CN109142890B - Terahertz leaky-wave antenna measuring system - Google Patents
Terahertz leaky-wave antenna measuring system Download PDFInfo
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- CN109142890B CN109142890B CN201810965187.7A CN201810965187A CN109142890B CN 109142890 B CN109142890 B CN 109142890B CN 201810965187 A CN201810965187 A CN 201810965187A CN 109142890 B CN109142890 B CN 109142890B
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01Q—ANTENNAS, i.e. RADIO AERIALS
- H01Q19/00—Combinations of primary active antenna elements and units with secondary devices, e.g. with quasi-optical devices, for giving the antenna a desired directional characteristic
- H01Q19/10—Combinations of primary active antenna elements and units with secondary devices, e.g. with quasi-optical devices, for giving the antenna a desired directional characteristic using reflecting surfaces
- H01Q19/12—Combinations of primary active antenna elements and units with secondary devices, e.g. with quasi-optical devices, for giving the antenna a desired directional characteristic using reflecting surfaces wherein the surfaces are concave
- H01Q19/15—Combinations of primary active antenna elements and units with secondary devices, e.g. with quasi-optical devices, for giving the antenna a desired directional characteristic using reflecting surfaces wherein the surfaces are concave the primary radiating source being a line source, e.g. leaky waveguide antennas
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/10—Radiation diagrams of antennas
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01Q—ANTENNAS, i.e. RADIO AERIALS
- H01Q13/00—Waveguide horns or mouths; Slot antennas; Leaky-waveguide antennas; Equivalent structures causing radiation along the transmission path of a guided wave
- H01Q13/20—Non-resonant leaky-waveguide or transmission-line antennas; Equivalent structures causing radiation along the transmission path of a guided wave
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01Q—ANTENNAS, i.e. RADIO AERIALS
- H01Q19/00—Combinations of primary active antenna elements and units with secondary devices, e.g. with quasi-optical devices, for giving the antenna a desired directional characteristic
- H01Q19/06—Combinations of primary active antenna elements and units with secondary devices, e.g. with quasi-optical devices, for giving the antenna a desired directional characteristic using refracting or diffracting devices, e.g. lens
- H01Q19/062—Combinations of primary active antenna elements and units with secondary devices, e.g. with quasi-optical devices, for giving the antenna a desired directional characteristic using refracting or diffracting devices, e.g. lens for focusing
Abstract
The application provides a terahertz leaky-wave antenna measurement system places the probe antenna at the ditch inslot to remove the probe antenna in the ditch inslot, can gather the amplitude and the phase distribution information of the probe antenna position of removal in-process, realized feed antenna and radiation cavity's separation. And the antenna far field test is realized according to the extrapolation of the reciprocity theorem. Compared with the method that the position of a feed source antenna in the transmitting device is directly changed, the terahertz leaky-wave antenna measuring system greatly reduces the damage degree to the original antenna structure and improves the testing precision. Meanwhile, the method is simple and easy to implement, and can provide comprehensive reference for the installation and adjustment of the feed source. When the integrated test of the terahertz leaky-wave antenna measuring system is completed, the maximum far-field gain is searched through the movement of the probe antenna so as to determine the position of the actual phase center, and the problem of feed source actual phase center correction in the two-dimensional leaky-wave antenna is effectively solved.
Description
Technical Field
The application relates to the field of antenna measurement, in particular to a terahertz leaky-wave antenna measurement system.
Background
The terahertz two-dimensional periodic leaky-wave antenna gets rid of a complex feed network, can realize high directivity under the condition of a low section, and is widely applied to terahertz security inspection, spectral analysis and radar application. The terahertz two-dimensional periodic leaky-wave antenna is composed of a radiation cavity with a periodic unit attached to the top and a feed source, and the position of the feed source has great influence on the performance of the two-dimensional leaky-wave antenna like a reflector antenna. In theoretical design, the phase center of the feed source is usually fixed, and then the leaky-wave antenna is optimized integrally, so that the optimal feed source matching scheme is considered.
