CN211046941U - Radio frequency performance test system - Google Patents
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- CN211046941U CN211046941U CN202020143001.2U CN202020143001U CN211046941U CN 211046941 U CN211046941 U CN 211046941U CN 202020143001 U CN202020143001 U CN 202020143001U CN 211046941 U CN211046941 U CN 211046941U
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Abstract
The utility model provides a radio frequency performance test system, which comprises a darkroom, a turntable arranged in the darkroom, a stray probe assembly, a plane wave generator and a test instrument arranged outside the darkroom; the turntable comprises a fixing part for fixing the tested piece and at least two adjusting shafts, and the at least two adjusting shafts are connected with the fixing part and drive the tested piece to move along different directions; the phase center of the stray probe is aligned with the phase center of the measured piece, and the frequency band of the stray probe can cover the frequency band of the measured piece; the plane wave generator is aligned with the phase center of the tested piece; the test instrument is respectively connected with the stray probe and the plane wave generator. The utility model discloses a radio frequency capability test system is equipped with stray probe and plane wave generater simultaneously in the darkroom, satisfies the demand that full frequency channel was tested in a test field completion, can realize the test to antenna in-band index, can realize again that it is multi-purpose to the stray test of antenna outband.
Description
Technical Field
The invention relates to the technical field of index testing of antenna systems, in particular to a radio frequency performance testing system.
Background
At present, a 5G Massive MIMO Active Antenna (AAS) is different from a traditional 2/3/4G base station, and integrates a plurality of radio frequency transmitting and receiving modules (RUs) with a large-scale antenna array, and after the whole assembly, no radio frequency interface is provided to the outside, and in the definition of the industry standard 3GPP TS38.141, the indexes of OTA (air interface) measurement adopted by the AAS of FR1 (frequency band lower than 6 GHz) are few, and all the indexes of FR2 (millimeter wave frequency band) must be measured by the OTA (air interface).
Since the transmission bandwidth of the 5G AAS is 100MHz at the lowest and 400MHz at the highest, the indexes in this band are also called useful signal indexes, such as transmission power, EVM, AC L R, sensitivity, etc., and the indexes outside the band are also called out-of-band indexes, such as spurs, blocking, and the above in-band indexes and out-of-band indexes are collectively referred to as radio frequency conformance indexes.
Currently, OTA fields suitable for AAS testing radio frequency performance mainly include far fields, compact fields, and the like. In the far field, due to too large signal attenuation, low stray signals are difficult to measure accurately; although the compact field overcomes the problem of path loss, the frequency band of the reflecting surface can only reach 1GHz at the lowest, and in general stray, stray of 30 MHz-1 GHz cannot be covered. It can be seen that whether it is a far field or a compact field, there is a limitation if both in-band criteria and out-of-band spurs are to be tested. Currently, no suitable method and device for testing the radio frequency performance of a full-band transmitter and a full-band receiver exist, and in-band indexes and full-band spurs can be tested at the same time.
In view of the foregoing, there is a need for an rf performance testing system that improves upon the existing situation.
Disclosure of Invention
The invention aims to solve the technical problems in the prior art, and provides a radio frequency performance test system which can simultaneously test the in-band index and the full-band stray of an antenna and solve the problem that no system suitable for testing the radio frequency performance of a full-band transmitter and a receiver exists at present.
In order to solve the technical problems in the background technology, the invention adopts the technical scheme that: the radio frequency performance test system comprises a darkroom, a rotary table, a stray probe assembly, a plane wave generator and a test instrument, wherein the rotary table, the stray probe assembly and the plane wave generator are arranged in the darkroom, and the test instrument is arranged outside the darkroom;
wave-absorbing materials are laid on the inner wall of the darkroom;
the turntable comprises a fixing part and at least two adjusting shafts, the fixing part is used for fixing a measured piece, the at least two adjusting shafts are connected with the fixing part, and the at least two adjusting shafts can drive the measured piece to move along different directions through the fixing part;
the phase centers of the stray probe and the measured piece are aligned, and the frequency band in which the stray probe works can cover the frequency band of the measured piece;
the plane wave generator is aligned with the phase center of the tested piece and is used for forming plane waves in the area of the tested piece, receiving a transmission signal of the tested piece, transmitting the transmission signal to the test instrument and transmitting the signal to the tested piece;
the test instrument is respectively connected with the stray probe and the plane wave generator.
