CN209471158U - A kind of radio-frequency devices test probe of embedded inductance - Google Patents
A kind of radio-frequency devices test probe of embedded inductance Download PDFInfo
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- CN209471158U CN209471158U CN201821342819.6U CN201821342819U CN209471158U CN 209471158 U CN209471158 U CN 209471158U CN 201821342819 U CN201821342819 U CN 201821342819U CN 209471158 U CN209471158 U CN 209471158U
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- metal
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- frequency devices
- inductance
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Abstract
The utility model discloses a kind of radio-frequency devices of embedded inductance to test probe, comprising: substrate metal layer, the insulating layer being arranged on the upside of substrate metal layer, the head clearance of the insulating layer are provided with the first metal layer；The first metal layer includes the first metal, the second metal, third metal and the 4th metal, it is connected separately with metal probe on first metal, the second metal and third metal, the metal probe is connect with the signal input part of tested radio-frequency devices, signal output end and ground terminal respectively；First metal and the bimetallic other end are connected by cable with the signal output end of Network Analyzer；The other end of the third metal is connected with second metal layer and forms ambipolar inductance, and the other end of the second metal layer is connect with one end of the 4th metal, the other end ground connection of the 4th metal.The utility model can eliminate the test error as caused by cable and Network Analyzer and fluctuation, improve the precision of test, increase the accuracy of test.
Description
Technical field
The utility model belongs to radio-frequency devices testing field, and in particular to a kind of radio-frequency devices test spy of embedded inductance
Needle.
Background technique
With the arrival in 5G epoch, radio-frequency communication technology is quickly grown, and radio-frequency filter receives the great attention of industry.
In the production and research of radio-frequency devices, it is more sensitive to test macro that insider understands radio-frequency devices, therefore, radio frequency filter
The test result fluctuation of wave device is big, and precision is low.The inaccuracy of its test result, it will cause very big warp for manufacturer
Ji loss, can also cause undesirable influence to scientific research result.
Big for the test result fluctuation of radio-frequency filter, precision is low so that the accuracy difference of its test result into
Row analysis, discovery main cause derive from the following aspects: first is that the performance difference of Network Analyzer, even if to network analysis
Instrument does regularly verification investigation and maintenance, also will appear test fluctuation.Second is that signal delay caused by different cables, at present to survey
The verification of examination equipment can not often verify cable；Meanwhile the replacement of cable and disassembly will also result in test process larger
Test fluctuation.Third is that being directed to different products, client may require that when using the product adds the certain port of product
Coilloading or capacity cell are matched, and during batch testing, it manufactures chamber of commerce's selection and is matched by software view
Strategy tested, to improve production efficiency；But so operation, bring negative effect are then that test result may be with
The actual performance of product has larger difference.
Summary of the invention
(1) technical problems to be solved
To solve the above-mentioned problems, the utility model proposes a kind of radio-frequency devices of embedded inductance to test probe, passes through
A definite value inductance coil is directly embedded in test probe interior, hardware view is realized and the ground terminal of measured device is fitted
Match, the test error as caused by cable and Network Analyzer and fluctuation can be eliminated, improve the precision of test, increases survey
The accuracy of examination.
(2) technical solution
A kind of radio-frequency devices test probe of embedded inductance, comprising: substrate metal layer is arranged on the upside of substrate metal layer
The top distribution of insulating layer, the insulating layer is fixed with the first metal layer；The first metal layer includes the first metal, the
One end difference of two metals, third metal and the 4th metal, first metal, the second metal and third metallic upper surface is each
Self-retaining is connected with metal probe, the metal probe respectively with the signal input part of tested radio-frequency devices, signal output end
It is connected with ground terminal；First metal and the bimetallic other end are exported each by the signal of cable and Network Analyzer respectively
End is connected；The other end of the third metal is connected with second metal layer and forms ambipolar inductance, the second metal layer
The other end connect with one end of the 4th metal, the other end of the 4th metal ground connection.
Further, first metal and the second metal are separately positioned on the two sides at the top of insulating layer.
Further, first metal connection is the first probe, first probe and tested radio-frequency devices
Signal input part connection.
Further, the connection of the second metal is the second probe, the signal of second probe and tested radio-frequency devices
Output end connection.
Further, the middle part at the top of insulating layer is arranged in the third metal and the 4th metal.
Further, the third metal connection is third probe, the third probe and tested radio-frequency devices
Ground terminal connection.
Further, the cable is coaxial cable.
Further, the inside of the probe is embedded with inductance coil.
(3) beneficial effect
The utility model proposes a kind of embedded inductance radio-frequency devices test probe, compared with prior art, tool
Have it is following the utility model has the advantages that
(1) by directly embedding a definite value inductance coil in test probe interior, hardware view is realized to tested device
The ground terminal of part is adapted to, and the test error as caused by cable and Network Analyzer and fluctuation can be eliminated, and improves test
Precision, increase the accuracy of test.
(2) second metal layer is embedded in inside insulating layer, forms a definite value inductance, directly with the ground connection of measured device
After the matching of end and it is grounded.The signal between probe ground terminal and Network Analyzer is tested caused by eliminating the additional impedance because of cable
Transmission distortion reduces the fluctuation of test, keeps test more stable.
Detailed description of the invention
Fig. 1 is the schematic diagram of the section structure of the utility model.
Fig. 2 is the overlooking structure diagram of the utility model.
Label in attached drawing and components mark: 1- the first metal layer, the first metal of 11-, the second metal of 12-, 13- the
Three metals, the 4th metal of 14-, the first probe of 15-, the second probe of 16-, 17- third probe, 2- second metal layer, 3- insulation
Layer, 4- substrate metal layer.
