CN108646208A - A kind of automatic De- embedding method of multiport fixture - Google Patents
A kind of automatic De- embedding method of multiport fixture Download PDFInfo
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- CN108646208A CN108646208A CN201810583683.6A CN201810583683A CN108646208A CN 108646208 A CN108646208 A CN 108646208A CN 201810583683 A CN201810583683 A CN 201810583683A CN 108646208 A CN108646208 A CN 108646208A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
- G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
Abstract
The invention discloses a kind of automatic De- embedding methods of multiport fixture, belong to the communications field.The present invention carries out passivity, causality and symmetry by the S parameter to multiport fixture and reinforces, and improves the accuracy of De- embedding, and then improve the measuring accuracy of S parameter, reduces the requirement to multiport calibrating device, realizes simple and improves testing efficiency.
Description
Technical field
The invention belongs to the communications fields, and in particular to a kind of automatic De- embedding method of multiport fixture.
Background technology
As fast development, internet and the Internet of Things of the 5th third-generation mobile communication are to the requirements at the higher level of information transmission bandwidth,
Microwave and millimeter wave effect in digital link increasingly becomes the bottleneck factor for restricting quality data transmission, vector network analysis
Traditional microwave and millimeter wave instrument such as instrument is in the design of digital circuit using more and more extensive.First, in high-speed digital circuit
Test in, many measured pieces all without coaxial connector (such as High speed rear panel), can only by test fixture by measured piece with
Coaxial cable links together, and could further be tested under co-axial environments.But it is really special to obtain measured piece
Property, it is necessary to accurately remove chucking effect.Although can be modeled to fixture by electromagnetic simulation software, or non-coaxial
Measured piece substrate on build multiple calibration standards to carry out the calibrations such as TRL, SOLT, characterization and removal chucking effect, but this
A little methods are very complicated and time-consuming.Furthermore the measured piece of high-speed digital circuit generally uses difference form to carry out multiport
Signal transmission, the chucking effect efficiency that traditional method carries out multiport are very low.
Be Deco skill automatic fixture remove option (AFR) engineer can be helped quickly and accurately to remove non-coaxial device
Chucking effect in measuring environment, cardinal principle be using the time domain measurement of fixture come compensate the mismatch of input terminal and output end with
And loss, it can also work even if the mismatch of input terminal and output end differs.Use the option, it is necessary to be inputted first to fixture
The plane of reference at end carries out same axis calibration；Then one or more standard components are measured again, it is straight-through logical as the two-port of fixture
Road.
There are two main classes for existing multiport fixture De- embedding technology, and one kind is to make multiple standards calibrating device, is answered
The calibrations such as miscellaneous SOLT, TRL, complicated for operation and step are easy error, and in addition how to characterize this kind of calibrating device is also such methods
Difficult point, if processing is careless, calibration error is big；Furthermore the cost for making a variety of calibrating devices is also higher.
Another kind of method is the automatic fixture removing method of moral scientific ＆ technical corporation, and this method is easy to operate, it is only necessary to symmetrical
Twice of thru calibration part the effect of fixture can be removed.But due to the influence of test error, original fixture tests number
According to that can there are problems that passivity, causality and symmetry, De- embedding is carried out in data of problems, can be introduced test and be missed
Difference.
Invention content
For the above-mentioned technical problems in the prior art, the present invention proposes a kind of automatic De- embedding of multiport fixture
Method, reasonable design overcome the deficiencies in the prior art, have good effect.