However, due to the deformation, assembly and other errors existing in the actual working condition, the phase center of the feed source deviates from the optimal position. Therefore, the optimal feed source position of the leaky-wave antenna is determined through measurement, and the method is very important for obtaining the high-quality and high-efficiency terahertz leaky-wave antenna. The existing leaky-wave antenna measuring system can not simply move the position of the feed source to realize the integrated measurement of the antenna because the feed source is integrated in the radiation cavity. Therefore, the existing leaky-wave antenna measuring system cannot effectively solve the problem of correcting the actual phase center of the feed source in the two-dimensional leaky-wave antenna while completing the terahertz antenna integrated test.
Disclosure of Invention
Therefore, the terahertz leaky-wave antenna measuring system capable of effectively correcting the actual phase center of the feed source in the two-dimensional leaky-wave antenna while completing the integrated terahertz antenna test is needed to be provided for solving the problem that the actual phase center of the feed source in the two-dimensional leaky-wave antenna cannot be effectively corrected while the existing leaky-wave antenna measuring system can not complete the integrated terahertz antenna test.
The application provides a terahertz leaky-wave antenna measurement system includes bow-shaped roof beam, emitter, radiation cavity and probe antenna. The emitting device is arranged on the arched beam. The radiation cavity is arranged at the position of the circle center of the arched beam, and a groove is arranged in the radiation cavity. The probe antenna is arranged in the groove.
In one embodiment, the trench includes a first sub-trench extending along a first direction, a second sub-trench extending along a second direction, and a third sub-trench extending along a third direction, and the first sub-trench, the second sub-trench, and the third sub-trench are perpendicular to and intersect each other.
In one embodiment, the transmitting device comprises a rotating mechanism, a transmitting platform, an adjustable support frame, a feed source antenna and a lens collimator. The rotating mechanism is nested in the arched beam and used for moving the rotating mechanism on the arched beam to change the angle. The emission platform is fixedly connected with one end, close to the radiation cavity, of the rotating mechanism. The adjustable support frame is fixedly connected with the launching platform, and the adjustable support frame and the launching platform are surrounded to form an accommodating space. The feed source antenna is arranged on the transmitting platform and arranged in the accommodating space. The lens collimator is connected with the adjustable support frame and used for adjusting the position of the lens collimator.
In one embodiment, the radiation cavity is provided with a plurality of metal sheets at intervals close to the surface of the emitting device.
In one embodiment, the terahertz leaky-wave antenna measuring system comprises a support frame. The support frame set up in bow-shaped roof beam bottom is used for supporting the bow-shaped roof beam.
In one embodiment, the terahertz leaky-wave antenna measuring system further comprises a wave-absorbing material layer. The wave absorbing material layer is arranged around the arched beam and the radiation cavity and used for reducing noise influence around the terahertz leaky wave antenna measurement system.
In one embodiment, the terahertz leaky-wave antenna measurement system further comprises a ground test platform. The ground test platform is arranged at the position of the circle center of the arched beam and used for placing the radiation cavity.
In one embodiment, the terahertz leaky-wave antenna measurement system further comprises a vector network analyzer. One port of the vector network analyzer is connected with the feed source antenna, and the other port of the vector network analyzer is connected with the probe antenna.
In one embodiment, the terahertz leaky-wave antenna measurement system further comprises a controller. The controller is connected with the vector network analyzer.
In one embodiment, the terahertz leaky-wave antenna measurement system further comprises a driving device. The output end of the driving device is connected with the transmitting device, and the input end of the driving device is connected with the computer controller and used for driving the transmitting device to move on the arched beam.
The application provides a terahertz leaky-wave antenna measurement system place in the slot probe antenna, and remove in the slot probe antenna can gather and remove the in-process the amplitude and the phase distribution information of probe antenna position have realized feed antenna with the separation of radiation cavity. And the antenna far field test is realized according to the extrapolation of the reciprocity theorem. Compared with the method of directly changing the position of the feed source antenna in the transmitting device, the method greatly reduces the damage degree to the original antenna structure and improves the test precision. Meanwhile, the method is simple and easy to implement, and can provide comprehensive reference for the installation and adjustment of the feed source.
