CN210575963U - Silicon controlled rectifier device - Google Patents
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- CN210575963U CN210575963U CN201921815377.7U CN201921815377U CN210575963U CN 210575963 U CN210575963 U CN 210575963U CN 201921815377 U CN201921815377 U CN 201921815377U CN 210575963 U CN210575963 U CN 210575963U
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Abstract
The utility model belongs to the technical field of semiconductor device, a silicon controlled rectifier device is provided, wherein, the first side of substrate layer is equipped with positive anode emission district, the cathode emission district, insulating medium layer, the second side of substrate layer is equipped with back anode emission district, adjust its minority carrier's life-span through the mode of doping platinum element at the substrate layer, thereby the turn-off time of silicon controlled rectifier device is reduced in the doping concentration condition that does not change the substrate layer, it is longer to have solved current silicon controlled rectifier device turn-off time, the turn-off problem that exists when using in the switching circuit of well high frequency unusually.
Description
Technical Field
The application relates to the technical field of semiconductor devices, in particular to a silicon controlled rectifier device.
Background
A Silicon Controlled Rectifier (SCR) is a high-power electrical component, also called a thyristor, and has the advantages of small size, high efficiency, long service life, and the like, and is mainly applied to low-frequency switching scenes, for example, power switching at 50 Hz or 60 Hz. The turn-off time (Tq) of a general silicon controlled device is within the range of 30-80 us, the working frequency of mains supply is 50 or 60Hz, and the corresponding response time is 20-16 ms, so that the general silicon controlled device can normally turn off under the working frequency of the mains supply.
However, the existing silicon controlled device has a long turn-off time, and has the problem of abnormal turn-off when being applied to a switching circuit of medium and high frequency.
SUMMERY OF THE UTILITY MODEL
The application aims to provide a silicon controlled rectifier device, and aims to solve the problems that the existing silicon controlled rectifier device is long in turn-off time and is abnormally turned off when being applied to a medium-high frequency switching circuit.
The embodiment of the application provides a silicon controlled rectifier device, includes:
a substrate layer having a first conductivity type and doped with platinum element;
the positive anode emitting region is arranged on the first side of the substrate layer, has a second conductivity type, and is doped with platinum elements;
the back anode emission region is arranged on the second side of the substrate layer and has a second conduction type, and the second side of the substrate layer is opposite to the first side of the substrate layer;
the substrate isolation region is arranged in the substrate layer, divides the substrate layer into an effective substrate layer and an ineffective substrate layer, is contacted with the back anode emission region and is isolated from the front anode emission region through the effective substrate layer;
the cathode emission region is arranged on the front anode emission region and is doped with platinum element;
the insulating medium layer is arranged on the first side of the substrate layer;
a cathode metal layer disposed on the cathode emission region;
the gate metal layer is arranged on the positive anode emission region and is isolated from the cathode metal layer through the insulating medium layer; and
and the anode metal layer is arranged in the back anode emission region.
Optionally, the first conductivity type is an N type, and the second conductivity type is a P type.
Optionally, the gate metal layer is aluminum metal.
Optionally, the anode metal layer is metallic silver.
Optionally, the substrate layer is concave, the front anode emission region is located in a groove on a first side of the substrate layer, and the back anode emission region is located in a second side surface area of the substrate layer.
Optionally, the front anode emission region is concave, and the cathode emission region is located in the groove on the first side of the front anode emission region.
Optionally, the substrate isolation region extends from the first side surface of the substrate layer deep to the second side surface of the substrate layer.
Optionally, the substrate isolation region is a second conductivity type semiconductor.
Optionally, the insulating dielectric layer is silicon oxide.
Optionally, the insulating dielectric layer is silicon nitride.
In the silicon controlled rectifier device that this application provided, the first side of substrate layer is equipped with positive anode emission district, cathode emission district, insulating medium layer, and the second side of substrate layer is equipped with back anode emission district, adjusts its minority carrier's life-span through the mode of doping platinum element at the substrate layer to the turn-off time of silicon controlled rectifier device is reduced to the doping concentration condition that does not change the substrate layer, it is longer to have solved current silicon controlled rectifier device turn-off time, the problem of turn-off abnormity that exists when using in the switching circuit of well high frequency.
Drawings
Fig. 1 is a schematic structural diagram of a thyristor device according to an embodiment of the present application;
fig. 2 is a schematic structural diagram of a substrate layer 100 provided by an embodiment of the present application after forming first masking layers 101 on both sides;
fig. 3 is a schematic structural diagram of a substrate isolation region 110 formed in a substrate layer 100 according to an embodiment of the present application;
fig. 4 is a schematic structural diagram of forming anode emission regions on two sides of a substrate layer 100 according to an embodiment of the present application;
fig. 5 is a schematic structural diagram of forming a cathode emission region 140 on the front anode emission region 120 according to an embodiment of the present application;
FIG. 6 is a schematic illustration of the implantation of a platinum source into the front anode emission region 120 and the cathode emission region 140 provided by one embodiment of the present application;
fig. 7 is a schematic structural diagram of forming an insulating dielectric layer 150 according to an embodiment of the present application.
Detailed Description
In order to make the objects, technical solutions and advantages of the present application more apparent, the present application is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present application and are not intended to limit the present application.
In the description of the present application, it is to be understood that the terms "first", "second" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implying any number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature.
Generally, the breakdown voltage of a silicon controlled rectifier is determined by the doping concentration of a substrate layer, silicon substrates with different doping concentrations are adopted as the substrate layer according to different breakdown voltages, the higher the doping concentration of the silicon substrate is, the lower the breakdown voltage of the prepared silicon controlled rectifier is, and at the moment, the lower the turn-off time (Tq) of the silicon controlled rectifier is, so that if the breakdown voltage of the silicon controlled rectifier is reduced or the turn-off time of the silicon controlled rectifier is reduced, the silicon substrate with the higher doping concentration is generally required to be replaced to serve as the substrate layer, because the silicon substrate is required to be subjected to operations such as ion implantation or etching in the manufacturing process, the original process parameters are generally required to be adjusted to replace the silicon substrate, the problems of cost increase, complex process and the like are caused, in order to reduce the turn-off time of the silicon controlled rectifier on the premise of not changing the concentration of the silicon, the method aims to reduce the turn-off time of the silicon controlled rectifier, increase the safety factor in design and not influence the functional characteristics of the silicon controlled rectifier under the original process parameters.
Fig. 1 is a schematic structural diagram of a thyristor device provided in an embodiment of the present application, and referring to fig. 1, the thyristor device in the embodiment includes: a substrate layer 100 having a first conductivity type; a front anode emitter region 120 of a second conductivity type doped with platinum element and disposed on a first side of the substrate layer 100; a back anode emitter region 130 of the second conductivity type disposed on a second side of the substrate layer 100, the second side of the substrate layer 100 being opposite to the first side of the substrate layer 100; a substrate isolation region 110 disposed in the substrate layer 100 and dividing the substrate layer 100 into an effective substrate layer and an ineffective substrate layer, wherein the substrate isolation region 110 is in contact with the back anode emission region 130 and is isolated from the front anode emission region 120 by the effective substrate layer; a cathode emitter region 140 doped with platinum and disposed on the front anode emitter region 120; an insulating dielectric layer 150 disposed on a first side of the substrate layer 100; a cathode metal layer 152 disposed on the cathode emission region 140; a gate metal layer 151 disposed on the front side anode emitter region 120; and an anode metal layer 153 disposed on the surface of the rear anode emitter region 130.
In this embodiment, the first side of the substrate layer 100 is provided with a front side anode emitter region 120, which front side anode emitter region 120 extends deep into the first side of the substrate layer 100, which is less than the thickness of the substrate layer 100 and forms a PN junction structure with the substrate layer 100 having the first conductive type, and, further, the front anode emission region 120 is further formed with a cathode emission region 140, the cathode emission region 140 extends into the front anode emission region 120 and forms a PN junction structure with the front anode emission region 120, in the present embodiment, the front anode emitter region 120, the cathode emitter region 140 and the substrate layer 100 are doped with platinum, the platinum element may be doped into the front side anode emitter region 120, the cathode emitter region 140, and the substrate layer 100 in the form of platinum ions or platinum atoms, so as to adjust the lifetime of minority carriers in the substrate layer 100, thereby reducing the turn-off time of the thyristor device without changing the doping concentration of the substrate layer 100.
Further, in one embodiment, the doping of the platinum element in the substrate layer 100 is controlled by adjusting the diffusion time or diffusion temperature in the platinum source drive-in process, so as to adjust the lifetime of minority carriers in the substrate layer 100, and determine the optimal diffusion time or diffusion temperature, so that the turn-off time of the thyristor device is minimized.
Further, in this embodiment, the substrate isolation region 110 is formed in the substrate layer 100, so that the substrate layer 100 is divided into an effective substrate layer and an invalid substrate layer, a plurality of stable PN junctions are formed in the effective substrate layer through the isolation of the substrate isolation region 110, and the invalid substrate layer is scribed after the device manufacturing process is completed, so that the single silicon controlled device is manufactured.
In one embodiment, the first conductivity type is N-type and the second conductivity type is P-type. In the present embodiment, the first conductivity type is N-type, i.e., the semiconductor material is made to be an electron conductivity type semiconductor by doping the semiconductor material with impurity ions of N-type conductivity, and the second conductivity type is P-type, i.e., the semiconductor material is made to be a hole conductivity type semiconductor by doping the semiconductor material with impurity ions of P-type conductivity, wherein the impurity ions of N-type conductivity are N-type impurity ions such as arsenic ions, phosphorus ions, nitrogen ions, and the like, and the impurity ions of P-type conductivity are P-type impurity ions such as boron ions.
In one embodiment, the gate metal layer 151 is aluminum metal. Further, in the present embodiment, the cathode metal layer 152 may also be aluminum metal.
In one embodiment, the anode metal layer 153 is metallic silver.
In one embodiment, the substrate layer 100 is "concave", the front anode emitter 120 is located in a groove on a first side of the substrate layer 100, and the back anode emitter 130 is located on a second side surface area of the substrate layer 100. In the present embodiment, the substrate layer 100 is made to be "concave" by implanting impurity ions of the second conductivity type into a partial region of the first side of the substrate layer 100 to form the front side anode emitter 120 on the first side of the substrate layer 100 and by advancing the depth of the PN junction on the first side of the substrate layer 100, wherein the depth of the front side anode emitter 120 is smaller than the depth of the substrate layer 100.
In one embodiment, the front anode emission region 120 is "concave" in shape, and the cathode emission region 140 is located in a recess on a first side of the front anode emission region 120. In the present embodiment, the front anode emitter region 120 is formed in a "concave" shape by implanting impurity ions of the first conductivity type, for example, a phosphorus source, in a portion of the region on the front anode emitter region 120 to advance the depth of the PN junction in the front anode emitter region 120, wherein the depth of the cathode emitter region 140 is smaller than the depth of the front anode emitter region 120.
In one embodiment, the substrate isolation region 110 extends from a first side surface of the substrate layer 100 deep to a second side surface of the substrate layer 100. In this embodiment, the substrate isolation region 110 may be formed by implanting second conductivity type impurity ions into two sides of the substrate layer 100, and continuously advancing the doping depth, so that the substrate isolation region 110 extends from the first side surface of the substrate layer 100 to the second side surface of the substrate layer 100, thereby dividing the substrate layer 100 into an effective substrate layer and an ineffective substrate layer, where the effective substrate layer is located in the enclosure of the substrate isolation region 110.
In one embodiment, the substrate isolation region 110 is a second conductive type semiconductor, and in this embodiment, the substrate isolation region 110 is doped with second conductive type impurity ions and integrated with the back anode emitter region 130 on the second side of the substrate layer 100 to form a "concave" type second conductive type semiconductor. Further, the second conductive type semiconductor may be a P-type semiconductor.
In one embodiment, the insulating dielectric layer 150 is silicon oxide.
In one embodiment, the insulating dielectric layer 150 is silicon nitride.
The embodiment of the application also provides a preparation method of the silicon controlled device, which comprises the following steps:
step a: a substrate isolation region 110 is defined with the first mask layer 101 at a first side and at a second side opposite to the first side of the substrate layer 100 having the first conductivity type, see fig. 2.
In the present embodiment, the first mask layer 101 is formed on the surface of both sides of the substrate layer 100, and the position of the substrate isolation region 110 is defined by the first mask layer 101, where the substrate isolation region 110 is used to divide the substrate layer 100 into an effective substrate layer and an ineffective substrate layer.
In one embodiment, the oxide layer may be formed by high temperature growth on the substrate layer 100, and the first mask layer 101 may be formed by etching the oxide layer.
Further, the thickness of the oxide layer is 1-3 microns.
Step b: implanting second conductivity type impurity ions into the substrate layer by means of ion implantation under the masking of the first mask layer to form the substrate isolation region in the substrate layer, so as to divide the substrate layer into an effective substrate layer and an ineffective substrate layer, as shown in fig. 3.
In the present embodiment, the substrate isolation region 110 is positioned by the first mask layer 101 on both sides of the substrate layer 100, and the substrate isolation region 110 is formed by implanting impurity ions of the second conductivity type into the exposed region of the first mask layer 101, thereby dividing the substrate layer 100 into an effective substrate layer and an ineffective substrate layer.
Step c: the position of the front side anode emitter region 120 is defined by using the second masking layer 102, and the second conductivity type impurity ions are implanted into the substrate layer 100 by using an ion implantation method under the masking of the second masking layer 102, so as to form the front side anode emitter region 120 on the first side of the substrate layer 100 and form the back side anode emitter region 130 on the second side of the substrate layer 100, as shown in fig. 4.
In this embodiment, the position of the front anode emitter region 120 is defined on the first side of the substrate layer 100 by the second mask layer 102, and the second conductive type impurity ions are implanted into the substrate layer 100 by ion implantation under the mask of the second mask layer 102, and at the same time, the second conductive type impurity ions are implanted into the second side surface of the substrate layer 100 to form the back anode emitter region 130.
Specifically, in one embodiment, an oxide layer is formed on the first side surface of the substrate layer 100 as the second mask layer 102 by etching, and the PN junction is further deep to a predetermined depth by implanting impurity ions of the second conductivity type at a temperature of 1200-1250 ℃, so as to form the front anode emitter region 120 and the back anode emitter region 130 on the first side and the second side of the substrate layer 100, respectively.
Step d: a third mask layer 103 is used to position a cathode emission region 140 on the front side anode emission region 140, and first conductivity type impurity ions are implanted into the front side anode emission region 120 under the masking of the third mask layer 103 to form a cathode emission region 140, as shown in fig. 5.
In this embodiment, a region of the cathode emission region 140 is defined on the front anode emission region 120 through the third mask layer 103, the area of the cathode emission region 140 is smaller than that of the front anode emission region 120, and then the first conductive type impurity ions are implanted into the front anode emission region 120 under the masking of the third mask layer 103 to form the cathode emission region 140, at this time, the cathode emission region 140 is an N-type semiconductor, and the front anode emission region 120 is a P-type semiconductor, so that a PN junction is formed between the cathode emission region 140 and the front anode emission region 120.
In one embodiment, an oxide layer may also be formed on the first side of the substrate layer 100 by high temperature oxidation and the third mask layer 103 may be formed by etching, and then the cathode emitter region 140 may be formed on the front anode emitter region 120 by phosphorous source drive-in.
Specifically, the mode of the phosphorus source may specifically be: a phosphorus source is vapor deposited on the exposed areas of the third mask layer 103 and then heated at a high temperature to drive the phosphorus source into the front anode emission region 120 to form a cathode emission region 140 on the front anode emission region 120.
Step e: a doped region of a platinum source is defined on a first side of the substrate layer 100 by using a fourth mask layer 104, and is doped under the mask of the fourth mask layer 104, as shown in fig. 6.
In this embodiment, the doped region of the platinum source may include a surface region of the front anode emission region 120 and a portion of the surface of the cathode emission region 140.
Step f: an insulating dielectric layer 150 is formed on the first side of the substrate layer 100, and the positions of the gate metal layer 151 and the cathode metal layer 152 are exposed, as shown in fig. 7.
Step g: a gate metal layer 151 and a cathode metal layer 152 are formed on a first side of the substrate layer and an anode metal layer 153 is formed on a second side of the substrate layer 100, see fig. 1.
In one embodiment, the substrate isolation region 110 in step b extends from the first side surface of the substrate layer 100 to the second side surface of the substrate layer 100.
In one embodiment, the step d comprises: a phosphorus source is implanted into the front side anode emission region 120 under the mask of the third mask layer 103 to form a cathode emission region 140.
In one embodiment, the step e comprises: a source of platinum is applied to a first side of the substrate layer 100 and annealed at a temperature of 700-900 degrees celsius to dope the platinum element.
In the present embodiment, by coating a platinum source on a first side of the substrate layer 100 and annealing at a temperature of 700-900 degrees celsius to inject the platinum source into the front anode emission region 120 and the cathode emission region 140, further, by comparing the experimental group coated with the platinum source and the control group not coated with the platinum source, the turn-off time of the thyristor in the control group not coated with the platinum source is 35us and the breakdown voltage is 820V, and after coating the platinum source under the mask of the fourth mask layer 104, in the temperature range of 700-900 degrees celsius while keeping the diffusion time constant as the annealing temperature increases, the turn-off time of the thyristor gradually decreases and a minimum turn-off time of 7us is obtained under a condition that the diffusion temperature is 800 degrees celsius, at which the breakdown voltage of the thyristor is 850V, and then as the diffusion time increases, the turn-off time of the thyristor increases to 9us at 900 degrees celsius, the breakdown voltage is greatly reduced to 600V.
In one embodiment, the step f comprises: an insulating dielectric layer 150 is formed on the first side of the substrate layer 100 by chemical vapor deposition.
In the silicon controlled rectifier device that this application provided, the first side of substrate layer is equipped with positive anode emission district, cathode emission district, insulating medium layer, and the second side of substrate layer is equipped with back anode emission district, adjusts its minority carrier's life-span through the mode of doping platinum element at the substrate layer to the turn-off time of silicon controlled rectifier device is reduced to the doping concentration condition that does not change the substrate layer, it is longer to have solved current silicon controlled rectifier device turn-off time, the problem of turn-off abnormity that exists when using in the switching circuit of well high frequency.
The above description is only exemplary of the present application and should not be taken as limiting the present application, as any modification, equivalent replacement, or improvement made within the spirit and principle of the present application should be included in the protection scope of the present application.
Claims (10)
1. A silicon controlled device, comprising: a substrate layer having a first conductivity type and doped with platinum element;
the positive anode emitting region is arranged on the first side of the substrate layer, has a second conductivity type and is doped with platinum elements;
the back anode emission region is arranged on the second side of the substrate layer and has a second conduction type, and the second side of the substrate layer is opposite to the first side of the substrate layer;
the substrate isolation region is arranged in the substrate layer, divides the substrate layer into an effective substrate layer and an ineffective substrate layer, is contacted with the back anode emission region and is isolated from the front anode emission region through the effective substrate layer;
the cathode emission region is arranged on the front anode emission region and is doped with platinum element;
the insulating medium layer is arranged on the first side of the substrate layer;
a cathode metal layer disposed on the cathode emission region;
the gate metal layer is arranged on the positive anode emission region and is isolated from the cathode metal layer through the insulating medium layer; and
and the anode metal layer is arranged in the back anode emission region.
2. The silicon controlled device as claimed in claim 1, wherein the first conductivity type is N-type and the second conductivity type is P-type.
3. The silicon controlled device as claimed in claim 1, wherein said gate metal layer is aluminum metal.
4. The silicon controlled device as claimed in claim 1, wherein said anode metal layer is metallic silver.
5. The silicon controlled device as defined in claim 1, wherein said substrate layer is "concave" shaped, said front anode emitter region being located in a recess in a first side of said substrate layer, said back anode emitter region being located in a region of a second side surface of said substrate layer.
6. The thyristor device of claim 5, wherein said front anode emitter region is "concave" shaped and said cathode emitter region is positioned within a recess in a first side of said front anode emitter region.
7. The silicon controlled device of claim 1, wherein the substrate isolation region penetrates deep from a first side surface of the substrate layer to a second side surface of the substrate layer.
8. The silicon controlled device as claimed in claim 1, wherein the substrate isolation region is a second conductivity type semiconductor.
9. The silicon controlled device of claim 1, wherein the insulating dielectric layer is silicon oxide.
10. The silicon controlled device of claim 1, wherein the insulating dielectric layer is silicon nitride.
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| CN201921815377.7U CN210575963U (en) | 2019-10-25 | 2019-10-25 | Silicon controlled rectifier device |
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| CN201921815377.7U CN210575963U (en) | 2019-10-25 | 2019-10-25 | Silicon controlled rectifier device |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110828548A (en) * | 2019-10-25 | 2020-02-21 | 深圳市德芯半导体技术有限公司 | Silicon controlled rectifier device and preparation method thereof |
| CN113410296A (en) * | 2021-06-17 | 2021-09-17 | 吉林华微电子股份有限公司 | Silicon controlled rectifier structure |
-
2019
- 2019-10-25 CN CN201921815377.7U patent/CN210575963U/en active Active
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110828548A (en) * | 2019-10-25 | 2020-02-21 | 深圳市德芯半导体技术有限公司 | Silicon controlled rectifier device and preparation method thereof |
| CN113410296A (en) * | 2021-06-17 | 2021-09-17 | 吉林华微电子股份有限公司 | Silicon controlled rectifier structure |
| CN113410296B (en) * | 2021-06-17 | 2024-03-22 | 吉林华微电子股份有限公司 | Silicon controlled rectifier structure |
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