CN210429777U - Amplifier chip packaging structure - Google Patents
Amplifier chip packaging structure Download PDFInfo
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- CN210429777U CN210429777U CN201921947466.7U CN201921947466U CN210429777U CN 210429777 U CN210429777 U CN 210429777U CN 201921947466 U CN201921947466 U CN 201921947466U CN 210429777 U CN210429777 U CN 210429777U
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/49—Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
- H01L2224/491—Disposition
- H01L2224/4912—Layout
- H01L2224/49171—Fan-out arrangements
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/181—Encapsulation
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Abstract
The utility model provides an amplifier chip packaging structure, relating to the technical field of chip packaging, comprising a chip, a packaging substrate and a sealing cover; the packaging substrate is provided with at least two layers of dielectric layers, a groove is formed in the top layer of the dielectric layer, a top metal layer, a middle metal layer and a bottom metal layer are arranged on the packaging substrate, and the sealing cover is arranged on the packaging substrate. The utility model provides an amplifier chip packaging structure, multilayer wiring has been realized, set up the chip in the recess, the effectual length of being connected between the top metal level that has shortened chip and packaging substrate, the transmission ability between the two has been improved, the loss of radio frequency transmission has been reduced, the closing cap that has the inner chamber makes the top of chip have the air bed of one deck low dielectric loss, the dielectric loss that traditional packaging chip needs direct contact plastic envelope material to cause has been avoided, the effectual performance loss that has reduced the millimeter wave band that packaging structure caused.
Description
Technical Field
The utility model belongs to the technical field of the chip package, more specifically say, relate to an amplifier chip package structure.
Background
With the utilization and development of spectrum resources in the radio frequency band, the operating frequencies of various communication systems have been expanded from lower frequency bands to the millimeter wave band. The millimeter wave frequency band has the advantages of short wavelength, wide frequency band, large information capacity and the like, and the millimeter wave communication technology is widely applied to the fields of mobile communication, radar detection, electronic countermeasure, accurate guidance and the like. The millimeter wave amplifier can amplify microwave signals in a millimeter wave frequency band, and is a key device of a 5G communication receiving and transmitting system. The amplifier chip in the millimeter wave frequency band is generally designed by adopting a monolithic microwave integrated circuit, and has the advantages of good microwave performance and high integration level.
At present, the microwave radio frequency chip mostly adopts a plastic package packaging process. However, the conventional plastic package chip adopts a solid injection molding packaging process, which comprises the steps of firstly manufacturing a metal packaging carrier frame, then bonding a chip on the frame, bonding the chip to a packaging pin, completing chip injection molding through an injection molding machine, and finally forming a final packaging product through a cutting process. The packaging structure is only suitable for packaging chips with frequency bands lower than 10GHz, and the 5G millimeter wave frequency band amplifier with frequency bands higher than 20GHz has the problem of overlarge parasitic loss, so that the normal use of the chips cannot be guaranteed.
The packaging process of the millimeter wave chip also adopts a ceramic tube shell packaging process for partial products, and the process adopts inorganic AL2O3The chip packaging process is that a chip is loaded into the tube shell and then sealed by gold-tin solder or high temperature resistant glue. Its advantages are less loss, high heat dissipation, high resistance to high temp and air tightness, high cost and large size. The method is mainly applied to military industry and is difficult to be used commercially.
SUMMERY OF THE UTILITY MODEL
An object of the utility model is to provide an amplifier chip package structure to the plastic envelope structure who exists among the solution prior art causes the technical problem that the millimeter wave amplifier loss is too big, performance is poor easily.
In order to achieve the above object, the utility model adopts the following technical scheme: an amplifier chip packaging structure is provided, which comprises a chip, a packaging substrate and a sealing cover; the outer periphery of the upper surface of the chip is provided with a plurality of metal pressure points, wherein at least two metal pressure points are chip radio frequency ports; the packaging substrate is provided with at least two layers of medium layers which are stacked from bottom to top, the medium layer positioned on the top layer is provided with a groove with an upward opening and used for accommodating a chip, the bottom surface of the groove is provided with a conducting layer, the top surface of the medium layer is provided with a plurality of top metal layers which are positioned on the periphery of the chip and respectively correspond to a plurality of metal pressure points one by one, a middle metal layer which corresponds to the top metal layers one by one is arranged between every two adjacent layers of medium layers, the bottom surface of the medium layer positioned on the bottom layer is provided with a bottom metal layer which corresponds to the middle metal layers one by one and corresponds to the conducting layer one by one, a sealing cover.