When the integrated test of the terahertz leaky-wave antenna measuring system is completed, the position with the maximum far-field gain is searched through the movement of the probe antenna so as to determine the position of the actual phase center, and the problem of feed source actual phase center correction in the two-dimensional leaky-wave antenna is effectively solved. The terahertz leaky-wave antenna measuring system can be used for measuring the radiation characteristics of terahertz waveband and millimeter waveband two-dimensional leaky-wave antennas and the transmission characteristics of frequency selection surfaces, antenna samples do not need to be manufactured in large quantities for testing, and the cost is greatly reduced.
Drawings
Fig. 1 is an overall structural diagram of a terahertz leaky-wave antenna measurement system provided by the present application;
fig. 2 is a schematic view of a radiation cavity structure in the terahertz leaky-wave antenna measurement system provided by the present application;
fig. 3 is a phase center offset gain diagram of the terahertz leaky-wave antenna measurement system provided by the present application.
Description of the reference numerals
The terahertz leaky-wave antenna measuring system 100, the arched beam 10, the transmitting device 20, the radiation cavity 30, the groove 310, the probe antenna 40, the first sub-groove 311, the second sub-groove 312, the third sub-groove 313, the rotating mechanism 210, the transmitting platform 220, the adjustable support frame 230, the accommodating space 231, the feed source antenna 240, the lens collimator 250, the metal sheet 320, the support frame 50, the wave absorbing material layer 60, the ground test platform 70, the vector network analyzer 80, the controller 90 and the driving device 910.
Detailed Description
In order to make the objects, technical solutions and advantages of the present application more apparent, the present application is further described in detail below by way of embodiments and with reference to the accompanying drawings. It should be understood that the specific embodiments described herein are merely illustrative of the present application and are not intended to limit the present application.
The numbering of the components as such, e.g., "first", "second", etc., is used herein only to distinguish the objects as described, and does not have any sequential or technical meaning. The term "connected" and "coupled" when used in this application, unless otherwise indicated, includes both direct and indirect connections (couplings). In the description of the present application, it is to be understood that the terms "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", and the like, indicate orientations or positional relationships based on those shown in the drawings, and are used only for convenience in describing the present application and for simplicity in description, and do not indicate or imply that the devices or elements referred to must have a particular orientation, be constructed in a particular orientation, and be operated, and thus, are not to be considered as limiting the present application.
In this application, unless expressly stated or limited otherwise, the first feature "on" or "under" the second feature may be directly contacting the first and second features or indirectly contacting the first and second features through intervening media. Also, a first feature "on," "over," and "above" a second feature may be directly or diagonally above the second feature, or may simply indicate that the first feature is at a higher level than the second feature. A first feature being "under," "below," and "beneath" a second feature may be directly under or obliquely under the first feature, or may simply mean that the first feature is at a lesser elevation than the second feature.
Referring to fig. 1, the present application provides a terahertz leaky-wave antenna measurement system 100 including an arched beam 10, a transmitter 20, a radiation cavity 30, and a probe antenna 40. The emitter means 20 is arranged on the arched beam 10. The radiation cavity 30 is arranged at the center of the arched beam 10, and a groove 310 is arranged in the radiation cavity 30. The probe antenna 40 is disposed in the groove 310.
The emitting device 20 is disposed on the arched beam 10, and the emitting device 20 can move on the arched beam 10 to change the angle of the incident wave to the radiation cavity 30. Terahertz signals are emitted from the emitting device 20, and the emitting device 20 can move in the range of 0-180 degrees.
