CN114157935A - Dead fault simulation device of four-port optical router - Google Patents
Dead fault simulation device of four-port optical router Download PDFInfo
- Publication number
- CN114157935A CN114157935A CN202111501658.7A CN202111501658A CN114157935A CN 114157935 A CN114157935 A CN 114157935A CN 202111501658 A CN202111501658 A CN 202111501658A CN 114157935 A CN114157935 A CN 114157935A
- Authority
- CN
- China
- Prior art keywords
- fault
- micro
- ring resonator
- fault simulation
- output
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04Q—SELECTING
- H04Q11/00—Selecting arrangements for multiplex systems
- H04Q11/0001—Selecting arrangements for multiplex systems using optical switching
- H04Q11/0005—Switch and router aspects
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
- H04B10/07—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems
- H04B10/073—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an out-of-service signal
- H04B10/0731—Testing or characterisation of optical devices, e.g. amplifiers
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04Q—SELECTING
- H04Q11/00—Selecting arrangements for multiplex systems
- H04Q11/0001—Selecting arrangements for multiplex systems using optical switching
- H04Q11/0062—Network aspects
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04Q—SELECTING
- H04Q11/00—Selecting arrangements for multiplex systems
- H04Q11/0001—Selecting arrangements for multiplex systems using optical switching
- H04Q11/0062—Network aspects
- H04Q2011/0079—Operation or maintenance aspects
- H04Q2011/0083—Testing; Monitoring
Landscapes
- Engineering & Computer Science (AREA)
- Computer Networks & Wireless Communication (AREA)
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Signal Processing (AREA)
- Optical Modulation, Optical Deflection, Nonlinear Optics, Optical Demodulation, Optical Logic Elements (AREA)
Abstract
The invention relates to a dead fault simulation device of a four-port optical router, which is used for solving the technical problem that faults can not be simulated, wherein through n micro-ring resonator fault simulation subunits which are mutually connected, the input and output interfaces of each fault simulation subunit respectively simulate the input and output ports of signals of the optical router; the fault simulation subunit is a multiplexer, and the multiplexer is used for simulating the technical scheme of the resonance state normal state and the fault state of the micro-ring resonator, so that the technical problem of fault simulation is well solved, and the fault simulation subunit can be used in an optical router fault simulator.
Description
Technical Field
The invention relates to the field of optical routers, in particular to a dead fault simulation device of a four-port optical router.
Background
Chip integration is continuously developed, the scale of the chip is gradually increased, and the complexity of the chip is gradually increased, so that the probability of generating defects inside the chip is greatly increased. The network on chip is a product of integrated circuit development, and has become a main flow communication architecture of a multi-core and many-core system on chip, and a router is used as a data receiving and transmitting medium to provide communication among a plurality of functional modules, so that the overall performance of the system is further improved by reducing time delay and power consumption, and the requirement on the communication efficiency of the multi-core system is met.
Currently, due to the continuous reduction of the feature size of the chip, the continuous increase of the integration density, etc., the chip is faced with the increasingly prominent reliability problem. The critical problem affecting the reliability of the chip is the occurrence of defects inside the chip.
From the source, the chip generates defects in the design and manufacturing process due to the limitation of the manufacturing process; according to the life cycle length, the reasons of electronic migration, electrolytic corrosion and the like in the working process are also the main causes of chip faults; in the system, the functions of the chip are temporarily disabled due to the influence of crosstalk, noise, electromagnetic interference and other factors.
In order to further improve the reliability of a chip and the overall performance of a network on a chip, the invention provides a dead fault simulation device of an optical router, which is used for simulating the output change of the optical router caused by the dead fault of a Micro Ring Resonator (MRR) in the optical router.
Disclosure of Invention
The technical problem to be solved by the invention is that the optical router in the prior art can not effectively carry out fault simulation. The dead fault simulation device of the optical router can effectively simulate the fault of MRR caused by manufacturing defects, and the characteristic that the reliability of the network on the optical router is improved to play an important role is provided.
In order to solve the technical problems, the technical scheme is as follows:
the dull fault simulation device of the optical router is used for simulating the fault of a micro-ring resonator in the optical router and comprises n micro-ring resonator fault simulation subunits which are mutually connected, wherein an input interface of the fault simulation subunit simulates a signal input port of the optical router, and an output interface of the fault simulation subunit simulates a signal output port of the optical router.
The fault simulation subunit is a multiplexer, and the multiplexer is used for simulating a resonance state normal state and a fault state of the micro-ring resonator.
