CN212031622U

CN212031622U - HDMI cable testing arrangement

Info

Publication number: CN212031622U
Application number: CN202020476088.5U
Authority: CN
Inventors: 游开炘; 文辉
Original assignee: Shenzhen Monidi Technology Co ltd
Current assignee: Shenzhen Monidi Technology Co ltd
Priority date: 2020-04-03
Filing date: 2020-04-03
Publication date: 2020-11-27
Anticipated expiration: 2030-04-03

Abstract

The application relates to an HDMI cable testing arrangement includes: a waveform generating circuit for generating a test waveform; the output port is used for plugging an HDMI cable, and is connected with the waveform generating circuit to output the test waveform to the HDMI cable; the input port is used for plugging the HDMI cable; and the waveform analysis circuit is connected to the input port, and is used for analyzing the error rate of the received test waveform to test the HDMI cable when the test waveform of the HDMI cable is received through the input port. The HDMI cable testing device can be used for inserting two ends of an HDMI cable into the input port and the output port, the waveform generating circuit outputs a test waveform through the output port, the waveform analyzing circuit is used for analyzing the error rate of the test waveform input by the input port, the quality of the HDMI cable can be rapidly detected through the error rate, and the testing time and the accuracy of an HDMI cable production line are accelerated.

Description

HDMI cable testing arrangement

Technical Field

The utility model belongs to cable test equipment, especially a HDMI cable testing arrangement.

Background

The statements in this section merely provide background information related to the present disclosure and may not necessarily constitute prior art.

In the product design stage, an engineer needs to check the waveform of the HDMI signal transmitted by the HDMI cable by using an oscilloscope to detect the transmission quality of the HDMI cable. However, this detection method requires the use of an oscilloscope, which is complicated to operate and requires a professional technician to perform the test. In addition, the HDMI cable can be tested to see whether the tv image is stable or not and whether there is no noise, which is usually used in the production line, but only to check the quality of the signal.

SUMMERY OF THE UTILITY MODEL

In view of the above, it is desirable to provide an HDMI cable testing apparatus capable of quickly and simply detecting the error rate of an HDMI cable.

An HDMI cable test apparatus comprising:

a waveform generating circuit for generating a test waveform;

the output port is used for plugging an HDMI cable, and is connected with the waveform generating circuit to output the test waveform to the HDMI cable;

the input port is used for plugging the HDMI cable;

and the waveform analysis circuit is connected to the input port, and is used for analyzing the error rate of the received test waveform to test the HDMI cable when the test waveform of the HDMI cable is received through the input port.

Preferably, the test circuit further comprises a control circuit, wherein the control circuit is respectively connected to the waveform generation circuit and the waveform analysis circuit to control the waveform generation circuit to generate the test waveform and control the waveform analysis circuit to analyze the error rate of the test waveform.

Preferably, the waveform generation circuit comprises one or more waveform generation chips to generate the test waveform.

Preferably, the waveform generating circuit comprises one or more waveform generating chips for generating standard error code test waveforms with the rates of 750MHz, 1.5GHz, 3GHz and 6 GHz.

Preferably, the waveform generating chips are respectively connected to the output ports through differential signal output line groups.

Preferably, the waveform analysis circuit includes a signal error rate analysis chip corresponding to the waveform generation chip.

Preferably, the signal bit error rate analysis chips are respectively connected to the input ports through differential signal input line groups.

Preferably, the control circuit is connected to the output port and the input port to test the connection and disconnection of the HDMI cable.

Preferably, the HDMI cable further comprises a display screen, the display screen is connected with the control circuit, and the control circuit analyzes the error rate of the circuit and/or the on-off information of the HDMI cable according to the waveform.

Preferably, the display screen is an LCD display screen.

Compared with the prior art, the HDMI cable testing device can plug two ends of the HDMI cable into the input port and the output port, the waveform generating circuit outputs the test waveform through the output port, the waveform analyzing circuit is used for analyzing the error rate of the test waveform input by the input port, the quality of the HDMI cable can be rapidly detected through the error rate, and the testing time and the accuracy of an HDMI cable production line are accelerated.

Drawings

In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings required to be used in the description of the embodiments are briefly introduced below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to these drawings without any creative effort.

Fig. 1 is a schematic structural diagram of an HDMI cable test apparatus.

Fig. 2 is a schematic diagram of the structure of the control circuit, the output port and the input port.

Description of the main elements

The following detailed description of the invention will be further described in conjunction with the above-identified drawings.