As can be seen from the reciprocity theorem in the far-field measurements, the far-field radiation intensity excited by a feed antenna located inside the radiation cavity 30 is equal to the radiation intensity excited by the same feed antenna in the far-field inside the radiation cavity 30. The probe antenna 40 is placed in the groove 310, and the probe antenna 40 is moved in the groove 310, so that the amplitude and phase distribution information of the position of the probe antenna 40 in the moving process can be collected, and the feed source antenna and the radiation cavity 30 are separated. And the antenna far field test is realized according to the extrapolation of the reciprocity theorem. Compared with the method of directly changing the position of the feed antenna in the transmitting device 20, the method greatly reduces the damage degree to the original antenna structure and improves the test precision. Meanwhile, the method is simple and easy to implement, and can provide comprehensive reference for the installation and adjustment of the feed source.
When the integrated test of the terahertz leaky-wave antenna measuring system 100 is completed, the position with the largest far-field gain is searched through the movement of the probe antenna 40 so as to determine the position of the actual phase center, and the problem of feed source actual phase center correction in the two-dimensional leaky-wave antenna is effectively solved. The terahertz leaky-wave antenna measuring system 100 can be used for measuring the radiation characteristics of terahertz wave band and millimeter wave band two-dimensional leaky-wave antennas and the transmission characteristics of frequency selection surfaces, and does not need to manufacture a large number of antenna samples for testing, so that the cost is greatly reduced.
In one embodiment, the launch device 20 includes a rotation mechanism 210, a launch platform 220, an adjustable support stand 230, a feed antenna 240, and a lens collimator 250. The rotating mechanism 210 is nested in the arched beam 10, and is used for moving the rotating mechanism 210 in the arched beam 10 to change the angle. The emission platform 220 is fixedly connected to one end of the rotating mechanism 210 close to the radiation cavity 30. The adjustable supporting frame 230 is fixedly connected with the launching platform 220, and the adjustable supporting frame 230 and the launching platform 220 surround to form an accommodating space 231. The feed antenna 240 is disposed on the transmitting platform 220 and disposed in the accommodating space 231. The lens collimator 250 is connected to the adjustable support frame 230 to adjust the position of the lens collimator 250.
The rotating mechanism 210 can be mounted on the arched beam 10 by gear-rack engagement, and the rotating mechanism 210 is driven by a stepping motor to move on the arched beam 10. The transmitting platform 220 is provided with the feed antenna 240, so as to transmit the terahertz signal from the feed antenna 240. Meanwhile, the position of the feed antenna 240 may be corrected by the lens collimator 250, so that the phase center position of the feed antenna 240 coincides with the focal position of the lens collimator 250, and thus the incident wave emitted at the θ angle is a plane wave. Also, the adjustable support 230 can adjust the front-back distance to change the front-back position of the lens collimator 250.
The far field is defined as that the distance R is required to satisfy R relative to the maximum aperture D of the antenna at the wavelength lambda of free space>2D2And/lambda. However, the terahertz leaky-wave antenna belongs to an electrically large structure, and a far-field distance needs more than one hundred meters to obtain a plane beam with good quality. The emitting device 20 adopts a compact field method based on the lens collimator 250, so that the volume of the terahertz leaky-wave antenna measuring system 100 is reduced, and the space occupancy rate is reduced.
By adjusting the position of the feed antenna 240 arranged on the transmitting platform 220 and the front-back distance of the adjustable support 230, the feed phase center can be located at the focus of the lens collimator 250, so as to obtain a quasi-planar beam with a larger dead zone. When the feed source phase center position coincides with the focal position of the lens collimator 250, the incident wave incident on the radiation cavity 30 at an angle of θ (0 ° -180 °) is a plane wave. When the probe antenna 40 moves horizontally by a distance d in the x-direction of the first sub-groove 311 or the y-direction of the second sub-groove 312, the phase difference is
When the third sub-groove 313 of the probe antenna 40 moves vertically in the z-direction by a distance d, the phase difference is
Therefore, when the feed antenna 240 is moved on the transmitting platform 220, if the phase difference obtained by sampling the probe antenna 40 satisfies the above two formulas, the focal position of the lens collimator 250 is the feed phase center position.
Terahertz signals are emitted from the feed antenna 240 and corrected by the lens collimator 250. The rotating mechanism 210 can drive the feed antenna 240 to move within a range of 0-180 °. Because the probe antenna 40 is placed in the groove 310, the probe antenna 40 can be moved in the groove 310, and simultaneously, the amplitude and phase distribution information of the position of the probe antenna 40 in the moving process is collected in real time, so that the feed antenna 240 is separated from the radiation cavity 30. And the antenna far field test is realized according to the extrapolation of the reciprocity theorem. When the integrated test of the terahertz leaky-wave antenna measuring system 100 is completed, the position with the largest far-field gain is searched through the movement of the probe antenna 40 so as to determine the position of the actual phase center, and the terahertz leaky-wave antenna measuring system for correcting the actual phase center of the feed source in the two-dimensional leaky-wave antenna is effectively solved.
Referring to fig. 2, in one embodiment, the trench 310 includes a first sub-trench 311 extending along a first direction, a second sub-trench 312 extending along a second direction, and a third sub-trench 313 extending along a third direction. The first sub-groove 311, the second sub-groove 312, and the third sub-groove 313 are perpendicular to and intersect each other.
The first direction is an x direction, the second direction is a y direction, and the third direction is a z direction. The first sub-groove 311, the second sub-groove 312, and the third sub-groove 313 are respectively disposed in three directions of x, y, and z, are perpendicular to each other, share a common origin, and are used for placing and moving the probe antenna 40.
The radiation cavity 30 is a dielectric rod (e.g., a silicon waveguide) with a rectangular cross-section. The first sub-groove 311 in the x direction, the second sub-groove 312 in the y direction, and the third sub-groove 313 in the z direction are etched in the radiation cavity 30, so that the probe antenna 40 can move in the radiation cavity 30 in the x, y, and z directions. The feed antenna 240 and the radiation cavity 30 can be separated by moving the probe antenna 40 in the radiation cavity 30 in x, y and z, and the antenna far-field test is completed by extrapolation of the reciprocity theorem. Meanwhile, the position of the far field gain maximum is found by the movement of the probe antenna 40 to determine the actual phase center position.
Wherein the first sub-trench 311, the second sub-trench 312 and the third sub-trench 313 are disposed at a theoretical phase center of the radiation cavity 30. After the electromagnetic wave radiated by the antenna leaves the antenna for a certain distance, the equiphase surface of the electromagnetic wave is approximate to a spherical surface, and the spherical center of the spherical surface is the theoretical phase center of the antenna. During the measurement, the probe antenna 40 can be moved in x, y, z directions, respectively, to determine the actual phase center position.
Through in the radiation cavity 30 the inside slot that etches x, y, z direction respectively, can make probe antenna 40 removes in different directions, compares in the direct change feed antenna 240's position, has reduced the degree of damage to original antenna structure by a wide margin, has improved terahertz leaky-wave antenna measurement system 100's test accuracy. Meanwhile, the terahertz leaky-wave antenna measuring system 100 is simple and easy to implement during measurement, and can provide comprehensive reference for feed source installation and adjustment.
In one embodiment, the probe antenna 40 may be 2mm by 1 mm.
In one embodiment, the radiation cavity 30 is provided with a plurality of metal sheets 320 at intervals near the surface of the emitting device 20.
The radiation cavity 30 is made of a solid dielectric material with a rectangular cross section, and a plurality of rectangular metal sheets 320 are periodically plated on the surface of the radiation cavity 30. When the electromagnetic wave propagates along the traveling wave structure, the radiation is generated continuously along the radiation cavity 30, and at this time, a leakage wave is formed by the plurality of metal sheets 320 of the radiation cavity 30.
In one embodiment, the terahertz leaky-wave antenna measurement system 100 includes a support frame 50. The support frame 50 is disposed at the bottom end of the arched beam 10 to support the arched beam 10.
In one embodiment, the terahertz leaky-wave antenna measurement system 100 further comprises a wave-absorbing material layer 60. The wave-absorbing material layer 60 is disposed around the arched beam 10 and the radiation cavity 30, so as to reduce noise influence around the terahertz leaky-wave antenna measurement system 100.
The wave-absorbing material layer 60 is a wave-absorbing material and is laid around the arched beam 10 and the radiation cavity 30, so that the wave-absorbing material is laid around the probe antenna 40 to absorb or greatly reduce the electromagnetic wave energy projected to the surface of the wave-absorbing material, thereby reducing the interference of the electromagnetic wave.
In one embodiment, the terahertz leaky-wave antenna measurement system 100 further comprises a ground test platform 70. The ground test platform 70 is disposed at the center of the arched beam 10 for placing the radiation cavity 30.
Meanwhile, the wave-absorbing material layer 60 is disposed around the ground test platform 70 and is used for absorbing or greatly reducing the electromagnetic wave energy projected to the surface of the wave-absorbing material, so as to reduce the interference of the electromagnetic wave.
In one embodiment, the terahertz leaky-wave antenna measurement system 100 further includes a vector network analyzer 80. One port of the vector network analyzer 80 is connected to the feed antenna 240, and the other port of the vector network analyzer 80 is connected to the probe antenna 40.
The vector network analyzer 80 is a device for testing electromagnetic wave energy, and can detect parameter amplitudes and phase positions. By connecting the feed antenna 240 and the probe antenna 40 with the vector network analyzer 80, amplitude and phase distribution information and variation about the location of the antenna can be obtained.
In one embodiment, the terahertz leaky-wave antenna measurement system 100 further includes a controller 90. The controller 90 is connected to the vector network analyzer 80. The controller 90 is a computer for data processing and controlling the stepping motor to drive the rotating mechanism 210 to move on the arched beam 10.
A terahertz signal is generated by a terahertz signal source, and the terahertz signal is emitted from the feed source antenna 240 connected with the vector network analyzer 80, converted into a quasi-planar wave by the lens collimator 250, and then reaches the radiation cavity 30 on the ground test platform 70. Part of the energy is transmitted to the probe antenna 40 inside the radiation cavity 30, and the transmitted signal is transmitted to the controller 90 through the probe antenna 40 and the vector network analyzer 80. The vector network analyzer 80 processes the acquired data to obtain amplitude and phase distribution information of the position where the probe antenna 40 is located, and transmits the amplitude and phase distribution information to the controller 90, so that the controller 90 processes the data, and far-field data conversion is performed to obtain far-field characteristics.
Meanwhile, an antenna far-field directional pattern under the condition of the current phase center is obtained by extrapolation according to the obtained far-field characteristic and the reciprocity theorem, so that the radiation characteristics of the directional pattern, the gain, the axial ratio and the like of the leaky-wave antenna are obtained.
In one embodiment, the terahertz leaky-wave antenna measurement system 100 further includes a driving device 910. The output end of the driving device 910 is connected to the emitting device 20, and the input end of the driving device 910 is connected to the computer controller 90 for driving the emitting device 20 to move on the arched beam 10.
The driving means 910 may be a stepping motor. The rotating mechanism 210 is mounted on the arched beam 10 by means of rack-and-pinion engagement, and the rotating mechanism 210 is driven by a stepping motor to move on the arched beam 10. The driving device 910 is connected to the controller 90, and controls the stepping motor in a manner programmed by the controller 90, so as to move the rotating mechanism 210. The controller 90 and the driving device 910 can control the emitting device 20 to move on the arched beam 10, so that the incident angle is changed within the range of 0-180 degrees, oblique incidence at different angles is realized, the accuracy of the terahertz leaky wave antenna measuring system 100 for angle control is improved, and more intelligent operation is realized.