As another embodiment of the present application, the top metal layers corresponding to the chip rf ports are respectively first rf ports, the chip rf ports are connected to the first rf ports in a one-to-one correspondence manner, and the bottom metal layers corresponding to the first rf ports are respectively provided with second rf ports.
As another embodiment of the present application, the package substrate is provided with a plurality of copper bars located below the conductive layer, the copper bars extend to the bottom metal layer located below the groove, and the top of the copper bars is communicated with the conductive layer.
As another embodiment of the present application, the groove penetrates through the top dielectric layer, and the conductive layer is flush with the middle metal layer.
As another embodiment of the present application, the chip rf port is connected to the first rf port through a bonding wire.
As another embodiment of the present application, the first rf port is provided with a plating layer for bonding with a bonding wire.
As another embodiment of the present application, two bonding wires are provided, and the bonding wires are connected to the chip and the first rf port by wedge bonding or ball bonding, respectively.
As another embodiment of the application, the edge of the bottom surface of the sealing cover is provided with an adhesive layer used for being bonded with the periphery of the packaging substrate, and the chip and the groove are bonded by adopting conductive adhesive.
As another embodiment of the present application, the top surface of the chip is flush with the top surface of the package substrate, and a distance between two side surfaces of the chip adjacent to the first RF port and the side surface of the groove has a value of 50-200 μm.
As another embodiment of the present application, a second rf port is disposed on the bottom metal layer corresponding to the first rf port up and down, and the second rf port is connected to the first rf port through a metalized through hole.
The utility model provides an amplifier chip package structure's beneficial effect lies in: compared with the prior art, the utility model provides an amplifier chip packaging structure, adopt the top metal level, the bottom metal level, the form that middle metal level and a plurality of dielectric layers combine, can realize the multilayer wiring, set up the chip in the recess, the effectual length of being connected between the top metal level who shortens chip and packaging substrate, the parasitic inductance of bonding wire has been reduced, radio frequency signal's transmission ability between the two has been improved, furthest's self radio frequency performance of chip has been guaranteed, the closing cap that has the inner chamber makes the top of chip have the air bed of one deck low dielectric loss, because the dielectric loss factor of air is far less than general plastic envelope material, the dielectric loss that traditional encapsulation chip needs direct contact plastic envelope material to cause has been avoided, the effectual performance loss that reduces the millimeter wave band that packaging structure caused.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings required for the embodiments or the prior art descriptions will be briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings without inventive labor.
Fig. 1 is a schematic front view of a cross-sectional structure of an amplifier chip package structure according to a first embodiment of the present invention;
FIG. 2 is a schematic top view of the package substrate of FIG. 1;
FIG. 3 is a schematic cross-sectional view of A-A in FIG. 2;
fig. 4 is a schematic front view of a cross-sectional structure of an amplifier chip package structure according to a second embodiment of the present invention;
fig. 5 is a schematic sectional structure view of B-B in fig. 4.
Wherein, in the figures, the respective reference numerals:
100. a chip; 110. pressing points of metal; 111. a chip radio frequency port; 112. a chip DC port; 120. bonding wires; 200. a package substrate; 210. a dielectric layer; 220. a bottom metal layer; 221. a second radio frequency port; 222. a second DC port; 230. an intermediate metal layer; 240. a top metal layer; 241. a first radio frequency port; 242. a first DC port; 250. a groove; 251. a conductive layer; 260. a copper bar; 270. metallizing the through-hole; 300. sealing the cover; 310. an inner cavity.
Detailed Description
In order to make the technical problem, technical solution and advantageous effects to be solved by the present invention more clearly understood, the following description is given in conjunction with the accompanying drawings and embodiments to illustrate the present invention in further detail. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.
