CN101839868A - Illumination source for detecting SMT welding quality and detecting system - Google Patents
Illumination source for detecting SMT welding quality and detecting system Download PDFInfo
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- CN101839868A CN101839868A CN200910105957A CN200910105957A CN101839868A CN 101839868 A CN101839868 A CN 101839868A CN 200910105957 A CN200910105957 A CN 200910105957A CN 200910105957 A CN200910105957 A CN 200910105957A CN 101839868 A CN101839868 A CN 101839868A
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Abstract
The invention is applied to the field of illumination, and provides an illumination source for detecting the SMT welding quality and a detecting system. The illumination source comprises three groups of lamps which are arranged from the bottom end to the top end of a lamp holder in sections, wherein the first section is provided with a first group of lamps, the second section is provided with a second group of lamps, and the third section is provided with a third group of lamps; the first, second and third groups of lamps all comprises a plurality of LED lamps; each LED lamp comprises a red LED, a green LED and a blue LED; the emitting color of each LED lamp is controlled by a computer according to the angle and gradient of a detected object; and the SMT welding quality is detected according to the result from sampling analysis of the detected object after being reflected by an image acquisition module. The illumination source provided by the invention can easily distinguish the background color from the image characteristic of the detected object through different emitting groups so as to easily distinguish the characteristics of the detected object with different angles or gradients.
Description
Technical field
The invention belongs to the light illumination field, relate in particular to a kind of lighting source and detection system that is used to detect the SMT welding quality.
Background technology
Surface installation technique, also be surface mounting technology (Surface Mounted Technology, SMT) be a kind of technology in the electronics assembling industry, its technology inscape comprises: printing (or some glue), mount, curing, reflow soldering, cleaning, detect, reprocess; Wherein, the effect of detection is that (Printed Circuit Board PCB) carries out the detection of welding quality and assembly quality to the printed circuit board (PCB) that assembles; The equipment that uses in the testing process has magnifier, microscope, on-line testing instrument (In Circuit Tester, ICT), flying probe tester, automated optical detect (Automated Optical Inspection, AOI), X-RAY detection system, functional tester etc.; In the process that detects, need lighting source that pcb board is shone, and measured object is carried out sample analysis, thereby understand the scolding tin quality condition of SMT face of weld element according to pcb board reflection back; Do over again by reprocessing the pcb board that detection is broken down again.
Existing lighting source is to have only the brightness difference when adopting the monochromatic light of common scolding tin to shine for the object on the Different Plane; Little for the brightness difference that the object of differing tilt angles is reflective; When by the software image sample analysis, difficulty is big, analysis is inaccurate like this; Simultaneously, even shine scolding tin on the pcb board from a plurality of angle different colours, because lighting source only to the object reflection of some angle effectively, and the light source of constant color can not be taken into account the testee of different colours; Often can't distinguish the feature of background color and testee, cause and judge difficulty; Therefore when image recognition is used, adopt the lamp of traditional a plurality of constant color also can't effectively discern for Different Plane or inclined-plane.
Summary of the invention
The purpose of the embodiment of the invention is to provide a kind of lighting source that is used to detect the SMT welding quality, be intended to solve the light illumination that existing lighting source adopts constant color, the feature that can not distinguish background color and testee causes detecting the problem of identification difficulty.
The embodiment of the invention is achieved in that a kind of lighting source that is used to detect the SMT welding quality, and described lighting source comprises three groups of lamps, is provided with to the top segmentation along the bottom of lamp bracket; First section is provided with first group of lamp, and second section is provided with second group of lamp, and the 3rd section is provided with the 3rd group of lamp; Described first group of lamp, second group of lamp and the 3rd group of lamp include many LED lamps, and every LED lamp comprises red LED, green LED and blue led respectively; According to the angle of measured object and degree of tilt glow color by described every the LED lamp of computer control; And according to the situation that is detected the SMT welding quality after the described measured object reflection by the result of image collection module sample analysis.
