CN208849775U - Test device and test macro - Google Patents

Abstract

The utility model provides a kind of test device, and it includes Test benchs and reflector.The Test bench defines accommodation space.The reflector is placed in the accommodation space and has nonparallel multiple reflecting surfaces each other.The reflecting surface defines emission space.

Description

Test device and test macro

Technical field

The utility model relates to a kind of test device, a kind of test macro and a kind of test methods, and are related to use Tether-free technologies (non-contact technique) test a kind of test of wireless module (wireless module) Device, a kind of test macro and a kind of test method.

Background technique

Wireless module (such as: millimeter wave RF wireless module (mmWave RF wireless module)) it can use sky Middle radiation pattern (over the air, OTA) is tested.Such test can test room (testing room) (or survey Try room (testing chamber)) in execute, wherein (such as inside it on surface) has disposed multiple absorbers.Such survey The volume for trying room (or test cabinet) is quite big.For example, size can for 6 meters (m) × 6m × 6m or 60 centimetre (cm) × 60cm×60cm.In addition, such test may take a long time.Therefore, such test may be not suitable for test volume The device of production, that is, such test is not suitable for as mass production technique or volume production process (mass production Process a part in).

Utility model content

According on one side, in some embodiments, a kind of test device includes Test bench (testing socket) With reflector (reflector).The Test bench defines accommodation space (accommodating space).The reflector It is placed in the accommodation space and there is nonparallel multiple reflecting surfaces each other.The reflecting surface defines emission space (transmission space)。

According to another aspect, in some embodiments, a kind of test device includes test fixture (testing fixture) With device bracket (device holder).The test fixture defines the first opening and opposite with first opening second Opening, and there are multiple reflecting surfaces.The reflecting surface defines the transmitting between first opening and second opening Space.Described device bracket is placed in the emission space and defines upper opening.Described device bracket include at least one the One signal emission part and second signal emitting portion.The upper opening of described device bracket corresponds to the test fixture First opening.First signal emission part and the second signal emitting portion, which define, accepts space, and described the Binary signal emitting portion is opposite with the upper opening.

According to another aspect, in some embodiments, a kind of test macro includes test device, circuit board and tester (tester).The test device includes Test bench, reflector and device bracket.The Test bench define the first opening, Accommodation space with first opening between the second opposite opening and first opening and second opening.It is described Reflector is placed in the accommodation space and has multiple reflecting surfaces.Described device bracket is placed in the accommodation space And define undertaking space (receiving space) to accommodate device under test (device under test, DUT).It is described Device bracket includes at least one first signal emission part and second signal emitting portion.The circuit board is placed in the survey It tries first overthe openings of pedestal and is configured to be electrically connected to the DUT.The tester is placed in the test base Second opening of seat is lower and is electrically connected to the circuit board.The tester includes corresponding to the described of the Test bench The test antenna of second opening.

According to another aspect, in some embodiments, a kind of test method includes: test board and DUT (a) are provided, it is described DUT includes first surface, the second surface opposite with the first surface, and is connect adjacent to multiple electricity of the first surface Point；(b) apply suction on the first surface of the DUT, so that the electric contact of the DUT is electrically connected to institute State test board.

Detailed description of the invention

When read in conjunction with the accompanying drawings, from it is described in detail below should be readily appreciated that some embodiments of the utility model in terms of. It should be noted that various structures may be not drawn on scale, and the size of various structures can for discuss it is clear for the sake of arbitrarily increase or Reduce.

Fig. 1 illustrates the sectional view of the test device of some embodiments according to the present utility model.

Fig. 2 illustrates the top view of test device demonstrated in Figure 1.

The sectional view of the device bracket of the test device of Fig. 3 explanatory diagram 1.

Fig. 4 illustrates the perspective view of device bracket demonstrated in Figure 3.

Fig. 5 illustrates the sectional view of the device bracket of some embodiments according to the present utility model.

Fig. 6 illustrates the perspective view of device bracket demonstrated in Figure 5.

The perspective view of the Test bench of the test device of Fig. 7 explanatory diagram 1.

The perspective view of the reflector of the test device of Fig. 8 explanatory diagram 1.

The perspective view of the test fixture of the test device of Fig. 9 explanatory diagram 1.

Figure 10 illustrates the sectional view of the test fixture of some embodiments according to the present utility model.

Figure 11 illustrates the sectional view of the test fixture of some embodiments according to the present utility model.

Figure 12 illustrates the sectional view of the test fixture of some embodiments according to the present utility model.

Figure 13 illustrates the sectional view of the test fixture of some embodiments according to the present utility model.

Figure 14 illustrates the sectional view of the test device of some embodiments according to the present utility model.

The top view of the test device shown in Figure 15 explanatory diagram 14.

The perspective view of the device bracket shown in Figure 16 explanatory diagram 14 and Figure 15.

Figure 17 illustrates the sectional view of the test device of some embodiments according to the present utility model.

The top view of the test device shown in Figure 18 explanatory diagram 17.

The perspective view of the device bracket shown in Figure 19 explanatory diagram 17 and Figure 18.

Figure 20 illustrates the sectional view of the test macro of some embodiments according to the present utility model.

Figure 21 illustrates one or more stages of the example of the test method of some embodiments according to the present utility model.

Figure 22 illustrates one or more stages of the example of the test method of some embodiments according to the present utility model.

The top view in one or more stages of the test method shown in Figure 23 explanatory diagram 22.

Figure 24 illustrates one or more stages of the example of the test method of some embodiments according to the present utility model.

Figure 25 illustrates the radiation path of the test macro of some embodiments according to the present utility model.

Figure 26 illustrates the radiation path of the test macro of some embodiments according to the present utility model.

Figure 27 illustrates the various sizes of the test macro of some embodiments according to the present utility model.

Figure 28 illustrates the schematic diagram of the test macro of some embodiments according to the present utility model.

Specific embodiment

It is numbered through schema and embodiment using collective reference to indicate same or similar component.From in conjunction with attached drawing with The embodiments of the present invention will be better understood in lower detailed description.

Content disclosed below provides many different embodiments or examples of the different characteristic for implementing provided theme.? The particular instance of component and arrangement is described below to illustrate the particular aspects of the utility model.Certainly, these components, value, operation, Material and arrangement are only example and are not intended to restrictive.For example, herein in provided description, fisrt feature Above second feature or on formation may include implementation that fisrt feature and second feature are directly contact formed or disposed Example, and also may include that additional features can be formed or be disposed between fisrt feature and second feature so that fisrt feature is special with second Levy the embodiment that can be not directly contacted with.In addition, the utility model can herein provided by repeated reference number in various examples Word and/or letter.This repeat be for purposes of simplicity and clarity, and do not indicate that in itself discussed various embodiments and/or Relationship between configuration.

