CN208766207U - PCB test fixture - Google Patents
PCB test fixture Download PDFInfo
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- CN208766207U CN208766207U CN201821384009.7U CN201821384009U CN208766207U CN 208766207 U CN208766207 U CN 208766207U CN 201821384009 U CN201821384009 U CN 201821384009U CN 208766207 U CN208766207 U CN 208766207U
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Abstract
The utility model relates to PCB detection device technical fields, more particularly to a kind of PCB test fixture, comprising: standard pcb board is electrically connected with test cabinet, and standard pcb board has test point corresponding with all test interfaces of test cabinet；And test board, test board from standard pcb board filter out detected PCB needed for test point, each test point of detected PCB test point corresponding to standard pcb board pass through test board conducting connection.By standard pcb board plate and test board, the type of test fixture PCB that can be detected is widened, so that the compatibility and versatility of test fixture are stronger.Since standard pcb board has test point corresponding with all test interfaces of test cabinet, as long as therefore test cabinet PCB type that can be detected, it can be detected by the PCB fixture, without configuring corresponding Special-purpose testing jig for every kind of PCB, testing efficiency is greatly improved, testing cost is reduced.
Description
Technical field
The utility model relates to PCB detection device technical fields, more particularly to a kind of PCB test fixture.
Background technique
During producing PCB product, have and much require to carry out ICP test, ICP needs dedicated test when testing
Whether fixture docks detected PCB with test cabinet, qualified to detect PCB product.But the diversity of product is driven to determine
The otherness between PCB is determined, has been needed when testing different PCB at present using different Special-purpose testing jigs, every test one
Kind PCB requires to replace corresponding test fixture, not only increases testing cost, is also greatly reduced testing efficiency.
Utility model content
Based on this, it is necessary to which low for testing efficiency, the high problem of testing cost provides a kind of PCB test fixture.
A kind of PCB test fixture, comprising: standard pcb board is electrically connected with test cabinet, and standard pcb board has and test cabinet
The corresponding test point of all test interfaces；And
Test board, test board from standard pcb board filter out detected PCB needed for test point, each test of detected PCB
Point test point corresponding to standard pcb board is connected by test board to be connected.
Test board is equipped with multiple probes in one of the embodiments, and each probe is separately connected the survey of detected PCB
Pilot test point corresponding to standard pcb board.
Test fixture further includes testing base and testboard in one of the embodiments, and testing base and testboard can
It releasably connects, all test interfaces of test cabinet are transferred to standard pcb board by testing base, and testboard is tested for placing
Pcb board, test board are set to testboard.
Test board includes the first test board and the second test board, the first test board and second in one of the embodiments,
Test board is mounted on testboard, and the first test board has test point corresponding with standard pcb board, and the second test board has and quilt
Survey the corresponding test point of pcb board.
Standard pcb board is set to testboard in one of the embodiments, and standard pcb board is oppositely arranged with test board, and
Standard pcb board and detected PCB are located at the two sides of test board, when testboard is connect with testing base, probe assembly and
The electrical connection of standard pcb board.
Test fixture further includes location structure in one of the embodiments, is set between testing base and testboard,
Location structure includes first positioning hole and second location hole, and first positioning hole is set to testing base, second location hole corresponding the
A positioning hole is set to testboard, first positioning hole and second location hole for being inserted into bolt.
Testing base includes pinboard and probe assembly in one of the embodiments, and probe assembly is installed on pinboard,
One end of probe assembly is electrically connected with test cabinet, and the other end with standard pcb board for being electrically connected.
Testing base further includes needle plate in one of the embodiments, and probe assembly is fixedly installed in needle plate, needle plate installation
In pinboard, and needle plate can slide in default range relative to pinboard along the surface of pinboard.
Test fixture further includes guide frame in one of the embodiments, is set between needle plate and standard pcb board,
Guide frame includes pilot hole and guide pin, and pilot hole is set in the one of them of needle plate and standard pcb board, and guide pin is corresponding
Pilot hole is set in the another one of needle plate and standard pcb board.
Needle plate is equipped with fixation hole in one of the embodiments, corresponds to fixation hole on pinboard and is provided with screw hole, utilizes
Screw passes through fixation hole and screw is anchored on screw hole, and the aperture of fixation hole is greater than the outer diameter of screw.
The beneficial effects of the utility model include:
By standard pcb board plate and test board, the type of test fixture PCB that can be detected is widened, so that test clip
The compatibility and versatility of tool are stronger.Since standard pcb board has test point corresponding with all test interfaces of test cabinet,
As long as therefore test cabinet PCB type that can be detected, so that it may be detected by the PCB fixture.Without for every
Kind PCB configures corresponding Special-purpose testing jig, greatly improves testing efficiency, reduces testing cost.
Detailed description of the invention
Fig. 1 is the application principle schematic diagram for the PCB test fixture that an embodiment of the present invention provides；
Fig. 2 is the structural schematic diagram for the PCB test fixture that an embodiment of the present invention provides；
Fig. 3 is the top view of structure shown in Fig. 2；
Fig. 4 is A-A cross-sectional view in Fig. 3；
Fig. 5 is the decomposition diagram one of structure shown in Fig. 2；
Fig. 6 is the decomposition diagram two of structure shown in Fig. 2.
Description of symbols:
10- test fixture；
20- test cabinet；
30- detected PCB；
100- standard pcb board；
200- test board；
The first test board of 210-；The second test board of 220-；
300- testing base；
310- pinboard；
320- probe assembly；
330- needle plate；
400- testboard；
500- location structure；510- first positioning hole；520- second location hole；
600- guide frame；610- pilot hole；620- guide pin.
Specific embodiment
In order to make the purpose of the utility model, technical solutions and advantages more clearly understood, by the following examples, it and ties
Attached drawing is closed, the PCB test fixture of the utility model is further elaborated.It should be appreciated that described herein specific
Embodiment only to explain the utility model, is not used to limit the utility model.
It should be noted that it can directly on the other element when element is referred to as " being fixed on " another element
Or there may also be elements placed in the middle.When an element is considered as " connection " another element, it, which can be, is directly connected to
To another element or it may be simultaneously present centering elements.On the contrary, when element is referred to as " directly existing " another element "upper",
There is no intermediary elements.Term as used herein "vertical", "horizontal", "left" and "right" and similar statement are
For illustrative purposes.
PCB test fixture 10 shown in Figure 1, that an embodiment of the present invention provides, comprising: standard pcb board 100
With test board 200.Standard pcb board 100 and test cabinet 20 are electrically connected, and standard pcb board 100 has the survey all with test cabinet 20
The corresponding test point of mouth of trying.Test board 200 from standard pcb board 100 filter out detected PCB 30 needed for test point, quilt
Each test point test point corresponding to standard pcb board 100 for surveying pcb board 30 passes through the conducting connection of test board 200.
By 100 plate of standard pcb board and test board 200, the type of the PCB that can be detected of test fixture 10 is widened, has been made
Compatibility and the versatility for obtaining test fixture 10 are stronger.Since standard pcb board 100 has the test interface all with test cabinet 20
Corresponding test point, as long as therefore the PCB type that can be detected of test cabinet 20, so that it may examined by the PCB fixture
It surveys.Without configuring corresponding Special-purpose testing jig 10 for every kind of PCB, testing efficiency is greatly improved, survey is reduced
Try cost.
Test point needed for test board 200 can filter out detected PCB 30 from standard pcb board 100, implementation can
Think a variety of.For example, test board 200 can accordingly be replaced according to the type of detected PCB 30.Test board 200 after replacement has
There is a linking probe corresponding with the test point in detected PCB 30, these linking probes are by the test point in detected PCB 30
It is connect with standard pcb board 100, thus allows for the detection of PCB.Alternatively, being offered on test board 200 and standard pcb board 100
On the corresponding through-hole of test point, the test with detected PCB 30 according to the type of detected PCB 30, on test board 200
Probe is worn in the corresponding through-hole of point, detected PCB 30 is connect with standard pcb board 100 by probe, thus allows for
The detection of PCB.
