 compares the collected current load value of the signal generating unit 16 with the feedback current value of the reactance unit 13, and triggers the function of the test assisting unit 12 according to the comparison result, in this embodiment, the comparing unit 17 may be a hysteresis comparator. Illustratively, the hysteresis comparator presets two thresholds, and the output state is a high level and a low level, and then compares the input value with the preset threshold, thereby setting the output corresponding level state in advance according to the comparison result. The reactance unit 13 may be a load reactor.
Preferably, the first detection unit 14 and the second detection unit 15 include a water-cooling heat dissipation system;
the first detection unit 14 and the second detection unit 15 further include one or more of a shell temperature detection unit, a device tube voltage drop detection unit, and a dynamic parameter detection unit.
Wherein, the water-cooling heat dissipation system is used for dissipating heat for the unit under test 11. The shell temperature detection unit is used for detecting whether the shell temperature change meets the requirement; the device tube voltage drop detection unit is used for tube voltage drop sensitive parameters; the dynamic parameter detection unit is used for detecting dynamic parameters through the oscilloscope.
In an alternative embodiment, referring to fig. 1, the unit under test 11 includes a first capacitor C1, a first IGBTT1, a first diode D1, a second IGBTT2, and a second diode D2;
the first IGBTT1 is connected in anti-parallel with the first diode D1, and the second IGBTT2 is connected in anti-parallel with the second diode D2; the first capacitor C1 is connected in parallel across the series connection of the first IGBTT1 and the second IGBTT 2;
the first detection unit 14 is connected in parallel to both ends of the first IGBTT1, and the second detection unit 15 is connected in parallel to both ends of the second IGBTT 2;
the emitter of the first IGBTT1 and the collector of the second IGBTT2 are both connected to a first end of the unit under test 11;
the gate of the first IGBTT1 and the gate of the second IGBTT2 are both connected to the second end of the unit under test 11.
In an alternative embodiment, referring to fig. 1, the test assisting unit 12 includes a second capacitor C2, a third IGBTT3, a third diode D3, a fourth IGBTT4, and a fourth diode D4;
the third IGBTT3 is connected in anti-parallel with the third diode D3, and the fourth IGBTT4 is connected in anti-parallel with the fourth diode D4; the second capacitor C2 is connected in parallel across the series connection of the third IGBTT3 and the fourth IGBTT 4;
the emitter of the third IGBTT3 and the collector of the fourth IGBTT4 are both connected to a connection point between the third IGBT and the fourth IGBT;
the gate of the third IGBTT3 and the gate of the fourth IGBTT4 are both connected to the input end of the test assistant unit.
In an alternative embodiment, referring to fig. 1, the device further comprises a supplementary power source 18;
the energy complementing power supply 18 is connected in parallel to two ends of the unit under test 11 and the unit under test 12.
Preferably, the energy compensating power supply 18 has a current output end for connecting with the unit under test 11 and the test assisting unit 12, and a current input end for connecting with an alternating current three-phase incoming line;
the energy supplementing power supply 18 further comprises a rectifying module 181 and a transformer 182; one end of the rectifier module 181 is connected to the current output end, and the other end is connected to the first end of the transformer 182; a second terminal of the transformer 182 is connected to the current input terminal.
In an alternative embodiment, the apparatus further comprises a current transformer;
the reactance unit 13 is connected to the comparison unit 17 via the current transformer.
In this embodiment, the feedback current is a load current on the reactance unit 13, and can be measured by a current transformer.
The power cycle acceleration test device of the MMC sub-module provided by the embodiment of the invention comprises a tested unit, an accompanying test unit, a reactance unit, a first detection unit, a second detection unit, a signal generation unit and a comparison unit, wherein the tested unit is electrically connected with two ends of the accompanying test unit in parallel, the first end of the reactance unit is connected with a connection point between a first IGBT and a second IGBT, the second end of the reactance unit is connected with a connection point between a third IGBT and a fourth IGBT, the first detection unit and the second detection unit are electrically connected with the tested unit, the first end of the signal generation unit is connected with the input end of the tested unit, the second end of the signal generation unit is connected with the first end of the comparison unit, and the second end of the comparison unit is connected with the second end of the reactance unit, the third end of the comparison unit is connected with the input end of the test assisting unit, so that the problem that a test result consistent with the aging characteristic of the sub-module under the actual working condition cannot be obtained due to the fact that only a single IGBT is tested and researched in the prior art can be effectively solved, the power cycle acceleration test device using the sub-module as an experimental object and the control method thereof can be provided, and the operation reliability of the modular multilevel converter system can be guaranteed.