The working principle of the invention is as follows: the invention establishes a fault model for MRR, and establishes two fault models. Definition dead 0 Fault (s-a-0) means dead 0 due to manufacturing defects. Specifically, when an optical signal enters from the input end, if the resonance state of the MRR is controlled to be "ON", the optical signal is normally output from the Drop terminal, but due to the existence of a fault, the optical signal is actually output from the Through terminal, and the Drop terminal does not output.
By controlling MRR to be in the ON state, the receiving end should receive "1" at this time, and "stay at 0" due to a manufacturing defect and actually receive "0".
The Stuck-at-one Fault (s-a-1) means that it is at 1 due to a manufacturing defect. Specifically, when an optical signal enters from the input end, if the resonance state of the MRR is controlled to be "OFF", normally, the signal should be output from the Through terminal, but due to the existence of a fault, the optical signal is actually output from the Drop terminal, and no signal is output from the Through terminal. As shown in fig. 3: by controlling the MRR to be in the OFF state, the receiving end should receive "0" at this time, and actually receive "1" due to "stay at 1" due to a manufacturing defect.
In the above scheme, for optimization, the fault simulation subunit further includes a second micro-ring resonator B connected to the first input interface of the fault simulation subunit, and a fourth micro-ring resonator D connected to the second input interface; the second microring resonator B connects the 2 switchable output branches bo1 and the output branch bo 2; the fourth micro-ring resonator is connected with 2 switchable output branches do1 and an output branch do 2; the output branch bo1 and the output branch do2 are connected to the third micro-ring resonator C through an or gate, the output branch bo2 and the output branch do1 are connected to the eighth micro-ring resonator H, the output branch co2 and the output branch ho1 are connected to the third output interface of the fault simulation subunit through an or gate, and the output branch co1 and the output branch ho2 are connected to the fourth output interface of the fault simulation subunit through an or gate;
the fault simulation subunit comprises a sixth micro-ring resonator F connected with the third input interface of the fault simulation subunit and a fifth micro-ring resonator E connected with the fourth input interface; the sixth micro-ring resonator F connects the 2 switchable output branches fo1 and the output branch fo 2; the fifth micro-ring resonator is connected with 2 switchable output branches eo1 and an output branch eo 2; the output branch eo1 and the output branch fo2 are connected to the first micro-ring resonator a through an or gate, the output branch eo2 and the output branch fo1 are connected to the seventh micro-ring resonator G, the output branch ao2 and the output branch go1 are connected to the second output interface of the fault simulation subunit through an or gate, and the output branch ao1 and the output branch go2 are connected to the first output interface of the fault simulation subunit through an or gate;
and the second micro-ring resonator B, the fourth micro-ring resonator D, the fifth micro-ring resonator E and the sixth micro-ring resonator F simulate 2 fault types in a fault model by controlling resonance states.
The second micro-ring resonator B, the fourth micro-ring resonator D, the fifth micro-ring resonator E and the sixth micro-ring resonator F simulate 2 fault types in a fault model by controlling a resonance state; wherein n is a positive integer.
Further, the 2 fault types include a stay 0 fault and a stay 1 fault; the dead 0 fault is a fault state which occurs when the resonance state of the micro-ring resonator is ON; the dead 1 fault is a fault condition that occurs when the resonant condition of the microring resonator is OFF.
Further, controlling 2 fault types in the resonance state simulation fault model controls the resonance state by using a ctrl i signal, and by using a ctrl _ i signal, wherein i is a positive integer less than or equal to n.
The invention has the following effects: the invention effectively simulates single fault caused by MRR manufacturing defect, and plays an important role in improving reliability of network on chip.
The invention makes MRR equivalent to an alternative multiplexer structure, and the fault simulation device of the optical router formed by connecting n multiplexers can perform fault simulation detection under the condition of single fault. And (3) randomly generating 1 micro-ring resonator fault by 8 micro-ring resonators, and respectively detecting the faults generated under the conditions of the state of stay 0 and the state of stay 1 to finish the simulation.
The device reduces the probability of data transmission errors and even loss caused by MRR faults due to the defects generated in the manufacturing process of the MRR, and improves the overall performance of the network on chip.
Drawings
The invention is further illustrated with reference to the following figures and examples.
Fig. 1 is a schematic structural diagram of a dead-time fault simulation apparatus of an optical router according to embodiment 1.
Fig. 2, a schematic diagram of the dead 0 fault model.
