CN212059989U - X-ray diffractometer is with many film sample frame that can quick replacement - Google Patents
X-ray diffractometer is with many film sample frame that can quick replacement Download PDFInfo
- Publication number
- CN212059989U CN212059989U CN202020383306.0U CN202020383306U CN212059989U CN 212059989 U CN212059989 U CN 212059989U CN 202020383306 U CN202020383306 U CN 202020383306U CN 212059989 U CN212059989 U CN 212059989U
- Authority
- CN
- China
- Prior art keywords
- film sample
- thin film
- stage
- transfer block
- base body
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
The utility model relates to a but X-ray diffractometer is with quick replacement's many film sample frame relates to X-ray diffraction test field, and a more loaded down with trivial details problem of change sample when having solved extensive film X-ray diffraction test among the prior art. The method comprises the following steps: a multi-position film sample stage for loading a plurality of film samples; and a transfer block for loading the multi-position thin film sample stage on an electric displacement stage of the diffractometer through the transfer block. The utility model is simple in operation, can realize the fixed and quick automatic switch-over of a plurality of film samples, reduced in the past need one put into when changing the sample loaded down with trivial details and occupation time problem, more can avoid the test neutral gear period of artificial leading to the fact.
Description
Technical Field
The utility model relates to an X-ray diffraction tests technical field, in particular to but X-ray diffraction appearance is with quick replacement's many film sample frame.
Background
X-ray diffraction is the most common method of characterizing the crystal structure of a material and has a very large number of applications. Among the various samples, the film sample is a very common sample, which refers to a millimeter to nanometer scale material prepared on a substrate.
Because the sizes and thicknesses of the substrates of different film samples are different, and the film part to be tested is very thin, the samples need to be strictly aligned before testing; in addition, because the diffraction signal of the film sample is weak, the general test time is usually long, and is in the order of tens of minutes, so that the current diffractometer is used for replacing one sample with another sample after the other sample is tested. However, the test is troublesome, and the phenomenon that the sample is not replaced timely usually occurs, so that the overall test efficiency is influenced. A multi-stage sample stage is one approach to solving this problem. However, only a multi-stage sample stage for powder samples is commercially available at present, and the multi-stage sample stage cannot be directly used for X-ray diffraction testing of thin film samples due to sample alignment required before thin film sample testing. In addition, the conventional electric translation sample stage is generally used for placing only one sample, and has no position indication when a plurality of samples are placed, so that the accurate movement and positioning of the samples cannot be controlled in a test procedure; meanwhile, the sample table is made of metal, the surface is smooth, and the problem of sample position drift can occur during movement. Therefore, it is necessary to develop a fast replaceable multi-position film sample holder for an X-ray diffractometer based on an electric translation stage according to the requirement of film X-ray diffraction.
SUMMERY OF THE UTILITY MODEL
The utility model discloses a change more loaded down with trivial details technical problem of sample when solving among the prior art extensive film X-ray diffraction test, but provide a X-ray diffractometer with quick replacement's many film sample frame.
In order to solve the technical problem, the technical scheme of the utility model is specifically as follows:
a rapidly replaceable multi-position thin film sample holder for an X-ray diffractometer comprising:
a multi-position thin film sample stage through which a plurality of thin film samples are loaded;
and the transfer block is used for loading the multi-position thin film sample stage on an electric displacement stage of the diffractometer.
Preferably, the multi-position thin film sample stage comprises a multi-position thin film sample stage substrate, a sample position indicator score line disposed on the multi-position thin film sample stage substrate, and an elastomeric coating applied to the multi-position thin film sample stage substrate and overlying the sample position indicator score line;
the film sample placement position is indicated by the sample position indicating score line, and the film sample is adhered by the elastomer coating to fix the film sample.
Preferably, the sample position indicator score line comprises:
the longitudinal reticle is positioned at the position of a central axis of the substrate of the multi-position film sample stage;
and the transverse scribed lines and the longitudinal scribed lines are arranged vertically and horizontally, and the transverse scribed lines are parallel to each other and are arranged at equal intervals along the extending direction of the longitudinal scribed lines.
