CN209707644U - Semiconductor test apparatus - Google Patents
Semiconductor test apparatus Download PDFInfo
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- CN209707644U CN209707644U CN201920386551.4U CN201920386551U CN209707644U CN 209707644 U CN209707644 U CN 209707644U CN 201920386551 U CN201920386551 U CN 201920386551U CN 209707644 U CN209707644 U CN 209707644U
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Abstract
Semiconductor test apparatus.It is related to field of semiconductor processing more particularly to semiconductor test apparatus.It is simple to provide a kind of structure, facilitates test, the semiconductor test apparatus of working efficiency is provided.Including pedestal, test box and rotating mechanism, the top of the test box is equipped with opening, bottom centre is equipped with perforation, and the test box is located at the top of pedestal by a pair of of upright bar；The rotating mechanism includes driving motor and rotating disk, and the driving motor sets on the base and is located between a pair of of upright bar, and the shaft of the driving motor is located in perforation, and the top center of the shaft is equipped with location hole；The side wall of the test box is equipped with mechanism for testing, and the inside of the mechanism for testing connects product to be measured, outside connecting test instrument.The utility model can test another group of product to be measured, save the time by replacing to rotating disk.
Description
Technical field
The utility model relates to field of semiconductor processing more particularly to semiconductor test apparatus.
Background technique
Semiconductor refers to that electric conductivity is between conductor (conductor) and insulator (insulator) under room temperature
Material.Semiconductor has a wide range of applications on radio, television set and thermometric, if diode is exactly to use semiconductor fabrication
Device.Electric performance test is carried out to semiconductor, is the important evidence to its product evaluation.Traditional test mode is with test
Line connects at the both ends of product to be measured, however, an instrument can only connect a product, as shown in fig. 6, so to survey different parameters
When, different instrument is needed replacing, timeliness reduces, and can not analog equipment actual application performance in the line.
Utility model content
The utility model facilitates test, provides partly leading for working efficiency in view of the above problems, to provide a kind of structure simple
Body test device.
The technical solution of the utility model are as follows: including pedestal, test box and rotating mechanism, the top of the test box is equipped with
Opening, bottom centre are equipped with perforation, and the test box is located at the top of pedestal by a pair of of upright bar；
The rotating mechanism includes driving motor and rotating disk, and the driving motor sets on the base and is located at an opposition
Between bar, the shaft of the driving motor is located in perforation, and the top center of the shaft is equipped with location hole；
The rotating disk includes disk body, and the disk body is laid with mounting hole on anchor ring, and the mounting hole is for placing
Vertically disposed product to be measured, top, the bottom of the product to be measured have lead, and the bottom centre of the disk body is equipped with positioning
Column, the positioning column are connected to positioning hole；
The side wall of the test box is equipped with mechanism for testing, and the inside of the mechanism for testing connects product to be measured, outside connection
Test instrumentation.
The mechanism for testing includes a test bench, and the side wall of the test box is equipped with an accommodating hole, and the test bench is located at
In accommodating hole, the inside of the test bench is equipped with a pair of of measuring head, and a pair of of measuring head is setting up and down, sets on the inside of the measuring head
There is p-wire, outside connects a testing needle, the testing needle connecting test instrument；
The measuring head and lead correspond, and the p-wire is used for contact lead-wire.
The mechanism for testing includes at least two test benches, and the side wall of the test box is equipped at least two accommodating holes, institute
It states test bench one-to-one correspondence to be located in accommodating hole, the inside of the test bench is equipped with a pair of of measuring head, divides on a pair of of measuring head
It sets, the inside of the measuring head is equipped with p-wire, and outside connects a testing needle, the testing needle connecting test instrument；
The measuring head and lead correspond, and the p-wire is used for contact lead-wire.
One end of the p-wire towards lead is corrugated.
The rectangular in cross-section or triangle of the positioning column.
It further include test lid, the top surface of the test box is equipped with annular groove, and the test lid connection is in a ring groove.
The top of the test lid is equipped with handle.
The utility model at work, several products to be measured is placed on the disk body of rotating disk, then rotating disk is determined
The shaft positioning hole of position column insertion driving motor, the two is reliably connected, then rotates to drive rotating disk by driving motor
Spinning movement；Since mechanism for testing is arranged in the side wall in test box, mechanism for testing is separately connected product and test instrumentation to be measured, drives
Dynamic motor spinning movement, can test different products to be measured, improve working efficiency.After the completion of test, by being carried out to rotating disk
Replacement, can test another group of product to be measured, save the time.
