CN211785654U

CN211785654U - Single-layer chip type ceramic dielectric capacitor test fixture

Info

Publication number: CN211785654U
Application number: CN201922386655.8U
Authority: CN
Inventors: 谢艺精; 潘甲东; 严勇; 刘剑林
Original assignee: Fujian Mmelec Electronics Co ltd
Current assignee: Guangzhou Tianji Electronic Technology Co.,Ltd.
Priority date: 2019-12-26
Filing date: 2019-12-26
Publication date: 2020-10-27
Anticipated expiration: 2029-12-26

Abstract

The utility model provides a single-layer piece formula porcelain capacitor test fixture, including a plurality of upper electrodes, a plurality of bottom electrodes, top board and holding down plate are the circuit board, and the upper electrode sets up in the top board, and the bottom electrode sets up in the holding down plate, goes up electrode and bottom electrode one-to-one, and piece formula electronic component presss from both sides between upper electrode and bottom electrode, need not the numerous and diverse operation of welded, has avoided traditional welding jig to cause destruction, can not reuse, the problem that test accuracy is low to the product.

Description

Single-layer chip type ceramic dielectric capacitor test fixture

Technical Field

The utility model relates to a power electronics field, concretely relates to individual layer piece formula porcelain capacitor test fixture.

Background

The single-layer chip ceramic dielectric capacitor needs to be subjected to a low-voltage moisture resistance test in the production process so as to ensure the quality, environmental adaptability and reliability of the product. The conventional jig practice is to weld the product to the glass brazing sheet and then perform the test. The method is easy to damage products, cannot be repeatedly used, and has low testing accuracy and the like. In the process of testing the low-voltage moisture-proof characteristic of the capacitor, the product and the clamp are required to be put into a high-low temperature alternating-humidity-heat test box, the reliability of the clamp is greatly influenced by the impact of 85% humidity environment, and the test is not accurate. The wet environment in the clamp at 85 ℃ is easy to cause the short circuit phenomenon caused by the conduction between products, the measurement is invalid, and the capacity value cannot be tested. Meanwhile, the traditional clamp is not easy to place a capacitor and is easy to damage a gold layer electrode of the capacitor, and the reliability and the result of the test are influenced, so that the traditional clamp has great defects.

SUMMERY OF THE UTILITY MODEL

In order to solve the test requirement that traditional test fixture can't satisfy the moisture-proof characteristic of condenser low-voltage, to the defect that exists among the prior art, the utility model aims at providing a single-deck piece formula porcelain capacitor test fixture that efficiency of software testing is high, the detection accuracy is high, easy and simple to handle, difficult emergence short circuit.

The utility model discloses a following technical scheme realizes:

a single-layer chip type ceramic dielectric capacitor test fixture comprises a plurality of upper electrodes, a plurality of lower electrodes, an upper pressing plate and a lower pressing plate, wherein the upper pressing plate and the lower pressing plate are circuit boards, the upper electrodes are arranged on the upper pressing plate, the lower electrodes are arranged on the lower pressing plate, the upper electrodes correspond to the lower electrodes one to one, and chip type electronic elements are clamped between the upper electrodes and the lower electrodes.

Furthermore, the device also comprises a spring thimble, wherein the spring thimble is fixedly connected with the upper electrode, and the upper electrode is contacted with the sheet type electronic element through the spring thimble.

Further, the spring thimble includes thimble head, thimble seat and spring, and thimble seat prelude is provided with the throat of mutually supporting with thimble head afterbody and prevents that the thimble head from deviating from, and the thimble seat is hollow structure, and the spring sets up in the thimble seat, links to each other with thimble head bottom.

Further, still include locking mechanism, top board and lower clamp plate edge are provided with and are locked mechanism complex perforation, and locking mechanism includes a plurality of bolts and a plurality of nut, and the bolt passes perforation and nut one-to-one cooperation.

Further, the through holes are symmetrically arranged along the centers of the upper pressing plate and the lower pressing plate.

Furthermore, the lower electrode is provided with a groove, and the shape of the groove is matched with the appearance of the chip electronic component.

Furthermore, the upper pressing plate and the lower pressing plate are provided with air holes.

Furthermore, the upper pressing plate and the lower pressing plate are both made of temperature-resistant and moisture-resistant materials.

Furthermore, the upper electrode and the lower electrode are subjected to special metallization treatment, and the surfaces of the upper electrode and the lower electrode are hardened gold-plated layers.

