WO2023016571A1 - Radio frequency index measurement method, apparatus and system, electronic device, and storage medium - Google Patents

Radio frequency index measurement method, apparatus and system, electronic device, and storage medium Download PDF

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WO2023016571A1
WO2023016571A1 PCT/CN2022/112527 CN2022112527W WO2023016571A1 WO 2023016571 A1 WO2023016571 A1 WO 2023016571A1 CN 2022112527 W CN2022112527 W CN 2022112527W WO 2023016571 A1 WO2023016571 A1 WO 2023016571A1
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eirp
trp
array antenna
radio frequency
sampling
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PCT/CN2022/112527
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French (fr)
Chinese (zh)
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庄言春
杨华
张飞越
吕婧任
金鹤飞
赵志勇
冯卫东
吴健
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中兴通讯股份有限公司
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Publication of WO2023016571A1 publication Critical patent/WO2023016571A1/en

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    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04BTRANSMISSION
    • H04B17/00Monitoring; Testing
    • H04B17/30Monitoring; Testing of propagation channels
    • H04B17/309Measuring or estimating channel quality parameters
    • H04B17/354Adjacent channel leakage power
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04BTRANSMISSION
    • H04B7/00Radio transmission systems, i.e. using radiation field
    • H04B7/02Diversity systems; Multi-antenna system, i.e. transmission or reception using multiple antennas
    • H04B7/04Diversity systems; Multi-antenna system, i.e. transmission or reception using multiple antennas using two or more spaced independent antennas
    • H04B7/0413MIMO systems
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02DCLIMATE CHANGE MITIGATION TECHNOLOGIES IN INFORMATION AND COMMUNICATION TECHNOLOGIES [ICT], I.E. INFORMATION AND COMMUNICATION TECHNOLOGIES AIMING AT THE REDUCTION OF THEIR OWN ENERGY USE
    • Y02D30/00Reducing energy consumption in communication networks
    • Y02D30/70Reducing energy consumption in communication networks in wireless communication networks

Definitions

  • the embodiments of the present application relate to the technical field of communications, and in particular to a method, device, system, electronic equipment, and storage medium for measuring radio frequency indicators.
  • the large-scale array antenna technology with the oscillator size reaching the millimeter level can be applied to 5G communication products.
  • the design of millimeter-wave circuits and the application of large-scale phased array antennas require the integration of the antenna and the remote radio unit (Radio Remote Unit, RRU) to form an active antenna system (Active Antenna System, AAS).
  • RRU Radio Remote Unit
  • AAS Active Antenna System
  • the 3GPP (3rd Generation Partnership Project) standard stipulates that the AAS base station belongs to 2-O type 5G equipment, and its radio frequency indicators must be measured in a dark room through the air interface (Over the Air, OTA).
  • the sampling step is set to be small, so that the sampling Too many points, resulting in lower efficiency in measuring ACLR and spurs.
  • the main purpose of the embodiment of the present application is to provide a radio frequency index measurement method, device, system, electronic equipment and storage medium, which can improve the efficiency of measuring the ACLR and spurious of the array antenna.
  • the embodiment of the present application provides a radio frequency index measurement method, including: determining the Rayleigh resolution of the target array antenna; The sampling point of the system; measure the EIRP (Equivalent Isotropic Radiated Power, equivalent isotropic radiated power) of the target array antenna at the sampling point; calculate the radio frequency index of the target array antenna according to the EIRP and the normalized wave vector space algorithm.
  • EIRP Equivalent Isotropic Radiated Power, equivalent isotropic radiated power
  • the embodiment of the present application also provides a radio frequency index measurement device, including: a first determination module, used to determine the Rayleigh resolution of the target array antenna; a second determination module, used to determine the Rayleigh resolution according to the Rayleigh resolution and the normalized wave vector space algorithm to determine the sampling point of the target array antenna in the spherical coordinate system; the measurement module is used to measure the EIRP of the target array antenna at the sampling point; the calculation module is used to calculate according to the EIRP and the normalized wave vector space algorithm The radio frequency index of the target array antenna is calculated.
  • the embodiment of the present application also provides a radio frequency index measurement system, including a device under test, a test antenna system, a power detector and a test machine, and the device under test includes an integrated array antenna and a remote radio frequency unit , the testing machine is respectively connected to the device under test, the test antenna system and the power detector, and the power detector is connected to the test antenna system; the test machine is used to determine the Rayleigh resolution of the array antenna; according to the Rayleigh resolution and the normalized wave vector
  • the space algorithm determines the sampling point of the array antenna in the spherical coordinate system; controls the device under test, the test antenna system and the power detector to measure the EIRP of the array antenna at the sampling point; calculates the radio frequency of the array antenna according to the EIRP and the normalized wave vector space algorithm index.
  • an embodiment of the present application further provides an electronic device, including: at least one processor; and a memory connected to the at least one processor in communication; wherein, the memory stores instructions that can be executed by the at least one processor , the instructions are executed by at least one processor, so that the at least one processor can execute the above radio frequency index measurement method.
  • an embodiment of the present application further provides a computer-readable storage medium storing a computer program, and implementing the above radio frequency index measurement method when the computer program is executed by a processor.
  • the radio frequency indicator measurement method proposed in this application by determining the Rayleigh resolution of the target array antenna, according to the Rayleigh resolution and the normalized wave vector space algorithm to determine the sampling point of the target array antenna in the spherical coordinate system, and measure the target array antenna in the
  • the EIRP of the sampling point is calculated according to the EIRP normalized wave vector space algorithm to obtain the radio frequency index of the target array antenna.
  • the sampling points of the array antenna in the spherical coordinate system are determined by the Rayleigh resolution and the normalized wave vector space algorithm, which can effectively reduce the sampling points while ensuring the accuracy of the measurement results, thereby improving the ACLR and spurious of the measurement array antenna s efficiency.
  • Fig. 1 is a schematic flow chart of the radio frequency indicator measurement method provided by the embodiment of the present application.
  • FIG. 2 is a schematic diagram of a spherical coordinate system with the target array antenna as a reference point in the radio frequency index measurement method provided by the embodiment of the present application;
  • Figure 3 is a schematic diagram of sampling at intervals of Rayleigh resolution in angular space
  • Fig. 4 is a schematic diagram of sampling at intervals of Rayleigh resolution in wave vector space
  • Fig. 5 is a schematic diagram of the positions corresponding to the sampling points in the wave vector space in Fig. 4 in the spherical coordinate system;
  • Fig. 6 is the spectrum curve of the spurious signal near the working channel of a 5G base station measured by the radio frequency index measurement method provided by the embodiment of the present application;
  • Fig. 7 is a radio frequency indicator measurement method provided by the embodiment of the present application when measuring a spurious curve of a 5G base station in a frequency band specified by 3GPP;
  • Fig. 8 is a schematic diagram of the module structure of the radio frequency indicator measurement device provided by the embodiment of the present application.
  • FIG. 9 is a schematic structural diagram of a radio frequency index measurement system provided by an embodiment of the present application.
  • FIG. 10 is a schematic structural diagram of an electronic device provided by an embodiment of the present application.
  • it relates to a radio frequency index measurement method, by determining the Rayleigh resolution of the target array antenna, and determining the sampling points of the target array antenna in the spherical coordinate system according to the Rayleigh resolution and the normalized wave vector space algorithm, Measure the EIRP of the target array antenna at the sampling point, and calculate the radio frequency index of the target array antenna according to the EIRP normalized wave vector space algorithm.
  • the sampling points of the array antenna in the spherical coordinate system are determined by the Rayleigh resolution and the normalized wave vector space algorithm, which can effectively reduce the sampling points while ensuring the accuracy of the measurement results, thereby improving the ACLR and spurious of the measurement array antenna s efficiency.
  • the radio frequency index measurement method includes:
  • S101 Determine the Rayleigh resolution of the target array antenna.
  • the specific size of the array antenna of the target array antenna AAS is not specifically limited here.
  • the Rayleigh resolution (u, v) of the wave vector space can be obtained by the following formula (1):
  • u r, min is the minimum Rayleigh resolution corresponding to the y direction of the target array antenna in the wave vector space
  • v r, min is the minimum Rayleigh resolution corresponding to the z direction of the target array antenna in the wave vector space
  • is The signal wavelength
  • D y, max and D z, max are the maximum antenna apertures corresponding to the target array antenna in the y-axis direction and the z-axis direction of the spherical coordinate system, respectively.
  • S102 Determine the sampling points of the target array antenna in the spherical coordinate system according to the Rayleigh resolution and the normalized wave vector space algorithm.
  • FIG. 2 is a schematic diagram of a spherical coordinate system with the target array antenna as a reference point.
  • the x-axis is basically consistent with the normal direction of the antenna array of the target array antenna, and the y-axis and z-axis correspond to the horizontal and vertical directions respectively.
  • Two kinds of space coordinates are used here to describe the direction: one is the angle space, using the spherical coordinate system To express, for example, when the wave vector direction is marked as (90°, 0°), it means pointing to the x-axis direction; the other is the normalized wave vector space, using (u, v) in the Cartesian coordinate system to represent, where u and v represent the size of the normalized wave vector projection on the y-axis and z-axis, respectively. For example, when the wave vector direction is marked as (0, 0), it means pointing to the x-axis direction.
  • angle space There is the following conversion relationship with the normalized wave vector space (u, v):
  • M uniform sampling points can be determined with ( ⁇ u, ⁇ v) as the sampling interval, and the M uniform sampling points in the wave vector space can be converted into spherical coordinate system angles according to the conversion relationship between the normalized wave vector space and the angle space Sampling points in the space, M uniform sampling points (u i , v i ) can be mapped to M non-uniform sampling points in the angular space of the spherical coordinate system through conversion i ⁇ M, M is a positive integer.
  • the test antenna When measuring the EIRP of the target array antenna at the sampling point, the test antenna can be connected to M non-uniform sampling points Coincidence, so as to measure the EIRP of the target array antenna at these sampling points.
  • S104 Calculate and obtain the radio frequency index of the target array antenna according to the EIRP and the normalized wave vector space algorithm.
  • the radio frequency index of the target array antenna may include ACLR and spurs.
  • the specific steps in S103 and S104 for the ACLR and spurious radio frequency indicators will be described respectively below.
  • the power detector connected to the test antenna can be configured so that it can simultaneously obtain EIRP T , EIRP L and EIRP R .
  • EIRP T , EIRP L and EIRP R are respectively integrated and accumulated into TRP T , TRP L and TRP R according to the normalized wave vector space algorithm, including:
  • Vu and Vv are the sampling intervals of the wave vector space
  • EIRP T i is the EIRP T of the i-th sampling point
  • i ⁇ M M is a positive integer
  • EIRP L i is the EIRP L of the i-th sampling point
  • EIRP R i is the EIRP R of the ith sampling point
  • ⁇ i and is the angle value of the i-th sampling point in the spherical coordinate system.
  • S103 can include: determine spectrum test point according to the spectrum bandwidth of the spurious signal to be measured; Measure the EIRP of target array antenna at each sampling point according to each spectrum test point; S104 can include: according to The EIRP of all sampling points and the normalized wave vector sampling algorithm count the spurious TRP of each spectrum test point.
  • the stray TRP of each spectrum test point may also include: drawing the target array according to the stray TRP of each spectrum test point The spurious TRP spectrum curve of the antenna in the spectrum bandwidth.
  • the spurious TRP and the TRP spectrum curve can be obtained by measuring and calculating while reducing the sampling points, so as to improve the efficiency of spurious measurement.
  • measuring the EIRP of the target array antenna at each sampling point according to each spectrum test point includes: when measuring the EIRP of the target array antenna at a sampling point, measuring the EIRP of all spectrum test points at the sampling point After EIRP, go to the next sampling point for measurement until all the sampling points are measured.
  • a serial measurement method is usually used, that is, first measure the EIRP of a frequency point at each sampling point, and then measure the EIRP of the next frequency point at each sampling point after measuring a frequency point . Since there are usually hundreds or even thousands of frequency points to be measured, if one frequency point is measured in one round, the conventional measurement method needs to go through hundreds or thousands of rounds to complete.
  • the serial measurement method will reduce the overall consumption. Very long.
  • the radio frequency index measurement method when measuring the EIRP of the target array antenna at a sampling point, after measuring the EIRP of all spectrum test points at the sampling point, turn to the next sampling point for measurement.
  • the method called parallel measurement can measure the EIRP corresponding to hundreds or thousands of spectrum test points in one round of measurement, which greatly improves the efficiency of spurious measurement.
  • the TRP of each spectrum test point is counted according to the EIRP of all the sampling points and the normalized wave vector sampling algorithm, including:
  • TRP j is the TRP of the j-th spectrum test point
  • Vu and Vv are the sampling intervals of the wave vector space
  • i represents the i-th sampling point
  • i ⁇ M M is a positive integer
  • ⁇ i and is the angle value of the i-th sampling point in the spherical coordinate system.
  • the EIRP of all spectrum test points at each sampling point has been measured, it can be passed Simultaneous calculation (parallel calculation) of TRP for each spectral test point.
  • the TRP can be calculated through parallel computing, thereby improving the measurement efficiency of spurious indicators.
