CN211826367U - Stitch detection imaging device - Google Patents
Stitch detection imaging device Download PDFInfo
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- CN211826367U CN211826367U CN202020187671.4U CN202020187671U CN211826367U CN 211826367 U CN211826367 U CN 211826367U CN 202020187671 U CN202020187671 U CN 202020187671U CN 211826367 U CN211826367 U CN 211826367U
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- stitch
- light source
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- light
- imaging device
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Abstract
The utility model provides a stitch detects imaging device, a serial communication port, include: an object stage, a light source and a camera device; the object stage is used for supporting an element to be tested; the light source is positioned on the side edge of the element to be measured and emits a plane light beam which vertically irradiates the free end part of the pin; the camera device is positioned above the pin and used for shooting the reflected light from the pin. The light source is arranged on the side edge of the element to be measured, and the plane light beams emitted by the light source are irradiated to the stitch tips of all the stitches, so that the camera device can only collect reflected light at the stitch positions, and stitch imaging of the element to be measured with high contrast can be acquired.
Description
Technical Field
The utility model relates to a stitch detects imaging device technical field, especially relates to a stitch detects imaging device.
Background
In the automatic production process of the circuit board, the electronic components with pins are assembled, and the pins of the electronic components are inserted into corresponding positions on the circuit board. In the assembling process, pins of the electronic element need to be detected and positioned so as to ensure that the finished circuit board can work normally.
In the prior art, the annular light source is arranged above the electronic element to irradiate the pins of the electronic element, and then reflected light on the pins of the electronic element is collected above the annular light source through the camera to obtain an image so as to realize detection and positioning of the pins. However, when the annular light source lights the pins of the electronic component, the peripheries of the pins are also illuminated, so that the imaging brightness of the pins is weakened.
Therefore, the brightness of the pin image in the prior art is not enough, so that the contrast of the pin detection image is not high.
SUMMERY OF THE UTILITY MODEL
In view of the above, the present invention has been made to provide a stitch detection imaging apparatus that overcomes or at least partially solves the above problems.
In order to solve the above problem, the utility model discloses a stitch detects imaging device, include: an object stage, a light source and a camera device;
the object stage is used for supporting an element to be tested;
the light source is positioned on the side edge of the element to be measured and emits a plane light beam which vertically irradiates the free end part of the pin;
the camera device is positioned above the pin and used for shooting the reflected light from the pin.
Optionally, the lighting device further comprises a cover plate, the cover plate is of an annular structure, and the light source is movably mounted below the cover plate.
Optionally, the number of the light sources is more than two, and the light sources are arranged on the side edge of the element to be tested in a surrounding mode through the cover plate.
Optionally, the light source includes the luminous body, is located the luminous body is close to the lens of stitch one side and fixes the top plate, the lower side plate of lens, be equipped with one between the top plate with the lower side plate and supply the clearance that the pencil passes through, the radial size of lens determines the size in clearance.
Optionally, an accommodating space is further provided between the upper side plate and the lower side plate, and the accommodating space is used for accommodating the light emitting body.
Optionally, the luminous body is an LED lamp panel.
Optionally, the lens is a convex lens.
The utility model discloses a following advantage: the plane light beam emitted by the light source irradiates the stitch tips of all the stitches, so that only reflected light of the stitch tips exists, and stitch imaging of the to-be-measured element with high contrast can be acquired.
Drawings
FIG. 1 is a block diagram of a first stitch detection imaging device according to the present invention;
FIG. 2 is a block diagram of a second stitch detection imaging device according to the present invention;
FIG. 3 is a block diagram of a third pin detection imaging device according to the present invention;
wherein, the stitch detection imaging device-1000; an object stage-100; a light source-200; a camera device-300; a cover plate-400; a device-500 to be tested; -a light emitter-210; a lens-220; an upper side plate-240; a lower side plate-230.
Detailed Description
In order to make the above objects, features and advantages of the present invention more comprehensible, the present invention is described in detail with reference to the accompanying drawings and the detailed description.