In comparative test process, device under test (device under test, DUT) can have first surface and with The opposite second surface of first surface.DUT may include multiple solder projections and antenna.Solder projection can be placed in first surface On, and antenna can be placed on second surface.During test process, test fixture (testing fixture) from DUT Pick up (picks up) DUT in two surfaces.Therefore, the hard material (such as metal material) of test fixture may contact second surface On antenna.Therefore, the efficiency (such as deformation via antenna) of antenna can be negatively affected.

If DUT includes mutiple antennas, the antenna of DUT can emit signal from different directions.However, to receive The test antenna of the signal of the antenna of DUT is in a fixed position.Therefore, during test process, DUT and test fixture must revolve Three-sixth turn receives so that all signals from DUT can be tested antenna.Such test fixture is very difficult to design.

The disclosure provides one kind can be during mass production (that is, volume production) for the test device in production line.One In a little embodiments, test device includes the reflector being placed in the accommodation space of Test bench, so that reflector can be in the future From the signal reflex of DUT to test antenna.Therefore, the size of test device can be effectively reduced.Some realities of the utility model It applies example and a kind of test method is at least provided, provide suction on the first surface of DUT so that electricity on the first surface of DUT Contact is electrically connected to test board.

Fig. 1 illustrates the sectional view of the test device 1 of some embodiments according to the present utility model.Institute's exhibition in Fig. 2 explanatory diagram 1 The top view for the test device 1 shown.It should be noted that Fig. 1 is the sectional view intercepted along the line I-I of Fig. 2.Test device 1 includes to survey Fixture (testing fixture) 11 is tried (including, for example, Test bench (testing socket) 12 and reflector (reflector) 14) and device bracket (device holder) 2.

Test bench 12 defines the opening of accommodation space (accommodating space) 123, first 125 and the second opening 126.Second opening 126 and the first opening 125 are opposite, and accommodation space 123 is placed in the first opening 125 and the second opening 126 Between.The opening of accommodation space 123, first 125 communicates with each other with the second opening 126.In some embodiments, Test bench 12 wraps Containing one or more side walls 121 (such as four side walls 121) and bottom wall 122.The respective tops part of side wall 121 can define first and open Mouth 125.Side wall 121 may be connected to bottom wall 122 to define accommodation space 123.Bottom wall 122 can define the second opening 126.Such as Fig. 1 Middle to be shown, the second opening 126 can be positioned at the center of bottom wall 122 and can extend across bottom wall 122.First opening 125 Width is greater than the width (for example, about 1.3 times or bigger, about 1.5 times or bigger or about 2 times or more large) of the second opening 126.One In a little embodiments, side wall 121 and bottom wall 122 are integrally molded so as monomer structure.In addition, Test bench 12 can be on the top of side wall 121 Multiple slits (slot) 127 are further defined in portion (such as upper surface 1211), the slit 127 is used for catching device bracket 2 Extension 22.

Reflector 14 is placed in the accommodation space 123 of Test bench 12, and includes nonparallel multiple reflection tables each other Face 143.Reflecting surface 143 is inclined surface and defines emission space (transmission space) 144.It is opened up as shown in figure 1 Show, reflector 14 defines the first opening 145 and second opening 146 opposite with the first opening 145, and the width of the first opening 145 Degree is different from the width of the second opening 146.The width of first opening 145 is greater than (for example, about 1.3 times of width of the second opening 146 Or it is bigger, about 1.5 times or bigger or about 2 times or more large), and emission space 144 is placed in the first opening 145 and is open with second Between 146.The opening of emission space 144, first 145 communicates with each other with the second opening 146.

The material of reflector 14 may include metal, such as aluminium, copper, iron or steel, other reflective metals or its alloy.One In a little embodiments, the reflecting surface 143 of reflector 14 is flat surfaces or curved surface.In some embodiments, a reflection Surface 143 may include two or more nonparallel sublist faces (sub-surfaces) each other.Reflector 14 may include four A curved corner surface 147, and each of curved corner surface 147 be placed between two reflecting surfaces 143 (with Clock-wise fashion).Therefore, flat inclined surface may be not present (in clockwise manner) between two reflecting surfaces 143. In some embodiments, reflector 14 includes four reflective portion 14'.The section of each of reflective portion 14' is triangle Shape, and all reflective portion 14' can be integrally molded so as monomer structure.Reflector 14 can be integrally molded so as monomer structure.Reflecting part Divide each of 14' that there is reflecting surface 143, outer surface 141 and bottom surface 142.Therefore, there are four the tools of reflector 14 Outer surface 141 and bottom surface 142.First opening 145 is defined by the top edge of four reflective portion 14', and second opens Mouthfuls 146 by four reflective portion 14' bottom internal fringe enclosing.When reflector 14 is placed in Test bench 12, reflection The side wall 121 of outer surface 141 and bottom surface 142 the difference engaged test pedestal 12 of device 14 and the interior surface of bottom wall 122. In addition, the first opening 145 of reflector 14 corresponds to the first opening 125 and aligned with it of Test bench 12, and reflector 14 The second opening 146 correspond to the second opening 126 and aligned with it of Test bench 12.Therefore, the second of Test bench 12 opens Mouth 126 is connected to the emission space 144 of reflector 14.As demonstrated in Figure 1, side wall of the reflecting surface 143 in Test bench 12 Extend between the top edge of the side wall of second opening 126 of the internal edge and Test bench 12 at 121 top.

Device bracket 2 is placed in the emission space 144 of the reflector 14 of test fixture 11, and by test fixture 11 (by Such as Test bench 12 or reflector 14) support.As demonstrated in Figure 1, device bracket 2 includes receptacle portion (receiving Portion) 21 and extension (extending portion) 22.Receptacle portion 21, which defines, accepts space (receiving Space) 23 for storing device under test (device under test, DUT) 4 (see Figure 20).Extension 22 is from carrier Divide the upper surface 1211 of 21 Test benchs 12 for extending to test fixture 11.In some embodiments, extension 22 can position In or be coupled in Test bench 12 the slit (slot) 127 of side wall 121 in.As illustrated in figures 1 and 2, device bracket 2 is pacified It is placed in accommodation space 123 in emission space 144, is surrounded so that accepting space 23 by the reflecting surface 143 of reflector 14, And the reflecting surface 143 of reflector 14 is facing towards the undertaking space 23 of device bracket 2.

