CN210040135U - Solar cell system - Google Patents
Solar cell system Download PDFInfo
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- CN210040135U CN210040135U CN201921272363.5U CN201921272363U CN210040135U CN 210040135 U CN210040135 U CN 210040135U CN 201921272363 U CN201921272363 U CN 201921272363U CN 210040135 U CN210040135 U CN 210040135U
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- electrodes
- solar cell
- cell system
- electrode
- conductive adhesive
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- 238000012360 testing method Methods 0.000 claims abstract description 45
- 239000000853 adhesive Substances 0.000 claims abstract description 17
- 230000001070 adhesive effect Effects 0.000 claims abstract description 17
- 239000000758 substrate Substances 0.000 claims description 14
- 239000000523 sample Substances 0.000 claims description 9
- 229910052709 silver Inorganic materials 0.000 claims description 7
- 239000004332 silver Substances 0.000 claims description 7
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 3
- 229910052710 silicon Inorganic materials 0.000 claims description 3
- 239000010703 silicon Substances 0.000 claims description 3
- 238000000034 method Methods 0.000 abstract description 9
- 230000008569 process Effects 0.000 abstract description 3
- 239000010410 layer Substances 0.000 description 12
- 238000002161 passivation Methods 0.000 description 8
- 239000011347 resin Substances 0.000 description 7
- 229920005989 resin Polymers 0.000 description 7
- 238000010998 test method Methods 0.000 description 5
- 238000004519 manufacturing process Methods 0.000 description 4
- 238000004021 metal welding Methods 0.000 description 4
- 230000003647 oxidation Effects 0.000 description 3
- 238000007254 oxidation reaction Methods 0.000 description 3
- GQPLMRYTRLFLPF-UHFFFAOYSA-N Nitrous Oxide Chemical compound [O-][N+]#N GQPLMRYTRLFLPF-UHFFFAOYSA-N 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 230000002457 bidirectional effect Effects 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 238000000151 deposition Methods 0.000 description 2
- 229920001971 elastomer Polymers 0.000 description 2
- 239000000806 elastomer Substances 0.000 description 2
- 230000007613 environmental effect Effects 0.000 description 2
- 239000003292 glue Substances 0.000 description 2
- VNWKTOKETHGBQD-UHFFFAOYSA-N methane Chemical compound C VNWKTOKETHGBQD-UHFFFAOYSA-N 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 2
- XHXFXVLFKHQFAL-UHFFFAOYSA-N phosphoryl trichloride Chemical compound ClP(Cl)(Cl)=O XHXFXVLFKHQFAL-UHFFFAOYSA-N 0.000 description 2
- GRYLNZFGIOXLOG-UHFFFAOYSA-N Nitric acid Chemical compound O[N+]([O-])=O GRYLNZFGIOXLOG-UHFFFAOYSA-N 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- 238000000137 annealing Methods 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 239000003245 coal Substances 0.000 description 1
- 230000002860 competitive effect Effects 0.000 description 1
- 239000000306 component Substances 0.000 description 1
- 238000002508 contact lithography Methods 0.000 description 1
- 239000008358 core component Substances 0.000 description 1
- 229910021419 crystalline silicon Inorganic materials 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 238000013100 final test Methods 0.000 description 1
- 239000005431 greenhouse gas Substances 0.000 description 1
- 230000000670 limiting effect Effects 0.000 description 1
- 238000001465 metallisation Methods 0.000 description 1
- 239000003345 natural gas Substances 0.000 description 1
- 229910017604 nitric acid Inorganic materials 0.000 description 1
- 235000013842 nitrous oxide Nutrition 0.000 description 1
- 239000003921 oil Substances 0.000 description 1
- 238000006385 ozonation reaction Methods 0.000 description 1
- 230000036961 partial effect Effects 0.000 description 1
- 238000001020 plasma etching Methods 0.000 description 1
- 238000000623 plasma-assisted chemical vapour deposition Methods 0.000 description 1
- 238000010248 power generation Methods 0.000 description 1
- 239000011241 protective layer Substances 0.000 description 1
- 238000013341 scale-up Methods 0.000 description 1
- 235000012239 silicon dioxide Nutrition 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- 238000005245 sintering Methods 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 239000013077 target material Substances 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
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Abstract
The utility model relates to a solar wafer system. The solar cell piece system comprises a base piece, wherein a plurality of electrodes are printed on the surface of the base piece, the electrodes are in a strip shape and extend along a first direction on the surface of the base piece, the interval between any two adjacent pairs of electrodes is different from the interval between the other two adjacent pairs of electrodes, conductive adhesive is further applied to the surface of the base piece, the conductive adhesive is also in a strip shape and extends along a second direction perpendicular to the first direction on the surface of the base piece so as to cross over the electrodes, and the conductive adhesive is used for connecting the electrodes. The solar cell system of the utility model can be used for testing the resistance value of the conductive adhesive, and compared with the existing testing method, the testing result is more accurate and the process is more efficient; and, the utility model discloses can also provide more possibilities of testing multiple type resistance value. And the more accurate, more efficient and more comprehensive resistance test has important significance for technical innovation in the photovoltaic industry.
Description
Technical Field
The utility model relates to an energy field especially relates to a solar wafer system.
Background
With the increasing consumption of conventional fossil energy such as global coal, oil, natural gas and the like, the ecological environment is continuously deteriorated, and particularly, the sustainable development of the human society is seriously threatened due to the increasingly severe global climate change caused by the emission of greenhouse gases. Various countries in the world make respective energy development strategies to deal with the limitation of conventional fossil energy resources and the environmental problems caused by development and utilization. Solar energy has become one of the most important renewable energy sources by virtue of the characteristics of reliability, safety, universality, long service life, environmental protection and resource sufficiency, and is expected to become a main pillar of global power supply in the future.
In a new energy revolution process, the photovoltaic industry in China has grown into a strategic emerging industry with international competitive advantages. However, the development of the photovoltaic industry still faces many problems and challenges, and the conversion efficiency and reliability are the biggest technical obstacles restricting the development of the photovoltaic industry, while the cost control and the scale-up are economically restricted. The photovoltaic module is taken as a core component of photovoltaic power generation, and the development of high-efficiency modules by improving the conversion efficiency of the photovoltaic module is a necessary trend. Various high efficiency modules, such as shingles, half-sheets, multi-master grids, double-sided modules, etc., are currently emerging on the market. With the application places and application areas of the photovoltaic module becoming more and more extensive, the reliability requirement of the photovoltaic module becomes higher and higher, and particularly, the photovoltaic module with high efficiency and high reliability needs to be adopted in some severe or extreme weather frequent areas.
Under the background of vigorous popularization and use of green solar energy, the shingled assembly utilizes the electrical principle of low current and low loss (the power loss of the photovoltaic assembly is in direct proportion to the square of working current) so as to greatly reduce the power loss of the assembly. And secondly, the inter-cell distance region in the cell module is fully utilized to generate electricity, so that the energy density in unit area is high. In addition, the conductive adhesive with the elastomer characteristic is used for replacing a photovoltaic metal welding strip for a conventional assembly, the photovoltaic metal welding strip shows higher series resistance in the whole battery, and the stroke of a current loop of the conductive adhesive is far smaller than that of a welding strip, so that the laminated assembly becomes a high-efficiency assembly, and meanwhile, the outdoor application reliability is more excellent than that of the conventional photovoltaic assembly, and the laminated assembly avoids stress damage of the metal welding strip to the interconnection position of the battery and other confluence areas. Especially, under the dynamic (load action of natural world such as wind, snow and the like) environment with alternating high and low temperatures, the failure probability of the conventional assembly which is interconnected and packaged by adopting the metal welding strips is far higher than that of the laminated assembly which is interconnected and cut by adopting the conductive adhesive of the elastomer and packaged by the crystalline silicon battery small pieces.
However, there is no relevant standard or effective testing method for testing the resistance of the conductive adhesive of the solar cell system in the industry at present, for example, the current commonly used testing method is to contact the probes with two conductive adhesives separated by a certain distance to obtain the final result, but the accuracy of the testing result is low. In addition, in the conventional test method, only a single resistance test result can be obtained by directly reading the reading of the tester, and other types of resistance values which cannot be directly measured by the tester cannot be obtained.
It is therefore desirable to provide a solar cell system that at least partially solves the above problems.
SUMMERY OF THE UTILITY MODEL
An object of the utility model is to provide a solar wafer system to can test all kinds of resistance values of solar wafer system's conducting resin department, and the test result is compared in current test method more accurate, more high-efficient. And more accurate and efficient test of the resistance has important significance for technical innovation in the aspects of reducing energy loss and improving energy efficiency in the photovoltaic industry.
According to an aspect of the present invention, there is provided a solar cell sheet system, the solar cell sheet system includes a base sheet, a plurality of electrodes are printed on a surface of the base sheet, the electrodes are in a bar shape and extend along a first direction on the surface of the base sheet, and any one pair of adjacent two intervals between the electrodes are different from another pair of adjacent two intervals between the electrodes, the base sheet is further applied with a conductive adhesive on the surface, the conductive adhesive is also in a bar shape and extends along a perpendicular to a second direction of the first direction on the surface of the base sheet so as to span across the plurality of electrodes.
In one embodiment, the second direction is a unidirectional direction, and the plurality of electrodes are arranged such that distances between two adjacent electrodes in the second direction increase in sequence.
In one embodiment, a test point structure for contacting a probe is arranged on the electrode at a position contacting with the conductive adhesive.
In one embodiment, the upper surface of the base sheet is provided with a recess for receiving the electrode and opening upwardly, the electrode being printed fittingly in the recess such that the upper surface of the electrode is flush with the upper surface of the base sheet.
In one embodiment, the upper surface of the base sheet is a flat surface, and the electrodes are printed on the upper surface so as to protrude upward from the base sheet.
In one embodiment, the base substrate comprises a silicon base substrate.
In one embodiment, the electrode is front silver or back silver.
According to the utility model discloses, will the utility model discloses a solar wafer system can be with probe direct contact printing conducting resin's electrode when testing the resistance of conducting resin department as the test base member, and such test makes the final resistance value that can comparatively be close to reality of the result that finally reachs (for example calculate the final result that obtains to the test result). And, the utility model discloses can also provide more possibilities of testing polytype resistance value, can compensate current technical blank to a certain extent. The more efficient, comprehensive and accurate test has important significance for the technical innovation in the aspects of reducing energy loss, improving energy efficiency and the like in the industry.
Drawings
For a better understanding of the above and other objects, features, advantages and functions of the present invention, reference should be made to the preferred embodiments illustrated in the accompanying drawings. Like reference numerals in the drawings refer to like parts. It will be appreciated by persons skilled in the art that the drawings are intended to illustrate preferred embodiments of the invention without any limiting effect on the scope of the invention, and that the various components in the drawings are not to scale.
Fig. 1 shows a schematic top view of a solar cell system according to a preferred embodiment of the present invention;
fig. 2 is a front cross-sectional view of the solar cell system in this embodiment;
FIG. 3 is an elevational cross-sectional schematic view of another alternative embodiment of the solar cell system of FIG. 2;
fig. 4 is a partial schematic diagram of the test method in this embodiment.
Detailed Description
Referring now to the drawings, specific embodiments of the present invention will be described in detail. What has been described herein is merely a preferred embodiment in accordance with the present invention, and those skilled in the art will appreciate that other ways of implementing the present invention on the basis of the preferred embodiment will also fall within the scope of the present invention.
In a preferred embodiment of the present invention, a solar cell system is provided.
As shown in fig. 1 and 2, the solar cell sheet system of the present embodiment includes a base sheet 3, and the base sheet 3 is preferably made of silicon. The surface of the base sheet 3 is printed with a plurality of electrodes 1, and the electrodes 1 are preferably made of silver to form front silver or back silver on the base sheet 3. Each of the electrodes 1 is formed in a strip shape and extends in the first direction D1 on a surface (e.g., an upper surface in the present embodiment) of the base sheet 3. All electrodes 1 have substantially equal width (i.e. W)1) And are sequentially arranged at intervals along a second direction D2 perpendicular to the first direction D1The width W1Refers to the dimension of the electrode 1 in the second direction D2.
Referring to fig. 2, a conductive paste 2 formed in a bar shape and extending in the second direction D2 to span over the respective electrodes 1 for connecting the respective electrodes 1 is further applied to the battery sheet. Referring to fig. 1, it can be seen that the width of the conductive paste 2 is W2The width W2Is the size of the conductive paste 2 in the first direction D1.
As can be seen from fig. 1, the first direction D1 and the second direction D2 are two directions extending on the upper surface of the base sheet 3 and perpendicular to each other, in other words, the first direction D1 and the second direction D2 together define a plane in which the upper surface of the base sheet 3 lies. Further, for convenience of description, the first direction D1 is set to be a bidirectional direction, as shown by the double-headed arrow in fig. 1; and the second direction D2 is set to be a unidirectional direction as indicated by the single arrow in fig. 1. In addition, a third direction D3 is also defined in the present embodiment, the third direction D3 is perpendicular to the surface defined by the first direction D1 and the second direction D2, and the third direction D3 is also a bidirectional direction, as indicated by the double-headed arrow in fig. 2. It can also be seen from fig. 2 that the electrode 1 has a dimension T in a third direction D31It can be considered as the thickness of the electrode 1; the conductive paste 2 has a dimension T in a third direction D32Which can be considered as the thickness of the conductive glue 2.
Preferably, as shown in fig. 2, a recess for accommodating the electrode 1 and having an upward opening may be provided on the upper surface of the base sheet 3, and the electrode 1 is fittingly printed in the recess so that the upper surface of the electrode 1 is flush with the upper surface of the base sheet 3, in this case, since the conductive paste 2 has an equal thickness T everywhere2And thus the upper surface of the conductive paste 2 is also formed as a flat surface. Also preferably, as an alternative to the embodiment shown in fig. 2, the upper surface of the base sheet 3 may not be provided with grooves, i.e. the upper surface of the base sheet 3 is a flat surface, and the electrodes 1 are printed on the upper surface of the base sheet 3 such that the electrodes 1 protrude upwards from the base sheet 3, since the conductive glue 2 has an equal thickness T everywhere2And thus of the conductive paste 2 covering the electrodes 1A bump is also formed at the position, which is shown in fig. 3.
Preferably, the respective electrodes 1 are arranged at unequal intervals in the second direction D2. Specifically, the respective electrodes 1 are arranged such that the distances between two adjacent electrodes 1 in the second direction D2 increase in order, i.e., L5 > L4 > L3 > L2 > L1.
The arrangement mode enables the solar cell system to be more suitable for being used as a testing base body for conducting resin resistance testing. When the solar cell system of the embodiment is used as a test substrate to perform conducting resin resistance test, the probes of the resistance measuring instrument can be directly abutted against the positions, close to the conducting resin 2, of the two adjacent electrodes 1, and a resistance reading R can be obtainedTThe distance L between the two electrodes 1 in the second direction D2 is measured simultaneously, so as to obtain a set of coordinates. For example, when two probes are brought into contact with the leftmost two adjacent electrodes 1 shown in FIG. 1, respectively, the resistance reading R is takenT1The distance L1 between the two adjacent electrodes 1 was measured and the coordinates (L1, R) were recordedT1). Similarly, other sets of coordinates are measured and recorded: (L2, R)T2)、(L3，RT3)、(L4，RT4)、(L5，RT5)……
Subsequently, according to the TLM test principle, a corresponding resistance reading R is established with the distance L between two adjacent electrodes 1 as the abscissaTThe coordinate values are respectively marked in the coordinate system and all the points are connected in sequence to form a straight line.
Next, on the one hand, the dimension W of the electrode 1 in the first direction D1 is measured, while the slope of the line is calculated or measured and based on the formula
The value of the bulk resistance Rs can be obtained; on the other hand, by finding the intercept 2R of the straight line on the vertical axisCThe contact resistance R can be obtainedCThe value of (c).
It is understood that the test result of the resistance test in this embodiment includes the bulk resistance and the contact resistance at the conductive paste 2. However, in other embodiments, not shown, the final test result of the resistance test performed by using the solar cell system provided by the present invention as the test substrate may include other types of resistors besides the bulk resistor and the contact resistor. However, in the conventional test method, only a single resistance test result can be obtained by directly reading the reading of the tester, and a resistance value which cannot be directly obtained by the test cannot be obtained. Therefore the utility model discloses not only can provide more accurate, more efficient test base member and test method, can also provide more possibilities of testing other all kinds of resistance values, can compensate current technical blank to a certain extent. And more comprehensive testing of various resistors has important significance for technical innovation in the aspects of reducing energy loss and improving energy efficiency in the photovoltaic industry.
Preferably, for more convenient test, the position of the electrode 1 contacting the conductive adhesive 2 is provided with a test point structure for the probe to contact, when testing, the probe can be quickly positioned to the test point and the test result can be obtained more efficiently and accurately. For example, the test site structure may be an indicator marked on the electrode 1, or the test site structure may be a small depression on the surface of the electrode 1 for receiving the tip of a probe.
The embodiment also provides a manufacturing method for manufacturing the solar cell system, which comprises the following steps:
pre-treating the substrate sheet 3; printing electrodes 1 on a base sheet 3 after pretreatment such that the electrodes 1 are strip-shaped and extend in a first direction on a surface of the base sheet 3, and a distance between any two adjacent pairs of the electrodes 1 is different from a distance between another two adjacent pairs of the electrodes 1;
carrying out metallization sintering;
and installing the conductive adhesive 2 and curing.
Further, the step of pre-treating the base sheet 3 may further include the steps of:
texturing the surface of the substrate sheet 3;
manufacturing a PN junction;
etching and removing the PN junction at the edge by adopting plasma etching, and carrying out annealing oxidation;
an inner passivation layer is grown and deposited on the front surface and the back surface of the substrate sheet 3;
growing and depositing a middle passivation layer on the inner passivation layer;
and growing and depositing an outer passivation protection layer on the middle passivation layer.
Preferably, in another embodiment, the PN junction may be optionally not made.
Also preferably, the above steps may be further refined using at least one of the following: the process of manufacturing the PN junction comprises the steps of introducing phosphorus oxychloride to react with the substrate sheet; the inner passivation layer is deposited by a thermal oxidation method or a laughing gas oxidation method or an ozonization method or a nitric acid solution chemical method, and is set as a silicon dioxide film layer; the middle passivation layer is deposited by a PECVD or ALD layer or a PVD layer method by using a solid target material, and is set to be an aluminum oxide film layer or a film layer containing aluminum oxide; and the outer passivation protective layer is deposited by PVD, CVD or ALD method.
The utility model discloses a solar wafer system can regard as the test base member, can make the user obtain accuracy, efficient measuring result when testing each type resistance value of conducting resin department. And more accurate and efficient test of various types of resistors has important significance for technical innovation in the aspects of reducing energy loss and improving energy efficiency in the photovoltaic industry.
The foregoing description of various embodiments of the invention is provided to one of ordinary skill in the relevant art for the purpose of illustration. It is not intended to be exhaustive or to limit the invention to the precise form disclosed. As noted above, various alternatives and modifications of the present invention will be apparent to those skilled in the art of the above teachings. Thus, while some alternative embodiments are specifically described, other embodiments will be apparent to, or relatively easily developed by, those of ordinary skill in the art. The present invention is intended to embrace all such alternatives, modifications and variances of the present invention described herein, as well as other embodiments that fall within the spirit and scope of the present invention as described above.
Reference numerals:
First direction D1
Second direction D2
Third direction D3
Claims (7)
1. A solar cell sheet system comprising a substrate sheet having a plurality of electrodes printed on a surface thereof, the electrodes being in the form of strips extending in a first direction on the surface of the substrate sheet and having a spacing between any pair of adjacent electrodes different from the spacing between another pair of adjacent electrodes, the surface of the substrate sheet further having applied thereto a conductive adhesive in the form of strips extending in a second direction perpendicular to the first direction on the surface of the substrate sheet so as to span over the plurality of electrodes for connecting the respective electrodes together.
2. The solar cell system according to claim 1, wherein the second direction is a unidirectional direction, and the plurality of electrodes are arranged such that intervals between two adjacent electrodes in the second direction increase sequentially.
3. The solar cell system as claimed in claim 1, wherein a test point structure for a probe to contact is provided at a position on the electrode contacting the conductive adhesive.
4. The solar cell system according to claim 1, wherein the upper surface of the base sheet is provided with a recess which is opened upward for accommodating the electrode, and the electrode is fittingly printed in the recess so that the upper surface of the electrode is flush with the upper surface of the base sheet.
5. The solar cell system of claim 1, wherein the upper surface of the base sheet is a flat surface, and the electrodes are printed on the upper surface so as to protrude upward from the base sheet.
6. The solar cell system of claim 1, wherein the base substrate is a silicon base substrate.
7. The solar cell system of claim 1, wherein the electrode is front silver or back silver.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921272363.5U CN210040135U (en) | 2019-08-07 | 2019-08-07 | Solar cell system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921272363.5U CN210040135U (en) | 2019-08-07 | 2019-08-07 | Solar cell system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN210040135U true CN210040135U (en) | 2020-02-07 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201921272363.5U Active CN210040135U (en) | 2019-08-07 | 2019-08-07 | Solar cell system |
Country Status (1)
| Country | Link |
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| CN (1) | CN210040135U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113759176A (en) * | 2020-06-05 | 2021-12-07 | 苏州阿特斯阳光电力科技有限公司 | Method for testing contact resistivity of conductive adhesive and metal electrode |
-
2019
- 2019-08-07 CN CN201921272363.5U patent/CN210040135U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113759176A (en) * | 2020-06-05 | 2021-12-07 | 苏州阿特斯阳光电力科技有限公司 | Method for testing contact resistivity of conductive adhesive and metal electrode |
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| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| EE01 | Entry into force of recordation of patent licensing contract |
Assignee: TONGWEI SOLAR ENERGY (HEFEI) Co.,Ltd. Assignor: CHENGDU YEFAN SCIENCE AND TECHNOLOGY Co.,Ltd. Contract record no.: X2023990000264 Denomination of utility model: Solar cell system Granted publication date: 20200207 License type: Common License Record date: 20230221 |
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| EE01 | Entry into force of recordation of patent licensing contract | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20231206 Address after: 230000 No.888 Changning Avenue, hi tech Zone, Hefei City, Anhui Province Patentee after: TONGWEI SOLAR ENERGY (HEFEI) Co.,Ltd. Address before: No. 505, building 6, Zone D, Tianfu Software Park, No. 599, shijicheng South Road, high tech Zone, Chengdu, Sichuan 610041 Patentee before: CHENGDU YEFAN SCIENCE AND TECHNOLOGY Co.,Ltd. |
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| TR01 | Transfer of patent right |