CN213210365U

CN213210365U - Double-layer type PCB testing device

Info

Publication number: CN213210365U
Application number: CN202021911816.7U
Authority: CN
Inventors: 陈利; 刘成云
Original assignee: Shenzhen Toreda Electronic Co ltd
Current assignee: Shenzhen Toreda Electronic Co ltd
Priority date: 2020-09-03
Filing date: 2020-09-03
Publication date: 2021-05-14
Anticipated expiration: 2030-09-03

Abstract

The utility model discloses a double-layer PCB testing device, which comprises a sliding support rod, a testing support plate, a servo motor, a driving device, a testing press plate and a testing needle plate; the test support plate is sleeved on the sliding support rod and can slide up and down relative to the sliding support rod under the driving of the driving device, the servo motor drives the PCB to be tested arranged on the test support plate, and the test press plate and the test needle plate respectively detect the PCB to be tested arranged on the test support plate. According to the test device, the test carrier plate comprises a double-layer test mode of an upper carrier plate and a lower carrier plate, the test of the upper carrier plate is carried out by using the test needle plate, the test of the lower carrier plate is carried out by using the test pressing plate, then the test of the test needle plate and a PCB product to be tested are realized by using the driving device, the upper carrier plate is used as a cache of the test position, the flowing time is reduced, and the productivity is provided; whether the product is tested or not is judged by arranging the scanning gun on the lower support plate, whether the product is released or intercepted is determined, and the false detection rate is greatly reduced.

Description

Double-layer type PCB testing device

Technical Field

The utility model relates to a setting of test fixture especially relates to a double-deck formula PCB board testing arrangement.

Background

When the software control program is burned into the IC chip of the PCB, the burning voltage is generally 6.5-10V, and the burning executed by the voltage belongs to high-voltage burning. During burning, if the sequence of manual control to the mechanical switch is not properly operated, the driving IC chip inside the liquid crystal screen on the PCB is easily damaged by the impact of the high voltage. Therefore, the production workshop detects the quality of various IC chips on the PCB so as to judge whether the IC chips are burnt out or not, whether the burning program is missed or not and the like.

The existing detection of the PCB burning device is carried out by adopting a one-to-one detection mode of one PCB at one station through a PCB detection jig. However, if a problem is detected by a certain PCB, the detection jig can not be used before the clamping is stopped; time is wasted, efficiency is low, and the error detection rate is relatively high.

SUMMERY OF THE UTILITY MODEL

Based on the above problem, the utility model aims to solve the problem that a double-deck formula PCB board testing arrangement of two PCB board tests can be realized simultaneously to a station is provided.

The technical scheme of the utility model as follows:

a double-layer PCB board testing device comprises a plurality of sliding support rods, a testing support plate, a servo motor, a driving device, a testing press plate and a testing needle plate; wherein:

the test carrier plate comprises an upper carrier plate and a lower carrier plate; the upper carrier plate and the lower carrier plate are respectively sleeved on the plurality of sliding support rods and can move up and down relative to the sliding support rods;

the servo motor comprises an upper servo motor and a lower servo motor which are respectively used for driving a first PCB to be tested arranged on the upper loading plate and a second PCB to be tested arranged on the lower loading plate;

the driving device comprises an upper driving device and a lower driving device which are respectively used for driving the upper carrier plate and the lower carrier plate to slide up and down along the sliding support rod;

the test pressing plate is arranged above the lower carrier plate and used for testing a second PCB to be tested on the lower carrier plate;

the test needle plate is arranged above the upper carrier plate and used for testing a first PCB to be tested, which is arranged on the upper carrier plate.

In an embodiment, in the double-layer PCB testing apparatus, the number of the sliding support rods is four, and the sliding support rods are vertically and symmetrically distributed to form a square outer frame structure.

In an embodiment, in the double-layer PCB testing apparatus, the upper loading plate includes an upper sliding support plate, two upper guide rails, an upper conveying belt, and an upper transmission shaft; the upper support plate is sleeved on the sliding support rod through the upper sliding support plate, and the two upper guide rails are arranged on the upper sliding support plate in parallel; the upper conveying belt is arranged on the upper guide rail and used for moving a first PCB to be tested on the upper guide rail; one end of the upper transmission shaft is connected with the upper servo motor shaft, and one end of the upper transmission shaft is connected with the upper conveyor belt in a tension manner; the upper servo motor drives the upper conveying belt to rotate through the upper transmission shaft, and further drives the first PCB to be tested to move along the upper guide rail.