  • determining the spectrum test point according to the spectrum bandwidth of the spurious signal to be tested includes:
  • B spurious is the spectrum bandwidth of the spurious signal to be tested
  • RBW spurious is the measurement resolution bandwidth specified by 3GPP
  • FIG. 3 is a schematic diagram of sampling at intervals of Rayleigh resolution in angular space.
  • the background image is the radiation pattern of the 16 ⁇ 8 (y ⁇ z) array antenna with a half-wavelength period in the angular space, the sign "+" indicates the sampling point, and the Rayleigh resolution of the angular space It can be determined according to the following formula:
  • D y and D z refer to the maximum size of the target array antenna in the y direction and the z direction.
  • the Rayleigh resolution can also be determined by the First Null Beamwidth (FNBW) of the pattern, namely:
  • Figure 4 is a schematic diagram of sampling at intervals of Rayleigh resolution in the wave vector space.
  • the antenna corresponding to the sampling point in the figure is also a 16 ⁇ 8 (y ⁇ z) array antenna with a half-wavelength period, marked with “+ ”Indicates the sampling points, and the sampling points are evenly distributed in this space.
  • the sampling point must be guaranteed to be within a circle with a radius of 1 (that is, the normalized wave vector space), because the field that can be measured in the far field is the radiation component, and the field outside the circle evanescent The wave components are truncated in the far field due to their exponential decay with distance.
  • FIG. 5 is a schematic diagram of the corresponding positions of the sampling points in the wave vector space in FIG. 4 in the spherical coordinate system, where the sign "+" indicates the sampling points.
  • the sampling points are non-uniformly distributed in the spherical coordinate system, and compared with the sampling points in Figure 3, the number of points has been significantly reduced (about 1/3 of that in Figure 3).
  • Figure 4 and Figure 5 correspond to the same antenna array as Figure 3, and the results of Figure 4 and Figure 5 have fewer sampling points in the wave vector space and higher efficiency.
  • sampling in the wave vector space is the method with the least number of points, which can also be called the optimal sampling scheme.
  • FIG. 6 shows the spectrum curve of the spurious signal near the working channel of a 5G base station measured by the radio frequency index measurement method provided by the embodiment of the present application.
  • the spurious frequency band bandwidth B spurious is 800MHz
  • the resolution bandwidth RBW spurious of the power detector is set to 1MHz.
  • the EIRP curve of the sampling point directly in front of the antenna array is superimposed in the figure.
  • FIG. 7 shows the radio frequency index measurement method provided by the embodiment of the present application when measuring the spurious curve of a 5G base station in a frequency band specified by 3GPP.
  • the spurious frequency band bandwidth B spurious is 6.25GHz (18000-24250MHz)
  • the resolution bandwidth RBW spurious of the power detector is set to 10MHz.
  • the EIRP curve of the sampling point directly in front of the antenna array is superimposed in the figure.
  • Spurious measurement has always been a difficult problem in the radio frequency index test of AAS base station equipment. If the traditional accurate measurement method given by 3GPP TR37.843 is used, it takes 68 days to complete a complete frequency band spurious measurement. In 3GPP TS38.141-2 (Chapter I.13), a scheme to improve the efficiency of spurious measurement by pre-scanning (Pre-scan) is given, but in this scheme, pre-scanning cannot accurately give each target frequency point In actual operation, it is easy to cause misjudgment and missed measurement, which will affect the credibility of the measurement results.
  • Pre-scan pre-scanning
  • the industry has also proposed a spurious measurement method based on a reverberation chamber: the stirring blade is used to uniformly reflect the directional beam energy in the closed space, and the transmitted signal is collected at a specific position in the closed space. After calibration, the measured The TRP of the device, and then sweep the frequency in the frequency band to be tested to obtain the spurious spectrum.
  • the reverberation chamber method relies too much on system calibration, and recalibration is required for different devices under test (DUT) or different installation locations of the devices under test, which affects test efficiency.
  • DUT devices under test
  • the measurement of broadband signals in the reverberation room is prone to spectrum fluctuations, which will affect the accuracy of spurious measurement results.
  • the embodiment of the present application determines the sampling points in the spherical angle coordinate system based on the Rayleigh resolution and the normalized wave vector space algorithm;
  • the spurious TRP spectrum is derived for the entire measured frequency band.
  • the measurement time for the broadband spuriousness of the 128-element antenna array device is about 10 minutes.
  • the radio frequency index measurement method provided by the embodiment of the application can improve the measurement efficiency of the spur by more than 3 orders of magnitude; compared with the conventional serial measurement calculation method, in the case of using wave vector sampling, the application
  • the parallel measurement and calculation method adopted in the embodiment can significantly improve the measurement efficiency of multi-frequency radio frequency indicators (such as spurious indicators) (Table 1 below):
  • the measurement efficiency of the radio frequency index measurement method provided in the embodiment of the present application is similar to the former two, but the radio frequency index measurement method provided in the embodiment of the present application uses a non-destructive sampling algorithm, so its The reliability and accuracy of the measurement results are much higher than the former two.
  • the radio frequency index measurement method provided by the embodiment of this application, by determining the Rayleigh resolution of the target array antenna, according to the Rayleigh resolution and the normalized wave vector space algorithm to determine the sampling point of the target array antenna in the spherical coordinate system, and measure the target array
  • the EIRP of the antenna at the sampling point is calculated according to the EIRP normalized wave vector space algorithm to obtain the radio frequency index of the target array antenna.
  • the sampling points of the array antenna in the spherical coordinate system are determined by the Rayleigh resolution and the normalized wave vector space algorithm, which can effectively reduce the sampling points while ensuring the accuracy of the measurement results, thereby improving the ACLR and spurious of the measurement array antenna s efficiency.
  • each module relates to a radio frequency index measuring device 200, as shown in FIG.
  • the detailed function of each module is as follows:
  • the first determination module 201 is configured to determine the Rayleigh resolution of the target array antenna
  • the second determination module 202 is used to determine the sampling point of the target array antenna in the spherical coordinate system according to the Rayleigh resolution and the normalized wave vector space algorithm;
  • Measurement module 203 for measuring the EIRP of the target array antenna at the sampling point
  • the calculation module 204 is configured to calculate the radio frequency index of the target array antenna according to the EIRP and the normalized wave vector space algorithm.
  • the measurement module 203 is also used to: measure the EIRP T , EIRP L and EIRP R of the target array antenna at each sampling point, where EIRP T is the EIRP output within the bandwidth, and EIRP L is the left neighbor channel leakage EIRP, EIRP R is the right adjacent channel leakage EIRP;
  • calculation module 204 is also used for:
  • Vu and Vv are the sampling intervals of the wave vector space
  • EIRP T i is the EIRP T of the i-th sampling point
  • i ⁇ M M is a positive integer
  • EIRP L i is the EIRP L of the i-th sampling point
  • EIRP R i is the EIRP R of the ith sampling point
  • ⁇ i and is the angle value of the i-th sampling point in the spherical coordinate system.
  • the measurement module 203 is also used to: determine the spectrum test point according to the spectrum bandwidth of the spurious signal to be measured; measure the EIRP of the target array antenna at each sampling point according to each spectrum test point;
  • the calculation module 204 is further configured to: calculate the spurious TRP of each spectrum test point according to the EIRP of all sampling points and the normalized wave vector sampling algorithm.
  • the calculation module 204 is further configured to: plot a spurious TRP spectrum curve of the target array antenna in the spectrum bandwidth according to the spurious TRP of each spectrum test point.
  • the measurement module 203 is further configured to measure the EIRP of all spectrum test points at the sampling point when measuring the EIRP of the target array antenna at the sampling point, and then go to the next sampling point for measurement.
  • the calculating module 204 is also used for: according to Calculate the TRP of each spectrum test point in parallel, where TRP j is the TRP of the jth spectrum test point, Vu and Vv are the sampling intervals of the wave vector space, i represents the i-th sampling point, i ⁇ M, and M is a positive integers, ⁇ i and is the angle value of the i-th sampling point in the spherical coordinate system.
  • the measuring module 203 is also used for: according to Determine the number of spectrum test points, where B spurious is the spectrum bandwidth of the spurious signal to be tested, and RBW spurious is the measurement resolution bandwidth specified by 3GPP; determine the spectrum test points according to the number of spectrum test points and the spectrum bandwidth.
  • this embodiment is an apparatus embodiment corresponding to the foregoing method embodiments, and this embodiment can be implemented in cooperation with the foregoing method embodiments.
  • the relevant technical details mentioned in the foregoing method embodiments are still valid in this embodiment, and are not repeated here to reduce repetition.
  • the relevant technical details mentioned in this embodiment may also be applied to the foregoing method embodiments.
  • modules involved in this embodiment are logical modules.
  • a logical unit can be a physical unit, or a part of a physical unit, or multiple physical units. Combination of units.
  • units that are not closely related to solving the technical problem proposed in the present application are not introduced in this embodiment, but this does not mean that there are no other units in this embodiment.
  • the device under test 310 includes an integrated array antenna 312 and a remote radio unit (RRU) 311, and the testing machine 330 is respectively connected to the device under test 310, the test antenna system 320 and the power detector 340, and the power detector 340 and the test antenna system 320 connections.
  • RRU remote radio unit
  • the testing machine 330 is used to determine the Rayleigh resolution of the array antenna 312; determine the sampling points of the array antenna 312 in the spherical coordinate system according to the Rayleigh resolution and the normalized wave vector space algorithm; control the device under test 310, test the antenna system 320
  • the power detector 340 measures the EIRP of the array antenna 312 at the sampling point; calculates the radio frequency index of the array antenna 312 according to the EIRP and the normalized wave vector space algorithm.
  • the array antenna 312 is closely integrated with the remote radio frequency unit 311 to form an integrated device, as shown by the dotted line.
  • the transmit and receive channels of the device under test 310 are directly connected to the array antenna 312 as opposed to the RRU and antenna system being individually and independently testable.
  • the array antenna 312 may be an antenna arranged in a matrix, or other irregularly arranged antennas, and the radiated electromagnetic wave energy may be in the millimeter wave band.
  • the array antenna 312 Since the array antenna 312 is integrated with the remote radio frequency unit 311 and has no radio frequency connection, the array antenna cannot be tested in isolation. That is to say, the radiation performance of the array antenna 312 and the transmission and reception link performance of the remote radio unit 311 cannot be simply tested to calculate the radio frequency index (including EIRP, TRP, equivalent isotropic sensitivity (Equivalent Isotropic Sensitivity, EIS) and Total Isotropic Sensitivity (Total Isotropic Sensitivity, TIS) and other radio frequency machine indicators), the measurement of the device under test 310 needs to be performed simultaneously.
  • EIRP Equivalent Isotropic Sensitivity
  • TIS Total Isotropic Sensitivity
  • the device under test 310 is placed and fixed on the turntable 313, and the turntable 313 can rotate on the horizontal plane and the pitch plane.
  • the test antenna system 320 includes a test antenna 321 , an antenna fixing bracket 323 and a test cable 322 .
  • the test antenna 321 can be a single antenna, or multiple antennas.
  • the antenna fixing bracket 323 is used to fix the test antenna 321 and can move in three-dimensional space.
  • the test antenna 321 is connected to a power detector 340 through a test cable 322, and the power detector 340 may be a vector network analyzer, a spectrum analyzer or a power meter, etc.
  • the device under test 310, the turntable 313, the antenna fixing bracket 323 and the power detector 340 are connected to the testing machine 330, and the testing machine 330 can be set to control the sending and receiving of the device under test 310, the rotation of the turntable 313, and the rotation of the antenna fixing bracket 323.
  • the mobile and power detector 340 sends and receives, records and processes relevant test data including the EIRP value, and records a log.
  • the environment of the fully anechoic chamber is isolated from the external environment by the absorbing material 350 and the outer wall of the anechoic chamber 360 to simulate the situation of an infinite space.
  • testing machine 330 is also used for:
  • Vu and Vv are the sampling intervals of the wave vector space
  • EIRP T i is the EIRP T of the i-th sampling point
  • i ⁇ M M is a positive integer
  • EIRP L i is the EIRP L of the i-th sampling point
  • EIRP R i is the EIRP R of the ith sampling point
  • ⁇ i and is the angle value of the i-th sampling point in the spherical coordinate system.
  • the testing machine 330 is also used to: determine the spectrum test point according to the spectrum bandwidth of the spurious signal to be tested; measure the EIRP of the array antenna 312 at each sampling point according to each spectrum test point; EIRP and normalized wave vector sampling algorithm count the spurious TRP of each spectrum test point.
  • the testing machine 330 is further configured to draw a spurious TRP spectrum curve of the array antenna 312 in the spectrum bandwidth according to the spurious TRP of each spectrum test point.
  • the testing machine 330 is also used to measure the EIRP of all spectrum test points at the sampling point when measuring the EIRP of the target array antenna at the sampling point, and then go to the next sampling point for measurement.
  • the testing machine 330 is also used for: according to Calculate the TRP of each spectrum test point in parallel, where TRP j is the TRP of the jth spectrum test point, Vu and Vv are the sampling intervals of the wave vector space, i represents the i-th sampling point, i ⁇ M, and M is a positive integers, ⁇ i and is the angle value of the i-th sampling point in the spherical coordinate system.
  • the testing machine 330 is also used for: according to Determine the number of spectrum test points, where B spurious is the spectrum bandwidth of the spurious signal to be tested, and RBW spurious is the measurement resolution bandwidth specified by 3GPP; determine the spectrum test points according to the number of spectrum test points and the spectrum bandwidth.