The utility model discloses an one of the core design lies in, through setting up the light source at the component side that awaits measuring to shine the plane light beam of light source transmission to the stitch point department of all stitches, make camera device only can gather the reverberation of stitch department, thereby can acquire the stitch formation of image of the higher component that awaits measuring of contrast.
The first embodiment is as follows:
referring to fig. 1, a block diagram of a first stitch detection imaging device 1000 according to the present invention is shown, which may specifically include: a stage 100, a light source 200, and an imaging device 300. The light source 200 is located above the side of the stage 100, and the specific height position may be determined according to the type of the dut 500. The camera device 300 is located above the object stage 100, and the shooting range of the camera device 300 covers the whole object stage 100; in this embodiment, the center line of the imaging device 300 coincides with the center line of the stage 100. The object carrying surface of the object carrying table 100 may be circular, square or oval; in this embodiment, the dut 500 is placed in the center of the stage 100.
The light source 200 emits a planar light beam that perpendicularly irradiates the free end of the pin of the dut 500. In this embodiment, the planar light beam emitted by the light source 200 covers all pins of the device under test 500 and irradiates from the pin tips of the pins to a position below the pin tips; certain position of stitch point lower part can be according to the effect decision that the formation of image was shot to needs, and the better the effect of shooting the formation of image, the position of stitch point lower part just is close to the stitch root more. The camera device 300 is located right above the pin and is used for shooting the reflected light of the plane light beam emitted by the light source 200 at the pin. All pins are irradiated by the plane light beam emitted by the light source 200, so that pin images of various types of elements 500 to be tested can be acquired; the planar light beam emitted by the light source 200 irradiates the stitch tips of all the stitches, so that only the reflected light of the stitch tips exists, and the stitch image of the to-be-measured element 500 with high contrast can be acquired.
Example two:
referring to fig. 2, a block diagram of a second stitch detection imaging device 1000 according to the present invention is shown, which may specifically include: a stage 100, a light source 200, and an imaging device 300. The light source 200 is located above the side of the stage 100, and the specific height position may be determined according to the type of the dut 500. The camera device 300 is located above the object stage 100, and the shooting range of the camera device 300 covers the whole object stage 100; in this embodiment, the center line of the imaging device 300 coincides with the center line of the stage 100. The object carrying surface of the object carrying table 100 may be circular, square or oval; in this embodiment, the dut 500 is placed in the center of the stage 100.
The light source 200 emits a planar light beam that perpendicularly irradiates the free end of the pin of the dut 500. In this embodiment, the planar light beam emitted by the light source 200 covers all pins of the device under test 500 and irradiates from the pin tips of the pins to a position below the pin tips; certain position of stitch point lower part can be according to the effect decision that the formation of image was shot to needs, and the better the effect of shooting the formation of image, the position of stitch point lower part just is close to the stitch root more. The camera device 300 is located right above the pin and is used for shooting the reflected light of the plane light beam emitted by the light source 200 at the pin. All pins are irradiated by the plane light beam emitted by the light source 200, so that pin images of various types of elements 500 to be tested can be acquired; the planar light beam emitted by the light source 200 irradiates the stitch tips of all the stitches, so that only the reflected light of the stitch tips exists, and the stitch image of the to-be-measured element 500 with high contrast can be acquired.
The stitch detection imaging device 1000 further comprises a cover plate 400, the cover plate 400 is of an annular structure, and the light source 200 is movably mounted below the cover plate 400. The cover 400 may block the light of the planar light beam from propagating to the image pickup device 300, so that the image pickup device 300 receives only the reflected light from the dut 500. The light source 200 is movable under the cover plate 400 in a direction close to the central axis of the stage 100 to adjust the intensity of the reflected light at the pins, thereby ensuring a high contrast in the pin image of the device 500 to be tested.