In one embodiment, in the double-layer PCB testing apparatus, first grooves are respectively formed at inner sides of two upper guide rails, and the upper conveyor belt is embedded in the first grooves; correspondingly, two ends of the first PCB to be tested are also arranged in the first groove and are erected on the surface of the upper conveying belt.

In an embodiment, in the dual-layer PCB testing apparatus, the dual-layer PCB testing apparatus further includes an upper supporting plate for carrying the first PCB to be tested, wherein two ends of the pressing plate are carried on the surface of the upper conveyor belt and move back and forth along the upper guide rail along the upper conveyor belt.

In one embodiment, in the double-layer PCB testing apparatus, the lower carrier plate includes a lower sliding carrier plate, two lower guide rails, a lower conveyor belt, and a lower transmission shaft; the lower support plate is sleeved on the sliding support rod through the lower sliding support plate, and the two lower guide rails are arranged on the lower sliding support plate in parallel; the lower conveyor belt is arranged on the lower guide rail and is used for moving a second PCB to be tested on the lower guide rail; one end of the lower transmission shaft is connected with the lower servo motor shaft, and one end of the lower transmission shaft is connected with the lower conveyor belt in a tension manner; the lower servo motor drives the lower conveying belt to rotate through the lower transmission shaft, and further drives the second PCB to be tested to move along the lower guide rail.

In an embodiment, in the double-layer PCB testing apparatus, two second grooves are respectively disposed at inner sides of the lower guide rails, the lower conveyor belt is embedded in the second grooves, and correspondingly, two ends of the second PCB to be tested are also disposed in the second grooves and are erected on the surface of the lower conveyor belt.

In an embodiment, in the double-layer PCB testing apparatus, the double-layer PCB testing apparatus further includes a lower tray for carrying the second PCB to be tested, wherein two ends of the tray are erected on the surface of the lower conveyor belt and move back and forth along the lower guide rail along the lower conveyor belt.

In an embodiment, in the double-layer PCB testing apparatus, the test pin plate is provided with a drawer cavity, and the test pin of the test pin plate is replaceably disposed in the drawer cavity.

In an embodiment, in the dual-layer PCB testing apparatus, the upper driving device and the lower driving device are both cylinder driving devices.

The utility model provides a double-deck formula PCB board testing arrangement, the test support plate includes the double-deck test mode of upper carrying plate and lower download board, and the test of upper carrying plate adopts the test faller to go on, and the test of lower download board adopts the test clamp plate to go on, then realizes the contact of test faller and the PCB board product (including first PCB board and the second PCB board that awaits measuring) test point that awaits measuring through drive arrangement, then realizes the test through the control of test procedure; the double-layer carrier plate is arranged in front of the test position of the test device, and the upper carrier plate is used as the cache of the test position, so that the flowing time is reduced, the productivity is improved by 20% compared with a manual line; whether the product is tested or not is judged by arranging the scanning gun on the lower support plate, whether the product is released or intercepted is determined, and the misdetection rate is reduced to 96% from 99.5% of the original manual line.

Drawings

FIG. 1 is a schematic view of the structure of the dual-layer PCB testing device of the washing machine of the present invention in a use state;

fig. 2a, 2b and 2c are schematic structural diagrams of a double-layer PCB testing device of a washing machine of the present invention;

FIG. 3 is a schematic diagram of the upper test needle plate structure in the double-layer PCB testing device of the washing machine of the utility model;

FIG. 4 is a schematic diagram of a test loading plate structure in the double-layer PCB testing device of the washing machine of the utility model;

FIG. 5 is a schematic diagram of a structure of a lower test board in the double-layer PCB testing device of the washing machine of the utility model;

FIG. 6 is a schematic view of a structure of a blocking positioning member in the double-layer PCB testing device of the washing machine of the utility model;

fig. 7 is a schematic view of a lower carrier plate testing pressing plate structure in the double-layer PCB testing apparatus of the washing machine of the utility model.

Detailed Description

The following describes the preferred embodiments of the present invention in further detail with reference to the accompanying drawings.