  • this embodiment is a system embodiment corresponding to the foregoing method embodiments, and this embodiment can be implemented in cooperation with the foregoing method embodiments.
  • the relevant technical details mentioned in the foregoing method embodiments are still valid in this embodiment, and will not be repeated here in order to reduce repetition.
  • the relevant technical details mentioned in this embodiment may also be applied to the foregoing method embodiments.
  • FIG. 10 it relates to an electronic device, as shown in FIG. 10 , including: at least one processor 401; and a memory 402 communicatively connected to at least one processor 401; Instructions executed by the processor 401, the instructions are executed by at least one processor 401, so that the at least one processor 401 can execute the above radio frequency index measurement method.
  • the memory and the processor are connected by a bus
  • the bus may include any number of interconnected buses and bridges, and the bus connects one or more processors and various circuits of the memory together.
  • the bus may also connect together various other circuits such as peripherals, voltage regulators, and power management circuits, all of which are well known in the art and therefore will not be further described herein.
  • the bus interface provides an interface between the bus and the transceivers.
  • a transceiver may be a single element or multiple elements, such as multiple receivers and transmitters, providing a means for communicating with various other devices over a transmission medium.
  • the data processed by the processor is transmitted on the wireless medium through the antenna, further, the antenna also receives the data and transmits the data to the processor.
  • the processor is responsible for managing the bus and general processing, and can also provide various functions, including timing, peripheral interface, voltage regulation, power management, and other control functions. Instead, memory can be used to store data that the processor uses when performing operations.
  • it relates to a computer readable storage medium storing a computer program.
  • the above method embodiments are implemented when the computer program is executed by the processor.
  • a storage medium includes several instructions to make a device ( It may be a single-chip microcomputer, a chip, etc.) or a processor (processor) to execute all or part of the steps of the methods described in the various embodiments of the present application.
  • the aforementioned storage media include: U disk, mobile hard disk, read-only memory (ROM, Read-Only Memory), random access memory (RAM, Random Access Memory), magnetic disk or optical disc, etc., which can store program codes. .

Abstract

The present application discloses a radio frequency index measurement method, comprising: determining a Rayleigh resolution of a target array antenna; determining a sampling point of the target array antenna in a spherical coordinate system according to the Rayleigh resolution and a normalized wave vector space algorithm; measuring an EIRP of the target array antenna at the sampling point; and calculating a radio frequency index of the target array antenna according to the EIRP and the normalized wave vector space algorithm. Also disclosed in embodiments of the present application are a radio frequency index measurement apparatus and system, an electronic device, and a storage medium.

Description

射频指标测量方法、装置、系统、电子设备及存储介质Radio frequency index measurement method, device, system, electronic equipment and storage medium
本申请要求于2021年8月13日申请的、申请号为202110932798.3的中国专利申请的优先权,其全部内容通过引用结合在本申请中。This application claims priority to a Chinese patent application with application number 202110932798.3 filed on August 13, 2021, the entire contents of which are incorporated herein by reference.
技术领域technical field
本申请实施例涉及通信技术领域,特别涉及一种射频指标测量方法、装置、系统、电子设备及存储介质。The embodiments of the present application relate to the technical field of communications, and in particular to a method, device, system, electronic equipment, and storage medium for measuring radio frequency indicators.
背景技术Background technique
随着5G通信技术的发展,振子尺寸达到毫米级的大规模阵列天线技术得以应用于5G通信产品中。毫米波电路设计及大规模相控阵列天线的应用,要求天线与远端射频单元(Radio Remote Unit,RRU)实现一体化,从而形成有源天线系统(Active Antenna System,AAS)。3GPP(3rd Generation Partnership Project)标准规定,AAS基站属于2-O类型5G设备,其射频指标必须在暗室中通过空口(Over the Air,OTA)方式测量。With the development of 5G communication technology, the large-scale array antenna technology with the oscillator size reaching the millimeter level can be applied to 5G communication products. The design of millimeter-wave circuits and the application of large-scale phased array antennas require the integration of the antenna and the remote radio unit (Radio Remote Unit, RRU) to form an active antenna system (Active Antenna System, AAS). The 3GPP (3rd Generation Partnership Project) standard stipulates that the AAS base station belongs to 2-O type 5G equipment, and its radio frequency indicators must be measured in a dark room through the air interface (Over the Air, OTA).
然而,目前在测量阵列天线的ACLR(Adjacent Channel Leakage Ratio,邻信道泄漏功率比)和杂散这两个射频指标时,为了获取较为准确的测量结果,采样时设置的步进较小,使得采样点过多,导致在测量ACLR和杂散的效率较低。However, when measuring the ACLR (Adjacent Channel Leakage Ratio, adjacent channel leakage power ratio) and spurious two radio frequency indicators of the array antenna, in order to obtain more accurate measurement results, the sampling step is set to be small, so that the sampling Too many points, resulting in lower efficiency in measuring ACLR and spurs.
发明内容Contents of the invention
本申请实施例的主要目的在于提出一种射频指标测量方法、装置、系统、电子设备及存储介质,可以提高测量阵列天线的ACLR和杂散的效率。The main purpose of the embodiment of the present application is to provide a radio frequency index measurement method, device, system, electronic equipment and storage medium, which can improve the efficiency of measuring the ACLR and spurious of the array antenna.
为实现上述目的,本申请实施例提供了一种射频指标测量方法,包括:确定目标阵列天线的瑞利分辨率;根据瑞利分辨率和归一化波矢空间算法确定目标阵列天线在球坐标系的采样点;测量目标阵列天线在采样点的EIRP(Equivalent Isotropic Radiated Power,等效全向辐射功率);根据EIRP和归一化波矢空间算法计算得到目标阵列天线的射频指标。In order to achieve the above purpose, the embodiment of the present application provides a radio frequency index measurement method, including: determining the Rayleigh resolution of the target array antenna; The sampling point of the system; measure the EIRP (Equivalent Isotropic Radiated Power, equivalent isotropic radiated power) of the target array antenna at the sampling point; calculate the radio frequency index of the target array antenna according to the EIRP and the normalized wave vector space algorithm.
为实现上述目的,本申请实施例还提供了一种射频指标测量装置,包括:第一确定模块,用于确定目标阵列天线的瑞利分辨率;第二确定模块,用于根据瑞利分辨率和归一化波矢空间算法确定目标阵列天线在球坐标系的采样点;测量模块,用于测量目标阵列天线在采样点的EIRP;计算模块,用于根据EIRP和归一化波矢空间算法计算得到目标阵列天线的射频指标。In order to achieve the above purpose, the embodiment of the present application also provides a radio frequency index measurement device, including: a first determination module, used to determine the Rayleigh resolution of the target array antenna; a second determination module, used to determine the Rayleigh resolution according to the Rayleigh resolution and the normalized wave vector space algorithm to determine the sampling point of the target array antenna in the spherical coordinate system; the measurement module is used to measure the EIRP of the target array antenna at the sampling point; the calculation module is used to calculate according to the EIRP and the normalized wave vector space algorithm The radio frequency index of the target array antenna is calculated.
为实现上述目的,本申请实施例还提供了一种射频指标测量系统,包括被测设备、测试天线系统、功率检测仪和测试机,被测设备包括集成在一起的阵列天线和远端射频单元,测试机分别连接被测设备、测试天线系统和功率检测仪,功率检测仪与测试天线系统连接;测试机用于确定阵列天线的瑞利分辨率;根据瑞利分辨率和归一化波矢空间算法确定阵列天线在球坐标系的采样点;控制被测设备、测试天线系统和功率检测仪测量阵列天线在采样点的EIRP;根据EIRP和归一化波矢空间算法计算得到阵列天线的射频指标。In order to achieve the above purpose, the embodiment of the present application also provides a radio frequency index measurement system, including a device under test, a test antenna system, a power detector and a test machine, and the device under test includes an integrated array antenna and a remote radio frequency unit , the testing machine is respectively connected to the device under test, the test antenna system and the power detector, and the power detector is connected to the test antenna system; the test machine is used to determine the Rayleigh resolution of the array antenna; according to the Rayleigh resolution and the normalized wave vector The space algorithm determines the sampling point of the array antenna in the spherical coordinate system; controls the device under test, the test antenna system and the power detector to measure the EIRP of the array antenna at the sampling point; calculates the radio frequency of the array antenna according to the EIRP and the normalized wave vector space algorithm index.
为实现上述目的,本申请实施例还提供了一种电子设备,包括:至少一个处理器;以及, 与至少一个处理器通信连接的存储器;其中,存储器存储有可被至少一个处理器执行的指令,指令被至少一个处理器执行,以使至少一个处理器能够执行上述的射频指标测量方法。To achieve the above purpose, an embodiment of the present application further provides an electronic device, including: at least one processor; and a memory connected to the at least one processor in communication; wherein, the memory stores instructions that can be executed by the at least one processor , the instructions are executed by at least one processor, so that the at least one processor can execute the above radio frequency index measurement method.
为实现上述目的,本申请实施例还提供了一种计算机可读存储介质,存储有计算机程序,计算机程序被处理器执行时实现上述的射频指标测量方法。To achieve the above object, an embodiment of the present application further provides a computer-readable storage medium storing a computer program, and implementing the above radio frequency index measurement method when the computer program is executed by a processor.
本申请提出的射频指标测量方法,通过确定目标阵列天线的瑞利分辨率,根据瑞利分辨率和归一化波矢空间算法确定目标阵列天线在球坐标系的采样点,测量目标阵列天线在采样点的EIRP,根据EIRP归一化波矢空间算法计算得到目标阵列天线的射频指标。通过瑞利分辨率和归一化波矢空间算法确定阵列天线在球坐标系的采样点,可以在保证测量结果的准确性的同时有效地减少采样点,从而提高测量阵列天线的ACLR和杂散的效率。The radio frequency indicator measurement method proposed in this application, by determining the Rayleigh resolution of the target array antenna, according to the Rayleigh resolution and the normalized wave vector space algorithm to determine the sampling point of the target array antenna in the spherical coordinate system, and measure the target array antenna in the The EIRP of the sampling point is calculated according to the EIRP normalized wave vector space algorithm to obtain the radio frequency index of the target array antenna. The sampling points of the array antenna in the spherical coordinate system are determined by the Rayleigh resolution and the normalized wave vector space algorithm, which can effectively reduce the sampling points while ensuring the accuracy of the measurement results, thereby improving the ACLR and spurious of the measurement array antenna s efficiency.
附图说明Description of drawings
一个或多个实施例通过与之对应的附图中的图片进行示例性说明,这些示例性说明并不构成对实施例的限定。One or more embodiments are exemplified by pictures in the accompanying drawings, and these exemplifications are not intended to limit the embodiments.
图1是本申请实施例提供的射频指标测量方法的流程示意图;Fig. 1 is a schematic flow chart of the radio frequency indicator measurement method provided by the embodiment of the present application;
图2是本申请实施例提供的射频指标测量方法中以目标阵列天线为参考点的球坐标系的示意图;2 is a schematic diagram of a spherical coordinate system with the target array antenna as a reference point in the radio frequency index measurement method provided by the embodiment of the present application;
图3是在角度空间以瑞利分辨率为间隔的采样示意图;Figure 3 is a schematic diagram of sampling at intervals of Rayleigh resolution in angular space;
图4是在波矢空间以瑞利分辨率为间隔的采样示意图;Fig. 4 is a schematic diagram of sampling at intervals of Rayleigh resolution in wave vector space;
图5是图4中在波矢空间的采样点对应在球坐标系下的位置示意图;Fig. 5 is a schematic diagram of the positions corresponding to the sampling points in the wave vector space in Fig. 4 in the spherical coordinate system;
图6是本申请实施例提供的射频指标测量方法在测量某5G基站工作信道附近杂散信号的频谱曲线;Fig. 6 is the spectrum curve of the spurious signal near the working channel of a 5G base station measured by the radio frequency index measurement method provided by the embodiment of the present application;
图7是本申请实施例提供的射频指标测量方法在测量某5G基站在3GPP规定的一段频段内的杂散曲线;Fig. 7 is a radio frequency indicator measurement method provided by the embodiment of the present application when measuring a spurious curve of a 5G base station in a frequency band specified by 3GPP;
图8是本申请实施例提供的射频指标测量装置的模块结构示意图;Fig. 8 is a schematic diagram of the module structure of the radio frequency indicator measurement device provided by the embodiment of the present application;
图9是本申请实施例提供的射频指标测量系统的结构示意图;FIG. 9 is a schematic structural diagram of a radio frequency index measurement system provided by an embodiment of the present application;
图10是本申请实施例提供的电子设备的结构示意图。FIG. 10 is a schematic structural diagram of an electronic device provided by an embodiment of the present application.
具体实施方式Detailed ways
为使本申请实施例的目的、技术方案和优点更加清楚,下面将结合附图对本申请的各实施例进行详细的阐述。然而,本领域的普通技术人员可以理解,在本申请各实施例中,为了使读者更好地理解本申请而提出了许多技术细节。但是,即使没有这些技术细节和基于以下各实施例的种种变化和修改,也可以实现本申请所要求保护的技术方案。以下各个实施例的划分是为了描述方便,不应对本申请的具体实现方式构成任何限定,各个实施例在不矛盾的前提下可以相互结合相互引用。In order to make the purpose, technical solutions and advantages of the embodiments of the present application clearer, the embodiments of the present application will be described in detail below with reference to the accompanying drawings. However, those of ordinary skill in the art can understand that in each embodiment of the application, many technical details are provided for readers to better understand the application. However, even without these technical details and various changes and modifications based on the following embodiments, the technical solutions claimed in this application can also be realized. The division of the following embodiments is for the convenience of description, and should not constitute any limitation to the specific implementation of the present application, and the embodiments can be combined and referred to each other on the premise of no contradiction.
在一个实施例中,涉及一种射频指标测量方法,通过确定目标阵列天线的瑞利分辨率,根据瑞利分辨率和归一化波矢空间算法确定目标阵列天线在球坐标系的采样点,测量目标阵列天线在采样点的EIRP,根据EIRP归一化波矢空间算法计算得到目标阵列天线的射频指标。通过瑞利分辨率和归一化波矢空间算法确定阵列天线在球坐标系的采样点,可以在保证测量结果的准确性的同时有效地减少采样点,从而提高测量阵列天线的ACLR和杂散的效率。In one embodiment, it relates to a radio frequency index measurement method, by determining the Rayleigh resolution of the target array antenna, and determining the sampling points of the target array antenna in the spherical coordinate system according to the Rayleigh resolution and the normalized wave vector space algorithm, Measure the EIRP of the target array antenna at the sampling point, and calculate the radio frequency index of the target array antenna according to the EIRP normalized wave vector space algorithm. The sampling points of the array antenna in the spherical coordinate system are determined by the Rayleigh resolution and the normalized wave vector space algorithm, which can effectively reduce the sampling points while ensuring the accuracy of the measurement results, thereby improving the ACLR and spurious of the measurement array antenna s efficiency.
本申请实施例提供的射频指标测量方法的具体流程如图1所示,射频指标测量方法包括:The specific flow of the radio frequency index measurement method provided in the embodiment of the present application is shown in Figure 1. The radio frequency index measurement method includes:
S101:确定目标阵列天线的瑞利分辨率。S101: Determine the Rayleigh resolution of the target array antenna.
目标阵列天线AAS的阵列天线,具体的尺寸此处不做具体限制。The specific size of the array antenna of the target array antenna AAS is not specifically limited here.
在确定目标阵列天线的瑞利分辨率时,可以是确定目标阵列天线在波矢空间的瑞利分辨率。波矢空间的瑞利分辨率(u,v)可通过以下公式(1)得到:When determining the Rayleigh resolution of the target array antenna, it may be to determine the Rayleigh resolution of the target array antenna in wave vector space. The Rayleigh resolution (u, v) of the wave vector space can be obtained by the following formula (1):
Figure PCTCN2022112527-appb-000001
Figure PCTCN2022112527-appb-000001
其中,u r,min为目标阵列天线在波矢空间中y方向对应的最小瑞利分辨率,v r,min为目标阵列天线在波矢空间中z方向对应的最小瑞利分辨率,λ为信号波长,D y,max和D z,max分别为目标阵列天线在球坐标系y轴方向和z轴方向对应的最大天线口径。 Among them, u r, min is the minimum Rayleigh resolution corresponding to the y direction of the target array antenna in the wave vector space, v r, min is the minimum Rayleigh resolution corresponding to the z direction of the target array antenna in the wave vector space, λ is The signal wavelength, D y, max and D z, max are the maximum antenna apertures corresponding to the target array antenna in the y-axis direction and the z-axis direction of the spherical coordinate system, respectively.
S102:根据瑞利分辨率和归一化波矢空间算法确定目标阵列天线在球坐标系的采样点。S102: Determine the sampling points of the target array antenna in the spherical coordinate system according to the Rayleigh resolution and the normalized wave vector space algorithm.
请参考图2,其为以目标阵列天线为参考点的球坐标系的示意图。其中x轴与目标阵列天线的天线阵面法线方向基本相一致,y轴和z轴分别对应水平和垂直方向。这里采用了两种空间坐标来描述方向:一种是角度空间,利用球坐标系中的
Figure PCTCN2022112527-appb-000002
来表示,例如,当波矢方向标定为(90°,0°)时,意味着指向x轴方向;另一种是归一化波矢空间,用笛卡尔坐标系中的(u,v)来表示,其中u和v分别表示归一化波矢投影在y轴和z轴上的大小。例如,当波矢方向标定为(0,0)时,意味着指向x轴方向。角度空间
Figure PCTCN2022112527-appb-000003
和归一化波矢空间(u,v)存在以下转换关系:
Please refer to FIG. 2 , which is a schematic diagram of a spherical coordinate system with the target array antenna as a reference point. The x-axis is basically consistent with the normal direction of the antenna array of the target array antenna, and the y-axis and z-axis correspond to the horizontal and vertical directions respectively. Two kinds of space coordinates are used here to describe the direction: one is the angle space, using the spherical coordinate system
Figure PCTCN2022112527-appb-000002
To express, for example, when the wave vector direction is marked as (90°, 0°), it means pointing to the x-axis direction; the other is the normalized wave vector space, using (u, v) in the Cartesian coordinate system to represent, where u and v represent the size of the normalized wave vector projection on the y-axis and z-axis, respectively. For example, when the wave vector direction is marked as (0, 0), it means pointing to the x-axis direction. angle space
Figure PCTCN2022112527-appb-000003
There is the following conversion relationship with the normalized wave vector space (u, v):
Figure PCTCN2022112527-appb-000004
v=cosθ。
Figure PCTCN2022112527-appb-000004
v = cos θ.
根据波矢空间的瑞利分辨率确定波矢空间的采样间隔(Δu,Δv),使采样间隔(Δu,Δv)小于或等于最小瑞利分辨率,即:Δu≤u r,min,Δv≤v r,minDetermine the sampling interval (Δu, Δv) of the wave vector space according to the Rayleigh resolution of the wave vector space, so that the sampling interval (Δu, Δv) is less than or equal to the minimum Rayleigh resolution, that is: Δu≤ur , min , Δv≤ v r, min .
在波矢空间以(Δu,Δv)为采样间隔可以确定M个均匀采样点,根据归一化波矢空间与角度空间的转换关系将波矢空间的M个均匀采样点转换为球坐标系角度空间的采样点,通过转换可以将M个均匀采样点(u i,v i)映射为球坐标系角度空间的M个非均匀采样点
Figure PCTCN2022112527-appb-000005
i∈M,M为正整数。
In the wave vector space, M uniform sampling points can be determined with (Δu, Δv) as the sampling interval, and the M uniform sampling points in the wave vector space can be converted into spherical coordinate system angles according to the conversion relationship between the normalized wave vector space and the angle space Sampling points in the space, M uniform sampling points (u i , v i ) can be mapped to M non-uniform sampling points in the angular space of the spherical coordinate system through conversion
Figure PCTCN2022112527-appb-000005
i∈M, M is a positive integer.
S103:测量目标阵列天线在采样点的EIRP。S103: Measure the EIRP of the target array antenna at the sampling point.
在测量目标阵列天线在采样点的EIRP时,可以使测试天线与M个非均匀采样点
Figure PCTCN2022112527-appb-000006
重合,从而测量得到目标阵列天线在这些采样点的EIRP。
When measuring the EIRP of the target array antenna at the sampling point, the test antenna can be connected to M non-uniform sampling points
Figure PCTCN2022112527-appb-000006
Coincidence, so as to measure the EIRP of the target array antenna at these sampling points.
S104:根据EIRP和归一化波矢空间算法计算得到目标阵列天线的射频指标。S104: Calculate and obtain the radio frequency index of the target array antenna according to the EIRP and the normalized wave vector space algorithm.
在本申请实施例中,目标阵列天线的射频指标可以包括ACLR和杂散。下面分别对ACLR和杂散两种射频指标在S103及S104的具体步骤进行说明。In this embodiment of the present application, the radio frequency index of the target array antenna may include ACLR and spurs. The specific steps in S103 and S104 for the ACLR and spurious radio frequency indicators will be described respectively below.
当射频指标为ACLR时,S103可以包括:测量目标阵列天线在每一采样点上的EIRP T、EIRP L和EIRP R,其中,EIRP T为带宽内输出的EIRP,EIRP L为左侧邻道泄漏EIRP,EIRP R为右侧邻道泄漏EIRP;而S104则包括:根据归一化波矢空间算法将EIRP T、EIRP L和EIRP R分别积分累计为TRP T、TRP L和TRP R;根据ACLR L=TRP L-TRP T计算得到目标阵列天线的左侧ACLR,根据ACLR R=TRP R-TRP T计算得到目标阵列天线的右侧ACLR,从而在减少采样点的情况下通过测量计算得到ACLR,提高ACLR的测量效率,其中,TRP T为带宽内输出的TRP(Total Radiated Power,总辐射功率),TRP L为左侧邻道泄漏TRP,TRP R为右侧邻道泄漏TRP。 When the radio frequency index is ACLR, S103 may include: measuring the EIRP T , EIRP L and EIRP R of the target array antenna at each sampling point, where EIRP T is the output EIRP within the bandwidth, and EIRP L is the left adjacent channel leakage EIRP, EIRP R is the leakage EIRP of the right adjacent channel; and S104 includes: according to the normalized wave vector space algorithm, EIRP T , EIRP L and EIRP R are respectively integrated and accumulated into TRP T , TRP L and TRP R ; according to ACLR L =TRP L -TRP T calculates the left side ACLR of the target array antenna, calculates and obtains the right side ACLR of the target array antenna according to ACLR R =TRP R -TRP T , thus obtains ACLR by measurement and calculation under the situation of reducing sampling points, improves The measurement efficiency of ACLR, where TRP T is the TRP (Total Radiated Power) output within the bandwidth, TRP L is the leakage TRP of the left adjacent channel, and TRP R is the leakage TRP of the right adjacent channel.
在测量每一采样点的EIRP T、EIRP L和EIRP R时,可以将与测试天线相连的功率检测仪进行配置,使其可以同时获取到EIRP T、EIRP L和EIRP RWhen measuring EIRP T , EIRP L and EIRP R at each sampling point, the power detector connected to the test antenna can be configured so that it can simultaneously obtain EIRP T , EIRP L and EIRP R .
在一实施例中,根据归一化波矢空间算法将EIRP T、EIRP L和EIRP R分别积分累计为TRP T、TRP L和TRP R,包括: In one embodiment, EIRP T , EIRP L and EIRP R are respectively integrated and accumulated into TRP T , TRP L and TRP R according to the normalized wave vector space algorithm, including:
根据
Figure PCTCN2022112527-appb-000007
计算TRP T
according to
Figure PCTCN2022112527-appb-000007
compute TRP T ;
根据
Figure PCTCN2022112527-appb-000008
计算TRP L
according to
Figure PCTCN2022112527-appb-000008
Calculate TRP L ;
根据
Figure PCTCN2022112527-appb-000009
计算TRP R
according to
Figure PCTCN2022112527-appb-000009
Calculate TRP R ;
其中,Vu和Vv为波矢空间的采样间隔,EIRP T,i为第i个采样点的EIRP T,i∈M,M为正整数,EIRP L,i为第i个采样点的EIRP L,EIRP R,i为第i个采样点的EIRP R,θ i
Figure PCTCN2022112527-appb-000010
为第i个采样点在球坐标系的角度值。
Among them, Vu and Vv are the sampling intervals of the wave vector space, EIRP T, i is the EIRP T of the i-th sampling point, i∈M, M is a positive integer, EIRP L, i is the EIRP L of the i-th sampling point, EIRP R, i is the EIRP R of the ith sampling point, θ i and
Figure PCTCN2022112527-appb-000010
is the angle value of the i-th sampling point in the spherical coordinate system.
当射频指标为杂散时,S103可以包括:根据待测杂散信号的频谱带宽确定频谱测试点;根据每一频谱测试点测量目标阵列天线在每一采样点的EIRP;S104则可以包括:根据所有采样点的EIRP和归一化波矢采样算法统计每一频谱测试点的杂散TRP。When the radio frequency index is spurious, S103 can include: determine spectrum test point according to the spectrum bandwidth of the spurious signal to be measured; Measure the EIRP of target array antenna at each sampling point according to each spectrum test point; S104 can include: according to The EIRP of all sampling points and the normalized wave vector sampling algorithm count the spurious TRP of each spectrum test point.
在一实施例中,在根据所有采样点的EIRP和归一化波矢采样算法统计每一频谱测试点的杂散TRP之后,还可以包括:根据每一频谱测试点的杂散TRP绘制目标阵列天线在频谱带宽的杂散TRP频谱曲线。In an embodiment, after counting the stray TRP of each spectrum test point according to the EIRP of all sampling points and the normalized wave vector sampling algorithm, it may also include: drawing the target array according to the stray TRP of each spectrum test point The spurious TRP spectrum curve of the antenna in the spectrum bandwidth.
通过根据所有采样点的EIRP和归一化波矢采样算法统计每一频谱测试点的杂散TRP,根据每一频谱测试点的杂散TRP绘制目标阵列天线在频谱带宽的杂散TRP频谱曲线,可以在减少采样点的情况下通过测量计算得到杂散TRP和TRP频谱曲线,提高杂散测量的效率。By counting the stray TRP of each spectrum test point according to the EIRP of all sampling points and the normalized wave vector sampling algorithm, draw the stray TRP spectrum curve of the target array antenna in the spectrum bandwidth according to the stray TRP of each spectrum test point, The spurious TRP and the TRP spectrum curve can be obtained by measuring and calculating while reducing the sampling points, so as to improve the efficiency of spurious measurement.