Another purpose of the embodiment of the invention is to provide a kind of detection system that is used to detect the SMT welding quality, described detection system comprises: computing machine is used for the lighting source that throws light on to measured object and is used to obtain the image after measured object reflects and it is carried out the image collection module of analyzing and processing by what computing machine output IO control interface was connected with described computing machine; Described lighting source is above-mentioned lighting source.
The lighting source that the embodiment of the invention provides is provided with three groups of lamps in the bottom along lamp bracket to the top segmentation, and every group of lamp includes many LED lamps, and every LED lamp comprises red LED, green LED and blue led respectively; By the glow color of every LED lamp of computer control and according to the situation that is detected the SMT welding quality after the measured object reflection by the result of image collection module sample analysis; Can distinguish the characteristics of image of background color and testee easily by different luminous group like this, thereby make the feature of testee of different angles or different degree of tilt be identified easily.
Description of drawings
Fig. 1 is that the embodiment of the invention provides a kind of modular structure figure that is used to detect the detection system of SMT welding quality;
Fig. 2 is that the embodiment of the invention provides a kind of circuit diagram that is used for detecting every LED lamp of lighting source of SMT welding quality;
Fig. 3 is that the embodiment of the invention provides a kind of wiring layout that is used to detect the lighting source of SMT welding quality.
Embodiment
In order to make purpose of the present invention, technical scheme and advantage clearer,, the present invention is further elaborated below in conjunction with drawings and Examples.Should be appreciated that specific embodiment described herein only in order to explanation the present invention, and be not used in qualification the present invention.
The lighting source that the embodiment of the invention provides is provided with three groups of lamps in the bottom along lamp bracket to the top segmentation, and every group of lamp includes many LED lamps, and every LED lamp comprises red LED, green LED and blue led respectively; By the glow color of every LED lamp of computer control and according to the situation that is detected the SMT welding quality after the measured object reflection by the result of image collection module sample analysis; Can distinguish the characteristics of image of background color and testee easily by different luminous group like this, thereby make the feature of testee of different angles or different degree of tilt be identified easily.
The lighting source that the embodiment of the invention provides mainly is to be used for throwing light on to detecting the SMT welding quality; A kind of modular structure of the detection system that is used to detect the SMT welding quality for convenience of explanation, only shows the part relevant with the embodiment of the invention as shown in Figure 1, and details are as follows.
Detection system comprises computing machine 1, lighting source 2 and image collection module 3; Wherein, lighting source 2 is connected with computing machine 1 by computing machine output IO control interface, is used for to measured object 3 illuminations; Image collection module 3 is used to obtain the image after measured object 3 reflections and it is carried out analyzing and processing.
In embodiments of the present invention, lighting source 2 comprises three groups of lamps, is provided with to the top segmentation along the bottom of lamp bracket; First section is provided with first group of lamp, and second section is provided with second group of lamp, and the 3rd section is provided with the 3rd group of lamp; Wherein, first group of lamp, second group of lamp and the 3rd group of lamp include many LED lamps, and every LED lamp includes red LED, green LED and blue led; According to the angle of measured object and degree of tilt glow color by every LED lamp of computer control; And according to the situation that is detected the SMT welding quality after measured object 3 reflections by the result of image collection module 4 sample analysis.
As one embodiment of the present of invention, can control every red LED, green LED and blue led in the LED lamp by computing machine all lights, also can control every red LED, green LED and blue led in the LED lamp and partly light, can also make it to light according to the frequency scintillation of a certain setting.Wherein, red LED, green LED and blue led can become yi word pattern to arrange, and also can be positioned over the place, three summits of equilateral triangle respectively, are packaged into a LED lamp then.
In embodiments of the present invention, first group of lamp is the low angle lamp, and the angle of low angle lamp and surface level is greater than 60 ° and less than 90 °; Second group of lamp is intermediate lamp, and the angle of intermediate lamp and surface level is greater than 25 ° and less than 60 °; The 3rd group of lamp is ceiling light, and the angle of ceiling light and surface level is less than 25 °.