Furthermore, the test instrument is connected with a switch matrix, and the switch matrix is respectively connected with the stray probe and the plane wave generator. The gear of the switch matrix can be switched between the stray probe and the plane wave generator, so that the effect of the stray probe and the plane wave generator on a polling switching test is achieved.
Adopt the radio frequency capability test system of above-mentioned structure, be equipped with stray probe and plane wave generater simultaneously in the darkroom, can realize the test to antenna in-band index, can realize again the test to antenna outband straying to satisfy the demand that a test field accomplished full frequency channel test, realized testing the in-band index of piece under test and full frequency channel is strayed, a field is multi-purpose.
Further, the stray probe passes through the bracing piece with darkroom inner wall connection, wherein, the stray probe with the bracing piece can be dismantled and be connected, is convenient for realize the change of stray probe.
Furthermore, the number of the stray probes is at least three, and the frequency band formed by the at least three stray probes covers the test antenna with the frequency range of 30 MHz-18 GHz. A plurality of stray probes for testing out-of-band stray are arranged in a test field, and the frequency range formed by the stray probes covers all frequency bands of a tested piece, so that the out-of-band full-band stray test is realized.
Furthermore, the darkroom is a closed shielding box body, and the darkroom is an OTA test necessary condition, so that signal leakage is prevented, and signal reflection is reduced.
Furthermore, the frequency band formed by at least three stray probes covers the test antenna with the frequency band of 30 MHz-18 GHz. The test antenna types include, but are not limited to, a horn antenna, a log periodic antenna, a bicone antenna, a whip antenna, and the like.
Furthermore, the number of the stray probes is three, and the frequency bands of the three stray probes are respectively 30 MHz-300 MHz, 300 MHz-1 GHz and 1 GHz-18 GHz.
Furthermore, the distribution positions of the stray probes are the top surface and the side surface of the darkroom or the right front of the probe of the plane wave generator, and the distribution positions of at least three stray probes are different.
Furthermore, be equipped with a plurality of probe mounting holes on the inner wall of darkroom, it is a plurality of the probe mounting hole sets up respectively on the different inner walls of darkroom, stray probe with the connection can be dismantled to the probe mounting hole, promptly stray probe can install on the different inner walls of darkroom.
Further, the distance between the stray probe and the measured piece is 2-3 meters.
Furthermore, a stray probe arranged right in front of the probe of the plane wave generator is connected with the probe mounting hole through a telescopic rod. The stray probe is installed to the one end of telescopic link, the other end of telescopic link is fixed through the installed part bottom or the top of darkroom.
Further, install stray probe in the dead ahead of plane wave generator probe, through the pole setting with the probe mounting hole is connected, stray probe installs the one end of pole setting ensures stray probe's phase place central point puts and is surveyed a piece and aligns, the other end of pole setting is fixed through the installed part the bottom or the top of darkroom.
Furthermore, the adjusting shaft comprises an azimuth shaft, and the azimuth shaft is used for driving the measured piece to rotate by 0-360 degrees in the horizontal direction.
Further, the regulating spindle includes X translation axle and polarization axle, X translation axle is fixed to be set up azimuth axis top, X translation axle is used for the adjustment to be surveyed the distance that the piece produced the plane wave, the one end of polarization axle with X translation hub connection, the other end of polarization axle with it connects to be surveyed the piece, the polarization axle with the one end that X translation axle is connected can be followed X translation axle removes, the polarization axle with the one end that is connected by being surveyed the piece can drive it realizes 0-360 rotation of vertical direction to be surveyed the piece. The rotary table with the structure realizes the TRP measuring range mainly through the azimuth axis and the polarization axis.
Further, the revolving stage is U type revolving stage, the regulating spindle still includes Y translation axle, X translation axle and lodging axle, the mounting is including the axle that turns over, Y translation axle is connected with the darkroom bottom, X translation axle sets up Y translation is epaxial and can follow Y translation axle removes, the azimuth axis with X translation axle is connected and can be followed X translation axle removes, azimuth axis top is equipped with the lodging axle, the lodging axle with the mounting is connected, the mounting turn over the axle with it connects to be surveyed the piece, the axle that turns over can drive the rotatory predetermined angle of mounting realizes being surveyed the installation and the rise of piece, the axle that turns over is used for driving it realizes the rotation of 0-360 of direction of rolling to be surveyed the piece. By adopting the turntable with the structure, the TRP measuring range is realized through the combination of the azimuth shaft and the turning roller.
