CN111157817A - Electronic component high-temperature reverse bias life tester convenient for fixing electronic component - Google Patents
Electronic component high-temperature reverse bias life tester convenient for fixing electronic component Download PDFInfo
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- CN111157817A CN111157817A CN201911419837.9A CN201911419837A CN111157817A CN 111157817 A CN111157817 A CN 111157817A CN 201911419837 A CN201911419837 A CN 201911419837A CN 111157817 A CN111157817 A CN 111157817A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/003—Environmental or reliability tests
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
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- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
The invention discloses an electronic component high-temperature reverse bias life tester convenient for fixing electronic components, which comprises a control box, a high-temperature box and a high-temperature reverse bias aging plate, wherein a display screen is fixedly arranged at the top of the front surface of the control box, and two sides of the inner wall of the high-temperature box are respectively connected with two sides of the two high-temperature reverse bias aging plates in a sliding manner through square sliding blocks. The operation is convenient, and the practicability of the high-temperature reverse bias life tester of the electronic element can be effectively improved.
Description
Technical Field
The invention relates to the technical field of electronic element testing, in particular to an electronic element high-temperature reverse bias life tester convenient for fixing an electronic element.
Background
Electronic components (electronic components), which are basic elements in electronic circuits, are usually individually packaged and have two or more leads or metal contacts. The electronic components are interconnected to form an electronic circuit having a specific function, such as: amplifiers, radio receivers, oscillators, etc., one of the common ways to connect electronic components is soldering to a printed circuit board. The electronic components may be individual packages (resistors, capacitors, inductors, transistors, diodes, etc.) or groups of various complexities, such as: integrated circuits (operational amplifiers, exclusion, logic gates, etc.).
The reliability characteristic quantity of the existing electronic element can be determined when the electronic product works or is stored under various environmental conditions through a reliability test, and useful data is provided for use, production and design; problems in the design, raw materials and process flow of the product can also be exposed. Through a series of feedback measures such as failure analysis, quality control and the like, the problems of products can be gradually solved, the reliability of the products is improved, and in the process of service life screening, a high-temperature reverse bias life tester of the electronic element is required to be used for carrying out high-temperature reverse bias test on the electronic element.
Electronic elements to be tested in the existing high-temperature reverse bias life tester for the electronic elements are directly inserted into the high-temperature reverse bias aging board, but the electronic elements are easy to fall off due to the inserting mode, so that the electronic elements are inconvenient to fix, and the practicability of the high-temperature reverse bias life tester for the electronic elements is reduced; the existing high-temperature reverse bias life tester for the electronic elements cannot simultaneously test the high-temperature reverse bias life of a plurality of electronic elements, so that the working efficiency of the high-temperature reverse bias life tester for the electronic elements is reduced.
Disclosure of Invention
The present invention is directed to overcome the deficiencies of the prior art, and provides an electronic component high temperature reverse bias life tester for conveniently fixing an electronic component, so as to solve the problem of inconvenience in fixing the electronic component in the electronic component high temperature reverse bias life tester in the market proposed by the background art.
The technical problem to be solved by the invention is realized by the following technical scheme:
an electronic component high-temperature anti-deviation service life tester convenient for fixing electronic components comprises a control box, a high-temperature box and a high-temperature anti-deviation aging board, wherein a display screen is fixedly arranged at the top of the front face of the control box, an operation keyboard is fixedly arranged at the middle part of the front face of the control box, the high-temperature box is fixedly arranged at one side of the front face of the control box, a box door is hinged at one side of the front face of the high-temperature box, two sides of the inner wall of the high-temperature box are respectively connected with two sides of two high-temperature anti-deviation aging boards in a sliding manner through square sliding blocks, a plurality of pin slots are uniformly formed in the top ends of the two high-temperature anti-deviation aging boards, four corners at the top ends of the two high-temperature anti-deviation aging boards are respectively fixedly connected with four corners at the top ends of two fixing boards through pins, thirty six the equal swing joint in inside of recess has the movable block, twelve of them the both sides of movable block and one side of twenty four other movable blocks are connected with the one end contact of forty-eight tight piece of clamp respectively, twelve of them the logical groove has all been seted up to the both sides of recess inner wall and one side of twenty four other recess inner walls, and the one end that leads to the groove alternates with the one end of pressing from both sides the piece and be connected, forty-eight the middle part of pressing from both sides tight piece both sides is respectively through reset spring and the middle part fixed connection of forty-eight logical groove inner wall both sides, forty-eight the semi-circular draw-in groove has all been seted up to the other end of pressing from.