Preferably, the elastomeric coating is a crosslinked PDMS elastomer.
Preferably, the adaptor block includes:
the film sample stage comprises a transfer block base body, wherein one side, facing the electric displacement stage of the diffractometer, of the transfer block base body is a fixed surface, and one side, facing the multi-position film sample stage base plate, of the transfer block base body is a splicing surface.
Preferably, a groove is formed in the splicing surface of the switching block base body, and a screw through hole for assembling with an electric displacement table of a diffractometer through a screw is formed in the inner side of the groove;
and the fixed surface of the adapter block substrate is in contact with an electric displacement table of the diffractometer.
Preferably, the splicing surface of the switching block base body is provided with a switching end positioning column;
a loading end positioning hole corresponding to the switching end positioning column is formed in the surface of one side, facing the switching block base, of the multi-position film sample table base plate;
and the splicing surface of the adapter block base body is contacted with the multi-position film sample table base plate.
Preferably, one side of the substrate of the multi-position film sample stage is provided with a first positioning notch;
one side of the switching block base body is provided with a second positioning notch corresponding to the first positioning notch;
when the multi-position film sample stage base plate is contacted with the transfer block base body and spliced, the first positioning notch and the second positioning notch are mutually overlapped.
The utility model discloses following beneficial effect has:
the utility model discloses a multi-position film sample holder for an X-ray diffractometer, which is capable of being replaced quickly.A transfer block is additionally arranged on an XY electric translation table of the diffractometer, so that a multi-position film sample table loaded on the transfer block can be replaced quickly; the surface of the multi-position film sample table is provided with an elastomer coating and a sample position indicating reticle, so that a plurality of film samples can be fixed, and finally, the automatic continuous alignment and test of the plurality of film samples are realized through an automatic test module of the diffractometer. The utility model is simple in operation, can realize the fixed and quick automatic switch-over of a plurality of film samples, reduced in the past need one put into when changing the sample loaded down with trivial details and occupation time problem, more can avoid the test neutral gear period of artificial leading to the fact.
Drawings
The present invention will be described in further detail with reference to the accompanying drawings and specific embodiments.
FIG. 1 is a schematic structural view of a multi-position film sample holder for an X-ray diffractometer according to the present invention, which can be rapidly replaced;
FIG. 2 is an exploded view of a rapidly replaceable multi-position thin film sample holder for an X-ray diffractometer according to the present invention;
FIG. 3 is a front view of a multi-position film sample stage of a multi-position film sample holder for an X-ray diffractometer according to the present invention, which is capable of being replaced quickly;
FIG. 4 is a top view of a multi-position film sample stage of a multi-position film sample holder for an X-ray diffractometer according to the present invention, which is capable of being replaced quickly;
FIG. 5 is a front view of a quick-change multi-position film sample holder adapter block for an X-ray diffractometer according to the present invention;
fig. 6 is a top view of the transfer block of the multi-position film sample holder for an X-ray diffractometer according to the present invention.
The reference numerals in the figures denote:
1. a multi-position thin film sample stage substrate; 2. an elastomeric coating; 3. longitudinally scribing; 4. transversely scribing; 5. a transfer block substrate; 6. a groove; 7. a screw through hole; 8. a transfer terminal positioning column; 9. a loading end positioning hole; 10. A first positioning gap; 11. a second positioning notch.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.
Referring to fig. 1-6, a rapidly replaceable multi-stage thin film sample holder for an X-ray diffractometer includes:
a multi-position film sample stage for loading a plurality of film samples;
and a transfer block for loading the multi-position thin film sample stage on an electric displacement stage of the diffractometer through the transfer block.
The multi-position thin film sample stage comprises a multi-position thin film sample stage substrate 1, a sample position indication reticle arranged on the multi-position thin film sample stage substrate 1 and an elastomer coating 2 coated on the multi-position thin film sample stage substrate 1 and covering the sample position indication reticle;
the film sample placement position is indicated by a sample position indicating score line, and the film sample is stuck by the elastomer coating 2 to fix the film sample.
