CN107091847A - A kind of dielectric material measuring electromagnetic parameters device and measuring method - Google Patents
A kind of dielectric material measuring electromagnetic parameters device and measuring method Download PDFInfo
- Publication number
- CN107091847A CN107091847A CN201710402147.7A CN201710402147A CN107091847A CN 107091847 A CN107091847 A CN 107091847A CN 201710402147 A CN201710402147 A CN 201710402147A CN 107091847 A CN107091847 A CN 107091847A
- Authority
- CN
- China
- Prior art keywords
- cavity
- sample
- measurement
- dielectric material
- measuring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000003989 dielectric material Substances 0.000 title claims abstract description 45
- 238000000034 method Methods 0.000 title claims abstract description 36
- 238000005259 measurement Methods 0.000 claims abstract description 113
- 238000012360 testing method Methods 0.000 claims abstract description 41
- 239000000463 material Substances 0.000 claims abstract description 36
- 230000035699 permeability Effects 0.000 claims description 15
- 239000004033 plastic Substances 0.000 claims description 3
- 229920003023 plastic Polymers 0.000 claims description 3
- 230000008859 change Effects 0.000 claims description 2
- 238000004321 preservation Methods 0.000 claims description 2
- 208000002925 dental caries Diseases 0.000 claims 1
- 238000000151 deposition Methods 0.000 claims 1
- 230000005540 biological transmission Effects 0.000 abstract description 18
- 230000008901 benefit Effects 0.000 abstract description 13
- 230000002159 abnormal effect Effects 0.000 abstract description 6
- 238000005538 encapsulation Methods 0.000 abstract description 4
- 238000004458 analytical method Methods 0.000 abstract description 2
- 238000001028 reflection method Methods 0.000 abstract 1
- 230000005611 electricity Effects 0.000 description 4
- 230000005672 electromagnetic field Effects 0.000 description 3
- 239000007788 liquid Substances 0.000 description 3
- 230000008569 process Effects 0.000 description 3
- 241000208340 Araliaceae Species 0.000 description 2
- 235000005035 Panax pseudoginseng ssp. pseudoginseng Nutrition 0.000 description 2
- 235000003140 Panax quinquefolius Nutrition 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000000686 essence Substances 0.000 description 2
- 235000008434 ginseng Nutrition 0.000 description 2
- 229920001343 polytetrafluoroethylene Polymers 0.000 description 2
- 239000004810 polytetrafluoroethylene Substances 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 230000007123 defense Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000004744 fabric Substances 0.000 description 1
- 238000000227 grinding Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000003032 molecular docking Methods 0.000 description 1
- -1 polytetrafluoroethylene Polymers 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N22/00—Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more
Landscapes
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Abstract
The present invention is applied to dielectric material fields of measurement there is provided a kind of dielectric material measuring electromagnetic parameters device and measuring method, and dielectric material measuring electromagnetic parameters device includes：Microwave vector network analyzer；Special-shaped coaxial measured material；The input coaxial cable and output coaxial cable at the special-shaped coaxial measured material two ends are connected respectively；The GPIB data collecting cards being connected with microwave vector network analyzer and the computer being connected with the GPIB data collecting cards.Dielectric material measuring electromagnetic parameters device in the embodiment of the present invention, by setting the coaxial measured material of abnormal shape and being provided for the testing cassete that encapsulation measures sample in special-shaped coaxial measured material, it make use of Resonant-cavity Method measurement accuracy high and transmission/reflection method for measuring bandwidth advantage, so that the dielectric material measuring electromagnetic parameters measurement device precision is high and measures bandwidth, by setting microwave vector network analyzer and computer automatic analysis measurement data, make measuring speed fast.
Description
Technical field
The invention belongs to dielectric material fields of measurement, more particularly to a kind of dielectric material measuring electromagnetic parameters device and measurement
Method.
Background technology
With extensive use of the new material in communication, computer, national defense industry, production firm and user are to material
The requirement of measurement accuracy and measurement range also more and more higher, and complex dielectric permittivity and complex permeability are that to characterize dielectric material electromagnetism special
Property important parameter, how to meet manufacturer under the new situation and user to the electromagnetism such as complex dielectric permittivity, the complex permeability of new material join
The requirement of several measurement accuracy and measurement range is the new problem faced in microwave testing.
In the prior art, the electromagnetic parameter such as complex dielectric permittivity and complex permeability is generally only with resonant cavity perturbation method, freedom
One kind in space law or transmission/bounce technique is measured.Although the measurement accuracy of resonant cavity perturbation method is high, resonant cavity perturbation
Method can only measure the electromagnetic parameter of one or limited frequency, and measuring speed is slow；The test scope of free-space Method is wide, but its
Measurement accuracy is limited；The measurement bandwidth of transmission/bounce technique, but when thickness of sample is corresponding half of the waveguide wavelength of test frequency
Integral multiple when, the method for testing is unstable easily to there is thickness resonance.
Therefore, the dielectric material measuring electromagnetic parameters device of prior art can not meet that measuring speed is fast, measurement frequency simultaneously
Bandwidth and the high requirement of measurement accuracy.
The content of the invention
The present invention provides a kind of dielectric material measuring electromagnetic parameters device, it is intended to which solving prior art can not be while accomplishes to survey
The problem of measuring fast speed, measurement bandwidth and high measurement accuracy.