And moreover, a placing groove is formed in the front bottom of the control box, the inner walls of two sides of the placing groove are respectively connected with two sides of the three placing plates in a sliding mode through square sliding blocks, and a plurality of pin inserting holes are uniformly formed in the top ends of the three placing plates.
And the two corners of the bottom end of the control box and the two corners of the bottom end of the high-temperature box are respectively fixedly provided with a universal wheel.
And the middle part of the front surface of the box door is fixedly provided with an observation window.
And, the fixed display screen switch and the high temperature case switch that are equipped with in bottom of display screen, display screen and high temperature case are respectively through display screen switch and high temperature case switch and the inside battery electric connection of control box.
The invention has the advantages and beneficial effects that:
1. according to the electronic component high-temperature reverse bias life tester convenient for fixing the electronic component, the fixed plate and the high-temperature reverse bias aging plate can be fixedly connected, pins of the electronic component are connected with the pin insertion holes in an inserting mode, then the movable block is pressed, the movable block extrudes the clamping block in the through groove, the semicircular clamping groove at one end of the clamping block is connected with the pins of the electronic component in a clamping mode, the electronic component is further firmly fixed, the operation is convenient, and the practicability of the electronic component high-temperature reverse bias life tester can be effectively improved; meanwhile, the high-temperature anti-deviation aging board of the electronic component high-temperature anti-deviation life tester convenient for fixing the electronic component is provided with the plurality of pin slots, so that the high-temperature anti-deviation life tester of the electronic component can simultaneously test the high-temperature anti-deviation life of the plurality of electronic components, and further, the working efficiency of the high-temperature anti-deviation life tester of the electronic component can be effectively improved.
Drawings
FIG. 1 is a schematic structural view of the present invention;
FIG. 2 is a front view of the fixing plate according to the present invention;
FIG. 3 is a schematic structural diagram of a high temperature anti-deflection aging board according to the present invention;
FIG. 4 is a schematic cross-sectional view of a fixing plate according to the present invention;
FIG. 5 is an enlarged view of the invention at A;
FIG. 6 is a schematic view of the clamping block of the present invention.
In the figure: 1. a control box; 2. a display screen; 3. operating a keyboard; 4. a placement groove; 5. placing the plate; 6. a pin jack; 7. a high temperature chamber; 8. a box door; 9. an observation window; 10. high temperature anti-deflection aging board; 11. a fixing plate; 12. a movable block; 13. a pin slot; 14. a pin; 15. a groove; 16. a through groove; 17. a clamping block; 18. a return spring; 19. semicircular clamping grooves.
Detailed Description
The present invention is further illustrated by the following specific examples, which are intended to be illustrative, not limiting and are not intended to limit the scope of the invention.
A high-temperature anti-deviation service life testing machine for electronic components convenient for fixing electronic components comprises a control box 1, a high-temperature box 7 and a high-temperature anti-deviation aging board 10, wherein a display screen 2 is fixedly arranged at the front top of the control box 1, an operation keyboard 3 is fixedly arranged at the front middle part of the control box 1, the high-temperature box 7 is fixedly arranged at one side of the control box 1, a box door 8 is hinged at one side of the front surface of the high-temperature box 7, two sides of the inner wall of the high-temperature box 7 are respectively connected with two sides of the two high-temperature anti-deviation aging boards 10 in a sliding manner through square sliders, a plurality of pin slots 13 are uniformly arranged at the top ends of the two high-temperature anti-deviation aging boards 10, four corners at the top ends of the two high-temperature anti-deviation aging boards 10 are respectively and fixedly connected with four corners at the top ends of the two fixing boards 11 through pins, the movable blocks 12 are movably connected inside the thirty-six grooves 15, two sides of the twelve movable blocks 12 and one sides of the other twenty-four movable blocks 12 are respectively in contact connection with one ends of the forty-eight clamping blocks 17, through grooves 16 are respectively formed in two sides of the inner walls of the twelve grooves 15 and one sides of the inner walls of the other twenty-four grooves 15, one ends of the through grooves 16 are connected with one ends of the clamping blocks 17 in an inserting mode, the middle parts of two sides of the forty-eight clamping blocks 17 are respectively fixedly connected with the middle parts of two sides of the inner walls of the forty-eight through grooves 16 through reset springs 18, semicircular clamping grooves 19 are respectively formed in the other ends of the forty-eight clamping blocks 17, and the two adjacent clamping blocks 17; the bottom of the front surface of the control box 1 is provided with a placing groove 4, the inner walls of two sides of the placing groove 4 are respectively connected with two sides of three placing plates 5 in a sliding mode through square sliding blocks, and the top ends of the three placing plates 5 are uniformly provided with a plurality of pin inserting holes 6 which can be used for placing electronic elements to be detected so that workers can take the electronic elements; universal wheels are fixedly arranged on two corners of the bottom end of the control box 1 and two corners of the bottom end of the high-temperature box 7, so that the testing machine can be conveniently moved; an observation window 9 is fixedly arranged in the middle of the front side of the box door 8, so that the condition inside the high-temperature box 7 can be observed in real time conveniently; the fixed display screen switch and the high temperature case switch that are equipped with in bottom of display screen 2, display screen 2 and high temperature case 7 are respectively through display screen switch and high temperature case switch and the inside battery electric connection of control box 1.