Further, the plane wave generator is a plane wave generator, which is a device that converts spherical waves into plane waves at a distance by exciting each array in its array antenna with amplitude and phase. The plane wave generator is selected to be used as the plane wave generator, the test field is a small field of the plane wave generator, so that the size of the darkroom is smaller than that of a far field and a compact field, the building and the arrangement of a test environment are facilitated, and the cost is saved.
Further, the test instrument comprises a frequency spectrograph and a signal source.
Further, the tested piece is a 5G Massive MIMO active antenna.
The radio frequency performance test system provided by the invention is provided with the stray probe and the plane wave generator in one test field simultaneously, and realizes the polling switching test of the stray probe and the plane wave generator through the switch matrix, thereby realizing the test of the in-band index of the antenna and the out-of-band stray of the antenna; and arranged a plurality of stray probe that are used for testing out-of-band spurious, it is a plurality of the frequency channel scope that stray probe constitutes covers all frequency channels of being surveyed the piece, and a plurality of stray probe distribute in the different regions of darkroom according to the motion trail of being surveyed the piece to satisfied the demand that a test field accomplished full frequency channel test, makeed present test field no matter be far field, compact field or plane wave generator's small field, can both realize simultaneously through the test system of this application to the antenna band index that awaits measuring and out-of-band full frequency channel spurious test, a field is multi-purpose. And the plane wave generator is selected as a test piece, and the test field is a small field of the plane wave generator, so that the size of the darkroom is smaller than that of a far field and a compact field, the building and the arrangement of a test environment are facilitated, and the cost is saved.
Drawings
In order to more clearly illustrate the technical solution of the present invention, the drawings needed for the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings without creative efforts.
FIG. 1 is a schematic structural diagram of a radio frequency performance testing system according to an embodiment of the present invention;
FIG. 2 is a schematic view of a wall mount for a stray probe according to an embodiment of the present invention;
FIG. 3 is a schematic structural diagram of a turntable according to an embodiment of the present invention;
fig. 4 is a schematic structural view of another turntable in the embodiment of the present invention;
FIG. 5 is a flow chart of a method for testing radio frequency performance according to an embodiment of the present invention;
FIG. 6 is a schematic diagram of a connection of a stray probe and a plane wave generator to a test meter according to an embodiment of the present invention;
FIG. 7 is a flowchart of a method for calibrating a test environment according to an embodiment of the present invention.
Wherein the reference numerals in the figures correspond to: the method comprises the following steps of 1-darkroom, 2-turntable, 3-tested piece, 4-plane wave generator, 5-stray probe, 6-vertical rod, 7-test instrument, 21-azimuth axis, 22-X translation axis, 23-polarization axis, 24-Y translation axis, 25-lodging axis and 26-rolling axis.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention. It should be noted that the embodiments and features of the embodiments may be combined with each other without conflict.
In the description of the present invention, it is to be understood that the terms "center", "longitudinal", "lateral", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", and the like, indicate orientations or positional relationships based on those shown in the drawings, and are used only for convenience in describing the present invention and for simplicity in description, and do not indicate or imply that the referenced devices or elements must have a particular orientation, be constructed and operated in a particular orientation, and thus, are not to be construed as limiting the present invention. Furthermore, the terms "first", "second", etc. are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first," "second," etc. may explicitly or implicitly include one or more of that feature. In the description of the present invention, "a plurality" means two or more unless otherwise specified.
In the description of the present invention, it should be noted that, unless otherwise explicitly specified or limited, the terms "mounted," "connected," and "connected" are to be construed broadly, e.g., as meaning either a fixed connection, a removable connection, or an integral connection; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meaning of the above terms in the present invention can be understood by those of ordinary skill in the art through specific situations.
The invention will be further described with reference to the following figures and specific examples, but the scope of the invention is not limited thereto.