The present invention is achieved in that a kind of dielectric material measuring electromagnetic parameters device includes：
Microwave vector network analyzer, the microwave vector network analyzer, which includes microwave signal output port, microwave, to be believed
Number input port and data output end；
Special-shaped coaxial measured material, the special-shaped coaxial measured material includes setting gradually and surrounding the first of closing space
Cavity, middle sample cavity and the second cavity, first cavity, the middle sample cavity and second chamber
Body is coaxially disposed, and the special-shaped coaxial measured material is also in first cavity and coaxial with first cavity including being fixed on
The first newel for setting, the second newel for being fixed in first cavity and being coaxially disposed with second cavity and
In the middle sample cavity and positioned at the testing cassete between first newel and second newel；
Coaxial cable is inputted, described input coaxial cable one end connects the microwave signal output port, other end connection
One end of the remote middle sample cavity of first cavity simultaneously inputs electromagnetic wave into first cavity；
Coaxial cable is exported, described output coaxial cable one end connects the microwave signal input port, other end connection
One end of the remote middle sample cavity of second cavity simultaneously exports the electromagnetic wave in second cavity；
GPIB data collecting cards, the input of the GPIB data collecting cards is connected with the data output end；
Computer, the computer is connected with the output end of the GPIB data collecting cards.
The present invention also provides a kind of measuring method of the application dielectric material measuring electromagnetic parameters device, including following step
Suddenly：
Measurement sample is positioned in the measuring box and sealed；
The input coaxial cable and the output coaxial cable are connected into calibrating device respectively, and by the microwave vector net
Network analyzer, the GPIB data acquisition cards are connected with the computer, and error school is carried out to the vector network analyzer
It is accurate；
The input coaxial cable and the output coaxial cable are connected into the special-shaped coaxial measured material respectively to carry out
Transmission calibration；
Standard sample is put into the measurement position in the middle sample cavity, the measurement of corresponding electromagnetic parameter is carried out
And input the corresponding electromagnetic parameter of the standard sample；
The standard sample is taken out, the testing cassete that will be equipped with measuring sample is put into the middle sample cavity
Measurement position, carry out the measurement of corresponding electromagnetic parameter, the computer calculates and shown automatically the electromagnetism of the measurement sample
Parameter is simultaneously preserved.
Dielectric material measuring electromagnetic parameters device in the embodiment of the present invention, by the way that the special-shaped coaxial measured material is set
It is set to coaxial line and surrounds the first cavity, middle sample cavity and the second cavity of closing space, makes to form coaxial resonance
Chamber, and intermediate cavity be provided for encapsulation measurement sample testing cassete, the advantage that make use of Resonant-cavity Method measurement accuracy high so that
Make measuring accuracy high；The electromagnetic parameter of measurement is calculated and shown automatically by using the computer, and measuring speed is fast, so that
Measurement efficiency is high；By setting microwave vector network analyzer to automatically analyze the scattering parameter of the measurement sample, biography make use of
The advantage of the measurement bandwidth of defeated/bounce technique, makes measurement bandwidth.The application dielectric material electricity provided in an embodiment of the present invention
The measuring method of magnetic parameters device combines the advantage of Resonant-cavity Method and transmission/bounce technique, and measurement accuracy is high, measuring speed
Fast and measurement bandwidth.
Brief description of the drawings
Fig. 1 is a kind of structured flowchart of dielectric material measuring electromagnetic parameters device provided in an embodiment of the present invention；
Fig. 2 is a kind of coaxial measured material of abnormal shape of dielectric material measuring electromagnetic parameters device provided in an embodiment of the present invention
Structural representation；
Fig. 3 is a kind of coaxial measured material of abnormal shape of dielectric material measuring electromagnetic parameters device provided in an embodiment of the present invention
Another angle structural representation；
Fig. 4 is a kind of structure of the first support member of dielectric material measuring electromagnetic parameters device provided in an embodiment of the present invention
Schematic diagram；
Fig. 5 is a kind of stream of the measuring method of applicating medium material measuring electromagnetic parameters device provided in an embodiment of the present invention
Cheng Tu.
Embodiment
In order to make the purpose , technical scheme and advantage of the present invention be clearer, it is right below in conjunction with drawings and Examples
The present invention is further elaborated.It should be appreciated that the specific embodiments described herein are merely illustrative of the present invention, and
It is not used in the restriction present invention.
Dielectric material measuring electromagnetic parameters device provided in an embodiment of the present invention, by by the special-shaped coaxial measured material
It is arranged to coaxial line and surrounds the first cavity, middle sample cavity and the second cavity of closing space, makes to form coaxial humorous
Shake chamber, and is provided for the testing cassete of encapsulation measurement sample in intermediate cavity, and in measurement process, testing cassete is in the space of closing
It is interior, the interference of external electromagnetic field is eliminated, internal magnetic field is protected, the advantage that make use of Resonant-cavity Method measurement accuracy high,
So that measurement accuracy is high；By setting the electromagnetic parameter that the computer is calculated automatically and display is measured, measuring speed is fast；It is logical
The scattering parameter for setting microwave vector network analyzer to automatically analyze the measurement sample is crossed, the survey of transmission/bounce technique is make use of
The advantage of bandwidth is measured, makes measurement bandwidth.
