CN210221036U - A semiconductor height detection device - Google Patents
A semiconductor height detection device Download PDFInfo
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- CN210221036U CN210221036U CN201921076262.0U CN201921076262U CN210221036U CN 210221036 U CN210221036 U CN 210221036U CN 201921076262 U CN201921076262 U CN 201921076262U CN 210221036 U CN210221036 U CN 210221036U
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Abstract
本实用新型涉及半导体检测技术领域，具体为一种半导体高度检测设备，包括底板，所述底板的一侧开设有活动槽，所述底板的底部固定连接有水平微调螺丝，所述活动槽的内部固定连接有滑轨，所述活动槽的内部活动连接有活动板。该半导体高度检测设备，使用时先将半导体放置在检测台上，然后可以通过调节活动板在滑轨上的位置来改变检测感应触头与半导体的接触点，通过旋转紧固钮可以固定活动板的位置，检测台边缘处的限位板与弹簧板的卡接可以便于调节半导体的旋转方位，通过设置活动板和检测台可以进行多点位的高度检测，增加高度检测的准确性，使用时可以通过激光灯照射在半导体上的光点来快速确认测量点位，达到快速对照测高的目的。
The utility model relates to the technical field of semiconductor detection, in particular to a semiconductor height detection device. A sliding rail is fixedly connected, and a movable plate is movably connected inside the movable groove. The semiconductor height detection equipment, when in use, first place the semiconductor on the detection table, and then adjust the position of the movable plate on the slide rail to change the contact point between the detection inductive contact and the semiconductor, and the movable plate can be fixed by rotating the fastening button The position of the limit plate at the edge of the detection table and the spring plate can be easily adjusted to adjust the rotation orientation of the semiconductor. By setting the movable plate and the detection table, multi-point height detection can be performed to increase the accuracy of height detection. The measurement point can be quickly confirmed by the light spot irradiated on the semiconductor by the laser light, so as to achieve the purpose of rapid comparison of height measurement.
Description
Technical Field
The utility model relates to a semiconductor detects technical field, specifically is a semiconductor height detection equipment.
Background
Semiconductor parts are increasingly applied to various industries and fields, and accordingly high requirements and standards for precision of the semiconductor parts are met, and in the precision parts, the precision of semiconductors influences the use performance of the precision parts; the conventional semiconductor component detection multipurpose height measuring instrument mainly detects height, depth, flatness and the like, but in the detection process, because the structure of a component is complicated or the detection and the positioning are not easy, one reference surface needs to be selected for detecting a plurality of point positions, and the position of the semiconductor component is frequently adjusted and changed, so that the reference surface positioning has accumulated errors to cause measurement misalignment, and therefore, a semiconductor height detection device is urgently needed to be provided.
SUMMERY OF THE UTILITY MODEL
Technical problem to be solved
The utility model provides a semiconductor height detection equipment, through setting up the fly leaf and examining test table, the problem of proposing among the above-mentioned background art has been solved to the not enough of prior art.
(II) technical scheme
In order to achieve the above purpose, the utility model discloses a following technical scheme realizes: a semiconductor height detection device comprises a bottom plate, wherein a movable groove is formed in one side of the bottom plate, a horizontal fine adjustment screw is fixedly connected to the bottom of the bottom plate, a slide rail is fixedly connected to the inside of the movable groove, a movable plate is movably connected to the inside of the movable groove, a movable plate sliding groove is formed in one side of the movable plate, the movable plate is movably connected with the slide rail through the movable plate sliding groove, an adjusting groove is formed in one side, close to the movable groove, of the bottom plate, a movable plate sliding block is fixedly connected to one side of the movable plate, the movable plate sliding block is movably connected to the inside of the adjusting groove, a screw rod is fixedly connected to one side of the movable plate sliding block, a fastening button is connected to the outer surface of the screw rod through threads, a horizontal bubble is fixedly connected, the inside fixedly connected with pivot of bearing, the top fixedly connected with of pivot examines test table, the edge fixedly connected with a plurality of limiting plate of examining test table, one side fixedly connected with spring plate that the fly leaf is close to the standing groove, one side fixedly connected with height detection appearance that the bottom plate is close to the movable groove, one side of height detection appearance is provided with detects the response contact, it sets up flutedly to detect one side of response contact, the inside fixedly connected with laser lamp of recess.
Optionally, the number of the horizontal fine-tuning screws is four, and the four horizontal fine-tuning screws are respectively located at four corners of the bottom plate.
Optionally, the number of the slide rails is two, and the two slide rails are uniformly distributed on the same side of the movable groove.
Optionally, the movable plate is matched with the movable groove, and the slide rail is matched with the movable plate slide groove.
Optionally, the number of the fastening buttons is two, and the two fastening buttons are respectively located on the left side and the right side of the bottom plate.
Optionally, the placing groove is located at the center of the top of the movable plate, the detection platform is circular, and the diameter of the detection platform is smaller than that of the placing groove.
Optionally, the recess is located at the center of the sensing feeler.
(III) advantageous effects
The utility model provides a semiconductor height detection equipment possesses following beneficial effect:
1. through setting up the fly leaf and examining test table, the inside swing joint in activity groove has the fly leaf, the top fixedly connected with of pivot examines test table, place the semiconductor earlier on examining test table during the use, then can change the contact point that detects response contact and semiconductor through adjusting the position of fly leaf on the slide rail, can fix the position of fly leaf through rotatory fastening button, examine the rotatory position that the limiting plate of test table edge and the joint of spring board can be convenient for adjust the semiconductor, can carry out the altitude mixture detection of many positions through setting up the fly leaf and examining test table, thereby compare, increase the accuracy of altitude mixture detection.
2. Through setting up the laser lamp, detect one side of response contact and seted up the recess, the inside fixedly connected with laser lamp of recess can shine the light spot on the semiconductor through the laser lamp during use and come the quick determination survey position, reaches the purpose of quick contrast height finding, has improved work efficiency.
Drawings
Fig. 1 is a schematic perspective view of the present invention;
fig. 2 is a schematic view of the structure of the present invention;
FIG. 3 is an enlarged schematic view of the structure at A in FIG. 1 according to the present invention;
fig. 4 is a schematic structural view of the laser lamp of the present invention.
In the figure: the detection device comprises a base plate 1, a movable groove 2, a horizontal fine adjustment screw 3, a sliding rail 4, a movable plate 5, a movable plate sliding groove 6, a movable plate sliding groove 7, an adjusting groove 8, a movable plate sliding block 8, a screw rod 9, a fastening button 10, a horizontal bubble 11, a horizontal bubble 12, a placing groove 13, a detection table 14, a limiting plate 14, a spring plate 15, a height detector 16, a detection induction contact 17, a groove 18 and a laser lamp 19.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments.
Referring to fig. 1 to 4, the present invention provides a technical solution: the detecting device comprises a bottom plate 1, a movable groove 2 is formed in one side of the bottom plate 1, a horizontal fine-tuning screw 3 is fixedly connected to the bottom of the bottom plate 1, the horizontal fine-tuning screw 3 has the same principle with a horizontal fine-tuning screw of a total station, a slide rail 4 is fixedly connected to the inside of the movable groove 2, a movable plate 5 is movably connected to the inside of the movable groove 2, a movable plate slide groove 6 is formed in one side of the movable plate 5, the movable plate 5 is movably connected with the slide rail 4 through the movable plate slide groove 6, an adjusting groove 7 is formed in one side of the bottom plate 1 close to the movable groove 2, a movable plate slide block 8 is fixedly connected to one side of the movable plate 5, the movable plate slide block 8 is movably connected to the inside of the adjusting groove 7, a screw rod 9 is fixedly connected to one side of the movable plate slide block 8, a fastening button 10 is connected to the outer, the position of the movable plate 5 can be fixed by rotating the fastening button 10, the clamping connection of the limiting plate 14 at the edge of the detection table 13 and the spring plate 15 can facilitate the adjustment of the rotation direction of the semiconductor, the multi-point height detection can be performed by setting the movable plate 5 and the detection table 13, so as to perform comparison and increase the accuracy of the height detection, the horizontal bubble 11 is fixedly connected at the top of the movable plate 5, the placing groove 12 is formed at the top of the movable plate 5, the bearing is fixedly connected inside the placing groove 12, the rotating shaft is fixedly connected inside the bearing, the detection table 13 is fixedly connected at the top of the rotating shaft, a plurality of limiting plates 14 are fixedly connected at the edge of the detection table 13, the spring plate 15 is fixedly connected at one side of the movable plate 5 close to the placing groove 12, the height detector 16 is fixedly connected at one side of the bottom plate 1 close, height detection appearance 16 is current well-known technique, the utility model discloses not improve its theory of operation, consequently do not describe its inner structure in detail, detect one side of induction contact 17 and seted up recess 18, the theory of operation that detects induction contact 17 and height detection appearance 16 does not change, the normal work that detects induction contact 17 can not be influenced in the setting of recess 18, the inside fixedly connected with laser lamp 19 of recess 18, can shine the light spot on the semiconductor through laser lamp 19 during the use and come the quick confirmation measurement position, reach the purpose of quick contrast height finding, increase work efficiency, the power of laser lamp 19 is the battery from the area.
As an optimal technical solution of the utility model: the quantity of horizontal fine setting screw 3 is four, four horizontal fine setting screws 3 are located the four corners department of bottom plate 1 bottom respectively, the quantity of slide rail 4 is two, two slide rail 4 evenly distributed are in the same one side of activity groove 2, activity plate 5 and activity groove 2 looks adaptation, slide rail 4 and activity plate spout 6 looks adaptation, the quantity of fastening button 10 is two, two fastening buttons 10 are located the left and right sides of bottom plate 1 respectively, standing groove 12 is located the center department at activity plate 5 top, it is circular to detect platform 13, the diameter of detecting platform 13 is less than the diameter of standing groove 12, recess 18 is located the center department that detects inductive contact 17.
When the user uses, place the semiconductor on examining test table 13 earlier, then can change the contact point that detects induction contact 17 and semiconductor through adjusting the position of fly leaf 5 on slide rail 4, the position of fly leaf 5 can be fixed through rotatory fastening button 10, examine the limiting plate 14 of test table 13 edge and the rotatory position of adjusting the semiconductor of can being convenient for of spring plate 15's joint, can carry out the height detection of multiple positions through setting up fly leaf 5 and examining test table 13, can shine the light spot on the semiconductor through laser lamp 19 during the use and come the quick determination measurement position, reach the purpose of quick contrast height finding.
In summary, when the semiconductor height detecting device is used, the movable plate 5 is movably connected inside the movable groove 2 by arranging the movable plate 5 and the detecting table 13, the detecting table 13 is fixedly connected on the top of the rotating shaft, when the semiconductor height detecting device is used, the semiconductor is firstly placed on the detecting table 13, then the contact point of the detecting induction contact 17 and the semiconductor can be changed by adjusting the position of the movable plate 5 on the sliding rail 4, the position of the movable plate 5 can be fixed by rotating the fastening button 10, the rotation direction of the semiconductor can be conveniently adjusted by clamping the limiting plate 14 at the edge of the detecting table 13 and the spring plate 15, the multi-point height detection can be performed by arranging the movable plate 5 and the detecting table 13, so as to perform comparison and increase the accuracy of the height detection, the groove 18 is formed at one side of the detecting induction contact 17 by arranging the laser lamp 19, the laser lamp 19 is, when the laser height measuring device is used, the measuring point position can be quickly confirmed through the light spot irradiated on the semiconductor by the laser lamp 19, the purpose of quickly contrasting and measuring the height is achieved, and the working efficiency is improved.
The above, only be the concrete implementation of the preferred embodiment of the present invention, but the protection scope of the present invention is not limited thereto, and any person skilled in the art is in the technical scope of the present invention, according to the technical solution of the present invention and the utility model, the concept of which is equivalent to replace or change, should be covered within the protection scope of the present invention.
Claims (7)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921076262.0U CN210221036U (en) | 2019-07-10 | 2019-07-10 | A semiconductor height detection device |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921076262.0U CN210221036U (en) | 2019-07-10 | 2019-07-10 | A semiconductor height detection device |
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| CN210221036U true CN210221036U (en) | 2020-03-31 |
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| CN201921076262.0U Active CN210221036U (en) | 2019-07-10 | 2019-07-10 | A semiconductor height detection device |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112123665A (en) * | 2020-09-16 | 2020-12-25 | 嵊州润雅电子科技有限公司 | Blank die-casting device with preheat and detect function |
| CN112304257A (en) * | 2020-11-03 | 2021-02-02 | 泰州铸鼎新材料制造有限公司 | New material production and processing is with horizontal testing platform |
| CN116592818A (en) * | 2023-07-17 | 2023-08-15 | 南通强生光电科技有限公司 | Photovoltaic panel thickness measuring device for photovoltaic power generation |
-
2019
- 2019-07-10 CN CN201921076262.0U patent/CN210221036U/en active Active
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112123665A (en) * | 2020-09-16 | 2020-12-25 | 嵊州润雅电子科技有限公司 | Blank die-casting device with preheat and detect function |
| CN112304257A (en) * | 2020-11-03 | 2021-02-02 | 泰州铸鼎新材料制造有限公司 | New material production and processing is with horizontal testing platform |
| CN116592818A (en) * | 2023-07-17 | 2023-08-15 | 南通强生光电科技有限公司 | Photovoltaic panel thickness measuring device for photovoltaic power generation |
| CN116592818B (en) * | 2023-07-17 | 2023-10-03 | 南通强生光电科技有限公司 | Photovoltaic panel thickness measuring device for photovoltaic power generation |
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