Example three:
referring to fig. 3, a block diagram of a third stitch detection imaging device 1000 according to the present invention is shown, which specifically includes: a stage 100, a light source 200, and an imaging device 300. The light source 200 is located above the side of the stage 100, and the specific height position may be determined according to the type of the dut 500. The camera device 300 is located above the object stage 100, and the shooting range of the camera device 300 covers the whole object stage 100; in this embodiment, the center line of the imaging device 300 coincides with the center line of the stage 100. The object carrying surface of the object carrying table 100 may be circular, square or oval; in this embodiment, the dut 500 is placed in the center of the stage 100.
The light source 200 emits a planar light beam that perpendicularly irradiates the free end of the pin of the dut 500. In this embodiment, the planar light beam emitted by the light source 200 covers all pins of the device under test 500 and irradiates from the pin tips of the pins to a position below the pin tips; certain position of stitch point lower part can be according to the effect decision that the formation of image was shot to needs, and the better the effect of shooting the formation of image, the position of stitch point lower part just is close to the stitch root more. The camera device 300 is located right above the pin and is used for shooting the reflected light of the plane light beam emitted by the light source 200 at the pin. All pins are irradiated by the plane light beam emitted by the light source 200, so that pin images of various types of elements 500 to be tested can be acquired; the planar light beam emitted by the light source 200 irradiates the stitch tips of all the stitches, so that only the reflected light of the stitch tips exists, and the stitch image of the to-be-measured element 500 with high contrast can be acquired.
The stitch detection imaging device 1000 further comprises a cover plate 400, the cover plate 400 is of an annular structure, and the light source 200 is movably mounted below the cover plate 400. The cover 400 may block the light of the planar light beam from propagating to the image pickup device 300, so that the image pickup device 300 receives only the reflected light from the dut 500. The light source 200 is movable under the cover plate 400 in a direction close to the central axis of the stage 100 to adjust the intensity of the reflected light at the pins, thereby ensuring a high contrast in the pin image of the device 500 to be tested.
The number of the light sources 200 is two or more, and the light sources 200 are disposed around the side of the dut 500 through the cover plate 400. The number of the light sources 200 may be multiple, and the specific number may be set according to actual needs. The light sources 200 are disposed on the cover plate 400 at equal intervals to irradiate the pins around the side of the device 500 to be tested, so as to further improve the contrast of the pin image of the device 500 to be tested.
Example four:
referring to fig. 3, a block diagram of a third stitch detection imaging device 1000 according to the present invention is shown, which specifically includes: a stage 100, a light source 200, and an imaging device 300. The light source 200 is located above the side of the stage 100, and the specific height position may be determined according to the type of the dut 500. The camera device 300 is located above the object stage 100, and the shooting range of the camera device 300 covers the whole object stage 100; in this embodiment, the center line of the imaging device 300 coincides with the center line of the stage 100. The object carrying surface of the object carrying table 100 may be circular, square or oval; in this embodiment, the dut 500 is placed in the center of the stage 100.
The light source 200 emits a planar light beam that perpendicularly irradiates the free end of the pin of the dut 500. In this embodiment, the planar light beam emitted by the light source 200 covers all pins of the device under test 500 and irradiates from the pin tips of the pins to a position below the pin tips; certain position of stitch point lower part can be according to the effect decision that the formation of image was shot to needs, and the better the effect of shooting the formation of image, the position of stitch point lower part just is close to the stitch root more. The camera device 300 is located right above the pin and is used for shooting the reflected light of the plane light beam emitted by the light source 200 at the pin. All pins are irradiated by the plane light beam emitted by the light source 200, so that pin images of various types of elements 500 to be tested can be acquired; the planar light beam emitted by the light source 200 irradiates the stitch tips of all the stitches, so that only the reflected light of the stitch tips exists, and the stitch image of the to-be-measured element 500 with high contrast can be acquired.
The stitch detection imaging device 1000 further comprises a cover plate 400, the cover plate 400 is of an annular structure, and the light source 200 is movably mounted below the cover plate 400. The cover 400 may block the light of the planar light beam from propagating to the image pickup device 300, so that the image pickup device 300 receives only the reflected light from the dut 500. The light source 200 is movable under the cover plate 400 in a direction close to the central axis of the stage 100 to adjust the intensity of the reflected light at the pins, thereby ensuring a high contrast in the pin image of the device 500 to be tested.