Incorporated by reference to reference picture 1- Fig. 3, wherein, Fig. 1 shows a kind of dielectric material electromagnetism ginseng provided in an embodiment of the present invention
The structured flowchart of number measurement apparatus；Fig. 2 is a kind of the different of dielectric material measuring electromagnetic parameters device provided in an embodiment of the present invention
The structural representation of the coaxial measured material of type；Fig. 3 is a kind of dielectric material measuring electromagnetic parameters dress provided in an embodiment of the present invention
The structural representation of another angle for the coaxial measured material of abnormal shape put.It is used as one embodiment of the present of invention, the dielectric material
Measuring electromagnetic parameters device includes：
Microwave vector network analyzer 1, the microwave vector network analyzer 1 includes microwave signal output port, microwave
Signal input port and data output end；
Special-shaped coaxial measured material 2, the special-shaped coaxial measured material 2 includes setting gradually and surround the of closing space
One cavity 21, middle sample cavity 22 and the second cavity 23, first cavity 21, the middle sample cavity 22
It is coaxially disposed with second cavity 23, the special-shaped coaxial measured material 2 also includes being fixed in first cavity 21 simultaneously
The first newel 24 for being coaxially disposed with first cavity 21, be fixed in second cavity 23 and with second cavity
23 the second newels 25 being coaxially disposed and in the middle sample cavity 22 and positioned at first newel
Testing cassete 26 between 24 and second newel 25；
Coaxial cable 3 is inputted, described input coaxial cable 3 one end connects the microwave signal output port, and the other end connects
Connect one end of the remote middle sample cavity 22 of first cavity 21 and electricity is inputted into first cavity 21
Magnetic wave；
Coaxial cable 4 is exported, described output coaxial cable 4 one end connects the microwave signal input port, and the other end connects
Connect one end of the remote middle sample cavity 22 of second cavity 23 and export the electricity in second cavity 23
Magnetic wave；
GPIB data collecting cards 5, the input of the GPIB data collecting cards 5 is connected with the data output end；
Computer 6, the computer 6 is connected with the output end of the GPIB data collecting cards 5.
The dielectric material measuring electromagnetic parameters device that the present invention is provided tests essence in the electromagnetic parameter of tested media material
Degree is high, measuring speed is fast and measurement bandwidth.
In an embodiment of the present invention, first cavity 21, the middle sample cavity 22 and second chamber
The formation coaxial resonant cavity of body 23, the microwave vector network analyzer 1 produce electromagnetic wave and by the input coaxial cable 3 to
Input electromagnetic wave in first cavity 21, electromagnetic wave is transmitted to first cavity 21 by first newel 24,
Through measuring the transmission of sample and being reflected into second cavity 23, then through second newel in second cavity 23
25 transmit to the output coaxial cable 4, and electromagnetic wave inputs the microwave signal input through the output coaxial cable 4 again
Mouthful, the microwave vector network analyzer 1 automatically analyzes the scattering parameter S of measurement sample, and the GPIB data collecting cards 5 are gathered
The data of the analysis of microwave vector network analyzer 1 are simultaneously exported to the computer 6, and the computer 6 is calculated and aobvious automatically
Show the electromagnetic parameter of measurement sample, by the way that first cavity 21, middle sample cavity 22 and the second cavity 23 are constituted
Coaxial resonant cavity, makes resonator measuring method can be made full use of to measure accurate advantage, while by second cavity 23
It is interior that the testing cassete is set, corresponding electromagnetic parameter is automatically analyzed and calculates after measuring sample transfer and reflection in electromagnetic wave,
Measuring speed is fast, and preferably make use of the advantage of the measurement bandwidth of transmission/bounce technique, therefore, the dielectric material electromagnetism
Parameter measuring apparatus has the advantages that measurement accuracy is high, measuring speed is fast and measure bandwidth simultaneously.
It is used as the practical application of the present invention, such as measurement complex dielectric permittivity and complex permeability parameter.Wherein, multiple dielectric is normal
Number and the Computing Principle of complex permeability are as follows：
First, according to the formula of complex permeability, complex dielectric permittivity and reflectance factor：
(1)
(2)
Wherein Γ is reflectance factor, μrFor complex permeability, εrFor complex dielectric permittivity, T is transmission coefficient, and L is sample length.
Microwave signal output port, microwave signal input port two-port further according to microwave vector network analyzer 1
Relation between scattering parameter S, reflectance factor Γ and transmission coefficient T：
(3)
(4)
Wherein, S11For input reflection coefficient, S21For output reflection coefficient.
Combinatorial formula (1), (2), (3), (4) formula can release the value of complex dielectric permittivity and complex permeability.
In an embodiment of the present invention, first cavity 21 and second cavity 23 are tapered, first cavity
21 it is interior without leave input electromagnetic wave one end gradually increase to the direction of intermediate cavity 22, second cavity 23 it is interior defeated without leave
The one end for going out electromagnetic wave gradually increases to the direction of intermediate cavity 22, meanwhile, the interior of first newel 24 inputs electricity without leave
One end of magnetic wave gradually increases to the direction of intermediate cavity 22, interior one end for exporting electromagnetic wave without leave of second newel 25
Gradually increase to the direction of intermediate cavity 22, because the structure for boring deformation type meets transmission/reflection theory, higher mode can be reduced
Influence to measurement result, so as to improve the precision of measurement.
One end of the close testing cassete 26 of first newel 24 and second newel 25 is all provided with being set to circle
Head, beneficial to the transmission of electromagnetic field.
One end of input electromagnetic wave of first cavity 21 forms the first N-type with one end of first newel 25 and turned
Joint, one end of output electromagnetic wave and one end of second newel 25 of second cavity 23 are similarly formed the second N-type
Adapter, the input coaxial cable 3 is connected with the first N-type adapter, the output coaxial cable 4 and described second
N-type adapter is connected, due to N-type adapter can directly with coaxial cable grafting so that the input coaxial cable 3 and described
Export coaxial cable 4 and docking for the coaxial measured material 2 of the abnormal shape is quick and easy.
As one embodiment of the present of invention, second newel 25 includes being fixed on consolidating in second cavity 23
Fixed column body 251 and the movable cylinder 252 for being movably connected on the fixed cylinder 251, the movable cylinder 252 are located at close to described
The side of testing cassete 26 can simultaneously stretch along the length direction of the fixed cylinder 251.By by the one of second newel 25
End is arranged to Collapsible structure, can according to the length adjustment of measurement sample the length of the second newel 25 and by the activity
Cylinder 252 withstands the testing cassete 26, and the sample measurement of different length can be achieved, makes measurement range wide.