To achieve the goals above, the present invention adopts the following technical scheme that：
A kind of automatic De- embedding method of multiport fixture, includes the following steps：
Step 1：Prepare symmetrical fixture and twice of direct-through line calibrating device, the spacing of transmission line is more than line width on symmetrical fixture
3-5 times or more；
Step 2：Measured piece and multiport vector network analyzer are linked together by test cable, using electronics school
Quasi- part completes the calibration of multiport vector network analyzer, and the test end face of entire multiport vector network analyzer is extended to
The coaxial fitting position of test cable；
Step 3：Symmetrical fixture is connected to the coaxial port of test cable, and is connect at the other port of symmetrical fixture
Enter measured piece, the original S parameter matrix of symmetrical fixture and measured piece is obtained by the multiport vector network analyzer after calibration
SRaw；
Step 4：Passivity, causality and Symmetry Detection are carried out to the original S parameter matrix obtained in step 3, according to
Formula (1) carries out passivity detection, and causality detection is carried out according to formula (2), and Symmetry Detection is carried out according to formula (3)；Such as
Obtained S parameter is unsatisfactory for any one of passivity, causality and symmetry, just carries out the compensation of the characteristic, detection and benefit
Modified S parameter matrix S is obtained after the completion of repayingupdate；
eigvalue(S*·S)≤1 (1)；
Si,j(t)=0, t≤tij(2)；
S=ST(3)；
Wherein, eigvalue () represents matrix exgenvalue, Si,j(t) the i-th row jth column element of S parameter matrix is represented
Time domain response；
Step 5：Twice of direct-through line calibrating device is linked on the cable of multiport vector network analyzer, and is measured twice
The original S parameter matrix of direct-through line calibrating deviceThen according to formula (1) carry out passivity detection, according to formula (2) into
Row causality detects, and Symmetry Detection is carried out according to formula (3)；The S parameter such as obtained is unsatisfactory for passivity, causality and symmetrical
Property any one, just carry out the compensation of the characteristic, after the completion of detection and compensation, obtain revised S parameter matrix
Step 6：Revised twice of direct-through line calibrating device S parameter matrix is obtained using vector matching methodTransmission
Jacobian matrixIts state space form is obtained according to lineary system theory, as shown in formula (4), by formula (4) discretization
Discrete state space form is obtained, as shown in formula (5)；
Wherein, A, B, C, D are the coefficient matrix of state space, and G, H are the coefficient matrixes of separate manufacturing firms form；
Step 7：The time domain response matrix that twice of direct-through line calibrating device can be obtained by formula (5), such as formula (6) institute
Show, then utilizes in formula (6)The time domain response of twice of direct-through line calibrating device is measured, so that it is determined that going out twice of direct-through line
The overall delay of calibrating device, the time domain response for followed by measuring twice of direct-through line calibrating device, left the half of twice direct-through line calibrating device
While being defined as left side calibrating device, right one side of something of twice of direct-through line calibrating device is defined as right side calibrating device, is obtained by time domain door method
Gating to left side calibrating device respondsLeft side calibrating device is obtained by the transformation of time domain to frequency domainParameter；Then anti-
The time domain response of twice of direct-through line calibrating device of orientation measurement, the gating that right side calibrating device is obtained by time domain door method respondRight side calibrating device is obtained by the transformation of time domain to frequency domainParameter；
If four parameters of left side calibrating device areFour parameters of right side calibrating device are For twice direct-through line calibrating device, we have 2 known quantitiesWithWith modified S parameter square in step 4
Battle array SupdateIn four elements, i.e.,Assuming that left side calibrating device and right side calibrating device are symmetrical respectively
, i.e.,From the foregoing it will be appreciated that only remaining 4 unknown quantitys：By Mason's public affairs
Formula and four thru calibration part S parameters can solve 4 unknown quantitys；
Step 8：Four parameters of left side calibrating device are obtained by step 7With four of right side calibrating device
ParameterThe length of transmission line, width and plank and fixture used on twice of direct-through line calibrating device simultaneously
It is completely the same, therefore the response of the Token Holder unilateral side fixture with unilateral calibrating device, according to the item number of transmission line, left side on fixture
Four parameters of calibrating device and four parameters of right side calibrating device, form the S parameter matrix S of fixtureFixAAnd SFixB, and by this two
A S parameter matrix conversion is the form T of T parameter matrixsFixAAnd TFixB；
Step 9：By modified S parameter matrix S in step 4updateBe converted to T parameter matrixs Tupdate, passed through according to formula (7)
It crosses matrix inversion operation and obtains the T parameter matrixs T of measured pieceDUT, and it is converted into S parameter matrix SDUT, De- embedding completion；
Tupdate=TFixA·TDUT·TFixA(7)；
Wherein, TFixAFor the time domain response of left side fixture, TFixBFor the time domain response of right side fixture.
Advantageous effects caused by the present invention：
The present invention obtains the S parameter of symmetrical twice of direct-through line calibrating device by port vector network analyzer, uses vector
Fitting algorithm handles S parameter to obtain its transmission function, by transmission function, is converted to state space form and is pressed from both sides
The shock response of tool obtains the time domain response of unilateral fixture and by being fourier transformed into frequency by the method for time domain door fixture
The S parameter of fixture is finally acted on original S parameter by domain using De- embedding algorithm, obtains the genuine property of fixture；
The acquisition algorithm of unilateral fixture S parameter；The fitting of symmetrical fixture S parameter is carried out using vector fitting algorithm, then
State space form is converted to, the S parameter of unilateral fixture is obtained using the method for time domain door gripping；
Present invention reduces the requirements to multiport calibrating device, realize simple and improve testing efficiency；
The present invention carries out passivity, causality and symmetry by the S parameter to multiport fixture and reinforces, and improves embedding
The accuracy entered, and then improve the measuring accuracy of S parameter.
