CN210221036U - Semiconductor height detection equipment - Google Patents

Semiconductor height detection equipment Download PDF

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Publication number
CN210221036U
CN210221036U CN201921076262.0U CN201921076262U CN210221036U CN 210221036 U CN210221036 U CN 210221036U CN 201921076262 U CN201921076262 U CN 201921076262U CN 210221036 U CN210221036 U CN 210221036U
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China
Prior art keywords
groove
plate
semiconductor
movable plate
movable
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CN201921076262.0U
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Chinese (zh)
Inventor
Haitao Liao
廖海涛
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Jiangsu Yiwen Microelectronics Technology Co Ltd
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Jiangsu Yiwen Microelectronics Technology Co Ltd
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Priority to CN201921076262.0U priority Critical patent/CN210221036U/en
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Abstract

The utility model relates to a semiconductor detects technical field, specifically is a semiconductor height detection equipment, comprising a base plate, the activity groove has been seted up to one side of bottom plate, the horizontal fine setting screw of bottom fixedly connected with of bottom plate, the inside fixedly connected with slide rail in activity groove, the inside swing joint in activity groove has the fly leaf. This semiconductor height detection equipment, place the semiconductor earlier on examining test table during the use, then can change the contact point that detects induction contact and semiconductor through adjusting the position of fly leaf on the slide rail, the position of fly leaf can be fixed through rotatory fastening button, examine the limiting plate of test table edge and the rotatory position of adjusting the semiconductor of can being convenient for of the joint of spring board, can carry out the height detection of multiple positions through setting up the fly leaf and examining test table, increase the accuracy of height detection, can shine the light spot on the semiconductor through the laser lamp during use and come the quick confirmation measuring position, reach the purpose of quick contrast height finding.

Description

Semiconductor height detection equipment
Technical Field
The utility model relates to a semiconductor detects technical field, specifically is a semiconductor height detection equipment.
Background
Semiconductor parts are increasingly applied to various industries and fields, and accordingly high requirements and standards for precision of the semiconductor parts are met, and in the precision parts, the precision of semiconductors influences the use performance of the precision parts; the conventional semiconductor component detection multipurpose height measuring instrument mainly detects height, depth, flatness and the like, but in the detection process, because the structure of a component is complicated or the detection and the positioning are not easy, one reference surface needs to be selected for detecting a plurality of point positions, and the position of the semiconductor component is frequently adjusted and changed, so that the reference surface positioning has accumulated errors to cause measurement misalignment, and therefore, a semiconductor height detection device is urgently needed to be provided.
SUMMERY OF THE UTILITY MODEL
Technical problem to be solved
The utility model provides a semiconductor height detection equipment, through setting up the fly leaf and examining test table, the problem of proposing among the above-mentioned background art has been solved to the not enough of prior art.
(II) technical scheme
In order to achieve the above purpose, the utility model discloses a following technical scheme realizes: a semiconductor height detection device comprises a bottom plate, wherein a movable groove is formed in one side of the bottom plate, a horizontal fine adjustment screw is fixedly connected to the bottom of the bottom plate, a slide rail is fixedly connected to the inside of the movable groove, a movable plate is movably connected to the inside of the movable groove, a movable plate sliding groove is formed in one side of the movable plate, the movable plate is movably connected with the slide rail through the movable plate sliding groove, an adjusting groove is formed in one side, close to the movable groove, of the bottom plate, a movable plate sliding block is fixedly connected to one side of the movable plate, the movable plate sliding block is movably connected to the inside of the adjusting groove, a screw rod is fixedly connected to one side of the movable plate sliding block, a fastening button is connected to the outer surface of the screw rod through threads, a horizontal bubble is fixedly connected, the inside fixedly connected with pivot of bearing, the top fixedly connected with of pivot examines test table, the edge fixedly connected with a plurality of limiting plate of examining test table, one side fixedly connected with spring plate that the fly leaf is close to the standing groove, one side fixedly connected with height detection appearance that the bottom plate is close to the movable groove, one side of height detection appearance is provided with detects the response contact, it sets up flutedly to detect one side of response contact, the inside fixedly connected with laser lamp of recess.
Optionally, the number of the horizontal fine-tuning screws is four, and the four horizontal fine-tuning screws are respectively located at four corners of the bottom plate.
Optionally, the number of the slide rails is two, and the two slide rails are uniformly distributed on the same side of the movable groove.
Optionally, the movable plate is matched with the movable groove, and the slide rail is matched with the movable plate slide groove.
Optionally, the number of the fastening buttons is two, and the two fastening buttons are respectively located on the left side and the right side of the bottom plate.
Optionally, the placing groove is located at the center of the top of the movable plate, the detection platform is circular, and the diameter of the detection platform is smaller than that of the placing groove.
Optionally, the recess is located at the center of the sensing feeler.
(III) advantageous effects
The utility model provides a semiconductor height detection equipment possesses following beneficial effect:
1. through setting up the fly leaf and examining test table, the inside swing joint in activity groove has the fly leaf, the top fixedly connected with of pivot examines test table, place the semiconductor earlier on examining test table during the use, then can change the contact point that detects response contact and semiconductor through adjusting the position of fly leaf on the slide rail, can fix the position of fly leaf through rotatory fastening button, examine the rotatory position that the limiting plate of test table edge and the joint of spring board can be convenient for adjust the semiconductor, can carry out the altitude mixture detection of many positions through setting up the fly leaf and examining test table, thereby compare, increase the accuracy of altitude mixture detection.
2. Through setting up the laser lamp, detect one side of response contact and seted up the recess, the inside fixedly connected with laser lamp of recess can shine the light spot on the semiconductor through the laser lamp during use and come the quick determination survey position, reaches the purpose of quick contrast height finding, has improved work efficiency.
Drawings
Fig. 1 is a schematic perspective view of the present invention;
fig. 2 is a schematic view of the structure of the present invention;
FIG. 3 is an enlarged schematic view of the structure at A in FIG. 1 according to the present invention;
fig. 4 is a schematic structural view of the laser lamp of the present invention.
In the figure: the detection device comprises a base plate 1, a movable groove 2, a horizontal fine adjustment screw 3, a sliding rail 4, a movable plate 5, a movable plate sliding groove 6, a movable plate sliding groove 7, an adjusting groove 8, a movable plate sliding block 8, a screw rod 9, a fastening button 10, a horizontal bubble 11, a horizontal bubble 12, a placing groove 13, a detection table 14, a limiting plate 14, a spring plate 15, a height detector 16, a detection induction contact 17, a groove 18 and a laser lamp 19.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments.
Referring to fig. 1 to 4, the present invention provides a technical solution: the detecting device comprises a bottom plate 1, a movable groove 2 is formed in one side of the bottom plate 1, a horizontal fine-tuning screw 3 is fixedly connected to the bottom of the bottom plate 1, the horizontal fine-tuning screw 3 has the same principle with a horizontal fine-tuning screw of a total station, a slide rail 4 is fixedly connected to the inside of the movable groove 2, a movable plate 5 is movably connected to the inside of the movable groove 2, a movable plate slide groove 6 is formed in one side of the movable plate 5, the movable plate 5 is movably connected with the slide rail 4 through the movable plate slide groove 6, an adjusting groove 7 is formed in one side of the bottom plate 1 close to the movable groove 2, a movable plate slide block 8 is fixedly connected to one side of the movable plate 5, the movable plate slide block 8 is movably connected to the inside of the adjusting groove 7, a screw rod 9 is fixedly connected to one side of the movable plate slide block 8, a fastening button 10 is connected to the outer, the position of the movable plate 5 can be fixed by rotating the fastening button 10, the clamping connection of the limiting plate 14 at the edge of the detection table 13 and the spring plate 15 can facilitate the adjustment of the rotation direction of the semiconductor, the multi-point height detection can be performed by setting the movable plate 5 and the detection table 13, so as to perform comparison and increase the accuracy of the height detection, the horizontal bubble 11 is fixedly connected at the top of the movable plate 5, the placing groove 12 is formed at the top of the movable plate 5, the bearing is fixedly connected inside the placing groove 12, the rotating shaft is fixedly connected inside the bearing, the detection table 13 is fixedly connected at the top of the rotating shaft, a plurality of limiting plates 14 are fixedly connected at the edge of the detection table 13, the spring plate 15 is fixedly connected at one side of the movable plate 5 close to the placing groove 12, the height detector 16 is fixedly connected at one side of the bottom plate 1 close, height detection appearance 16 is current well-known technique, the utility model discloses not improve its theory of operation, consequently do not describe its inner structure in detail, detect one side of induction contact 17 and seted up recess 18, the theory of operation that detects induction contact 17 and height detection appearance 16 does not change, the normal work that detects induction contact 17 can not be influenced in the setting of recess 18, the inside fixedly connected with laser lamp 19 of recess 18, can shine the light spot on the semiconductor through laser lamp 19 during the use and come the quick confirmation measurement position, reach the purpose of quick contrast height finding, increase work efficiency, the power of laser lamp 19 is the battery from the area.
As an optimal technical solution of the utility model: the quantity of horizontal fine setting screw 3 is four, four horizontal fine setting screws 3 are located the four corners department of bottom plate 1 bottom respectively, the quantity of slide rail 4 is two, two slide rail 4 evenly distributed are in the same one side of activity groove 2, activity plate 5 and activity groove 2 looks adaptation, slide rail 4 and activity plate spout 6 looks adaptation, the quantity of fastening button 10 is two, two fastening buttons 10 are located the left and right sides of bottom plate 1 respectively, standing groove 12 is located the center department at activity plate 5 top, it is circular to detect platform 13, the diameter of detecting platform 13 is less than the diameter of standing groove 12, recess 18 is located the center department that detects inductive contact 17.
When the user uses, place the semiconductor on examining test table 13 earlier, then can change the contact point that detects induction contact 17 and semiconductor through adjusting the position of fly leaf 5 on slide rail 4, the position of fly leaf 5 can be fixed through rotatory fastening button 10, examine the limiting plate 14 of test table 13 edge and the rotatory position of adjusting the semiconductor of can being convenient for of spring plate 15's joint, can carry out the height detection of multiple positions through setting up fly leaf 5 and examining test table 13, can shine the light spot on the semiconductor through laser lamp 19 during the use and come the quick determination measurement position, reach the purpose of quick contrast height finding.
In summary, when the semiconductor height detecting device is used, the movable plate 5 is movably connected inside the movable groove 2 by arranging the movable plate 5 and the detecting table 13, the detecting table 13 is fixedly connected on the top of the rotating shaft, when the semiconductor height detecting device is used, the semiconductor is firstly placed on the detecting table 13, then the contact point of the detecting induction contact 17 and the semiconductor can be changed by adjusting the position of the movable plate 5 on the sliding rail 4, the position of the movable plate 5 can be fixed by rotating the fastening button 10, the rotation direction of the semiconductor can be conveniently adjusted by clamping the limiting plate 14 at the edge of the detecting table 13 and the spring plate 15, the multi-point height detection can be performed by arranging the movable plate 5 and the detecting table 13, so as to perform comparison and increase the accuracy of the height detection, the groove 18 is formed at one side of the detecting induction contact 17 by arranging the laser lamp 19, the laser lamp 19 is, when the laser height measuring device is used, the measuring point position can be quickly confirmed through the light spot irradiated on the semiconductor by the laser lamp 19, the purpose of quickly contrasting and measuring the height is achieved, and the working efficiency is improved.
The above, only be the concrete implementation of the preferred embodiment of the present invention, but the protection scope of the present invention is not limited thereto, and any person skilled in the art is in the technical scope of the present invention, according to the technical solution of the present invention and the utility model, the concept of which is equivalent to replace or change, should be covered within the protection scope of the present invention.

Claims (7)

1. A semiconductor height detecting apparatus, characterized in that: comprises a bottom plate (1), a movable groove (2) is arranged on one side of the bottom plate (1), a horizontal fine adjustment screw (3) is fixedly connected to the bottom of the bottom plate (1), a slide rail (4) is fixedly connected to the inside of the movable groove (2), a movable plate (5) is movably connected to the inside of the movable groove (2), a movable plate slide groove (6) is arranged on one side of the movable plate (5), the movable plate (5) is movably connected with the slide rail (4) through the movable plate slide groove (6), an adjusting groove (7) is arranged on one side of the bottom plate (1) close to the movable groove (2), a movable plate slide block (8) is fixedly connected to one side of the movable plate (5), the movable plate slide block (8) is movably connected to the inside of the adjusting groove (7), a screw rod (9) is fixedly connected to one side of the movable plate slide block (8), and a fastening button (, the top of the movable plate (5) is fixedly connected with a horizontal bubble (11), the top of the movable plate (5) is provided with a placing groove (12), the inside of the placing groove (12) is fixedly connected with a bearing, the inside of the bearing is fixedly connected with a rotating shaft, the top of the rotating shaft is fixedly connected with a detection table (13), the edge of the detection table (13) is fixedly connected with a plurality of limiting plates (14), one side of the movable plate (5) close to the placing groove (12) is fixedly connected with a spring plate (15), a height detector (16) is fixedly connected with one side of the bottom plate (1) close to the movable groove (2), a detection induction contact (17) is arranged on one side of the height detector (16), one side of the detection induction contact (17) is provided with a groove (18), and a laser lamp (19) is fixedly connected inside the groove (18).
2. A semiconductor level detecting apparatus according to claim 1, wherein: the number of the horizontal fine adjustment screws (3) is four, and the four horizontal fine adjustment screws (3) are respectively positioned at four corners of the bottom plate (1).
3. A semiconductor level detecting apparatus according to claim 1, wherein: the number of the slide rails (4) is two, and the two slide rails (4) are uniformly distributed on the same side of the movable groove (2).
4. A semiconductor level detecting apparatus according to claim 1, wherein: the movable plate (5) is matched with the movable groove (2), and the sliding rail (4) is matched with the movable plate sliding groove (6).
5. A semiconductor level detecting apparatus according to claim 1, wherein: the number of the fastening buttons (10) is two, and the two fastening buttons (10) are respectively positioned on the left side and the right side of the bottom plate (1).
6. A semiconductor level detecting apparatus according to claim 1, wherein: the placing groove (12) is located in the center of the top of the movable plate (5), the detection platform (13) is circular, and the diameter of the detection platform (13) is smaller than that of the placing groove (12).
7. A semiconductor level detecting apparatus according to claim 1, wherein: the groove (18) is located at the center of the detection induction contact (17).
CN201921076262.0U 2019-07-10 2019-07-10 Semiconductor height detection equipment Active CN210221036U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201921076262.0U CN210221036U (en) 2019-07-10 2019-07-10 Semiconductor height detection equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201921076262.0U CN210221036U (en) 2019-07-10 2019-07-10 Semiconductor height detection equipment

Publications (1)

Publication Number Publication Date
CN210221036U true CN210221036U (en) 2020-03-31

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ID=69936976

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201921076262.0U Active CN210221036U (en) 2019-07-10 2019-07-10 Semiconductor height detection equipment

Country Status (1)

Country Link
CN (1) CN210221036U (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112123665A (en) * 2020-09-16 2020-12-25 嵊州润雅电子科技有限公司 Blank die-casting device with preheat and detect function
CN112304257A (en) * 2020-11-03 2021-02-02 泰州铸鼎新材料制造有限公司 New material production and processing is with horizontal testing platform

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112123665A (en) * 2020-09-16 2020-12-25 嵊州润雅电子科技有限公司 Blank die-casting device with preheat and detect function
CN112304257A (en) * 2020-11-03 2021-02-02 泰州铸鼎新材料制造有限公司 New material production and processing is with horizontal testing platform

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