As a preferred embodiment of the present invention, screwed hole, the movable cylinder are offered on the fixed cylinder 251
252 include the movable bulb 2521 abutted with the testing cassete 26 and the threaded post being connected with the movable bulb 2521
2522, the threaded post 2522 is connected with the screwed hole by screw thread.The fixed cylinder 251 and the movable bulb
Cooperated and connected by screw thread between 2521, when adjusting the length of second newel 25, only need to gently twist the activity
Bulb 2521 is the length adjustment that second newel 25 can be achieved, and its is simple to operate.
The testing cassete 26 is cylindrical, and the opening for injecting measurement sample is offered on the testing cassete 26, described
Testing cassete 26 can hold the measurement sample of solid-state or liquid, can meet the measurement of the measurement sample of different conditions.
As one embodiment of the present of invention, the special-shaped coaxial measured material 2 also includes being fixed on first cavity
21 outer walls simultaneously surround the first fixture 27 of first cavity 21 setting, are fixed on the outer wall of the second cavity 23 and around institute
State the second fixture 28 of the second cavity 23 setting and be individually fixed in the middle opposite end of sample cavity 22 simultaneously
The 3rd fixture 29 set around the middle sample cavity 22, the 3rd fixation described in first fixture 27 and one
Part 29 is connected by fastener, and second fixture 28 is connected to form same with the 3rd fixture 29 by fastener
Axle resonator, the fastener can be bolt, pin etc., and it is dismantled and installed simple, is conveniently replaceable different measurement samples, so that
Make testing efficiency high.
As one embodiment of the present of invention, the special-shaped coaxial measured material 2 also includes being fixed on first cavity
21 and for supporting the first support member 30 of first newel 24 and being fixed on second cavity 23 and for supporting institute
State the second support member 31 of the second newel 25.First support member 30 is set around the inwall of first cavity 21, institute
The inwall that the second support member 31 is stated around second cavity 23 is set, wherein, the first support member 30 and second support member
31 quantity can be set according to actual needs, by setting first support member 30 and second support member 31, be made described
First newel 24 and the spaced setting of first cavity 21, second newel 25 and second cavity 23 are mutual
It is arranged at intervals, and keeps first newel 24 and the coaxial line of the first cavity 21, is conducive to the straightline propagation of electromagnetic wave.
As a preferred embodiment of the present invention, first support member 30 and second support member 31 are all provided with being set to
Two and it is spaced set, now, first newel 24 and the stress balance of the second newel 25 and make described the
The space that one cavity 21 keeps enough is used for reflection electromagnetic wave.
As the practical application of the present invention, first support member 30 and second support member 31 are plastics branch
Support member, i.e., described first support member 30 and second support member 31 are the support member being made of plastic material, can be to different
The coaxial measured material 2 of type plays support fixation well, and make the oeverall quality of the special-shaped coaxial measured material 2 compared with
Gently.
Incorporated by reference to reference picture 4, a kind of dielectric material measuring electromagnetic parameters device provided in an embodiment of the present invention is shown
The structural representation of first support member.As one embodiment of the present of invention, first support member 30 and second support
Part 31 offers multiple spaced settings and the through hole 302 being connected with the middle sample cavity 22；This implementation
In example, the shape and structure all same of first support member 30 and second support member 31, first support member 30 and institute
It is in plum blossom-shaped to state the second support member 31, can effectively reduce and produce unnecessary high-order mode resonance during electromagnetic transmission, favorably
In electromagnetic transmission.
First support member 30 includes the main part 301 set around the inwall of the first cavity 21, the through hole 302
Through the main part 301, first newel 24 is through the main part 301 and coaxial with the main part 301
Line, the axis and the axis collinear of the coaxial measured material 2 of the abnormal shape, multiple through holes 302 are around first support member
30 central axis is set, and the diameter of multiple through holes 302 is respectively from first support member 30 and second support member
31 central axis increases successively to circumferencial direction.In actual applications, the big I of the through hole 302 is according to part in magnetic field
Cloth situation is configured, by the way that the diameter of multiple through holes 302 is increased successively from inside to outside, can reduce by reflectance factor and
The influence that the error band of transmission coefficient comes, so as to improve the precision of measurement result.
Dielectric material measuring electromagnetic parameters device provided in an embodiment of the present invention, by by the special-shaped coaxial measured material
It is arranged to coaxial line and surrounds the first cavity, middle sample cavity and the second cavity of closing space, makes shape between three
The testing cassete of encapsulation measurement sample is provided for into coaxial resonant cavity, and in intermediate cavity, in measurement process, testing cassete is in envelope
In the space closed, the interference of external electromagnetic field is eliminated, internal magnetic field is protected, make use of Resonant-cavity Method measuring accuracy high
Advantage so that measuring accuracy is high；By setting the electromagnetic parameter that the computer is calculated automatically and display is measured, measurement speed
Degree is fast, so that measurement efficiency is high；By setting microwave vector network analyzer to automatically analyze the measurement sample scattering parameter,
The advantage of the measurement bandwidth of transmission/bounce technique is make use of, makes measurement bandwidth.
Incorporated by reference to reference picture 5, Fig. 5 shows a kind of dielectric material measuring electromagnetic parameters method provided in an embodiment of the present invention
Flow chart.As one embodiment of the present of invention, the dielectric material measuring electromagnetic parameters method comprises the following steps：
Step S1, measurement sample is positioned in the measuring box and sealed；
Step S2, calibrating device is connected by the input coaxial cable and the input coaxial cable respectively, and will be described micro-
Wave vector Network Analyzer, the GPIB data acquisition cards are connected with the computer, and the vector network analyzer is entered
Row calibrates for error；
Step S3, connects the special-shaped coaxial measurement by the input coaxial cable and the output coaxial cable and presss from both sides respectively
Tool is transmitted calibration；
Step S4, the measurement position in the middle sample cavity is put into by standard sample, carries out corresponding electromagnetism ginseng
Several test and the corresponding electromagnetic parameter for inputting the standard sample；
Step S5, takes out the standard sample, and the testing cassete that will be equipped with measuring sample is put into the middle detected sample
Measurement position in product cavity, carries out corresponding electromagnetic parameter testing, and the computer calculates and shown automatically the measurement sample
The electromagnetic parameter of product and preservation.