Description of the drawings
Fig. 1 is symmetrical fixture and calibrating device structural schematic diagram.
Fig. 2 is test connection figure.
Fig. 3 is the flow chart of the method for the present invention.
Specific implementation mode
Below in conjunction with the accompanying drawings and specific implementation mode invention is further described in detail：
A kind of automatic De- embedding method of multiport fixture, flow is as shown in figure 3, include the following steps：
Step 1：Prepare symmetrical fixture and twice of direct-through line calibrating device, as shown in Figure 1, on symmetrical fixture transmission line spacing
More than 3-5 times or more of line width；
Step 2：Measured piece and multiport vector network analyzer are linked together by test cable, using electronics school
Quasi- part completes the calibration of multiport vector network analyzer, and the test end face of entire multiport vector network analyzer is extended to
The coaxial fitting position of test cable；
Step 3：Symmetrical fixture shown in FIG. 1 is connected to the coaxial port of test cable, and symmetrical fixture in addition
Port at access measured piece, as shown in Fig. 2, by multiport vector network analyzer after calibration obtain symmetrical fixture and by
Survey the original S parameter matrix S of partRaw；
Step 4：Passivity, causality and Symmetry Detection are carried out to the original S parameter matrix obtained in step 3, according to
Formula (1) carries out passivity detection, and causality detection is carried out according to formula (2), and Symmetry Detection is carried out according to formula (3)；Such as
Obtained S parameter is unsatisfactory for any one of passivity, causality and symmetry, just carries out the compensation of the characteristic, detection and benefit
Modified S parameter matrix S is obtained after the completion of repayingupdate；
eigvalue(S*·S)≤1 (1)；
Si,j(t)=0, t≤tij(2)；
S=ST(3)；
Wherein, eigvalue () represents matrix exgenvalue, Si,j(t) the i-th row jth column element of S parameter matrix is represented
Time domain response；
Step 5：Twice of direct-through line calibrating device is linked on the cable of multiport vector network analyzer, and is measured twice
The original S parameter matrix of direct-through line calibrating deviceThen according to formula (1) carry out passivity detection, according to formula (2) into
Row causality detects, and Symmetry Detection is carried out according to formula (3)；The S parameter such as obtained is unsatisfactory for passivity, causality and symmetrical
Property any one, just carry out the compensation of the characteristic, after the completion of detection and compensation, obtain revised S parameter matrix
Step 6：Revised twice of direct-through line calibrating device S parameter matrix is obtained using vector matching methodTransmission
Jacobian matrixIts state space form is obtained according to lineary system theory, as shown in formula (4), by formula (4) discretization
Discrete state space form is obtained, as shown in formula (5)；
Wherein, A, B, C, D are the coefficient matrix of state space, and G, H are the coefficient matrixes of separate manufacturing firms form；
Step 7：The time domain response matrix that twice of direct-through line calibrating device can be obtained by formula (5), such as formula (6) institute
Show, then utilizes in formula (6)The time domain response of twice of direct-through line calibrating device is measured, so that it is determined that going out twice of direct-through line
The overall delay of calibrating device, the time domain response for followed by measuring twice of direct-through line calibrating device, left the half of twice direct-through line calibrating device
While being defined as left side calibrating device, right one side of something of twice of direct-through line calibrating device is defined as right side calibrating device, is obtained by time domain door method
Gating to left side calibrating device respondsLeft side calibrating device is obtained by the transformation of time domain to frequency domainParameter；Then anti-
The time domain response of twice of direct-through line calibrating device of orientation measurement, the gating that right side calibrating device is obtained by time domain door method respondRight side calibrating device is obtained by the transformation of time domain to frequency domainParameter；
If four parameters of left side calibrating device areFour parameters of right side calibrating device are For twice direct-through line calibrating device, we have 2 known quantitiesWithWith modified S parameter square in step 4
Battle array SupdateIn four elements, i.e.,Assuming that left side calibrating device and right side calibrating device are symmetrical respectively
, i.e.,From the foregoing it will be appreciated that only remaining 4 unknown quantitys：By Mason's public affairs
Formula and four thru calibration part S parameters can solve 4 unknown quantitys；
Step 8：Four parameters of left side calibrating device are obtained by step 7With four of right side calibrating device
ParameterThe length of transmission line, width and plank and fixture used on twice of direct-through line calibrating device simultaneously
It is completely the same, therefore the response of the Token Holder unilateral side fixture with unilateral calibrating device, according to the item number of transmission line, left side on fixture
Four parameters of calibrating device and four parameters of right side calibrating device, form the S parameter matrix S of fixtureFixAAnd SFixB, and by this two
A S parameter matrix conversion is the form T of T parameter matrixsFixAAnd TFixB；
Step 9：By modified S parameter matrix S in step 4updateBe converted to T parameter matrixs Tupdate, passed through according to formula (7)
It crosses matrix inversion operation and obtains the T parameter matrixs T of measured pieceDUT, and it is converted into S parameter matrix SDUT, De- embedding completion；
Tupdate=TFixA·TDUT·TFixA(7)；
Wherein, TFixAFor the time domain response of left side fixture, TFixBFor the time domain response of right side fixture.
