CN210572591U - Transistor parameter tester based on PocketLab - Google Patents
Transistor parameter tester based on PocketLab Download PDFInfo
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- CN210572591U CN210572591U CN201920913514.4U CN201920913514U CN210572591U CN 210572591 U CN210572591 U CN 210572591U CN 201920913514 U CN201920913514 U CN 201920913514U CN 210572591 U CN210572591 U CN 210572591U
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- jack
- pocketlab
- transistor
- parameter tester
- measuring
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Abstract
The utility model discloses a transistor parameter tester based on PocketLab, including a PCB circuit board, above-mentioned integrated standard resistance jack, the component jack and the contact pin of awaiting measuring, the contact pin can link to each other with PocketLab's function pin district and power pin district. When the transistor parameters are measured, the test platform is inserted into PocketLab, transistor parameter curves (BJT input characteristic curve, BJT output characteristic curve, BJT amplification factor, MOS tube and other related device parameters) can be drawn by matching with PocketLab, main parameter tests are fed back to an interface in an image form, and related data reading, data correction and parameter setting functions are provided. The test platform can be used for measuring the parameters of daily transistors and can also be used for experimental teaching.
Description
Technical Field
The invention relates to a transistor parameter tester based on PocketLab, and belongs to the technical field of electronic circuits.
Background
At present, a mature product, a single function, high price and no instrument capable of simultaneously measuring an input-output characteristic curve and an amplification factor exist in the field of transistor parameter measurement, the existing instrument can only measure partial functions, and the operation is not simple and convenient enough; instruments capable of simultaneously measuring output characteristic curves and amplification coefficients are few at present, the price is generally high, and the instrument is not suitable for teaching popularization.
Disclosure of Invention
The invention aims to overcome the problems of single function, inconvenient use and higher price of the current transistor parameter tester, and the utility model provides a transistor parameter tester based on PocketLab, which utilizes the existing PocketLab platform and the transistor parameter tester integrating software and hardware to conveniently draw an input characteristic curve and an output characteristic curve of a BJT (bipolar junction transistor) tube and an MOS (metal oxide semiconductor) tube.
In order to achieve the purpose, the utility model discloses a method is: a transistor parameter tester based on PocketLab comprises a PocketLab and a PCB, wherein a standard resistor, a jack of an element to be tested and a contact pin are integrated on the PCB, and the contact pin can be connected with a functional pin area and a power supply pin area of the PocketLab; the standard resistor comprises R1 and R2, and the jacks comprise jack A, jack B, jack C, jack D and jack E; the jack A is used for being connected with a collector electrode of a transistor to be tested, the jack B is used for being connected with a base electrode of the transistor to be tested, the jack C is used for being connected with an emission set of the transistor to be tested, and meanwhile, the jack C is grounded; one end of the standard resistor R1 is connected with the jack B, and the other end is connected with the jack D; one end of the standard resistor R2 is provided with a jack A, and the other end of the standard resistor R2 is provided with a jack E; when measuring the input characteristic of the transistor, jack D was plugged through jack C via signal port SIG2 of PocketLab and jack E was plugged through jack C via signal port SIG1 of PocketLab; when the output characteristic of the transistor was measured, jack D was plugged through jack C via signal port SIG1 of PocketLab and jack E was plugged through jack C via signal port SIG2 of PocketLab.
As an improvement of the present invention, the resistance of the standard resistor R1 is 100K, and the resistance of the standard resistor R2 is 5K.
As an improvement of the present invention, when measuring the input characteristic curve of the BJT tube, the jack D and the jack B are also connected to the PocketLab oscilloscope ports U1 and U2, respectively.
As an improvement of the present invention, when measuring the output characteristic curve of the BJT tube, the jack a and the jack E are also connected to the PocketLab oscilloscope ports U2 and U1, respectively.
As an improvement of the utility model, when measuring the output characteristic curve of MOS pipe, jack A and jack E still are connected with PocketLab oscilloscope port U1 and U2 respectively.
As an improvement of the utility model, the size of the PCB circuit board is 5.48cm x 4.12cm x 1.60 mm.
By matching with virtual laboratory software, sinusoidal signals can be generated through PocketLab, input signals are collected through PocketLab, current is obtained through calculation, and meanwhile, the current is fed back to an interface in an image form to obtain a characteristic curve, and related data reading, data correction and parameter setting functions are provided;
has the advantages that:
the utility model discloses it is light and handy portable, the structure is exquisite, can carry out mass production, can obtain the use in teaching and teaching experiment in one aspect of it, can help improving the relevant knowledge of electronic circuit, if: on the other hand, the electronic circuit basic course can realize larger value in practical use, is used for portable device parameter measurement and transistor detection, realizes the portability characteristic by using PocketLab, is mainly used for transistor and resistor expansion interfaces, and improves the portability characteristic. The device can test and draw the parameters of the triode input characteristic curve, the triode output characteristic curve and other related devices, feed back the parameters to an interface in an image form, and provide related data reading, data correction and parameter setting functions.
Drawings
FIG. 1 is a schematic diagram of BJT tube input characteristic curve measurement.
FIG. 2 is a measurement schematic diagram of the output characteristic curve of the BJT tube.
FIG. 3 is a schematic diagram of a MOS output characteristic curve measurement.
Detailed Description
The technical solution of the present invention will be further explained with reference to the accompanying drawings and specific embodiments.
As shown in FIGS. 1 to 3, in the present invention, SIG1 and SIG2 are PocketLab signal ports, U1、U2Is PocketLab oscilloscope port; inputting SIG sinusoidal signal, and collecting signal U by PocketLab1And U2Calculating to obtain input current, feeding back to interface in image form to obtain input characteristic curve, and providing relevant data reading and data correctionSetting functions of positive and negative parameters; an output characteristic curve is obtained in a similar manner. The resistance of the standard resistor R1 is 100K, and the resistance of the standard resistor R2 is 5K.
Example 1:
as shown in FIG. 1, an input signal source SIG is a BJT input characteristic curve measurement schematic diagram2Connected in series with a suitable resistor R1Connected to the emitter junction and output voltage source SIG1Also connected in series with a suitable resistor R2Into collector-emitter, U1Representing the original sinusoidal signal, U, generated by a signal generator in PocketLab2The sinusoidal signals recovered by PocketLab after passing through the reference resistor are respectively drawn into U1 and U2, and the voltage at two ends of a collector-emitter and the voltage of an input signal are measured to obtain the value of the input current, wherein the value of the input current forms a curve along with the continuous change of the voltage value of the input signal, and the output voltage changes to form a curve family.
Example 2:
as shown in FIG. 2, an input signal source SIG is shown for the measurement of the output characteristic curve of the BJT tube1Connected in series with a suitable resistor R1Connected to the emitter junction and output voltage source SIG2Also connected in series with a suitable resistor R2Into collector-emitter, U1Representing the original sinusoidal signal, U, generated by a signal generator in PocketLab2The sinusoidal signals recovered by PocketLab after passing through the reference resistor are respectively drawn into U1 and U2 images, and the output current value is obtained through the measurement of the voltage at the two ends of the base electrode-emitter and the voltage of the output signal, and forms a curve along with the continuous change of the voltage value of the output signal, and simultaneously the input voltage changes to form a curve family.
Example 3:
as shown in FIG. 3, an input signal source SIG is a schematic diagram for measuring output characteristic curve of MOS transistor1Connected in series with a suitable resistor R1Gate-in, output voltage source SIG2Also connected in series with a suitable resistor R2Access drain electrode, U2Representing the original sinusoidal signal, U, generated by a signal generator in PocketLab1Represents the sinusoidal signal recovered by PocketLab after passing through the reference resistor, by plotting the images of U1, U2, respectivelyAnd measuring the voltage at two ends of the grid electrode and the voltage of the output signal to obtain an output current value, forming a curve along with the continuous change of the voltage value of the output signal, and simultaneously, changing the input voltage to form a curve family.
Claims (6)
1. Transistor parameter tester based on PocketLab, its characterized in that: the circuit board comprises a PocketLab and a PCB, wherein a standard resistor, a jack of an element to be tested and a contact pin are integrated on the PCB, and the contact pin can be connected with a functional pin area and a power supply pin area of the PocketLab; the standard resistor comprises R1 and R2, and the jacks comprise jack A, jack B, jack C, jack D and jack E; the jack A is used for being connected with a collector electrode of a transistor to be tested, the jack B is used for being connected with a base electrode of the transistor to be tested, the jack C is used for being connected with an emission set of the transistor to be tested, and meanwhile, the jack C is grounded; one end of the standard resistor R1 is connected with the jack B, and the other end is connected with the jack D; one end of the standard resistor R2 is provided with a jack A, and the other end of the standard resistor R2 is provided with a jack E; when measuring the input characteristic of the transistor, jack D was plugged through jack C via signal port SIG2 of PocketLab and jack E was plugged through jack C via signal port SIG1 of PocketLab; when the output characteristic of the transistor was measured, jack D was plugged through jack C via signal port SIG1 of PocketLab and jack E was plugged through jack C via signal port SIG2 of PocketLab.
2. The PocketLab-based transistor parameter tester of claim 1, wherein: the resistance value of the standard resistor R1 is 100K, and the resistance value of the standard resistor R2 is 5K.
3. The PocketLab-based transistor parameter tester of claim 1, wherein: jack D and jack B are also connected to PocketLab oscilloscope ports U1 and U2, respectively, when measuring the input characteristic curves of BJT tubes.
4. The PocketLab-based transistor parameter tester of claim 1, wherein: jack a and jack E are also connected to PocketLab oscilloscope ports U2 and U1, respectively, when measuring the output characteristic curves of BJT tubes.
5. The PocketLab-based transistor parameter tester of claim 1, wherein: when measuring the output characteristic curve of the MOS tube, the jack A and the jack E are also respectively connected with PocketLab oscilloscope ports U1 and U2.
6. The PocketLab-based transistor parameter tester of claim 1, wherein: the size of the PCB circuit board is 5.48cm multiplied by 4.12cm multiplied by 1.60 mm.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201920913514.4U CN210572591U (en) | 2019-06-18 | 2019-06-18 | Transistor parameter tester based on PocketLab |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201920913514.4U CN210572591U (en) | 2019-06-18 | 2019-06-18 | Transistor parameter tester based on PocketLab |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN210572591U true CN210572591U (en) | 2020-05-19 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201920913514.4U Expired - Fee Related CN210572591U (en) | 2019-06-18 | 2019-06-18 | Transistor parameter tester based on PocketLab |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN210572591U (en) |
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2019
- 2019-06-18 CN CN201920913514.4U patent/CN210572591U/en not_active Expired - Fee Related
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| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20200519 Termination date: 20210618 |
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| CF01 | Termination of patent right due to non-payment of annual fee |