The measuring method of the application dielectric material measuring electromagnetic parameters device provided in an embodiment of the present invention, measurement accuracy
High, measuring speed is fast and measures bandwidth.
In step sl, dielectric material to be measured is made into powdering or liquid is uniformly put into the measuring box 26
In, make the dielectric material of measurable solid-state or liquid.
In step s 2, corresponding Electronic Calibration part pair can be selected according to the model of the microwave vector network analyzer 1
The microwave vector network analyzer 1 is calibrated for error.
In step s3, before measurement sample is not put into, electromagnetic transmission is carried out to the special-shaped coaxial measured material 2
Error measure, is calibrated with the error according to presence, improves the accuracy of measurement.
In step s 4, using the solid cylinder standard sample of polytetrafluoroethylene (PTFE), during test, start in the computer 6
Preassembled test software, the corresponding test option of selection.Such as：When testing complex dielectric permittivity, " complex dielectric permittivity is surveyed for selection
Amount " option, and " canonical measure " option in test software is clicked on, the complex dielectric permittivity of polytetrafluoroethylstandard standard sample is inputted,
Complete the measurement of standard sample complex dielectric permittivity.
When testing complex permeability, " Measurement for the complex permeability " option is selected, and click on " canonical measure " in test software
Option, inputs the complex permeability of polytetrafluoroethylstandard standard sample, completes the measurement of the complex permeability of standard sample.
In step s 5, the measuring box 26 that will be equipped with measuring sample is positioned in the middle sample cavity 22
Measurement position and assemble the special-shaped coaxial measured material 2, in the selection preassembled test software of the computer 6
" sample measurement " option is to measure, and the computer 6 calculates and shown automatically the measurement corresponding electromagnetic parameter of sample.
For example：When testing complex dielectric permittivity, " complex-permittivity measurement " option is selected in step S4, then the computer
6 calculate and show automatically the measurement corresponding complex dielectric permittivity of sample；When testing complex permeability, selection " multiple magnetic in step S4
Conductance is measured " option, then the computer 6 is automatic calculates and shows the measurement corresponding complex permeability of sample.Pass through the meter
Calculation machine 6 calculates and shown automatically the measurement result of measurement sample, and calculating speed is fast, and measurement efficiency is high.
As one embodiment of the present of invention, step S5 includes：
When only one of which measures sample, the computer 6 calculates and shown automatically the electromagnetic parameter of the measurement sample
And select to exit after preserving；
When there is more than one to measure sample, on having measured after a measurement sample, change next measurement sample and select
Into the measurement of next measurement sample electromagnetic parameter, treat that all measurement sample tests are finished, click on the computer 6 and preserve document
Data are simultaneously exited.
In actual applications, if more than one measurement sample needs measurement, the computer 6 is selected to install in advance
Test software " next sample " option, carry out it is next measurement sample test, the rest may be inferred, treats all measurement samples
It is completed, clicks on the computer 6 and preserve document data and exit, you can completes the survey of all measurement sample electromagnetic parameters
Amount.When there is multiple measurement samples to need measurement, without the measuring process of repeat step S4 Plays samples, can directly it carry out down
The test of one sample, makes testing efficiency high.
The measuring method of the application dielectric material measuring electromagnetic parameters device provided in an embodiment of the present invention combines humorous
The advantage of cell method of shaking and transmission/bounce technique, measurement accuracy is high, measuring speed is fast and measurement bandwidth.
The foregoing is merely illustrative of the preferred embodiments of the present invention, is not intended to limit the invention, all essences in the present invention
Any modifications, equivalent substitutions and improvements made within refreshing and principle etc., should be included in the scope of the protection.
Claims (10)
1. a kind of dielectric material measuring electromagnetic parameters device, it is characterised in that including：
Microwave vector network analyzer, it is defeated that the microwave vector network analyzer includes microwave signal output port, microwave signal
Inbound port and data output end；
Special-shaped coaxial measured material, the special-shaped coaxial measured material includes setting gradually and surrounding the first chamber of closing space
Body, middle sample cavity and the second cavity, first cavity, the middle sample cavity and second cavity
It is coaxially disposed, the special-shaped coaxial measured material also includes being fixed in first cavity and coaxially setting with first cavity
The first newel for putting, it is fixed on the second newel being coaxially disposed in first cavity and with second cavity and sets
In in the middle sample cavity and positioned at the testing cassete between first newel and second newel；
Coaxial cable is inputted, described input coaxial cable one end connects the microwave signal output port, and other end connection is described
The N-type adapter of one end of the remote middle sample cavity of the first cavity simultaneously inputs electromagnetism into first cavity
Ripple；
Coaxial cable is exported, described output coaxial cable one end connects the microwave signal input port, and other end connection is described
The N-type adapter of one end of the remote middle sample cavity of the second cavity simultaneously exports the electromagnetism in second cavity
Ripple；
GPIB data collecting cards, the input of the GPIB data collecting cards is connected with the data output end；
Computer, the computer is connected with the output end of the GPIB data collecting cards.