In addition, the receptacle portion 21 of device bracket 2 defines upper opening 24.The upper opening 24 of device bracket 2 corresponds to test First opening 145 of the reflector 14 of the first opening 125 and test fixture 11 of the Test bench 12 of fixture 11.In addition, device The receptacle portion 21 of bracket 2 includes at least one or more first signal emission parts (first signal transmission Portion) 211 and second signal emitting portion (second signal transmission portion) 212.First signal Emitting portion 211 is connected to second signal emitting portion 212, and the first signal emission part 211 and second signal emitting portion 212 define undertaking space 23 together.Second signal emitting portion 212 and upper opening 24 are opposite.As illustrated in figures 1 and 2, it fills The receptacle portion 21 for setting bracket 2 includes four the first signal emission parts for corresponding respectively to four sides of receptacle portion 21 211.Second signal emitting portion 212 corresponds to the bottom side of receptacle portion 21.In addition, extension 22 is from the first signal emission part Divide the upper surface 1211 of 211 Test benchs 12 for extending to fixture 11.

The sectional view of the device bracket 2 of the test device 1 of Fig. 3 explanatory diagram 1.Fig. 4 illustrates device bracket demonstrated in Figure 3 2 perspective view.Device bracket 2 may include multiple bands (strip) or stick (bar), and can be integrally molded so as monomer structure.One In a little embodiments, the material of device bracket 2 can such as plastics, wood, acrylic acid (acrylic) or aeroge (aerogel).It holds First signal emission part 211 of socket part point 21 defines lateral openings 2111, and includes lateral openings 2111 and the first banded portion Divide 2112.The second signal emitting portion 212 of receptacle portion 21 defines under shed 2121, and includes under shed 2121 and Article 2 Band part 2122.Second strip part 2122 can hold or hold the bottom margin of DUT 4 (see Figure 20).Therefore, device bracket 2 Undertaking space 23 be connected to the emission space 144 of reflector 14 (see Fig. 1) by under shed 2121 and lateral openings 2111.Figure The device bracket 2 of 3 and Fig. 4 can be referred to " mesh bag type (net bag type) ".

Fig. 5 illustrates the sectional view of the device bracket 2a of some embodiments according to the present utility model.Institute in Fig. 6 explanatory diagram 5 The perspective view of the device bracket 2a of displaying.Device bracket 2a is similar to Fig. 3 and device bracket 2 demonstrated in Figure 4, but different Locate as follows.Such as Fig. 5 and demonstrated in Figure 6, the first signal emission part 211 may include the first signal emission part 211a, and The first strip portion 2112a of one signal emission part 211a extends towards lateral openings 2111a.Therefore, the of Fig. 5 and Fig. 6 The side of first signal emission part 211 of the size of the lateral openings 2111a of one signal emission part 211a less than Fig. 3 and Fig. 4 To the size of opening 2111.The the first strip portion 2112a extended can hold the side surface 47 of DUT 4 (see Figure 20).

The perspective view of the Test bench 12 of the test device 1 of Fig. 7 explanatory diagram 1.Test bench 12 may include four side walls 121 With bottom wall 122.The top section of side wall 121 can define the first opening 125.Side wall 121 may be connected to bottom wall 122 to define and accommodate Space 123.Bottom wall 122 can define the second opening 126.Second opening 126 can be positioned at the center of bottom wall 122 and may extend away and wear Cross bottom wall 122.The width of first opening 125 be greater than the second opening 126 width (for example, about 1.3 times or bigger, about 1.5 times or It is bigger or about 2.0 times or bigger).In some embodiments, side wall 121 and bottom wall 122 are integrally molded so as monomer structure.In addition, Test bench 12 can further define prolonging for catching device bracket 2 in the top (such as upper surface 1211) of side wall 121 Multiple slits 127 of extending portion point 22.

The perspective view of the reflector 14 of the test device 1 of Fig. 8 explanatory diagram 1.Reflector 14 may include each other nonparallel four A reflecting surface 143, and define the first opening 145, second opening 146 and first opening 145 opposite with the first opening 145 With the emission space 144 between the second opening 146.The width of first opening 145 is greater than the width of the second opening 146 (for example, about 1.3 times or bigger, about 1.5 times or bigger or about 2.0 times or bigger).In addition, reflector 14 can further include four it is curved Corner surface 147, and each of curved corner surface 147 is placed between two reflecting surfaces 143 (with side clockwise Formula).Therefore, flat inclined surface may be not present between two reflecting surfaces 143 (in clockwise manner).In some implementations In example, reflector 14 can be integrally molded so as monomer structure.Reflector 14 has one or more outer surfaces 141, and (such as four outer Portion surface 141) and bottom surface 142.First opening 145 is defined by the top edge of four reflecting surfaces 143, and the second opening 146 by four reflecting surfaces 143 bottom internal fringe enclosing.

The perspective view of the test fixture 11 of the test device 1 of Fig. 9 explanatory diagram 1.When reflector 14 is placed in Test bench 12 Accommodation space 123 in form test fixture 11 when, the outer surface 141 and bottom surface 142 of reflector 14 connect respectively Touch the side wall 121 of Test bench 12 and the interior surface of bottom wall 122.In addition, the first opening 145 of reflector 14 corresponds to test First opening 125 of pedestal 12, and the second opening 146 of reflector 14 is aligned with the second opening 126 of Test bench 12.Cause This, the second opening 126 of Test bench 12 is connected to the emission space 144 of reflector 14.

Figure 10 illustrates the sectional view of the test fixture 11a of some embodiments according to the present utility model.Test fixture 11a class It is similar to Fig. 1 and test fixture 11 demonstrated in Figure 9, is not existed together as described below.As demonstrated in Figure 10, Fig. 1 and Fig. 9's is anti- Emitter 14 and Test bench 12 can be integrally molded so as monomer structure to form test fixture 11a.That is, test fixture 11a is monomer Boundary may be not present in structure between the reflector 14 and Test bench 12 of Fig. 1 and Fig. 9.Test fixture 11a can define first Opening 115 and second opening 116 opposite with the first opening 115, and may include multiple reflecting surfaces 113, it defines first and opens Emission space 114 between mouth 115 and the second opening 116.The width of first opening 115 is greater than the width (example of the second opening 116 Such as from about 1.3 times or bigger, about 1.5 times or bigger or about 2.0 times or bigger).Test fixture 11a can at the top of it (such as upper table Face) on further define multiple slits 117, be used for the extension 22 of catching device bracket 2.The material of test fixture 11a Can reflecting material, such as metal.Therefore, reflecting surface 113 can reflected electromagnetic signal.

Figure 11 illustrates the sectional view of the test fixture 11b of some embodiments according to the present utility model.Test fixture 11b class It is similar to test fixture 11a demonstrated in Figure 10, is not existed together as described below.As shown in fig. 11, the material of test fixture 11b Material may include non-reflective materials, and the placement of reflecting material 118 (such as coating) of such as metal is on reflecting surface 113.

