CN211577295U

CN211577295U - Electronic component high-temperature reverse bias life tester convenient for fixing electronic component

Info

Publication number: CN211577295U
Application number: CN201922343872.9U
Authority: CN
Inventors: 朱永兵
Original assignee: Tianjin Hirel Electronic Technology Co ltd
Current assignee: Tianjin Hirel Electronic Technology Co ltd
Priority date: 2019-12-24
Filing date: 2019-12-24
Publication date: 2020-09-25
Anticipated expiration: 2029-12-24

Abstract

The utility model discloses an electronic component high temperature anti-bias life tester convenient for fixing electronic components, which comprises a control box, a high temperature box and a high temperature anti-bias aging plate, wherein a display screen is fixedly arranged at the top of the front side of the control box, and two sides of the inner wall of the high temperature box are respectively connected with two sides of the two high temperature anti-bias aging plates in a sliding way through square sliders, the utility model discloses an electronic component high temperature anti-bias life tester convenient for fixing electronic components, which is provided with a fixed plate and a pin, the fixed plate and the high temperature anti-bias aging plate can be fixedly connected, pins of the electronic component are alternately connected with pin jacks, then a movable block is pressed, the movable block extrudes a clamping block in a through groove, a semicircular clamping groove at one end of the clamping block is connected with the pins of the electronic component in a clamping way, and the electronic component is firmly fixed, the operation is convenient, and the practicability of the high-temperature reverse bias life tester of the electronic element can be effectively improved.

Description

Electronic component high-temperature reverse bias life tester convenient for fixing electronic component

Technical Field

The utility model relates to an electronic component tests technical field, specifically is an electronic component high temperature anti-inclined to one side life-span test machine convenient to fixed electronic component.

Background

Electronic components (electronic components), which are basic elements in electronic circuits, are usually individually packaged and have two or more leads or metal contacts. The electronic components are interconnected to form an electronic circuit having a specific function, such as: amplifiers, radio receivers, oscillators, etc., one of the common ways to connect electronic components is soldering to a printed circuit board. The electronic components may be individual packages (resistors, capacitors, inductors, transistors, diodes, etc.) or groups of various complexities, such as: integrated circuits (operational amplifiers, exclusion, logic gates, etc.).

The reliability characteristic quantity of the existing electronic element can be determined when the electronic product works or is stored under various environmental conditions through a reliability test, and useful data is provided for use, production and design; problems in the design, raw materials and process flow of the product can also be exposed. Through a series of feedback measures such as failure analysis, quality control and the like, the problems of products can be gradually solved, the reliability of the products is improved, and in the process of service life screening, a high-temperature reverse bias life tester of the electronic element is required to be used for carrying out high-temperature reverse bias test on the electronic element.

Electronic elements to be tested in the existing high-temperature reverse bias life tester for the electronic elements are directly inserted into the high-temperature reverse bias aging board, but the electronic elements are easy to fall off due to the inserting mode, so that the electronic elements are inconvenient to fix, and the practicability of the high-temperature reverse bias life tester for the electronic elements is reduced; the existing high-temperature reverse bias life tester for the electronic elements cannot simultaneously test the high-temperature reverse bias life of a plurality of electronic elements, so that the working efficiency of the high-temperature reverse bias life tester for the electronic elements is reduced.

SUMMERY OF THE UTILITY MODEL

An object of the utility model is to overcome prior art's not enough, provide an electronic component high temperature anti-inclined to one side life-span test machine convenient to fixed electronic component to solve the inconvenient fixed electronic component's of the electronic component high temperature anti-inclined to one side life-span test machine on the present market that above-mentioned background art provided problem.