Detailed Description

In order to make the above objects, features and advantages of the present invention more clearly understood, the present invention will be described in detail with reference to the accompanying drawings and detailed description. In addition, the embodiments and features of the embodiments of the present application may be combined with each other without conflict. In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present invention, and the described embodiments are merely some embodiments, rather than all embodiments, of the present invention. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work all belong to the protection scope of the present invention.

Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. The terminology used herein in the description of the invention is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention.

In various embodiments of the present invention, for convenience of description and not limitation, the term "connected" as used in the specification and claims of the present invention is not limited to physical or mechanical connections, but may include electrical connections, whether direct or indirect. "upper", "lower", "left", "right", and the like are used merely to indicate relative positional relationships, and when the absolute position of the object being described is changed, the relative positional relationships are changed accordingly.

The HDMI (High Definition Multimedia Interface) cable testing device is used for testing the quality of the HDMI cable 70, TMDS (Transition Minimized Differential Signaling) signals in the HDMI signals are matched to a circuit format of a communication chip by using a chip with an error code detection function in the communication industry, the quality of the HDMI cable is detected by using the error code detection function of the chip in the communication industry, the error code rate can be given in 1 second, quantitative analysis results can greatly accelerate the testing time of an HDMI cable production line and improve the accuracy.

Fig. 1 is a schematic structural diagram of an HDMI cable 70 testing apparatus, and as shown in fig. 1, the HDMI cable 70 testing apparatus includes a circuit board 10, and a control circuit 60, a waveform generating circuit 40, an output port 20, an input port 30, a waveform analyzing circuit 50, and a display screen 80 are disposed on the circuit board 10.

The waveform generating circuit 40 is used to generate a test waveform. In this embodiment, the waveform generating circuit 40 includes one or more waveform generating chips 41 to generate the test waveforms, and the waveform generating chips 41 are respectively connected to the output ports 20 through differential signal output line groups 42. The test waveform may be one of a sine wave, a triangle wave, and a square wave, and the waveform generation chip 41 may be a PRBS Pseudo Random noise waveform (i.e., (Pseudo-Random Binary Sequence)) for generating different frequencies with rates of 750MHz, 1.5GHz, 3GHz, 6GHz, etc., for example, four waveform generation chips 41 are shown in fig. 1: respectively used for generating standard error code test waveforms of 750MHz, 1.5GHz, 3GHz and 6 GHz. In this embodiment, the waveform generating chip 41 may be a chip with a model number of MAXP 37161.

The output port 20 is an HDMI interface for plugging an HDMI cable 70. The output port 20 is connected to the waveform generation circuit 40 to output the test waveform to the HDMI cable 70. The input port 30 is an HDMI interface for plugging the HDMI cable 70. The input port 30 is connected to the waveform analysis circuit 50 to receive the test waveform output from the HDMI cable 70.

The waveform analyzing circuit 50 is connected to the input port 30, and when a test waveform of the HDMI cable 70 is received through the input port 30, analyzes an error rate of the received test waveform to test the HDMI cable 70. The waveform analysis circuit 50 includes a signal error rate analysis chip 51 corresponding to the waveform generation chip 41, and the signal error rate analysis chips 51 are respectively connected to the input port 30 through a differential signal input line group 52. The signal error rate analysis chip 51 performs error rate statistics. In this embodiment, the signal ber analysis chip 51 may also be a chip with a model number of MAXP 37161. The MAXP37161 chip can generate a PRBS-31 waveform and can also perform error code analysis on the input PRBS waveform, namely perform PRBS-31 error code rate statistics.

The control circuit 60 is respectively connected to the waveform generating circuit 40 and the waveform analyzing circuit 50 to control the waveform generating circuit 40 to generate the test waveform and control the waveform analyzing circuit 50 to analyze the error rate of the test waveform. In this embodiment, the control circuit 60 may include a Controller for executing program codes of the related control waveform generating circuit 40 and the waveform analyzing circuit 50, including but not limited to a processor (CPU), a Micro Controller Unit (MCU) and other devices for interpreting computer instructions and Processing computer codes.

The display screen 80 is connected to the control circuit 60, and the control circuit 60 analyzes the error rate of the circuit 50 according to the waveform. The display screen 80 is an LCD display screen, an LED display screen, or other devices or modules with display functions.

In use, the control circuit 60 controls the waveform generating chip 41 of the waveform generating circuit 40 to output test waveforms with different code rates to the output port 20 through the differential signal output line group 42, the test waveforms are transmitted to the input port 30 through the HDMI cable 70 to be tested, and are transmitted to the signal error rate analyzing chip 51 from the input port 30 through the differential signal input line group 52 to perform error rate analysis through the signal error rate analyzing chip 51.

Finally, the control circuit 60 reads the bit error rate value of the signal bit error rate analysis chip 51, and displays the bit error rate of each channel on the display screen 80, thereby realizing the test of the high-speed signal channel of the HDMI cable 70.