2. dielectric material measuring electromagnetic parameters device as claimed in claim 1, it is characterised in that the special-shaped coaxial measurement folder
The first fixture that tool also includes being fixed on first chamber outer wall and set around first cavity, it is fixed on described the
Two chamber outer walls simultaneously surround the second fixture of second cavity setting and are individually fixed in the middle sample chamber
Body opposite end simultaneously surround two the 3rd fixtures that the middle sample cavity is set, described in first fixture and one
3rd fixture is connected by fastener, and second fixture is connected with another 3rd fixture by fastener
Connect.
3. dielectric material measuring electromagnetic parameters device as claimed in claim 1, it is characterised in that first cavity and described
Second cavity is tapered, and one end of the interior electromagnetic wave of input without leave of first cavity gradually increases to the middle cavity direction,
One end of the interior electromagnetic wave of output without leave of second cavity gradually increases to the middle cavity direction.
4. dielectric material measuring electromagnetic parameters device as claimed in claim 1, it is characterised in that the special-shaped coaxial measurement folder
Tool also includes being fixed on first cavity and for supporting the first support member of first newel and being fixed on described the
Two cavitys and the second support member for supporting second newel.
5. dielectric material measuring electromagnetic parameters device as claimed in claim 4, it is characterised in that first support member and institute
State the second support member and offer multiple spaced settings and the through hole being connected with the middle sample cavity；It is described
First support member and second support member are in plum blossom-shaped, and the diameters of multiple through holes is from first support member and described the
The central axis of two support members increases successively to circumferencial direction.
6. dielectric material measuring electromagnetic parameters device as claimed in claim 5, it is characterised in that first support member and institute
It is plastic supporting pieces to state the second support member.
7. dielectric material measuring electromagnetic parameters device as claimed in claim 1, it is characterised in that second newel includes
The fixed cylinder being fixed in second cavity and the movable cylinder for being movably connected on the fixed cylinder, the movable cylinder
Positioned at the side close to the testing cassete and can be flexible along the length direction of the fixed cylinder.
8. a kind of dielectric material measuring electromagnetic parameters device of application claim 1 into claim 7 described in any one
Measuring method, it is characterised in that comprise the following steps：
Measurement sample is positioned in the measuring box and sealed；
The input coaxial cable and the output coaxial cable are connected into calibrating device respectively, and the microwave vector network is divided
Analyzer, the GPIB data acquisition cards are connected with the computer, and the vector network analyzer is calibrated for error；
The input coaxial cable and the output coaxial cable are connected into the special-shaped coaxial measured material respectively to be transmitted
Calibration；
Standard sample is put into the measurement position in the middle sample cavity, the measurement of the corresponding electromagnetic parameter of progress is simultaneously defeated
Enter the corresponding electromagnetic parameter of the standard sample；
The standard sample is taken out, the testing cassete that will be equipped with measuring sample is put into survey in the middle sample cavity
Position is measured, the measurement of corresponding electromagnetic parameter is carried out, the computer calculates and shown automatically the electromagnetic parameter of the measurement sample
And preserve.
9. the measuring method of dielectric material measuring electromagnetic parameters device according to claim 8, it is characterised in that described to take
Go out the standard sample, will be equipped with measure sample the testing cassete be put into the middle sample cavity measurement position
Put, carry out the measurement of corresponding electromagnetic parameter, the computer calculates and shown automatically the electromagnetic parameter of the measurement sample and guarantor
Depositing step includes：
When only one of which measures sample, the computer calculates and shown automatically the electromagnetic parameter of the measurement sample and preservation
Selection is exited afterwards；
When there is more than one to measure sample, on having measured after a measurement sample, change next measurement sample and select to enter
The measurement of next measurement sample electromagnetic parameter, treats that all measurement sample tests are finished, clicks on the computer and preserve document data
And exit.
10. the measuring method of dielectric material measuring electromagnetic parameters device according to claim 8, it is characterised in that described
Electromagnetic parameter includes complex dielectric permittivity and complex permeability.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710402147.7A CN107091847B (en) | 2017-06-01 | 2017-06-01 | Device and method for measuring electromagnetic parameters of dielectric material |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710402147.7A CN107091847B (en) | 2017-06-01 | 2017-06-01 | Device and method for measuring electromagnetic parameters of dielectric material |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN107091847A true CN107091847A (en) | 2017-08-25 |
| CN107091847B CN107091847B (en) | 2023-11-07 |
Family
ID=59639912
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201710402147.7A Active CN107091847B (en) | 2017-06-01 | 2017-06-01 | Device and method for measuring electromagnetic parameters of dielectric material |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN107091847B (en) |