The sample position indicator score line comprises:
a longitudinal reticle 3, wherein the longitudinal reticle 3 is positioned at the central axis position of the substrate 1 of the multi-position film sample stage;
and the transverse scribed lines 4 are arranged vertically and horizontally with the longitudinal scribed lines 3, the transverse scribed lines 4 are parallel to each other, and the transverse scribed lines 4 are arranged at equal intervals along the extending direction of the longitudinal scribed lines 3.
The elastomer coating 2 is a crosslinked PDMS elastomer.
The switching piece includes:
the switching block base body 5, one side of the switching block base body 5 towards the electric displacement table of the diffractometer is a fixed surface, and one side of the switching block base body 5 towards the multi-position film sample table base plate 1 is a splicing surface.
A groove 6 is formed in the splicing surface of the transfer block base body 5, and a screw through hole 7 for assembling with an electric displacement table of a diffractometer through a screw is formed in the inner side of the groove 6;
the fixed surface of the transfer block matrix 5 is contacted with an electric displacement table of the diffractometer.
A splicing surface of the splicing block base body 5 is provided with a splicing end positioning column 8;
a loading end positioning hole 9 corresponding to the switching end positioning column 8 is formed in the surface of one side, facing the switching block base body 5, of the multi-position film sample stage base plate 1;
the splicing surface of the transfer block matrix 5 is contacted with the substrate 1 of the multi-position film sample table.
One side of the substrate 1 of the multi-position film sample table is provided with a first positioning notch 10;
a second positioning notch 11 corresponding to the first positioning notch 10 is formed in one side of the transfer block base body 5;
when the multi-position film sample stage base plate 1 is contacted with the switching block base plate 5 and spliced, the first positioning notch 10 and the second positioning notch 11 are mutually overlapped.
The working principle is as follows:
a plurality of thin film samples are first loaded using a multi-position thin film sample stage. Wherein the elastomer coating 2 in the multi-position thin film sample stage is coated on the multi-position thin film sample stage substrate 1 and covers the sample position indication scribe line, wherein the elastomer coating 2 is transparent so that the sample position indication scribe line can be seen through the elastomer coating 2 when the thin film sample is fixed, the thin film sample fixing position is indicated according to the sample position indication scribe line, and the elastomer coating 2 is a crosslinked PDMS elastomer having viscosity, and the thin film sample is fixed by the viscosity of the elastomer coating 2. The sample position indication reticle comprises a longitudinal reticle 3 and a transverse reticle 4 which are positioned at the central axis position of the substrate 1 of the multi-position film sample stage, wherein the transverse reticle 4 and the longitudinal reticle 3 are arranged in a vertical and horizontal mode, the transverse reticle 4 is parallel to each other and is arranged at equal intervals along the extending direction of the longitudinal reticle 3, and the intervals of the plurality of transverse reticles 4 are determined according to the size and the number of samples. Simultaneously, a plurality of sample position marks can be correspondingly arranged on the multi-position film sample stage substrate 1 beside the transverse reticle 4, such as: the positions of the film samples are more conveniently determined by '1', '2', '3', '4' and '5'.
When detecting the sample, the multi-position film sample stage is loaded on the electric displacement stage of the diffractometer through the transfer block. Specifically, one side of the switching block matrix 5, which faces the electric displacement table of the diffractometer, is a fixed surface, and one side of the switching block matrix 5, which faces the multi-position film sample table substrate 1, is a splicing surface. The fixed surface of the transfer block base body 5 is in contact with an electric displacement table of the diffractometer, and is assembled on the electric displacement table of the diffractometer through a screw through hole 7 arranged on the inner side of the groove 6. And then, the mortise and tenon structure is utilized to realize the rapid combination and separation between the multi-position film sample stage and the switching block, and then the rapid combination and separation between the multi-position film sample stage and the electric displacement stage of the diffractometer are realized. Specifically, the transfer end positioning column 8 on the transfer block base body 5 is inserted into the loading end positioning hole 9 on the multi-position film sample stage substrate 1 for splicing, and then the transfer block base body 5 is connected with the multi-position film sample stage substrate 1.