The utility model provides a its technical problem realize through following technical scheme:

an electronic component high-temperature anti-deviation service life tester convenient for fixing electronic components comprises a control box, a high-temperature box and a high-temperature anti-deviation aging board, wherein a display screen is fixedly arranged at the top of the front face of the control box, an operation keyboard is fixedly arranged at the middle part of the front face of the control box, the high-temperature box is fixedly arranged at one side of the front face of the control box, a box door is hinged at one side of the front face of the high-temperature box, two sides of the inner wall of the high-temperature box are respectively connected with two sides of two high-temperature anti-deviation aging boards in a sliding manner through square sliding blocks, a plurality of pin slots are uniformly formed in the top ends of the two high-temperature anti-deviation aging boards, four corners at the top ends of the two high-temperature anti-deviation aging boards are respectively fixedly connected with four corners at the top ends of two fixing boards through pins, thirty six the equal swing joint in inside of recess has the movable block, twelve of them the both sides of movable block and one side of twenty four other movable blocks are connected with the one end contact of forty-eight tight piece of clamp respectively, twelve of them the logical groove has all been seted up to the both sides of recess inner wall and one side of twenty four other recess inner walls, and the one end that leads to the groove alternates with the one end of pressing from both sides the piece and be connected, forty-eight the middle part of pressing from both sides tight piece both sides is respectively through reset spring and the middle part fixed connection of forty-eight logical groove inner wall both sides, forty-eight the semi-circular draw-in groove has all been seted up to the other end of pressing from.

And moreover, a placing groove is formed in the front bottom of the control box, the inner walls of two sides of the placing groove are respectively connected with two sides of the three placing plates in a sliding mode through square sliding blocks, and a plurality of pin inserting holes are uniformly formed in the top ends of the three placing plates.

And the two corners of the bottom end of the control box and the two corners of the bottom end of the high-temperature box are respectively fixedly provided with a universal wheel.

And the middle part of the front surface of the box door is fixedly provided with an observation window.

And, the fixed display screen switch and the high temperature case switch that are equipped with in bottom of display screen, display screen and high temperature case are respectively through display screen switch and high temperature case switch and the inside battery electric connection of control box.

The utility model discloses an advantage and beneficial effect do:

1. the utility model discloses an electronic component high temperature anti-partial service life test machine convenient to fixed electronic component can be with fixed plate and the ageing board fixed connection of high temperature anti-partial, then alternate electronic component pin and pin jack and be connected, then press the movable block, the movable block causes the extrusion to the clamp block that leads to the inslot, makes the semicircular draw-in groove of clamp block one end and electronic component's pin block be connected, and then firmly fixes electronic component, convenient operation can effectively improve the practicality of electronic component high temperature anti-partial service life test machine; meanwhile, the high-temperature anti-deviation aging board of the electronic component high-temperature anti-deviation life tester convenient for fixing the electronic component is provided with the plurality of pin slots, so that the high-temperature anti-deviation life tester of the electronic component can simultaneously test the high-temperature anti-deviation life of the plurality of electronic components, and further, the working efficiency of the high-temperature anti-deviation life tester of the electronic component can be effectively improved.

Drawings

FIG. 1 is a schematic structural view of the present invention;

fig. 2 is a schematic front structural view of the fixing plate of the present invention;

FIG. 3 is a schematic structural diagram of the high temperature anti-deviation aging board of the present invention;

fig. 4 is a schematic sectional view of the fixing plate of the present invention;

fig. 5 is an enlarged view of the utility model at a;

fig. 6 is a schematic structural view of the clamping block of the present invention.

In the figure: 1. a control box; 2. a display screen; 3. operating a keyboard; 4. a placement groove; 5. placing the plate; 6. a pin jack; 7. a high temperature chamber; 8. a box door; 9. an observation window; 10. high temperature anti-deflection aging board; 11. a fixing plate; 12. a movable block; 13. a pin slot; 14. a pin; 15. a groove; 16. a through groove; 17. a clamping block; 18. a return spring; 19. semicircular clamping grooves.

Detailed Description

The present invention will be described in further detail with reference to specific examples, which are provided for illustrative purposes only, and are not intended to be limiting, and the scope of the present invention should not be limited thereby.