Cited By (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108267642A (en) * | 2017-12-18 | 2018-07-10 | 河南师范大学 | A kind of microfluid electrical characteristics microwave detecting device |
| CN109061319A (en) * | 2018-07-24 | 2018-12-21 | 北京工业大学 | A kind of measuring electromagnetic parameters method based on rectangular cavity |
| CN109884565A (en) * | 2019-03-27 | 2019-06-14 | 北京工业大学 | A kind of sheeting Measurement for the complex permeability method and apparatus |
| CN110058056A (en) * | 2018-12-20 | 2019-07-26 | 中国科学院高能物理研究所 | A kind of nonstandard test fixture |
| CN110596463A (en) * | 2019-09-20 | 2019-12-20 | 电子科技大学 | Coaxial measuring device, testing system and method for measuring dielectric constant of medium |
| CN111198302A (en) * | 2020-02-13 | 2020-05-26 | 山东国瓷功能材料股份有限公司 | Method, device and system for testing dielectric property of material |
| CN111398708A (en) * | 2020-03-18 | 2020-07-10 | 唐山任氏巨源微波仪器有限公司 | Microwave heating equipment and method for comprehensive test of electromagnetic material |
| CN111551880B (en) * | 2020-05-26 | 2021-04-13 | 清华大学 | High-sensitivity magnetic conductivity sensor based on cavity local field enhancement |
| CN112684259A (en) * | 2020-12-04 | 2021-04-20 | 西南大学 | Reentrant cavity sensor for measuring dielectric constant and magnetic conductivity of magnetic medium material |
| CN113433392A (en) * | 2021-07-21 | 2021-09-24 | 苏州伏波电子科技有限公司 | Device and method for measuring electromagnetic parameters of dielectric material |
| CN115494308A (en) * | 2022-09-20 | 2022-12-20 | 闽都创新实验室 | Material electromagnetic parameter measuring device and measuring method |
Citations (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4866369A (en) * | 1987-08-03 | 1989-09-12 | Aerospatiale Societe Nationale Industrielle | Waveguide structure for estimating the electromagnetic characteristics of a dielectric or magnetic material |
| CA2124459A1 (en) * | 1991-11-26 | 1993-06-10 | Johnson J. H. Wang | Compact Broadband Microstrip Antenna |
| JP2003075369A (en) * | 2001-09-06 | 2003-03-12 | Electronic Navigation Research Institute | Method and instrument for measuring dielectric constant |
| US20040130402A1 (en) * | 2003-01-02 | 2004-07-08 | Marquardt Gregory H. | System and method for an ultra low noise micro-wave coaxial resonator oscillator using 5/8ths wavelength resonator |
| CN1928536A (en) * | 2006-09-30 | 2007-03-14 | 厦门大学 | Microwave pottery materials fast detection device and method |
| JP2007263625A (en) * | 2006-03-27 | 2007-10-11 | Hokkaido Univ | Device and method for measuring complex dielectric constant |
| US20140174210A1 (en) * | 2011-06-01 | 2014-06-26 | Université D'aix-Marseille | Universal sample holder for measuring the electromagnetic properties of a dielectric and/or magnetic material |
| CN103901278A (en) * | 2014-03-28 | 2014-07-02 | 电子科技大学 | Method for measuring material complex permittivity based on substrate integrated waveguide round resonant cavities |
| CN104111378A (en) * | 2013-04-19 | 2014-10-22 | 电子科技大学 | Microwave material electromagnetic parameter and shielding performance slab line test method |
| CN104965127A (en) * | 2015-06-05 | 2015-10-07 | 中国工程物理研究院计量测试中心 | Microwave closed resonant cavity complex permittivity measurement device |
| CN105929246A (en) * | 2016-04-27 | 2016-09-07 | 大连理工大学 | Closed coaxial transmission line test system and method for representing dielectric property of sample to be tested |
| WO2016189058A1 (en) * | 2015-05-25 | 2016-12-01 | Centre National De La Recherche Scientifique Cnrs | Portable device for measuring dielectric and/or magnetic characteristics of samples |
| CN206848193U (en) * | 2017-06-01 | 2018-01-05 | 厦门大学 | A kind of dielectric material measuring electromagnetic parameters device |
-
2017
- 2017-06-01 CN CN201710402147.7A patent/CN107091847B/en active Active
Patent Citations (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4866369A (en) * | 1987-08-03 | 1989-09-12 | Aerospatiale Societe Nationale Industrielle | Waveguide structure for estimating the electromagnetic characteristics of a dielectric or magnetic material |
| CA2124459A1 (en) * | 1991-11-26 | 1993-06-10 | Johnson J. H. Wang | Compact Broadband Microstrip Antenna |
| JP2003075369A (en) * | 2001-09-06 | 2003-03-12 | Electronic Navigation Research Institute | Method and instrument for measuring dielectric constant |
| US20040130402A1 (en) * | 2003-01-02 | 2004-07-08 | Marquardt Gregory H. | System and method for an ultra low noise micro-wave coaxial resonator oscillator using 5/8ths wavelength resonator |
| JP2007263625A (en) * | 2006-03-27 | 2007-10-11 | Hokkaido Univ | Device and method for measuring complex dielectric constant |
| CN1928536A (en) * | 2006-09-30 | 2007-03-14 | 厦门大学 | Microwave pottery materials fast detection device and method |
| US20140174210A1 (en) * | 2011-06-01 | 2014-06-26 | Université D'aix-Marseille | Universal sample holder for measuring the electromagnetic properties of a dielectric and/or magnetic material |
| CN104111378A (en) * | 2013-04-19 | 2014-10-22 | 电子科技大学 | Microwave material electromagnetic parameter and shielding performance slab line test method |
| CN103901278A (en) * | 2014-03-28 | 2014-07-02 | 电子科技大学 | Method for measuring material complex permittivity based on substrate integrated waveguide round resonant cavities |
| WO2016189058A1 (en) * | 2015-05-25 | 2016-12-01 | Centre National De La Recherche Scientifique Cnrs | Portable device for measuring dielectric and/or magnetic characteristics of samples |
| CN104965127A (en) * | 2015-06-05 | 2015-10-07 | 中国工程物理研究院计量测试中心 | Microwave closed resonant cavity complex permittivity measurement device |
| CN105929246A (en) * | 2016-04-27 | 2016-09-07 | 大连理工大学 | Closed coaxial transmission line test system and method for representing dielectric property of sample to be tested |
| CN206848193U (en) * | 2017-06-01 | 2018-01-05 | 厦门大学 | A kind of dielectric material measuring electromagnetic parameters device |