As shown in fig. 1, the utility model provides a pair of double-layer PCB board testing arrangement 200, when using, is installed on a workstation 100, and this workstation 100 can be posture structure, table platform formula structure or box formula structure. In this embodiment, the workbench 100 is of a box-type structure, a plurality of cabinet bodies are arranged on the workbench 100, and each cabinet body is correspondingly provided with a corresponding cabinet door 101; the worktable 100 adopting the box body structure has the cabinet body which can be used for placing operation tools, production materials, maintenance accessories and the like, and is convenient and practical. The outer shape of the table 100 may be designed to have a regular cylindrical structure such as a square cylindrical structure or a cylindrical structure, or other irregular cylindrical structures, as required. In this embodiment, the table 100 is a square column.

As shown in fig. 1, 2aa, 2b and 2c, the dual-layer PCB testing apparatus 200 includes a plurality of sliding support rods 240, a test carrier, a servo motor, a driving device, a test pressure plate 270 and a test needle plate 250. The structure and connection relationship of each functional component are described in detail below.

The test carrier board comprises an upper carrier board 202 and a lower carrier board 201; the upper carrier plate 202 and the lower carrier plate 201 are respectively sleeved on the sliding support rod 240 and can move up and down relative to the sliding support rod 240.

Specifically, in the present embodiment, the number of the sliding struts 240 is four, and the sliding struts are vertically and symmetrically distributed to form a square outer frame structure, that is, a rectangular parallelepiped structure. Four sliding support rods 240 are distributed at four top corners or edges of the rectangular parallelepiped, and the lower ends of the four sliding support rods 240 are fixedly arranged on the worktable 100.

In embodiments, the number of sliding struts 240 may also be two, three, six, etc. In consideration of the load stability and low cost of the sliding support rod 240, four members are selected in the present embodiment, so that the load stability and low cost of manufacture are also considered, that is, the cost performance is relatively excellent.

The servo motor is mainly used for driving the test PCB loaded on the test carrier plate to move back and forth on the test carrier plate under the action of a power source provided by a power supply. The method comprises the following specific steps:

the servo motor comprises an upper servo motor 221 and a lower servo motor 211, and the test PCB comprises a first PCB 300 to be tested and a second PCB 301 to be tested; the upper servo motor 221 is used for driving the first PCB 300 to be tested to move back and forth on the upper carrier plate 202, and the lower servo motor 211 is used for driving the second PCB 301 to be tested to move back and forth on the lower carrier plate 201.

Preferably, as shown in fig. 4, the upper carrier plate 202 includes an upper sliding carrier plate 223, two upper guide rails 220, an upper conveyor belt 2201, and an upper transmission shaft 2210. In order to facilitate the testing of the first PCB 300 to be tested on the lower carrier 201, a certain testing moving space is reserved above the lower carrier in the vertical direction, in this embodiment, two upper sliding carriers 223 are selected and respectively disposed at two ends of the upper guide rail 220 for fixing and carrying the upper guide rail 220; a corresponding reserved space is reserved between the two upper sliding carrier plates 223. The two upper sliding support plates 223 are respectively provided with four upper positioning sleeve hole columns 2211 at the end corners of the two ends. The upper carrier 202 is respectively fitted and sleeved on the four sliding supports 240 through the four upper positioning sleeve hole columns 2211 of the two upper sliding carriers 223, and the upper positioning sleeve hole columns 2211 of the upper sliding carriers 223 can slide up and down and back and forth relative to the sliding supports 240. In other embodiments, the upper sliding plate 223 may be a square frame or a square panel with a predetermined hollow hole.

When the two upper sliding support plates 223 are sleeved on the four sliding supports 240, the two upper sliding support plates 223 are kept on the same horizontal plane, namely, at the same height position, so that the two upper sliding support plates 223 can be ensured to stably ascend or descend when sliding up and down on the four sliding supports 240, and the stability is ensured.

The two upper guide rails 220 are fixedly disposed in parallel on the two upper sliding carrier plates 223. Specifically, at least four upper sliding grooves 2231 are formed in the two upper sliding carrier plates 223 at corresponding positions along the longitudinal direction of the upper sliding carrier plates 223, and each upper sliding groove 2231 is provided with an upper fixing clip 2232 for fixing the two upper guide rails 220 to the two upper sliding carrier plates 223 respectively. Meanwhile, the upper fixing clip 2232 is loosened and moved along the upper slide groove 2231 according to the test requirement, and the parallel distance between the two upper guide rails 220 can be adaptively adjusted.