When the terahertz leaky-wave antenna measurement system 100 is used for testing, the feed antenna 240 is firstly fixed on the transmitting platform 220, and the probe antenna 40 of the ground testing platform 70 is moved for sampling. The phase center position of the feed antenna 240 is calculated from the sampling result, so that the position of the feed antenna 240 can be adjusted such that the phase center position of the feed antenna 240 coincides with the focal position of the lens collimator 250. At this time, when the probe antenna 40 moves within a given range, the amplitude and phase of the acquired signal change according to the incident condition of the plane wave, so that a large number of antenna samples do not need to be manufactured for testing, and the cost is greatly reduced.
When the feed phase center position coincides with the focal position of the lens collimator 250, the calibration is completed. At this time, the radiation cavity 30 of the leaky-wave antenna to be tested is placed on the ground test platform 70, a terahertz signal generated by a terahertz signal source is emitted from the feed source antenna 240, and is converted into a quasi-planar wave by the lens collimator 250, and then reaches the test platform, and part of energy is transmitted to the probe antenna 40 inside the radiation cavity 30. The transmitted signal is uploaded to the controller 90 via the probe antenna 40 and the vector network analyzer 80. By the method, the amplitude and the phase distribution of the position of the probe antenna 40 are collected under the incident angle of 0-180 degrees, and the antenna far-field directional diagram under the current phase center condition can be obtained by extrapolation according to the reciprocity theorem.
By the above method, the position of the probe antenna 40 is regularly moved in the vicinity of the theoretical phase center in the first sub-groove 311, the second sub-groove 312, and the third sub-groove 313 (i.e., in the x, y, and z directions), the amplitude of the probe antenna 40 is collected, and after the amplitude is uploaded to the controller 90 by the vector network analyzer 80, the position of the probe antenna 40 at the time of obtaining the maximum radiation gain by comparison, that is, the position of the ideal phase center, is obtained.
Referring to fig. 3, fig. 3 is a graph of z-offset distance and normalized directivity coefficient for a phase center in one embodiment, fig. 3 showing that z-direction variation is very sensitive and the gain is maximum without phase center offset.
The technical features of the embodiments described above may be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the embodiments described above are not described, but should be considered as being within the scope of the present specification as long as there is no contradiction between the combinations of the technical features.
The above-mentioned embodiments only express several embodiments of the present application, and the description thereof is more specific and detailed, but not construed as limiting the scope of the present application. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the concept of the present application, which falls within the scope of protection of the present application. Therefore, the protection scope of the present patent shall be subject to the appended claims.
Claims (8)
1. A terahertz leaky-wave antenna measurement system (100), comprising:
a bow beam (10);
a launcher (20) disposed on the arcuate beam (10);
the radiation cavity (30) is arranged at the circle center of the arched beam (10), and a groove (310) is arranged in the radiation cavity (30);
a probe antenna (40) disposed in the trench (310);
the grooves (310) comprise a first sub-groove (311) extending along a first direction, a second sub-groove (312) extending along a second direction and a third sub-groove (313) extending along a third direction, and the first sub-groove (311), the second sub-groove (312) and the third sub-groove (313) are perpendicular to each other and intersect with each other;
the transmitting device (20) comprises:
the rotating mechanism (210) is nested in the arched beam (10) and is used for moving the rotating mechanism (210) on the arched beam (10) to change the angle;
the emission platform (220) is fixedly connected with one end, close to the radiation cavity (30), of the rotating mechanism (210);
the adjustable support frame (230) is fixedly connected with the launching platform (220), and the adjustable support frame (230) and the launching platform (220) surround to form an accommodating space (231);
a feed antenna (240) disposed on the transmitting platform (220) and disposed in the accommodating space (231);
a lens collimator (250) coupled to the adjustable support frame (230) for adjusting a position of the lens collimator (250);
the first sub-trench (311), the second sub-trench (312) and the third sub-trench (313) are disposed at a theoretical phase center of the radiation cavity (30);
the feed antenna (240) is separated from the radiation cavity (30) by moving the probe antenna (40) in the groove (310) in the radiation cavity (30), an antenna far field test is completed by extrapolation of a reciprocity theorem, meanwhile, the position of the actual phase center of the feed antenna (240) is determined by finding the position with the maximum far field gain through the movement of the probe antenna (40), and therefore the position of the feed antenna (240) is adjusted, the position of the phase center of the feed antenna (240) is enabled to be coincident with the focus position of the lens collimator (250), and calibration is completed.