Non-Patent Citations (6)
| Title |
|---|
| JOHN O. CURTIS: "A Durable Laboratory Apparatus for the Measurement of Soil Dielectric Properties", 《IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT》 * |
| JOHN O. CURTIS: "A Durable Laboratory Apparatus for the Measurement of Soil Dielectric Properties", 《IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT》, vol. 50, no. 5, 31 October 2001 (2001-10-31), pages 1364 - 1369, XP011025353 * |
| YANG HONG等: "Analysis and Design of a Multi-Frequency Microstrip Antenna Based on a PBG Substrate", 《SENSORS & TRANSDUCERS》 * |
| YANG HONG等: "Analysis and Design of a Multi-Frequency Microstrip Antenna Based on a PBG Substrate", 《SENSORS & TRANSDUCERS》, vol. 172, no. 6, 11 April 2014 (2014-04-11), pages 178 - 183 * |
| 姜山: "电磁参数测试系统研究", 《中国优秀博硕士学位论文全文数据库 (硕士)工程科技Ⅱ辑》 * |
| 姜山: "电磁参数测试系统研究", 《中国优秀博硕士学位论文全文数据库 (硕士)工程科技Ⅱ辑》, no. 05, 15 May 2007 (2007-05-15), pages 12 - 60 * |
Cited By (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108267642B (en) * | 2017-12-18 | 2023-06-06 | 河南师范大学 | Micro-fluid electric characteristic microwave detection device |
| CN108267642A (en) * | 2017-12-18 | 2018-07-10 | 河南师范大学 | A kind of microfluid electrical characteristics microwave detecting device |
| CN109061319B (en) * | 2018-07-24 | 2020-07-03 | 北京工业大学 | Electromagnetic parameter measuring method based on rectangular resonant cavity |
| CN109061319A (en) * | 2018-07-24 | 2018-12-21 | 北京工业大学 | A kind of measuring electromagnetic parameters method based on rectangular cavity |
| CN110058056A (en) * | 2018-12-20 | 2019-07-26 | 中国科学院高能物理研究所 | A kind of nonstandard test fixture |
| CN109884565A (en) * | 2019-03-27 | 2019-06-14 | 北京工业大学 | A kind of sheeting Measurement for the complex permeability method and apparatus |
| CN110596463A (en) * | 2019-09-20 | 2019-12-20 | 电子科技大学 | Coaxial measuring device, testing system and method for measuring dielectric constant of medium |
| CN111198302A (en) * | 2020-02-13 | 2020-05-26 | 山东国瓷功能材料股份有限公司 | Method, device and system for testing dielectric property of material |
| CN111398708A (en) * | 2020-03-18 | 2020-07-10 | 唐山任氏巨源微波仪器有限公司 | Microwave heating equipment and method for comprehensive test of electromagnetic material |
| CN111551880B (en) * | 2020-05-26 | 2021-04-13 | 清华大学 | High-sensitivity magnetic conductivity sensor based on cavity local field enhancement |
| CN112684259A (en) * | 2020-12-04 | 2021-04-20 | 西南大学 | Reentrant cavity sensor for measuring dielectric constant and magnetic conductivity of magnetic medium material |
| CN113433392A (en) * | 2021-07-21 | 2021-09-24 | 苏州伏波电子科技有限公司 | Device and method for measuring electromagnetic parameters of dielectric material |
| CN115494308A (en) * | 2022-09-20 | 2022-12-20 | 闽都创新实验室 | Material electromagnetic parameter measuring device and measuring method |
Also Published As
| Publication number | Publication date |
|---|---|
| CN107091847B (en) | 2023-11-07 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN107091847A (en) | A kind of dielectric material measuring electromagnetic parameters device and measuring method | |
| CN104965127B (en) | A kind of microwave enclosed resonator complex dielectric constant measuring apparatus | |
| CN105929246B (en) | A kind of closure coaxial transmission line test system and method for characterizing sample to be tested dielectric property | |
| CN105137199B (en) | The dielectric permittivity measuring method of Excavation Cluster Based on Network Analysis instrument | |
| CN108594023A (en) | Material complex dielectric permittivity based on gradation type coaxial resonant cavity tests system and method | |
| CN106066425B (en) | A kind of impedance measurement device and its method for realizing compensation for calibrating errors | |
| CN109239480B (en) | Transmission line, scattering parameter testing system and method | |
| CN105974345B (en) | Free space terminal short circuit complex dielectric permittivity tests system high temperature calibration method | |
| CN103353553B (en) | The dielectric coefficient microwave measurement system of dielectric coefficient MMU microwave measurement unit and formation thereof | |
| CN107896412A (en) | A kind of high frequency magnetic probe diagnostic system for being used to measure radio frequency wave property | |
| CN107543970A (en) | A kind of dielectric constant measurement method based on data base calibration method | |
| CN111983538B (en) | On-chip S parameter measurement system calibration method and device | |
| Gronau et al. | A simple broad-band device de-embedding method using an automatic network analyzer with time-domain option | |
| CN109239634A (en) | The method of Two-port netwerk vector network analyzer calibration based on ridge regression | |
| CN106443198A (en) | Coaxial line testing method | |
| CN206848193U (en) | A kind of dielectric material measuring electromagnetic parameters device | |
| CN109444174A (en) | Fixture is used in a kind of high frequency dielectric constant of rock measurement method and measurement | |
| CN110398636A (en) | Liquid dielectric Sensors & Application based on miniaturization medium resonator antenna | |
| Szypłowska et al. | Soil complex dielectric permittivity spectra determination using electrical signal reflections in probes of various lengths | |
| CN104950184B (en) | The broadband alternating temperature dielectric constant test system of solid and dusty material | |
| US7288944B1 (en) | Evanescent waveguide apparatus and method for measurement of dielectric constant | |
| CN109061319A (en) | A kind of measuring electromagnetic parameters method based on rectangular cavity | |
| CN208092134U (en) | A kind of VHF frequency ranges complex dielectric constant measuring apparatus | |
| Khalid et al. | Evaluation of a VNA-based material characterization kit at frequencies from 0.75 THz to 1.1 THz | |
| CN115494308A (en) | Material electromagnetic parameter measuring device and measuring method |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |