CN209247964U - PCB mechanism for testing, test pressing plate and PCB test device - Google Patents
PCB mechanism for testing, test pressing plate and PCB test device Download PDFInfo
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- CN209247964U CN209247964U CN201821791142.4U CN201821791142U CN209247964U CN 209247964 U CN209247964 U CN 209247964U CN 201821791142 U CN201821791142 U CN 201821791142U CN 209247964 U CN209247964 U CN 209247964U
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Abstract
The utility model relates to a kind of PCB mechanism for testing, test pressing plate and PCB test devices, the PCB mechanism for testing, including Test bench, there are the first detection probe and adapting probe on the Test bench, first detection probe with the contact on PCB to be tested wherein side for abutting, first detection probe and adapting probe are electrically connected, and the adapting probe is used to that the detection information that the first detection probe obtains to be passed to test macro by test pressing plate；In test, PCB to be tested is placed on Test bench, platen presses PCB to be tested is tested, the first detection probe is abutted with the contact on PCB to be tested close to Test bench side, and the information that the first detection probe obtains is passed to test macro by test pressing plate by adapting probe.The information that first detection probe detects can be passed to test macro by the cooperation of adapting probe and test pressing plate in test platen presses PCB to be tested by the setting of adapting probe.
Description
Technical field
The utility model relates to PCB the field of test technology, more particularly to a kind of PCB mechanism for testing, test pressing plate and PCB
Test device.
Background technique
Mainly there are voltage-withstand test, functional test, burn-in test etc. to the test of PCB.In order to complete these tests, usually
It is correspondingly arranged test carrier plate in each test equipment, by the way that PCB to be tested is corresponded to the survey being placed in each test equipment
Corresponding every test is completed on examination support plate.
Probe is respectively set in the two sides of PCB to be tested in general test fixture, and one end of probe is used for and the touching on PCB
Point is electrically connected, and the other end of probe with test macro for connecting.
Due to being limited by test condition, when the Test bench for carrying PCB needs to test along sliding rail slide handover
When station, if probe on Test bench continue in the structure to conducting wire connecting test system, conducting wire with Test bench
The end needs of upper probe connection are mobile with Test bench, and there are stable connections for the connection of probe on such conducting wire and Test bench
Property difference problem.
Utility model content
Based on this, the utility model lies in that overcome the deficiencies of existing technologies, a kind of PCB mechanism for testing, test pressing plate are provided
And PCB test device, to solve the problems, such as that stable testing is poor.
A kind of PCB mechanism for testing, including Test bench have the first detection probe and adapting probe on the Test bench,
First detection probe for abutting with the contact on PCB to be tested wherein side, visit by first detection probe and switching
Needle is electrically connected, and the adapting probe is used to that the detection information that the first detection probe obtains to be passed to test by test pressing plate
System.
Above-mentioned PCB mechanism for testing, in test, PCB to be tested is placed on Test bench, and test platen presses are to be tested
PCB, the first detection probe are abutted with the contact on PCB to be tested close to Test bench side, and adapting probe passes through test pressing plate
The information that first detection probe obtains is passed into test macro.The setting of adapting probe can be to be tested in test platen presses
When PCB, the information that the first detection probe detects is passed to by test macro by the cooperation of adapting probe and test pressing plate.Turn
The connection type that probe changes the first detection probe and test macro is connect, it can by the cooperation of adapting probe and test pressing plate
It avoids being directly connected to the first detection probe and test macro using conducting wire, so that the position of Test bench is mobile not by the limit of conducting wire
System, facilitates the movement of Test bench；Simultaneously because the connection type of the first detection probe and test macro changes, improve
When connecting the first detection probe and test macro using conducting wire, the problem of conducting wire connective stability difference.
The Test bench includes test pallet and bearing base in one of the embodiments, and the test pallet can
It is moved on the direction close to bearing base, first detection probe and adapting probe are set on bearing base, the survey
And the corresponding first through hole of the first detection probe and the second through-hole corresponding with adapting probe is offered on examination pallet；When test is held in the palm
When disk is in first position, the end of first detection probe stretches out first through hole and carries base with close on PCB to be tested
The contact of seat side abuts.When needing to detect the PCB to be tested on test pallet, platen presses test pallet is tested, makes to test
Pallet is located at first position, and the first detection probe is abutted with the contact of the PCB to be tested on test pallet at this time.
The mounting groove for installing PCB to be tested is offered on the test pallet in one of the embodiments, it is described
First through hole is connected to the mounting groove.The setting of mounting groove, which can facilitate, carries out installation limit to PCB to be tested on test pallet
Position.
The test pallet is equipped with the first guide rod in one of the embodiments, is installed with and leads on the bearing base
Set, first guide rod are installed in guide sleeve, and the test pallet is by the first guide rod and guide sleeve in the side close to bearing base
It moves up.The cooperation of guide sleeve and the first guide rod can guarantee the to the relative motion between limitation test pallet and bearing base
The cooperation precision of the cooperation precision and adapting probe and the second through-hole of one detection probe and first through hole avoids the first detection from visiting
Needle and adapting probe are interfered with test pallet.
The PCB mechanism for testing further includes switching circuit board in one of the embodiments, first detection probe
It is electrically connected with adapting probe by the switching circuit board；Or further include adapter cable, first detection probe and switching
Probe is electrically connected by the adapter cable.When the first detection probe and adapting probe are electrically connected by switching circuit board
When, it can be by the way that the corresponding angle connection PIN be arranged on switching circuit board, the first detection probe and adapting probe pass through corresponding
The angle PIN is electrically connected, and so facilitates the connection of the first detection probe and adapting probe；Simultaneously in the first detection probe and switching
When probe is more, the standard that the first detection probe and adapting probe connect one to one can preferably be guaranteed by switching circuit board
True property.The structure that first detection probe and adapting probe are electrically connected by adapter cable is simple, easy to connect.
Resilient snubber is equipped between the test pallet and bearing base in one of the embodiments, the elasticity is slow
One end of stamping is abutted with test pallet, and the other end of resilient snubber is abutted with bearing base.The setting energy of resilient snubber
When enough avoiding test platen presses PCB to be tested, PCB to be tested and the first detection probe generation rigid contact.
The PCB mechanism for testing further includes sliding rail in one of the embodiments, is equipped at least two operations along sliding rail
Station, the bearing base are slidably mounted on sliding rail, and bearing base can be along sliding rail mobile handoff operation position.The setting of sliding rail
The glide direction of bearing base can be limited；Meanwhile sliding rail energy bearing test pedestal, the position for so facilitating Test bench is cut
It changes.
The PCB mechanism for testing further includes Auxiliary support seat in one of the embodiments, and the Auxiliary support seat is set
It is placed in the side of bearing base glide direction, Auxiliary support seat and sled position are relatively fixed, and Auxiliary support seat is held for sharing
Carry the load of pedestal effect on the slide rail；The carrying for so reducing sliding rail, avoids sliding rail from deforming due to carrying excessively.
In one of the embodiments, the test pallet be equipped with the first detection zone corresponding with bearing base and with auxiliary
Corresponding second detection zone of support base, the first through hole and the second through-hole are opened in first detection zone；The auxiliary branch
Seat is supportted equipped with the third detection probe for being electrically connected with test macro, second detection zone offers and third detects
The corresponding third through-hole of probe；When test pallet is in first position, the end of the third detection probe is logical by third
Hole protrudes from test pallet and abuts with the contact on PCB to be tested；When test pallet is in the second position, the third inspection
Probing needle exits third through-hole.Since the corresponding third detection probe of the second detection zone is set to Auxiliary support seat on test pallet
On, in test, test pressing plate is applied on Auxiliary support seat the active force of third detection probe, so reduces holding for sliding rail
It carries, avoids sliding rail because carrying excessively deforms.Simultaneously when needing switch test pedestal position on the slide rail, make to test
Pallet is located at the second position, and third detection probe exits third through-hole at this time, avoids third detection probe and test pallet is sent out
Raw interference.
The second guide rod is set on the Auxiliary support seat in one of the embodiments, offers position on the test pallet
Pilot hole in the second detection zone, second guide rod are installed in pilot hole, and the test pallet is being leaned on along the second guide rod
It is moved on the direction of nearly bearing base；When test pallet is in first position, second guide rod is located in pilot hole；Work as survey
When examination pallet is in the second position, second guide rod exits pilot hole.The cooperation of pilot hole and the second guide rod can survey limitation
The relative motion between pallet and Auxiliary support seat is tried, guarantees the cooperation precision of third detection probe and third through-hole, avoids the
Three detection probes are interfered with test pallet.
Multiple first installation positions PCB, first detection are equipped in first detection zone in one of the embodiments,
Probe and adapting probe have multiple, and first detection probe is arranged in a one-to-one correspondence with the first installation position PCB, and the switching is visited
Needle is arranged in a one-to-one correspondence with the first installation position PCB, the first detection probe and adapting probe bullet of corresponding same first installation position PCB
Property be electrically connected, the first through hole and the second through-hole have multiple, and the first through hole and the first installation position PCB correspond
Setting, the first detection probe and first through hole installation cooperation of corresponding same first installation position PCB, second through-hole and first
The installation position PCB is arranged in a one-to-one correspondence, the adapting probe of corresponding same first installation position PCB and the installation cooperation of the second through-hole；It is described
Be equipped with multiple 2nd installation positions PCB in second detection zone, the third detection probe have it is multiple, the 2nd installation position PCB with
Third detection probe is arranged in a one-to-one correspondence, and the third through-hole has multiple, one a pair of the third through-hole and the 2nd installation position PCB
It should be arranged, the third detection probe and third through-hole installation cooperation of corresponding same 2nd installation position PCB.First installation position PCB and
2nd PCB installs the quantity for increasing energy PCB to be tested of bit quantity, improves detection efficiency.
A kind of test pressing plate includes that pressing plate ontology and the second detection probe being set on the pressing plate ontology and docking are visited
Needle, second detection probe for it is corresponding with the contact on PCB to be tested wherein side abut, the docking probe for
Adapting probe docks and the information that will acquire passes to test macro.In test, pressing plate is tested to the direction close to Test bench
Movement presses PCB to be tested, in the second detection probe abutting corresponding with other side contact on PCB to be tested, adapting probe and
Docking probe, which is abutted, passes to test macro for the detection information of the first detection probe.Such mode is avoided to be visited in the first detection
Wire transmission detection information is set between needle and test macro, and the position for facilitating Test bench is mobile.
A kind of PCB test device, including test chassis, the PCB mechanism for testing and the test pressing plate, the survey
Examination pedestal and test pressing plate are correspondingly arranged in test chassis.By the abutting of adapting probe and docking probe, docking probe will
The information that first detection probe detects passes to test macro, and structure is simple, facilitates the movement of Test bench.
Detailed description of the invention
Fig. 1 is the structural schematic diagram of PCB mechanism for testing described in an embodiment；
Fig. 2 is the explosive view of PCB mechanism for testing described in an embodiment；
Fig. 3 is the partial enlarged view in Fig. 2 at A；
Fig. 4 is the structural schematic diagram of PCB mechanism for testing described in an embodiment；
Fig. 5 is the structural schematic diagram of PCB test device described in an embodiment.
Description of symbols: 100, Test bench, 110, test pallet, 110a, mounting groove, the 111, first detection zone,
112, the first installation position PCB, 113, first through hole, the 114, second through-hole, the 115, first guide rod, the 116, second detection zone, 117,
2nd installation position PCB, 118, third through-hole, 119, pilot hole, 120, bearing base, the 121, first detection probe, 122, switching
Probe, 123, guide sleeve, 130, resilient snubber, 300, test pressing plate, 310, pressing plate ontology, 400, Auxiliary support seat, 410, the
Three detection probes, the 420, second guide rod, 500, test chassis.
Specific embodiment
The utility model is more fully retouched below with reference to relevant drawings for the ease of understanding the utility model,
It states.The better embodiment of the utility model is given in attached drawing.But the utility model can come in many different forms
It realizes, however it is not limited to embodiments described herein.On the contrary, the purpose of providing these embodiments is that making practical new to this
The disclosure of type understands more thorough and comprehensive.
It should be noted that it can directly on the other element when element is referred to as " being fixed on " another element
Or there may also be elements placed in the middle.When an element is considered as " connection " another element, it, which can be, is directly connected to
To another element or it may be simultaneously present centering elements.On the contrary, when element is referred to as " directly existing " another element "upper",
There is no intermediary elements.Term as used herein "vertical", "horizontal", "left" and "right" and similar statement are
For illustrative purposes, it is not meant to be the only embodiment.
Unless otherwise defined, all technical and scientific terms used herein are led with the technology for belonging to the utility model
The normally understood meaning of the technical staff in domain is identical.Terminology used in the description of the utility model herein only be
The purpose of description specific embodiment, it is not intended that in limitation the utility model.Term " and or " used herein packet
Include any and all combinations of one or more related listed items.
In conjunction with shown in Fig. 1-Fig. 3, a kind of PCB mechanism for testing, including Test bench 100, the survey are provided in an embodiment
There are the first detection probe 121 and adapting probe 122 on examination pedestal 100, first detection probe 121 is used for and PCB to be tested
Wherein the contact on side abuts, and first detection probe 121 and adapting probe 122 are electrically connected, the adapting probe 122
For the detection information that first detection probe 121 obtains to be passed to test macro by test pressing plate 300.
Above-mentioned PCB mechanism for testing, in test, PCB to be tested is placed on Test bench 100, the pressing of test pressing plate 300 to
PCB is tested, the first detection probe 121 is abutted with the contact on PCB to be tested close to 100 side of Test bench, adapting probe 122
The information that first detection probe 121 obtains is passed into test macro by test pressing plate 300.The setting energy of adapting probe 122
Enough when test pressing plate 300 presses PCB to be tested, spy is detected for first by the cooperation of adapting probe 122 and test pressing plate 300
The information that needle 121 detects passes to test macro.Adapting probe 122 changes the first detection probe 121 and test macro
Connection type can be avoided by the cooperation of adapting probe 122 and test pressing plate 300 and be directly connected to the first detection spy using conducting wire
Needle 121 and test macro facilitate the shifting of Test bench 100 so that the position movement of Test bench 100 is not limited by conducting wire
It is dynamic；Simultaneously because the connection type of the first detection probe 121 and test macro changes, improve using the first inspection of conducting wire connection
When probing needle 121 and test macro, the problem of conducting wire connective stability difference.
In conjunction with shown in Fig. 2 and Fig. 3, in an embodiment, the Test bench 100 includes test pallet 110 and bearing base
120, the test pallet 110 can move on the direction close to bearing base 120, first detection probe 121 and switching
Probe 122 is set on bearing base 120, is offered on the test pallet 110 and the first detection probe 121 corresponding first
Through-hole 113 and second through-hole 114 corresponding with adapting probe 122；When test pallet 110 is in first position, described first
The end of detection probe 121 is stretched out first through hole 113 and is abutted with the contact on PCB to be tested close to 120 side of bearing base.
When needing to detect the PCB to be tested on test pallet 110, test pressing plate 300 presses test pallet 110, makes test pallet 110
In first position, the first detection probe 121 is abutted with the contact of the PCB to be tested on test pallet 110 at this time.
In conjunction with shown in Fig. 1 and Fig. 3, in an embodiment, offer on the test pallet 110 for installing PCB to be tested
Mounting groove 110a, the first through hole 113 is connected to the mounting groove 110a.The setting of mounting groove 110a, which can facilitate, to be tested
Installation limit is carried out to PCB to be tested on pallet 110.
As shown in connection with fig. 2, in an embodiment, the test pallet 110 is equipped with the first guide rod 115, the bearing base
Guide sleeve 123 is installed on 120, first guide rod 115 is installed in guide sleeve 123, and the test pallet 110 passes through the first guide rod
115 and guide sleeve 123 close to bearing base 120 direction on move.The cooperation of guide sleeve 123 and the first guide rod 115 can be to limitation
Relative motion between test pallet 110 and bearing base 120 guarantees the cooperation of the first detection probe 121 and first through hole 113
The cooperation precision of precision and adapting probe 122 and the second through-hole 114, avoid the first detection probe 121 and adapting probe 122 with
Test pallet 110 interferes.
Specifically, first guide rod 115 penetrates guide sleeve 123, one end of first guide rod 115 and test pallet 110
Affixed, the other end of the first guide rod 115 is abutted with the side on guide sleeve 123 far from test pallet 110.It can so be led by first
Bar 115 limits moving range of the test pallet 110 with respect to Test bench 120.
Further, one end on the first guide rod 115 far from test pallet 110 is set to retaining ring, and the first guide rod 115 passes through gear
It encloses and is abutted with the side on guide sleeve 123 far from test pallet 110.
It should be noted that the first guide rod 115 and guide sleeve 123 there are four, four guide sleeves 123 and four the first guide rods
115 one-to-one correspondence are slidably installed.
In one embodiment, the PCB mechanism for testing further includes switching circuit board (not shown), first detection
Probe 121 and adapting probe 122 are electrically connected by the switching circuit board；Or further include adapter cable, first detection
Probe 121 and adapting probe 122 are electrically connected by the adapter cable.When the first detection probe 121 and adapting probe 122 are logical
It, can be by the way that the corresponding angle connection PIN, the first detection probe be arranged on switching circuit board when crossing switching circuit board electric connection
121 and adapting probe 122 by the corresponding angle PIN be electrically connected, so facilitate the first detection probe 121 and adapting probe
122 connection；Simultaneously in the first detection probe 121 and more adapting probe 122, can preferably it be protected by switching circuit board
Demonstrate,prove the first detection probe 121 and accuracy that adapting probe 122 connects one to one.First detection probe 121 and adapting probe
122 is simple by the structure of adapter cable electric connection, easy to connect.
In conjunction with shown in Fig. 2 and Fig. 3, it is slow that elasticity is equipped in an embodiment, between the test pallet 110 and bearing base 120
One end of stamping 130, the resilient snubber 130 is abutted with test pallet 110, the other end of resilient snubber 130 and carrying
Pedestal 120 abuts.The setting of resilient snubber 130 can be avoided test pressing plate 300 when pressing PCB to be tested, PCB to be tested with
Rigid contact occurs for the first detection probe 121.
It should be noted that resilient snubber 130 has multiple, multiple resilient snubbers 130 are arranged at intervals at test pallet
Between 110 and bearing base 120.
In one embodiment, the PCB mechanism for testing further includes sliding rail (not shown), is equipped at least two along sliding rail
Operation position, the bearing base 120 are slidably mounted on sliding rail, and bearing base 120 can be along sliding rail mobile handoff operation position.
The setting of sliding rail can limit the glide direction of bearing base 120；Meanwhile sliding rail energy bearing test pedestal 100, so facilitate survey
Try the position switching of pedestal 100.
In conjunction with shown in Fig. 4 and Fig. 5, in an embodiment, the PCB mechanism for testing further includes Auxiliary support seat 400, described
Auxiliary support seat 400 is set to the side of 120 glide direction of bearing base, and Auxiliary support seat 400 and sled position are relatively fixed,
Auxiliary support seat 400 is used to share the load of the effect of bearing base 120 on the slide rail；The carrying for so reducing sliding rail, avoids sliding
Rail is deformed due to carrying excessively.
In one embodiment, the test pallet 110 be equipped with first detection zone 111 corresponding with bearing base 120 and with it is auxiliary
Corresponding second detection zone 116 of support base 400 is helped, the first through hole 113 and the second through-hole 114 are opened in first detection
Area 111；The Auxiliary support seat 400 is equipped with third detection probe 410 for being electrically connected with test macro, and described second
Detection zone 116 offers third through-hole 118 corresponding with third detection probe 410；When test pallet 110 is in first position
When, the end of the third detection probe 410 by third through-hole 118 protrude from test pallet 110 and on PCB to be tested
Contact abuts；When test pallet 110 is in the second position, the third detection probe 410 exits third through-hole 118.Due to
The corresponding third detection probe 410 of second detection zone 116 is set on Auxiliary support seat 400 on test pallet 110, in test,
Test pressing plate 300 is applied on Auxiliary support seat 400 active force of third detection probe 410, so reduces holding for sliding rail
It carries, avoids sliding rail because carrying excessively deforms.Simultaneously when needing the position on the slide rail of switch test pedestal 100, make
Test pallet 110 is located at the second position, and third detection probe 410 exits third through-hole 118 at this time, avoids third detection probe
410 interfere with test pallet 110.
It should be noted that first detection probe 121 and switching are visited when test pallet 110 is in the second position
Needle 122 exits first through hole 113 and the second through-hole 114 respectively.
In one embodiment, the second guide rod 420 is set on the Auxiliary support seat 400, offers position on the test pallet 110
Pilot hole 119 in the second detection zone 116, second guide rod 420 are installed in pilot hole 119, the test pallet 110
It is moved on the direction close to bearing base 120 along the second guide rod 420；When test pallet 110 is in first position, described
Two guide rods 420 are located in pilot hole 119；When test pallet 110 is in the second position, second guide rod 420 exits guiding
Hole 119.The cooperation of pilot hole 119 and the second guide rod 420 can be to the phase between limitation test pallet 110 and Auxiliary support seat 400
To movement, guarantee the cooperation precision of third detection probe 410 and third through-hole 118, third detection probe 410 and test is avoided to hold in the palm
Disk 110 interferes.
In one embodiment, multiple first installation positions PCB 112 are equipped in first detection zone 111, first detection is visited
Needle 121 and adapting probe 122 have multiple, and first detection probe 121 is arranged in a one-to-one correspondence with the first installation position PCB 112,
The adapting probe 122 is arranged in a one-to-one correspondence with the first installation position PCB 112, and the first of corresponding same first installation position PCB 112
Detection probe 121 and 122 elasticity of adapting probe are electrically connected, and the first through hole 113 and the second through-hole 114 have multiple, institute
It states first through hole 113 to be arranged in a one-to-one correspondence with the first installation position PCB 112, the first inspection of corresponding same first installation position PCB 112
Probing needle 121 and the installation cooperation of first through hole 113, second through-hole 114 are arranged in a one-to-one correspondence with the first installation position PCB 112,
The adapting probe 122 of corresponding same first installation position PCB 112 and the installation cooperation of the second through-hole 114；Second detection zone 116
Interior to be equipped with multiple 2nd installation positions PCB 117, the third detection probe 410 has multiple, the 2nd installation position PCB 117 and the
Three detection probes 410 are arranged in a one-to-one correspondence, and the third through-hole 118 has multiple, the third through-hole 118 and the 2nd PCB installation
Position 117 is arranged in a one-to-one correspondence, and the third detection probe 410 and third through-hole 118 of corresponding same 2nd installation position PCB 117 are installed
Cooperation.The quantity for increasing energy PCB to be tested of first installation position PCB 112 and 117 quantity of the 2nd installation position PCB, improves detection
Efficiency.
In conjunction with shown in Fig. 4 and Fig. 5, specifically, in the present embodiment, there are two the second above-mentioned detection zones 116, and two
Two detection zones 116 distinguish the first detection zone 111 along the two sides of the sliding rail direction of motion, and there are two the Auxiliary support seats 400, and two
Auxiliary support seat 400 is respectively arranged at the two sides of sliding rail, two Auxiliary support seats 400 respectively with two the second detection zones 116 1
One is correspondingly arranged.The third through-hole 118 and third probe being arranged between corresponding second detection zone 116 and Auxiliary support seat 400
Structure between 410 with it is above-mentioned similar.
It should be noted that above-mentioned multiple first installation positions PCB 112 and multiple 2nd installation positions PCB 117 are right respectively
Answer an above-mentioned mounting groove 110a.
In one embodiment, a kind of test pressing plate 300 is also provided and includes pressing plate ontology 310 and is set to the pressing plate ontology
The second detection probe and docking probe, second detection probe on 310 are used for and the contact on PCB to be tested wherein side
Corresponding to abut, the information that the docking probe is used to dock and will acquire with adapting probe 122 passes to test macro.Test
In, test pressing plate 300 move to the direction close to Test bench 100 and presses PCB to be tested, the second detection probe with it is to be tested
When the upper other side contact PCB corresponds to abutting, adapting probe 122 is abutted with docking probe believes the detection of the first detection probe 121
Breath passes to test macro.Such mode is avoided is arranged wire transmission detection between the first detection probe 121 and test macro
Information, the position for facilitating Test bench 100 are mobile.
As shown in connection with fig. 5, in an embodiment, a kind of PCB test device is in addition also provided, including test chassis 500, described
PCB mechanism for testing and the test pressing plate 300, the Test bench 100 and test pressing plate 300 be correspondingly arranged in test machine
On frame 500.By the abutting of adapting probe 122 and docking probe, the information that probe detects the first detection probe 121 is docked
Test macro is passed to, structure is simple, facilitates the movement of Test bench 100.
It should be noted that the first detection probe and the second detection probe are located at the opposite of PCB to be tested in test
Two sides, the first detection probe and the second detection probe are for detecting two sides opposite on PCB to be tested.
Each technical characteristic of embodiment described above can be combined arbitrarily, for simplicity of description, not to above-mentioned reality
It applies all possible combination of each technical characteristic in example to be all described, as long as however, the combination of these technical characteristics is not deposited
In contradiction, all should be considered as described in this specification.
Above-described embodiments merely represent several embodiments of the utility model, the description thereof is more specific and detailed,
But it cannot be understood as the limitations to utility model patent range.It should be pointed out that for the common skill of this field
For art personnel, without departing from the concept of the premise utility, various modifications and improvements can be made, these are belonged to
The protection scope of the utility model.Therefore, the scope of protection shall be subject to the appended claims for the utility model patent.
Claims (13)
1. a kind of PCB mechanism for testing, which is characterized in that including Test bench, have on the Test bench the first detection probe and
Adapting probe, first detection probe with the contact on PCB to be tested wherein side for abutting, first detection probe
It is electrically connected with the adapting probe, the adapting probe is used for the inspection for obtaining first detection probe by testing pressing plate
Measurement information passes to test macro.
2. PCB mechanism for testing according to claim 1, which is characterized in that the Test bench includes test pallet and holds
Pedestal is carried, the test pallet can move on the direction close to the bearing base, first detection probe and described turn
It connects probe to be set on the bearing base, it is logical that corresponding with first detection probe first is offered on the test pallet
Hole and the second through-hole corresponding with adapting probe；
When the test pallet is in first position, the end of first detection probe stretch out the first through hole and with to
The contact on PCB close to the bearing base side is tested to abut.
3. PCB mechanism for testing according to claim 2, which is characterized in that offer on the test pallet for installing
The mounting groove of PCB to be tested, the first through hole are connected to the mounting groove.
4. PCB mechanism for testing according to claim 2, which is characterized in that the test pallet is equipped with the first guide rod, institute
It states and is installed with guide sleeve on bearing base, first guide rod is installed in the guide sleeve, and the test pallet passes through the first guide rod
It is moved on the direction close to bearing base with the guide sleeve.
5. PCB mechanism for testing according to claim 1, which is characterized in that it further include switching circuit board, first detection
Probe and the adapting probe are electrically connected by the switching circuit board；
Or further include adapter cable, first detection probe and adapting probe are electrically connected by the adapter cable.
6. PCB mechanism for testing according to claim 2, which is characterized in that between the test pallet and the bearing base
Equipped with resilient snubber, one end of the resilient snubber is abutted with the test pallet, the other end of the resilient snubber
It is abutted with the bearing base.
7. PCB mechanism for testing according to claim 2, which is characterized in that further include sliding rail, be equipped at least along the sliding rail
Two operation positions, the bearing base are slidably mounted on the sliding rail, and the bearing base can be moved along the sliding rail and be cut
Change operation position.
8. PCB mechanism for testing according to claim 7, which is characterized in that further include Auxiliary support seat, the Auxiliary support
Seat is set to the side of the bearing base glide direction, and the Auxiliary support seat and the sled position are relatively fixed, described
Auxiliary support seat is for sharing the load that the bearing base acts on the sliding rail.
9. PCB mechanism for testing according to claim 8, which is characterized in that the test pallet is equipped with and the carrying base
Corresponding first detection zone of seat and the second detection zone corresponding with the Auxiliary support seat, the first through hole and described second are led to
Hole is opened in first detection zone；
The Auxiliary support seat is equipped with the third detection probe for being electrically connected with test macro, and second detection zone is opened
Equipped with third through-hole corresponding with third detection probe；
When the test pallet is in first position, the end of the third detection probe is protruded from by the third through-hole
Test pallet is simultaneously abutted with the contact on PCB to be tested；
When the test pallet is in the second position, the third detection probe exits third through-hole.
10. PCB mechanism for testing according to claim 9, which is characterized in that the second guide rod is set on the Auxiliary support seat,
The pilot hole in second detection zone is offered on the test pallet, second guide rod is installed on the pilot hole
Interior, the test pallet moves on the direction close to the bearing base along second guide rod；
When the test pallet is in first position, second guide rod is located in the pilot hole；
When the test pallet is in the second position, second guide rod exits the pilot hole.
11. according to the described in any item PCB mechanism for testing of claim 9-10, which is characterized in that set in first detection zone
There are multiple first installation positions PCB, first detection probe and adapting probe have multiple, first detection probe and first
The installation position PCB is arranged in a one-to-one correspondence, and the adapting probe is arranged in a one-to-one correspondence with the first installation position PCB, and corresponding same first
The first detection probe and adapting probe elasticity of the installation position PCB are electrically connected, the first through hole and the second through-hole have it is multiple,
The first through hole is arranged in a one-to-one correspondence with the first installation position PCB, the first detection probe of corresponding same first installation position PCB and
First through hole installation cooperation, second through-hole are arranged in a one-to-one correspondence with the first installation position PCB, corresponding same first PCB installation
The adapting probe of position and the installation cooperation of the second through-hole；Multiple 2nd installation positions PCB, the third are equipped in second detection zone
Detection probe has multiple, and the 2nd installation position PCB is arranged in a one-to-one correspondence with third detection probe, and the third through-hole has more
A, the third through-hole is arranged in a one-to-one correspondence with the 2nd installation position PCB, and the third of corresponding same 2nd installation position PCB, which detects, to be visited
Needle and third through-hole installation cooperation.
12. a kind of test pressing plate, which is characterized in that visited including pressing plate ontology and the second detection being set on the pressing plate ontology
Needle and docking probe, second detection probe are abutted for corresponding with the contact on PCB to be tested wherein side, the docking
The information that probe is used to dock and will acquire with adapting probe passes to test macro.
13. a kind of PCB test device, which is characterized in that surveyed including test chassis, the described in any item PCB of claim 1-11
Test pressing plate described in test-run a machine structure and claim 12, the Test bench and the test pressing plate are correspondingly arranged in the test
In rack.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201821791142.4U CN209247964U (en) | 2018-10-31 | 2018-10-31 | PCB mechanism for testing, test pressing plate and PCB test device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201821791142.4U CN209247964U (en) | 2018-10-31 | 2018-10-31 | PCB mechanism for testing, test pressing plate and PCB test device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN209247964U true CN209247964U (en) | 2019-08-13 |
Family
ID=67526714
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201821791142.4U Active CN209247964U (en) | 2018-10-31 | 2018-10-31 | PCB mechanism for testing, test pressing plate and PCB test device |
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| Country | Link |
|---|---|
| CN (1) | CN209247964U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112345851A (en) * | 2020-10-29 | 2021-02-09 | 湖南常德牌水表制造有限公司 | Electronic device inspection device |
-
2018
- 2018-10-31 CN CN201821791142.4U patent/CN209247964U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112345851A (en) * | 2020-10-29 | 2021-02-09 | 湖南常德牌水表制造有限公司 | Electronic device inspection device |
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