The working principle is as follows: when the electronic component high-temperature reverse bias life tester convenient for fixing the electronic component is used, firstly, the placing plate 5 in the placing groove 4 is drawn out through the square sliding groove, then pins of the electronic component to be tested are inserted into the pin inserting holes 6 at the top end of the placing plate 5, then the placing plate 5 fully inserted with the electronic component is placed back into the placing groove 4, after all the electronic components to be tested are placed in the placing groove 4, the box door 8 is opened, the high-temperature reverse bias aging plate 10 connected in a sliding manner in the high-temperature box 7 is drawn out, then the fixed plate 11 is fixedly connected with the high-temperature reverse bias aging plate 10 through the pins 14, then the pins of the electronic component to be tested are inserted into the pin inserting holes 6 at the top end of the fixed plate 11, the bottoms of the pins of the electronic component are ensured to be in contact connection with the pin inserting grooves 13 on the high-temperature reverse bias aging plate 10, after the electronic component is inserted, the, the movable block 12 will extrude the clamping block 17 in the through groove 16 at both sides of the groove 15, so that one end of the clamping block 17 moves into the pin jack 6 until the semicircular clamping groove 19 at one end of the clamping block 17 is connected with the pin of the electronic element in a clamping way, thereby firmly fixing the electronic element, the operation is convenient, the practicability of the high temperature anti-bias life test machine of the electronic element can be effectively improved, after the electronic element is fixed, the high temperature anti-bias aging board 10 slides back to the inside of the high temperature box 7, the box door 8 is closed, then the switch of the high temperature box 7 is opened, the high temperature box 7 carries out high temperature anti-bias life test on the electronic element, meanwhile, the high temperature box 7 synchronously transmits the test data of the electronic element to the display screen 2 for the observation of a user, after the test of the electronic element is finished, the movable block 12 in the groove 15 is pulled out, the clamping block 17 will return to the initial position under, therefore, the high-temperature reverse bias life tester of the electronic element can simultaneously carry out high-temperature reverse bias life test on a plurality of electronic elements, and further can effectively improve the working efficiency of the high-temperature reverse bias life tester of the electronic element.
Although the embodiments of the present invention and the accompanying drawings have been disclosed for illustrative purposes, those skilled in the art will appreciate that various substitutions, alterations, and modifications are possible without departing from the spirit and scope of the invention and the appended claims, and thus the scope of the invention is not limited to the embodiments and drawings disclosed.
Claims (5)
1. The utility model provides an electronic component high temperature anti-life test machine that deviates from convenient to fixed electronic component, includes control box (1), high temperature case (7) and the ageing board of high temperature anti-deviation (10), its characterized in that: the display screen (2) is fixedly arranged at the front top of the control box (1), the operation keyboard (3) is fixedly arranged at the front middle part of the control box (1), the high-temperature box (7) is fixedly arranged at one side of the control box (1), the box door (8) is hinged to one side of the front side of the high-temperature box (7), two sides of the inner wall of the high-temperature box (7) are respectively in sliding connection with two sides of two high-temperature anti-deviation aging plates (10) through square sliders, a plurality of pin slots (13) are uniformly formed in the top ends of the two high-temperature anti-deviation aging plates (10), four corners at the top ends of the two high-temperature anti-deviation aging plates (10) are respectively and fixedly connected with four corners at the top ends of the two fixed plates (11) through pins (14), twenty-four pin inserting holes (6) are uniformly formed in the top ends of the two fixed plates (11), and grooves (15) are formed, thirty-six the equal swing joint in inside of recess (15) has movable block (12), wherein twelve the both sides of movable block (12) and one side of twenty-four other movable blocks (12) are connected with the one end contact of forty-eight tight piece (17) of clamp respectively, wherein twelve logical groove (16) have all been seted up to the both sides of recess (15) inner wall and one side of twenty-four other recess (15) inner wall, and the one end that leads to groove (16) and the one end that presss from both sides tight piece (17) alternate and be connected, forty-eight the middle part that presss from both sides tight piece (17) both sides is respectively through reset spring (18) and the middle part fixed connection of forty-eight logical groove (16) inner wall both sides, forty-eight semicircular clamping groove (19) have all been seted up to the other end of pressing from both sides tight piece (17), and contact between two adjacent.
2. The apparatus as claimed in claim 1, wherein the testing apparatus comprises: the novel electric heating cabinet is characterized in that a placing groove (4) is formed in the front bottom of the control box (1), the inner walls of two sides of the placing groove (4) are connected with two sides of a three placing plate (5) in a sliding mode through square sliding blocks respectively, and a plurality of pin inserting holes (6) are formed in the top end of the three placing plate (5) evenly.
3. The apparatus as claimed in claim 1, wherein the testing apparatus comprises: two corners of control box (1) bottom and two corners of high-temperature cabinet (7) bottom all are fixed and are equipped with the universal wheel.
4. The apparatus as claimed in claim 1, wherein the testing apparatus comprises: and an observation window (9) is fixedly arranged in the middle of the front surface of the box door (8).
5. The apparatus as claimed in claim 1, wherein the testing apparatus comprises: the bottom of display screen (2) is fixed and is equipped with display screen switch and high temperature box switch, display screen (2) and high temperature box (7) are respectively through display screen switch and high temperature box switch and the inside battery electric connection of control box (1).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201911419837.9A CN111157817A (en) | 2019-12-31 | 2019-12-31 | Electronic component high-temperature reverse bias life tester convenient for fixing electronic component |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201911419837.9A CN111157817A (en) | 2019-12-31 | 2019-12-31 | Electronic component high-temperature reverse bias life tester convenient for fixing electronic component |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN111157817A true CN111157817A (en) | 2020-05-15 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201911419837.9A Withdrawn CN111157817A (en) | 2019-12-31 | 2019-12-31 | Electronic component high-temperature reverse bias life tester convenient for fixing electronic component |
Country Status (1)
| Country | Link |
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| CN (1) | CN111157817A (en) |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100875876B1 (en) * | 2007-08-30 | 2008-12-26 | 주식회사 성우하이텍 | A sensor cover unit |
| CN201796114U (en) * | 2010-07-01 | 2011-04-13 | 江西联创特种微电子有限公司 | High-temperature reverse-bias aging table of long-service life transistor |
| CN206945902U (en) * | 2017-06-13 | 2018-01-30 | 杭州高坤电子科技有限公司 | A kind of high temperature reverse bias testing equipment with junction temperature test |
| CN109030875A (en) * | 2018-06-01 | 2018-12-18 | 芜湖市亿仑电子有限公司 | A kind of comprehensive test device of capacitor |
| CN209448159U (en) * | 2019-04-03 | 2019-09-27 | 贵州电网有限责任公司 | It is a kind of easy to disassemble for the two-way binding post with electrical testing terminal |
| CN110308401A (en) * | 2019-05-17 | 2019-10-08 | 杭州元朗智能科技有限公司 | A kind of whole rent battery cycle life tester |
-
2019
- 2019-12-31 CN CN201911419837.9A patent/CN111157817A/en not_active Withdrawn
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100875876B1 (en) * | 2007-08-30 | 2008-12-26 | 주식회사 성우하이텍 | A sensor cover unit |
| CN201796114U (en) * | 2010-07-01 | 2011-04-13 | 江西联创特种微电子有限公司 | High-temperature reverse-bias aging table of long-service life transistor |
| CN206945902U (en) * | 2017-06-13 | 2018-01-30 | 杭州高坤电子科技有限公司 | A kind of high temperature reverse bias testing equipment with junction temperature test |
| CN109030875A (en) * | 2018-06-01 | 2018-12-18 | 芜湖市亿仑电子有限公司 | A kind of comprehensive test device of capacitor |
| CN209448159U (en) * | 2019-04-03 | 2019-09-27 | 贵州电网有限责任公司 | It is a kind of easy to disassemble for the two-way binding post with electrical testing terminal |
| CN110308401A (en) * | 2019-05-17 | 2019-10-08 | 杭州元朗智能科技有限公司 | A kind of whole rent battery cycle life tester |
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Application publication date: 20200515 |
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| WW01 | Invention patent application withdrawn after publication |