A high-temperature anti-deviation service life testing machine for electronic components convenient for fixing electronic components comprises a control box 1, a high-temperature box 7 and a high-temperature anti-deviation aging board 10, wherein a display screen 2 is fixedly arranged at the front top of the control box 1, an operation keyboard 3 is fixedly arranged at the front middle part of the control box 1, the high-temperature box 7 is fixedly arranged at one side of the control box 1, a box door 8 is hinged at one side of the front surface of the high-temperature box 7, two sides of the inner wall of the high-temperature box 7 are respectively connected with two sides of the two high-temperature anti-deviation aging boards 10 in a sliding manner through square sliders, a plurality of pin slots 13 are uniformly arranged at the top ends of the two high-temperature anti-deviation aging boards 10, four corners at the top ends of the two high-temperature anti-deviation aging boards 10 are respectively and fixedly connected with four corners at the top ends of the two fixing boards 11 through pins, the movable blocks 12 are movably connected inside the thirty-six grooves 15, two sides of the twelve movable blocks 12 and one sides of the other twenty-four movable blocks 12 are respectively in contact connection with one ends of the forty-eight clamping blocks 17, through grooves 16 are respectively formed in two sides of the inner walls of the twelve grooves 15 and one sides of the inner walls of the other twenty-four grooves 15, one ends of the through grooves 16 are connected with one ends of the clamping blocks 17 in an inserting mode, the middle parts of two sides of the forty-eight clamping blocks 17 are respectively fixedly connected with the middle parts of two sides of the inner walls of the forty-eight through grooves 16 through reset springs 18, semicircular clamping grooves 19 are respectively formed in the other ends of the forty-eight clamping blocks 17, and the two adjacent clamping blocks 17; the bottom of the front surface of the control box 1 is provided with a placing groove 4, the inner walls of two sides of the placing groove 4 are respectively connected with two sides of three placing plates 5 in a sliding mode through square sliding blocks, and the top ends of the three placing plates 5 are uniformly provided with a plurality of pin inserting holes 6 which can be used for placing electronic elements to be detected so that workers can take the electronic elements; universal wheels are fixedly arranged on two corners of the bottom end of the control box 1 and two corners of the bottom end of the high-temperature box 7, so that the testing machine can be conveniently moved; an observation window 9 is fixedly arranged in the middle of the front side of the box door 8, so that the condition inside the high-temperature box 7 can be observed in real time conveniently; the fixed display screen switch and the high temperature case switch that are equipped with in bottom of display screen 2, display screen 2 and high temperature case 7 are respectively through display screen switch and high temperature case switch and the inside battery electric connection of control box 1.

The working principle is as follows: when the electronic component high-temperature reverse bias life tester convenient for fixing the electronic component is used, firstly, the placing plate 5 in the placing groove 4 is drawn out through the square sliding groove, then pins of the electronic component to be tested are inserted into the pin inserting holes 6 at the top end of the placing plate 5, then the placing plate 5 fully inserted with the electronic component is placed back into the placing groove 4, after all the electronic components to be tested are placed in the placing groove 4, the box door 8 is opened, the high-temperature reverse bias aging plate 10 connected in a sliding manner in the high-temperature box 7 is drawn out, then the fixed plate 11 is fixedly connected with the high-temperature reverse bias aging plate 10 through the pins 14, then the pins of the electronic component to be tested are inserted into the pin inserting holes 6 at the top end of the fixed plate 11, the bottoms of the pins of the electronic component are ensured to be in contact connection with the pin inserting grooves 13 on the high-temperature reverse bias aging plate 10, after the electronic component is inserted, the, the movable block 12 will extrude the clamping block 17 in the through groove 16 at both sides of the groove 15, so that one end of the clamping block 17 moves into the pin jack 6 until the semicircular clamping groove 19 at one end of the clamping block 17 is connected with the pin of the electronic element in a clamping way, thereby firmly fixing the electronic element, the operation is convenient, the practicability of the high temperature anti-bias life test machine of the electronic element can be effectively improved, after the electronic element is fixed, the high temperature anti-bias aging board 10 slides back to the inside of the high temperature box 7, the box door 8 is closed, then the switch of the high temperature box 7 is opened, the high temperature box 7 carries out high temperature anti-bias life test on the electronic element, meanwhile, the high temperature box 7 synchronously transmits the test data of the electronic element to the display screen 2 for the observation of a user, after the test of the electronic element is finished, the movable block 12 in the groove 15 is pulled out, the clamping block 17 will return to the initial position under, therefore, the high-temperature reverse bias life tester of the electronic element can simultaneously carry out high-temperature reverse bias life test on a plurality of electronic elements, and further can effectively improve the working efficiency of the high-temperature reverse bias life tester of the electronic element.

