CN209103793U - Array substrate and display panel - Google Patents
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- CN209103793U CN209103793U CN201822072689.5U CN201822072689U CN209103793U CN 209103793 U CN209103793 U CN 209103793U CN 201822072689 U CN201822072689 U CN 201822072689U CN 209103793 U CN209103793 U CN 209103793U
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Abstract
This application involves a kind of array substrate and display panels.Array substrate includes: turntable driving, multiple scan lines, data-driven, multiple data lines and test electrode group.Electrode group is tested, for testing practical electric signal.Testing electrode group includes at least one scan electrode group and/or at least one data electrode group；Scan electrode group includes the first scan electrode and the second scan electrode, and the first scan electrode is used to test the practical electric signal of the first scanner section of any one scan line, and the second scan electrode is used to test the practical electric signal of the second scanner section of any one scan line；Data electrode group includes the first data electrode and the second data electrode, and the first data electrode is used to test the practical electric signal of the first data portion of any one data line, and the second data electrode is used to test the practical electric signal of the second data portion of any one data line.The application can accurate and effective assessment scan line and/or data line on charging ability difference.
Description
Technical field
This application involves field of display technology, more particularly to a kind of array substrate and display panel.
Background technique
Here statement only provides background information related with the application, without the inevitable composition prior art.
With the development of science and technology, display technology is more and more mature, the quality of display panel is also being stepped up.Display panel
Generally include array substrate.Array substrate carries out charge and discharge to each sub-pixel, to realize the aobvious of the different pictures of display panel
Show effect.Charging ability to each sub-pixel is an important indicator for measuring display panel reliability.
There is resistance in scan line and data line due to realizing charge and discharge in array substrate, RC retardation ratio can be generated
Effect.So the charging ability of the sub-pixel of the different location of display panel is variant, so as to cause reliability problem.
The assessment of the charging ability of each sub-pixel is got generally by simulation in the related technology, therefore assessment result is quasi-
True property is poor.
Utility model content
Based on this, it is necessary in view of the above technical problems, provide a kind of array for capableing of accurate evaluation charging ability difference
Substrate and display panel.
A kind of array substrate, comprising:
Turntable driving, for exporting scanning signal；
Multiple scan lines are electrically connected the turntable driving, are used for transmission the scanning signal；The same scan line has
First scanner section and the second scanner section, the scanning signal are transmitted to second scanner section by first scanner section；
Data-driven is used for outputting data signals；
Multiple data lines are electrically connected the data-driven, are used for transmission the data-signal；The same data line has
First data portion and the second data portion, the data-signal are transmitted to second data portion by first data portion；
Electrode group is tested, for testing practical electric signal；
The test electrode group includes at least one scan electrode group and/or at least one data electrode group；The scanning
Electrode group includes the first scan electrode and the second scan electrode, and first scan electrode is for testing any one of scanning
The practical electric signal of first scanner section of line, second scan electrode are swept for testing the second of any one of scan line
Retouch the practical electric signal in portion；The data electrode group includes the first data electrode and the second data electrode, the first data electricity
Pole is used to test the practical electric signal of the first data portion of any one of data line, and second data electrode is for testing
The practical electric signal of second data portion of any one of data line.
The array substrate has viewing area and non-display area, the test electrode group position in one of the embodiments,
In the non-display area.
The non-display area includes driving side and non-drive side in one of the embodiments, the driving side relative to
The non-drive side wiring congestion, the test electrode group are located at the non-drive side.
In one of the embodiments,
The test electrode group includes scan electrode group, first scan electrode in the same scan electrode group with
Second scan electrode is electrically connected to the same scan line.
In one of the embodiments,
The test electrode group includes data electrode group, first data electrode in the same data electrode group with
Second data electrode is electrically connected to the same data line.
In one of the embodiments,
The turntable driving is located at the unilateral side of the array substrate, first scanner section and second scanned position in
The both ends of the scan line；
The test electrode group includes two scan electrode groups, each scan electrode group include first scan electrode with
And second scan electrode；
First scan electrode and second scan electrode of two scan electrode groups are located at the battle array
Four apex angles of column substrate.
In one of the embodiments,
The turntable driving is located at the bilateral of the array substrate, and first scanned position is in the end of the scan line
Portion is located at the center of the scan line with second scanner section；
The test electrode group includes two scan electrode groups, each scan electrode group include two the first scan electrodes with
And second scan electrode；
First scan electrode of two scan electrode groups is located at four apex angles of the array substrate, institute
Second scan electrode for stating two scan electrode groups is located at the central two sides of the array substrate.
In one of the embodiments,
The data-driven is located at the unilateral side of the array substrate, and first data portion is located at second data portion
The both ends of the data line；
The test electrode group includes two data electrode groups, each data electrode group include first data electrode with
And second data electrode；
First data electrode and second data electrode of two data electrode groups are located at the battle array
Four apex angles of column substrate.
A kind of array substrate, comprising:
Turntable driving, for exporting scanning signal, positioned at the unilateral side of the array substrate；
Multiple scan lines are electrically connected the turntable driving, are used for transmission the scanning signal；The same scan line has
First scanner section and the second scanner section, the scanning signal are transmitted to second scanner section by first scanner section；
Data-driven is used for outputting data signals, positioned at the unilateral side of the array substrate；
Multiple data lines are electrically connected the data-driven, are used for transmission the data-signal；The same data line has
First data portion and the second data portion, the data-signal are transmitted to second data portion by first data portion；
Electrode group is tested, for testing practical electric signal；The test electrode group includes two scan electrode groups and two
Data electrode group；The scan electrode group includes first scan electrode and second scan electrode；The same scanning
First scan electrode in electrode group is used to test the practical electric signal of first scanner section of the scan line, described
Second scan electrode is used to test the practical electric signal of the second scanner section of the scan line；Two scan electrode groups are surveyed respectively
Try the practical electric signal of two scan lines；The data electrode group includes first data electrode and the second data electricity
Pole；First data electrode in the same data electrode group is used to test first data portion of the data line
Practical electric signal, second data electrode are used to test the practical electric signal of the second data portion of the data line；Described in two
Data electrode group tests the practical electric signal of two data lines respectively；
First scan electrode and second scan electrode of two scan electrode groups are located at the battle array
Four apex angles of column substrate；First data electrode of two data electrode groups is also distinguished with second data electrode
Positioned at four apex angles of the array substrate.
A kind of display panel, including array substrate described in any of the above embodiments.
Above-mentioned array substrate when being equipped with scan electrode group, practical electric signal to the first scanner section and second can be swept
The practical electric signal for retouching portion carries out validity test, by the scanning signal wave of actual signal waveform and turntable driving output after test
Shape compare, can accurate and effective assessment scan line on charging ability difference；It, can be to the first data portion when equipped with data electrode group
Practical electric signal and the second data portion practical electric signal carry out validity test, by the actual signal waveform and number after test
According to driving output data signal waveforms compare, can accurate and effective assessment data line on charging ability difference.
Detailed description of the invention
Fig. 1 is display panel schematic diagram in one embodiment；
Fig. 2 is array substrate schematic diagram in one embodiment；
Fig. 3 is array substrate shown in Fig. 2 along A-A ' diagrammatic cross-section；
Fig. 4 is array substrate schematic diagram in another embodiment.
Specific embodiment
It is with reference to the accompanying drawings and embodiments, right in order to which the objects, technical solutions and advantages of the application are more clearly understood
The application is further elaborated.It should be appreciated that specific embodiment described herein is only used to explain the application, not
For limiting the application.
Array substrate provided by the present application, can be applied to various types of display panels, for example, liquid crystal display panel or
Organic light emitting display panel etc..
In one embodiment, with reference to Fig. 1 and Fig. 2, provide a kind of display panel, including multiple sub-pixels 100 and
Array substrate 200.Multiple sub-pixels can be respectively the sub-pixel with multiple and different colors, such as red sub-pixel R, green
Sub-pixel G and blue subpixels B etc..Array substrate 200 is that each sub-pixel 100 is powered.
In one embodiment, it continues to refer to figure 1 and Fig. 2, array substrate 200 includes turntable driving 210, scan line
220, data-driven 230, data line 240 and test electrode group 250.Turntable driving 210 exports scanning signal.Scan line 220
With multiple.Each scan line 220 extends along first direction (horizontal direction in figure), and multiple scan lines 220 are along second party
It is alternatively arranged to (vertical direction in figure).Scan line 220 is electrically connected turntable driving 210, and then is each sub- picture of display panel
Element 100 transmits scanning signal.There is the first scanner section 221 and the second scanner section 222 with scan line 220.Scanning signal is by
One scanner section 221 is transmitted to the second scanner section 222.The RC retardation ratio of first scanner section 221 is minimum, and the RC of the second scanner section 222
Delay is maximum.
Data-driven 230 is used for outputting data signals.Data line 240 also has multiple.Each data line 240 is in a second direction
(vertical direction in figure) extends, and multiple data lines 240 are alternatively arranged along first direction (vertical direction in figure).Data
Line 240 is electrically connected data-driven 230, and then transmits data-signal for each sub-pixel 100 of display panel.Same data line 240
With the first data portion 241 and the second data portion 242.Data-signal is transmitted to the second data portion 242 by the first data portion 241.
The RC retardation ratio of first data portion 241 is minimum, and the RC retardation ratio of the second data portion 242 is maximum.
Test electrode group 250 is for testing practical electric signal.Specifically, test electrode group may include at least one scanning
Electrode group 251, perhaps including at least one data electrode group 252 or simultaneously including at least one scan electrode group 251 and extremely
A few data electrode group 252.
Scan electrode group 251 includes the first scan electrode 2511 and the second scan electrode 2512.First scan electrode 2511
For testing the practical electric signal of the first scanner section 221 of any one scan line 220, can be swept close to tested first
Retouch the setting of portion 221.Second scan electrode 2515 is used to test the practical electricity of the second scanner section 222 of any one scan line 220
Signal, can be close to tested the second scanner section 222 setting.
Since the signal delay situation in each scan line 220 is close, the application can select to survey according to the actual situation
Try the practical electric signal of the first scanner section 221 of any one scan line 220 and the second scanning of any one scan line 220
The practical electric signal in portion 222, the first tested scanner section 221 and the second scanner section 222 can be located at scan line 220
On, it may be alternatively located on different scanning line 220, the application is not restricted to this.
It, can be to the practical electricity of the first scanner section 221 of scan line 220 when array substrate is equipped with scan electrode group 251
The practical electric signal of signal and the second scanner section 222 of scan line 220 carries out validity test.By the actual signal after test
The respective scanned signal waveform that waveform is exported with turntable driving 210 compares, can accurate and effective assess the charging in each scan line 220
Capacity variance, and then the uniform reliability of display can be effectively improved accordingly.
Data electrode group 252 includes the first data electrode 2521 and the second data electrode 2522.First data electrode 2521
It, can be close to the first tested number for testing the practical electric signal of the first data portion 241 of any one data line 240
It is arranged according to portion 241.Second data electrode 2522 is used to test the practical electricity of the second data portion 242 of any one data line 240
Signal, can be close to tested the second data portion 242 setting.It is the second scan electrode 2512 and the second number with reference to Fig. 3
According to the cross-sectional view of electrode 2522.The cross-sectional view of first scan electrode 2511 and the first data electrode 2521 is similar.
Since the signal delay situation on each data line 240 is close, the application can select to survey according to the actual situation
Try the practical electric signal of the first data portion 241 of any one a data line 240 and the second data of any one data line 240
The practical electric signal in portion 242, the first tested data portion 241 and the second data portion 242 can be located at same data line 240
On, it may be alternatively located on different data line 240, the application is not restricted to this.
It, can be to the practical electricity of the first data portion 241 of a data line 240 when array substrate is equipped with data electrode group 252
The practical electric signal of second data portion 242 of signal and a data line 240 carries out validity test.By the actual signal after test
The corresponding data signal waveform that waveform is exported with data-driven 230 compares, can accurate and effective assess the charging on each data line 240
Capacity variance, and then the uniform reliability of display can be effectively improved accordingly.
In one embodiment, with reference to Fig. 2, array substrate 200 has viewing area 200a and non-display area 200b.Setting is surveyed
Examination electrode group 250 is located at non-display area 200b, has both made array substrate 200 can each scan line 220 of validity test and each data
Charging ability difference on line 240, and the wiring of viewing area 200a is not influenced, and then does not influence the effective aobvious of viewing area 200a
Show.
In one embodiment, with continued reference to Fig. 2, further, non-display area 200b includes driving side 200c and non-drive
Dynamic side 200d.Driving side 200c is due to close turntable driving 210 or data-driven 230, relative to non-drive side 200d
Wiring congestion (such as driving side 200c will lay fan-out line, for illustrative clarity, the wiring of non-display area 200b is not complete in figure
Full display).The present embodiment will be tested electrode group 250 and is set to non-drive side 200d (one group 251 on the downside of Fig. 2), non-driven
Side 200d is relatively sparse due to being routed, it can be to test the broader placement space of electrode group 250, and then it is convenient for technique
Design and implementation.
Certain the application is not in the above described manner limitation, in the case where process conditions can achieve, can also will be tested
Electrode group 250 is arranged in viewing area 200a, or test electrode group 250 is arranged in the driving side 200c of non-display area 200b.
As before, tested the first scanner section 221 and the second scanner section 222 can be positioned at in scan lines 220, it can also
On different scanning line 220.In one embodiment, as shown in Fig. 2, in order to further increase testing precision, Ke Yishe
The first scan electrode 2511 and the second scan electrode 2512 set in scan electrode group 251 are electrically connected to the same scan line 220.
It, can be at this point, further shield the resistance difference in each turntable driving 210 to the transmission path between each scan line 220
The more accurate charging ability difference tested out in scan line 220 caused by 220 self-resistance of scan line, so can accordingly into
One step, which improves, shows uniform reliability.
Therewith similarly, in one embodiment, in order to further increase testing precision, as shown in Fig. 2, number can be set
According in electrode group 252 the first data electrode 2521 and the second data electrode 2522 be electrically connected to the same data line 240.This
When, further shield the resistance difference in each data-driven 210 to the transmission path between each data line 240, Ke Yigeng
Add the charging ability difference accurately tested out on data line 240 caused by 240 self-resistance of data line, and then can be accordingly into one
Step, which improves, shows uniform reliability.
In one embodiment, with reference to 1 and Fig. 2, turntable driving 210 is located at the unilateral side of array substrate 200, i.e. display surface
The scanning of plate is using unilateral driving.At this point, the scanning signal of one turntable driving 210 of scan line 220 reception, scanning letter
Number the other end is transmitted to by one end of same scan line 220.So the first scanner section 221 and the second scanner section 222 are located at scanning
The both ends of line 220.
Meanwhile the present embodiment setting test electrode group 250 includes two scan electrode groups 251.Each scan electrode group 251
Including first scan electrode 2511 and second scan electrode 2512.First scanning of two scan electrode groups 251
Electrode 2511 and the second scan electrode 2512 are located at four apex angles of array substrate, and then are surveyed convenient for external probe
Examination.Meanwhile accurate testing degree is verified mutually and then be can be further improved to two groups of test electrode groups 250.
In one embodiment, with reference to Fig. 4, turntable driving 210 is located at the bilateral of array substrate, the i.e. scanning of display panel
It is driven using bilateral.At this point, the same scan line 220 receives the scanning signal of the turntable driving 210 of two sides.Wherein the one of side
The scanning signal of a turntable driving 210 is transmitted to the other end by one end (being assumed to be first end) of scan line 220.The other side
The scanning signal of respective scanned driving 210 is transmitted to above-mentioned first end by the other end of the scan line 220, and then realizes the scanning
The application of scanning signal on line 220, so that the sub-pixel in the scan line 220 receives scanning signal and opens.At this point, scanning
The end RC retardation ratio of line 220 acts on minimum, and the first scanner section 221 is located at the end of scan line 220.And the center of scan line 220
The RC retardation ratio effect for receiving the turntable driving 210 at both ends is larger, therefore RC retardation ratio effect is maximum, and the second scanner section 222 is located at
The center of scan line 220.
Meanwhile the present embodiment setting test electrode group 250 includes two scan electrode groups 251.Each scan electrode group 251
Including two the first scan electrodes 2511 and second scan electrode 2512.Two the first scan electrodes 2511 can be distinguished
Test the practical electric signal of first scanner section 221 at 220 both ends of scan line.One the second scan electrode 2512 can test scanning
The practical electric signal of second scanner section 222 in 220 center of line.Therefore, the present embodiment not only precisely can effectively assess scan line
Charging ability difference on 220, but also whether the symmetry that can verify bilateral driving is good.Also, two groups of test electrodes
Accurate testing degree is verified mutually and then be can be further improved to group 250.
Also, four the first scan electrodes 2511 that two scan electrode groups 251 are arranged in the present embodiment are located at array
Second scan electrode 2512 of four apex angles of substrate 200, two scan electrode groups 251 is located at the center two of array substrate 200
Side, and then tested convenient for external probe.
, can also be different from above-mentioned set-up mode when scanning is using bilateral driving in certain the application other embodiments, example
Such as, first scanner section 221 and second scanner section 222 in 220 center of scan line of 220 one end of scan line are only tested.
In one embodiment, with reference to Fig. 2, data-driven 230 is located at the unilateral side of array substrate 200, i.e. display panel
Data charging is carried out using unilateral driving.At this point, the data-signal of one data-driven 230 of data line 240 reception, number
It is believed that number being transmitted to the other end by one end of same data line 240.So the first data portion 221 is located at the second data portion 222
The both ends of data line 240.
Meanwhile the present embodiment setting test electrode group 250 includes two data electrode groups 252.Each data electrode group 252
Including first data electrode 2521 and second data electrode 2522.First data of two data electrode groups 252
Electrode 2521 and the second data electrode 2522 are located at four apex angles of array substrate, and then are surveyed convenient for external probe
Examination.Meanwhile accurate testing degree is verified mutually and then be can be further improved to two groups of test electrode groups 250.
It is above-mentioned unilateral side data-driven 210 set-up mode and scanning single side driving 210 set-up mode similarly.Certainly, exist
In larger sized display panel, data-driven 230 may be alternatively located at the bilateral of array substrate 200.At this point, the setting of data-driven
Mode can also be with the set-up mode of bilateral turntable driving 210 similarly, then this is repeated no more.
In one embodiment, as shown in Fig. 2, providing a kind of array substrate, including turntable driving 210, multiple scan lines
220, data-driven 230, multiple data lines 240 and test electrode group 250.Turntable driving 210 is for exporting scanning signal, position
In the unilateral side of array substrate 200.Scan line 220 is electrically connected turntable driving 210, is used for transmission scanning signal.With scan line 220
With the first scanner section 221 and the second scanner section 222.Scanning signal is transmitted to the second scanner section 222 by the first scanner section 221.
Data-driven 230 is used for outputting data signals, positioned at the unilateral side of array substrate 200.Data line 240 is electrically connected data-driven 230,
It is used for transmission data-signal.Same data line 240 has the first data portion 241 and the second data portion 242.Data-signal is by first
Data portion 241 is transmitted to the second data portion 242.
Test electrode group 250 is for testing practical electric signal.Testing electrode group 250 includes two 251 Hes of scan electrode group
Two data electrode groups 252.Each scan electrode group 251 includes first scan electrode 2511 and second scan electrode
2512.The first scan electrode 2511 in same scan electrode group 251 is used to test first scanner section an of scan line 220
221 practical electric signal, the second scan electrode 220 are used to test the practical telecommunications of the second scanner section 222 of the scan line 220
Number.Two scan electrode groups 251 test the practical electric signal of two scan lines 220 respectively.
Each data electrode group 252 includes first data electrode 2521 and second data electrode 2522.It is same
The first data electrode 2521 in data electrode group 252 is used to test the practical electricity of first data portion 241 an of data line 240
Signal, the second data electrode 2522 are used to test the practical electric signal of the second data portion 241 of the data line 240.
The first scan electrode 2511 and the second scan electrode 2512 of two scan electrode groups 251 are located at array substrate
200 four apex angles.Meanwhile the first data electrode 2521 of two data electrode groups 252 also divides with the second data electrode 2522
Not Wei Yu array substrate 200 four apex angles.
A scan electrode group 251 in the present embodiment can test the practical electrical signal wave at 220 both ends of scan line
Shape, and then can be with both ends caused by itself resistance value of the accurate evaluation scan line 220 by the comparison of the actual signal waveform at both ends
Charging ability difference.And two scan electrode groups 251 can be mutually authenticated, and then improve test accuracy.Meanwhile this implementation
A data electrode group 252 in example can test the practical electric signal waveform at 240 both ends of data line, and then pass through both ends
The comparison of actual signal waveform can be with both ends charging ability difference caused by itself resistance value of the accurate evaluation data line 240.And
And two data electrode groups 252 can be mutually authenticated, and then improve test accuracy.
Each technical characteristic of above embodiments can be combined arbitrarily, for simplicity of description, not to above-described embodiment
In each technical characteristic it is all possible combination be all described, as long as however, the combination of these technical characteristics be not present lance
Shield all should be considered as described in this specification.
The several embodiments of the application above described embodiment only expresses, the description thereof is more specific and detailed, but simultaneously
The limitation to utility model patent range therefore cannot be interpreted as.It should be pointed out that for the ordinary skill people of this field
For member, without departing from the concept of this application, various modifications and improvements can be made, these belong to the application's
Protection scope.Therefore, the scope of protection shall be subject to the appended claims for the application patent.
Claims (10)
1. a kind of array substrate characterized by comprising
Turntable driving, for exporting scanning signal；
Multiple scan lines are electrically connected the turntable driving, are used for transmission the scanning signal；The same scan line has first
Scanner section and the second scanner section, the scanning signal are transmitted to second scanner section by first scanner section；
Data-driven is used for outputting data signals；
Multiple data lines are electrically connected the data-driven, are used for transmission the data-signal；The same data line has first
Data portion and the second data portion, the data-signal are transmitted to second data portion by first data portion；
Electrode group is tested, for testing practical electric signal；
The test electrode group includes at least one scan electrode group and/or at least one data electrode group；The scan electrode
Group includes the first scan electrode and the second scan electrode, and first scan electrode is for testing any one of scan line
The practical electric signal of first scanner section, second scan electrode are used to test the second scanner section of any one of scan line
Practical electric signal；The data electrode group includes the first data electrode and the second data electrode, and first data electrode is used
In the practical electric signal for the first data portion for testing any one of data line, second data electrode is any for testing
The practical electric signal of second data portion of one data line.
2. array substrate according to claim 1, which is characterized in that the array substrate have viewing area with it is non-display
Area, the test electrode group are located at the non-display area.
3. array substrate according to claim 2, which is characterized in that the non-display area include driving side with it is non-driven
Side, the driving side are located at the non-drive side relative to the non-drive side wiring congestion, the test electrode group.
4. array substrate according to claim 1, which is characterized in that
The test electrode group includes scan electrode group, first scan electrode in the same scan electrode group with it is described
Second scan electrode is electrically connected to the same scan line.
5. array substrate according to claim 1, which is characterized in that
The test electrode group includes data electrode group, first data electrode in the same data electrode group with it is described
Second data electrode is electrically connected to the same data line.
6. array substrate according to claim 1, which is characterized in that
The turntable driving is located at the unilateral side of the array substrate, and first scanner section is with second scanned position in described
The both ends of scan line；
The test electrode group includes two scan electrode groups, and each scan electrode group includes first scan electrode and one
A second scan electrode；
First scan electrode and second scan electrode of two scan electrode groups are located at the array base
Four apex angles of plate.
7. array substrate according to claim 1, which is characterized in that
The turntable driving is located at the bilateral of the array substrate, first scanned position in the end of the scan line, with
Second scanner section is located at the center of the scan line；
The test electrode group includes two scan electrode groups, and each scan electrode group includes two the first scan electrodes and one
A second scan electrode；
First scan electrode of two scan electrode groups is located at four apex angles of the array substrate, and described two
Second scan electrode of a scan electrode group is located at the central two sides of the array substrate.
8. array substrate according to claim 1, which is characterized in that
The data-driven is located at the unilateral side of the array substrate, and first data portion and second data portion are located at described
The both ends of data line；
The test electrode group includes two data electrode groups, and each data electrode group includes first data electrode and one
A second data electrode；
First data electrode and second data electrode of two data electrode groups are located at the array base
Four apex angles of plate.
9. a kind of array substrate characterized by comprising
Turntable driving, for exporting scanning signal, positioned at the unilateral side of the array substrate；
Multiple scan lines are electrically connected the turntable driving, are used for transmission the scanning signal；The same scan line has first
Scanner section and the second scanner section, the scanning signal are transmitted to second scanner section by first scanner section；
Data-driven is used for outputting data signals, positioned at the unilateral side of the array substrate；
Multiple data lines are electrically connected the data-driven, are used for transmission the data-signal；The same data line has first
Data portion and the second data portion, the data-signal are transmitted to second data portion by first data portion；
Electrode group is tested, for testing practical electric signal；The test electrode group includes two scan electrode groups and two data
Electrode group；The scan electrode group includes first scan electrode and second scan electrode；The same scan electrode
The practical electric signal of first scanner section of first scan electrode for testing the scan line in group, described second
Scan electrode is used to test the practical electric signal of the second scanner section of the scan line；Two scan electrode groups test two respectively
The practical electric signal of a scan line；The data electrode group includes first data electrode and second data electrode；Together
First data electrode in the one data electrode group is used to test the reality of first data portion of the data line
Electric signal, second data electrode are used to test the practical electric signal of the second data portion of the data line；Two data
Electrode group tests the practical electric signal of two data lines respectively；
First scan electrode and second scan electrode of two scan electrode groups are located at the array base
Four apex angles of plate；First data electrode of two data electrode groups is also located at second data electrode
Four apex angles of the array substrate.
10. a kind of display panel, which is characterized in that including the described in any item array substrates of claim 1-9.
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|---|---|---|---|
| CN201822072689.5U CN209103793U (en) | 2018-12-11 | 2018-12-11 | Array substrate and display panel |
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| CN201822072689.5U CN209103793U (en) | 2018-12-11 | 2018-12-11 | Array substrate and display panel |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20220149027A1 (en) * | 2020-11-06 | 2022-05-12 | Samsung Display Co., Ltd. | Display device and method of fabricating display device |
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2018
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20220149027A1 (en) * | 2020-11-06 | 2022-05-12 | Samsung Display Co., Ltd. | Display device and method of fabricating display device |
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