Detailed description of the invention
Fig. 1 is the structural schematic diagram of the utility model embodiment one,
Fig. 2 is the structural schematic diagram of test box and test bench in Fig. 1,
Fig. 3 is the structural schematic diagram of the utility model embodiment two,
Fig. 4 is the structural schematic diagram of test box and test bench in Fig. 3,
Fig. 5 is the structural schematic diagram of p-wire,
Fig. 6 is the structural schematic diagram of the prior art；
1 is pedestal in figure, and 2 be test box, and 21 be opening, and 22 be perforation, and 23 be annular groove, and 3 be upright bar, and 4 be driving electricity
Machine, 40 be shaft, and 400 be location hole,
5 be rotating disk, and 51 be disk body, and 52 be mounting hole, and 53 be positioning column,
6 be product to be measured, and 60 be lead,
7 be mechanism for testing, and 71 be test bench, and 72 be measuring head, and 73 be p-wire, and 74 be testing needle,
8 be test lid, and 9 be handle.
Specific embodiment
The utility model is as shown in Figs. 1-5, including pedestal 1, test box 2 and rotating mechanism, and the top of the test box 2 is set
There are opening 21, bottom centre to be equipped with perforation 22, the test box passes through the top that a pair of of upright bar 3 is located at pedestal；
The rotating mechanism includes driving motor 4 and rotating disk 5, and the driving motor sets on the base and is located at a pair
Between upright bar, the shaft 40 of the driving motor is located in perforation, and the top center of the shaft is equipped with location hole 400；
The rotating disk 5 includes disk body 51, and the disk body is laid with mounting hole 52 on anchor ring, and the mounting hole is used for
Vertically disposed product to be measured 6 is placed, top, the bottom of the product to be measured have lead 60, and the bottom centre of the disk body sets
There is positioning column 53, the positioning column is connected to positioning hole；
The side wall of the test box is equipped with mechanism for testing 7, and the inside of the mechanism for testing connects product 6 to be measured, and outside connects
Connect test instrumentation (not shown).
The utility model at work, several products to be measured is placed on the disk body of rotating disk, then rotating disk is determined
The shaft positioning hole of position column insertion driving motor, the two is reliably connected, then rotates to drive rotating disk by driving motor
Spinning movement；Since mechanism for testing is arranged in the side wall in test box, mechanism for testing is separately connected product and test instrumentation to be measured, drives
Dynamic motor spinning movement, can test different products to be measured, improve working efficiency.After the completion of test, by being carried out to rotating disk
Replacement, can test another group of product to be measured, save the time.
Driving motor is conventional equipment, such as the prosperous brand of space, the monopole asynchronous motor of model 2I (R) K-6I (R) K；To
It surveys product to be placed in spaced mounting hole, facilitates loading, test is reliable.
Product to be measured is diode in this case, passes through test instrumentation (such as Haier's pa HPS2910 diode parameters integration test
Instrument) forward voltage, backward voltage and reverse leakage current etc. can be tested.
As shown in Figs. 1-2, the mechanism for testing 7 includes a test bench 71, and the side wall of the test box is equipped with an accommodating hole
(not shown), the test bench are located in accommodating hole, and the inside of the test bench is equipped with a pair of of measuring head 72, a pair of test
Setting up and down, the inside of the measuring head is equipped with p-wire 73, and outside connects a testing needle 74, the testing needle connecting test
Instrument；
The measuring head and lead correspond, and the p-wire is used for contact lead-wire.
By the way that single test bench is arranged, the p-wire connected by measuring head is arranged in the inside of test bench, outside connects
Testing needle contacts p-wire with lead one by one, and testing needle is contacted with test instrumentation, convenient to survey to several products to be measured
Examination.
Since single test instrumentation is only arranged, the single parameter of product to be measured can only be tested.
As shown in Figure 3-4, the mechanism for testing includes at least two test benches 71, and the side wall of the test box is equipped at least
Two accommodating holes, test bench one-to-one correspondence are located in accommodating hole, and the inside of the test bench is equipped with a pair of of measuring head 72, and one
Setting up and down to measuring head, the inside of the measuring head is equipped with p-wire 73, and outside connects a testing needle 74, and the testing needle connects
Connect test instrumentation；
The measuring head and lead correspond, and the p-wire is used for contact lead-wire.
By the way that at least two test benches are arranged, the p-wire connected by measuring head is arranged in the inside of test bench, outside connects
Testing needle is connect, p-wire is contacted one by one with lead, testing needle is contacted with test instrumentation, convenient to survey to several products to be measured
Examination.
Since at least two test instrumentations are arranged, the different parameters of product to be measured can be tested, improve working efficiency.
One end of p-wire 73 towards the lead is corrugated.