The number of the light sources 200 is two or more, and the light sources 200 are disposed around the side of the dut 500 through the cover plate 400. The number of the light sources 200 may be multiple, and the specific number may be set according to actual needs. The light sources 200 are disposed on the cover plate 400 at equal intervals to irradiate the pins around the side of the device 500 to be tested, so as to further improve the contrast of the pin image of the device 500 to be tested.
The light source 200 includes a light emitter 210, a lens 220 located on one side of the light emitter 210 close to the pins, and an upper side plate 240 and a lower side plate 230 for fixing the lens 220, wherein a gap for light beams to pass through is provided between the upper side plate 240 and the lower side plate 230. The lens 220 is fixed at a central section between the upper side plate 240 and the lower side plate 230, the light emitter 210 and the gap are respectively located at two sides of the lens 220, and the lens 220, the light emitter 210 and the gap are on the same axis. The size of the gap can be adjusted by changing the radial dimension of the lens 220, so as to change the position of the planar beam irradiated to the lower part of the pin tip, thereby realizing the adjustment of the contrast of the pin imaging of the element 500 to be measured.
An accommodating space is further disposed between the upper side plate 240 and the lower side plate 230, and the accommodating space is used for accommodating the light emitter 210. The accommodating space is formed by enclosing the upper side plate and the lower side plate and is positioned at one end opposite to the gap. The light emitting body 210 is installed in the receiving space between the upper side plate 240 and the lower side plate 230, so that the internal structural layout of the light source 200 can be optimized.
Finally, it should also be noted that, herein, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or terminal that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or terminal. The term "comprising" is used to specify the presence of stated elements, but not necessarily the presence of stated elements, unless otherwise specified.
The pin detection imaging device provided by the present invention is introduced in detail, and the principle and the implementation of the present invention are explained by applying specific examples, and the descriptions of the above examples are only used to help understanding the method and the core idea of the present invention; meanwhile, for the general technical personnel in the field, according to the idea of the present invention, there are changes in the specific implementation and application scope, to sum up, the content of the present specification should not be understood as the limitation of the present invention.
Claims (7)
1. A stitch detection imaging device, comprising: an object stage, a light source and a camera device;
the object stage is used for supporting an element to be tested;
the light source is positioned on the side edge of the element to be measured and emits a plane light beam which vertically irradiates the free end part of the pin;
the camera device is positioned above the pin and used for shooting the reflected light from the pin.
2. The stitch detection imaging device according to claim 1, further comprising a cover plate, wherein the cover plate is a ring structure, and the light source is movably mounted below the cover plate.
3. The stitch detecting and imaging device according to claim 2, wherein the number of the light sources is two or more, and the light sources are disposed around the side of the device under test through the cover plate.
4. The pin detection imaging device according to claim 1, wherein the light source comprises a light emitter, a lens located on a side of the light emitter close to the pin, and an upper side plate and a lower side plate for fixing the lens, a gap for light beams to pass through is provided between the upper side plate and the lower side plate, and a radial dimension of the lens determines a size of the gap.
5. The stitch detection imaging device according to claim 4, wherein an accommodating space is further provided between the upper side plate and the lower side plate, and the accommodating space is used for accommodating the light emitter.
6. The stitch detection imaging device according to claim 4, wherein the light emitter is an LED lamp panel.
7. The stitch detection imaging device according to claim 5, wherein the lens is a convex lens.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202020187671.4U CN211826367U (en) | 2020-02-19 | 2020-02-19 | Stitch detection imaging device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202020187671.4U CN211826367U (en) | 2020-02-19 | 2020-02-19 | Stitch detection imaging device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN211826367U true CN211826367U (en) | 2020-10-30 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202020187671.4U Active CN211826367U (en) | 2020-02-19 | 2020-02-19 | Stitch detection imaging device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN211826367U (en) |
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2020
- 2020-02-19 CN CN202020187671.4U patent/CN211826367U/en active Active
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