The testing device further comprises a power supply positive interface arranged on the upper pressing plate and a power supply negative interface arranged on the lower pressing plate, the upper electrode is connected with the power supply positive interface, the negative electrode is connected with the power supply negative interface, and the testing wires are respectively led out from the power supply positive interface and the power supply negative interface.

The utility model discloses following beneficial effect has:

1. the utility model discloses a contact's anchor clamps need not the tedious operation of welded, have avoided traditional welding jig to cause the problem that destruction, can not reuse, test accuracy are low to the product, reach piece formula electronic component's harmless performance measurement, reduce measurement operation by a wide margin.

2. The utility model discloses can once only test a plurality of products, the station can add according to the demand.

3. The locking mechanism can ensure that the product has good contact performance in the detection process.

4. The spring thimble plays the cushioning effect and can guarantee that the product can not cause external damage because of locking mechanism's external force.

5. The recess that the bottom electrode set up plays the effect of constant head tank, makes the product place the back difficult for moving into.

6. The upper plate and the lower plate are provided with air holes and adopt temperature-resistant and moisture-resistant materials, so that the environment of the clamp between the test clamp internal environment and the high-low temperature alternating damp-heat test box is closer, and the product can be prevented from being short-circuited due to the fact that water vapor is condensed between test positions due to different temperature differences inside and outside the clamp when the product is tested.

7. The upper electrode and the lower electrode are subjected to special metallization treatment, the surfaces of the upper electrode and the lower electrode are hardened gold-plated layers, the upper electrode and the lower electrode are not easy to oxidize and wear, and the upper electrode and the lower electrode are matched with gold electrodes of sheet-shaped electronic elements, so that the test is more accurate.

Drawings

The present invention will be described in further detail with reference to the accompanying drawings.

Fig. 1 is a side cross-sectional view of the present invention;

FIG. 2 is a single-layer chip ceramic capacitor;

FIG. 3 is a top view of the upper platen;

FIG. 4 is a top view of the lower platen;

FIG. 5 is a side cross-sectional view of a pogo pin.

The labeled information in the graph is:

the device comprises an upper pressing plate 1, a lower pressing plate 2, an upper electrode 3, a lower electrode 4, a locking device 5, an air hole 6, a single-layer sheet type ceramic dielectric capacitor 8, a test lead 9, a spring thimble 31, a groove 41, a perforation 51, a bolt 52, a nut 53, a power supply positive electrode interface 71, a power supply negative electrode interface 72, a capacitor upper electrode 81, a capacitor lower electrode 82, a capacitor ceramic body 83, a thimble head 311, a thimble seat 312 and a spring 313.

Detailed Description

The utility model provides a single-layer piece formula porcelain dielectric capacitor test fixture, including top board 1, holding down plate 2, thirty six upper electrodes 3, thirty six bottom electrodes 4 and locking device 5, upper electrodes 3 sets up in top board 1, and bottom electrodes 4 set up in holding down plate 2, and upper electrodes 3 and bottom electrodes 4 one-to-one need not welded tedious operation through the anchor clamps of contact, have avoided traditional welding jig to cause the product to destroy, can not reuse, test the low problem of accuracy, reach the harmless performance measurement of piece formula electronic component, reduce measuring operation by a wide margin; a plurality of products can be tested at one time, and stations can be added according to requirements. The upper electrode 3 and the lower electrode 4 are subjected to special metallization treatment, the surfaces of the electrodes are hardened gold-plated layers, the electrodes are not easy to oxidize and wear, and the electrodes are matched with gold electrodes of the sheet-shaped electronic elements, so that the test is more accurate. Thirty-six spring thimbles 31 are fixedly welded on the upper electrode 3, each spring thimble 31 comprises a thimble head 311, a thimble seat 312 and a spring 313, a necking 314 matched with the tail of the thimble head 311 is arranged at the head of the thimble seat 312 to prevent the thimble head from falling off, the thimble seat 312 is of a hollow structure, and the spring 313 is arranged in the thimble seat 312 and connected with the bottom of the thimble head 311. The single-layer chip type ceramic dielectric capacitor 8 is clamped between the spring thimble 31 connected with the upper electrode 3 and the lower electrode 4, and the spring thimble 31 plays a role in buffering to ensure that the product cannot be externally damaged due to the external force of the locking mechanism. The lower electrode 4 is provided with a groove 41, and the shape of the groove 41 is matched with the appearance of the chip electronic component, so that the groove is positioned, and a product is not easy to move after being placed. The locking device 5 comprises four bolts 52 and four nuts 53, the upper pressure plate 1 and the lower pressure plate 2 are respectively provided with four through holes 51 matched with the locking device 5, the through holes 51 are symmetrically arranged along the centers of the upper pressure plate 1 and the lower pressure plate 2, and the bolts 52 penetrate through the through holes 51 to be matched with the nuts 53, so that good contact performance of products in the detection process is guaranteed. The upper press plate 1 and the lower press plate 2 are made of temperature-resistant and moisture-resistant materials and are provided with thirty-six air holes 6, so that the environment of the clamp between the test clamp internal environment and the high-low temperature alternating damp-heat test box is closer, and the product can be prevented from being short-circuited due to the fact that water vapor is condensed between test positions due to different temperature differences inside and outside the clamp when the product is tested. The upper pressing plate 1 is provided with a power supply positive interface 71, the lower pressing plate 2 is provided with a power supply negative interface 72, the upper electrode 3 is connected with the power supply positive interface 71, the negative electrode is connected with the power supply negative interface 72, and the test lead 9 is respectively led out from the power supply positive interface 71 and the power supply negative interface 72.