Fig. 3, stay 1 fault model schematic.
Fig. 4 is a schematic diagram of an optical router according to embodiment 1.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more concise and clear, the present invention is further described in detail with reference to the following embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.
Example 1
The embodiment provides a dead-time fault simulation device of an optical router, which is used for simulating a fault of a single micro-ring resonator in the optical router, and the fault simulation device of the optical router comprises n micro-ring resonator fault simulation subunits connected with each other, wherein an input interface of the fault simulation subunit simulates a signal input port of the optical router, and an output interface of the fault simulation subunit simulates a signal output port of the optical router.
The fault simulation subunit is a multiplexer, and the multiplexer is used for simulating a resonance state normal state and a fault state of the micro-ring resonator.
Specifically, the fault simulation subunit includes a second micro-ring resonator B connected to the first input interface of the fault simulation subunit, and a fourth micro-ring resonator D connected to the second input interface; the second microring resonator B connects the 2 switchable output branches bo1 and the output branch bo 2; the fourth micro-ring resonator D is connected with 2 switchable output branches do1 and an output branch do 2; the output branch bo1 and the output branch do2 are connected to the third micro-ring resonator C through an or gate, the output branch bo2 and the output branch do1 are connected to the eighth micro-ring resonator H, the output branch co2 and the output branch ho1 are connected to the third output interface of the fault simulation subunit through an or gate, and the output branch co1 and the output branch ho2 are connected to the fourth output interface of the fault simulation subunit through an or gate;
the fault simulation subunit comprises a sixth micro-ring resonator F connected with the third input interface of the fault simulation subunit and a fifth micro-ring resonator E connected with the fourth input interface; the sixth micro-ring resonator F connects the 2 switchable output branches fo1 and the output branch fo 2; the fifth micro-ring resonator is connected with 2 switchable output branches eo1 and an output branch eo 2; the output branch eo1 and the output branch fo2 are connected to the first micro-ring resonator a through an or gate, the output branch eo2 and the output branch fo1 are connected to the seventh micro-ring resonator G, the output branch ao2 and the output branch go1 are connected to the second output interface of the fault simulation subunit through an or gate, and the output branch ao1 and the output branch go2 are connected to the first output interface of the fault simulation subunit through an or gate;
the first micro-ring resonator A, the second micro-ring resonator B, the third micro-ring resonator C, the fourth micro-ring resonator D, the fifth micro-ring resonator E, the sixth micro-ring resonator F, the seventh micro-ring resonator G and the eighth micro-ring resonator H simulate 2 fault types in a fault model by controlling resonance states.
Wherein the 2 fault types include a stay 0 fault and a stay 1 fault; the dead 0 fault is a fault state which occurs when the resonance state of the micro-ring resonator is ON; the dead 1 fault is a fault condition that occurs when the resonant condition of the microring resonator is OFF.
In detail, 2 fault types in the resonance state simulation fault model are controlled by using a ctrl signal to control the resonance state, and a ctrl _ i signal is used to control, i is a positive integer less than or equal to n, and n is 8 in this embodiment 1.
As shown in fig. 1, a 4 × 4 fault simulation apparatus, which is composed of 4 waveguides and 8 MRRs, is adapted to an optical router with 4 input ports. A, B, C, D, E, F, G, H illustrates an MRR ring of an optical router; the ports P1, P2, P3 and P4 respectively correspond to the signal input ports of the optical router; the ports Q1, Q2, Q3 and Q4 respectively correspond to the signal output ports of the optical router; ctrl _1, ctrl _2, ctrl _3, ctrl _4, ctrl _5, ctrl _6, ctrl _7, and ctrl _8 are used in the fault simulation apparatus to control the resonant state of each of 8 MRRs, and when ctrl _ i is 1(i is 1 to 8), the corresponding MRR is in the resonant state, and when ctrl _ i is 0(i is 1 to 8), the corresponding MRR is in the non-resonant state; ctrl1, ctrl2, ctrl3, ctrl4, ctrl5, ctrl6, ctrl7, and ctrl8 are used in the fault simulator to control the fault state of 8 MRRs, respectively, and when ctrl ═ 0, MRR is in a no-fault state, and when ctrl ═ 1, MRR is in a fault state.