To sum up, the utility model is simple in operation, can realize the fixed and quick automatic switch-over of a plurality of film samples, reduced in the past need a loaded down with trivial details and the occupation time problem of putting into when changing the sample, more can avoid the test neutral gear period of artificial leading to the fact.
Wherein the size range of the substrate 1 of the multi-position film sample stage in the multi-position film sample stage can be 50-200mm in length, 50-100mm in width and 2-20mm in thickness; the size range of the switching block matrix 5 in the switching block can be 20-200mm long, 20-200mm wide and 2-20mm thick; the transverse score lines 4 may be spaced at a distance in the range of 5 to 50mm, depending on the size and number of film samples.
Example (b): the switching block can be fixed on an XY electric displacement table of a Japan science smartlab diffractometer through a screw through hole 7 by utilizing three screws; the film samples are placed on a multi-position film sample table one by one; and finally, loading a multi-position film sample stage on the transfer block, and positioning and fixing the multi-position film sample stage and the positioning hole through the positioning column.
The substrate 1 of the multi-position film sample stage in the multi-position film sample stage is made of PLA material through 3D printing, and is 160mm long, 30mm wide and 9mm thick; the front surface is provided with sample position indicating scribed lines for indicating the sample position, the longitudinal scribed lines 3 in the sample position indicating scribed lines are positioned at the central axis of the substrate 1 of the multi-position film sample stage, the transverse scribed lines are spaced by 25mm, and the sample position indicating lines are provided with film sample position marks of '1', '2', '3', '4' and '5'; the surface of the sample position indication reticle is coated with a transparent crosslinked PDMS elastomer, so that the film sample can be better adhered; two sides are provided with 3 positioning holes matched with the size of the positioning block
A switching block substrate 5 in the switching block is made of PLLA materials through 3D printing, a switching end positioning column 8 matched with a loading end positioning hole 9 in size on the multi-position film sample table substrate 1 is arranged on the front side of the switching block substrate, and a screw through hole 7 matched with an XY electric displacement table of a smartlab diffractometer in position is formed in the middle groove 6.
It should be understood that the above examples are only for clarity of illustration and are not intended to limit the embodiments. Other variations and modifications will be apparent to persons skilled in the art in light of the above description. And are neither required nor exhaustive of all embodiments. And obvious variations or modifications therefrom are within the scope of the invention.
Claims (8)
1. A rapidly replaceable multi-position thin film sample holder for an X-ray diffractometer, comprising:
a multi-position thin film sample stage through which a plurality of thin film samples are loaded;
and the transfer block is used for loading the multi-position thin film sample stage on an electric displacement stage of the diffractometer.
2. The rapidly replaceable multi-position thin film sample holder for an X-ray diffractometer according to claim 1, wherein the multi-position thin film sample stage comprises a multi-position thin film sample stage substrate (1), sample position indication scribe lines disposed on the multi-position thin film sample stage substrate (1), and an elastomer coating (2) applied on the multi-position thin film sample stage substrate (1) and covering the sample position indication scribe lines;
the film sample placement position is indicated by the sample position indication score line, and the film sample is stuck by the elastomer coating (2) to fix the film sample.
3. The rapidly replaceable multi-stage thin film sample holder of claim 2 in which the sample position indicating reticle comprises:
the longitudinal reticle (3), the longitudinal reticle (3) is positioned at the position of the central axis of the multi-position film sample stage substrate (1);
and the transverse scribed lines (4) are vertically and horizontally arranged with the longitudinal scribed lines (3) and the transverse scribed lines (4) are parallel to each other and are arranged at equal intervals along the extending direction of the longitudinal scribed lines (3).
4. A rapidly exchangeable multi-position thin film sample holder for X-ray diffractometers according to claim 2, wherein the elastomer coating (2) is a cross-linked PDMS elastomer.
5. The rapidly replaceable multi-stage thin film sample holder of claim 2, wherein the interface block comprises:
the film sample stage comprises a transfer block base body (5), wherein one side, facing the electric displacement stage of the diffractometer, of the transfer block base body (5) is a fixed surface, and one side, facing the multi-position film sample stage base plate (1), of the transfer block base body (5) is a splicing surface.