The single-layer chip ceramic dielectric capacitor 8 includes a capacitor upper electrode 81, a capacitor lower electrode 82, and a capacitor ceramic body 83, and the capacitor ceramic body 83 is sandwiched between the capacitor upper electrode 81 and the capacitor lower electrode 82.

When in use, the upper electrode 3 connected with the spring thimble 31 is lifted, and the single-layer ceramic dielectric capacitor is placed between the upper electrode 3 and the lower electrode 4 and is fixed by bearing the spring force; then the whole clamp is placed in a high-low temperature alternating damp-heat test box, the test lead 9 is led out of the box, and direct current voltage is conducted on the capacitor through the upper test lead 9 and the lower test lead 9 respectively.

The above description is only a preferred embodiment of the present invention, and therefore should not be taken as limiting the scope of the invention, which is defined by the following claims and their equivalents.

Claims

1. The utility model provides a single-deck piece formula ceramic dielectric capacitor test fixture which characterized in that: the chip type electronic component comprises a plurality of upper electrodes, a plurality of lower electrodes, an upper pressing plate and a lower pressing plate, wherein the upper pressing plate and the lower pressing plate are circuit boards, the upper electrodes are arranged on the upper pressing plate, the lower electrodes are arranged on the lower pressing plate, the upper electrodes correspond to the lower electrodes one to one, and the chip type electronic component is clamped between the upper electrodes and the lower electrodes.

2. The single-layer chip ceramic dielectric capacitor test fixture of claim 1, wherein: the spring thimble is fixedly connected with the upper electrode, and the upper electrode is contacted with the sheet type electronic element through the spring thimble.

3. The single-layer chip ceramic dielectric capacitor test fixture of claim 2, wherein: the spring thimble includes thimble head, thimble seat and spring, and thimble seat prelude is provided with the throat that mutually supports with thimble head afterbody and prevents that the thimble head from deviating from, and the thimble seat is hollow structure, and the spring sets up in the thimble seat, links to each other with thimble head bottom.

4. The single-layer chip ceramic dielectric capacitor test fixture of claim 1, wherein: the locking mechanism comprises a plurality of bolts and a plurality of nuts, and the bolts penetrate through the through holes to be matched with the nuts one by one.

5. The single-layer chip ceramic capacitor test fixture of claim 4, wherein: the through holes are symmetrically arranged along the centers of the upper pressing plate and the lower pressing plate.

6. The single-layer chip ceramic capacitor test fixture as claimed in any one of claims 1 to 5, wherein: the lower electrode is provided with a groove, and the shape of the groove is matched with the appearance of the chip electronic component.

7. The single-layer chip ceramic capacitor test fixture as claimed in any one of claims 1 to 5, wherein: the upper pressing plate and the lower pressing plate are provided with air holes.

8. The single-layer chip ceramic capacitor test fixture as claimed in any one of claims 1 to 5, wherein: the upper pressing plate and the lower pressing plate are both made of temperature-resistant and moisture-resistant materials.

9. The single-layer chip ceramic capacitor test fixture as claimed in any one of claims 1 to 5, wherein: the upper electrode and the lower electrode are subjected to metallization treatment, and the surfaces of the upper electrode and the lower electrode are hardened gold-plated layers.

10. The single-layer chip ceramic capacitor test fixture as claimed in any one of claims 1 to 5, wherein: the testing device is characterized by further comprising a power supply positive interface arranged on the upper pressing plate and a power supply negative interface arranged on the lower pressing plate, the upper electrode is connected with the power supply positive interface, the negative electrode is connected with the power supply negative interface, and the testing wires are led out from the power supply positive interface and the power supply negative interface respectively.