CN211478392U

CN211478392U - Chip testing seat

Info

Publication number: CN211478392U
Application number: CN201922347649.1U
Authority: CN
Inventors: 吴志明
Original assignee: Asiachip Electronic Shenzhen Co ltd
Current assignee: Asiachip Electronic Shenzhen Co ltd
Priority date: 2019-12-24
Filing date: 2019-12-24
Publication date: 2020-09-11
Anticipated expiration: 2029-12-24

Abstract

The utility model discloses a chip testing seat, the on-line screen storage device comprises a base, the top center of base is provided with the spread groove, the inside of spread groove is provided with the connecting block, the inside equidistance of connecting block is provided with test probe, the top of base is provided with the flap, spacing hole has been seted up with test probe corresponding position to the surface of flap, the inside in spacing hole is provided with test chip, test probe distributes for both sides equidistance, and corresponds with test chip's contact phase, the outside in spacing hole is the back taper design, the inboard and the chip transition fit in spacing hole, the utility model relates to an electron technical field. The chip testing seat can be matched with electrical equipment to carry out automatic detection, is simple in structure and convenient and fast to install, can be used in combination with multiple testing seats, and is high in testing efficiency.

Description

Chip testing seat

Technical Field

The utility model relates to the field of electronic technology, specifically a chip test seat.

Background

Integrated circuits, abbreviated as ICs, or microcircuits, microchips, chips/chips, are a way in electronics to miniaturize circuits (including primarily semiconductor devices, also passive components, etc.) and are often fabricated on semiconductor wafer surfaces. Need test its finished product during the chip preparation, whether the performance is qualified, adopt single mode manual work to detect at present more, efficiency of software testing is slow, and mounting structure is complicated, and unable cooperation automation test is used, in order to satisfy automatic test production, the utility provides a simple structure, easily cooperate, efficiency of software testing is fast chip test seat.

SUMMERY OF THE UTILITY MODEL

Technical problem to be solved

The utility model provides a not enough to prior art, the utility model provides a chip test seat can cooperate electrical equipment to carry out automated inspection, and simple structure, installation are convenient, but the test seat jointly uses more simultaneously, and efficiency of software testing is high.

(II) technical scheme

In order to achieve the above purpose, the utility model discloses a following technical scheme realizes: the utility model provides a chip testing seat, includes the base, the top center of base is provided with the spread groove, the inside of spread groove is provided with the connecting block, the inside equidistance of connecting block is provided with test probe, the top of base is provided with the flap, spacing hole has been seted up on the surface of flap and with the corresponding position of test probe, the inside in spacing hole is provided with test chip.

Preferably, the base is fixedly connected with the base cover through a bolt.

Preferably, the test probes are distributed at equal intervals on two sides and correspond to the contact positions of the test chip.

Preferably, the outer side of the limiting hole is designed in an inverted cone shape, and the inner side of the limiting hole is in transition fit with the chip.

Preferably, the bottom of base equidistance is provided with the mounting hole.

(III) advantageous effects

The utility model provides a chip test seat. Has the following beneficial effects:

this chip test seat realizes the spacing fixed of chip through spacing hole on the flap, then cooperates the inside test probe of base and the butt joint of chip contact position, realizes the chip test, and the spacing hole outside adopts the back taper design, and the chip is easily put into, conveniently cooperates the cylinder to carry out automated handling automatic control test, improves test detection efficiency.

Drawings

FIG. 1 is a schematic structural view of the present invention;

FIG. 2 is a side view of the structure of the present invention;

FIG. 3 is a top view of the present invention;

fig. 4 is a contact diagram of the chip probe according to the present invention.

In the figure: the test device comprises a base 1, a connecting groove 2, a connecting block 3, a test probe 4, a base cover 5, a limiting hole 6 and a test chip 7.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.

Referring to fig. 1-4, the present invention provides a technical solution: a chip test seat comprises a base 1, a connecting groove 2 is arranged at the center of the top of the base 1, a connecting block 3 is arranged inside the connecting groove 2, test probes 4 are equidistantly arranged inside the connecting block 3 to realize chip contact and detection, a seat cover 5 is arranged at the top of the base 1 to realize top sealing of the base, a limiting hole 6 is arranged on the surface of the seat cover 5 and at a position corresponding to the probes of the test probes 4 to realize chip limiting and ensure that the chip contact is positioned in the test probe contact, a test chip 7 is arranged inside the limiting hole 6, the base 1 is fixedly connected with the seat cover 5 through a bolt, the test probes 4 are equidistantly distributed at two sides and correspond to the contact phase of the test chip 7 to realize chip test, the outer side of the limiting hole 6 is designed in an inverted cone shape, the inner side of the limiting hole 6 is in transition fit with the chip to ensure that the chip completely enters the limiting hole, and mounting, the installation of the test station of the automatic equipment is convenient.

During the use, in connecting groove 2 is gone into to the connecting block 3 card that will embed test probe 4, then block upper cover 5 and carry out the bolt fastening, then with the pedestal mounting on the automatic detection board test station, then connect the circuit can, during the test, utilize cylinder cooperation gas accuse suction pen to test chip absorption transport, put into spacing hole 6, then utilize the design of spacing 6 outside back taper, guarantee that the chip slides in and test probe 4 top contact, accomplish the test.

It is noted that, herein, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation. The use of the phrase "comprising one of the elements does not exclude the presence of other like elements in the process, method, article, or apparatus that comprises the element.

Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.

Claims

1. A chip test socket, includes base (1), its characterized in that: the top center of base (1) is provided with spread groove (2), the inside of spread groove (2) is provided with connecting block (3), the inside equidistance of connecting block (3) is provided with test probe (4), the top of base (1) is provided with seat cover (5), spacing hole (6) have been seted up on the surface of seat cover (5) and with test probe (4) probe corresponding position, the inside in spacing hole (6) is provided with test chip (7).

2. The chip test socket according to claim 1, wherein: the base (1) is fixedly connected with the seat cover (5) through bolts.

3. The chip test socket according to claim 1, wherein: the test probes (4) are distributed at equal intervals on two sides and correspond to the contact position of the test chip (7).

4. The chip test socket according to claim 1, wherein: the outside of spacing hole (6) is the back taper design, the inboard and the chip transition cooperation in spacing hole (6).

5. The chip test socket according to claim 1, wherein: the bottom equidistance of base (1) is provided with the mounting hole.