Certainly, above description is not limitation of the present invention, and the present invention is also not limited to the example above, this technology neck
The variations, modifications, additions or substitutions that the technical staff in domain is made in the essential scope of the present invention should also belong to the present invention's
Protection domain.
Claims (1)
1. a kind of automatic De- embedding method of multiport fixture, it is characterised in that：Include the following steps：
Step 1：Prepare symmetrical fixture and twice of direct-through line calibrating device, the spacing of transmission line is more than the 3-5 of line width on symmetrical fixture
Times or more；
Step 2：Measured piece and multiport vector network analyzer are linked together by test cable, using Electronic Calibration part
The calibration for completing multiport vector network analyzer, test is extended to by the test end face of entire multiport vector network analyzer
The coaxial fitting position of cable；
Step 3：Symmetrical fixture is connected to the coaxial port of test cable, and accesses quilt at the other port of symmetrical fixture
Part is surveyed, the original S parameter matrix S of symmetrical fixture and measured piece is obtained by the multiport vector network analyzer after calibrationRaw；
Step 4：Passivity, causality and Symmetry Detection are carried out to the original S parameter matrix obtained in step 3, according to formula
(1) passivity detection is carried out, causality detection is carried out according to formula (2), Symmetry Detection is carried out according to formula (3)；Such as obtain
S parameter be unsatisfactory for passivity, causality and symmetry any one, just carry out the compensation of the characteristic, detect and compensated
Modified S parameter matrix S is obtained afterupdate；
eigvalue(S*·S)≤1 (1)；
Si,j(t)=0, t≤tij(2)；
S=ST(3)；
Wherein, eigvalue () represents matrix exgenvalue, Si,j(t) time domain of the i-th row jth column element of S parameter matrix is represented
Response；
Step 5：Twice of direct-through line calibrating device is linked on the cable of multiport vector network analyzer, and measures twice and leads directly to
The original S parameter matrix of line calibrating deviceThen according to formula (1) carry out passivity detection, according to formula (2) carry out because
Fruit property detects, and Symmetry Detection is carried out according to formula (3)；As obtained S parameter is unsatisfactory for passivity, causality and symmetry
Any one, just carries out the compensation of the characteristic and obtains revised S parameter matrix after the completion of detection and compensation
Step 6：Revised twice of direct-through line calibrating device S parameter matrix is obtained using vector matching methodTransmission function
MatrixIts state space form is obtained according to lineary system theory, as shown in formula (4), formula (4) discretization is obtained
Discrete state space form, as shown in formula (5)；
Wherein, A, B, C, D are the coefficient matrix of state space, and G, H are the coefficient matrixes of separate manufacturing firms form；
Step 7：The time domain response matrix that twice of direct-through line calibrating device can be obtained by formula (5), as shown in formula (6), so
It utilizes in formula (6) afterwardsThe time domain response of twice of direct-through line calibrating device is measured, so that it is determined that going out twice of direct-through line calibration
The overall delay of part, the time domain response for followed by measuring twice of direct-through line calibrating device, twice direct-through line calibrating device it is left half of fixed
Justice is left side calibrating device, and right one side of something of twice of direct-through line calibrating device is defined as right side calibrating device, a left side is obtained by time domain door method
The gating of side calibration part respondsLeft side calibrating device is obtained by the transformation of time domain to frequency domainParameter；Then negative direction
The time domain response for measuring twice of direct-through line calibrating device, the gating that right side calibrating device is obtained by time domain door method respondIt is logical
The transformation for crossing time domain to frequency domain obtains right side calibrating deviceParameter；