6. The fast-replaceable multi-position film sample holder for the X-ray diffractometer according to claim 5, wherein a groove (6) is formed in a splicing surface of the transfer block base body (5), and a screw through hole (7) for assembling with an electric displacement table of the diffractometer through a screw is formed in the inner side of the groove (6);
the fixed surface of the transfer block base body (5) is in contact with an electric displacement table of the diffractometer.
7. The rapidly replaceable multi-position film sample holder for X-ray diffractometers according to claim 5, wherein the splicing surface of the adapter block base (5) is provided with an adapter end positioning column (8);
a loading end positioning hole (9) corresponding to the switching end positioning column (8) is formed in the surface of one side, facing the switching block base body (5), of the multi-position film sample table base plate (1);
the splicing surface of the transfer block base body (5) is in contact with the multi-position film sample stage base plate (1).
8. The fast replaceable multi-position film sample holder for the X-ray diffractometer according to claim 5, wherein a first positioning notch (10) is formed in one side of the multi-position film sample holder base plate (1);
one side of the transfer block base body (5) is provided with a second positioning notch (11) corresponding to the first positioning notch (10);
when the multi-position film sample stage base plate (1) is in contact with and spliced with the transfer block base body (5), the first positioning notch (10) and the second positioning notch (11) are mutually overlapped.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202020383306.0U CN212059989U (en) | 2020-03-24 | 2020-03-24 | X-ray diffractometer is with many film sample frame that can quick replacement |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202020383306.0U CN212059989U (en) | 2020-03-24 | 2020-03-24 | X-ray diffractometer is with many film sample frame that can quick replacement |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN212059989U true CN212059989U (en) | 2020-12-01 |
Family
ID=73530866
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202020383306.0U Active CN212059989U (en) | 2020-03-24 | 2020-03-24 | X-ray diffractometer is with many film sample frame that can quick replacement |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN212059989U (en) |
-
2020
- 2020-03-24 CN CN202020383306.0U patent/CN212059989U/en active Active
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN114471774B (en) | Flow cell cartridge with floating seal holder | |
| US4548630A (en) | Fibre fusion splicing | |
| CN212059989U (en) | X-ray diffractometer is with many film sample frame that can quick replacement | |
| CN104422419A (en) | Outer diameter V-shaped measurement method and V-shaped gauge of valve retainer outer diameter | |
| CN105892112B (en) | A kind of frame glue bonding force checking device for liquid crystal display | |
| CN109612918B (en) | Atmospheric corrosion sensor and manufacturing method thereof | |
| CN110702500B (en) | Micro-droplet debonding test fixture | |
| CN209215404U (en) | A kind of blotting membrane clamping and positioning device | |
| CN101078504B (en) | Lamp fixing unit, backlight assembly having the same and display device having the same | |
| US3619056A (en) | Pattern registering jig | |
| CN209763916U (en) | Measuring device for edge processing amount | |
| CN115668601A (en) | Pouch-shaped battery sealing apparatus including position adjustment unit and pouch-shaped battery sealing method using the same | |
| CN218002880U (en) | Measure tool of glass substrate beam split homogeneity | |
| CN219869521U (en) | Auxiliary measuring jig and measuring instrument | |
| CN107121799B (en) | Positioning jig for panel frame glue peeling test | |
| CN117990460B (en) | Composite material shear sample preparation tool and sample preparation method | |
| CN221377515U (en) | Ceramic lock pin bending strength detects frock | |
| US4445775A (en) | Registration blocks for a photomask assembly | |
| CN211955350U (en) | Thin layer chromatography experimental device for drug inspection | |
| CN217604895U (en) | Steel bridge flatness measuring device | |
| CN217620561U (en) | Marking tool | |
| CN217083613U (en) | Carving board for impact sample notch projector | |
| JPH11220300A (en) | Testing body for inspecting mounting tolerance | |
| CN214224767U (en) | Distance-adjustable tensile film sample marking device and sheet punching machine | |
| CN216205870U (en) | Bearing device for workpiece measurement |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant |