CN210546422U - Sorting unit for chip testing - Google Patents
Sorting unit for chip testing Download PDFInfo
- Publication number
- CN210546422U CN210546422U CN201921213205.2U CN201921213205U CN210546422U CN 210546422 U CN210546422 U CN 210546422U CN 201921213205 U CN201921213205 U CN 201921213205U CN 210546422 U CN210546422 U CN 210546422U
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- linear
- chip
- sliding plate
- gantry support
- stator
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Abstract
The utility model discloses a sorting unit is used in chip test, include: the linear motor comprises a machine table, wherein a gantry support is arranged on the rear side of the machine table, a linear electronic stator is installed on the middle side of the gantry support, a linear electronic rotor is installed in the linear electronic stator, a sliding plate is installed on the linear electronic rotor, a linear guide rail is arranged at the front end of the gantry support below the linear motor stator, and the lower side of the sliding plate is connected with the linear guide rail in a sliding mode. The utility model relates to a sorting unit is used in chip test's advantage is: compact structure, the chip relies on pneumatic chuck structure to shift, and under the control of grating chi and reading head, the accurate pneumatic chuck structure that drives of linear electric motor stator shifts to the transfer of cooperation receipts flitch is selected separately the chip to in the material receiving box, and transfer efficiency is high, and degree of automation is high.
Description
Technical Field
The utility model relates to an electron chip test technical field especially relates to a sorting unit is used in chip test.
Background
With the continuous development of the chip packaging technology, the chip packaging testing technology also becomes an important technical key for ensuring the production quality and accelerating the production process in the electronic industry. Generally, the packaged chip needs to be subjected to quality test, currently, in the chip testing process, the chip is manually taken, sent and sorted, and during the manual chip testing process, the chip is manually transferred and tested, so that the problem of chip damage or inaccurate chip test can be caused by chip repositioning, and the chip testing efficiency is low, time and labor are wasted, and the automation level is low.
SUMMERY OF THE UTILITY MODEL
The utility model discloses the technical problem that will solve is: the sorting device for the chip test is accurate in transfer and high in transfer efficiency.
Above-mentioned technical problem, the utility model discloses a technical scheme be: a sorting device for chip testing comprises: a machine platform, wherein the rear side of the machine platform is provided with a gantry support, the middle side of the gantry support is provided with a linear electronic stator, a linear electronic rotor is arranged in the linear electronic stator, a sliding plate is arranged on the linear electronic rotor, the front end of the gantry support below the linear motor stator is provided with a linear guide rail, the lower side of the sliding plate is connected with the linear guide rail in a sliding way, the upper side of the linear guide rail is connected with a grating ruler, the left side of the sliding plate is connected with a reading head, the front end of the sliding plate is connected with a micro cylinder, the lower end of the micro cylinder is provided with a pneumatic chuck structure, a material receiving linear motor is arranged on the left side of the machine platform on the lower side of the gantry support, a material receiving plate is arranged on the material receiving linear motor, the machine table on the right side of the material receiving plate is provided with a test wafer bearing table, the test wafer bearing table is provided with a chip clamp, and the chip clamp corresponds to the pneumatic chuck structure in position.
Preferably, the material collecting plate is uniformly provided with material collecting boxes.
The utility model relates to a sorting unit is used in chip test's advantage is: compact structure, the chip relies on pneumatic chuck structure to shift, and under the control of grating chi and reading head, the accurate pneumatic chuck structure that drives of linear electric motor stator shifts to the transfer of cooperation receipts flitch is selected separately the chip to in the material receiving box, and transfer efficiency is high, and degree of automation is high.
Drawings
Fig. 1 is a schematic structural view of the sorting apparatus for chip testing of the present invention.
Detailed Description
The invention will be further elucidated by means of specific embodiments in the following description, in conjunction with the drawings, in which: for those skilled in the art, modifications of the invention in various equivalent forms will fall within the scope of the appended claims without departing from the principles of the invention.
As shown in fig. 1, a sorting apparatus for chip testing includes: a machine table 1, a gantry support 2 is arranged on the rear side of the machine table 1, a linear electronic stator 3 is arranged on the middle side of the gantry support 2, a linear electronic rotor 4 is arranged in the linear electronic stator 3, a sliding plate 5 is arranged on the linear electronic rotor 4, a linear guide rail 6 is arranged at the front end of the gantry support 2 below the linear motor stator 3, the lower side of the sliding plate 5 is connected with the linear guide rail 6 in a sliding manner, a grating ruler 7 is connected to the upper side of the linear guide rail 6, a reading head 8 is connected to the left side of the sliding plate 5, a micro cylinder 9 is connected to the front end of the sliding plate 5, a pneumatic chuck structure 10 is arranged at the lower end of the micro cylinder 9, a material receiving linear motor 11 is arranged on the left side of the machine table 1 on the lower side of the gantry support 2, a material receiving plate 12 is arranged on the, and a chip clamp 14 is arranged on the test wafer bearing table 13, and the chip clamp 14 corresponds to the pneumatic chuck structure 10 in position.
Furthermore, the material receiving plates 12 are uniformly provided with material receiving boxes 16.
The utility model relates to a sorting unit is used in chip test, chip rely on pneumatic chuck structure 10 centre gripping to shift, under grating chi 7 and reading head's measurement, linear electric motor stator 3 accurately drives pneumatic chuck structure 10 centre gripping and shifts, shifts to the upside of receiving flitch 12, receives the flitch and removes 12 under the drive of receiving linear electric motor 11, and the cooperation receives the shift of flitch 12, selects separately the chip to the material collecting box in, and transfer efficiency is high, and degree of automation is high.
Claims (2)
1. The utility model provides a sorting unit is used in chip test which characterized in that includes: the automatic feeding device comprises a machine table (1), wherein a gantry support (2) is arranged on the rear side of the machine table (1), a linear electronic stator (3) is arranged on the middle side of the gantry support (2), a linear electronic rotor (4) is arranged in the linear electronic stator (3), a sliding plate (5) is arranged on the linear electronic rotor (4), a linear guide rail (6) is arranged at the front end of the gantry support (2) below the linear motor stator (3), the lower side of the sliding plate (5) is in sliding connection with the linear guide rail (6), a grating ruler (7) is connected to the upper side of the linear guide rail (6), a reading head (8) is connected to the left side of the sliding plate (5), a micro cylinder (9) is connected to the front end of the sliding plate (5), a pneumatic chuck structure (10) is arranged at the lower end of the micro cylinder (9), and a material receiving linear motor (11) is arranged on the, receive material linear electric motor (11) and go up installation and receive flitch (12), be equipped with test cushion cap (13) on board (1) on receipts flitch (12) right side, be equipped with chip anchor clamps (14) on test cushion cap (13), chip anchor clamps (14) are corresponding with pneumatic chuck structure (10) position.
2. The sorting device for chip testing according to claim 1, wherein the material receiving plates (12) are uniformly provided with material receiving boxes (16).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921213205.2U CN210546422U (en) | 2019-07-30 | 2019-07-30 | Sorting unit for chip testing |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921213205.2U CN210546422U (en) | 2019-07-30 | 2019-07-30 | Sorting unit for chip testing |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN210546422U true CN210546422U (en) | 2020-05-19 |
Family
ID=70666898
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201921213205.2U Active CN210546422U (en) | 2019-07-30 | 2019-07-30 | Sorting unit for chip testing |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN210546422U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114046710A (en) * | 2021-09-29 | 2022-02-15 | 洛阳轴承研究所有限公司 | Eccentric roller measurement grouping operation table and measurement grouping device |
-
2019
- 2019-07-30 CN CN201921213205.2U patent/CN210546422U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114046710A (en) * | 2021-09-29 | 2022-02-15 | 洛阳轴承研究所有限公司 | Eccentric roller measurement grouping operation table and measurement grouping device |
| CN114046710B (en) * | 2021-09-29 | 2023-08-11 | 洛阳轴承研究所有限公司 | Eccentric roller measurement grouping operation panel and measurement grouping device |
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