2. The terahertz leaky-wave antenna measurement system (100) as claimed in claim 1, wherein the radiation cavity (30) is provided with a plurality of metal sheets (320) at intervals on a surface close to the transmitting device (20).
3. The terahertz leaky-wave antenna measurement system (100) according to claim 1, wherein the terahertz leaky-wave antenna measurement system (100) comprises:
the support frame (50) is arranged at the bottom end of the arched beam (10) and used for supporting the arched beam (10).
4. The terahertz leaky-wave antenna measurement system (100) according to claim 1, wherein the terahertz leaky-wave antenna measurement system (100) further comprises:
and the wave absorbing material layer (60) is arranged around the arched beam (10) and the radiation cavity (30) and used for reducing the noise influence around the terahertz leaky wave antenna measuring system (100).
5. The terahertz leaky-wave antenna measurement system (100) according to claim 1, wherein the terahertz leaky-wave antenna measurement system (100) further comprises:
the ground test platform (70) is arranged at the position of the circle center of the arched beam (10) and used for placing the radiation cavity (30).
6. The terahertz leaky-wave antenna measurement system (100) according to claim 1, wherein the terahertz leaky-wave antenna measurement system (100) further comprises:
a vector network analyzer (80), wherein one port of the vector network analyzer (80) is connected with the feed antenna (240), and the other port of the vector network analyzer (80) is connected with the probe antenna (40).
7. The terahertz leaky-wave antenna measurement system (100) according to claim 6, wherein the terahertz leaky-wave antenna measurement system (100) further comprises:
and the controller (90) is connected with the vector network analyzer (80).
8. The terahertz leaky-wave antenna measurement system (100) according to claim 7, wherein the terahertz leaky-wave antenna measurement system (100) further comprises:
a driving device (910), an output end of the driving device (910) is connected with the emitting device (20), and an input end of the driving device (910) is connected with the controller (90) for driving the emitting device (20) to move on the arched beam (10).
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| PCT/CN2018/114493 WO2020037838A1 (en) | 2018-08-23 | 2018-11-08 | Terahertz leaky wave antenna measurement system |
| US17/173,147 US11437729B2 (en) | 2018-08-23 | 2021-02-10 | Terahertz leaky-wave antenna measuring system |
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| CN113960373A (en) * | 2020-07-20 | 2022-01-21 | 川升股份有限公司 | Antenna radiation pattern measuring system |
| CN113533863B (en) * | 2021-06-23 | 2022-07-12 | 北京邮电大学 | Amplitude scanning system |
| TWI771092B (en) * | 2021-07-01 | 2022-07-11 | 川升股份有限公司 | AiP PHASED ARRAY RADIATION PATTERN EVALUATION SYSTEM SUITABLE FOR SMALL QUIET ZONE |
| CN113933320A (en) * | 2021-08-25 | 2022-01-14 | 兰州大学 | Single-end testing method for wave-absorbing property of material |
| CN114216853B (en) * | 2021-12-13 | 2023-12-29 | 清华大学 | Real-time detection system and method based on terahertz leaky-wave antenna |
| CN114280382B (en) * | 2021-12-27 | 2023-06-27 | 中国电子科技集团公司第三十八研究所 | Automatic spherical near field antenna correction test system and test method thereof |
| CN114966238B (en) * | 2022-07-27 | 2022-12-02 | 陕西拾贝通讯技术有限公司 | Automatic detection and alignment method for antenna phase center |
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| CN109142890A (en) | 2019-01-04 |
| WO2020037838A1 (en) | 2020-02-27 |
| US20210167517A1 (en) | 2021-06-03 |
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