Example (b):
the embodiment provides a radio frequency performance testing system, as shown in fig. 1, the antenna testing system includes a darkroom 1, a turntable 2, a stray probe assembly, a plane wave generator 4 and a testing instrument 7, the turntable 2, the stray probe assembly and the plane wave generator 4 are arranged in the darkroom 1, and the testing instrument 7 is arranged outside the darkroom 1; wave-absorbing materials are paved on the inner wall of the darkroom 1; the turntable 2 comprises a fixing part and at least two adjusting shafts, the fixing part is used for fixing a measured part 3, the at least two adjusting shafts are connected with the fixing part, and the at least two adjusting shafts can drive the measured part 3 to move along different directions through the fixing part; the phase center of the stray probe 5 is aligned with the phase center of the measured piece 3, and the frequency band in which the stray probe works can cover the frequency band of the measured piece; the plane wave generator 4 is aligned with the phase center of the tested piece 3, and the plane wave generator 4 is used for forming plane waves in the area of the tested piece 3, receiving the transmission signals of the tested piece 3, transmitting the transmission signals to the test instrument 7 and transmitting the signals to the tested piece 3; the test instrument 7 is respectively connected with the stray probe 5 and the plane wave generator 4. Wherein, the test instrument 7 comprises a frequency spectrograph and a signal source.
The test instrument 7 is connected with a switch matrix, and the switch matrix is respectively connected with the stray probe 5 and the plane wave generator 4. The gear of the switch matrix can be switched between the stray probe and the plane wave generator, so that the effect of the stray probe and the plane wave generator on a polling switching test is achieved.
The tested piece 3 of the embodiment is mainly a 5G Massive MIMO active antenna. Adopt the radio frequency capability test system of above-mentioned structure, be equipped with stray probe and plane wave generater simultaneously in the darkroom, can realize the test to antenna in-band index, can realize again the test to antenna outband straying to satisfy the demand that a test field accomplished full frequency channel test, realized testing the in-band index of piece under test and full frequency channel is strayed, a field is multi-purpose.
The darkroom 1 is a closed shielding box body, and the darkroom is an OTA test necessary condition, so that signal leakage is prevented, and signal reflection is reduced.
In a possible implementation mode, the stray probe is connected with the inner wall of the darkroom through a support rod, wherein the stray probe is detachably connected with the support rod, so that the stray probe with different working frequency bands can be replaced conveniently.
In possible embodiment, be equipped with a plurality of probe mounting holes on the inner wall of darkroom, it is a plurality of the probe mounting hole sets up respectively on the different inner walls of darkroom, stray probe's quantity is a plurality of, and is concrete, stray probe's quantity is at least three, test system still wrap with stray probe one-to-one's installing support, stray probe passes through installing support with the connection can be dismantled to the probe mounting hole, promptly stray probe can install on the different inner walls of darkroom. The frequency band formed by at least three stray probes 5 covers all the frequency bands of the tested piece 3. Preferably, the frequency band formed by at least three stray probes 5 in this embodiment covers the test antenna of 30MHz to 18 GHz. The test antenna types include, but are not limited to, a horn antenna, a log periodic antenna, a bicone antenna, a whip antenna, and the like.
In a possible embodiment, the number of the stray probes 5 is three, and the frequency bands of the three stray probes 5 are respectively 30MHz to 300MHz, 300MHz to 1GHz and 1GHz to 18 GHz.
In a possible embodiment, the number of the stray probes 5 is four, and the frequency bands of the four stray probes 5 are respectively 30MHz to 300MHz, 300MHz to 1GHz, 1GHz to 5GHz and 5GHz to 18 GHz.
In a possible embodiment, the number of the stray probes 5 is five, and the frequency bands of the five stray probes 5 are respectively 30MHz to 300MHz, 300MHz to 600MHz, 600MHz to 1GHz, 1GHz to 8GHz and 8GHz to 18 GHz.
Of course, in possible embodiments, the number of stray probes 5 may be greater, and may be adjusted according to the frequency of the selected probes and the actual test conditions.
Since the stray test belongs to the TRP measurement and requires the radiation power of the entire spherical surface to be measured and then integrated, the object 3 to be measured is moved on the turntable 2, and the stray probe 5 needs to be aligned with the phase center of the object 3 to be measured, and thus can be disposed in a plurality of areas of the darkroom 1. Preferably, the plurality of probe mounting holes are respectively arranged on different inner walls of the darkroom 1, and the stray probe 5 is detachably connected with the probe mounting holes, that is, the stray probe 5 can be arranged on different inner walls of the darkroom 1. The distance between the probe mounting hole and the measured piece 3 is 2-3 meters, namely when the stray probe 5 is mounted on the probe mounting hole, the distance between the stray probe 5 and the measured piece 3 is 2-3 meters.