Establishing an MRR fault model, which comprises two fault models:
a stuck 0 fault, due to manufacturing defects, is stuck at 0. Specifically, when an optical signal enters from the input end, if the resonance state of the MRR is controlled to be "ON", the optical signal is normally output from the Drop terminal, but due to the existence of a fault, the optical signal is actually output from the Through terminal, and the Drop terminal does not output. As shown in fig. 2: by controlling MRR to be in the ON state, the receiving end should receive "1" at this time, and "stay at 0" due to a manufacturing defect and actually receive "0".
A stay 1 fault refers to stay at 1 due to a manufacturing defect. Specifically, when an optical signal enters from the input end, if the resonance state of the MRR is controlled to be "OFF", normally, the signal should be output from the Through terminal, but due to the existence of a fault, the optical signal is actually output from the Drop terminal, and no signal is output from the Through terminal. As shown in fig. 3: by controlling the MRR to be in the OFF state, the receiving end should receive "0" at this time, and actually receive "1" due to "stay at 1" due to a manufacturing defect.
Taking module 1 in fig. 1 as an example: when ctrl1 is 1, indicating that the alternative multiplexer has failed, the type of failure is generated by ctrl _1, if ctrl _1 equals 0, a dead 1 failure can be simulated, and if ctrl _1 equals 1, a dead 0 failure can be simulated.
In the circuit, under the condition that the first micro-ring resonator has known single fault, state signals ctrl n of the rest 7 micro-ring resonators are all 0, and the MRR is in a fault-free state; the control signal ctrl _ n is 0, which indicates that MRR does not resonate at this time; the circuit knows that the single fault condition carries out fault detection and is discussed in two conditions of stay 0 and stay 1. The following describes a fault simulation device of an optical router with reference to a specific case.
The circuit carries out fault simulation under the condition of single fault, one of eight micro-ring resonators is randomly selected to have single fault, the first micro-ring resonator is supposed to have fault, when the first micro-ring resonator has fault, namely the fault state control signal of No. 1 MRR is ctrl 1-1, and the control signal ctrl n-0 of other micro-ring resonators indicates that the micro-ring resonators are in a fault-free state. The resonant state control signal ctrl _1 ═ 0 for MRR # 1 indicates that # 1 is in the dull 1 fault state, and the control signals for the other micro-ring resonators are equal to 0, indicating that MRR is in the no fault state.
The circuit also equates the remaining seven micro-ring resonators to an alternative switching structure, and when fault simulation is performed under the condition of single fault, the dead 0 fault and the dead 1 fault are simulated in the same way as the first micro-ring resonator, and so on.
Defining that when the optical signal is detected, the output is represented by logic 1, and when the optical signal is not detected, the output is represented by logic 0, and the MRR is equivalent to an alternative switch structure. For the second micro-ring resonator signal coming in from the P1 port, two outputs bo1 and bo2 are selected. The same applies to the remaining 7 microring resonators.
The fault simulation device of the embodiment also needs a plurality of intermediate variables for representing transmission among various signals during construction, and the bo1 and the bo2 are used for representing two signal output ports of the alternative multiplexer B, wherein the control signal of the bo1 alternative switch is output when being 1, and the control signal of the bo2 alternative switch is output when being 0; the alternative switch A, C, D, E, F, G, H is similar.
The module 2 and the module 4 need an intermediate variable e for communication, and at this time, e is a signal obtained by passing through an or gate by the output port bo1 of the one-out multiplexer B of the module 2 and the output port do2 of the one-out multiplexer D of the module 4; similarly, a, b, c, d, f, g, h are obtained from the output signals of the corresponding positions through the or gate.
The fault simulation device of the optical router is used for obtaining an output signal Q3 by the output branches co2 and d of the alternative multiplexer C through an OR gate; similarly, Q1, Q2 and Q4 are obtained by passing the output signals of the corresponding positions through an or gate. Fig. 4 is a schematic diagram of an optical router according to embodiment 1.
In summary, the present embodiment provides a fault simulation apparatus for an optical router, in which MRR is equivalent to an alternative multiplexer structure, and the whole router is designed as a circuit simulation structure formed by connecting n multiplexers, the apparatus can perform fault simulation detection under the condition of a single fault, and eight micro-rings randomly generate a micro-ring fault, and then detect the faults occurring under the conditions of stay 0 and stay 1, respectively. The invention can effectively simulate single fault caused by MRR manufacturing defect, and plays an important role in improving the reliability of the network on chip.
Although the illustrative embodiments of the present invention have been described above to enable those skilled in the art to understand the present invention, the present invention is not limited to the scope of the embodiments, and it is apparent to those skilled in the art that all the inventive concepts using the present invention are protected as long as they can be changed within the spirit and scope of the present invention as defined and defined by the appended claims.