Referring to fig. 1 to 5, the amplifier chip package structure provided by the present invention will now be described. The amplifier chip packaging structure comprises a chip 100, a packaging substrate 200 and a sealing cover 300; a plurality of metal pressure points 110 are arranged on the outer periphery of the upper surface of the chip 100, wherein at least two metal pressure points 110 are chip radio frequency ports 111; the package substrate 200 is provided with at least two layers of dielectric layers 210 stacked from bottom to top, a groove 250 with an upward opening and used for accommodating the chip 100 is arranged on the dielectric layer 210 on the top layer, a conductive layer 251 is arranged on the bottom surface of the groove 250, top metal layers 240 which are arranged on the periphery of the chip 100 and respectively correspond to the plurality of metal pressure points 110 one by one are arranged on the top surface of the dielectric layer 210, middle metal layers 230 which correspond to the top metal layers 240 one by one are arranged between the two adjacent layers of dielectric layers 210, bottom metal layers 220 which correspond to the middle metal layers 230 one by one up and down and correspond to the conductive layer 251 up and down are arranged on the bottom surface of the dielectric layer 210 on the bottom layer, a sealing cover 300 is arranged on the package substrate 200 and used.
It will be understood that when an element is referred to as being "disposed on" another element, it can be directly on the other element or be indirectly on the other element. It will be understood that the terms "length," "width," "upper," "lower," "front," "rear," "top," "bottom," "inner," "outer," and the like are used in the orientation or positional relationship indicated in the drawings for convenience in describing the invention and to simplify the description, and do not indicate or imply that the device or element so referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus should not be considered as limiting the invention. Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature.
The utility model provides a pair of amplifier chip package structure, compared with the prior art, the utility model provides an amplifier chip package structure adopts top metal level 240, bottom metal level 220, the form that middle metal level 230 and two at least dielectric layers 210 combine, can realize the multilayer wiring, the effectual requirement that satisfies radio frequency wiring and power wiring, set up chip 100 in packaging substrate 200's recess 250, the effectual length of being connected that shortens between chip 100 and the top metal level 240, the transmission ability between the two has been improved, the loss of radio frequency transmission has been reduced, furthest's assurance chip 100's self performance. The manner of mounting the chip 100 by providing the groove 250 on the package substrate 200 also effectively shortens the distance between the chip 100 and the bottom surface of the package substrate 200, shortens the heat dissipation path of the chip 100, increases the heat dissipation efficiency, and contributes to stable operation of the chip 100. The sealing cover 300 with the inner cavity 310 is connected with the top surface of the packaging substrate 200 through the bottom surface of the periphery, so that a gap is formed between the chip 100 which is flush with the top surface of the packaging substrate 200 and the inner cavity 310 of the sealing cover 300, the chip 100 is isolated from the sealing cover 300 through air with a certain thickness above the chip 100, and the metal pressure point 110 is in direct contact with air, the loss caused by the fact that the traditional packaging needs to be in contact with electrolyte is avoided, and the loss of a high-frequency wave band is effectively reduced.
In this embodiment, the dielectric layer 210 is made of a resin material with a low dielectric loss factor, so that the loss can be effectively reduced, and the millimeter wave amplifier chip is suitable for a high-frequency millimeter wave amplifier chip. The mounting mode that the chip 100 is bonded in the groove 250 is simple and convenient to operate, the connection length between the chip 100 and the top metal layer 240 is effectively shortened, and the loss of radio frequency transmission is reduced conveniently. The sealing cover 300 is made of high-temperature-resistant plastic, the lower portion of the sealing cover is provided with the inner cavity 310 with the downward opening, dielectric loss of millimeter wave frequency wave bands is effectively reduced, structural sealing is achieved through bonding with the packaging substrate 200, and compared with a traditional injection molding type plastic package, bonding operation is very simple and convenient. The structure is suitable for GaN millimeter wave amplifier chips or GaAs millimeter wave amplifier chips.
According to the processing requirements and practical application, the thicknesses of the top metal layer 240, the bottom metal layer 220 and the middle metal layer 230 are 18um to 30um, and the thickness of the dielectric layer 210 is 60um to 100 um.
The top metal layer 240 serves as a radio frequency trace and a power feed layer, the middle metal layer 230 serves as a ground layer and a trace layer, and the bottom metal layer 220 serves as a pad layer and is welded to a PCB pad. The combination of two dielectric layers 210 and one intermediate metal layer 230 can meet the requirements of radio frequency wiring and power supply wiring.
By adopting the packaging structure, two layers of dielectric layers 210 or three layers of dielectric layers 210 can be selected according to the number of radio frequency wiring and power supply wiring of the chip 100 and the wiring crossing condition, a top metal layer 240, a bottom metal layer 220 and a middle metal layer 230 need to be arranged corresponding to the two layers of dielectric layers 210, a top metal layer 240, a bottom metal layer 220 and two middle metal layers 230 need to be arranged corresponding to the three layers of dielectric layers 210, the arrangement of the middle metal layer 230 is more convenient for the radio frequency wiring and the power supply wiring of the chip 100, and the applicability of the packaging structure is improved. The top metal layer 240, the dielectric layer 210, the middle metal layer 230, the bottom metal layer 220 and the dielectric layer 210 are arranged in a stacked manner, so that a complicated process of customizing a special plastic package frame in a plastic package process is omitted, meanwhile, the mounting precision of the chip 100 is ensured more easily by arranging the groove 250 in the dielectric layer 210, and meanwhile, multilayer wiring and reduction of loss of a high-frequency waveband are facilitated.
As a specific implementation manner of the embodiment of the present invention, please refer to fig. 1 to fig. 5, the top metal layer 240 corresponding to the chip rf port 111 is a first rf port 241, the chip rf port 111 is connected to the first rf port 241, and two bottom metal layers 220 are respectively provided with second rf ports 221 corresponding to the first rf port 241. In this embodiment, the metal pressure points 110 except the chip rf port 111 are the chip dc ports 112, the top metal layers 240 corresponding to the chip dc ports 112 are the first dc ports 242, the bottom metal layers 220 corresponding to the chip dc ports 112 are the second dc ports 222, the chip dc ports 112 are connected to the first dc ports 242, and the first dc ports 242 and the second dc ports 222 may be connected through the metalized through holes 270 or other methods.
Further, the chip rf ports 111 may be provided in two, three or four forms, which are provided in at least two forms, and the corresponding first rf ports 241 and second rf ports 221 are also provided in the form of the same number as the chip rf ports 111.
As a specific implementation manner of the embodiment of the present invention, please refer to fig. 4 to 5, a plurality of copper bars 260 located below the groove 250 and extending to the bottom surface of the package substrate 200 are disposed on the package substrate 200, and the top of the copper bars 260 is communicated with the conductive layer 251. Because the copper material is the material that the heat conductivility is good, the setting of copper bar 260 can realize thermal quick derivation, and copper bar 260 can also set up the copper post that is located recess 250 below, and the main shaft of copper post sets up along upper and lower direction, and the top and the conducting layer 251 intercommunication of copper post, bottom extend to bottom metal level 220 on, can realize same heat conduction function. The length direction of the copper bar 260 is perpendicular to the up-down direction, and may be set in a form parallel to the transmission direction of the radio frequency signal, may also be set in a form perpendicular to the transmission direction of the radio frequency signal, and may also be set at a certain angle with the radio frequency signal. The rf signal transmission direction refers to a direction in which the two first rf ports 241 on the top surface of the package substrate 200 are wired.
Further, the width of the copper bar 260 is 100-300 um, the ratio of the width of the copper bar 260 to the distance between two adjacent copper bars 260 is 5: 1-2: 1, and the parameter range can ensure good heat transfer performance.
As an embodiment of the present invention, referring to fig. 1 and 4, the groove 250 penetrates through the top surface of the dielectric layer 210, and the conductive layer 251 is flush with the middle metal layer 230. In the embodiment, the thickness of the top dielectric layer 210 is set according to the thickness of the chip 100, and the top dielectric layer 210 is arranged in a penetrating manner, so that the bottom of the groove 250 is just flush with the middle metal layer 230 and is located between the two dielectric layers 210.
As a specific implementation manner of the embodiment of the present invention, please refer to fig. 2 to fig. 3, the chip rf port 111 is connected to the first rf port 241 through the bonding wire 120. The first rf port 241 is provided with a plating layer for bonding with the bonding wire 120, and the plating layer is made of ni-pd-au. Two bonding wires 120 are provided, and the bonding wires 120 are connected to the chip 100 and the first rf port 241 by wedge bonding or ball bonding, respectively. The bonding wire 120 is used to connect the metal pad 110 of the chip 100 and the first rf port 241 on the top metal layer 240 of the first package substrate, and the bonding wire 120 is formed by using two 25 μm gold wires and is connected by means of wedge bonding or ball bonding. The arrangement of the plating layer on the package substrate 200 can improve the bonding strength with the bonding wire 120, and improve the reliability of the package. The bonding wire 120 may adopt a double-wire or multi-wire form, which can realize a smaller integrated inductance and improve the packaging performance.
In this embodiment, the first rf port 241 is surface-treated by a electroless nickel-palladium plating and gold immersion technique, so as to enhance the bonding tension of the bonding wire 120 and improve the packaging reliability.
Further, the first rf port 241 and the second rf port 221 on the package substrate 200 are directly connected in the form of a microstrip line or a coplanar waveguide, the width of the top metal layer 240 as the first rf port 241 is determined by the thickness and the dielectric constant of the dielectric layer 210, and the metalized via 270 is connected with the second rf port 221 at the bottom of the package substrate 200, so as to implement the feedthrough of the rf signals inside and outside the whole package structure. The major axis of the metalized through-hole 270 is arranged in the up-down direction, i.e., in a form perpendicular to the plate surface of the package substrate 200. The microstrip line is a microwave transmission line formed by a single conductor strip supported on the top dielectric layer 210, and is suitable for manufacturing a planar transmission line of a microwave integrated circuit. Compared with other guided wave systems, the microwave single-chip microwave guided wave system has the advantages of small size, light weight, wide frequency band, suitability for packaging and integration of microwave single chips and the like.
Coplanar waveguide, also called coplanar microstrip transmission line, is to make a central conductor on one surface of a dielectric substrate and to make reference ground conductors on two sides adjacent to the central conductor. In the coplanar waveguide transmission, because the central conductor and the reference ground conductor are positioned in the same plane, the change of an electromagnetic wave transmission mode can be effectively reduced and the radio frequency transmission loss of the chip radio frequency port 111 can be reduced by adopting a coplanar waveguide form in the packaging substrate.
As a specific implementation manner of the embodiment of the present invention, the bottom edge of the cover 300 is provided with an adhesive layer for adhering to the periphery of the package substrate 200, and the chip 100 and the groove 250 are adhered by a conductive adhesive. The sealing cover 300 is effectively bonded with the packaging substrate 200 through the adhesive layer on the periphery of the bottom surface, and the adhesive layer is melted through heating during bonding, so that the effect that the sealing cover 300 and the packaging substrate 200 are effectively bonded into a whole is achieved.
As a specific implementation manner of the embodiment of the present invention, please refer to fig. 1 to fig. 5, the top surface of the chip 100 is flush with the top surface of the package substrate 200, and a distance between two side surfaces of the chip 100 adjacent to the first rf port 241 and the side surface of the groove 250 is 50-200 μm. The arrangement of the groove 250 on the package substrate 200 not only effectively shortens the distance between the chip 100 and the bottom surface of the package substrate 200, and improves the heat dissipation efficiency, but also makes the top surface of the chip 100 and the top surface of the package substrate 200 closer to each other, and when the metal pressure point 110 on the top surface of the chip 100 is connected with the first rf port 241 on the package substrate 200, the connection length can be effectively shortened, and the transmission loss is reduced. In this embodiment, the depth of the groove 250 is consistent with the thickness of the chip 100, so that the top surface of the chip 100 is flush with the top surface of the package substrate 200 after the chip 100 is mounted, the size between the metal pressure point 110 and the first radio frequency port 241 is minimized, the bending radian of the bonding wire 120 is effectively reduced, the metal pressure point 110 is connected with the first radio frequency port 241 through the bonding wire 120, the bonding wire 120 is in a form of two gold wires, the high-frequency transmission capability of the package structure is improved by reducing the parasitic parameters of the bonding wire 120, and the self performance of the millimeter wave amplifier chip is exerted to the maximum.
Further, the distance between the two adjacent side surfaces of the chip 100 and the first rf port 241 and the side surface of the groove 250 should be set to be smaller, in this embodiment, a distance range of 50-200 μm is adopted, the length of the bonding wire 120 can be effectively shortened, and the distance between the other two side edges of the chip 100 and the other two side walls of the groove 250 is not limited, and a larger distance can be adopted to achieve the effect of facilitating processing.
As a specific implementation manner of the embodiment of the present invention, please refer to fig. 1 to fig. 5, the bottom metal layer 220 corresponding to the first rf port 241 is provided with a second rf port 221, and the second rf port 221 is connected to the first rf port 241 through a metalized through hole 270. The second rf port 221 and the first rf port 241 on the bottom surface of the package substrate 200 are connected by a metalized through hole 270, and a plurality of grounded solid copper pillars may be formed around the metalized through hole 270 to form a coaxial transmission effect, thereby reducing discontinuity of microwave signal transmission and reducing transmission loss of the metalized through hole 270.
In this embodiment, a form of providing a middle metal layer 230 is adopted, the bottom surface of the groove 250 provided on the dielectric layer 210 located at the top extends to the top surface of the middle metal layer 230, the middle metal layer 230 serves as a conductive layer 251 provided at the bottom of the groove 250, a plurality of copper bars 260 arranged in parallel are provided below the middle metal layer 230, the top surface of the copper bars 260 is communicated with the middle metal layer 230, and the copper bars 260 extend downward to the bottom surface of the dielectric layer 210 located at the lower layer, so as to achieve communication with an external space. Because the copper material has good heat-conducting property, the heat emitted by the chip 100 can be quickly conducted to the outside of the package substrate 200, so that the outward quick transmission of the internal heat is realized, and the over-high temperature of the chip 100 is avoided.
Further, the copper bar 260 may be in the form of a column with a spindle disposed in the vertical direction, and may also achieve the effect of conducting the heat at the intermediate metal layer 230 to the outside of the package substrate 200.
The manufacturing method of the amplifier chip packaging structure comprises the following steps:
1. manufacturing a package substrate 200: two dielectric layers 210 are stacked, an intermediate metal layer 230 corresponding to the metal pressure point 110 of the chip 100 is arranged between the two dielectric layers 210, a top metal layer 240 corresponding to the metal pressure point 110 of the chip 100 is arranged on the top dielectric layer 210, a bottom metal layer 220 corresponding to the metal pressure point 110 of the chip 100 is arranged on the bottom dielectric layer 210, the dielectric layer 210 is a high-frequency plate with the thickness of 60um, and the intermediate metal layer 230, the top metal layer 240 and the bottom metal layer 220 are respectively made of copper layers with the thickness of 30 um. A groove 250 is formed in the top dielectric layer 210, the groove depth is 60um, the middle metal layer 230 is exposed at the bottom of the groove 250, and the distance from the edge of the chip 100, which is not adjacent to the first radio frequency port 241 and the second radio frequency port 221, to the edge of the groove 250 is 60 um; the surface of the upper dielectric layer 210 is plated, the plating layer is made of nickel-palladium-gold, and the nickel, palladium and gold are stacked from bottom to top, so that the bonding wire has a soft texture, the adhesion of the bonding wire 120 on the top metal layer 240 is improved, and the adhesion performance is improved.
2. Bonding the chip 100 to the package substrate 200: placing the package substrate 200 on a bonding stage, and bonding the chip 100 into the groove 250 of the package substrate 200 through a high-thermal-conductivity conductive adhesive; the packaging substrate 200 with the bonded chip 100 is placed in a high-temperature oven, the drying temperature is 150 ℃, and the drying time is 4 hours, so that the bonding glue between the chip 100 and the packaging substrate 200 is fully cured, and the requirements of fixing and heat conduction of the chip 100 are met.
3. Bonding the chip radio frequency port 111 and the first radio frequency port 241, placing the packaging substrate 200 bonded with the chip 100 on a bonding table, and heating to 120 ℃ of temperature required by bonding; and bonding the chip radio frequency port 111 and the first radio frequency port 241 by using a 25um gold wire, and bonding the chip direct current port 112 and the first direct current port 242 at the same time.
4. Mounting the cover 300: heating the packaging substrate 200 bonded with the chip 100 to 125 ℃; fixing the sealing cover 300 right above the packaging substrate 200, keeping the temperature of the packaging substrate 200 and the sealing cover 300 unchanged at 125 ℃, applying certain pressure, keeping for 10-30 min to fully melt the adhesive of the sealing cover 300, and continuously heating to 160 ℃ for 1 hour; the packaged chip 100 is naturally cooled to room temperature.
And finally, carrying out appearance and X-ray inspection on the packaged product, judging whether the packaged product is scratched or has the phenomena of bonding wire 120 breaking and the like, and marking the front side of the packaged product by adopting laser.
Further, after the package substrate 200 is manufactured, the package substrate 200 may be bonded to a dicing film, and the package substrate 200 may be diced, which is suitable for small-lot processing tests; the whole packaging structure can be diced after being manufactured, and the method is suitable for being used in large-batch processing production.
