CN209803278U - Test conveying line and test production line - Google Patents
Test conveying line and test production line Download PDFInfo
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- CN209803278U CN209803278U CN201920011371.8U CN201920011371U CN209803278U CN 209803278 U CN209803278 U CN 209803278U CN 201920011371 U CN201920011371 U CN 201920011371U CN 209803278 U CN209803278 U CN 209803278U
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- 238000012360 testing method Methods 0.000 title claims abstract description 285
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 13
- 238000006073 displacement reaction Methods 0.000 claims description 33
- 238000011990 functional testing Methods 0.000 claims description 32
- 238000006243 chemical reaction Methods 0.000 abstract description 2
- 238000010586 diagram Methods 0.000 description 3
- 230000005540 biological transmission Effects 0.000 description 2
- 230000033001 locomotion Effects 0.000 description 2
- 230000032683 aging Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000007599 discharging Methods 0.000 description 1
- 230000005489 elastic deformation Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000013522 software testing Methods 0.000 description 1
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Abstract
The utility model relates to a test conveying line and a test production line, wherein the test conveying line comprises an annular track and a test base, and a plurality of operation stations are arranged along the annular track; the test base can move along the annular track, the test base switches positions among a plurality of operation stations along the annular track, and the test base is used for supporting a test product; in practical use, the circular track can be arranged according to the positions of the plurality of operation stations, so that the plurality of operation stations can be connected into a loop by the circular track in a limited space. The test base carrying the test product moves to each operation station along the annular track, so that the problem that the manipulator is difficult to realize the conversion of the product among a plurality of operation stations in a narrow space is solved. In the test, the test base is through switching operation station along the circular orbit, so can reduce the dismouting number of times of test product on the test base, improve test speed.
Description
Technical Field
The utility model relates to a PCB test and technical field especially relate to a line is produced in test transfer chain and test.
Background
The test of the PCB mainly comprises a voltage withstanding test, a function test, an aging test and the like. In order to complete these tests, test bases are generally correspondingly disposed in each test device, and the PCB to be tested is correspondingly placed on the test bases in each test device to complete each corresponding test.
Under the condition that the test field is limited, the manipulator is difficult to switch the work station of the PCB among a plurality of test devices.
SUMMERY OF THE UTILITY MODEL
based on this, the utility model discloses lie in overcoming prior art's defect, provide a test transfer chain and test and produce the line, solve the inconvenient problem of manipulator material loading.
A test conveying line comprises an annular rail and a test base, wherein a plurality of operation stations are arranged along the annular rail; the test base can move along the annular rail, the test base switches positions among a plurality of operation stations along the annular rail, and the test base is used for supporting a test product.
In practical use, the annular rail can be arranged according to the positions of the operating stations, so that the operating stations can be connected in series into a loop by the annular rail in a limited space. The test base carrying the test product moves to each operation station along the annular track, so that the problem that the manipulator is difficult to realize the conversion of the product among a plurality of operation stations in a narrow space is solved. In the test, the test base is through switching operation station along the circular orbit, so can reduce the dismouting number of times of test product on the test base, improve test speed.
In one embodiment, the annular track is an annular guide rail, and the test base is provided with a guide groove in sliding fit with the annular guide rail; or still include the support body, the annular track is for seting up the annular guide slot on the support body, the test base is equipped with the guide piece that can follow the annular guide slot and remove, the test base passes through the guide piece and moves along the annular guide slot. When the annular rail is the annular guide rail, the test base can move along the annular guide rail through the annular guide rail and the matching of the guide groove, the guide groove can be arranged to prevent the test base from being separated from the annular guide rail, and the matching reliability of the test base and the annular guide rail is ensured. When the annular guide rail is the annular guide groove arranged on the frame body, the guide piece on the test base is arranged in the annular guide groove, the test base moves along the annular guide groove under the matching of the guide piece and the inner wall of the annular guide groove, and the test base is prevented from being separated from the annular guide groove.
in one embodiment, the test base is provided with a first guide part matched with the inner side of the annular guide rail and a second guide part matched with the outer side of the annular guide rail, and the guide groove is formed between the first guide part and the second guide part, so that the test base is simple in structure and convenient to mount.
In one embodiment, the first guide is a roller; or the second guide member is a roller. The circular orbit is including arc track, and when first guide or second guide were the gyro wheel, the gyro wheel can be better with the cooperation direction of arc track, makes test base can follow the smooth and easy operation of circular guide.