As one embodiment of the present of invention, Fig. 2 shows the circuit diagram of every LED lamp; For convenience of explanation, only show the part relevant with the embodiment of the invention, details are as follows.
Every low angle lamp 251 comprises red LED R1, green LED G1, blue led B1; Wherein, the plus earth of red LED R1, the anode of red LED R1 is connected to the emitter of the first transistor Q11, and the collector of the first transistor Q11 connects power supply VCC1, and the control end of the first transistor Q11 is connected to computing machine output IO control interface 100; The plus earth of green LED G1, the anode of green LED G1 is connected to the emitter of transistor seconds Q12, and the collector of transistor seconds Q12 connects power supply VCC1, and the control end of transistor seconds Q12 is connected to computing machine output IO control interface 100; The plus earth of blue led B1, the anode of blue led B1 is connected to the emitter of the 3rd transistor Q13, and the collector of the 3rd transistor Q13 connects power supply VCC1, and the control end of the 3rd transistor Q13 is connected to computing machine output IO control interface 100.Wherein, power supply VCC1 is the 24v constant current source; This constant current source adopts split conductor, and this split conductor is connected with red LED R1, green LED G1 and blue led B1 respectively, controls red LED R1, green LED G1 respectively and blue led B1 is luminous.
Every intermediate lamp 221 comprises red LED R2, green LED G2, blue led B2; Wherein, the plus earth of red LED R2, the anode of red LED R2 is connected to the emitter of the first transistor Q21, and the collector of the first transistor Q21 connects power supply VCC2, and the control end of the first transistor Q21 is connected to computing machine output IO control interface 100; The plus earth of green LED G2, the anode of green LED G2 is connected to the emitter of transistor seconds Q22, and the collector of transistor seconds Q22 connects power supply VCC2, and the control end of transistor seconds Q22 is connected to computing machine output IO control interface 100; The plus earth of blue led B2, the anode of blue led B2 is connected to the emitter of the 3rd transistor Q23, and the collector of the 3rd transistor Q23 connects power supply VCC2, and the control end of the 3rd transistor Q23 is connected to computing machine output IO control interface 100.Wherein, power supply VCC2 also is the 24v constant current source; This constant current source adopts split conductor, and this split conductor is connected with red LED R2, green LED G2 and blue led B2 respectively, controls red LED R2, green LED G2 respectively and blue led B2 is luminous.
Every ceiling light 211 comprises red LED R3, green LED G3, blue led B3; Wherein, the plus earth of red LED R3, the anode of red LED R3 is connected to the emitter of the first transistor Q31, and the collector of the first transistor Q31 connects power supply VCC3, and the control end of the first transistor Q31 is connected to computing machine output IO control interface 100; The plus earth of green LED G3, the anode of green LED G3 is connected to the emitter of transistor seconds Q32, and the collector of transistor seconds Q32 connects power supply VCC3, and the control end of transistor seconds Q32 is connected to computing machine output IO control interface 100; The plus earth of blue led B3, the anode of blue led B3 is connected to the emitter of the 3rd transistor Q33, and the collector of the 3rd transistor Q33 connects power supply VCC3, and the control end of the 3rd transistor Q33 is connected to computing machine output IO control interface 100.Wherein, power supply VCC3 also is the 24v constant current source; Simultaneously, this constant current source adopts split conductor, and this split conductor is connected with red LED R3, green LED G3 and blue led B3 respectively, controls red LED R3, green LED G3 respectively and blue led B3 is luminous.