Figure 12 illustrates the sectional view of the test fixture 11c of some embodiments according to the present utility model.Test fixture 11c class It is similar to Fig. 1 and test fixture 11 demonstrated in Figure 9, is not existed together as described below.As shown in Figure 12, reflector 14a can It is identical as the reflector 14 of Fig. 1 and Fig. 9, but (that is, putting upside down) can be disposed on the contrary.Therefore, the bottom surface 142 of reflector 14a Up, and the inner surface of the bottom wall 122 of not engaged test pedestal 12.In addition, the second opening 146 of Fig. 1 becomes in Figure 12 First opening 145a, and the first opening 145 of Fig. 1 becomes the second opening 146a in Figure 12.The width of first opening 145a is small In the width (for example, about 3/4 times or smaller, about 1/2 times or smaller or about 1/4 times or more) of the second opening 146a.In some implementations In example, reflector 14a and Test bench 12 can be integrally molded so as monomer structure.Test fixture 11c can be integrally molded so as monomer knot Structure.

Figure 13 illustrates the sectional view of the test fixture 11d of some embodiments according to the present utility model.Test fixture 11d class It is similar to Fig. 1 and test fixture 11 demonstrated in Figure 9, is not existed together as described below.As demonstrated in Figure 13, reflector 14b can Include reflector 14 and annular inner portion 14c.The reflector 14 of Figure 13 can be identical as the reflector 14 of Fig. 1 and Fig. 9.Annular inner portion 14c can be placed on reflecting surface 143.The section of a part of annular inner portion 14c can be generally triangular.Annular inner portion Up, and define the first opening 145b in the top surface 148 of 14c.The top surface 148 of annular inner portion 14c can be substantially parallel to reflection The bottom surface 142 of device 14.Annular inner portion 14c may include multiple reflecting surfaces 149, the reflecting surface 143 with reflector 14 Generally intersect.One or more contacts between one in reflecting surface 143 and one in reflecting surface 149 may be defined as Curve.It is empty that the uncovered reflecting surface 143 of the reflecting surface 149 of annular inner portion 14c and reflector 14 defines transmitting together Between 144'.

Intersection (contact) boundary between the reflecting surface 149 of annular inner portion 14c and the reflecting surface 143 of reflector 14 Determine third opening 147b.In addition, the second opening 146 of Fig. 1 becomes the second opening 146b in Figure 13.Therefore, reflector 14b circle Fixed first opening 145b, the second opening 146b and third opening 147b.Third is open 147b positioned at the first opening 145b and second It is open between 146b, and the width of third opening 147b is not equal to the width of the first opening 145b and the second opening 146b.Such as figure It is shown in 13, the width of third opening 147b is greater than (for example, about 1.3 times of width of the first opening 145b and the second opening 146b Or it is bigger, about 1.5 times or bigger or about 2.0 times or bigger).In some embodiments, reflector 14 and annular inner portion 14c can one Body formed is monomer structure.Reflector 14b can be integrally molded so as monomer structure.In some embodiments, reflector 14b and test Pedestal 12 can be integrally molded so as monomer structure.Test fixture 11d can be integrally molded so as monomer structure.

Figure 14 illustrates the sectional view of the test device 1a of some embodiments according to the present utility model.In Figure 15 explanatory diagram 14 The top view of the test device 1a shown.Test device 1a includes test fixture 11e (including, for example, Test bench 12a and instead Emitter 14) and device bracket 2b.Test bench 12a is similar to the Test bench 12 of Fig. 1 and Fig. 2, does not exist together as described below, surveys Examination pedestal 12a further includes top (such as upper surface 1211) the prominent ring outstanding from the side wall 121 of Test bench 12a 128.The protrusion ring 128 of the side wall 121 of Test bench 12a defines housing region (accommodating with upper surface 1211 together Area) 129, it is used for the extension 25 of catching device bracket 2b.

Device bracket 2b includes receptacle portion 21 and extension 25.The receptacle portion 21 and Fig. 1 and Fig. 2 of device bracket 2b Device bracket 2 receptacle portion 21 it is identical.That is, the receptacle portion 21 of device bracket 2b, which defines, accepts space 23 and upper opening 24.Accepting space 23 can be used for storing DUT 4 (see Figure 20).The upper opening 24 of device bracket 2b is corresponding to test fixture 11e's First opening 145 of the reflector 14 of the first 125 and test fixture 11e of opening of Test bench 12a.The extension of device bracket 2b Part 25 extends to the upper surface 1211 of the Test bench 12a of test fixture 11e from receptacle portion 21.In some embodiments, Extension 25 can be positioned in housing region 129.Therefore, extension 25 periphery bottom by test fixture 11e survey The upper surface 1211 for trying pedestal 12a supports, and the outer surface of extension 25 is limited by prominent ring 128.

The perspective view of the device bracket 2b shown in Figure 16 explanatory diagram 14 and Figure 15.Device bracket 2b be similar to Fig. 3 and The device bracket 2 of Fig. 4 does not exist together as described below, and the extension 25 of device bracket 2b is plate, and it has to correspond to and holds The central through hole of socket part point 21.Device bracket 2b can be referred to " shape for hat (hat type) ".The device bracket 2b of Figure 14 to Figure 16 Rigidity bear bigger downward push power than the device bracket 2 of Fig. 3 and Fig. 4, and can provide the good stabilization of the position of DUT Property.

Figure 17 illustrates the sectional view of the test device 1b of some embodiments according to the present utility model.In Figure 18 explanatory diagram 17 The top view of the test device 1b shown.Test device 1b includes test fixture 11f (including, for example, Test bench 12b and instead Emitter 14) and device bracket 2c.Test bench 12b is similar to the Test bench 12 of Fig. 1 and Fig. 2, does not exist together as described below, surveys It tries pedestal 12b and does not include slit 127.

Device bracket 2c includes receptacle portion 21c and solid portion (solid portion) 26.Device bracket 2c is solid Block structure (solid block structure).The receptacle portion 21c of device bracket 2c, which is defined, accepts space 23 and upper opening 24.Space 23 is accepted for accepting or storing DUT.The upper opening 24 of device bracket 2c corresponds to the test base of test fixture 11f First opening 145 of the reflector 14 of the first 125 and test fixture 11f of opening of seat 12b.The receptacle portion of device bracket 2c 21c includes at least one first signal emission part 211c and second signal emitting portion 212c.First signal emission part 211c is connected to second signal emitting portion 212c, and the first signal emission part 211c and second signal emitting portion 212c mono- It rises to define and accepts space 23.Second signal emitting portion 212c and upper opening 24 are opposite.As shown in Figure 17, the first signal hair The internal side wall that part 211c can be receptacle portion 21c is penetrated, and second signal emitting portion 212c can be the interior of receptacle portion 21c Portion's bottom wall.