In one embodiment, the endless track is racetrack shaped. The track-shaped annular track has small occupied area and high space utilization rate compared with a circular track.
In one embodiment, the test base is provided in plurality, and the plurality of test bases are arranged along the annular track. The test base has a plurality ofly, and in use, every operation station all has corresponding test base, so can improve the rate of utilization of each operation station, and then improve efficiency of software testing.
In one embodiment, the test base is provided with a plurality of accommodating grooves for accommodating test products. The test base is provided with a plurality of accommodating grooves, so that a plurality of product tests can be carried out simultaneously.
In one embodiment, the test conveying line further comprises a driving wheel, a supporting wheel and a linkage piece, the linkage piece is wound on the driving wheel and the supporting wheel, the driving wheel is used for driving the linkage piece to move around the driving wheel and the supporting wheel, and the linkage piece is connected with the test base and used for drawing the test base to move along the annular track. The motion trail of the linkage part is limited by the driving wheel and the supporting wheel. The driving wheel rotates, the linkage piece moves around the driving wheel and the supporting wheel, and the linkage piece pulls the test base to move along the annular track. The test base is powered by a linkage. During testing, the position of the test base on the annular track can be controlled by controlling the rotation of the driving wheel.
In one embodiment, a displacement compensation structure is arranged between the linkage piece and the test base, and the displacement compensation structure is used for enabling the test base to move along the annular track relative to the linkage piece. A plurality of operation stations are arranged along the annular track, in use, the linkage part firstly moves the test base to the position near the corresponding test station to complete first positioning, and then the positioning mechanism is used for positioning the test base relative to the test equipment. Because the test base can slide along the annular track at a small distance through the displacement compensation structure, the test base can have good alignment precision relative to the test equipment through the station positioning mechanism.
In one embodiment, the displacement compensation structure comprises a traction piece and a traction pin, the traction piece is provided with a displacement compensation hole, the traction pin is arranged in the displacement compensation hole, and the traction pin can move in the displacement compensation hole; one of the traction member and the traction pin is fixedly connected with the linkage member, and the other one of the traction member and the traction pin is fixedly connected with the test base; when the test base moves among the operation stations, the traction pin is abutted against the inner wall of the displacement compensation hole, and the test base moves along the annular track along with the traction piece; when the test base carries out station location, the relative linkage piece of test base passes through towing pin and displacement compensation hole inner wall interval and slides along the circular orbit. When the test base carries out station positioning, the matching of the displacement compensation hole and the traction pin can avoid the influence of rigid connection between the test base and the linkage piece on the station positioning; meanwhile, the insufficient turning radius of the test base during turning can be made up by utilizing the distance between the hole wall of the displacement compensation hole and the traction pin.
The test production line comprises the test conveying line, and the operation station comprises a feeding station, a test station and an unloading station; the automatic loading and unloading device is characterized by further comprising a loading mechanism, a testing device and an unloading mechanism, wherein the loading mechanism corresponds to the loading station, the testing device corresponds to the testing station, and the unloading mechanism corresponds to the unloading station. The loading station, the unloading station and the testing station are arranged along the annular rail, and the testing base moves among the loading station, the testing station and the unloading station along the annular rail to switch positions. The circular track can be set according to the loading station that feed mechanism corresponds, the test station that test equipment corresponds, and the discharge station that discharge mechanism corresponds, so can set up the circular track according to the position of arranging of feed mechanism, test equipment and discharge mechanism, so improved space utilization.
In one embodiment, the test station comprises a pressure-resistant test station and a functional test station, the test equipment comprises pressure test equipment and functional test equipment, the pressure test equipment is arranged corresponding to the pressure-resistant test station, and the functional test equipment corresponds to the functional test equipment.
In one embodiment, the number of the functional test stations is at least two, the number of the functional test devices is at least two, and the functional test devices and the functional test stations are arranged in a one-to-one correspondence manner. When the functional test stations and the functional test equipment corresponding to the functional test stations are added, functional tests of products can be divided into a plurality of parts, and each functional test station only correspondingly tests one part of the functional test stations, so that the test time process of the functional test stations is reduced, the overall test efficiency of a test production line is influenced, and the service efficiency of each operation station is improved.
In one embodiment, the test production line further comprises an NG conveying belt, and the NG conveying belt is arranged corresponding to the discharging mechanism.
Drawings
FIG. 1 is a schematic structural diagram of a test conveyor line according to an embodiment;
FIG. 2 is an enlarged view of a portion A;
FIG. 3 is a schematic structural diagram of a test base according to an embodiment;
Fig. 4 is a schematic structural diagram of a test production line according to an embodiment.
Description of reference numerals: 100. the test device comprises an annular rail, 100a, an annular guide rail, 110, an operation station, 111, a loading station, 112, a test station, 112a, a pressure-resistant test station, 112b, a function test station, 113, an unloading station, 200, a test base, 210, a test tray, 211, a containing groove, 220, a bearing base, 221, a traction pin, 222, a positioning column, 310, a driving wheel, 320, a supporting wheel, 330, a linkage piece, 331, a traction piece, 331a, a displacement compensation hole, 410, a loading mechanism, 420, test equipment, 421, pressure test equipment, 422, function test equipment, 430, an unloading mechanism, 440, an NG conveyer belt, 500, a test line body, 510, a positioning block, 511, a guide groove, 520 and a cylinder.
Detailed Description
In order to facilitate understanding of the present invention, the present invention will be described more fully hereinafter with reference to the accompanying drawings. The preferred embodiments of the present invention are shown in the drawings. The invention may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete.
It will be understood that when an element is referred to as being "secured to" another element, it can be directly on the other element or intervening elements may also be present. When an element is referred to as being "connected" to another element, it can be directly connected to the other element or intervening elements may also be present. In contrast, when an element is referred to as being "directly on" another element, there are no intervening elements present. The terms "vertical," "horizontal," "left," "right," and the like as used herein are for illustrative purposes only and do not represent the only embodiments.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. The terminology used herein in the description of the invention is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. As used herein, the term "and/or" includes any and all combinations of one or more of the associated listed items.
With reference to fig. 1, an embodiment provides a test transport line, which includes an annular rail 100 and a test base 200, wherein a plurality of operation stations 110 are disposed along the annular rail 100; the test base 200 is movable along the endless track 100, and the test base 200 is switched between a plurality of operation stations 110 along the endless track 100, and the test base 200 holds a test product.
In practical use, the endless track 100 may be disposed according to the positions of the plurality of operation stations 110, so that the plurality of operation stations 110 can be looped by the endless track 100 in a limited space. The test base 200 carrying the test product moves along the circular track 100 to each operation station 110, thereby avoiding the problem that the robot is difficult to switch the product among the operation stations 110 in a narrow space. In the test, the test base 200 switches the operation stations 110 along the circular track 100, so that the times of assembling and disassembling the test product on the test base 200 can be reduced, and the test speed is improved.
It should be noted that, in this embodiment, the product is on a PCB.
In this embodiment, the circular track 100 is a circular guide rail 100a, and the test base 200 is provided with a guiding groove (not shown) slidably engaged with the circular guide rail 100 a. The test base 200 can move along the circular guide 100a by the matching of the circular guide 100a and the guide groove, and the arrangement of the guide groove can prevent the test base 200 from separating from the circular guide 100a, thereby ensuring the reliability of the matching of the test base 200 and the circular guide 100 a.
It should be noted that, in other embodiments, the test conveying line further includes a frame body (not shown), the annular rail 100 is an annular guide groove (not shown) opened on the frame body, the test base 200 is provided with a guide member movable along the annular guide groove, and the test base 200 is moved along the annular guide groove by the guide member. The guide member of the test base 200 is installed in the annular guide groove, and the test base 200 is moved along the annular guide groove by the cooperation of the guide member and the inner wall of the annular guide groove, thereby preventing the test base 200 from being separated from the annular guide groove.
Specifically, in an embodiment, the test conveying line further includes a test line body 500, and the annular guide rail 100a or the frame body is disposed on the test line body 500.
In one embodiment, the test base 200 is provided with a first guide (not shown) engaged with the inner side of the circular guide 100a and a second guide engaged with the outer side of the circular guide 100a, and the guide groove is formed between the first guide and the second guide, so that the test base has a simple structure and is convenient to mount.
In one embodiment, the first guide member is a roller; or the second guide member is a roller. The circular rail 100 includes an arc rail, and when the first guide member or the second guide member is a roller, the roller can be well matched with the arc rail for guiding, so that the test base 200 can smoothly run along the circular guide rail 100 a.
Specifically, in the present embodiment, the first guide member and the second guide member are both rollers.
In one embodiment, the endless track 100 is racetrack shaped. The track-shaped circular rail 100 occupies a small area and has a high space utilization ratio compared to a circular rail.
In one embodiment, there are a plurality of test bases 200, and a plurality of test bases 200 are disposed along the circular rail 100. The number of the test bases 200 is multiple, and in use, each operation station 110 corresponds to the test base 200, so that the utilization rate of each operation station 110 can be improved, and the test efficiency is further improved.
Specifically, in the present embodiment, two first guides and two second guides are provided on each test base 200. The first guide piece and the second guide piece are both rollers; the guide precision is high, and the stability of the matching of the test base 200 and the annular guide rail 100a can be ensured.
Referring to fig. 3, in the present embodiment, the test base 200 includes a test tray 210 for holding a test product and a carrying base 220 for connecting with the circular rail 100, and the test tray 210 is fixed on the carrying base 220 and moves along the circular rail 100 along with the carrying base 220.
Specifically, the first guide and the second guide are disposed on the carrying base 220.
In an embodiment, the test base 200 is provided with a plurality of receiving slots 211, and the receiving slots 211 are used for receiving test products. The test base 200 is provided with a plurality of receiving grooves 211, so that a plurality of product tests can be performed simultaneously.
Specifically, in the present embodiment, the receiving groove 211 is opened on the test tray 210.
Further, in the present embodiment, the accommodating groove 211 has three rows, and each row is sequentially provided with six accommodating grooves 211 at intervals.
In one embodiment, the test conveying line further includes a driving wheel 310, a supporting wheel 320 and a linkage 330, the linkage 330 is wound around the driving wheel 310 and the supporting wheel 320, the driving wheel 310 is used for driving the linkage 330 to move around the driving wheel 310 and the supporting wheel 320, and the linkage 330 is connected with the test base 200 for pulling the test base 200 to move along the circular track 100. The movement trace of the linkage 330 is limited by the driving wheel 310 and the supporting wheel 320. The driving wheel 310 rotates, the linkage 330 moves around the driving wheel 310 and the support wheel 320, and the linkage 330 pulls the test base 200 to move along the circular track 100. The test base 200 is powered by a linkage 330. During the test, the position of the test base 200 on the circular track 100 can be controlled by controlling the rotation of the driving wheel 310.
Specifically, in the present embodiment, the supporting wheel 320 can be driven by the linkage 330 to rotate. The linkage 330 is a belt, the belt is in meshing transmission with the driving wheel 310, and the belt is in meshing transmission with the supporting wheel 320.
In one embodiment, the linkage 330 is connected to the test base 200 by a displacement compensation mechanism, and the displacement compensation mechanism is used for the test base 200 to move along the circular track 100 relative to the linkage 330. A plurality of operating stations 110 are disposed along the circular track 100, and in use, the linkage 330 moves the test base 200 to a position near the corresponding test station 112 for performing a first positioning operation, and then the positioning mechanism is used to perform a station positioning operation on the test base 200 relative to the test equipment 420. Since the test base 200 can slide along the circular rail 100 by a small distance through the displacement compensation structure, the test base 200 can have good alignment accuracy with respect to the test equipment 420 through the station positioning mechanism.
Specifically, in the embodiment, as shown in fig. 2, the displacement compensation structure includes a pulling member 331 and a pulling pin 221, the pulling member 331 is provided with a displacement compensation hole 311a, the pulling pin 221 is installed in the displacement compensation hole 311a, and the pulling pin 221 is movable in the displacement compensation hole 311 a; one of the traction member 331 and the traction pin 221 is fixedly connected with the linkage member 330, and the other is fixedly connected with the test base 200; when the test base 200 moves between the operation stations 110, the pulling pin 221 abuts against the inner wall of the displacement compensation hole 311a, and the test base 200 moves along the circular track 100 along with the pulling member 331; when the test base 200 is positioned at the working position, the test base 200 slides along the circular rail 100 with respect to the link 330 by a distance between the traction pin 221 and the inner wall of the displacement compensation hole 311 a. When the test base 200 is used for station positioning, the matching of the displacement compensation hole 311a and the traction pin can avoid the influence of rigid connection between the test base 200 and the linkage 331 on the station positioning; meanwhile, the insufficient turning radius of the test base 200 during turning can be made up by the distance between the hole wall of the displacement compensation hole 311a and the traction pin 221.
Further, as shown in fig. 2, in the present embodiment, the pulling member 331 is fixed to the linking member 330, and the pulling pin 221 is fixed to the carrying base 220.
it should be noted that, in other embodiments, the displacement compensation structure includes an elastic member having two ends respectively connected to the linkage member 330 and the test base 200, and the elastic deformation of the elastic member is used for displacement compensation.
It should be noted that the station positioning mechanism includes a positioning column 222, a positioning block 510 and an air cylinder 520, the positioning column is fixedly disposed on the bearing base 220, the air cylinder 520 is fixedly disposed on the testing line body 500, the positioning block 510 is disposed on a piston rod of the air cylinder 520, the positioning block 510 moves along with the piston rod in a direction close to the positioning column 222, a guide groove 511 is disposed on the positioning block 510, and the guide groove 511 is used for being matched with the positioning column 222. When the test base 200 is first positioned, the test base 200 moves to the vicinity of the test station 112, the piston rod of the air cylinder 520 moves towards the direction close to the positioning column 222, the bearing base 220 is pushed to move on the annular rail 100 by the abutting of the inner wall of the positioning groove 511 and the positioning column 222, so as to position the test base 200, and when the positioning column 222 abuts against the bottom of the guide groove 511, the positioning of the test base 200 is completed.
In this embodiment, the guide slot 511 is a U-shaped slot, and in other embodiments, the guide slot 511 may be a V-shaped slot.
It should be noted that, when it is required to move the test base 200 along the circular track 100, the positioning block 510 is driven by the piston rod of the cylinder 50 to be disengaged from the positioning post 222.
With reference to fig. 1 and fig. 4, in another embodiment, a test production line is further provided, which includes the test conveying line, and the operation station 110 includes a loading station 111, a testing station 112, and an unloading station 113; the test device comprises a loading mechanism 410, a test device 420 and an unloading mechanism 430, wherein the loading mechanism 410 is arranged corresponding to the loading station 111, the test device 420 is arranged corresponding to the test station 112, and the unloading mechanism 430 is arranged corresponding to the unloading station 113. The loading station 111, the unloading station 113 and the testing station 112 are arranged along the circular rail 100, and the testing base 200 moves among the loading station 111, the testing station 112 and the unloading station 113 along the circular rail 100 to switch positions. The circular rail 100 can be set according to the loading station 111 corresponding to the loading mechanism 410, the testing station 112 corresponding to the testing device 420, and the unloading station 113 corresponding to the unloading mechanism 430, so that the circular rail 100 can be set according to the arrangement positions of the loading mechanism 410, the testing device 420, and the unloading mechanism 430, and thus the space utilization rate is improved.
In an embodiment, the test station 112 includes a pressure-resistant test station 112a and a functional test station 112b, the test device 420 includes a pressure test device 421 and a functional test device 422, the pressure test device 421 corresponds to the pressure-resistant test station 112, and the functional test device 422 corresponds to the functional test device 422.
In one embodiment, there are at least two functional test sites 112b, at least two functional test devices 422, and the functional test devices 422 and the functional test sites 112b are disposed in a one-to-one correspondence.
it should be noted that the number of functional test stations 112b depends on the test time of the test product. For example, when the test time of the product at the withstand voltage test station 112a is T, and the test time of the product at the functional test station 112b is 2T, the test time duration of each station can be balanced by providing two functional test stations 112 b; when the test time of the product at the withstand voltage test station 112a is T and the test time of the product at the functional test station 112b is 3T, the test time duration of each station can be balanced by providing three functional test stations 112 b.
In an embodiment, the test production line further includes an NG conveyer belt 440, and the NG conveyer belt 440 corresponds to the unloading mechanism 430.
The technical features of the embodiments described above may be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the embodiments described above are not described, but should be considered as being within the scope of the present specification as long as there is no contradiction between the combinations of the technical features.
the above-mentioned embodiments only represent some embodiments of the present invention, and the description thereof is specific and detailed, but not to be construed as limiting the scope of the present invention. It should be noted that, for those skilled in the art, without departing from the spirit of the present invention, several variations and modifications can be made, which are within the scope of the present invention. Therefore, the protection scope of the present invention should be subject to the appended claims.
Claims (14)
1. A test conveying line is characterized by comprising an annular rail and a test base, wherein a plurality of operation stations are arranged along the annular rail; the test base can move along the annular rail, the test base switches positions among a plurality of operation stations along the annular rail, and the test base is used for supporting a test product.
2. The test conveyor line according to claim 1, wherein the annular rail is an annular guide rail, and the test base is provided with a guide groove in sliding fit with the annular guide rail;
or still include the support body, the annular track is for seting up the annular guide slot on the support body, the test base is equipped with the guide piece that can follow the annular guide slot and remove, the test base passes through the guide piece and moves along the annular guide slot.
3. the test conveyor line according to claim 2, wherein the test base is provided with a first guide member engaging an inner side of the endless guide rail and a second guide member engaging an outer side of the endless guide rail, the first guide member and the second guide member forming the guide groove therebetween.
4. The test conveyor line of claim 3 wherein the first guide is a roller; or the second guide member is a roller.
5. The test conveyor line of claim 1 wherein the endless track is racetrack shaped.
6. The test conveyor line of claim 1 wherein there are a plurality of test pedestals, the plurality of test pedestals being disposed along an endless track.
7. The test conveyor line according to claim 1, wherein the test base is provided with a plurality of receiving slots for receiving test products.
8. The test conveying line according to any one of claims 1 to 7, further comprising a driving wheel, a support wheel and a linkage member, wherein the linkage member is wound on the driving wheel and the support wheel, the driving wheel is used for driving the linkage member to move around the driving wheel and the support wheel, and the linkage member is connected with the test base and used for drawing the test base to move along the annular track.
9. The test conveyor line of claim 8 wherein a displacement compensation structure is disposed between the linkage and the test base, the displacement compensation structure being adapted to move the test base along the endless track relative to the linkage.
10. The test conveyor line of claim 9 wherein the displacement compensation structure further comprises a puller member having a displacement compensation hole and a puller pin mounted in the displacement compensation hole, the puller pin being movable in the displacement compensation hole;
One of the traction member and the traction pin is fixedly connected with the linkage member, and the other one of the traction member and the traction pin is fixedly connected with the test base;
When the test base moves among the operation stations, the traction pin is abutted against the inner wall of the displacement compensation hole, and the test base moves along the annular track along with the traction piece;
When the test base carries out station location, the relative linkage piece of test base passes through the distance of towing pin and displacement compensation hole and slides along the circular orbit.
11. A test production line comprising the test conveyor line of any one of claims 1 to 10, wherein the operation stations include a loading station, a test station, and an unloading station;
The automatic loading and unloading device is characterized by further comprising a loading mechanism, a testing device and an unloading mechanism, wherein the loading mechanism corresponds to the loading station, the testing device corresponds to the testing station, and the unloading mechanism corresponds to the unloading station.
12. The production line of claim 11, wherein the testing stations comprise pressure-resistant testing stations and functional testing stations, the testing equipment comprises pressure testing equipment and functional testing equipment, the pressure testing equipment is arranged corresponding to the pressure-resistant testing stations, and the functional testing equipment is arranged corresponding to the functional testing equipment.
13. The production line of claim 12, wherein the functional test stations are at least two, the functional test devices are at least two, and the functional test devices are arranged in one-to-one correspondence with the functional test stations.
14. the test production line of claim 13, comprising a NG conveyor belt, wherein the NG conveyor belt is disposed in correspondence with the discharge mechanism.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201920011371.8U CN209803278U (en) | 2019-01-04 | 2019-01-04 | Test conveying line and test production line |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201920011371.8U CN209803278U (en) | 2019-01-04 | 2019-01-04 | Test conveying line and test production line |
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| CN209803278U true CN209803278U (en) | 2019-12-17 |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111257724A (en) * | 2020-01-13 | 2020-06-09 | 惠州市德赛电池有限公司 | Test method and system based on lithium battery protection board annular production line |
| CN114428056A (en) * | 2021-12-31 | 2022-05-03 | 苏州精濑光电有限公司 | Automatic optical detection equipment and detection method thereof |
| CN116559618A (en) * | 2023-05-17 | 2023-08-08 | 北京京瀚禹电子工程技术有限公司 | Semiconductor discrete device testing device capable of avoiding displacement |
-
2019
- 2019-01-04 CN CN201920011371.8U patent/CN209803278U/en active Active
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111257724A (en) * | 2020-01-13 | 2020-06-09 | 惠州市德赛电池有限公司 | Test method and system based on lithium battery protection board annular production line |
| CN114428056A (en) * | 2021-12-31 | 2022-05-03 | 苏州精濑光电有限公司 | Automatic optical detection equipment and detection method thereof |
| CN116559618A (en) * | 2023-05-17 | 2023-08-08 | 北京京瀚禹电子工程技术有限公司 | Semiconductor discrete device testing device capable of avoiding displacement |
| CN116559618B (en) * | 2023-05-17 | 2024-02-06 | 北京京瀚禹电子工程技术有限公司 | Semiconductor discrete device testing device capable of avoiding displacement |
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