Fig. 3 shows the wiring layout of this lighting source; Wherein, 21 are that the zones of light focal plane, 28 representatives are Image Acquisition effective field of view scope for lamp bracket filler ring, 27 for low angle lamp lamp bracket, 26 for lamp bracket retaining ring, 25 for the monolithic case of lighting source, 24 for intermediate lamp lamp bracket, 23 for ceiling light lamp bracket, 22; First group of lamp is installed on the low angle lamp lamp bracket 25, and second group of lamp is installed on the intermediate lamp lamp bracket 22, and the 3rd group of lamp is installed on the ceiling light lamp bracket 21; Measured object 3 is positioned on the light focal plane 27, and every group of lamp includes many LED lamps, and every LED lamp includes red LED, green LED and blue led; According to the angle of measured object 3 and degree of tilt glow color by every LED lamp of computing machine 1 control; Again according to the situation that is detected the SMT welding quality behind measured object 3 vertical reflections by Image Acquisition effective field of view scope 28 by the result of image collection module 4 sample analysis.
In embodiments of the present invention, first group of lamp (low angle lamp) comprises more than 800 LED lamp, is uniformly distributed on the low angle lamp lamp bracket 25; Second group of lamp (intermediate lamp) comprises more than 600 LED lamp, is uniformly distributed on the intermediate lamp lamp bracket 22; The 3rd group of lamp (ceiling light) comprises more than 400 LED lamp, is uniformly distributed on the ceiling light lamp bracket 21; Luminous even in order to make, the position distribution hole of every LED lamp needs elder generation's precise on the numerical control scale-division dish locate postpone, the more identical LED lamp of each parameter is welded on the fixed support, then totally assembling.As one embodiment of the present of invention, every LED lamp is tack LED lamp, and the 100mm irradiating angle of each tack LED lamp is greater than 10 ° and less than 25 °.
As one embodiment of the present of invention, the monolithic case 23 of lighting source adopts the aluminium alloy of thickness greater than 1.5mm.In order evenly to control the position of every LED lamp, aluminum alloy casing also need assembling again after preestablishing processing on the numerical control scale-division dish.
In embodiments of the present invention, this lighting source can be a pyramid type, also can be four stupefied tapered.Every LED lamp can be launched three kinds of primary colours of red, green, blue separately or synthesize other different colors by three kinds of groups of primaries, from the dome position, from different angular illumination measured objects 3.For example when the ceiling light red-emitting and the background of measured object 3 when also being redness, a brown object of distinguishing under the red background is very difficult, if at this moment the ruddiness with ceiling light emission becomes green glow, so red background not reflective or reflective more weak, brightness is very dark; And brown object is just highlighted the reflection of green glow, and test easily becomes.Because the color of production scene measured object 3 is unfixed in the practical application, can shine the feature of effectively discerning measured object 3 by the light that adopts different colours by the glow color of every LED lamp of computing machine 1 control.
As one embodiment of the present of invention, computing machine 1 can be controlled ceiling light red-emitting, intermediate lamp transmitting green light, low angle lamp emission blue light; Can also control ceiling light transmitting green light, intermediate lamp red-emitting, low angle lamp emission blue light; Also can control all lamps generation white light that all brightens simultaneously; This just need be according to the angle of measured object 3 and bias light difference different with degree of tilt depend on the circumstances; When measured object 3 during in the different background color, color and measured object 3 inverses of the light of ceiling light emission are set, system just preserves corresponding setting automatically, effectively avoided employing fixedly monochromatic light useful information is submerged in puzzlement in the background.
The lighting source that the embodiment of the invention provides is provided with three groups of lamps in the bottom along lamp bracket to the top segmentation, and every group of lamp includes many LED lamps, and every LED lamp comprises red LED, green LED and blue led respectively; By the glow color of every LED lamp of computer control and according to the situation that is detected the SMT welding quality after the measured object reflection by the result of image collection module sample analysis; Can distinguish the characteristics of image of background color and testee easily by different luminous group like this, thereby make the feature of testee of different angles or different degree of tilt be identified easily.