If four parameters of left side calibrating device areFour parameters of right side calibrating device are For twice direct-through line calibrating device, we have 2 known quantitiesWithWith modified S parameter square in step 4
Battle array SupdateIn four elements, i.e.,Assuming that left side calibrating device and right side calibrating device are symmetrical respectively
, i.e.,From the foregoing it will be appreciated that only remaining 4 unknown quantitys：By Mason's public affairs
Formula and four thru calibration part S parameters can solve 4 unknown quantitys；
Step 8：Four parameters of left side calibrating device are obtained by step 7With four parameters of right side calibrating deviceLength, width and the plank used of transmission line and fixture are complete on twice of direct-through line calibrating device simultaneously
Unanimously, the response of the Token Holder unilateral side fixture therefore with unilateral calibrating device is calibrated according to the item number of transmission line, left side on fixture
Four parameters of part and four parameters of right side calibrating device, form the S parameter matrix S of fixtureFixAAnd SFixB, and the two S are joined
Matrix number is converted to the form T of T parameter matrixsFixAAnd TFixB；
Step 9：By modified S parameter matrix S in step 4updateBe converted to T parameter matrixs Tupdate, square is passed through according to formula (7)
Battle array inverse operation obtains the T parameter matrixs T of measured pieceDUT, and it is converted into S parameter matrix SDUT, De- embedding completion；
Tupdate=TFixA·TDUT·TFixA(7)；
Wherein, TFixAFor the time domain response of left side fixture, TFixBFor the time domain response of right side fixture.
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Cited By (6)
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| CN109254217A (en) * | 2018-11-12 | 2019-01-22 | 中电科仪器仪表有限公司 | A kind of S parameter extracting method of unilateral side fixture |
| CN110361685A (en) * | 2019-07-01 | 2019-10-22 | 北京无线电计量测试研究所 | A kind of wide-band oscilloscope probe transmission characteristic calibration method and system |
| CN112462178A (en) * | 2020-11-17 | 2021-03-09 | 海光信息技术股份有限公司 | Test structure and test method for S parameter of chip socket |
| CN113595658A (en) * | 2021-07-26 | 2021-11-02 | 宋宏平 | Greatly simplified calibration method for radio frequency or microwave multi-port expansion equipment |
| CN113960510A (en) * | 2021-10-20 | 2022-01-21 | 北京环境特性研究所 | Coaxial annular material electromagnetic parameter testing seat and testing system testing method |
| CN116449183A (en) * | 2023-04-24 | 2023-07-18 | 上海新微半导体有限公司 | De-embedding structure and method for on-chip test of radio frequency chip, storage medium and terminal |
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Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN109254217A (en) * | 2018-11-12 | 2019-01-22 | 中电科仪器仪表有限公司 | A kind of S parameter extracting method of unilateral side fixture |
| CN109254217B (en) * | 2018-11-12 | 2020-10-09 | 中电科仪器仪表有限公司 | S parameter extraction method of unilateral clamp |
| CN110361685A (en) * | 2019-07-01 | 2019-10-22 | 北京无线电计量测试研究所 | A kind of wide-band oscilloscope probe transmission characteristic calibration method and system |
| CN110361685B (en) * | 2019-07-01 | 2021-07-30 | 北京无线电计量测试研究所 | Broadband oscilloscope probe transmission characteristic calibration method and system |
| CN112462178A (en) * | 2020-11-17 | 2021-03-09 | 海光信息技术股份有限公司 | Test structure and test method for S parameter of chip socket |
| CN113595658A (en) * | 2021-07-26 | 2021-11-02 | 宋宏平 | Greatly simplified calibration method for radio frequency or microwave multi-port expansion equipment |
| CN113960510A (en) * | 2021-10-20 | 2022-01-21 | 北京环境特性研究所 | Coaxial annular material electromagnetic parameter testing seat and testing system testing method |
| CN113960510B (en) * | 2021-10-20 | 2024-01-19 | 北京环境特性研究所 | Coaxial annular material electromagnetic parameter test seat and test system test method |
| CN116449183A (en) * | 2023-04-24 | 2023-07-18 | 上海新微半导体有限公司 | De-embedding structure and method for on-chip test of radio frequency chip, storage medium and terminal |
| CN116449183B (en) * | 2023-04-24 | 2024-04-05 | 上海新微半导体有限公司 | De-embedding structure and method for on-chip test of radio frequency chip, storage medium and terminal |
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