Specific embodiment
As shown in Figs. 1-2, a kind of radio-frequency devices of embedded inductance test probe, comprising: substrate metal layer 4, the substrate
Metal layer 4 is the support metal layer of entire test fixture；The insulating layer 3 of 4 upside of substrate metal layer, the insulating layer are set
3 top distribution is fixed with the first metal layer 1；The first metal layer 1 includes the first metal 11, the second metal 12, third
Metal 13 and the 4th metal 14；First metal 11 and the second metal 12 is separately positioned on the two sides at 1 top of insulating layer；Institute
It states third metal 13 and the middle part at 3 top of insulating layer is arranged in the 4th metal 14.
One end of first metal, 11 upper surface is fixedly connected with the first probe 15, and first probe 15 is as whole
The signal output end of a test fixture is connect with the signal input part of tested radio-frequency devices；The other end conduct of first metal 11
The signal input part of entire test fixture, is connected by coaxial cable with the signal output end of Network Analyzer.
One end of second metal, 12 upper surface is fixedly connected with the second probe 16, and second probe 16 is as whole
The signal input part of a test fixture is connect with the signal output end of tested radio-frequency devices；The other end conduct of second metal 12
The signal output end of entire test fixture, is connected by coaxial cable with the signal output end of Network Analyzer.
One end of 13 upper surface of third metal is fixedly connected with third probe 17, the third probe 17 and quilt
Survey the ground terminal connection of radio-frequency devices.The other end of the third metal 13 is connected with second metal layer 2, and it is ambipolar fixed to be formed
It is worth inductance；The other end of the second metal layer 2 is connect with one end of the 4th metal 14, and the 4th metal 14 is as entire test
The ground terminal of fixture is grounded.Second metal layer 2 is embedded in the insulating layer 3, forms a definite value inductance, directly and measured device
Ground terminal matched after and be grounded, second metal layer 2 is made of semiconductor technology, the metal formed by adjusting it
The width and coil shape and the number of turns of coil can form an ambipolar definite value inductance.
The inside of first probe 15, the second probe 16 and third probe 17 is embedded with inductance coil.
Embodiment described above is only that preferred embodiments of the present invention are described, not practical to this
Novel conception and scope is defined.Without departing from the design concept of the present utility model, ordinary people in the field couple
The all variations and modifications that the technical solution of the utility model is made, should fall within the protection scope of the present utility model, this reality
With novel claimed technology contents, it is all described in the claims.
Claims (8)
1. a kind of radio-frequency devices of embedded inductance test probe, it is characterised in that: include: substrate metal layer (4), be arranged in substrate
The top distribution of insulating layer (3) on the upside of metal layer (4), the insulating layer (3) is fixed with the first metal layer (1)；Described
The first metal layer (1) includes the first metal (11), the second metal (12), third metal (13) and the 4th metal (14), described
One end of first metal (11), the second metal (12) and third metal (13) upper surface is respectively fixedly connected with metal spy respectively
Needle, the metal probe are connect with the signal input part of tested radio-frequency devices, signal output end and ground terminal respectively；First gold medal
The other end for belonging to (11) and the second metal (12) is connected each by cable with the signal output end of Network Analyzer respectively；It is described
The other end of third metal (13) be connected with second metal layer (2) and form ambipolar inductance, the second metal layer (2)
The other end is connect with one end of the 4th metal (14), the other end ground connection of the 4th metal (14).
2. a kind of radio-frequency devices of embedded inductance according to claim 1 test probe, it is characterised in that: described first
Metal (11) and the second metal (12) are separately positioned on the two sides at the top of insulating layer (3).
3. according to claim 1 or 2 its any one of described in a kind of embedded inductance radio-frequency devices test probe, feature
Be: the first metal (11) connection is the first probe (15), first probe (15) and tested radio-frequency devices
Signal input part connection.
4. according to claim 1 or 2 its any one of described in a kind of embedded inductance radio-frequency devices test probe, feature
Be: the second metal (12) connection is the second probe (16), second probe (16) and tested radio-frequency devices
Signal output end connection.
5. a kind of radio-frequency devices of embedded inductance according to claim 1 test probe, it is characterised in that: the third gold
Belong to the middle part of (13) and the setting of the 4th metal (14) at the top of insulating layer (3).
6. according to claim 1 or 5 its any one of described in a kind of embedded inductance radio-frequency devices test probe, feature
Be: third metal (13) connection is third probe (17), the third probe (17) and tested radio-frequency devices
Ground terminal connection.
7. a kind of radio-frequency devices of embedded inductance according to claim 1 test probe, it is characterised in that: the cable
For coaxial cable.
8. a kind of radio-frequency devices of embedded inductance according to claim 1 test probe, it is characterised in that: the probe
Inside be embedded with inductance coil.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201821342819.6U CN209471158U (en) | 2018-08-21 | 2018-08-21 | A kind of radio-frequency devices test probe of embedded inductance |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201821342819.6U CN209471158U (en) | 2018-08-21 | 2018-08-21 | A kind of radio-frequency devices test probe of embedded inductance |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN209471158U true CN209471158U (en) | 2019-10-08 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201821342819.6U Active CN209471158U (en) | 2018-08-21 | 2018-08-21 | A kind of radio-frequency devices test probe of embedded inductance |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109001500A (en) * | 2018-08-21 | 2018-12-14 | 淮阴师范学院 | A kind of radio-frequency devices test probe of embedded inductance |
-
2018
- 2018-08-21 CN CN201821342819.6U patent/CN209471158U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109001500A (en) * | 2018-08-21 | 2018-12-14 | 淮阴师范学院 | A kind of radio-frequency devices test probe of embedded inductance |
| CN109001500B (en) * | 2018-08-21 | 2024-01-02 | 淮阴师范学院 | Radio frequency device test probe of embedded inductance |
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