In addition, solid portion 26 can have upper surface 261, bottom surface 262 and multiple outer surfaces 263.Bottom surface 262 is opposite with upper surface 261, and outer surface 263 extends between upper surface 261 and bottom surface 262.Receptacle portion 21c Be recessed in upper surface 261, and bottom surface 262 facing towards Test bench 12b second be open 126.In some embodiments, Solid portion 26 can be placed in the accommodation space 123 of Test bench 12b.Therefore, device bracket 2c can be by test fixture 11f's The reflecting surface 143 of reflector 14 supports, and outer surface 263 contacts the reflecting surface 143 of reflector 14.In some embodiments In, the material of device bracket 2c may include plastics, wood, acrylic acid or aeroge.The size of device bracket 2c can generally etc. In the size of emission space 144, and upper surface 261 can be substantially coplanar with the upper surface 1211 of Test bench 12b.

The perspective view of the device bracket 2c shown in Figure 19 explanatory diagram 17 and Figure 18.Device bracket 2c is solid agllutination Structure, and it is tapered from upper surface 261 to bottom surface 262.Dress of the rigidity than Fig. 3 to Fig. 4 of the device bracket 2c of Figure 17 to 19 It sets bracket 2 and bears bigger downward push power, and the excellent stability of the position of DUT is provided.

Figure 20 illustrates the sectional view of the test macro 3 of some embodiments according to the present utility model.Test macro 3 includes to survey 1, DUT 4, top circuit board 34 (such as test board (test board)), 30, collet handling arm (handler arm) are set in trial assembly (chuck) 32, connection pedestal (connecting socket) 35,36, tester converter board (convertor board) (tester) 38, base circuit board 50 (such as load board (load board)), plate reinforcer (board stiffener) 52 Hes Test antenna (test antenna) 54.The test device 1 of Figure 20 and the test device 1 of Fig. 1 and Fig. 2 are identical, and include test Fixture 11 (including, for example, Test bench 12 and reflector 14) and device bracket 2.

DUT 4 is placed in the undertaking space 23 of device bracket 2, and DUT 4 includes at least one signal emitting-source, right It should be at least one of the first signal emission part 211 and second signal emitting portion 212.Signal emitting-source can have hair Penetrate/receive the function of signal.In some embodiments, DUT 4 can be encapsulating structure, and can have first surface 41 and first The opposite second surface 42 in surface 41 and multiple side surfaces 47.DUT 4 may include substrate 43, at least one electric component 44, envelope Fill body (encapsulant) 45 and antenna 46.Therefore, DUT 4 be with antenna encapsulation (antenna in package, AiP).For example, DUT 4 can be the wireless module of such as millimeter wave wireless module (mmWave wireless module). In one embodiment, DUT 4 can be radio frequency (radio frequency, RF) AiP of the frequency with 30GHz to 80GHz.

Substrate 43 includes that multiple electricity of neighbouring surface (that is, first surface 41) thereon connect adjacent to first surface 41 431 (such as soldered ball or solder projections) of point.Electric component 44, such as semiconductor bare chip and/or passive component, are electrically connected to substrate 43 lower surface.Packaging body 45, such as mold compound (molding compound) cover the lower surface of substrate 43 and electrical Component 44.Antenna 46 is embedded in packaging body 45 or is placed on packaging body 45.That is, second table of the antenna 46 adjacent to DUT 4 Face 42.The bottom part of antenna 46 can be from the exposure of the second surface 42 of DUT 4, and a part of the side of antenna 46 can be from DUT 4 exposure of side surface 47.Therefore, the side surface 47 of DUT 4 can be the first signal emission part 211 corresponding to device bracket 2 Signal emitting-source, and the second surface 42 of DUT 4 can for corresponding to device bracket 2 second signal emitting portion 212 letter Number emission source.As shown in Figure 20, antenna 46 be can be down.

Converter board 36 is placed on the top section (such as upper surface 1211) of the Test bench 12 of test fixture 11, and On the extension of device bracket 2 22.Converter board 36 may include at least one with cloth exchange line (layout line) Circuit layer 361 and multiple spring thimbles (pogo pins) 362 (or other electrical connectors).Converter board 36 can shape in a ring, And central through hole is defined with the undertaking space 21 of exposing device bracket 2.

Top circuit board 34 (such as printed circuit board (print circuit board, PCB)) is placed in test device 1 Test bench 12 125 top of the first opening, and be electrically connected to converter board 36 and DUT 4.In one embodiment, top Circuit board 34 is attached to handling arm 30 via collet 32.Collet 32 can be used for applying suction to DUT 4.In one embodiment, Top circuit board 34 includes at least one reflector point 341, adjacent to 34 lower surface of top circuit board for reflecting Signal.In some embodiments, reflective portion 341 can be the most external metal layer of top circuit board 34, and can be sudden and violent from protective layer Dew.As shown in Figure 20, a part of the extension 22 of device bracket 2 is placed in Test bench 12 and top circuit board 34 Between.

Connection pedestal 35 is attached to the lower surface of top circuit board 34, and includes multiple test probes 351.Test probe Electric contact 431 of 351 one end to contact DUT 4, and the other end of probe 351 is tested to contact top circuit board 34. When collet 32 aspirates the first surface 41 of (suck) DUT 4, DUT 4 can be electrically connected via electric contact 431 and test probe 351 To top circuit board 34.

Tester 38, base circuit board 50 and plate reinforcer 52 are placed in 1 lower section of test device.Plate reinforcer 52 is placed in On tester 38 and it is used to support base circuit board 50.That is, tester 38 supports base circuit board 50 via plate reinforcer 52.It surveys Trial assembly is set 1 and is placed in base circuit board 50.Therefore, base circuit board 50 is placed between test device 1 and tester 38.Bottom Portion's circuit board 50 defines through-hole 501, is aligned with the second opening 126 of Test bench 12.In some embodiments, bottom circuit Plate 50 can be electrically connected to top circuit board 34 via converter board 36.In some embodiments, base circuit board 50 can be electrically connected To tester 38.

Tester 38 is electrically connected to top circuit board 34 via converter board 36.Tester 38 includes test antenna 54, drop Frequency converter (down converter) 381, frequency up-converter (up converter) 382, electric supply 383 and tester Calculation machine 384.Test second opening 126 of the antenna 54 adjacent to Test bench 12.If shown in Figure 20, the one of test antenna 54 It is partially disposed in the second opening 126 of Test bench 12 and in the through-hole 501 of base circuit board 50, so that test antenna 54 It is exposed in emission space 144.For example, the type for testing antenna 54 can be electromagnetic horn (horn antenna), patch Antenna (patch antenna), array antenna (array antenna) or radio frequency unit (radio frequency unit, RU).Electric supply 383 and measuring and calculation machine 384 are electrically connected to converter board 36 and top circuit board 34 to control DUT 4. Measuring and calculation machine 384 may include processor, and can be performed and write on machine-readable medium (machine-readable medium) Instruction, described instruction makes processor execute process described herein, such as analysis electromagnetism when executed by the processor Signal.