The utility model provides a pair of make amplifier chip packaging structure has adopted the shaping mode that combines top metal level 240, bottom metal level 220, middle metal level 230 and a plurality of dielectric layers 210, and the packaging structure of this mode preparation can effectual improvement preparation efficiency, and can the effectual encapsulation cost that reduces chip 100. This structure is convenient for realize the requirement of multilayer wiring still, utilize the mode of bonding glue adhesion in the recess 250 of packaging substrate 200 with chip 100, not only easy and simple to handle, still effectual length of the bonding wire 120 who has shortened between chip 100 and the top metal level 240, the transmission ability between chip 100 and the packaging substrate 200 has been improved, the loss of radio frequency transmission has been reduced, be applicable to the effective transmission of high frequency wave band, the closing cap 300 that has inner chamber 310 in addition, through the bonding realization structure's with packaging substrate 200 sealed, compare traditional formula of moulding plastics plastic envelope, not only the bonding is simple and convenient still effectual the loss that reduces high frequency wave band. The mounting of the chip 100 is performed by providing the groove 250 in the package substrate 200, which not only facilitates shortening the length of the bonding wire 120, but also effectively shortens the distance between the chip 100 and the bottom surface of the package substrate 200, shortens the heat dissipation path of the chip 100, increases the heat dissipation efficiency, and facilitates stable operation of the chip 100.
The above description is only exemplary of the present invention and should not be construed as limiting the present invention, and any modifications, equivalents and improvements made within the spirit and principles of the present invention are intended to be included within the scope of the present invention.
Claims (10)
1. An amplifier chip package, comprising:
the chip comprises a chip, wherein a plurality of metal pressure points are arranged on the outer periphery of the upper surface of the chip, and at least two metal pressure points are chip radio frequency ports;
the packaging substrate is provided with at least two layers of medium layers which are stacked from bottom to top, a groove which is provided with an upward opening and is used for accommodating the chip is arranged on the medium layer positioned on the top layer, a conducting layer is arranged on the bottom surface of the groove, a plurality of top metal layers which are positioned on the periphery of the chip and are respectively in one-to-one correspondence with the metal pressure points are arranged on the top surface of the medium layer, middle metal layers which are in one-to-one correspondence with the top metal layers are arranged between every two adjacent layers of medium layers, and bottom metal layers which are in one-to-one correspondence with the middle metal layers and in one-to-one correspondence; and
and the sealing cover is arranged on the packaging substrate and is used for sealing the packaging substrate, and the sealing cover is provided with an inner cavity with a downward opening.
2. The amplifier chip package of claim 1, wherein the top metal layers corresponding to the chip rf ports are first rf ports, respectively, the chip rf ports are connected to the first rf ports in a one-to-one correspondence, and the bottom metal layers corresponding to the first rf ports are provided with second rf ports, respectively.
3. The amplifier chip package of claim 2, wherein the package substrate has a plurality of copper bars disposed under the conductive layer, the copper bars extending to the bottom metal layer under the grooves, and the tops of the copper bars are connected to the conductive layer.
4. The amplifier chip package of claim 3, wherein the recess extends through a face of the dielectric layer at the top layer, and the conductive layer is flush with the intermediate metal layer.
5. The amplifier chip package of claim 2, wherein the chip rf port and the first rf port are connected by a bond wire.
6. The amplifier chip package of claim 5, wherein the first RF port has a plating thereon for bonding with the bonding wire.
7. The amplifier chip package of claim 5, wherein there are two bonding wires, and the bonding wires are connected to the chip and the first RF port by a wedge bond or a ball bond, respectively.
8. The amplifier chip package according to any one of claims 2 to 7, wherein an adhesive layer is disposed at an edge of a bottom surface of the cover for adhering to an outer periphery of the package substrate, and the chip and the groove are adhered by a conductive adhesive.
9. The amplifier chip package of claim 2, wherein a top surface of the chip is flush with a top surface of the package substrate, and wherein a spacing value between two side surfaces of the chip adjacent to the first rf port and the side surfaces of the recess is 50-200 μ ι η.
10. The amplifier chip package of claim 2, wherein the first rf port and the second rf port are connected by a metalized via.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN201921947466.7U CN210429777U (en) | 2019-11-12 | 2019-11-12 | Amplifier chip packaging structure |
Applications Claiming Priority (1)
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