The upper conveyor belt 2201 is used for moving the first PCB 300 to be tested back and forth, so as to facilitate the testing of the first PCB 300 on the upper carrier plate 202. Therefore, the upper conveyor 2201 is disposed on the upper rail 220 in consideration of functionality, reliability, and installation convenience. According to the test requirement, one upper conveyor belt 2201 can be arranged on one upper guide rail 220; the number of the upper conveyor belts 2201 may also be two, and the two upper conveyor belts are respectively arranged on the two upper guide rails 220, in this embodiment, two upper conveyor belts 2201 are adopted to increase the smoothness and smoothness. The upper conveyor belt 2201 moves in parallel on the upper rail 220 to ensure that the first PCB 300 to be tested moves smoothly on the upper rail 220.

For the upper belt 2201, it is only a link for transmitting power, and the power transmission is realized by providing the upper servo motor 221 with power through the upper transmission shaft 2210. Specifically, the upper servo motor 221 is fixedly disposed at the end of an upper sliding carrier plate 223, the rotating shaft of the upper servo motor 221 is fixedly connected to one end of the upper transmission shaft 2210, and the other end of the upper transmission shaft 2210 is in tension transmission connection with the upper transmission belt 2201, so that when the rotating shaft of the upper servo motor 221 rotates, the upper transmission shaft 2210 is driven to rotate, and the rotating force is transmitted to the upper transmission belt 2201, and further the upper transmission belt 2201 is driven to rotate. Because the upper servo motor 221 can rotate clockwise or counterclockwise under the action of the control system, the upper servo motor 221 rotates clockwise or counterclockwise under the control of the control system, so that the upper transmission shaft 2210 moves forward along the upper guide rail 220 or moves backward along the upper guide rail 220, thereby moving the first PCB 300 to be tested back and forth on the upper guide rail 220.

Preferably, in order to facilitate the replacement and movement of the first PCB 300 to be tested, an upper supporting plate 2222 of a flat plate type structure for carrying the first PCB 300 to be tested is further disposed on the upper conveyor 2201, and both ends of the upper supporting plate 2222 are adapted to be arranged on the upper surface of the upper conveyor 2201 and move back and forth along the upper guide rail 220 along with the upper conveyor 2201. The size and structure of the upper supporting plate 2222 need to be set according to the size and structure of the first PCB 300 to be tested.

As the upper conveyor 2201, a chain type conveyor may be used, a belt type conveyor may be used, or even a roller set type conveyor may be used. In this embodiment, the upper conveyor 2201 is a belt conveyor, which is low in cost, light in weight, convenient to install and good in silencing effect during the conveying process.

Preferably, the inner sides, i.e., opposite sides, of the two upper guide rails 220 are respectively provided with a first groove 2202, and the upper conveyor belt 2201 is embedded in the first groove 2202; accordingly, both ends of the first PCB 300 to be tested are also placed in the first groove 2202 and set up on the surface of the upper conveyor 2201. By the design, the upper conveyor belt 2201 can be hidden, so that the attractive and tidy design is realized, and other problems caused by the exposure of the upper conveyor belt 2201, such as impurity winding or clamping belt, can be avoided.

In the dual-layer PCB testing apparatus 200, as shown in fig. 1, 2 and 3, a testing pin plate 250 is disposed above the upper carrier plate for testing a first PCB 300 to be tested placed on the upper carrier plate.

Specifically, an upper cover plate 2501 is fixedly disposed at the top ends of the four sliding brackets 240, a through hole 2502 is disposed at the middle position of the upper cover plate 2501, and the size, specification and dimension of the through hole 2502 are just suitable for accommodating and mounting the test needle plate 250. When mounting, the upper end of the test pin plate 250 is fixedly mounted on the upper cover plate 2501 after passing through the through hole 2502.

As shown in fig. 3, the test probe plate 250 includes an upper fixing plate 251, a lower fixing plate 252, a carrier plate cylinder 254, a carrier plate cylinder push rod 2541, and a fixing bracket 253. The carrier plate cylinder 254 is fixedly mounted on the upper cover plate 2501 through a through hole 2502 of the upper cover plate 2501; the carrier cylinder push rod 2541 slides up and down relative to the carrier cylinder 254 under the pushing of the external air medium, that is, the lower fixing plate 252 slides up and down relative to the four fixing brackets 253.

The upper fixing plate 251 and the lower fixing plate 252 are respectively of a square structure; four end corners of the upper fixing plate 251 are respectively provided with a sleeve column 2531, and a through hole 2501 is formed in the middle of the upper fixing plate 251; the lower end of the carrier plate cylinder push rod 2541 passes through the through hole 2501 and is fixedly connected with the upper surface of the lower fixing plate 252. In this embodiment, four fixing brackets 253 are provided, the upper ends of the four fixing brackets respectively penetrate through the four sleeves 2531 of the upper fixing plate 251 and form a relatively movable sleeve with the sleeves 2531 up and down, and the lower ends of the four fixing brackets 253 are respectively fixedly connected with the upper surface of the lower fixing plate 252. Thus, the lower fixing plate 252 can move back and forth up and down relative to the upper fixing plate 251 through the power transmission mechanism under the driving force provided by the servo motor.

And a test pin 2510 for testing the first PCB 300 to be tested is fixedly disposed on a lower surface of the lower fixing plate 252.

Preferably, when testing the first PCB 300 under test with different specifications, a different test needle 2510 needs to be replaced. In order to facilitate the replacement of the testing needle 2510, the lower fixing plate 252 is configured to be a drawer structure, the lower fixing plate 252 includes an upper pulling plate 2521 and a lower pulling plate 2522, and a drawer cavity 2510 structure is formed between the upper pulling plate 2521 and the lower pulling plate 2522, at this time, the testing needle fixing plate 2511 for mounting the testing needle 2510 can be inserted into the drawer cavity 2510 in a drawer manner, so that the testing needle 2510 can be replaced very conveniently to adapt to the PCB boards to be tested of different specifications.

In the dual-layer PCB testing apparatus 200, the structure and function of the lower board 201 are substantially similar to those of the upper board 202, and both are used for testing PCBs.

As shown in FIG. 5, the lower load board 201 includes a lower slide carrier plate 213, two lower guide rails 210, a lower conveyor 2101, and a lower drive shaft 2110. In this embodiment, the lower sliding carrier plate 213 is a whole plate, or two lower sliding carrier plates may be used to fix and carry the lower guide rail 210 and the upper carrier plate 202; the end corners of the two ends of the lower sliding carrier plate 213 are respectively provided with four lower positioning sleeve hole columns 2111. The lower carrier 201 is fitted over the four sliding brackets 240 through the four lower positioning sleeve hole posts 2111 of the lower sliding carrier 213, and the lower positioning sleeve hole posts 2111 of the lower sliding carrier 213 can slide back and forth up and down relative to the sliding brackets 240.

The two lower guide rails 210 are fixedly disposed in parallel on the lower sliding carrier 213. Specifically, at least four lower sliding grooves 2131 are formed in the corresponding positions of two corresponding sides of the lower sliding carrier plate 213 along the longitudinal direction of the lower sliding carrier plate 213, and each lower sliding groove 2131 is provided with a lower fixing clip 2132 for fixing two lower guide rails 210 to the lower sliding carrier plate 213 respectively. Meanwhile, according to the test requirement, the lower fixing clip 2132 is loosened and moved along the lower sliding groove 2131, so that the parallel distance between the two lower guide rails 210 can be adjusted adaptively.

The lower conveyor 2101 is used to move the second PCB 301 to be tested back and forth, facilitating the testing of the second PCB 301 to be tested on the lower carrier 201. Therefore, the lower conveyer 2101 is disposed on the lower rail 220 in consideration of functionality, reliability, and installation convenience. According to the test requirement, the lower conveyor belt 2101 can be one and is arranged on one lower guide rail 210; the number of the lower conveyors 2101 may also be two, and the two lower conveyors 2101 are respectively disposed on the two lower guide rails 210. The lower conveyor 2101 moves in parallel on the lower guide rail 210 to ensure smooth movement of the second PCB board 301 to be tested on the lower guide rail 210.

For the lower belt 2101, it is simply a power-transmitting link, and its power transmission is to provide a power transmission force to the lower servomotor 211 through the lower transmission shaft 2110. Specifically, the lower servo motor 211 is fixedly disposed at the end of the lower sliding carrier 213, a rotating shaft of the lower servo motor 211 is fixedly connected to one end of the lower transmission shaft 2110, and the other end of the lower transmission shaft 2110 is in tension-type transmission connection with the lower conveyer 2101, so that when the rotating shaft of the lower servo motor 211 rotates, the lower transmission shaft 2110 is driven to rotate, and the rotating force is transmitted to the lower conveyer 2101, thereby driving the lower conveyer 2101 to rotate. Because the lower servo motor 211 can rotate clockwise or counterclockwise under the action of the control system, the lower servo motor 211 rotates clockwise or counterclockwise under the control of the control system, so that the lower transmission shaft 2110 moves forward along the lower guide rail 210 or moves backward along the lower guide rail 210, thereby moving the second PCB 301 to be tested back and forth on the lower guide rail 210.

Preferably, in order to facilitate the replacement and movement of the second PCB 301 to be tested, a lower supporting plate 2120 of a flat plate-like structure for carrying the second PCB 301 to be tested is further disposed on the lower conveyor 2101, and both ends of the lower supporting plate 2120 are adapted to be placed on the upper surface of the lower conveyor 2101 and move back and forth along the lower guide rail 220 along with the lower conveyor 2101. The size and structure of the bottom plate 2120 need to be set according to the size and structure of the second PCB 301 to be tested.

For the lower conveying belt 2101, a chain type conveying belt, a belt type conveying belt, or even a roller group type conveying belt may be selected. In this embodiment, the lower conveying belt 2101 is a belt type conveying belt, which is low in cost, light in weight, convenient to install and good in silencing effect in the conveying process.

Preferably, a second groove 2102 is respectively arranged on the inner sides of the two lower guide rails 210, and the lower conveyor 2101 is embedded in the second groove 2102; accordingly, both ends of the second PCB board 301 to be tested are also placed in the second groove 2102 and set up on the surface of the lower conveyor 2101. By the design, the lower conveying belt 2101 can be hidden, so that attractive and tidy design is realized, and other problems caused by exposure of the lower conveying belt 2101, such as impurity belt coiling or belt clamping, can be avoided.

As shown in fig. 1, 2a, 5 and 6, a blocking positioning member 270 is further disposed on the lower carrier plate 201, and includes a positioning plate 271 in the shape of a square flat plate and a support plate 272 for supporting the positioning plate 271, where the two support plates 272 are vertically disposed on two opposite side edges of the positioning plate 217 and disposed on the same side. The positioning plate 271 and the two support plates 272 can be integrally formed by punching, that is, a whole square flat plate is adopted to perform concave punching on two corresponding side edges, so that the blocking positioning member 270 with a concave structure can be obtained. The two brackets 272 can also be replaced by a plurality of brackets. A through hole 2701 is formed in the center of the positioning plate 271 for receiving and inserting the second PCB 301 to be tested.

Correspondingly, a second servo motor 212, a second transmission shaft 2120 and two second conveyor belts 2121 are further arranged on the lower carrier plate 201; the second servo motor 212 is disposed on the lower sliding carrier 213, one end of the second transmission shaft 2120 is fixed on the rotation shaft of the second servo motor 212, the two second transmission belts 2121 are disposed on two sides of the two lower guide rails 210 respectively and keep a certain gap with the two lower guide rails 210 respectively, the other end of the second transmission shaft 2120 is in tension connection with the two second transmission belts 2121 respectively, and the two support plates 272 are disposed on the surfaces of the two second transmission belts 2121 respectively. Thus, when the rotating shaft of the second servo motor 212 rotates, the second transmission shaft 2120 is driven to rotate, so that the rotating force is transmitted to the two second belts 2121, and the two second belts 2121 are driven to rotate. Because the second servo motor 212 can rotate clockwise or counterclockwise under the action of the control system, the second servo motor 212 can rotate clockwise or counterclockwise under the control of the control system, so that the second transmission shaft 2120 can move forward or backward horizontally, thereby blocking the positioning element 270 from moving back and forth on the lower carrier plate 201.

The second conveyor belt 2121, the upper conveyor belt 2201 and the lower conveyor belt 2101 are driven back and forth along the same horizontal direction; however, the transmission steps or directions (i.e., forward or backward) of the second conveyor 2121 and the lower conveyor 2101 are not identical, so that the blocking positioning member 270 can block the movement of the second PBC board 301 to be tested placed in the through hole 2701 of the positioning plate 271 by the through hole 2701, thereby achieving the test positioning.

Preferably, as shown in fig. 6, when the movement of the blocking positioning member 270 is not required to block and position the second PBC board 301 to be tested, the locking structure disposed at the blocking positioning member 270 is not required to disengage the support plate 272 from the second conveyor belt 2121 for transmission. The locking hook structure comprises a locking head 2741 and a movable handle 274, wherein the upper end of the locking head 2741 penetrates through a sliding groove 2702 formed in the positioning plate 271, and the lower end of the locking head 2741 is movably connected with the movable handle 274; the movable handle 274 is disposed on the sidewall of the support plate 272 through the lock frame 2742, the movable handle 274 can move inward or outward relative to the lock frame 2742, and the movable handle 274 moves inward or outward relative to the lock frame 2742 to pull the lock head 2741 to move inward or outward along the sliding slot 2702, so that the support plate 272 is separated from or overlaps the second conveyor belt 2121, and the blocking positioning of the blocking positioning member 270 is achieved.

Further, a scanning gun 273 is further disposed on the blocking positioning member 270, and is used for collecting and collecting test status information of the second PCB 301 to be tested, and sending the test status information to the control center for processing.

As shown in fig. 1, 2 and 7, in the dual-layer PCB testing apparatus 200, the testing pressing plate 280 is disposed above the lower carrier 201 for testing the second PCB 301 to be tested placed on the lower carrier.

Specifically, the test platen 280 includes a lower plate 282, two support plates 283 and an upper plate 281, and the two support plates 283 are respectively disposed on the corresponding sides of the lower plate 282 and the upper plate 281 to form a frame structure. The lower plate 282 has a testing hole 2801, and the lower plate 282 is fixedly disposed on the positioning plate 217 of the blocking positioning member 270, and the testing hole 2801 of the lower plate 282 is disposed corresponding to the through hole 2701 of the positioning plate 217, so that the testing on the upper plate 281 can be performed to test the second PCB 301 to be tested.

As shown in fig. 1, 2a and 2b, in the dual-layer PCB testing apparatus 200, the driving device 230 includes an upper driving device 232 and a lower driving device 231 for driving the upper carrier board 202 and the lower carrier board 201 to slide up and down along four sliding rods 240, respectively.

Specifically, the upper end of the lower driving device 231 is fixed on the lower sliding carrier plate 213 of the lower carrier plate 201 by a fixing member 2701, and the lower end of the lower driving device 231 is fixed on the workbench 100; accordingly, the upper end of the upper driving unit 232 is fixed to the upper sliding plate 223 of the upper carrier plate 202 by a fixing member, and the lower end of the upper driving unit 232 is fixed to the table 100. The upper driving device 232 and the lower driving device 231 each independently provide a driving force. The upper driving device 232 and the lower driving device 231 respectively drive the upper carrier board 202 and the lower carrier board 201 to slide up and down along the four sliding support rods 240 back and forth, i.e. to ascend or descend, under the action of respective driving forces, so as to test the first PCB 300 or the second PCB 301 to be tested at different heights.

Preferably, as shown in fig. 2a and 2c, the double-layer PCB testing apparatus 200 further includes an upper sliding chain 262 and a lower sliding chain 261; the upper ends of the upper slide chain 262 and the lower slide chain 261 are fixedly coupled to the upper slide plate 223 of the upper plate 202 and the lower slide plate 213 of the lower plate 201, respectively, and the lower ends of the upper slide chain 262 and the lower slide chain 261 are fixedly coupled to the table 100, respectively. The upper slide chain 262 and the lower slide chain 261 are mainly used for controlling the sliding stroke of the upper carrier plate 202 and the lower carrier plate 201 on the sliding support 240, so as to avoid the problem caused by the over-short stroke process or stroke of the upper carrier plate 202 and the lower carrier plate 201.

Further, the upper driving device 232 and the lower driving device 231 are both cylinder driving devices, and the cylinder driving devices realize boosting driving or reducing driving of the cylinders by changing gas pressure in the cylinders, and are low in cost, light in weight, environment-friendly and convenient to operate. In other embodiments, a hydraulic cylinder driving device can be adopted, and a lifting or descending transmission mechanism composed of a servo motor can be adopted.

The upper carrier plate is mainly used for testing the PCB, the lower carrier plate is used for burning PCB components, the upper needle plate is in contact with product test points in a pneumatic cylinder driving mode, and burning and testing are achieved through control of a test program. According to the double-layer PCB testing device 200, the upper layer uploading plate is used as the cache of the testing position through automatic burning and FVT testing, so that the flowing time is reduced, the productivity is provided, and the production capacity is improved by 20% compared with a manual line; whether the PCB product is tested or not is judged through a scanning gun arranged on the lower carrier plate to determine whether the PCB product is released or intercepted, so that the misdetection rate is reduced to 96% from 99.5% of the original manual line.

It should be understood that the above description of the preferred embodiments of the present invention is given in some detail and should not be taken as limiting the scope of the invention, which is defined by the appended claims.

Claims

1. A double-layer PCB board testing device is characterized by comprising a plurality of sliding support rods, a testing support plate, a servo motor, a driving device, a testing press plate and a testing needle plate; wherein:

2. The dual-layer PCB testing device of claim 1, wherein the number of the sliding support rods is four, and the sliding support rods are vertically and symmetrically distributed to form a square outer frame structure.

3. The dual-layer PCB testing apparatus of claim 1 or 2, wherein the upper carrier comprises an upper sliding carrier, two upper guide rails, an upper conveyor belt and an upper transmission shaft; the upper support plate is sleeved on the sliding support rod through the upper sliding support plate, and the two upper guide rails are arranged on the upper sliding support plate in parallel; the upper conveying belt is arranged on the upper guide rail and used for moving a first PCB to be tested on the upper guide rail; one end of the upper transmission shaft is connected with the upper servo motor shaft, and one end of the upper transmission shaft is connected with the upper conveyor belt in a tension manner; the upper servo motor drives the upper conveying belt to rotate through the upper transmission shaft, and further drives the first PCB to be tested to move along the upper guide rail.

4. The dual-layer PCB testing device of claim 3, wherein a first groove is respectively arranged at the inner sides of the two upper guide rails, and the upper conveyor belt is embedded in the first groove; correspondingly, two ends of the first PCB to be tested are also arranged in the first groove and are erected on the surface of the upper conveying belt.

5. A dual-layer PCB testing apparatus as claimed in claim 3, further comprising an upper supporting plate for carrying the first PCB to be tested, wherein two ends of the pressing plate are arranged on the surface of the upper conveyor belt and move back and forth along the upper guide rail along with the upper conveyor belt.

6. The dual-layer PCB testing apparatus of claim 1 or 2, wherein the lower carrier plate comprises a lower sliding carrier plate, two lower guide rails, a lower conveyor belt and a lower transmission shaft; the lower support plate is sleeved on the sliding support rod through the lower sliding support plate, and the two lower guide rails are arranged on the lower sliding support plate in parallel; the lower conveyor belt is arranged on the lower guide rail and is used for moving a second PCB to be tested on the lower guide rail; one end of the lower transmission shaft is connected with the lower servo motor shaft, and one end of the lower transmission shaft is connected with the lower conveyor belt in a tension manner; the lower servo motor drives the lower conveying belt to rotate through the lower transmission shaft, and further drives the second PCB to be tested to move along the lower guide rail.

7. The dual-layer PCB testing device of claim 6, wherein a second groove is respectively arranged at the inner sides of the two lower guide rails, the lower conveyor belt is embedded in the second groove, and accordingly, two ends of the second PCB to be tested are also arranged in the second groove and are erected on the surface of the lower conveyor belt.

8. A dual-layer PCB testing device as in claim 6 further comprising a lower tray for carrying the second PCB to be tested, wherein two ends of the tray are erected on the surface of the lower conveyor belt and move back and forth along the lower guide rail along with the lower conveyor belt.

9. The dual-layer PCB testing device of claim 1, wherein the test pin plate is provided with a drawer cavity, and the test pins of the test pin plate are replaceably disposed in the drawer cavity.

10. The dual-layer PCB testing device of claim 1, wherein the upper driving device and the lower driving device are both cylinder driving devices.