在一个具体的例子中,根据每一频谱测试点测量目标阵列天线在每一采样点的EIRP,包括:在测量目标阵列天线在一个采样点的EIRP时,测量所有频谱测试点在该采样点的EIRP后转至下一个采样点进行测量,直至所有采样点均测量完成。In a specific example, measuring the EIRP of the target array antenna at each sampling point according to each spectrum test point includes: when measuring the EIRP of the target array antenna at a sampling point, measuring the EIRP of all spectrum test points at the sampling point After EIRP, go to the next sampling point for measurement until all the sampling points are measured.
常规在测量阵列天线的杂散时,通常采用串行测量的方式,即先测量一个频点在每一个采样点的EIRP,测量完一个频点之后测量下一个频点在每一个采样点的EIRP。由于需测量的频点通常有成百上千个,若一个频点的测量为一轮,则常规做法的测量方式需要经历成百上千轮才能完成。由于在测量阵列天线在不同采样点的EIRP时,需要控制并改变支撑阵列天线的转台和支撑测试天线的支架的方位,而改变方位耗时较长,因此采用串行测量的方式会使得整体耗时非常长。而本申请实施例提供的射频指标测量方法,在测量目标阵列天线在一个采样点的EIRP时,测量完所有频谱测试点在该采样点的EIRP后转至下一个采样点进行测量的方式,可以称为并行测量的方式,能够在一轮的测量中测量完成百上千个频谱测试点对应的EIRP,大大提高了杂散的测量效率。Conventionally, when measuring the spurs of an array antenna, a serial measurement method is usually used, that is, first measure the EIRP of a frequency point at each sampling point, and then measure the EIRP of the next frequency point at each sampling point after measuring a frequency point . Since there are usually hundreds or even thousands of frequency points to be measured, if one frequency point is measured in one round, the conventional measurement method needs to go through hundreds or thousands of rounds to complete. When measuring the EIRP of the array antenna at different sampling points, it is necessary to control and change the orientation of the turntable supporting the array antenna and the bracket supporting the test antenna, and it takes a long time to change the orientation, so the serial measurement method will reduce the overall consumption. Very long. However, the radio frequency index measurement method provided by the embodiment of the present application, when measuring the EIRP of the target array antenna at a sampling point, after measuring the EIRP of all spectrum test points at the sampling point, turn to the next sampling point for measurement. The method called parallel measurement can measure the EIRP corresponding to hundreds or thousands of spectrum test points in one round of measurement, which greatly improves the efficiency of spurious measurement.
在一实施例中,根据所有所述采样点的EIRP和所述归一化波矢采样算法统计每一所述频谱测试点的TRP,包括:In one embodiment, the TRP of each spectrum test point is counted according to the EIRP of all the sampling points and the normalized wave vector sampling algorithm, including:
根据
Figure PCTCN2022112527-appb-000011
并行计算每一频谱测试点的TRP,从而实现每一频谱测试点的TRP统计,方便TRP频谱曲线的绘制。其中,TRP j为第j个频谱测试点的TRP,Vu 和Vv为波矢空间的采样间隔,i表示第i个采样点,i∈M,M为正整数,θ i
Figure PCTCN2022112527-appb-000012
为第i个采样点在球坐标系的角度值。
according to
Figure PCTCN2022112527-appb-000011
The TRP of each spectrum test point is calculated in parallel, so as to realize the TRP statistics of each spectrum test point and facilitate the drawing of the TRP spectrum curve. Among them, TRP j is the TRP of the j-th spectrum test point, Vu and Vv are the sampling intervals of the wave vector space, i represents the i-th sampling point, i∈M, M is a positive integer, θ i and
Figure PCTCN2022112527-appb-000012
is the angle value of the i-th sampling point in the spherical coordinate system.
由于在一轮的测量中,所有频谱测试点在每一采样点的EIRP均已测量完成,因此可以通过
Figure PCTCN2022112527-appb-000013
同时计算(并行计算)每一频谱测试点的TRP。
Since in one round of measurement, the EIRP of all spectrum test points at each sampling point has been measured, it can be passed
Figure PCTCN2022112527-appb-000013
Simultaneous calculation (parallel calculation) of TRP for each spectral test point.
在常规做法中,由于是采用串行测量的方式,因此其只能逐个计算频点的TRP再合成杂散指标,效率较低;而本申请实施例提供的射频指标测量方法,由于采用并行测量的方式,因此可以通过并行计算的方式来计算TRP,从而提高了杂散指标的测量效率。In conventional practice, because it adopts the method of serial measurement, it can only calculate the TRP of the frequency points one by one and then synthesize the spurious index, and the efficiency is low; and the radio frequency index measurement method provided by the embodiment of the present application, due to the use of parallel measurement Therefore, the TRP can be calculated through parallel computing, thereby improving the measurement efficiency of spurious indicators.
在一实施例中,根据待测杂散信号的频谱带宽确定频谱测试点,包括:In one embodiment, determining the spectrum test point according to the spectrum bandwidth of the spurious signal to be tested includes:
根据
Figure PCTCN2022112527-appb-000014
确定频谱测试点数,其中,B spurious为待测杂散信号的频谱带宽,RBW spurious为3GPP规定的测量分辨率带宽;根据频谱测试点数和频谱带宽确定频谱测试点。
according to
Figure PCTCN2022112527-appb-000014
Determine the number of spectrum test points, where B spurious is the spectrum bandwidth of the spurious signal to be tested, and RBW spurious is the measurement resolution bandwidth specified by 3GPP; determine the spectrum test points according to the number of spectrum test points and the spectrum bandwidth.
请参考图3,其为在角度空间以瑞利分辨率为间隔的采样示意图。其中背景图为周期为半波长的16×8(y×z)阵列天线在角度空间辐射方向图,标志“+”表示采样点,角度空间的瑞利分辨率
Figure PCTCN2022112527-appb-000015
可以根据以下式子确定:
Please refer to FIG. 3 , which is a schematic diagram of sampling at intervals of Rayleigh resolution in angular space. The background image is the radiation pattern of the 16×8 (y×z) array antenna with a half-wavelength period in the angular space, the sign "+" indicates the sampling point, and the Rayleigh resolution of the angular space
Figure PCTCN2022112527-appb-000015
It can be determined according to the following formula:
Figure PCTCN2022112527-appb-000016
Figure PCTCN2022112527-appb-000016
其中,D y和D z指的是目标阵列天线在y方向和z方向上的最大尺寸。对于常见的等幅同相阵列天线,还可以通过方向图第一零陷半宽(First Null Beamwidth,简称FNBW)来确定瑞利分辨率,即: Among them, D y and D z refer to the maximum size of the target array antenna in the y direction and the z direction. For common equal-amplitude and in-phase array antennas, the Rayleigh resolution can also be determined by the First Null Beamwidth (FNBW) of the pattern, namely:
θ r=FNBW θ/2,
Figure PCTCN2022112527-appb-000017
θr = FNBW θ /2,
Figure PCTCN2022112527-appb-000017
请参考图4,其为在波矢空间以瑞利分辨率为间隔的采样示意图,图中的采样点对应的天线也是周期为半波长的16×8(y×z)阵列天线,标志“+”表示采样点,采样点在该空间中呈均匀分布。应当理解的是,采样点必须要保证在半径为1的圆内(即归一化波矢空间),这是因为在远场能被测到的场都是辐射分量,而圆外的场消逝波分量由于随距离呈指数衰减,在远场被截断。Please refer to Figure 4, which is a schematic diagram of sampling at intervals of Rayleigh resolution in the wave vector space. The antenna corresponding to the sampling point in the figure is also a 16×8 (y×z) array antenna with a half-wavelength period, marked with “+ ”Indicates the sampling points, and the sampling points are evenly distributed in this space. It should be understood that the sampling point must be guaranteed to be within a circle with a radius of 1 (that is, the normalized wave vector space), because the field that can be measured in the far field is the radiation component, and the field outside the circle evanescent The wave components are truncated in the far field due to their exponential decay with distance.
请参考图5,其为图4中在波矢空间的采样点对应在球坐标系下的位置示意图,其中标志“+”表示采样点。从图5中可以看出,采样点在球坐标系下呈非均匀分布,且与图3的采样点相比,点数有了明显的减少(约为图3中的1/3)。而图4和图5与图3对应的是同样的天线阵列,图4和图5的结果在波矢空间进行采样点数更少,效率更高。在一实施例中,由于波矢空间与阵列天线对应空间存在傅里叶变换的关系,因此在波矢空间采样是点数最少的方式,也可称为最佳采样方案。Please refer to FIG. 5 , which is a schematic diagram of the corresponding positions of the sampling points in the wave vector space in FIG. 4 in the spherical coordinate system, where the sign "+" indicates the sampling points. It can be seen from Figure 5 that the sampling points are non-uniformly distributed in the spherical coordinate system, and compared with the sampling points in Figure 3, the number of points has been significantly reduced (about 1/3 of that in Figure 3). However, Figure 4 and Figure 5 correspond to the same antenna array as Figure 3, and the results of Figure 4 and Figure 5 have fewer sampling points in the wave vector space and higher efficiency. In one embodiment, since there is a Fourier transform relationship between the wave vector space and the corresponding space of the array antenna, sampling in the wave vector space is the method with the least number of points, which can also be called the optimal sampling scheme.
请参考图6,其为本申请实施例提供的射频指标测量方法在测量某5G基站工作信道附近杂散信号的频谱曲线。其中,杂散频段带宽B spurious为800MHz,功率检测仪分辨率带宽RBW spurious设置为1MHz。作为数据对比,图中叠加了天线阵列正前方采样点的EIRP曲线。 Please refer to FIG. 6 , which shows the spectrum curve of the spurious signal near the working channel of a 5G base station measured by the radio frequency index measurement method provided by the embodiment of the present application. Wherein, the spurious frequency band bandwidth B spurious is 800MHz, and the resolution bandwidth RBW spurious of the power detector is set to 1MHz. For data comparison, the EIRP curve of the sampling point directly in front of the antenna array is superimposed in the figure.
请参考图7,其为本申请实施例提供的射频指标测量方法在测量某5G基站在3GPP规定的一段频段内的杂散曲线。其中,杂散频段带宽B spurious为6.25GHz(18000~24250MHz),功率检测仪分辨率带宽RBW spurious设置为10MHz。作为数据对比,图中叠加了天线阵列正前方采样点的EIRP曲线。图中标识
Figure PCTCN2022112527-appb-000018
处为检测到的异常杂散信号。
Please refer to FIG. 7 , which shows the radio frequency index measurement method provided by the embodiment of the present application when measuring the spurious curve of a 5G base station in a frequency band specified by 3GPP. Among them, the spurious frequency band bandwidth B spurious is 6.25GHz (18000-24250MHz), and the resolution bandwidth RBW spurious of the power detector is set to 10MHz. For data comparison, the EIRP curve of the sampling point directly in front of the antenna array is superimposed in the figure. Logo in the picture
Figure PCTCN2022112527-appb-000018
where is the detected abnormal spurious signal.
杂散测量一直是AAS型基站设备的射频指标测试难题,若采用3GPP TR37.843给出的传统精确测量方法,完成一次完整频段的杂散测量需要68天。在3GPP TS38.141-2(章节I.13)中给出了通过预扫描(Pre-scan)方式来提升杂散测量效率的方案,但是该方案中预扫描无法准确给出每个目标频点的杂散值,在实际操作中容易导致误判和漏测,影响测量结果的可信度。此外,业界还提出了基于混响室的杂散测量方法:采用搅拌叶片将具有方向性的波束能量在封闭空间内均匀反射,在封闭空间内特定位置收集发射信号,经校准可以推算出被测设备的TRP,然后在待测频段内扫频即可获得杂散频谱。但是,混响室方法过于依赖系统校准,被测设备(DUT)不同或者被测设备安装位置不同,都需要重新校准,影响测试效率。另外,根据测试经验,混响室对宽频信号的测量容易产生频谱起伏,影响杂散测量结果的精确度。Spurious measurement has always been a difficult problem in the radio frequency index test of AAS base station equipment. If the traditional accurate measurement method given by 3GPP TR37.843 is used, it takes 68 days to complete a complete frequency band spurious measurement. In 3GPP TS38.141-2 (Chapter I.13), a scheme to improve the efficiency of spurious measurement by pre-scanning (Pre-scan) is given, but in this scheme, pre-scanning cannot accurately give each target frequency point In actual operation, it is easy to cause misjudgment and missed measurement, which will affect the credibility of the measurement results. In addition, the industry has also proposed a spurious measurement method based on a reverberation chamber: the stirring blade is used to uniformly reflect the directional beam energy in the closed space, and the transmitted signal is collected at a specific position in the closed space. After calibration, the measured The TRP of the device, and then sweep the frequency in the frequency band to be tested to obtain the spurious spectrum. However, the reverberation chamber method relies too much on system calibration, and recalibration is required for different devices under test (DUT) or different installation locations of the devices under test, which affects test efficiency. In addition, according to the test experience, the measurement of broadband signals in the reverberation room is prone to spectrum fluctuations, which will affect the accuracy of spurious measurement results.
本申请实施例基于瑞利分辨率和归一化波矢空间算法确定球面角度坐标系中的采样点;然后针对测量频段一次性读取全部目标测试频点,在球面采样结束后,通过并行计算得出整个测量频段的杂散TRP频谱。采用本申请实施例提供的射频指标测量方法,对128振子天线阵列设备的宽频杂散测量时间在10分钟左右。相较于传统精确测量方法,本申请实施例提供的射频指标测量方法将杂散的测量效率提升3个数量级以上;对比常规的串行测量计算方法,在通过采用波矢采样情况下,本申请实施例采用的并行测量计算方法可明显提高多频点射频指标(比如杂散指标)的测量效率(如下表1):The embodiment of the present application determines the sampling points in the spherical angle coordinate system based on the Rayleigh resolution and the normalized wave vector space algorithm; The spurious TRP spectrum is derived for the entire measured frequency band. Using the radio frequency index measurement method provided in the embodiment of the present application, the measurement time for the broadband spuriousness of the 128-element antenna array device is about 10 minutes. Compared with the traditional precise measurement method, the radio frequency index measurement method provided by the embodiment of the application can improve the measurement efficiency of the spur by more than 3 orders of magnitude; compared with the conventional serial measurement calculation method, in the case of using wave vector sampling, the application The parallel measurement and calculation method adopted in the embodiment can significantly improve the measurement efficiency of multi-frequency radio frequency indicators (such as spurious indicators) (Table 1 below):
Figure PCTCN2022112527-appb-000019
Figure PCTCN2022112527-appb-000019
与预扫描方法和混响室方法相比,本申请实施例提供的射频指标测量方法的测量效率与前两者相近,但本申请实施例提供的射频指标测量方法采用了无损采样算法,因此其测量结果的可信度和精确度远高于前两者。Compared with the pre-scan method and the reverberation chamber method, the measurement efficiency of the radio frequency index measurement method provided in the embodiment of the present application is similar to the former two, but the radio frequency index measurement method provided in the embodiment of the present application uses a non-destructive sampling algorithm, so its The reliability and accuracy of the measurement results are much higher than the former two.
本申请实施例提供的射频指标测量方法,通过确定目标阵列天线的瑞利分辨率,根据瑞利分辨率和归一化波矢空间算法确定目标阵列天线在球坐标系的采样点,测量目标阵列天线在采样点的EIRP,根据EIRP归一化波矢空间算法计算得到目标阵列天线的射频指标。通过瑞利分辨率和归一化波矢空间算法确定阵列天线在球坐标系的采样点,可以在保证测量结果的准确性的同时有效地减少采样点,从而提高测量阵列天线的ACLR和杂散的效率。The radio frequency index measurement method provided by the embodiment of this application, by determining the Rayleigh resolution of the target array antenna, according to the Rayleigh resolution and the normalized wave vector space algorithm to determine the sampling point of the target array antenna in the spherical coordinate system, and measure the target array The EIRP of the antenna at the sampling point is calculated according to the EIRP normalized wave vector space algorithm to obtain the radio frequency index of the target array antenna. The sampling points of the array antenna in the spherical coordinate system are determined by the Rayleigh resolution and the normalized wave vector space algorithm, which can effectively reduce the sampling points while ensuring the accuracy of the measurement results, thereby improving the ACLR and spurious of the measurement array antenna s efficiency.
此外,本领域技术人员可以理解,上面各种方法的步骤划分,只是为了描述清楚,实现时可以合并为一个步骤或者对某些步骤进行拆分,分解为多个步骤,只要包括相同的逻辑关系,都在本专利的保护范围内;对算法中或者流程中添加无关紧要的修改或者引入无关紧要的设计,但不改变其算法和流程的核心设计都在该专利的保护范围内。In addition, those skilled in the art can understand that the division of the steps of the various methods above is only for the sake of clarity of description, and can be combined into one step or split into multiple steps during implementation, as long as the same logical relationship is included , are all within the protection scope of this patent; adding insignificant modifications or introducing insignificant designs to the algorithm or process, but not changing the core design of its algorithm and process are all within the protection scope of this patent.
在一个实施例中,涉及一种射频指标测量装置200,如图8所示,包括:第一确定模块201、第二确定模块202、测量模块203和计算模块204。各模块功能详细说明如下:In one embodiment, it relates to a radio frequency index measuring device 200, as shown in FIG. The detailed function of each module is as follows:
第一确定模块201,用于确定目标阵列天线的瑞利分辨率;The first determination module 201 is configured to determine the Rayleigh resolution of the target array antenna;
第二确定模块202,用于根据瑞利分辨率和归一化波矢空间算法确定目标阵列天线在球坐标系的采样点;The second determination module 202 is used to determine the sampling point of the target array antenna in the spherical coordinate system according to the Rayleigh resolution and the normalized wave vector space algorithm;
测量模块203,用于测量目标阵列天线在采样点的EIRP; Measurement module 203, for measuring the EIRP of the target array antenna at the sampling point;
计算模块204,用于根据EIRP和归一化波矢空间算法计算得到目标阵列天线的射频指标。The calculation module 204 is configured to calculate the radio frequency index of the target array antenna according to the EIRP and the normalized wave vector space algorithm.
在一实施例中,测量模块203还用于:测量目标阵列天线在每一采样点上的EIRP T、EIRP L和EIRP R,其中,EIRP T为带宽内输出的EIRP,EIRP L为左侧邻道泄漏EIRP,EIRP R为右侧邻道泄漏EIRP; In one embodiment, the measurement module 203 is also used to: measure the EIRP T , EIRP L and EIRP R of the target array antenna at each sampling point, where EIRP T is the EIRP output within the bandwidth, and EIRP L is the left neighbor channel leakage EIRP, EIRP R is the right adjacent channel leakage EIRP;
计算模块204还用于:根据归一化波矢空间算法将EIRP T、EIRP L和EIRP R分别积分累计为TRP T、TRP L和TRP R;根据ACLR L=TRP L-TRP T计算得到目标阵列天线的左侧ACLR,根据ACLR R=TRP R-TRP T计算得到目标阵列天线的右侧ACLR,其中,TRP T为带宽内输出的TRP,TRP L为左侧邻道泄漏TRP,TRP R为右侧邻道泄漏TRP。 The calculation module 204 is also used to: integrate and accumulate EIRP T , EIRP L and EIRP R into TRP T , TRP L and TRP R respectively according to the normalized wave vector space algorithm; calculate the target array according to ACLR L =TRP L -TRP T For the left ACLR of the antenna, the right ACLR of the target array antenna is calculated according to ACLR R =TRP R -TRP T , where TRP T is the output TRP within the bandwidth, TRP L is the left adjacent channel leakage TRP, and TRP R is the right Side channel leakage TRP.
在一实施例中,计算模块204还用于:In an embodiment, the calculation module 204 is also used for:
根据
Figure PCTCN2022112527-appb-000020
计算TRP T
according to
Figure PCTCN2022112527-appb-000020
compute TRP T ;
根据
Figure PCTCN2022112527-appb-000021
计算TRP L
according to
Figure PCTCN2022112527-appb-000021
Calculate TRP L ;
根据
Figure PCTCN2022112527-appb-000022
计算TRP R
according to
Figure PCTCN2022112527-appb-000022
Calculate TRP R ;
其中,Vu和Vv为波矢空间的采样间隔,EIRP T,i为第i个采样点的EIRP T,i∈M,M为正整数,EIRP L,i为第i个采样点的EIRP L,EIRP R,i为第i个采样点的EIRP R,θ i
Figure PCTCN2022112527-appb-000023
为第i个采样点在球坐标系的角度值。
Among them, Vu and Vv are the sampling intervals of the wave vector space, EIRP T, i is the EIRP T of the i-th sampling point, i∈M, M is a positive integer, EIRP L, i is the EIRP L of the i-th sampling point, EIRP R, i is the EIRP R of the ith sampling point, θ i and
Figure PCTCN2022112527-appb-000023
is the angle value of the i-th sampling point in the spherical coordinate system.
在一实施例中,测量模块203还用于:根据待测杂散信号的频谱带宽确定频谱测试点;根据每一频谱测试点测量目标阵列天线在每一采样点的EIRP;In one embodiment, the measurement module 203 is also used to: determine the spectrum test point according to the spectrum bandwidth of the spurious signal to be measured; measure the EIRP of the target array antenna at each sampling point according to each spectrum test point;
计算模块204还用于:根据所有采样点的EIRP和归一化波矢采样算法统计每一频谱测试点的杂散TRP。The calculation module 204 is further configured to: calculate the spurious TRP of each spectrum test point according to the EIRP of all sampling points and the normalized wave vector sampling algorithm.
在一实施例中,计算模块204还用于:根据每一频谱测试点的杂散TRP绘制目标阵列天线在频谱带宽的杂散TRP频谱曲线。In an embodiment, the calculation module 204 is further configured to: plot a spurious TRP spectrum curve of the target array antenna in the spectrum bandwidth according to the spurious TRP of each spectrum test point.
在一实施例中,测量模块203还用于在测量目标阵列天线在一个采样点的EIRP时,测量所有频谱测试点在该采样点的EIRP后,转至下一个采样点进行测量。In an embodiment, the measurement module 203 is further configured to measure the EIRP of all spectrum test points at the sampling point when measuring the EIRP of the target array antenna at the sampling point, and then go to the next sampling point for measurement.
在一实施例中,计算模块204还用于:根据
Figure PCTCN2022112527-appb-000024
并行计算每一频谱测试点的TRP,其中,TRP j为第j个频谱测试点的TRP,Vu和Vv为波矢空间的采样间隔,i表示第i个采样点,i∈M,M为正整数,θ i
Figure PCTCN2022112527-appb-000025
为第i个采样点在球坐标系的角度值。
In an embodiment, the calculating module 204 is also used for: according to
Figure PCTCN2022112527-appb-000024
Calculate the TRP of each spectrum test point in parallel, where TRP j is the TRP of the jth spectrum test point, Vu and Vv are the sampling intervals of the wave vector space, i represents the i-th sampling point, i∈M, and M is a positive integers, θ i and
Figure PCTCN2022112527-appb-000025
is the angle value of the i-th sampling point in the spherical coordinate system.
在一实施例中,测量模块203还用于:根据
Figure PCTCN2022112527-appb-000026
确定频谱测试点数,其中,B spurious为待测杂散信号的频谱带宽,RBW spurious为3GPP规定的测量分辨率带宽;根据频谱测试点数和频谱带宽确定频谱测试点。
In an embodiment, the measuring module 203 is also used for: according to
Figure PCTCN2022112527-appb-000026
Determine the number of spectrum test points, where B spurious is the spectrum bandwidth of the spurious signal to be tested, and RBW spurious is the measurement resolution bandwidth specified by 3GPP; determine the spectrum test points according to the number of spectrum test points and the spectrum bandwidth.
不难发现,本实施例为与前述方法的实施例相对应的装置实施例,本实施例可与前述方法的实施例互相配合实施。前述方法的实施例中提到的相关技术细节在本实施例中依然有效, 为了减少重复,这里不再赘述。相应地,本实施例中提到的相关技术细节也可应用在前述方法的实施例中。It is not difficult to find that this embodiment is an apparatus embodiment corresponding to the foregoing method embodiments, and this embodiment can be implemented in cooperation with the foregoing method embodiments. The relevant technical details mentioned in the foregoing method embodiments are still valid in this embodiment, and are not repeated here to reduce repetition. Correspondingly, the relevant technical details mentioned in this embodiment may also be applied to the foregoing method embodiments.
值得一提的是,本实施例中所涉及到的各模块均为逻辑模块,在实际应用中,一个逻辑单元可以是一个物理单元,也可以是一个物理单元的一部分,还可以以多个物理单元的组合实现。此外,为了突出本申请的创新部分,本实施例中并没有将与解决本申请所提出的技术问题关系不太密切的单元引入,但这并不表明本实施例中不存在其它的单元。It is worth mentioning that all the modules involved in this embodiment are logical modules. In practical applications, a logical unit can be a physical unit, or a part of a physical unit, or multiple physical units. Combination of units. In addition, in order to highlight the innovative part of the present application, units that are not closely related to solving the technical problem proposed in the present application are not introduced in this embodiment, but this does not mean that there are no other units in this embodiment.
在一个实施例中,涉及一种射频指标测量系统300,如图9所示,包括被测设备310、测试天线系统320、功率检测仪340和测试机330。被测设备310包括集成在一起的阵列天线312和远端射频单元(RRU)311,测试机330分别连接被测设备310、测试天线系统320和功率检测仪340,功率检测仪340与测试天线系统320连接。In one embodiment, it relates to a radio frequency index measurement system 300, as shown in FIG. The device under test 310 includes an integrated array antenna 312 and a remote radio unit (RRU) 311, and the testing machine 330 is respectively connected to the device under test 310, the test antenna system 320 and the power detector 340, and the power detector 340 and the test antenna system 320 connections.
测试机330用于确定阵列天线312的瑞利分辨率;根据瑞利分辨率和归一化波矢空间算法确定阵列天线312在球坐标系的采样点;控制被测设备310、测试天线系统320和功率检测仪340测量阵列天线312在采样点的EIRP;根据EIRP和归一化波矢空间算法计算得到阵列天线312的射频指标。The testing machine 330 is used to determine the Rayleigh resolution of the array antenna 312; determine the sampling points of the array antenna 312 in the spherical coordinate system according to the Rayleigh resolution and the normalized wave vector space algorithm; control the device under test 310, test the antenna system 320 The power detector 340 measures the EIRP of the array antenna 312 at the sampling point; calculates the radio frequency index of the array antenna 312 according to the EIRP and the normalized wave vector space algorithm.
阵列天线312与远端射频单元311紧密集成在一起形成一体化设备,如虚线所示。与单独和独立可测的RRU和天线系统相反,被测设备310的发射和接收通道直接连接到阵列天线312。阵列天线312可为矩阵型布置的天线,也可为其他非规则排列的天线,辐射的电磁波能量可处于毫米波波段。The array antenna 312 is closely integrated with the remote radio frequency unit 311 to form an integrated device, as shown by the dotted line. The transmit and receive channels of the device under test 310 are directly connected to the array antenna 312 as opposed to the RRU and antenna system being individually and independently testable. The array antenna 312 may be an antenna arranged in a matrix, or other irregularly arranged antennas, and the radiated electromagnetic wave energy may be in the millimeter wave band.
由于阵列天线312与远端射频单元311集成在一起,没有射频连接,因此阵列天线不能被隔离测试。也即是说,不能简单地测试阵列天线312的辐射性能和远端射频单元311的发射和接收链路性能来计算射频指标(包括EIRP、TRP、等效全向灵敏度(Equivalent Isotropic Sensitivity,EIS)和总全向灵敏度(Total Isotropic Sensitivity,TIS)等射频整机指标),对被测设备310的测量需要同时进行。Since the array antenna 312 is integrated with the remote radio frequency unit 311 and has no radio frequency connection, the array antenna cannot be tested in isolation. That is to say, the radiation performance of the array antenna 312 and the transmission and reception link performance of the remote radio unit 311 cannot be simply tested to calculate the radio frequency index (including EIRP, TRP, equivalent isotropic sensitivity (Equivalent Isotropic Sensitivity, EIS) and Total Isotropic Sensitivity (Total Isotropic Sensitivity, TIS) and other radio frequency machine indicators), the measurement of the device under test 310 needs to be performed simultaneously.
被测设备310被安置固定在转台313上,转台313可以在水平面上和俯仰面上进行转动。测试天线系统320包括测试天线321、天线固定支架323和测试线缆322。测试天线321可以为单个天线,也可以是多个天线。天线固定支架323用于固定测试天线321,并可以进行三维空间的移动。测试天线321通过测试线缆322被连接到功率检测仪340上,功率检测仪340可以是矢量网络分析仪、频谱仪或功率计等等。The device under test 310 is placed and fixed on the turntable 313, and the turntable 313 can rotate on the horizontal plane and the pitch plane. The test antenna system 320 includes a test antenna 321 , an antenna fixing bracket 323 and a test cable 322 . The test antenna 321 can be a single antenna, or multiple antennas. The antenna fixing bracket 323 is used to fix the test antenna 321 and can move in three-dimensional space. The test antenna 321 is connected to a power detector 340 through a test cable 322, and the power detector 340 may be a vector network analyzer, a spectrum analyzer or a power meter, etc.
被测设备310、转台313、天线固定支架323和功率检测仪340被连接到测试机330上,该测试机330可设置为控制被测设备310的收发、转台313的转动、天线固定支架323的移动和功率检测仪340的收发,对包括EIRP值的相关测试数据进行记录和处理,并记录日志。The device under test 310, the turntable 313, the antenna fixing bracket 323 and the power detector 340 are connected to the testing machine 330, and the testing machine 330 can be set to control the sending and receiving of the device under test 310, the rotation of the turntable 313, and the rotation of the antenna fixing bracket 323. The mobile and power detector 340 sends and receives, records and processes relevant test data including the EIRP value, and records a log.
在整个测试过程中,全电波暗室环境通过吸波材料350和暗室外墙360与外界环境隔绝以模拟无穷大空间的情况。During the whole test process, the environment of the fully anechoic chamber is isolated from the external environment by the absorbing material 350 and the outer wall of the anechoic chamber 360 to simulate the situation of an infinite space.
在一实施例中,测试机330还用于:测量阵列天线312在每一采样点上的EIRP T、EIRP L和EIRP R,其中,EIRP T为带宽内输出的EIRP,EIRP L为左侧邻道泄漏EIRP,EIRP R为右侧邻道泄漏EIRP;根据归一化波矢空间算法将EIRP T、EIRP L和EIRP R分别积分累计为TRP T、TRP L和TRP R;根据ACLR L=TRP L-TRP T计算得到阵列天线312的左侧ACLR,根据ACLR R=TRP R-TRP T计算得到阵列天线312的右侧ACLR,其中,TRP T为带宽内输出的TRP, TRP L为左侧邻道泄漏TRP,TRP R为右侧邻道泄漏TRP。 In one embodiment, the testing machine 330 is also used to: measure the EIRP T , EIRP L and EIRP R of the array antenna 312 at each sampling point, where EIRP T is the EIRP output within the bandwidth, and EIRP L is the left neighbor channel leakage EIRP, EIRP R is the right adjacent channel leakage EIRP; according to the normalized wave vector space algorithm, EIRP T , EIRP L and EIRP R are respectively integrated and accumulated into TRP T , TRP L and TRP R ; according to ACLR L = TRP L -TRP T calculates the left side ACLR of the array antenna 312, and calculates the right side ACLR of the array antenna 312 according to ACLR R =TRP R -TRP T , wherein, TRP T is the TRP output in the bandwidth, and TRP L is the left adjacent channel Leakage TRP, TRP R is the leakage TRP of the right adjacent channel.
在一实施例中,测试机330还用于:In one embodiment, the testing machine 330 is also used for:
根据
Figure PCTCN2022112527-appb-000027
计算TRP T
according to
Figure PCTCN2022112527-appb-000027
compute TRP T ;
根据
Figure PCTCN2022112527-appb-000028
计算TRP L
according to
Figure PCTCN2022112527-appb-000028
Calculate TRP L ;
根据
Figure PCTCN2022112527-appb-000029
计算TRP R
according to
Figure PCTCN2022112527-appb-000029
Calculate TRP R ;
其中,Vu和Vv为波矢空间的采样间隔,EIRP T,i为第i个采样点的EIRP T,i∈M,M为正整数,EIRP L,i为第i个采样点的EIRP L,EIRP R,i为第i个采样点的EIRP R,θ i
Figure PCTCN2022112527-appb-000030
为第i个采样点在球坐标系的角度值。
Among them, Vu and Vv are the sampling intervals of the wave vector space, EIRP T, i is the EIRP T of the i-th sampling point, i∈M, M is a positive integer, EIRP L, i is the EIRP L of the i-th sampling point, EIRP R, i is the EIRP R of the ith sampling point, θ i and
Figure PCTCN2022112527-appb-000030
is the angle value of the i-th sampling point in the spherical coordinate system.
在一实施例中,测试机330还用于:根据待测杂散信号的频谱带宽确定频谱测试点;根据每一频谱测试点测量阵列天线312在每一采样点的EIRP;根据所有采样点的EIRP和归一化波矢采样算法统计每一频谱测试点的杂散TRP。In one embodiment, the testing machine 330 is also used to: determine the spectrum test point according to the spectrum bandwidth of the spurious signal to be tested; measure the EIRP of the array antenna 312 at each sampling point according to each spectrum test point; EIRP and normalized wave vector sampling algorithm count the spurious TRP of each spectrum test point.
在一实施例中,测试机330还用于:根据每一频谱测试点的杂散TRP绘制阵列天线312在频谱带宽的杂散TRP频谱曲线。In an embodiment, the testing machine 330 is further configured to draw a spurious TRP spectrum curve of the array antenna 312 in the spectrum bandwidth according to the spurious TRP of each spectrum test point.
在一实施例中,测试机330还用于在测量目标阵列天线在一个采样点的EIRP时,测量所有频谱测试点在该采样点的EIRP后转至下一个采样点进行测量。In an embodiment, the testing machine 330 is also used to measure the EIRP of all spectrum test points at the sampling point when measuring the EIRP of the target array antenna at the sampling point, and then go to the next sampling point for measurement.
在一实施例中,测试机330还用于:根据
Figure PCTCN2022112527-appb-000031
并行计算每一频谱测试点的TRP,其中,TRP j为第j个频谱测试点的TRP,Vu和Vv为波矢空间的采样间隔,i表示第i个采样点,i∈M,M为正整数,θ i
Figure PCTCN2022112527-appb-000032
为第i个采样点在球坐标系的角度值。
In one embodiment, the testing machine 330 is also used for: according to
Figure PCTCN2022112527-appb-000031
Calculate the TRP of each spectrum test point in parallel, where TRP j is the TRP of the jth spectrum test point, Vu and Vv are the sampling intervals of the wave vector space, i represents the i-th sampling point, i∈M, and M is a positive integers, θ i and
Figure PCTCN2022112527-appb-000032
is the angle value of the i-th sampling point in the spherical coordinate system.
在一实施例中,测试机330还用于:根据
Figure PCTCN2022112527-appb-000033
确定频谱测试点数,其中,B spurious为待测杂散信号的频谱带宽,RBW spurious为3GPP规定的测量分辨率带宽;根据频谱测试点数和频谱带宽确定频谱测试点。
In one embodiment, the testing machine 330 is also used for: according to
Figure PCTCN2022112527-appb-000033
Determine the number of spectrum test points, where B spurious is the spectrum bandwidth of the spurious signal to be tested, and RBW spurious is the measurement resolution bandwidth specified by 3GPP; determine the spectrum test points according to the number of spectrum test points and the spectrum bandwidth.
不难发现,本实施例为与前述方法的实施例相对应的系统实施例,本实施例可与前述方法的实施例互相配合实施。前述方法的实施例中提到的相关技术细节在本实施例中依然有效,为了减少重复,这里不再赘述。相应地,本实施例中提到的相关技术细节也可应用在前述方法的实施例中。It is not difficult to find that this embodiment is a system embodiment corresponding to the foregoing method embodiments, and this embodiment can be implemented in cooperation with the foregoing method embodiments. The relevant technical details mentioned in the foregoing method embodiments are still valid in this embodiment, and will not be repeated here in order to reduce repetition. Correspondingly, the relevant technical details mentioned in this embodiment may also be applied to the foregoing method embodiments.
在一个实施例中,涉及一种电子设备,如图10所示,包括:至少一个处理器401;以及,与至少一个处理器401通信连接的存储器402;其中,存储器402存储有可被至少一个处理器401执行的指令,指令被至少一个处理器401执行,以使至少一个处理器401能够执行上述的射频指标测量方法。In one embodiment, it relates to an electronic device, as shown in FIG. 10 , including: at least one processor 401; and a memory 402 communicatively connected to at least one processor 401; Instructions executed by the processor 401, the instructions are executed by at least one processor 401, so that the at least one processor 401 can execute the above radio frequency index measurement method.
其中,存储器和处理器采用总线方式连接,总线可以包括任意数量的互联的总线和桥,总线将一个或多个处理器和存储器的各种电路连接在一起。总线还可以将诸如外围设备、稳压器和功率管理电路等之类的各种其他电路连接在一起,这些都是本领域所公知的,因此,本文不再对其进行进一步描述。总线接口在总线和收发机之间提供接口。收发机可以是一个 元件,也可以是多个元件,比如多个接收器和发送器,提供用于在传输介质上与各种其他装置通信的单元。经处理器处理的数据通过天线在无线介质上进行传输,进一步,天线还接收数据并将数据传送给处理器。Wherein, the memory and the processor are connected by a bus, and the bus may include any number of interconnected buses and bridges, and the bus connects one or more processors and various circuits of the memory together. The bus may also connect together various other circuits such as peripherals, voltage regulators, and power management circuits, all of which are well known in the art and therefore will not be further described herein. The bus interface provides an interface between the bus and the transceivers. A transceiver may be a single element or multiple elements, such as multiple receivers and transmitters, providing a means for communicating with various other devices over a transmission medium. The data processed by the processor is transmitted on the wireless medium through the antenna, further, the antenna also receives the data and transmits the data to the processor.
处理器负责管理总线和通常的处理,还可以提供各种功能,包括定时,外围接口,电压调节、电源管理以及其他控制功能。而存储器可以被用于存储处理器在执行操作时所使用的数据。The processor is responsible for managing the bus and general processing, and can also provide various functions, including timing, peripheral interface, voltage regulation, power management, and other control functions. Instead, memory can be used to store data that the processor uses when performing operations.
在一个实施例中,涉及一种计算机可读存储介质,存储有计算机程序。计算机程序被处理器执行时实现上述方法实施例。In one embodiment, it relates to a computer readable storage medium storing a computer program. The above method embodiments are implemented when the computer program is executed by the processor.
即,本领域技术人员可以理解,实现上述实施例方法中的全部或部分步骤是可以通过程序来指令相关的硬件来完成,该程序存储在一个存储介质中,包括若干指令用以使得一个设备(可以是单片机,芯片等)或处理器(processor)执行本申请各个实施例所述方法的全部或部分步骤。而前述的存储介质包括:U盘、移动硬盘、只读存储器(ROM,Read-Only Memory)、随机存取存储器(RAM,Random Access Memory)、磁碟或者光盘等各种可以存储程序代码的介质。That is, those skilled in the art can understand that all or part of the steps in the method of the above-mentioned embodiments can be completed by instructing related hardware through a program, the program is stored in a storage medium, and includes several instructions to make a device ( It may be a single-chip microcomputer, a chip, etc.) or a processor (processor) to execute all or part of the steps of the methods described in the various embodiments of the present application. The aforementioned storage media include: U disk, mobile hard disk, read-only memory (ROM, Read-Only Memory), random access memory (RAM, Random Access Memory), magnetic disk or optical disc, etc., which can store program codes. .
本领域的普通技术人员可以理解,上述各实施例是实现本申请的具体实施例,而在实际应用中,可以在形式上和细节上对其作各种改变,而不偏离本申请的精神和范围。Those of ordinary skill in the art can understand that the above-mentioned embodiments are specific embodiments for realizing the present application, and in practical applications, various changes can be made to it in form and details without departing from the spirit and spirit of the present application. scope.

Claims (12)

  1. 一种射频指标测量方法,其中,包括:A radio frequency index measurement method, including:
    确定目标阵列天线的瑞利分辨率;Determine the Rayleigh resolution of the target array antenna;
    根据所述瑞利分辨率和归一化波矢空间算法确定所述目标阵列天线在球坐标系的采样点;determining the sampling points of the target array antenna in the spherical coordinate system according to the Rayleigh resolution and the normalized wave vector space algorithm;
    测量所述目标阵列天线在所述采样点的等效全向辐射功率EIRP;Measuring the equivalent isotropic radiated power EIRP of the target array antenna at the sampling point;
    根据所述EIRP和所述归一化波矢空间算法计算得到所述目标阵列天线的射频指标。The radio frequency index of the target array antenna is calculated according to the EIRP and the normalized wave vector space algorithm.
  2. 根据权利要求1所述的射频指标测量方法,其中,所述测量所述目标阵列天线在所述采样点的EIRP,包括:The radio frequency index measurement method according to claim 1, wherein said measuring the EIRP of said target array antenna at said sampling point comprises:
    测量所述目标阵列天线在每一所述采样点上的EIRP T、EIRP L和EIRP R,所述EIRP T为带宽内输出的EIRP,所述EIRP L为左侧邻道泄漏EIRP,所述EIRP R为右侧邻道泄漏EIRP; Measure the EIRP T , EIRP L , and EIRP R of the target array antenna at each of the sampling points, the EIRP T is the EIRP output within the bandwidth, the EIRP L is the leakage EIRP of the left adjacent channel, and the EIRP R is the leakage EIRP of the right adjacent channel;
    所述根据所述EIRP和所述归一化波矢空间算法计算得到所述目标阵列天线的射频指标,包括:The calculation according to the EIRP and the normalized wave vector space algorithm to obtain the radio frequency index of the target array antenna includes:
    根据所述归一化波矢空间算法将所述EIRP T、EIRP L和EIRP R分别积分累计为TRP T、TRP L和TRP R,所述TRP T为带宽内的总辐射功率TRP,所述TRP L为左侧邻道泄漏TRP,所述TRP R为右侧邻道泄漏TRP; According to the normalized wave vector space algorithm, the EIRP T , EIRP L and EIRP R are respectively integrated and accumulated into TRP T , TRP L and TRP R , the TRP T is the total radiation power TRP within the bandwidth, and the TRP L is the leakage TRP of the left adjacent channel, and the TRP R is the leakage TRP of the right adjacent channel;
    根据ACLR L=TRP L-TRP T计算得到所述目标阵列天线的左侧邻信道泄漏功率比ACLR,根据ACLR R=TRP R-TRP T计算得到所述目标阵列天线的右侧ACLR。 The left adjacent channel leakage power ratio ACLR of the target array antenna is calculated according to ACLR L =TRP L -TRP T , and the right ACLR of the target array antenna is calculated according to ACLR R =TRP R -TRP T.
  3. 根据权利要求2所述的射频指标测量方法,其中,所述根据所述归一化波矢空间算法将所述EIRP T、EIRP L和EIRP R分别积分累计为TRP T、TRP L和TRP R,包括: The radio frequency index measurement method according to claim 2, wherein said EIRP T , EIRP L and EIRP R are respectively integrated and accumulated into TRP T , TRP L and TRP R according to the normalized wave vector space algorithm, include:
    根据
    Figure PCTCN2022112527-appb-100001
    计算所述TRP T
    according to
    Figure PCTCN2022112527-appb-100001
    calculating said TRP T ;
    根据
    Figure PCTCN2022112527-appb-100002
    计算所述TRP L
    according to
    Figure PCTCN2022112527-appb-100002
    calculating said TRP L ;
    根据
    Figure PCTCN2022112527-appb-100003
    计算所述TRP R
    according to
    Figure PCTCN2022112527-appb-100003
    calculating said TRP R ;
    其中,所述Vu和所述Vv为波矢空间的采样间隔,所述EIRP T,i为第i个采样点的EIRP T,i∈M,所述M为正整数,所述EIRP L,i为第i个采样点的EIRP L,所述EIRP R,i为第i个采样点的EIRP R,所述θ i和所述
    Figure PCTCN2022112527-appb-100004
    为第i个采样点在所述球坐标系的角度值。
    Wherein, the Vu and the Vv are the sampling intervals of the wave vector space, the EIRP T, i is the EIRP T of the ith sampling point, i∈M, the M is a positive integer, and the EIRP L, i is the EIRP L of the i-th sampling point, the EIRP R, i is the EIRP R of the i-th sampling point, the θ i and the
    Figure PCTCN2022112527-appb-100004
    is the angle value of the i-th sampling point in the spherical coordinate system.
  4. 根据权利要求1所述的射频指标测量方法,其中,所述测量所述目标阵列天线在所述采样点的EIRP,包括:The radio frequency index measurement method according to claim 1, wherein said measuring the EIRP of said target array antenna at said sampling point comprises:
    根据待测杂散信号的频谱带宽确定频谱测试点;Determine the spectrum test point according to the spectrum bandwidth of the spurious signal to be tested;
    根据每一所述频谱测试点测量所述目标阵列天线在每一所述采样点的EIRP;Measuring the EIRP of the target array antenna at each of the sampling points according to each of the spectrum test points;
    所述根据所述EIRP和所述归一化波矢空间算法计算得到所述目标阵列天线的射频指标,包括:The calculation according to the EIRP and the normalized wave vector space algorithm to obtain the radio frequency index of the target array antenna includes:
    根据所有所述采样点的EIRP和所述归一化波矢采样算法统计每一所述频谱测试点的杂散TRP。According to the EIRP of all the sampling points and the normalized wave vector sampling algorithm, the spurious TRP of each spectrum test point is counted.
  5. 根据权利要求4所述的射频指标测量方法,其中,在所述根据所有所述采样点的EIRP和所述归一化波矢采样算法统计每一所述频谱测试点的杂散TRP之后,还包括:The radio frequency index measurement method according to claim 4, wherein, after the EIRP of all the sampling points and the normalized wave vector sampling algorithm are used to count the spurious TRP of each spectrum test point, further include:
    根据每一所述频谱测试点的杂散TRP绘制所述目标阵列天线在所述频谱带宽的杂散TRP 频谱曲线。Drawing a spurious TRP spectrum curve of the target array antenna in the spectrum bandwidth according to the spurious TRP of each spectrum test point.
  6. 根据权利要求4所述的射频指标测量方法,其中,所述根据每一所述频谱测试点测量所述目标阵列天线在每一所述采样点的EIRP,包括:The radio frequency index measurement method according to claim 4, wherein said measuring the EIRP of said target array antenna at each said sampling point according to each said spectrum test point comprises:
    在测量所述目标阵列天线在一个采样点的EIRP时,测量所有频谱测试点在所述采样点的EIRP后,转至下一个采样点进行测量。When measuring the EIRP of the target array antenna at a sampling point, after measuring the EIRP of all spectrum test points at the sampling point, go to the next sampling point for measurement.
  7. 根据权利要求6所述的射频指标测量方法,其中,所述根据所有所述采样点的EIRP和所述归一化波矢采样算法统计每一所述频谱测试点的TRP,包括:The radio frequency index measurement method according to claim 6, wherein said counting the TRP of each spectrum test point according to the EIRP of all said sampling points and said normalized wave vector sampling algorithm comprises:
    根据
    Figure PCTCN2022112527-appb-100005
    并行计算每一所述频谱测试点的TRP,其中,所述TRP j为第j个频谱测试点的TRP,所述Vu和所述Vv为波矢空间的采样间隔,所述i表示第i个采样点,i∈M,所述M为正整数,所述θ i和所述
    Figure PCTCN2022112527-appb-100006
    为第i个采样点在所述球坐标系的角度值。
    according to
    Figure PCTCN2022112527-appb-100005
    Calculate the TRP of each spectrum test point in parallel, wherein, the TRP j is the TRP of the jth spectrum test point, the Vu and the Vv are the sampling intervals of the wave vector space, and the i represents the ith Sampling point, i∈M, said M is a positive integer, said θ i and said
    Figure PCTCN2022112527-appb-100006
    is the angle value of the i-th sampling point in the spherical coordinate system.
  8. 根据权利要求7所述的射频指标测量方法,其中,所述根据待测杂散信号的频谱带宽确定频谱测试点,包括:The radio frequency index measurement method according to claim 7, wherein said determining the spectrum test point according to the spectrum bandwidth of the spurious signal to be measured comprises:
    根据
    Figure PCTCN2022112527-appb-100007
    确定频谱测试点数,其中,B spurious为所述待测杂散信号的频谱带宽,所述RBW spurious为3GPP规定的测量分辨率带宽;
    according to
    Figure PCTCN2022112527-appb-100007
    Determine the number of spectrum test points, where B spurious is the spectral bandwidth of the spurious signal to be measured, and the RBW spurious is the measurement resolution bandwidth specified by 3GPP;
    根据所述频谱测试点数和所述频谱带宽确定频谱测试点。Determine a spectrum test point according to the number of spectrum test points and the spectrum bandwidth.
  9. 一种射频指标测量装置,其中,包括:A radio frequency index measuring device, including:
    第一确定模块,用于确定目标阵列天线的瑞利分辨率;A first determining module, configured to determine the Rayleigh resolution of the target array antenna;
    第二确定模块,用于根据所述瑞利分辨率和归一化波矢空间算法确定所述目标阵列天线在球坐标系的采样点;The second determination module is used to determine the sampling points of the target array antenna in the spherical coordinate system according to the Rayleigh resolution and the normalized wave vector space algorithm;
    测量模块,用于测量所述目标阵列天线在所述采样点的EIRP;a measurement module, configured to measure the EIRP of the target array antenna at the sampling point;
    计算模块,用于根据所述EIRP和所述归一化波矢空间算法计算得到所述目标阵列天线的射频指标。A calculation module, configured to calculate the radio frequency index of the target array antenna according to the EIRP and the normalized wave vector space algorithm.
  10. 一种射频指标测量系统,其中,包括被测设备、测试天线系统、功率检测仪和测试机,所述被测设备包括集成在一起的阵列天线和远端射频单元,所述测试机分别连接所述被测设备、所述测试天线系统和所述功率检测仪,所述功率检测仪与所述测试天线系统连接;A radio frequency index measurement system, which includes a device under test, a test antenna system, a power detector and a test machine, the device under test includes an integrated array antenna and a remote radio frequency unit, and the test machine is connected to the The device under test, the test antenna system and the power detector, the power detector is connected to the test antenna system;
    所述测试机用于确定所述阵列天线的瑞利分辨率;根据所述瑞利分辨率和归一化波矢空间算法确定所述阵列天线在球坐标系的采样点;控制所述被测设备、所述测试天线系统和所述功率检测仪测量所述阵列天线在所述采样点的EIRP;根据所述EIRP和所述归一化波矢空间算法计算得到所述阵列天线的射频指标。The testing machine is used to determine the Rayleigh resolution of the array antenna; determine the sampling point of the array antenna in the spherical coordinate system according to the Rayleigh resolution and the normalized wave vector space algorithm; control the tested The equipment, the test antenna system and the power detector measure the EIRP of the array antenna at the sampling point; calculate the radio frequency index of the array antenna according to the EIRP and the normalized wave vector space algorithm.
  11. 一种电子设备,其中,包括:An electronic device, comprising:
    至少一个处理器;以及,at least one processor; and,
    与所述至少一个处理器通信连接的存储器;其中,a memory communicatively coupled to the at least one processor; wherein,
    所述存储器存储有可被所述至少一个处理器执行的指令,所述指令被所述至少一个处理器执行,以使所述至少一个处理器能够执行如权利要求1至8任一项所述的射频指标测量方法。The memory stores instructions executable by the at least one processor, and the instructions are executed by the at least one processor, so that the at least one processor can perform the operation described in any one of claims 1 to 8. RF index measurement method.
  12. 一种计算机可读存储介质,存储有计算机程序,其中,所述计算机程序被处理器执行时实现如权利要求1至8任一项所述的射频指标测量方法。A computer-readable storage medium storing a computer program, wherein, when the computer program is executed by a processor, the radio frequency index measurement method according to any one of claims 1 to 8 is implemented.
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