In addition, the control circuit 60 is connected to the output port 20 and the input port 30 to test the on/off of the low-speed connection line of the HDMI cable 70. Fig. 2 is a schematic structural diagram of the control circuit 60, the output port 20, and the input port 30, and as shown in fig. 2, the control circuit 60 is connected to 5 low-speed connection lines of the input port 30, where the 5 low-speed connection lines are a power line (5V), a hot plug detection line (HPD) of the HDMI interface, a consumer electronics control line (CEC) of the HDMI interface, display data channels (SCL line and SDA line) of the HDMI interface, and an Audio Return Channel (ARC), respectively. The control circuit 60 sends out corresponding high and low levels to the 5 low-speed connection lines of the output port 20, and performs corresponding detection through the input port 30 to judge the on-off of the 5 low-speed connection lines, thereby implementing the on-off test of the low-speed connection lines. The display screen 80 displays on-off information of the HDMI cable 70 under the control of the control circuit 60.

In use, the control circuit 60 outputs a high level to the low-speed connection lines (power lines, HPD, CEC, SCL, SDA, and ARC) of the output port 20, detects the level of the connection pin corresponding to the input port 30 to determine whether each low-speed connection line is on or off, and displays 'Y' (indicating pass) or 'N' (indicating fail) on the display screen 80, and also displays the serial number of the connection line that fails the test on the display screen 80.

The HDMI cable 70 testing device can plug the two ends of the HDMI cable 70 into the input port 30 and the output port 20, output the test waveform through the output port 20 by the waveform generating circuit 40, and then analyze the error rate of the test waveform input by the input port 30 by the waveform analyzing circuit 50, so that the quality of the HDMI cable 70 can be quickly detected by the error rate, and the testing time and accuracy of the HDMI cable 70 production line can be accelerated.

In the several embodiments provided in the present disclosure, it should be understood that the disclosed systems and components may be implemented in other ways. It is obvious to a person skilled in the art that the invention is not restricted to details of the above-described exemplary embodiments, but that it can be implemented in other specific forms without departing from the spirit or essential characteristics of the invention. The present embodiments are therefore to be considered in all respects as illustrative and not restrictive, the scope of the invention being indicated by the appended claims rather than by the foregoing description, and all changes which come within the meaning and range of equivalency of the claims are therefore intended to be embraced therein. Any reference sign in a claim should not be construed as limiting the claim concerned. Furthermore, it is obvious that the word "comprising" does not exclude other elements or steps, and the singular does not exclude the plural. The terms first, second, etc. are used to denote names, but not any particular order.

The above embodiments are only used to illustrate the technical solutions of the present invention and not to limit the same, and although the present invention has been described in detail with reference to the above preferred embodiments, it should be understood by those skilled in the art that the technical solutions of the present invention can be modified or replaced equivalently without departing from the spirit and scope of the technical solutions of the present invention.

Claims

1. An HDMI cable test apparatus, comprising:

a waveform generating circuit for generating a test waveform;

the input port is used for plugging the HDMI cable;

2. The HDMI cable test apparatus of claim 1, further comprising a control circuit connected to the waveform generation circuit and the waveform analysis circuit, respectively, to control the waveform generation circuit to generate the test waveform and to control the waveform analysis circuit to analyze a bit error rate of the test waveform.

3. The HDMI cable test apparatus of claim 2, wherein the waveform generation circuit comprises one or more waveform generation chips to generate the test waveform.

4. The HDMI cable test apparatus of claim 3, wherein said waveform generating circuit comprises one or more waveform generating chips for generating standard error test waveforms with a rate of 750MHz, 1.5GHz, 3GHz, 6 GHz.

5. The HDMI cable test apparatus of claim 4, wherein the waveform generation chips are connected to the output ports through differential signal output line groups, respectively.

6. The HDMI cable test apparatus of claim 5, wherein said waveform analysis circuit comprises a signal error rate analysis chip corresponding to said waveform generation chip.

7. The HDMI cable test apparatus of claim 6, wherein the signal error rate analysis chips are respectively connected to the input ports through differential signal input line groups.

8. The HDMI cable test apparatus of claim 7, wherein the control circuit is connected to the output port and the input port to test the connection and disconnection of the HDMI cable.

9. The HDMI cable testing apparatus of claim 8, further comprising a display screen, wherein the display screen is connected to the control circuit, and the control circuit analyzes the error rate of the circuit and/or the on/off information of the HDMI cable according to the waveform.

10. The HDMI cable test apparatus of claim 9, wherein said display screen is an LCD display screen.