Claims (3)
1. A dead fault simulation device of a four-port optical router is characterized in that: the fault simulation device of the router is used for simulating the fault of a single micro-ring resonator in the optical router and consists of n micro-ring resonator fault simulation subunits which are connected with each other, wherein an input interface of the fault simulation subunit simulates a signal input port of the optical router, and an output interface of the fault simulation subunit simulates a signal output port of the optical router; the fault simulation subunit is a multiplexer, and the multiplexer is used for simulating a resonance state normal state and a fault state of the micro-ring resonator.
2. The apparatus for simulating a failure of an optical router according to claim 1, wherein: the fault simulation subunit comprises a second micro-ring resonator B connected with a first input interface connected with the fault simulation subunit and a fourth micro-ring resonator D connected with a second input interface; each micro-ring resonator is provided with two output branches, and each output branch is connected to the next micro-ring resonator H or C in the abstract drawing through an OR gate;
the first micro-ring resonator B and the second micro-ring resonator D simulate 2 fault types in a fault model by controlling resonance states;
3. the apparatus for simulating a failure of an optical router according to claim 2, wherein: the 2 fault types comprise a stay-0 fault and a stay-1 fault; the dead 0 fault is a fault state which occurs when the resonance state of the micro-ring resonator is ON; the dead 1 fault is a fault state occurring when the resonance state of the micro-ring resonator is OFF; and controlling the resonance state simulation fault model to enable ctrl i to be used for controlling the resonance state, ctrl _ i to be used for signal control, and i is a positive integer less than or equal to n.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202111501658.7A CN114157935A (en) | 2021-12-09 | 2021-12-09 | Dead fault simulation device of four-port optical router |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202111501658.7A CN114157935A (en) | 2021-12-09 | 2021-12-09 | Dead fault simulation device of four-port optical router |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN114157935A true CN114157935A (en) | 2022-03-08 |
Family
ID=80454301
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202111501658.7A Pending CN114157935A (en) | 2021-12-09 | 2021-12-09 | Dead fault simulation device of four-port optical router |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN114157935A (en) |
-
2021
- 2021-12-09 CN CN202111501658.7A patent/CN114157935A/en active Pending
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN106529062B (en) | A kind of bridge structure health diagnostic method based on deep learning | |
| CN211930796U (en) | Bridging fault simulation device of optical router | |
| CN100346167C (en) | Low-power consumption sweep test method based on circuit division | |
| CN103376340A (en) | Adapter plate, a multi-platform serial test system and method | |
| CN106888050A (en) | MRR failure detectors and method in PNoC | |
| CN211352196U (en) | Fault simulation device of optical router | |
| CN102142911A (en) | Communication equipment and communication test method | |
| US11175338B2 (en) | System and method for compacting test data in many-core processors | |
| Pomeranz et al. | On removing redundancies from synchronous sequential circuits with synchronizing sequences | |
| CN111147131B (en) | Fault simulation device of optical router | |
| Yaghini et al. | Investigation of transient fault effects in synchronous and asynchronous network on chip router | |
| CN111565339A (en) | Bridging fault simulation device and control method of optical router | |
| CN114157935A (en) | Dead fault simulation device of four-port optical router | |
| CN111931376B (en) | Simulation system for evaluating performance of large-scale optical switching integrated chip | |
| US20070265823A1 (en) | Circuit emulation with state recovery | |
| CN103675653A (en) | Satellite mobile terminal CPLD test method | |
| US20160131706A1 (en) | Customer-transparent logic redundancy for improved yield | |
| Tran et al. | Design-for-test approach of an asynchronous network-on-chip architecture and its associated test pattern generation and application | |
| Cota et al. | Redefining and testing interconnect faults in mesh nocs | |
| US7337103B2 (en) | Method and apparatus for the automatic correction of faulty wires in a logic simulation hardware emulator / accelerator | |
| CN201740852U (en) | Interface adapter with cascaded structure used for rear panel testing | |
| CN104579314B (en) | A kind of reliability optimization method of SRAM type FPGA | |
| US11073558B2 (en) | Circuit having multiple scan modes for testing | |
| CN110457839B (en) | Method for accelerating chip-level circuit time sequence analysis | |
| CN103092731B (en) | Fine-adjustment remainder validation fault-tolerant low-pass filtering processing method based on input |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination |