CN105929246A - Closed coaxial transmission line test system and method for representing dielectric property of sample to be tested - Google Patents

Abstract

The invention discloses a closed coaxial transmission line test system for testing the dielectric properties of liquid and solid materials. The closed coaxial transmission line test system includes a test fixture, a vector network analyzer, a computer and a test connection line; the test fixture includes a bidirectional SMA connector , screws, waterproof rubber gaskets, adapters with openings at both ends, sample chambers with electromagnetic shielding effects, conductors in the sample chambers and samples to be tested; the test fixture consists of four-hole flanges, cylindrical PTFE and two-way SMA connectors. The female coaxial inner conductor is formed. Based on the organic combination of transmission reflection method and de-embedding technology, the present invention removes the test parasitic effect of the fixture interface without relying on exclusive customized calibration parts or complex mathematical modeling of the fixture, and realizes the dielectric properties of liquid and solid materials. Accurate measurement; low requirements for test sample processing, simple fixture installation, flexible expansion of test working frequency range, and wide application range.

Description

A closed coaxial transmission line testing system and method for characterizing the dielectric properties of a sample to be tested

technical field

The invention belongs to the field of microwave testing, and relates to the characterization of the dielectric properties of liquid materials, solid or solid powder materials, in particular to a closed coaxial transmission line testing system for characterizing the dielectric properties of liquid and solid materials.

Background technique

The dielectric properties of a material are the unique electrical characteristics of each material, and accurate measurement and characterization of the dielectric properties of a material is critical to its proper use. Through the mastery of the dielectric properties of materials, key design parameter information can be provided for many electronic applications. Through an in-depth understanding of the dielectric properties of materials, it can be used in food safety testing, medical equipment design and use, aerospace design and other fields. Come to help, quickly and accurately grasp the dielectric properties of materials is of great help to improve the efficiency of product design and process quality inspection in the industry.

For the measurement of dielectric properties of materials, there are mainly coaxial probe method, coaxial/waveguide transmission line method, free space method, parallel plate method and resonant cavity method. The coaxial transmission line method has attracted more attention because of its wide-band measurement (50MHz-60GHz), low processing requirements for test samples, various types of test samples, fast test and accurate results, but because the closed coaxial transmission line fixture needs to be connected to the instrument , the adapter is essential in it, so the parasitic effect of the connector in the final test result should have a non-negligible impact on the accuracy of the test result. The existing calibration method is to customize the corresponding calibration parts according to the specific size of the fixture, or to eliminate the parasitic effect of the joint in the S parameter by simulating the S parameter of the joint through complex mathematical modeling. Customized calibration parts have limited scope of application, high cost, time-consuming modeling and cannot completely remove the influence of joints. The existing de-embedding technology can achieve the effect of de-parasitic effect on the test under the premise of obtaining the S-parameters of the fixture joint, but there are few specific and simple methods that can be realized.

In the existing technology "a coaxial fixture for testing the electromagnetic properties of materials" (application number 201420584461.3), the assembly procedure of the probe for testing is complicated, and the complex structure is not conducive to ensuring the accuracy of test results. At the same time, it will lengthen the process of sample testing, which is not conducive to The fast test of the sample, the fixed adapter type is not conducive to the expansion of the test frequency. Existing technology "Broadband Variable Temperature Permittivity Test of Solid and Powder Materials" (Application No. 201510305197.4), the removal of the coupling effect in the test of the test fixture is achieved through the traditional TRL calibration method, which requires customized calibration of specific dimensions However, the production requirements of the calibration parts are extremely high, which greatly increases the production cost. At the same time, the results of the calibration cannot be well guaranteed. At the same time, the test system cannot test the dielectric properties of the liquid sample.

Contents of the invention

For the coaxial transmission line test method in the prior art, it is difficult to remove the parasitic effect generated by the connector in the test fixture during the test process. Specific test materials have higher requirements on the application frequency range. The specific coaxial transmission line fixture has a limited working range and the test frequency range is expanded. difficult question. The invention provides a closed coaxial transmission line test system for characterizing the dielectric properties of liquid and solid materials, specifically a closed coaxial transmission line probe, the correction result of the closed coaxial transmission line test system is accurate, and the test frequency range can be extended for testing system to realize the measurement of the dielectric properties of the test sample material.

In order to realize the purpose, technical scheme of the present invention is:

A closed coaxial transmission line test system for characterizing the dielectric properties of liquid and solid materials, the closed coaxial transmission line test system includes a test fixture, a vector network analyzer 9, a computer 10 and a test connection line 11; the test fixture includes a bidirectional SMA connector, Screws 4, waterproof rubber gaskets 5, adapters 6 with openings at both ends connected to each other, sample chambers 7 with electromagnetic shielding effects, conductors 8 in the sample chambers, and samples to be tested.

One side of the two-way SMA connector is plugged and connected to the conductor 8 in the sample chamber through the double-female coaxial inner conductor 3 of the two-way SMA connector, and is connected with the adapter 6 through the screw thread and tightened, and the outer conductor of the two-way SMA connector is double-ended through the screw 4 SMA threaded four-hole flange 1 fixes the entire two-way SMA connector on the adapter 6, and the other side is connected to the corresponding port of the vector network analyzer 9 through the test connection line 11; the other end of the adapter 6 is connected to the sample chamber 7 through the inner hole thread Engagement, the end of the inner hole thread is an annular groove, which is used to install the annular waterproof rubber gasket 5. Two-way SMA connector double-female coaxial inner conductor 3. The size of the female head at both ends of the coaxial inner conductor 3 refers to the size of the inner conductor of the SMA connector female head. The inner conductors are the same, and both contain cylindrical holes with symmetrical slits and insets, and the hole terminals are coaxial tapered holes. The vector network analyzer 9 is connected to the closed coaxial transmission line fixture through the test connection line 11 to test the sample to be tested; the computer 10 is connected to the vector network analyzer 9 for data collection and calculation analysis. The two ports of the double-ended open cylindrical sample chamber 7 are threadedly connected to the adapter 6, and the inner annular cavity places the sample to be tested.

The bidirectional SMA joint is composed of a four-hole flange 1, a cylindrical cylindrical polytetrafluoroethylene 2 and a bidirectional SMA joint with double female heads and coaxial inner conductors 3; The cylindrical cylindrical polytetrafluoroethylene 2 is filled between the four-hole flange 1 and the coaxial inner conductor 3 of the double female head of the bidirectional SMA joint, and the inner diameter of the cylindrical cylindrical polytetrafluoroethylene 2 is equal to The diameter of the inner conductor 3 in the shaft, the outer diameter is equal to the inner diameter of the outer conductor of the bidirectional SMA joint, and the length is equal to the length of the coaxial inner conductor 3 of the double-female head of the bidirectional SMA joint. Insert the double-female coaxial inner conductor 3 of the bidirectional SMA connector into the processed cylindrical PTFE 2, and then insert the assembled whole into the bidirectional SMA connector outer conductor double-headed SMA threaded four-hole flange 1 to form a bidirectional SMA connector.

The two ends of the conductor 8 in the sample chamber are pins, the size of which matches the size of the female head at both ends of the double-female coaxial inner conductor 3 of the bidirectional SMA connector. The main body length of the conductor 8 in the sample chamber is equal to that of the sample chamber 7 except for the pins. , the diameter of the main body is equal to the diameter of the double-female coaxial inner conductor 3 of the bidirectional SMA connector, and the conductor 8 in the sample chamber is inserted into the coaxial tapered hole of the double-female coaxial inner conductor 3 of the bidirectional SMA connector; the conductor 8 in the sample chamber is bidirectional SMA The inner conductor 3 of the connector is on the same central axis as the annular sample chamber 7, and the sample to be tested is placed between two adapters 6 connected to the bidirectional SMA connector. The sample chamber is an annular sample chamber with double-ended openings, and the inner annular chamber is used to hold samples to be tested.

The two-way SMA connector, the sample chamber 7, the adapter 6, the double-female coaxial inner conductor 3 of the two-way SMA connector and the conductor 8 in the sample chamber are all austenitic 304 stainless steel, which can effectively reduce the corrosion damage of the test sample to the test system , and because the material is non-magnetic, it can also effectively avoid the influence of the test system's own material on the dielectric property test of the sample. The inner surfaces of the two-way SMA connector 1 and the sample chamber 7, the surfaces of the inner conductor 3 of the SMA connector and the conductor 8 in the sample chamber are all required to be polished to ensure the stability of the test microwave signal transmission.

The sample to be tested is a liquid or solid material, and the sample to be tested is placed between two adapters connected with the two-way SMA connector. The sample to be tested is completely filled in the sample chamber, and the sample to be tested is a cylindrical tube with the inner diameter equal to the diameter of the conductor in the sample chamber, the outer diameter equal to the diameter of the sample chamber, and the length equal to the length of the sample chamber, so as to facilitate the accurate measurement of the dielectric properties of the sample. Measurement, for solid powder or liquid samples, it is directly filled in the fixture with one side adapter installed.

The method for characterizing the dielectric properties of a sample to be tested by using the above-mentioned closed coaxial transmission line test system specifically includes the following steps:

The first step is to prepare the test equipment and collect data

Connect the computer to the vector network analyzer to obtain the data from the test instrument; connect the test connection line to the corresponding port of the vector network analyzer, use the standard calibration parts to perform full dual-port calibration on the vector network analyzer, and save the calibration after calibration data into a vector network analyzer.

The second step is to test the S parameters of the bidirectional SMA connector

Connect the bidirectional SMA connector to the test cable of the dual port of the vector network analyzer, and obtain the full S parameters S ^a ₁₁ , S ^a ₂₁ , S ^a ₁₂ , and S ^a ₂₂ of the bidirectional SMA connector by performing a frequency sweep test on the bidirectional SMA connector, And save the data measured by the vector network analyzer to the computer, and obtain the S-parameters of the two-way SMA joint through actual testing.

The third step is to assemble the test fixture and put the sample to be tested into the sample chamber

Assemble from one side of the test fixture, connect the two-way SMA connector to one side of the adapter and tighten it, fix the SMA connector and the adapter with screws, and make a ring-shaped recess at the end of the inner hole thread that connects with the sample chamber on the other side of the adapter Put the waterproof rubber gasket in the slot.

On the other side of the test fixture, connect the conductor in the sample chamber to the two-way SMA connector, then screw the two-way SMA connector into the thread on the side of the adapter corresponding to the SMA connector, and fix the SMA connector and the adapter with screws after tightening to ensure When the fixture is connected to the test line, the SMA connector will not rotate additionally; the adapter is connected to the sample chamber and screwed tightly, and a waterproof rubber gasket is placed.

The fourth step is to test the sample to be tested

Connect the two ends of the test fixture to the test connection wires connected to the two ports of the vector network analyzer and tighten them, perform a frequency sweep test on the sample to be tested, and measure the two-port full parameters of the test fixture S ^m ₁₁ , S ^m ₂₁ , S ^m ₁₂ and S ^m ₂₂ are imported into the computer and saved.

The fifth step is to remove the test parasitic effect and calculate the dielectric characteristic parameters

By combining the full S parameters S ^a ₁₁ , S ^a ₂₁ , S ^a ₁₂ , S ^a ₂₂ measured in the second step and the full S parameters S ^m ₁₁ , S ^m ₂₁ , S ^m ₁₂ , S ^m measured in the fourth step ₂₂ Transform transmission and scattering parameters to obtain corresponding T parameters T ^a ₁₁ , T ^a ₁₂ , T ^a ₂₁ , T ^a ₂₂ and corresponding T ^m ₁₁ , T ^m ₂₁ , T ^m ₁₂ , T ^m ₂₂ ; Calculate and remove the test parasitic effect caused by the bidirectional SMA connector, and obtain the T parameters T ^d ₁₁ , T ^d ₂₁ , T ^d ₁₂ , T ^d ₂₂ of the pure sample to be tested, and then obtain the corresponding full S parameter S ^d of the test sample through matrix transformation ₁₁ , S ^d ₂₁ , S ^d ₁₂ , S ^d ₂₂ ; the dielectric properties of the sample can be obtained by using the obtained full S parameters of the sample to be measured through transmission reflection method inversion, and the dielectric properties include complex permittivity , complex permeability, sample loss tangent or quality factor.

Based on the organic combination of transmission reflection method and de-embedding technology, the test parasitic effect of the fixture interface can be removed without relying on exclusive custom calibration parts or complex mathematical modeling of the fixture, and the accurate measurement of the dielectric properties of liquid and solid materials can be realized .

Beneficial effects of the present invention:

1) Since the joint part of the fixture is designed as a two-way joint corresponding to the size, thread and inner conductor of the wiring joint used in the test of the vector network analyzer, the scattering parameters of the joint can be obtained through direct testing, and the matrix transformation and operation corresponding to the test results are It can remove the parasitic effect of the joint test in the fixture of the coaxial transmission line method. For the removal of the joint parasitic effect in the process of testing the dielectric properties of the sample by the transmission reflection method, it is not necessary to customize specific calibration parts according to the size of the fixture, and it can handle different joint types without relying on A complex mathematical model is established to remove the additional test effects of joints, the removal method is feasible, and the removal results are accurate and reliable.

2) The test material can be liquid, solid or solid powder; there are many types of test available, wide application range, and low requirements for test sample processing.

3) The expansion of the test frequency range can be realized by means of the bidirectional connector type of the fixture and the coaxial inner conductor of the corresponding sample chamber. The test fixture connected by SMA connector can realize the test in the range of 1MHz-18GHz. Changing the type of bidirectional connector from SMA to SSMA can extend the upper limit of the test frequency to 38GHz, and changing it to one of GPO, OSMP, and SMP can extend the test frequency range to 40GHz. It has the characteristics of flexible expansion of the test working frequency range and wide application range.

4) The overall test operation process is short, the fixture installation is simple, the operation is simple, and the test repeatability is good.

Description of drawings

Fig. 1 is a cross-sectional structural schematic diagram of a test fixture;

Fig. 2 is a schematic diagram of the testing device system of the present invention;

Fig. 3 is a structural cross-sectional view of a bidirectional SMA connector;

Figure 4 is a left view of the bidirectional SMA joint structure;

Fig. 5 is a cross-sectional view of the adapter structure;

Figure 6 is a left view of the adapter structure;

Figure 7 is a right view of the adapter structure;

Fig. 8 is a schematic diagram of the structure of the coaxial inner conductor in the sample chamber;

Fig. 9 is a schematic diagram of the structure of the sample chamber;

In the figure: 1 four-hole flange; 2 cylindrical cylindrical PTFE; 3 two-way SMA connector double female coaxial inner conductor; 4 screws; 5 waterproof rubber gasket; 6 adapter; 7 sample room; 8 sample indoor conductor; 9 Vector network analyzer; 10 computer; 11 test connection line.

detailed description

In order to achieve the above effects, the invention will be further described below in conjunction with the accompanying drawings and embodiments:

A closed coaxial transmission line test system for characterizing the dielectric properties of liquid and solid materials, as shown in Figure 2, includes a test fixture, a vector network analyzer 9, a computer 10 and a test connection line 11; the cross-sectional structural schematic diagram of the test fixture is as follows As shown in Figure 1, the test fixture includes a two-way SMA connector (Figure 3, 4), a screw 4, a waterproof rubber gasket 5, an adapter 6 with an open connection structure at both ends (Figure 5, 6, 7), an electromagnetic shielding effect The sample chamber 7 (as shown in FIG. 9 ), the conductor 8 in the sample chamber (as shown in FIG. 8 ) and the sample to be tested.

The bidirectional SMA joint is composed of a four-hole flange 1, a cylindrical cylindrical polytetrafluoroethylene 2 and a bidirectional SMA joint with double female heads and coaxial inner conductors 3; Insert the double-female coaxial inner conductor 3 of the bidirectional SMA connector into the processed cylindrical PTFE 2, and then insert the assembled whole into the bidirectional SMA connector outer conductor double-headed SMA threaded four-hole flange 1 to form a bidirectional SMA connector;

One side of the two-way SMA connector is plugged and connected to the conductor 8 in the sample chamber through the double-female coaxial inner conductor of the two-way SMA connector, and is connected with the adapter 6 through the thread and screwed tightly, and the outer conductor of the two-way SMA connector is double-ended SMA through the screw 4 The threaded four-hole flange 1 fixes the entire two-way SMA joint on the adapter 6, and the other side is connected to the corresponding port of the vector network analyzer 9 through the test connection line 11; the other end of the adapter 6 is connected to the sample chamber 7 through the internal thread , the end of the inner hole thread is an annular groove for installing the annular waterproof rubber gasket 5. The two-way SMA connector double-female coaxial inner conductor 3 is manufactured with reference to the size of the female inner conductor of the SMA connector. Both contain cylindrical holes with symmetrical slits and indented holes, and the hole terminals are coaxial tapered holes. The vector network analyzer 9 is connected to the closed coaxial transmission line fixture through the test connection line 11 to test the sample to be tested; the computer 10 is connected to the vector network analyzer 9 for data collection and calculation analysis.

The method for characterizing the dielectric properties of a sample to be tested by using the above-mentioned closed coaxial transmission line test system specifically includes the following steps:

The first step is to prepare the test equipment and collect data

The computer 10 is connected with the vector network analyzer 9 to obtain data from the test instrument; the test connection line 11 is connected with the corresponding port of the vector network analyzer 9, and the full two-port correction is carried out to the vector network analyzer 9 with a standard calibration part. Save the calibration data to the vector network analyzer 9 after the calibration is completed.

The second step is to test the S parameters of the bidirectional SMA connector

Connect the bidirectional SMA connector to the dual-port test line 11 of the vector network analyzer 9, and obtain the full S parameters S ^a ₁₁ , S ^a ₂₁ , S ^a ₁₂ , and S ^a ₂₂ of the bidirectional SMA connector through a frequency sweep test on the bidirectional SMA connector , and save the data measured by the vector network analyzer 9 to the computer 10, and obtain the S parameters of the bidirectional SMA joint through actual testing.

The third step is to assemble the test fixture

Assemble from one side of the test fixture, connect the two-way SMA connector to one side of the adapter 6 and tighten it, use the screw 4 to fix the SMA connector and the adapter 6, and connect the other side of the adapter 6 to the sample chamber 7 Put waterproof rubber washer 5 in the annular groove at the end of the hole thread.

On the other side of the test fixture, connect the conductor 8 in the sample chamber to the two-way SMA connector, then screw the two-way SMA connector into the thread on the side of the adapter 6 corresponding to the SMA connector, and use the screw 4 to connect the SMA connector to the adapter 6 after tightening. Fix it to ensure that the SMA connector will not rotate additionally when the fixture is connected to the test line in the later stage; the adapter 6 is connected to the product chamber 7 and tightened, and the waterproof rubber gasket 5 is placed.

Put the sample to be tested into the sample chamber 7, connect the assembled adapter 6 with the sample chamber 7 and tighten it.

The fourth step is to test the sample to be tested

Connect the two ends of the test fixture with the test line 11 connected to the two ports of the vector network analyzer 9 and tighten them, perform a frequency sweep test on the sample to be tested, and take the measured double-port full parameters of the fixture S ^m ₁₁ , S ^m ₂₁ , S ^m ₁₂ and S ^m ₂₂ are imported into the computer 10 and saved.

The fifth step is to remove the test parasitic effect and calculate the dielectric characteristic parameters

By combining the full S parameters S ^a ₁₁ , S ^a ₂₁ , S ^a ₁₂ , S ^a ₂₂ measured in the second step and the full S parameters S ^m ₁₁ , S ^m ₂₁ , S ^m ₁₂ , S ^m measured in the fourth step ₂₂ Transform transmission and scattering parameters to obtain corresponding T parameters T ^a ₁₁ , T ^a ₁₂ , T ^a ₂₁ , T ^a ₂₂ and corresponding T ^m ₁₁ , T ^m ₂₁ , T ^m ₁₂ , T ^m ₂₂ ; Calculate and remove the test parasitic effect brought by the two-way SMA connector, obtain the T parameters T ^d ₁₁ , T ^d ₂₁ , T ^d ₁₂ , T ^d ₂₂ of the pure test sample, and then obtain the corresponding full S parameter S ^d ₁₁ of the test sample through matrix transformation , S ^d ₂₁ , S ^d ₁₂ , S ^d ₂₂ ; the complex permittivity, complex permeability, sample loss tangent or quality factor of the sample can be obtained by inversion of the obtained S parameters of the test sample by the transmission reflection method.

For the test of the material working range from radio frequency to below 18GHz frequency band, the use of SMA connectors can meet the test requirements. For testing and characterization of the dielectric properties of the required test materials in higher frequency bands (K-band, Ka-band, Q-band), you can change the type of connectors corresponding to the working frequency band (two-way SSMA connectors, two-way GPO, OSMP or SMP connectors) and corresponding The adapter and the corresponding coaxial inner conductor of the sample chamber are realized. Taking the two-way SSMA joint as an example, when the upper limit of the test frequency is 38GHz, the two-way SSMA joint machine and its corresponding adapter and the coaxial inner conductor of the sample chamber can be replaced, and the connection test can be carried out according to the connection method in the embodiment, and the test system can be realized An extension of the test frequency range is available.

The design of the present invention is more convenient for removing the unavoidable test coupling effect of the joint in the test, and can realize the independent test of the S parameter of the joint while coupling the non-removable test part in the fixture into the fixture. Testing the instrument after calibration with the existing calibrator can ensure the accuracy of the test results. At the same time, the tightness of the design and the requirements of the sample size of the fixture ensure the characterization of the dielectric properties of the liquid sample.

Claims (6)

1. the Guan Bi coaxial transmission line test system characterizing liquid and solid material dielectric property, it is characterised in that This Guan Bi coaxial transmission line test system includes test fixture, vector network analyzer (9), computer (10) With test connecting line (11)；Described test fixture includes two-way sub-miniature A connector, screw (4), water proof rubber Packing ring (5), the adaptor (6) of both ends open connectivity structure, have electromagnetic shielding effect sample room (7), Sample room inner wire (8) and testing sample；

Described two-way sub-miniature A connector side is by the double female coaxial inner conductor (3) of two-way sub-miniature A connector and sample Indoor conductor (8) grafting is connected, and by four hole flanges (1), two-way sub-miniature A connector is fixed on adaptor (6) One end, opposite side is connected with vector network analyzer (9) by test connecting line (11)；Described switching The other end of head (6) is engaged with sample room (7) by inner hole thread, the end of adaptor (6) inner hole thread It is annular groove at tail, annular waterproof rubber gasket (5) is installed；Described vector network analyzer (9) leads to Cross test connecting line (11) to be connected with test fixture, testing sample is tested；Computer (10) with Vector network analyzer (9) connects, and carries out data acquisition and computational analysis；Described sample room inner wire (8), The double female coaxial inner conductor (3) of two-way sub-miniature A connector and sample room (7) are in same axis, treat test sample Product are placed on the inner annular intracavity of sample room (7) between two adaptors (6)；

Described two-way sub-miniature A connector is by four hole flanges (1), column tubular politef (2) and two-way SMA The double female coaxial inner conductor (3) of joint is constituted, and two-way sub-miniature A connector is female, and female two ends are external screw thread, It is coaxially interior that column tubular politef (2) is filled in four hole flanges (1) female double with two-way sub-miniature A connector Between conductor (3)；The interior diameter of described column tubular politef (2) is equal to two-way sub-miniature A connector The diameter of double female coaxial inner conductors (3), overall diameter is equal to the interior diameter of two-way sub-miniature A connector outer conductor, long Degree is equal to the length of the double female coaxial inner conductor (3) of two-way sub-miniature A connector；Described two-way sub-miniature A connector is double female The two ends female size of head coaxial inner conductor (3) is identical with sub-miniature A connector female inner wire, all contains symmetry and opens The cylindrical hole that seam caves in, hole terminal is coaxial bellmouth, by coaxial bellmouth and sample room inner wire (8) Connect；

Described sample room inner wire (8) two ends are contact pin, and its size female double with two-way sub-miniature A connector is coaxial The female matching size at inner wire (3) two ends closes, and sample room inner wire (8) removes the principal length of contact pin Equal with sample room (7), main body portion diameter female coaxial inner conductor (3) double with two-way sub-miniature A connector is straight Footpath is equal.

Guan Bi coaxial transmission line the most according to claim 1 test system, it is characterised in that described is two-way Sub-miniature A connector, sample room (7), adaptor (6), the double female coaxial inner conductor (3) of two-way sub-miniature A connector and Sample room inner wire (8) is austenite 304 rustless steel.

Guan Bi coaxial transmission line the most according to claim 1 and 2 test system, it is characterised in that two-way SMA Joint and the inner surface of sample room (7), sub-miniature A connector inner wire (3) and the table of sample room inner wire (8) Face is processed by shot blasting.

Guan Bi coaxial transmission line the most according to claim 1 and 2 test system, it is characterised in that described Testing sample is liquid or solid material.

Guan Bi coaxial transmission line the most according to claim 3 test system, it is characterised in that described is to be measured Sample is liquid or solid material.

6. use the arbitrary described Guan Bi coaxial transmission line test characterized systematically testing sample dielectric of claim 1-5 special The method of property, it is characterised in that specifically include following steps:

The first step, setup test instrument, gather data

Computer (10) is connected with vector network analyzer (9), obtains test instrunment data；Will test Connecting line (11) connects with vector network analyzer (9) corresponding ports, with standard calibration part to vector network Analyser (9) carries out full dual-port correction, preserves correction data to vector network analyzer (9) after correction In；

Second step, tests the S parameter of two-way sub-miniature A connector

Two-way sub-miniature A connector is connected with the test connecting line (11) of vector network analyzer (9) dual-port, Two-way sub-miniature A connector is carried out sweep check and obtains full S parameter S of two-way sub-miniature A connector^a ₁₁、S^a ₂₁、S^a ₁₂、S^a ₂₂, And the data that vector network analyzer (9) records are saved in computer (10)；

3rd step, puts into sample room (7) by testing sample；

4th step, tests testing sample

By test connecting line (11), test fixture is connected with vector network analyzer (9) two-port, right Testing sample carries out sweep check, and the dual-port population parameter S of test fixture that will record^m ₁₁、S^m ₂₁、S^m ₁₂、 S^m ₂₂Import computer (10) to preserve；

5th step, removes test ghost effect, calculates dielectric property parameter

Full S parameter S that second step is recorded^a ₁₁、S^a ₂₁、S^a ₁₂、S^a ₂₂It is transmitted scattering parameter conversion and obtains phase T parameter T answered^a ₁₁、T^a ₁₂、T^a ₂₁、T^a ₂₂；Full S parameter S that 4th pacing is obtained^m ₁₁、S^m ₂₁、S^m ₁₂、S^m ₂₂ It is transmitted scattering parameter conversion and obtains corresponding T parameter T^m ₁₁、T^m ₂₁、T^m ₁₂、T^m ₂₂；

Calculated by chain type transmission matrix and remove the test ghost effect that two-way sub-miniature A connector brings, obtain to be measured T parameter T of sample^d ₁₁、T^d ₂₁、T^d ₁₂、T^d ₂₂, then obtain, by matrixing, the full S parameter that testing sample is corresponding S^d ₁₁、S^d ₂₁、S^d ₁₂、S^d ₂₂, full S parameter S^d ₁₁、S^d ₂₁、S^d ₁₂、S^d ₂₂Obtain to be measured by transmission bounce technique inverting The dielectric property of sample, described dielectric property includes complex dielectric permittivity, complex permeability, sample loss tangent Or quality factor.