CN106771709A - A kind of S parameter De- embedding method of multiport network - Google Patents

Abstract

The present invention proposes a kind of S parameter De- embedding method of multiport network, multiport fixture S parameter is obtained first, is obtained after the S parameter of integral clamp, then removed fixture S parameter using matrix operation, when De- embedding treatment is carried out, publicity derivation is carried out using the mode of incidence wave/back wave.Compared to the De- embedding method that existing use Electromagnetic Simulation calculates fixture parameter, precision of the invention is higher；Compared to TRL calibrations, calibration of the invention is easy, calibrating device easily makes.

Description

A kind of S parameter De- embedding method of multiport network

Technical field

The present invention relates to technical field of measurement and test, the S parameter De- embedding method of more particularly to a kind of multiport network.

Background technology

Present multiport device, connector are increasing, and testing requirement also increases.In face of a variety of devices, connection Device is, it is necessary to make special fixture to be connected on vector network instrument port.The influence of removal fixture is needed in testing, just Two kinds of solutions are needed, the first is De- embedding, second is calibration.

The mode of the first De- embedding：Fixture parameter is calculated using Electromagnetic Simulation, but due to fixture reality processing, system The reason such as make, it is larger with simulation parameter difference, cause final testing result difference larger.

Second mode of calibration：Make special calibrating device, but because the calibrating device manufacture difficulty for customizing is big, calibrated Journey is complicated so that test is difficult.

The content of the invention

To solve above-mentioned deficiency of the prior art, the present invention proposes a kind of S parameter De- embedding method of multiport network.

The technical proposal of the invention is realized in this way：

A kind of S parameter De- embedding method of multiport network, obtains multiport fixture S parameter first, obtains integral clamp S parameter after, fixture S parameter is removed using matrix operation then, when carrying out De- embedding and processing, using incidence wave/anti- The mode of ejected wave carries out publicity derivation.

Alternatively, the step of obtaining multiport fixture S parameter, specifically includes：

For multiport fixture, by fixture, each port is symmetrically spliced, and forms symmetric double port fixture structure, and then Fixture parameter is calculated, is then spliced the S parameter of each port of fixture, obtain the S parameter of integral clamp, specific meter Calculation process is as follows：

Step (a), after calibration, direct measurement obtains the S parameter of integral clamp：S11、S21、S12、S22；

Step (b), T11 is obtained by the conversion of S11 time domains, and the time at its peak-peak is designated as t₁；

Step (c), T21 is obtained by the conversion of S21 time domains, and the time at its peak-peak is designated as t₂；

Step (d), with t₁Centered on, 2 (t₂-t₁) for width sets door, S11 is intercepted, obtain S11_A；

Step (e), similarly, can obtain S11_B；

Obtained by S parameter relation

Wherein, the integral clamp S parameter that S11, S21, S12, S22 are measured for lattice gauge；S11_A、S21_A、S12_A、S22_A It is the S parameter of fixture A；S11_B、S21_B、S12_B、S22_BIt is the S parameter of fixture B；

And then obtain：

Due to being symmetrical fixture, so S21_A=S12_A=S21_B=S12_B, S21=S12, so：

The S parameter of each port of fixture is spliced, the S parameter of integral clamp is obtained.

Alternatively, the step of use matrix operation removes fixture S parameter, specifically includes：

For N-port measured piece network：

For X port networks, its S parameter is as follows：

For Y-port network, its S parameter is as follows：

For the universe network that lattice gauge is tested, its S parameter is as follows：

According to incidence wave and the relation of back wave, following matrix is set up：

Wherein, a_iIt is the incidence wave of each network, b_iIt is the back wave of each network；

And the incidence wave for measured piece both sides has following relation with back wave：

Wherein：

The above-mentioned equation of simultaneous, eliminates

Obtain：

[S]=[C (TS-A)^-qB+D]^-1 (13)

So far, the S parameter De- embedding operation of N-port network is completed.

The beneficial effects of the invention are as follows：

(1) the De- embedding method of fixture parameter is calculated compared to existing use Electromagnetic Simulation, precision of the invention is more It is high；

(2) calibrated compared to TRL, calibration of the invention is easy, calibrating device easily makes.

Brief description of the drawings

In order to illustrate more clearly about the embodiment of the present invention or technical scheme of the prior art, below will be to embodiment or existing The accompanying drawing to be used needed for having technology description is briefly described, it should be apparent that, drawings in the following description are only this Some embodiments of invention, for those of ordinary skill in the art, on the premise of not paying creative work, can be with Other accompanying drawings are obtained according to these accompanying drawings.