In a possible embodiment, the stray probes 5 are distributed on the top surface and the side surface of the darkroom 1 or in front of the probe of the plane wave generator 4, and the distribution positions of at least three stray probes 5 are different. Consider darkroom 1 as a regular hexahedron, darkroom 1 includes six faces, and what just right with the observer is the front, is the back opposite with the front, is located the left hand side of observer for the left side face, is located the right side of observer's right hand side, and is located the top surface at top and the bottom surface opposite with the top surface. For example, in one embodiment, there are three stray probes 5 with frequency bands of 30MHz to 300MHz, 300MHz to 1GHz, and 1GHz to 18GHz, wherein the stray probe 5 with 30MHz to 300MHz is installed on the back wall of the darkroom 1, the stray probe 5 with 300MHz to 1GHz is installed on the right side wall of the darkroom 1, and the stray probe 5 with 1GHz to 18GHz is installed right in front of the probe of the plane wave generator 4. In another embodiment, a plurality of stray probes 5 can be disposed in five areas of the darkroom 1, namely, the top surface, the back surface, the left and right side surfaces of the darkroom 1 and the front of the probe of the plane wave generator 4. Of course, since the plurality of probe mounting holes are respectively arranged on different inner walls of the darkroom 1, the distribution positions of the plurality of stray probes 5 can be changed according to actual measurement needs.
For the positions of the top surface, the back surface, the left side surface and the right side surface, the stray probe 5 can be directly arranged on the wall body of the darkroom 1, the mounting bracket can be a flange, namely the stray probe 5 is mounted on the flange, and the flange is connected on the probe mounting hole reserved in the wall body, as shown in fig. 2.
For the position right in front of the probe of the plane wave generator 4, the test probe can be fixed at one end of the rod by means of a telescopic rod or a vertical rod 6, so as to ensure that the phase center position of the test probe is aligned with the tested piece 3, and the other end of the rod can be fixed at the bottom or the top of the darkroom 1 by a mounting piece, as shown in fig. 1. In a possible embodiment, a stray probe 5 installed right in front of the in-band test probe is connected with the probe installation hole through a telescopic rod. Stray probe 5 is installed to the one end of telescopic link, the other end of telescopic link is fixed through the installed part bottom or the top of darkroom 1. If use the telescopic link, when surveying when stray, only need with the telescopic link pull out can. In another embodiment, a stray probe 5 installed right in front of the in-band test probe is connected with the probe mounting hole through an upright rod 6, the stray probe 5 is installed at one end of the upright rod 6, it is ensured that the phase center position of the stray probe 5 is aligned with the tested piece 3, and the other end of the upright rod 6 is fixed at the bottom or the top of the darkroom 1 through a mounting piece. If the upright rod 6 is used, the device is usually laid on the ground, and when stray measurement is carried out, the device only needs to be lifted and fixed.
In the radio frequency performance test system of the embodiment, the plurality of stray probes are arranged in the test field, and the frequency band range formed by the plurality of stray probes covers all frequency bands of the tested piece, so that the requirement of completing full-frequency band test in one test field is met, the in-band index and full-frequency band stray of the tested piece are tested, and the test system is multifunctional in one field.
Since the spurious indicators are to be tested, in the standard definition, the spurious test is a measurement of the omnidirectional radiated power, as is the TRP, so that here the turntable requires at least two axes, of which the azimuth axis is necessary, and the other axis, depending on the type of turntable, can be either the polarization axis or the roll axis. Meanwhile, in order to assist in positioning, an X translation axis, a Y translation axis, a lodging axis and the like are also arranged.