The above only is preferred embodiment of the present invention, not in order to restriction the present invention, all any modifications of being done within the spirit and principles in the present invention, is equal to and replaces and improvement etc., all should be included within protection scope of the present invention.
Claims (10)
1. a lighting source that is used to detect the SMT welding quality is characterized in that, described lighting source comprises three groups of lamps, is provided with to the top segmentation along the bottom of lamp bracket; First section is provided with first group of lamp, and second section is provided with second group of lamp, and the 3rd section is provided with the 3rd group of lamp; Described first group of lamp, second group of lamp and the 3rd group of lamp include many LED lamps, and every LED lamp comprises red LED, green LED and blue led respectively; According to the angle of measured object and degree of tilt glow color by described every the LED lamp of computer control; And according to the situation that is detected the SMT welding quality after the described measured object reflection by the result of image collection module sample analysis.
2. lighting source as claimed in claim 1 is characterized in that, red LED, green LED and the blue led in described every the LED lamp of described computer control all lighted or part is lighted or lighted according to a certain frequency scintillation.
3. lighting source as claimed in claim 1, it is characterized in that, the plus earth of described red LED, the anode of described red LED is connected to the emitter of the first transistor, the collector of the first transistor connects power supply, and the control end of the first transistor is connected to computing machine output IO control interface; The plus earth of described green LED, the anode of described green LED is connected to the emitter of transistor seconds, and the collector of transistor seconds connects power supply, and the control end of transistor seconds is connected to computing machine output IO control interface; The plus earth of described blue led, the anode of described blue led are connected to the 3rd transistorized emitter, and the 3rd transistorized collector connects power supply, and the 3rd transistorized control end is connected to computing machine output IO control interface.
4. lighting source as claimed in claim 3 is characterized in that, described power supply is the 24v constant current source.
5. lighting source as claimed in claim 4 is characterized in that, described constant current source adopts split conductor, and described split conductor is connected with described red LED, green LED and blue led respectively, and it is luminous to control described red LED, green LED and blue led respectively.
6. lighting source as claimed in claim 1 is characterized in that, the angle of described first group of lamp and surface level is greater than 60 ° and less than 90 °; The angle of described second group of lamp and surface level is greater than 25 ° and less than 60 °; The angle of described the 3rd group of lamp and surface level is less than 25 °.
7. lighting source as claimed in claim 1 is characterized in that, described red LED, green LED and the blue led in described every LED lamp becomes yi word pattern to arrange or be positioned over respectively the place, three summits of equilateral triangle.
8. lighting source as claimed in claim 1 is characterized in that, described every LED lamp is tack LED lamp, and the 100mm irradiating angle of each tack LED lamp is greater than 10 ° and less than 25 °.
9. lighting source as claimed in claim 1 is characterized in that described lighting source further comprises the shell that is fixed on the described lamp bracket, and described lamp bracket is a pyramid type or four stupefied tapered.
10. a detection system that is used to detect the SMT welding quality is characterized in that, described detection system comprises:
Computing machine;
The lighting source that throws light on to measured object by computing machine output IO control interface being used for of being connected with described computing machine; Described lighting source is each described lighting source of claim 1-9; And
Be used to obtain the image after the measured object reflection and it is carried out the image collection module of analyzing and processing.
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| Application Number | Priority Date | Filing Date | Title |
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| CN200910105957A CN101839868A (en) | 2009-03-10 | 2009-03-10 | Illumination source for detecting SMT welding quality and detecting system |
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| CN200910105957A CN101839868A (en) | 2009-03-10 | 2009-03-10 | Illumination source for detecting SMT welding quality and detecting system |
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Cited By (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102033072A (en) * | 2010-10-30 | 2011-04-27 | 华南理工大学 | Light source for optical automatic detector |
| CN102520537A (en) * | 2011-12-02 | 2012-06-27 | 深圳市华星光电技术有限公司 | Automatic optical inspection method and automatic optical inspection equipment |
| CN106550516A (en) * | 2015-09-21 | 2017-03-29 | 大族激光科技产业集团股份有限公司 | A kind of flying probe tester light-source system and its control method |
| CN107514576A (en) * | 2017-09-26 | 2017-12-26 | 李劲松 | A kind of LED annular light sources for vision-based detection illumination |
| CN108240990A (en) * | 2018-03-22 | 2018-07-03 | 深圳市永光神目科技有限公司 | A kind of scolding tin defect detecting system |
| CN108535262A (en) * | 2018-03-22 | 2018-09-14 | 深圳市永光神目科技有限公司 | A kind of light-source structure and scolding tin defect detecting system |
| CN111721782A (en) * | 2020-06-28 | 2020-09-29 | 苏州天准科技股份有限公司 | Optical detection device |
| CN112020435A (en) * | 2018-05-16 | 2020-12-01 | 惠普发展公司，有限责任合伙企业 | Determining reflected light intensity of a light source |
| CN112415022A (en) * | 2020-10-12 | 2021-02-26 | 安徽美阅文化发展股份有限公司 | Method for rapidly detecting printing and binding quality of printed matter |
| CN112540454A (en) * | 2020-11-11 | 2021-03-23 | 中国航发贵州黎阳航空动力有限公司 | Auxiliary device and method for acquiring grain orientation imaging graph |
| TWI756777B (en) * | 2020-08-10 | 2022-03-01 | 輝視科技股份有限公司 | Lamp structure for optical inspection |
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2009
- 2009-03-10 CN CN200910105957A patent/CN101839868A/en active Pending
Cited By (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102033072A (en) * | 2010-10-30 | 2011-04-27 | 华南理工大学 | Light source for optical automatic detector |
| CN102520537A (en) * | 2011-12-02 | 2012-06-27 | 深圳市华星光电技术有限公司 | Automatic optical inspection method and automatic optical inspection equipment |
| CN102520537B (en) * | 2011-12-02 | 2015-02-11 | 深圳市华星光电技术有限公司 | Automatic optical inspection method and automatic optical inspection equipment |
| CN106550516A (en) * | 2015-09-21 | 2017-03-29 | 大族激光科技产业集团股份有限公司 | A kind of flying probe tester light-source system and its control method |
| CN106550516B (en) * | 2015-09-21 | 2020-01-14 | 大族激光科技产业集团股份有限公司 | Light source system of flying probe tester and control method thereof |
| CN107514576A (en) * | 2017-09-26 | 2017-12-26 | 李劲松 | A kind of LED annular light sources for vision-based detection illumination |
| CN108535262A (en) * | 2018-03-22 | 2018-09-14 | 深圳市永光神目科技有限公司 | A kind of light-source structure and scolding tin defect detecting system |
| CN108240990A (en) * | 2018-03-22 | 2018-07-03 | 深圳市永光神目科技有限公司 | A kind of scolding tin defect detecting system |
| CN112020435A (en) * | 2018-05-16 | 2020-12-01 | 惠普发展公司，有限责任合伙企业 | Determining reflected light intensity of a light source |
| US11285733B2 (en) | 2018-05-16 | 2022-03-29 | Hewlett-Packard Development Company, L.P. | Determining reflected light intensities of light sources |
| CN111721782A (en) * | 2020-06-28 | 2020-09-29 | 苏州天准科技股份有限公司 | Optical detection device |
| TWI756777B (en) * | 2020-08-10 | 2022-03-01 | 輝視科技股份有限公司 | Lamp structure for optical inspection |
| CN112415022A (en) * | 2020-10-12 | 2021-02-26 | 安徽美阅文化发展股份有限公司 | Method for rapidly detecting printing and binding quality of printed matter |
| CN112540454A (en) * | 2020-11-11 | 2021-03-23 | 中国航发贵州黎阳航空动力有限公司 | Auxiliary device and method for acquiring grain orientation imaging graph |
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Application publication date: 20100922 |