Although the embodiments of the present invention and the accompanying drawings have been disclosed for illustrative purposes, those skilled in the art will appreciate that various substitutions, alterations, and modifications are possible without departing from the spirit and scope of the invention and the appended claims, and thus the scope of the invention is not limited to the embodiments and drawings disclosed.

Claims

1. The utility model provides an electronic component high temperature anti-life test machine that deviates from convenient to fixed electronic component, includes control box (1), high temperature case (7) and the ageing board of high temperature anti-deviation (10), its characterized in that: the display screen (2) is fixedly arranged at the front top of the control box (1), the operation keyboard (3) is fixedly arranged at the front middle part of the control box (1), the high-temperature box (7) is fixedly arranged at one side of the control box (1), the box door (8) is hinged to one side of the front side of the high-temperature box (7), two sides of the inner wall of the high-temperature box (7) are respectively in sliding connection with two sides of two high-temperature anti-deviation aging plates (10) through square sliders, a plurality of pin slots (13) are uniformly formed in the top ends of the two high-temperature anti-deviation aging plates (10), four corners at the top ends of the two high-temperature anti-deviation aging plates (10) are respectively and fixedly connected with four corners at the top ends of the two fixed plates (11) through pins (14), twenty-four pin inserting holes (6) are uniformly formed in the top ends of the two fixed plates (11), and grooves (15) are formed, thirty-six the equal swing joint in inside of recess (15) has movable block (12), wherein twelve the both sides of movable block (12) and one side of twenty-four other movable blocks (12) are connected with the one end contact of forty-eight tight piece (17) of clamp respectively, wherein twelve logical groove (16) have all been seted up to the both sides of recess (15) inner wall and one side of twenty-four other recess (15) inner wall, and the one end that leads to groove (16) and the one end that presss from both sides tight piece (17) alternate and be connected, forty-eight the middle part that presss from both sides tight piece (17) both sides is respectively through reset spring (18) and the middle part fixed connection of forty-eight logical groove (16) inner wall both sides, forty-eight semicircular clamping groove (19) have all been seted up to the other end of pressing from both sides tight piece (17), and contact between two adjacent.

2. The apparatus as claimed in claim 1, wherein the testing apparatus comprises: the novel electric heating cabinet is characterized in that a placing groove (4) is formed in the front bottom of the control box (1), the inner walls of two sides of the placing groove (4) are connected with two sides of a three placing plate (5) in a sliding mode through square sliding blocks respectively, and a plurality of pin inserting holes (6) are formed in the top end of the three placing plate (5) evenly.

3. The apparatus as claimed in claim 1, wherein the testing apparatus comprises: two corners of control box (1) bottom and two corners of high-temperature cabinet (7) bottom all are fixed and are equipped with the universal wheel.

4. The apparatus as claimed in claim 1, wherein the testing apparatus comprises: and an observation window (9) is fixedly arranged in the middle of the front surface of the box door (8).

5. The apparatus as claimed in claim 1, wherein the testing apparatus comprises: the bottom of display screen (2) is fixed and is equipped with display screen switch and high temperature box switch, display screen (2) and high temperature box (7) are respectively through display screen switch and high temperature box switch and the inside battery electric connection of control box (1).