Fig. 1 is symmetric double port fixture signal model schematic diagram of the invention；

Fig. 2 is the principle schematic of multiport network S parameter De- embedding method of the invention；

Fig. 3 is a principle schematic for specific embodiment of multiport network S parameter De- embedding method of the invention.

Specific embodiment

Below in conjunction with the accompanying drawing in the embodiment of the present invention, the technical scheme in the embodiment of the present invention is carried out clear, complete Site preparation is described, it is clear that described embodiment is only a part of embodiment of the invention, rather than whole embodiments.It is based on Embodiment in the present invention, it is every other that those of ordinary skill in the art are obtained under the premise of creative work is not made Embodiment, belongs to the scope of protection of the invention.

With the development of electronic information technology, multiport device is increasing, and device packing forms, interface type Also it is increasing, test the problem that such devices are accomplished by facing multiport fixture De- embedding using Network Analyzer.

The present invention proposes a kind of S parameter De- embedding method of multiport network, carries out multiport using time domain mode first The acquisition of fixture parameter, is then removed fixture S parameter using matrix operation.

In the obtaining step of multiport fixture parameter, for multiport fixture, by fixture, each port is symmetrically spliced, Symmetric double port fixture structure as shown in Figure 1 is formed, and then is calculated fixture parameter, then by the S of each port of fixture Parameter is spliced, and obtains the S parameter of integral clamp, and specific calculating process is as follows：

Step (a), after calibration, direct measurement to the overall S parameter of fixture：S11、S21、S12、S22；

Step (b), T11 is obtained by the conversion of S11 time domains, and the time at its peak-peak is designated as t₁；

Step (c), T21 is obtained by the conversion of S21 time domains, and the time at its peak-peak is designated as t₂；

Step (d), with t₁Centered on, 2 (t₂-t₁) for width sets door, S11 is intercepted, obtain S11_A；

Step (e), similarly, can obtain S11_B。

Obtained by S parameter relation in Fig. 1 signal flow diagrams

Wherein, the overall S parameter that S11, S21, S12, S22 are measured for lattice gauge；S11_A、S21_A、S12_A、S22_AIt is folder Has the S parameter of A；S11_B、S21_B、S12_B、S22_BIt is the S parameter of fixture B.

And then obtain：

Due to being symmetrical fixture, so S21_A=S12_A=S21_B=S12_B, S21=S12, so：

The S parameter of each port of fixture is spliced, the S parameter of integral clamp is obtained.

After obtaining the S parameter of integral clamp, next, fixture S parameter is removed using matrix operation, carry out it is embedding When entering to process, publicity derivation is carried out using the mode of incidence wave/back wave.

As shown in Fig. 2 for N-port measured piece network：

For X port networks, its S parameter is as follows：

For Y-port network, its S parameter is as follows：

For the universe network that lattice gauge is tested, its S parameter is as follows：

According to incidence wave and the relation of back wave, following matrix is set up：

Wherein, a_iIt is the incidence wave of each network, b_iIt is the back wave of each network；

And the incidence wave for measured piece both sides has following relation with back wave：

Wherein：

The above-mentioned equation of simultaneous, eliminates

Obtain：

[S]=[C (TS-A)^-1B+D]^-1 (13)

So far, the S parameter De- embedding operation of N-port network is completed, the influence of multiport fixture is removed, measured piece is obtained Actual parameter.

A specific embodiment is given below to illustrate the S parameter De- embedding step of multiport of the invention, such as Fig. 3 Shown, the embodiment carries out the derivation of equation so that three port measured pieces remove embedding four port and two-port network as an example.

The S parameter of four port networks, two-port network and overall network is as follows：

Wherein, S1S is the S parameter of four port networks, and S2S is the S parameter of two-port network, and TS is four port networks, quilt Part, the S parameter of two-port network cascade are surveyed, S is the network parameter of measured piece, and S11, S21, S12, S22 are measured for lattice gauge Overall S parameter.

Using back wave and the relation of incidence wave, overall relational matrix is built：

Wherein, b₁、...、b₉It is the back wave of each network, a₁、...、a₉It is the incidence wave of each network, other specification is net The S parameter of network, A, B, C, D are the matrix after splitting, and S is the S parameter matrix of measured piece.