Example two
Referring to fig. 2, a schematic flowchart of a power cycle acceleration control method for an MMC sub-module according to a second embodiment of the present invention is shown, where the method includes the following steps S201 to S203.
S201, adjusting the current load of a tested unit through a signal generating unit; wherein the current load is a sinusoidal half-wave current.
It should be noted that, the signal generating unit 16 applies an intermittent sinusoidal half-wave current load with adjustable amplitude and period to the IGBT devices in the sub-modules according to the actual operating condition of the modular multilevel converter.
S202, comparing the collected current load value of the signal generation unit with the feedback current value of the reactance unit through the comparison unit, and triggering the test assisting unit according to the comparison result so as to enable the MMC sub-module to perform a power aging test at a preset aging rate.
Note that the turn-on of the IGBT device in the unit under test depends on the current load of the signal generation unit 6. When the current load is sinusoidal positive half-cycle current, the first IGBTT1 in the tested unit is always on, and the second IGBTT2 in the tested unit is always off; when the current load is a sinusoidal negative half cycle current, the first IGBTT1 in the unit under test 11 is always off, and the second IGBTT2 is always on. In addition, the turn-on of the IGBT device in the test-accompanying cell 12 depends on the comparison result of the comparison cell.
In an alternative embodiment, when the current load of the unit under test 11 is a sinusoidal positive half-cycle current, the first IGBTT1 is turned on, the second IGBTT2 is turned off, the difference between the current load value corresponding to the sinusoidal positive half-cycle current and the feedback current value is calculated, and the difference is compared with a preset deviation threshold; wherein the deviation threshold comprises a positive deviation threshold and a negative deviation threshold.
Optionally, when the difference is greater than the positive deviation threshold, the comparing unit 17 outputs a first trigger signal, and sends the first trigger signal to the test assisting unit 12, so that the third IGBTT3 of the test assisting unit 12 is turned off, and the fourth IGBTT4 is turned on.
It should be noted that, when the difference between the current load value given by the signal generating unit 16 and the feedback current value is larger than the positive deviation threshold, the feedback current is considered to be too small, and at this time, the comparing unit 17 outputs a high level, the fourth IGBTT4 is turned on, the third IGBTT3 is turned off, the first IGBTT1 and the fourth IGBTT4 are turned on together, and the feedback current starts to increase.
Optionally, when the difference is smaller than the negative deviation threshold, the comparing unit 17 outputs a second trigger signal, and sends the second trigger signal to the test assisting unit 12, so that the third IGBTT3 of the test assisting unit 12 is turned on, and the fourth IGBTT4 is turned off.
It should be noted that, when the difference between the current load value and the feedback current value is smaller than the negative deviation threshold value due to the increase of the current, the feedback current is considered to be too large, the comparing unit 17 outputs a low level, the fourth IGBTT4 is turned off, the third IGBTT3 is turned on, the anti-parallel third diode D3 of the first IGBTT1 and the third IGBTT3 freewheels, the feedback current starts to decrease in attenuation, and so on, so as to realize that the feedback current tracks the current load.
In another alternative embodiment, when the current load of the unit under test 11 is a sinusoidal negative half-cycle current, the first IGBTT1 is turned off, the second IGBTT2 is turned on, the difference between the current load value corresponding to the sinusoidal negative half-cycle current and the feedback current value is calculated, and the difference is compared with a preset deviation threshold.
Optionally, when the difference is greater than the positive deviation threshold, the feedback current is considered to be too large, and at this time, the comparing unit 17 outputs a low level, the third IGBTT3 of the test assisting unit 12 is turned on, and the fourth IGBTT4 is turned off, so that the second IGBTT2 and the third IGBTT3 are both turned on, and the feedback current starts to decay and decrease.
Optionally, when the difference is smaller than the negative deviation threshold, the feedback current is considered to be too small, and at this time, the comparing unit 17 outputs a high level, the third IGBTT3 of the test assisting unit 12 is turned off, and the fourth IGBTT4 is turned on, so that the anti-parallel fourth diodes D4 of the second IGBTT2 and the fourth IGBTT4 freewheel, and the feedback current starts to increase.
Preferably, the amplitude and the period of the current load are adjusted, and the size of the deviation threshold in the reactance unit 13 and the comparison unit 17 is adjusted, so that the MMC sub-module performs power aging tests at different preset aging rates.
S203, obtaining test results through the first detection unit and the second detection unit, and obtaining the aging characteristic of the sub-module at the preset aging rate according to the test results.
It should be noted that the sub-module aging characteristic at the specific aging rate is obtained through the detection results of the shell temperature detection unit, the device tube voltage drop detection unit, and the dynamic parameter detection unit.
The MMC sub-module power cycle acceleration control method provided by the embodiment of the invention adjusts the current load of a tested unit through a signal generating unit, further compares the acquired current load value of the signal generating unit with the feedback current value of a reactance unit through a comparison unit, triggers an auxiliary test unit according to the comparison result so as to enable the MMC sub-module to carry out a power aging test at a preset aging rate, further obtains a test result through a first detection unit and a second detection unit, and obtains the sub-module aging characteristic at the preset aging rate according to the test result, thereby effectively solving the problem that the test result which is consistent with the sub-module aging characteristic under the actual working condition cannot be obtained due to the fact that the test and research are carried out only on a single IGBT in the prior art, and providing a power cycle acceleration test device and a control method thereof which are used for taking the sub-module as an experimental object, therefore, the operation reliability of the modular multilevel converter system can be ensured.
It should be noted that the above-described device embodiments are merely illustrative, where the units described as separate parts may or may not be physically separate, and the parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on multiple network units. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of the present embodiment. In addition, in the drawings of the embodiment of the apparatus provided by the present invention, the connection relationship between the modules indicates that there is a communication connection between them, and may be specifically implemented as one or more communication buses or signal lines. One of ordinary skill in the art can understand and implement it without inventive effort.
While the foregoing is directed to the preferred embodiment of the present invention, it will be understood by those skilled in the art that various changes and modifications may be made without departing from the spirit and scope of the invention.
Claims (8)
1. A power cycle acceleration test device of an MMC sub-module is characterized by comprising a tested unit, an accompanying test unit, a reactance unit, a first detection unit, a second detection unit, a signal generation unit and a comparison unit;
the unit under test comprises a first IGBT and a second IGBT; the test accompanying unit comprises a third IGBT and a fourth IGBT;
the tested unit is electrically connected to two ends of the test accompanying unit in parallel; a first end of the reactance unit is connected with a connection point between the first IGBT and the second IGBT, and a second end of the reactance unit is connected with a connection point between the third IGBT and the fourth IGBT; the first detection unit and the second detection unit are electrically connected with the tested unit; the first end of the signal generating unit is connected with the input end of the tested unit, and the second end of the signal generating unit is connected with the first end of the comparing unit; the second end of the comparison unit is connected with the second end of the reactance unit, and the third end of the comparison unit is connected with the input end of the test assistant unit;
the first detection unit is connected in parallel to two ends of the first IGBT, and the second detection unit is connected in parallel to two ends of the second IGBT;
through the comparing unit according to gathering the current load value of signal generation unit with reactance unit's feedback current value carries out the comparison to trigger according to the comparative result accompany and try the unit, so that the MMC submodule piece carries out power ageing test with preset ageing rate, specifically includes:
when the current load of the tested unit is sinusoidal positive half-cycle current, the first IGBT is switched on, the second IGBT is switched off, the difference value between the current load value corresponding to the sinusoidal positive half-cycle current and the feedback current value is calculated, and the difference value is compared with a preset deviation threshold value; wherein the deviation threshold comprises a positive deviation threshold and a negative deviation threshold;
when the difference value is larger than the positive deviation threshold value, the comparison unit outputs a first trigger signal and sends the first trigger signal to an accompanying unit, so that a third IGBT of the accompanying unit is turned off, and a fourth IGBT of the accompanying unit is turned on;
when the difference value is smaller than the negative deviation threshold value, the comparison unit outputs a second trigger signal and sends the second trigger signal to the test assisting unit, so that the third IGBT of the test assisting unit is turned on, and the fourth IGBT is turned off.