In an embodiment, the turntable 2 is as shown in fig. 3, the adjusting shaft includes an azimuth axis 21, an X translation axis 22, and a polarization axis 23, the azimuth axis 21 is used to drive the detected piece 3 to rotate in a horizontal direction by 0-360 °, the X translation axis 22 is fixedly disposed on the top of the azimuth axis 21, the X translation axis 22 is used to adjust a distance from the detected piece 3 to the plane wave generator 4, one end of the polarization axis 23 is connected to the X translation axis 22, the other end of the polarization axis 23 is connected to the detected piece 3, one end of the polarization axis 23 connected to the X translation axis 22 can move along the X translation axis 22, and one end of the polarization axis 23 connected to the detected piece 3 can drive the detected piece 3 to rotate in a vertical direction by 0-360 °. The turntable 2 with the structure realizes the TRP measuring range mainly through the azimuth axis 21 and the polarization axis 23.
In another embodiment, the rotating table 2 is as shown in fig. 4, the rotating table 2 is a U-shaped rotating table 2, the adjusting shaft includes an azimuth axis 21, a Y translation axis 24, an X translation axis 22, and a lodging axis 25, the fixing member includes a rolling axis 26, the Y translation axis 24 is connected to the bottom of the darkroom 1, the X translation axis 22 is disposed on the Y translation axis 24 and can move along the Y translation axis 24, the azimuth axis 21 is connected to the X translation axis 22 and can move along the X translation axis 22, the X translation axis 22 and the Y translation axis 24 adjust the position of the tested piece 3, the test is performed after reaching the position, the lodging axis 25 is disposed on the top of the azimuth axis 21, the lodging axis 25 is connected to the fixing member, the rolling axis 26 of the fixing member is connected to the tested piece 3, the lodging axis 25 can drive the fixing member to rotate by a preset angle, the tested piece 3 is installed and lifted, and the rolling shaft 26 is used for driving the tested piece 3 to rotate in the rolling direction by 0-360 degrees. With the turntable 2 of the above configuration, the measurement range of the TRP is realized by the combination of the azimuth axis 21 and the roll axis 26. Since the measurement of the omnidirectional radiation function is substantially spherical, the above-described U-shaped turntable 2 is preferably used for the turntable 2 for stray measurement.
The plane wave generator 4 is a plane wave generator, which is a device that converts spherical waves into plane waves at a distance by exciting each array in its array antenna with amplitude and phase. The plane wave generator is selected to be used as the plane wave generator, the test field is a small field of the plane wave generator, so that the size of the darkroom is smaller than that of a far field and a compact field, the building and the arrangement of a test environment are facilitated, and the cost is saved.
The embodiment also provides a radio frequency performance testing method, which is completed by using the radio frequency performance testing system, as shown in fig. 5, and the method includes:
s501: placing a measured piece on a rotary table, and aligning the phase center of the measured piece with the phase center of a plane wave generator;
s502: connecting the plane wave generator with a test instrument;
s503: controlling the plane wave generator to form plane waves in the area of the tested piece;
s504: the test device comprises a test instrument, a turntable, a plane wave generator, a test signal generator and a test signal generator, wherein the turntable is controlled to rotate to drive the tested piece to rotate;
s505: controlling the plane wave generator to emit a test signal, and simultaneously controlling the rotary table to rotate so as to drive the tested piece to rotate, wherein the tested piece receives the test signal emitted by the plane wave generator and transmits the test signal to the test instrument, and the test instrument receives the test signal and performs in-band signal receiving processing;
s506: turning off the plane wave generator, connecting the stray probe with the test instrument, and starting the stray probe;
s507: the test instrument is used for controlling the tested piece to emit a test signal and controlling the rotary table to rotate so as to drive the tested piece to rotate, the phase center of the stray probe is aligned with the phase center of the tested piece, the stray probe receives the test signal emitted by the tested piece and conducts the test signal to the test instrument, and the test instrument receives the test signal and processes out-of-band signals.
In a possible embodiment, if the number of the stray probes is at least three, the step S506 is specifically: and closing the plane wave generator, connecting each stray probe with the test instrument, starting each stray probe in sequence, and repeatedly executing the step S507 until the data acquisition of each frequency band is finished.
In a specific embodiment, the number of the stray probes is three, and the stray probes are respectively a first stray probe with a frequency band of 30MHz to 300MHz, a second stray probe with a frequency band of 300MHz to 1GHz, and a third stray probe with a frequency band of 1GHz to 18GHz, wherein the first stray probe is arranged on a back wall of the darkroom, the second stray probe is arranged on a right side wall of the darkroom, the third stray probe is arranged in front of the plane wave generator, and the plane wave generator is a plane wave generator. The rear ends of the three stray probes are led out by radio frequency cables and connected to the test instrument, because the test instrument has only 1 port, a switch matrix can be added, the three stray probe probes and the plane wave generator are connected to the switch matrix, the switch matrix is connected to the instrument again, the effect of 4 polling switching tests is achieved, and the connection relationship between the stray probes, the plane wave generator and the test instrument is shown in fig. 6. During testing, firstly, the switch matrix gear is switched to the plane wave generator, a tested piece sends a test signal to the plane wave generator, then the tested piece enters a test instrument, and then data is collected, namely the steps S501-S505 are executed, so that in-band index testing is realized; after the test is finished, switching the switch matrix to the first stray probe, then controlling the rotary table, moving the tested piece to a phase center to be aligned with the phase center of the first stray probe, then sending a test signal to the tested piece, receiving the signal by the stray probe, entering a test instrument, and then collecting data, namely executing the step S507; then, the switch matrix is switched to the second stray probe, and the step S507 is executed; and switching the switch matrix to the third stray probe, and executing the step S507 to realize full-band stray test.
Preferably, the radio frequency performance testing method further includes calibrating the test environment before the testing, as shown in fig. 7, where the calibrating the test environment includes:
s701: placing a standard gain antenna on the turntable such that a phase center of the standard gain antenna is aligned with a phase center of the stray probe;
s702: respectively connecting the standard gain antenna and the stray probe with the test instrument;
s703: controlling the standard gain antenna to transmit a test signal, and receiving the test signal by the stray probe;
s704: analyzing and processing the test signal transmitted by the standard gain antenna and the test signal received by the stray probe through the test instrument to obtain a path loss value in a frequency band to be tested, and establishing a compensation table; wherein, the difference value of the power of the test signal transmitted by the standard gain antenna and the power of the test signal received by the stray probe is the path loss value;
s705: and controlling the test instrument to derive the compensation meter. And when the signals are processed in the test process, the path loss value in the compensation table is used for compensating and correcting the corresponding signals. All path loss values in the bandwidth are obtained through setting parameters such as a test frequency band of the test instrument and through vector network analysis in the test instrument, and then a compensation table is directly derived and generated.
In the radio frequency performance test system and method provided by the embodiment, the stray probe and the plane wave generator are simultaneously arranged in one test field, and the polling switching test of the stray probe and the plane wave generator is realized through the switch matrix, so that the test on the in-band index of the antenna can be realized, and the test on the out-of-band stray of the antenna can also be realized; and arranged a plurality of stray probe that are used for testing out-of-band spurious, it is a plurality of the frequency channel scope that stray probe constitutes covers all frequency channels of being surveyed the piece, and a plurality of stray probe distribute in the different regions of darkroom according to the motion trail of being surveyed the piece to satisfied the demand that a test field accomplished full frequency channel test, makeed present test field no matter be far field, compact field or plane wave generator's small field, can both realize simultaneously through the test system of this application to the antenna band index that awaits measuring and out-of-band full frequency channel spurious test, a field is multi-purpose. And the plane wave generator is selected as a test piece, and the test field is a small field of the plane wave generator, so that the size of the darkroom is smaller than that of a far field and a compact field, the building and the arrangement of a test environment are facilitated, and the cost is saved.
While the invention has been described with reference to a preferred embodiment, it will be understood by those skilled in the art that various changes in form and details may be made therein without departing from the spirit and scope of the invention.
Claims (8)
1. A radio frequency performance testing system, characterized by: the device comprises a darkroom (1), a rotary table (2), a stray probe (5), a plane wave generator (4) and a test instrument (7), wherein the rotary table (2), the stray probe assembly and the plane wave generator (4) are arranged in the darkroom (1), and the test instrument (7) is arranged outside the darkroom (1);
wave-absorbing materials are paved on the inner wall of the darkroom (1);
the turntable (2) comprises a fixing part and at least two adjusting shafts, the fixing part is used for fixing a measured part (3), the at least two adjusting shafts are connected with the fixing part, and the at least two adjusting shafts can drive the measured part (3) to move along different directions through the fixing part;
the phase center of the stray probe (5) is aligned with the phase center of the tested piece (3), and the frequency band of the stray probe can cover the frequency band of the tested piece;
the plane wave generator (4) is aligned with the phase center of the tested piece (3);
the test instrument (7) is respectively connected with the stray probe (5) and the plane wave generator (4).
2. The radio frequency performance testing system of claim 1, wherein: the test instrument (7) is connected with a switch matrix, and the switch matrix is respectively connected with the stray probe (5) and the plane wave generator (4).
3. The radio frequency performance testing system of claim 1, wherein: the number of the stray probes (5) is at least three, and the frequency band formed by the at least three stray probes (5) covers the test antenna with the frequency range of 30 MHz-18 GHz.
4. The radio frequency performance testing system of claim 3, wherein: the number of the stray probes (5) is three, and the frequency bands of the three stray probes (5) are respectively 30 MHz-300 MHz, 300 MHz-1 GHz and 1 GHz-18 GHz.
5. The radio frequency performance testing system of claim 3, wherein: the distribution positions of the stray probes (5) are the top surface and the side surface of the darkroom (1) or the right front of the probe of the plane wave generator (4), and the distribution positions of at least three of the stray probes (5) are different.
6. The radio frequency performance testing system of claim 5, wherein: be equipped with a plurality of probe mounting holes on the inner wall of darkroom (1), it is a plurality of the probe mounting hole sets up respectively on the different inner walls of darkroom (1), stray probe (5) with the connection can be dismantled to the probe mounting hole.
7. The radio frequency performance testing system of claim 1, wherein: the adjusting shaft comprises an azimuth shaft, and the azimuth shaft is used for driving the measured piece (3) to rotate by 0-360 degrees in the horizontal direction.
8. The radio frequency performance testing system of claim 7, wherein: the regulating spindle still includes Y translation axle, X translation axle and lodging axle, the mounting is including the roll-over axle, Y translation axle is connected with the darkroom bottom, X translation axle sets up Y translation is epaxial and can be followed Y translation axle removes, the azimuth axle with X translation axle is connected and can be followed X translation axle removes, azimuth axle top is equipped with the lodging axle, the lodging axle with the mounting is connected, the mounting the roll-over axle with it connects to be surveyed piece (3), the roll-over axle can drive the rotatory angle of predetermineeing of mounting, the roll-over axle is used for driving it realizes the rotation of 0-360 of direction of rolling to be surveyed piece (3).
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| CN202020143001.2U CN211046941U (en) | 2020-01-22 | 2020-01-22 | Radio frequency performance test system |
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| CN202020143001.2U CN211046941U (en) | 2020-01-22 | 2020-01-22 | Radio frequency performance test system |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112887039A (en) * | 2020-09-03 | 2021-06-01 | 上海无委无线电检测实验室有限公司 | 5G base station radio frequency consistency test method |
| CN113156224A (en) * | 2021-03-31 | 2021-07-23 | 国家无线电监测中心检测中心 | OTA test darkroom |
| CN113219244A (en) * | 2021-05-07 | 2021-08-06 | 北京航空航天大学 | Ultra-wide band plane wave generating system |
| CN114362847A (en) * | 2021-12-30 | 2022-04-15 | 江苏创通电子股份有限公司 | Millimeter wave radio frequency testing device and method |
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2020
- 2020-01-22 CN CN202020143001.2U patent/CN211046941U/en active Active
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112887039A (en) * | 2020-09-03 | 2021-06-01 | 上海无委无线电检测实验室有限公司 | 5G base station radio frequency consistency test method |
| CN113156224A (en) * | 2021-03-31 | 2021-07-23 | 国家无线电监测中心检测中心 | OTA test darkroom |
| CN113156224B (en) * | 2021-03-31 | 2023-01-10 | 国家无线电监测中心检测中心 | OTA test darkroom |
| CN113219244A (en) * | 2021-05-07 | 2021-08-06 | 北京航空航天大学 | Ultra-wide band plane wave generating system |
| CN114362847A (en) * | 2021-12-30 | 2022-04-15 | 江苏创通电子股份有限公司 | Millimeter wave radio frequency testing device and method |
| CN114362847B (en) * | 2021-12-30 | 2024-02-02 | 江苏创通电子股份有限公司 | Millimeter wave radio frequency testing device and testing method |
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