In addition by incidence wave in Fig. 3 and back wave, following relation can also be built：

Simultaneous equations (16), (17), (18), eliminateObtain

[S]=[C (TS-A)^-1B+D]^-1 (19)

So far, the influence of multiport fixture is can remove by above-mentioned formula, the actual parameter of measured piece is obtained.

Compared to the De- embedding method that existing use Electromagnetic Simulation calculates fixture parameter, precision of the invention is higher； Compared to TRL calibrations, calibration of the invention is easy, calibrating device easily makes.

Presently preferred embodiments of the present invention is the foregoing is only, is not intended to limit the invention, it is all in essence of the invention Within god and principle, any modification, equivalent substitution and improvements made etc. should be included within the scope of the present invention.

Claims (3)

1. a kind of S parameter De- embedding method of multiport network, it is characterised in that obtain multiport fixture S parameter first, obtain After the S parameter of integral clamp, fixture S parameter is removed using matrix operation then, when carrying out De- embedding and processing, using entering The mode of ejected wave/back wave carries out publicity derivation.

2. the S parameter De- embedding method of a kind of multiport network as claimed in claim 1, it is characterised in that obtain multiport The step of fixture S parameter, specifically include：

For multiport fixture, by fixture, each port is symmetrically spliced, and forms symmetric double port fixture structure, and then calculate Fixture parameter is obtained, is then spliced the S parameter of each port of fixture, obtain the S parameter of integral clamp, specifically calculated Journey is as follows：

Step (a), after calibration, direct measurement obtains the S parameter of integral clamp：S11、S21、S12、S22；

Step (b), T11 is obtained by the conversion of S11 time domains, and the time at its peak-peak is designated as t₁；

Step (c), T21 is obtained by the conversion of S21 time domains, and the time at its peak-peak is designated as t₂；

Step (d), with t₁Centered on, 2 (t₂-t₁) for width sets door, S11 is intercepted, obtain S11_A；

Step (e), similarly, can obtain S11_B；

Obtained by S parameter relation

$S11=S{11}_A+\frac{S{21}_{A}S{12}_{A}S{22}_B}{1-S{22}_{A}S{22}_B}---\left(1\right)$

$S21=\frac{S{21}_{A}S{12}_B}{1-S{22}_{A}S{22}_B}---\left(2\right)$

$S12=\frac{S{12}_{A}S{21}_B}{1-S{22}_{A}S{22}_B}---\left(3\right)$

$S22=S{11}_B+\frac{S{21}_{B}S{12}_{B}S{22}_A}{1-S{22}_{A}S{22}_B}---\left(4\right)$

Wherein, the integral clamp S parameter that S11, S21, S12, S22 are measured for lattice gauge；S11_A、S21_A、S12_A、S22_AIt is fixture The S parameter of A；S11_B、S21_B、S12_B、S22_BIt is the S parameter of fixture B；

And then obtain：

$S{22}_{A}S{22}_B=\frac{\left(S11-S{11}_A\right)\left(S22-S{22}_B\right)}{S21\·S12}---\left(5\right)$

Due to being symmetrical fixture, so S21_A=S12_A=S21_B=S12_B, S21=S12, so：

$S{22}_B=\frac{S11-S{11}_A}{S21},S{22}_A=\frac{S22-S{11}_B}{S21}---\left(6\right)$

$S{21}_A=S{12}_A=S{21}_B=S{12}_B=\sqrt{\frac{S{21}^2-\left(S11-S{11}_A\right)\left(S22-S{11}_B\right)}{S21}}---\left(7\right)$

The S parameter of each port of fixture is spliced, the S parameter of integral clamp is obtained.

3. a kind of S parameter De- embedding method of multiport network as claimed in claim 1, it is characterised in that the use square The step of battle array computing removes fixture S parameter, specifically includes：

For N-port measured piece network：

For X port networks, its S parameter is as follows：

For Y-port network, its S parameter is as follows：

For the universe network that lattice gauge is tested, its S parameter is as follows：

According to incidence wave and the relation of back wave, following matrix is set up：

Wherein, a_iIt is the incidence wave of each network, b_iIt is the back wave of each network；

And the incidence wave for measured piece both sides has following relation with back wave：

$a_i=b_{i+\frac{X+Y}{2}}$

$b_i=a_{i+\frac{X+Y}{2}}---\left(12\right)$

Wherein：

The above-mentioned equation of simultaneous, eliminates

Obtain：

[S]=[C (TS-A)^-1B+D]^-1 (13)

So far, the S parameter De- embedding operation of N-port network is completed.