Corrugated, raising intensity is set；Improve p-wire and wire contacts reliability.
The rectangular in cross-section or triangle of the positioning column 53.
In this way, driving motor is made reliably rotating disk to be driven to act.
It further include test lid 8, the top surface of the test box is equipped with annular groove 23, and the test lid connection is in a ring groove.
It is covered by the way that test is arranged in test upper box part, dust-proof effect can be played；Meanwhile seal case can be formed, pass through
To the adjusting of seal box body temperature (such as setting opening, connecting heating pipe), the electrical property of product to be measured under different temperatures is tested
Power distribution and temperature trend.
The top of the test lid is equipped with handle 9.Handle is set, opens, close convenient for lid will be tested, reliable replacement rotation
Disk.
For this case disclosure of that, need to illustrate there are also the following:
(1), this case the disclosed embodiments attached drawing relate only to structure involved by this case disclosed embodiment,
His structure, which can refer to, to be commonly designed；
(2), in the absence of conflict, the feature in this case the disclosed embodiments and embodiment can be combined with each other with
Obtain new embodiment；
More than, only specific embodiment disclosed in this case, but the protection scope of the disclosure is not limited thereto, this case
Disclosed protection scope should be subject to the protection scope in claims.
Claims (7)
1. semiconductor test apparatus, which is characterized in that including pedestal, test box and rotating mechanism, set at the top of the test box
There are opening, bottom centre to be equipped with perforation, the test box is located at the top of pedestal by a pair of of upright bar；
The rotating mechanism includes driving motor and rotating disk, the driving motor set on the base and be located at a pair of of upright bar it
Between, the shaft of the driving motor is located in perforation, and the top center of the shaft is equipped with location hole；
The rotating disk includes disk body, and the disk body is laid with mounting hole on anchor ring, and the mounting hole is vertical for placing
The product to be measured being arranged, top, the bottom of the product to be measured have lead, and the bottom centre of the disk body is equipped with positioning column, institute
It states positioning column and is connected to positioning hole；
The side wall of the test box is equipped with mechanism for testing, and the inside of the mechanism for testing connects product to be measured, outside connecting test
Instrument.
2. semiconductor test apparatus according to claim 1, which is characterized in that the mechanism for testing includes a test bench,
The side wall of the test box is equipped with an accommodating hole, and the test bench is located in accommodating hole, and the inside of the test bench is equipped with a pair
Measuring head, a pair of of measuring head is setting up and down, and the inside of the measuring head is equipped with p-wire, and outside connects a testing needle, the survey
Test point connecting test instrument；
The measuring head and lead correspond, and the p-wire is used for contact lead-wire.
3. semiconductor test apparatus according to claim 1, which is characterized in that the mechanism for testing includes at least two surveys
Seat is tried, the side wall of the test box is equipped at least two accommodating holes, and the test bench one-to-one correspondence is located in accommodating hole, the survey
The inside for trying seat is equipped with a pair of of measuring head, and a pair of of measuring head is setting up and down, and the inside of the measuring head is equipped with p-wire, and outside connects
Connect a testing needle, the testing needle connecting test instrument；
The measuring head and lead correspond, and the p-wire is used for contact lead-wire.
4. semiconductor test apparatus according to claim 2 or 3, which is characterized in that the p-wire towards lead one
It holds corrugated.
5. semiconductor test apparatus according to claim 1, which is characterized in that the rectangular in cross-section of the positioning column or three
It is angular.
6. semiconductor test apparatus according to claim 1, which is characterized in that it further include test lid, the test box
Top surface is equipped with annular groove, and the test lid connection is in a ring groove.
7. semiconductor test apparatus according to claim 6, which is characterized in that the top of the test lid is equipped with handle.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201920386551.4U CN209707644U (en) | 2019-03-25 | 2019-03-25 | Semiconductor test apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201920386551.4U CN209707644U (en) | 2019-03-25 | 2019-03-25 | Semiconductor test apparatus |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN209707644U true CN209707644U (en) | 2019-11-29 |
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ID=68647628
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201920386551.4U Active CN209707644U (en) | 2019-03-25 | 2019-03-25 | Semiconductor test apparatus |
Country Status (1)
| Country | Link |
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| CN (1) | CN209707644U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109828195A (en) * | 2019-03-25 | 2019-05-31 | 扬州扬杰电子科技股份有限公司 | A kind of semiconductor test apparatus |
-
2019
- 2019-03-25 CN CN201920386551.4U patent/CN209707644U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109828195A (en) * | 2019-03-25 | 2019-05-31 | 扬州扬杰电子科技股份有限公司 | A kind of semiconductor test apparatus |
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