In embodiment illustrated in fig. 20, test macro 3 can test the emission function and/or receive capabilities of DUT 4. For example, under the first test pattern, to test the emission function of DUT 4.Tester 38 controls DUT 4 to emit height Frequency wave (such as millimeter wave with about several millimeters of wavelength).The high frequency waves emitted from DUT 4 can pass through the first of device bracket 2 Signal emission part 211 and/or second signal emitting portion 212 are then reflected by the reflecting surface 143 of reflector 14, and are connect Received by test antenna 54.Then, the signal from test antenna 54 can drop to intermediate frequency by down converter 381.Finally, Tester 38 can determine whether DUT 4 reaches desired transmitting function according to the analysis to the signal from down converter 381 Energy.In addition, under the second test pattern, to test the receive capabilities of DUT 4.Tester 38 passes through frequency up-converter 382 By IF signal processing at high-frequency signal.Then, the control of tester 38 test antenna 54 is to emit high frequency waves (such as millimeter wave). The high frequency waves emitted from test antenna 54 can be reflected by the reflecting surface 143 of reflector 14, then pass through the first of device bracket 2 Signal emission part 211 and/or second signal emitting portion 212, and then received by DUT 4.Finally, tester 38 can root Determine whether DUT 4 reaches desired receive capabilities according to the analysis to the signal from DUT 4.

It therefore, can transmitted wave in air (such as only in air).Therefore, the material of device bracket 2 can generally not It will affect test result, so that the material of device bracket 2 can not be the significant environmental variance of test process.In addition, due to The design of reflecting surface 143, all waves emitted in emission space 144 can be received by test antenna 54 or DUT 4.Cause This, the size of test device 1 can be reduced to X × X × X dimension, wherein X be for example, about 30cm or smaller, about 10cm or smaller or About 5cm or smaller.The size of test device 1 need not be equal to each other.In addition, compared with comparative test method, this test method It can be executed in less time.Therefore, this test device 1 can be during mass production (that is, volume production) in production line.Separately Outside, during the test, DUT 4 need not be rotated by 360 °, and therefore, the test fixture 11 of test device 1 can be easier to design and make It makes.

Figure 21 to Figure 24 illustrates the test method of some embodiments according to the present utility model.With reference to Figure 21, DUT is provided 4, top circuit board 34 (such as test board), handling arm 30, collet 32 and connection pedestal 35.In some embodiments, DUT 4 can For encapsulating structure, and can have first surface 41, the second surface 42 opposite with first surface 41 and multiple side surfaces 47.DUT 4 may include substrate 43, at least one electric component 44, packaging body 45 and antenna 46.Substrate 43 is wrapped adjacent to first surface 41 Multiple electric contacts 431 containing free space (free area) 432 and adjacent to the upper surface (such as first surface 41) of DUT 4 (such as soldered ball or solder projection).Free space 432 is located on the upper surface (such as first surface 41 of DUT 4) of substrate 43, And do not have electric contact.Therefore, free space 432 is the region contacted for collet 32.Electric component 44, such as semiconductor bare chip Or passive component, it is electrically connected to the lower surface of substrate 43.Packaging body 45, such as mold compound cover the lower surface of substrate 43 With electric component 44.Antenna 46 is embedded in packaging body 45 or is placed on packaging body 45.That is, antenna 46 is adjacent to DUT's 4 Second surface 42.The bottom part of antenna 46 can be from the exposure of the second surface 42 of DUT 4, and a part of the side of antenna 46 can From the exposure of the side surface of DUT 4 47.As demonstrated in Figure 21, antenna 46 can be face-down.

Top circuit board 34 is attached to handling arm 30 via collet 32.Collet 32 is used to apply suction to DUT 4.Linker Seat 35 is attached to the lower surface of top circuit board 34, and includes multiple test probes 351.

Then, collet 32 provides suction 321 on the free space 432 of the first surface 41 of DUT 4.Therefore, collet 32 The first surface 41 of DUT 4 is aspirated, and the electric contact 431 of DUT 4 can be electrically connected to top circuit board via test probe 351 34。

It is the top view of Figure 22 with reference to Figure 22 and Figure 23, Figure 23.Figure 22 and Figure 23 displaying is provided to be placed in test dress Set the converter board 36 on the top surface 1211 of 1 Test bench 12.

With reference to Figure 24, tester 38, base circuit board 50 and plate reinforcer 52 are set as being placed in 1 lower section of test device. Plate reinforcer 52 is placed on tester 38 and is used to support base circuit board 50.Test device 1 is placed in base circuit board 50 On.In some embodiments, base circuit board 50 can be electrically connected to top circuit board 34 via converter board 36.In some implementations In example, base circuit board 50 may be electrically connected to tester 38.Tester 38 is electrically connected to top circuit board via converter board 36 34.Tester 38 includes test antenna 54, down converter 381, frequency up-converter 382, electric supply 383 and measuring and calculation Machine 384.

Then, it moves down by DUT 4, top circuit board 34, handling arm 30, collet 32 and connect what pedestal 35 was constituted Sub-assembly (assembly).Therefore, as shown in Figure 20, the device bracket 2 that DUT 4 can be placed on Test bench 12 is held In socket part point 21.Device bracket 2 accommodates the lower surface (such as second surface 42) of DUT 4 and the side surface 47 of DUT4.

Figure 25 illustrates the radiation path of the test macro 3 of some embodiments according to the present utility model.The antenna 46 of DUT 4 Can be end-on-fire antenna (end fire antenna).The wave 60 emitted by DUT 4 can reflecting surface 143 by reflector 14 and top The reflective portion 341 of portion's circuit board 34 is reflected, and is then received by test antenna 54.In some embodiments, in test mould Under formula, frequency wave 60 can be emitted, by test antenna 54 by the reflecting surface 413 of reflector 14 and the reflecting part of top circuit board 34 Divide 341 reflections, and is then received by DUT 4.

Figure 26 illustrates the radiation path of the test macro 3 of some embodiments according to the present utility model.The antenna 46 of DUT 4 It can be paster antenna.The frequency wave 62 emitted by DUT 4 can by reflector 14 reflecting surface 143 and top circuit board 34 it is anti- The reflection of part 341 is penetrated, and is then received by test antenna 54.In some embodiments, in test mode, frequency wave 62 can It reflects, and connects by the transmitting of test antenna 54, by the reflecting surface 143 of reflector 14 and the reflective portion 341 of top circuit board 34 Received by DUT 4.

Figure 27 illustrates the various sizes of the test macro 3 of some embodiments according to the present utility model.Such as institute's exhibition in Figure 27 Show, measuring distance " d " is defined as test the distance between antenna 54 and DUT 4.Test the operating frequency of antenna 54 and DUT 4 " F " is in the range of about 30 gigahertz (GHZ)s (gigahertz, GHz) to about 80GHz.Near field measurement (near- is carried out for λ to 2 λ Field measurement), wherein λ is wavelength.λ=C/F, wherein " C " is the light velocity: 3 × 10⁸m/s." d " is set between " d1 " is arrived in the range of " d2 ",

D1=λ=C/F；

D2=2 λ=2* (C/F).

For example, operating frequency " F " is 30GHz/60GHz/79GHz, and measuring distance " d " can be as follows respectively:

If (a) F=30GHz, d in the range of d1 to d2=10 millimeters of (mm)~20mm in the range of.

If (b) F=60GHz, d in the range of d1 to d2=5mm~10mm in the range of.

If (c) F=79GHz, d in the range of d1 to d2=3.8mm~7.6mm in the range of.

In addition, the width of the bottom surface 142 of the reflective portion 14' of reflector 14 is defined as " a ", the reflection of reflector 14 The height of the outer surface 141 of part 14' is defined as " b ", the length of the reflecting surface 143 of the reflective portion 14' of reflector 14 It being defined as " c ", the width of test antenna 54 is defined as " X ", and the width of the accommodation space 123 of Test bench 12 is defined as " Y ", and Angle between bottom surface 142 and reflecting surface 143 is defined as " θ ".

In some embodiments, relational expression a can be kept to be approximately equal to (Y-X)/2.

In one embodiment, if X=20mm, Y=70mm, then a=substantially 25mm.In addition, if d=20mm, b =25mm, then c²=a²+b²=1250, and c is about 35.35mm.It should be noted that θ is about 45 degree in presently described example. In some embodiments, θ can be in the range of about 30 degree to about 45 degree.

In some embodiments, if X=10mm, Y=50mm, then a is approximately equal to 20mm.In addition, if d=45mm, b =50mm, then c²=a²+b²=2900, and c is about 53.85mm.It should be noted that θ can be greater than 45 degree.Height b or angle theta can be It is preset.

Figure 28 illustrates the schematic diagram of the test macro 3a of some embodiments according to the present utility model.Test macro 3a can be wrapped Containing four DUT, 4, four top circuit boards 34, handling arm 30a, four test devices 1 and base circuit board 50a.In DUT 4 Each corresponds to an other person in top circuit board 34, and four DUT 4 and four top circuit boards 34 can be removed by one Transport arm 30a processing.Four test devices 1 can be placed on a base circuit board 50a.Handling arm 30a and four DUT 4 and four A top circuit board 34 can be moved together to cover four test devices 1, and each of DUT 4 is placed in test device In each of 1.Therefore, test macro 3a can be realized multi-point sampler (multi-site testing), and a test dress Network topology testing device 1 will not be influenced significantly by setting the signal in 1.In some embodiments, it can be used suitable equipment more Test is more than four DUT 4 or less than four DUT4 in point test.

Unless specified otherwise herein, otherwise for example " top ", " lower section ", " upward ", " left side ", " the right ", " downward ", " top The spatial descriptions such as portion ", " bottom ", " vertical ", "horizontal", " side ", " higher ", " lower part ", " top ", " top ", " following " are It is indicated about relative to the orientation shown in figure.It should be understood that spatial description used herein is merely for explanation Purpose, and the actual implementation of structure described herein can by it is any orientation or in a manner of be spatially arranged, restrictive condition It is not therefore arranged for the advantages of the embodiments of the present invention and has deviation.

As used herein, term " about ", " generally ", " substantially " and " about " are to describe and consider small change Change.When being used in combination with event or situation, term can refer to event or situation clearly there is a situation where and event or situation pole Be similar to there is a situation where.For example, when in conjunction with numerical value in use, the term can refer to less than or equal to the numerical value ± 10% variation range, e.g., less than or equal to ± 5%, be less than or equal to ± 4%, be less than or equal to ± 3%, be less than or equal to ± 2%, be less than or equal to ± 1%, be less than or equal to ± 0.5%, be less than or equal to ± 0.1% or be less than or equal to ± 0.05% variation range.For example, if difference between two values be less than or equal to the average value of described value ± 10% (e.g., less than or equal to ± 5%, be less than or equal to ± 4%, be less than or equal to ± 3%, be less than or equal to ± 2%, be less than Or be equal to ± 1%, be less than or equal to ± 0.5%, be less than or equal to ± 0.1% or less than or equal to ± 0.05%), then can Think that described two numerical value " generally " are identical.

If the displacement between two surfaces is not more than 5 μm, is not more than 2 μm, no more than 1 μm or no more than 0.5 μm, It is believed that two surface co-planars or substantially coplanar.

Unless context is in addition clearly stipulate that otherwise as used herein, singular references " one (a/an) " and " described " can be wrapped Object is referred to containing multiple.In the description to some embodiments, the component for providing " " another component "upper" can cover previous component Situation and one or more intervention packages directly on latter component (for example, with latter assemblies physical contact) are located at previous group Situation between part and latter component.

As used herein, term " conductibility (conductive) ", " electric conductivity (electrically Conductive) " and " conductivity (electrical conductivity) " refers to the ability for transmitting electric current.Conductive material is usual Instruction is in referring now to those of minimum or zero resistance of electric current flowing material.One measurement of conductivity is Siemens/rice (S/ m).In general, conductive material is that have greater than about 10⁴S/m (for example, at least 10⁵S/m or at least 10⁶S/m one kind of conductivity) Material.The conductivity of material can vary with temperature sometimes.Unless specified otherwise herein, the conductivity of material is otherwise measured at room temperature.

In addition, pressing range format proposition amount, ratio and other numerical value herein sometimes.It should be understood that such range format It is convenient and uses for purpose of brevity for being, and should be interpreted flexibly to not only include be expressly specified as the numerical value of scope limitation, and Also comprising all individual numbers or the subrange that are covered by within the scope of that, as clearly specifying each numerical value and subrange.

Although the utility model is described and illustrates referring to its specific embodiment, these descriptions and instructions are not limited Property processed.Those skilled in the art will appreciate that not departing from the utility model as defined by the appended claims In the case where true spirit and range, it can be variously modified and may replace equivalent.Illustrate to be not necessarily drawn to scale.Attribution Difference may be present between art recurring and actual device in manufacturing process and tolerance, the utility model.It may be present not special Affirm the other embodiments of bright the utility model.This specification and schema should be considered as illustrative and not restrictive.It can do It modifies out, so that particular condition, material, material composition, method or technique are adapted to the target, spirit and model of the utility model It encloses.All such modifications are desired to be in the range of appended claims herein.It is held although having referred to by certain order Capable specific operation describes method disclosed herein, it should be appreciated that can be the teaching for not departing from the utility model the case where Lower combination, subdivision, or these operations are re-sequenced to form equivalent method.Therefore, it unless specifically indicating herein, otherwise grasps The order of work and grouping are not the limitation of the utility model.

Symbol description

1 test device

1a test device

1b test device

2 device brackets

2a device bracket

2b device bracket

2c device bracket

3 test macros

3a test macro

4 device under tests (DUT)

11 test fixtures

11a test fixture

11b test fixture

11c test fixture

11d test fixture

11e test fixture

11f test fixture

12 Test benchs

12a Test bench

12b Test bench

14 reflectors

The reflective portion 14'

14a reflector

14b reflector

14c annular inner portion

21 receptacle portions

21c receptacle portion

22 extensions

23 accept space

24 upper openings

25 extensions

26 solid portions

30 handling arm

30a handling arm

32 collets

34 top circuit boards

35 connection pedestals

36 converter boards

38 testers

41 first surfaces

42 second surfaces

43 substrates

44 electric components

45 packaging bodies

46 antennas

47 side surfaces

50 base circuit boards

50a base circuit board

52 plate reinforcers

54 test antennas

60 waves

62 frequency waves

113 reflecting surfaces

114 emission spaces

115 first openings

116 second openings

117 slits

118 reflecting materials

121 side walls

122 bottom walls

123 accommodation spaces

125 first openings

126 second openings

127 slits

128 prominent rings

129 housing regions

141 outer surfaces

142 bottom surfaces

143 reflecting surfaces

144 emission spaces

144' emission space

145 first openings

145a first is open

145b first is open

146 second openings

146a second is open

146b second is open

147 curved corner surfaces

147b third opening

148 top surfaces

149 reflecting surfaces

211 first signal emission parts

The first signal emission part of 211a

The first signal emission part of 211c

212c second signal emitting portion

212 second signal emitting portions

261 upper surfaces

262 bottom surfaces

263 outer surfaces

321 suction

341 reflective portions

351 test probes

361 circuit layers

362 spring thimbles

381 down converters

382 frequency up-converters

383 electric supply

384 measuring and calculation machines

431 electric contacts

432 free spaces

501 through-holes

1211 upper surfaces

2111 lateral openings

2111a lateral openings

2112 first strip portions

The first strip portion of 2112a

2121 under sheds

2122 second strip parts

A width

B height

C length

D measuring distance

X width

Y width

θ angle

Claims (17)

1. a kind of test device, it is characterised in that comprising:

Test bench defines accommodation space；And

Reflector is placed in the accommodation space and has nonparallel multiple reflecting surfaces each other, wherein the reflection Delimited emission space.

2. test device according to claim 1, it is characterised in that the reflector defines the first opening and with described The second opposite opening of one opening, and the width of different size in second opening of first opening.

3. test device according to claim 2, it is characterised in that the width of first opening is greater than described the The width of two openings.

4. test device according to claim 1, it is characterised in that further comprising:

Device bracket is placed in the emission space of the reflector and defines and accepts space.

5. test device according to claim 4, it is characterised in that described device bracket includes receptacle portion and extension Point, the receptacle portion defines the undertaking space, and the extension extends to the test base from the receptacle portion The upper surface of seat.

6. test device according to claim 5, it is characterised in that the receptacle portion defines upper opening, under shed and extremely Few lateral openings, and the under shed is passed through by the undertaking space that the receptacle portion of described device bracket defines It is connected to the lateral openings with the emission space of the reflector.

7. test device according to claim 4, it is characterised in that described device bracket has multiple outer surfaces, connects Touch the reflecting surface of the reflector.

8. a kind of test device, it is characterised in that comprising:

Test fixture defines the first opening and second opening opposite with first opening, and has multiple reflecting surfaces, The reflecting surface defines the emission space between first opening and second opening；And

Device bracket, is placed in the emission space and defines upper opening, described device bracket include at least one first Signal emission part and second signal emitting portion, wherein the upper opening of described device bracket corresponds to the test fixture First opening, first signal emission part and the second signal emitting portion, which define, accepts space, and described Second signal emitting portion is opposite with the upper opening.

9. test device according to claim 8, it is characterised in that described device bracket further includes multiple external tables Face, the outer surface contact the reflecting surface of the test fixture.

10. test device according to claim 8, it is characterised in that described device bracket further includes at least one and prolongs Extending portion point, the extension extends to the upper surface of the test fixture from first signal emission part.

11. test device according to claim 8, it is characterised in that first signal emission part, which defines, laterally to be opened Mouthful, the second signal emitting portion defines under shed, and the undertaking space of described device bracket passes through the under shed It is connected to the lateral openings with the emission space.

12. test device according to claim 8, it is characterised in that the test fixture includes:

Test bench defines first opening, second opening and described first opposite with first opening is opened Accommodation space between mouth and second opening；And

Reflector is placed in the accommodation space, and has the reflecting surface, wherein the reflecting surface define it is described Emission space.

13. a kind of test macro, it is characterised in that comprising:

Test device comprising:

Test bench, define the first opening, the second opening opposite with first opening and first opening with it is described Accommodation space between second opening；

Reflector is placed in the accommodation space and has multiple reflecting surfaces；And

Device bracket is placed in the accommodation space and defines the undertaking space to accommodate device under test, wherein described Device bracket includes at least one first signal emission part and second signal emitting portion；

Circuit board, is placed in first overthe openings of the Test bench, and is configured to be electrically connected to described tested Device；And

Tester is placed under second opening of the Test bench, and is electrically connected to the circuit board, and the survey Trying device includes test antenna, corresponds to second opening of the Test bench.

14. test macro according to claim 13, it is characterised in that described device bracket further includes multiple outsides Surface, the multiple outer surface contact the reflecting surface of the reflector.

15. test macro according to claim 13, it is characterised in that described device bracket further includes extension, Its upper surface that the Test bench is extended to from first signal emission part, and a part placement of the extension Between the Test bench and the circuit board.

16. test macro according to claim 13, it is characterised in that first signal emission part, which defines, laterally to be opened Mouthful, the second signal emitting portion defines under shed, and the undertaking space of described device bracket passes through the under shed It is connected to the lateral openings with the emission space of the reflector.

17. test macro according to claim 13, it is characterised in that the reflector define the first opening and with it is described Opposite second opening of first opening, and first opening of the reflector is of different size described in the reflector The width of second opening.