CN211352196U - Fault simulation device of optical router - Google Patents
Fault simulation device of optical router Download PDFInfo
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- CN211352196U CN211352196U CN202020152290.2U CN202020152290U CN211352196U CN 211352196 U CN211352196 U CN 211352196U CN 202020152290 U CN202020152290 U CN 202020152290U CN 211352196 U CN211352196 U CN 211352196U
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Abstract
The utility model relates to a fault simulation device of an optical router, which solves the technical problem that faults can not be simulated, and adopts a micro-ring resonator fault simulation subunit comprising n interconnections, wherein an input interface of the fault simulation subunit simulates a signal input port of the optical router, and an output interface of the fault simulation subunit simulates a signal output port of the optical router; the fault simulation subunit is a multiplexer, and the multiplexer is used for simulating the technical scheme of the resonance state normal state and the fault state of the micro-ring resonator, so that the problem is well solved, and the fault simulation subunit can be used in an optical router fault simulator.
Description
Technical Field
The utility model relates to an optical router field, concretely relates to fault simulation device of optical router.
Background
The network on chip is a product of the development of integrated circuits, and has become a main stream communication architecture of a multi-core and many-core system on chip, and the router is used as a data receiving and transmitting medium to provide communication among a plurality of functional modules, so that the time delay is reduced, the power consumption is reduced, the performance of the system is improved, and the requirement of the multi-core system on the communication efficiency is met. However, the reduction of feature size, the increase of integration density, and the like all cause the chip to face serious reliability problems.
The integration of chips is increasing, and the number of transistors that can be integrated by a single chip and the total area of the chip tend to increase, thereby causing more defects inside the chip. Mainly expressed in (1) defects generated in the manufacturing process of the chip due to the limitation of the manufacturing process level; (2) in the life cycle of the chip, the faults are increased due to oxidation, circuit aging, electron migration and the like; (3) the system is influenced by factors such as crosstalk, noise, electromagnetic interference and the like, so that the chip function is temporarily disabled; both of these factors will make the network on chip face serious reliability problems. In order to improve the overall performance of the optical network on chip, the utility model provides a fault simulation device of optical router for the output of optical router that micro-ring resonator (MRR) trouble leads to changes in the simulation optical router.
SUMMERY OF THE UTILITY MODEL
The utility model aims to solve the technical problem that the optical router that exists can not effectively carry out the fault simulation among the prior art. The fault simulator of the optical router has the characteristics that the fault caused by the manufacturing defect of the MRR can be effectively simulated, and the reliability of the network on the optical router chip is improved to play an important role.
In order to solve the technical problems, the technical scheme is as follows:
a fault simulation device of an optical router is used for simulating micro-ring resonator faults in the optical router and comprises n micro-ring resonator fault simulation subunits which are connected with one another, an input interface of each fault simulation subunit simulates a signal input port of the optical router, and an output interface of each fault simulation subunit simulates a signal output port of the optical router.
The fault simulation subunit is a multiplexer, and the multiplexer is used for simulating a resonance state normal state and a fault state of the micro-ring resonator.
The utility model discloses a theory of operation: the utility model discloses establish the fault model to MRR, established two kinds of fault models. Definition dead 0 Fault (s-a-0) means dead 0 due to manufacturing defects. Specifically, when an optical signal enters from the input end, if the resonance state of the MRR is controlled to be "ON", the optical signal is normally output from the Drop terminal, but due to the existence of a fault, the optical signal is actually output from the Through terminal, and the Drop terminal does not output.
By controlling MRR to be in the ON state, the receiving end should receive "1" at this time, and "stay at 0" due to a manufacturing defect and actually receive "0".
The Stuck-at-one Fault (s-a-1) means that it is at 1 due to a manufacturing defect. Specifically, when an optical signal enters from the input end, if the resonance state of the MRR is controlled to be "OFF", normally, the signal should be output from the Through terminal, but due to the existence of a fault, the optical signal is actually output from the Drop terminal, and no signal is output from the Through terminal. As shown in fig. 3: by controlling the MRR to be in the OFF state, the receiving end should receive "0" at this time, and actually receive "1" due to "stay at 1" due to a manufacturing defect.
In the above scheme, for optimization, the fault simulation subunit further includes a first micro-ring resonator a connected to the second input interface of the fault simulation subunit, and a second micro-ring resonator B connected to the third input interface; the first microring resonator a connects the 2 switchable output branches ao1 and the output branch ao 2; the second micro-ring resonator is connected with 2 switchable output branches bo1 and an output branch bo 2; the output branch ao1 and the output branch bo1 are connected to the first output interface of the fault simulation subunit through an or gate, the output branch ao2 is connected to the fifth micro-ring resonator E, and the output branch bo2 is connected to the output interface of the fault simulation subunit through an or gate; and the first micro-ring resonator A and the second micro-ring resonator B simulate 2 fault types in a fault model by controlling resonance states.
The first micro-ring resonator A and the second micro-ring resonator B simulate 2 fault types in a fault model by controlling resonance states; wherein n is a positive integer.
Further, the 2 fault types include a stay 0 fault and a stay 1 fault; the dead 0 fault is a fault state which occurs when the resonance state of the micro-ring resonator is ON; the dead 1 fault is a fault condition that occurs when the resonant condition of the microring resonator is OFF.
Further, controlling 2 fault types in the resonance state simulation fault model controls the resonance state by using a ctrl i signal, and by using a ctrl _ i signal, wherein i is a positive integer less than or equal to n.
The utility model has the advantages that: the utility model discloses can simulate MRR effectively because the single trouble that the manufacturing defect caused, will play important role in the reliability that improves the network on chip. The utility model discloses be the multiplexer structure of one alternative with the MRR equivalence, constitute optical router fault analogue means by a plurality of multiplexer interconnect of n and can carry out the fault simulation under the single trouble condition and detect. And (3) randomly generating 1 micro-ring resonator fault by 8 micro-ring resonators, and respectively detecting the faults generated under the conditions of the state of stay 0 and the state of stay 1 to finish the simulation. The utility model discloses a device has reduced because MRR leads to MRR to break down and then leads to the probability that data transmission mistake is lost even in the defect that MRR produced in manufacturing process, improves the wholeness ability of network on chip.
Drawings
The present invention will be further explained with reference to the drawings and examples.
Fig. 1 is a schematic structural diagram of a failure simulation apparatus of an optical router according to embodiment 1.
Fig. 2 is a schematic diagram of the dead 0 fault model in embodiment 1.
Fig. 3 is a schematic diagram of the stay-1 fault model in embodiment 1.
Fig. 4 is a schematic diagram of an optical router in embodiment 1.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is further described in detail with reference to the following embodiments. It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the invention.
Example 1
The present embodiment provides a fault simulation apparatus for an optical router, where the fault simulation apparatus is configured to simulate a fault of a single micro-ring resonator in the optical router, and the fault simulation apparatus for the optical router includes n micro-ring resonator fault simulation subunits connected to each other, where an input interface of the fault simulation subunit simulates a signal input port of the optical router, and an output interface of the fault simulation subunit simulates a signal output port of the optical router.
The fault simulation subunit is a multiplexer, and the multiplexer is used for simulating a resonance state normal state and a fault state of the micro-ring resonator.
Specifically, the fault simulation subunit includes a first micro-ring resonator a connected to the second input interface of the fault simulation subunit, and a second micro-ring resonator B connected to the third input interface; the first microring resonator a connects the 2 switchable output branches ao1 and the output branch ao 2; the second micro-ring resonator B is connected with 2 switchable output branches bo1 and an output branch bo 2; the output branch ao1 and the output branch bo1 are connected to the first output interface of the fault simulation subunit through an or gate, the output branch ao2 is connected to the fifth micro-ring resonator E, and the output branch bo2 is connected to the output interface of the fault simulation subunit through an or gate; and the first micro-ring resonator A and the second micro-ring resonator B simulate 2 fault types in a fault model by controlling resonance states.
Wherein the 2 fault types include a stay 0 fault and a stay 1 fault; the dead 0 fault is a fault state which occurs when the resonance state of the micro-ring resonator is ON; the dead 1 fault is a fault condition that occurs when the resonant condition of the microring resonator is OFF.
In detail, 2 fault types in the resonance state simulation fault model are controlled by using a ctrl signal to control the resonance state, and a ctrl _ i signal is used to control, i is a positive integer less than or equal to n, and n is 8 in this embodiment 1.
As shown in fig. 1, a 4 × 4 fault simulation apparatus, which is composed of 4 waveguides and 8 MRRs, is adapted to an optical router with 4 input ports. A, B, C, D, E, F, G, H illustrates an MRR ring of an optical router; the ports P1, P2, P3 and P4 respectively correspond to the signal input ports of the optical router; the ports Q1, Q2, Q3 and Q4 respectively correspond to the signal output ports of the optical router; ctrl _1, ctrl _2, ctrl _3, ctrl _4, ctrl _5, ctrl _6, ctrl _7, and ctrl _8 are used in the fault simulation apparatus to control the resonant state of each of 8 MRRs, and when ctrl _ i is 1(i is 1 to 8), the corresponding MRR is in the resonant state, and when ctrl _ i is 0(i is 1 to 8), the corresponding MRR is in the non-resonant state; ctrl1, ctrl2, ctrl3, ctrl4, ctrl5, ctrl6, ctrl7, and ctrl8 are used in the fault simulator to control the fault state of 8 MRRs, respectively, and when ctrl ═ 0, MRR is in a no-fault state, and when ctrl ═ 1, MRR is in a fault state.
Then, an MRR fault model is established, and the MRR fault model comprises two fault models: a stuck 0 fault, due to manufacturing defects, is stuck at 0. Specifically, when an optical signal enters from the input end, if the resonance state of the MRR is controlled to be "ON", the optical signal is normally output from the Drop terminal, but due to the existence of a fault, the optical signal is actually output from the Through terminal, and the Drop terminal does not output. As shown in fig. 2: by controlling MRR to be in the ON state, the receiving end should receive "1" at this time, and "stay at 0" due to a manufacturing defect and actually receive "0".
A stay 1 fault refers to stay at 1 due to a manufacturing defect. Specifically, when an optical signal enters from the input end, if the resonance state of the MRR is controlled to be "OFF", normally, the signal should be output from the Through terminal, but due to the existence of a fault, the optical signal is actually output from the Drop terminal, and no signal is output from the Through terminal. As shown in fig. 3: by controlling the MRR to be in the OFF state, the receiving end should receive "0" at this time, and actually receive "1" due to "stay at 1" due to a manufacturing defect.
Taking module 1 in fig. 1 as an example: when ctrl1 is 1, indicating that the alternative multiplexer has failed, the type of failure is generated by ctrl _1, if ctrl _1 equals 0, then s-a-1 dead 1 failure can be simulated, if ctrl _1 equals 1, then s-a-0 dead 0 failure can be simulated.
In the circuit, under the condition that the first micro-ring resonator has known single fault, state signals ctrl n of the rest 7 micro-ring resonators are all 0, and the MRR is in a fault-free state; the control signal ctrl _ n is 0, which indicates that MRR does not resonate at this time; the circuit knows that a single fault condition is subject to a fault detection discussion divided into two cases, s-a-1 and s-a-0. The following describes a fault simulation device of an optical router with reference to a specific case.
The circuit carries out fault simulation under the condition of single fault, one of eight micro-ring resonators is randomly selected to have single fault, the first micro-ring resonator is supposed to have fault, when the first micro-ring resonator has s-a-1 fault, namely the fault state control signal of MRR No. 1 is ctrl1 ═ 1, and the control signal ctrl n ═ 0 of other micro-ring resonators indicates that the circuit is in a fault-free state. The resonant state control signal ctrl _1 ═ 0 for MRR # 1 indicates that # 1 is in the dull 1 fault state, and the control signals for the other micro-ring resonators are equal to 0, indicating that MRR is in the no fault state.
The circuit also equates the remaining seven micro-ring resonators to an alternative switching architecture, when fault simulation is performed in the case of a single fault, s-a-0 stuck-at 0 fault and s-a-1 stuck-at 1 fault are simulated in the same way as the first micro-ring resonator, and so on.
Defining that when the optical signal is detected, the output is represented by logic 1, and when the optical signal is not detected, the output is represented by logic 0, and the MRR is equivalent to an alternative switch structure. For the first microring resonator signal coming in from the P2 port, two outputs ao1 and ao2 are selected. The same applies to the remaining 7 microring resonators.
The fault simulation device of the embodiment also needs a plurality of intermediate variables for representing transmission among various signals during construction, and ao1 and ao2 are used for representing two signal output ports of the alternative multiplexer a, wherein the control signal of an ao1 alternative switch is output when being 1, and the control signal of an ao2 alternative switch is output when being 0; the alternative switch B, C, D, E, F, G, H is similar.
The module 1 and the module 2 need an intermediate variable d for communication, and at this time, d is a signal obtained by passing through an or gate from the output bo1 of the one-out multiplexer B of the module 2 and the output ao1 of the one-out multiplexer a of the module 1; similarly, a, b, c, e, f, g, h are obtained from the output signals of the corresponding positions through the or gate.
The fault simulation device of the optical router is used for obtaining an output signal Q1 through an OR gate from output ends ao1 and d of an alternative multiplexer A; similarly, Q2, Q3 and Q4 are obtained by passing the output signals of the corresponding positions through an or gate. Fig. 4 is a schematic diagram of an optical router according to embodiment 1.
In summary, the present embodiment provides a fault simulation apparatus for an optical router, in which MRR is equivalent to an alternative multiplexer structure, and the whole router is designed as a circuit simulation structure formed by connecting n multiplexers, the apparatus can perform fault simulation detection under the condition of a single fault, and eight micro-rings randomly generate a micro-ring fault, and then detect the faults occurring under the conditions of stay 0 and stay 1, respectively. The utility model discloses can simulate MRR effectively because the single trouble that the manufacturing defect caused, will play important role in the reliability that improves the network on chip.
Although the invention has been described with respect to illustrative embodiments thereof so that those skilled in the art can understand the invention, it is to be understood that the invention is not limited to the disclosed embodiments, but rather, is intended to cover all modifications and variations within the spirit and scope of the invention as defined and defined by the appended claims.
Claims (4)
1. A fault simulation apparatus for an optical router, comprising: the fault simulation device of the optical router is used for simulating the fault of a single micro-ring resonator in the optical router, and comprises n micro-ring resonator fault simulation subunits which are connected with one another, wherein an input interface of each fault simulation subunit simulates a signal input port of the optical router, and an output interface of each fault simulation subunit simulates a signal output port of the optical router;
the fault simulation subunit is a multiplexer, and the multiplexer is used for simulating a resonance state normal state and a fault state of the micro-ring resonator.
2. The apparatus for simulating a failure of an optical router according to claim 1, wherein: the fault simulation subunit comprises a first micro-ring resonator A connected with a second input interface of the fault simulation subunit and a second micro-ring resonator B connected with a third input interface; the first microring resonator a connects the 2 switchable output branches ao1 and the output branch ao 2; the second micro-ring resonator B is connected with 2 switchable output branches bo1 and an output branch bo 2; the output branch ao1 and the output branch bo1 are connected to the first output interface of the fault simulation subunit through an or gate, the output branch ao2 is connected to the fifth micro-ring resonator E, and the output branch bo2 is connected to the output interface of the fault simulation subunit through an or gate; and the first micro-ring resonator A and the second micro-ring resonator B simulate 2 fault types in a fault model by controlling resonance states.
3. The apparatus for simulating a failure of an optical router according to claim 2, wherein: the 2 fault types comprise a stay-0 fault and a stay-1 fault; the dead 0 fault is a fault state which occurs when the resonance state of the micro-ring resonator is ON; the dead 1 fault is a fault condition that occurs when the resonant condition of the microring resonator is OFF.
4. The apparatus for simulating a failure of an optical router according to claim 3, wherein: controlling 2 fault types in the resonance state simulation fault model the resonance state is controlled using a ctrl i signal, and using a ctrl _ i signal, i being a positive integer less than or equal to n.
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| CN111147131A (en) * | 2020-02-04 | 2020-05-12 | 桂林电子科技大学 | Fault simulation device of optical router |
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| CN111147131A (en) * | 2020-02-04 | 2020-05-12 | 桂林电子科技大学 | Fault simulation device of optical router |
| CN111147131B (en) * | 2020-02-04 | 2024-04-30 | 桂林电子科技大学 | Fault simulation device of optical router |
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