2. The MMC sub-module power cycle accelerated test device of claim 1, wherein the unit under test comprises a first capacitor, a first IGBT, a first diode, a second IGBT, and a second diode;
the first IGBT is connected with the first diode in an inverse parallel mode, and the second IGBT is connected with the second diode in an inverse parallel mode; the first capacitor is connected in parallel to two ends of the first IGBT and the second IGBT which are connected in series;
the first detection unit is connected in parallel to two ends of the first IGBT, and the second detection unit is connected in parallel to two ends of the second IGBT;
the emitter of the first IGBT and the collector of the second IGBT are both connected with the connection point between the first IGBT and the second IGBT;
and the gate pole of the first IGBT and the gate pole of the second IGBT are both connected with the input end of the tested unit.
3. The MMC sub-module power cycle accelerated test device of claim 1, wherein the test-accompanying cell comprises a second capacitor, a third IGBT, a third diode, a fourth IGBT and a fourth diode;
the third IGBT is connected with the third diode in an inverse parallel mode, and the fourth IGBT is connected with the fourth diode in an inverse parallel mode; the second capacitor is connected in parallel to two ends of the third IGBT and the fourth IGBT which are connected in series;
an emitter of the third IGBT and a collector of the fourth IGBT are both connected with a connection point between the third IGBT and the fourth IGBT;
and the gate pole of the third IGBT and the gate pole of the fourth IGBT are both connected with the input end of the accompanying test unit.
4. The MMC sub-module power cycle accelerated test device of claim 1, further comprising a complementary power source;
the energy supplementing power supply is connected to two ends of the tested unit and the accompanying unit in parallel.
5. The MMC sub-module power cycle accelerated test device of claim 4, wherein the complementary power source has a current output for connection with the unit under test, the test-assist unit, and a current input for connection with an AC three-phase incoming line;
the energy supplementing power supply also comprises a rectifying module and a transformer; one end of the rectifying module is connected with the current output end, and the other end of the rectifying module is connected with the first end of the transformer; the second end of the transformer is connected with the current input end.
6. The MMC sub-module power cycle accelerated test device of claim 1, wherein the first detection unit and the second detection unit comprise a water-cooled heat dissipation system;
the first detection unit and the second detection unit further comprise a dynamic parameter detection unit.
7. The MMC sub-module power cycle accelerated test device of claim 1, further comprising a current transformer;
the reactance unit is connected with the comparison unit through the current transformer.
8. A power cycle acceleration control method for an MMC sub-module, the method being applied to the power cycle acceleration test apparatus for an MMC sub-module according to any one of claims 1 to 7, the method comprising:
adjusting the current load of the unit to be tested through the signal generating unit; wherein the current load is a sine half-wave current;
comparing the acquired current load value of the signal generation unit with the feedback current value of the reactance unit through a comparison unit, and triggering an auxiliary test unit according to a comparison result so as to enable the MMC sub-module to perform a power aging test at a preset aging rate;
and obtaining a test result through the first detection unit and the second detection unit, and obtaining the aging characteristic of the sub-module at the preset aging rate according to the test result.
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| CN111781480B (en) * | 2020-05-28 | 2022-05-20 | 南方电网科学研究院有限责任公司 | IGBT junction temperature monitoring method, device and system |
| CN113092897A (en) * | 2021-03-16 | 2021-07-09 | 荣信汇科电气股份有限公司 | Temperature fatigue aging comprehensive test device for MMC flexible direct converter valve power module |
| CN116990601B (en) * | 2023-06-28 | 2024-04-02 | 荣信汇科电气股份有限公司 | High-power chopper circuit DC load capacity test device and test method |
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