Connection between the test point of detected PCB 30 and the test point of standard pcb board 100, can be real in several ways
It is existing.As a kind of enforceable mode, test board 200 is equipped with multiple probes, and each probe is separately connected detected PCB 30
Test point test point corresponding to standard pcb board 100.It is realized by probe between detected PCB 30 and standard pcb board 100
Connection, structure is simple, and connection is reliable.Multiple probes may be a fixed connection on test board 200, the distribution of multiple probes with
The distribution of the test point of detected PCB 30 is corresponding, in the PCB of test different types, can replace the survey of adaptation as needed
Test plate (panel) 200.Alternatively, multiple probes are detachably connected on test board 200, it, can be according to need in the PCB of test different types
The distribution of multiple probes is adjusted, to be adapted to detected PCB 30.
Referring to fig. 2 to Fig. 4, as a kind of enforceable mode, test fixture 10 further includes testing base 300 and testboard
400, testing base 300 and testboard 400 are detachably connected.Testing base 300 is by all test interfaces of test cabinet 20
It is transferred to standard pcb board 100.For testboard 400 for placing detected PCB 30, test board 200 is set to testboard 400.Pass through
Test fixture 10 is designed as include testing base 300 and testboard 400 split type structure, be convenient for test board 200 and standard
The arrangement of pcb board 100.Convenient for by the interface of test cabinet 20 to standard pcb board 100, in the PCB of test different types,
It can be convenient for realizing the screening to 100 test point of standard pcb board using the testboard 400 where replacement test board 200.Specifically make
Used time, testing base 300 is fixedly attached to test cabinet 20 since no replacement is required, and is electrically connected with test cabinet 20.Test
Platform 400 is placed in the top of testing base 300, and detected PCB 30 is placed in testboard 400, and passes through test board 200 and standard
Pcb board 100 connects.
Referring to fig. 4, in one embodiment, test board 200 include the first test board 210 and the second test board 220, first
Test board 210 and the second test board 220 are mounted on testboard 400.First test board 210 has corresponding with standard pcb board 100
Test point, the second test board 220 have test point corresponding with detected PCB 30.Due to surveying in actually detected use process
The side that test plate (panel) 200 is docked with detected PCB 30 is easy to wear, so that test board 200 is in use for some time, needs replacing new
Test board 200.Test board 200 is designed as include the first test board 210 and the second test board 220 structure, first test
Plate 210 adapts to standard pcb board 100, and the second test board 220 adapts to detected PCB 30, only needs after actually using a period of time
The second test board 220 easy to wear is replaced, the time of maintenance replacement has greatly been saved, has for ease of maintenaince safeguarded.
And no replacement is required from the beginning to the end or change for standard pcb board 100, standard pcb board 100 can be installed on according to the design needs
In testing base 300 or on testboard 400, when standard pcb board 100 is installed in testing base 300, in test inhomogeneity
When the PCB of type, the testboard 400 where test board 200 only can be replaced or change, it is any without being carried out to testing base 300
Operation.Standard pcb board 100 is also mountable on testboard 400.
Referring to fig. 4 and Fig. 6, in one embodiment, standard pcb board 100 is set to testboard 400, standard pcb board 100
It is oppositely arranged with test board 200, and standard pcb board 100 and detected PCB 30 are located at the two sides of test board 200.Work as test
When platform 400 is connect with testing base 300, probe assembly 320 is electrically connected with standard pcb board 100.Standard pcb board 100 is set to
Testboard 400 mainly transfers to testing base 300 in view of the intensity of standard pcb board 100 is not enough to bear testboard 400
When power, be not easy to being used for a long time for standard pcb board 100.By the way that standard pcb board 100 is set to testboard 400, can extend
The service life of standard pcb board 100, save the cost.It is appreciated that it is as described above, in the detected PCB of test different types
When 30, it may be necessary to replace testboard 400, at this time can remove standard pcb board 100 from testboard 400, refill and be fitted on replacement
Testboard 400 afterwards.Alternatively, each testboard 400 is equipped with a standard pcb board 100, when needing replacing testboard 400
Can direct integral replacing, be not necessarily to nuisance operation, be conducive to save the time, improve detection efficiency.
The type of attachment of testboard 400 and testing base 300 can be a variety of, as long as can be realized detachably connecting for the two
It connects.For example, can realize the quick connection of testboard 400 and testing base 300 using the structure of lock ring and snap fit
With fast quick-detach.
Referring to figs. 5 and 6, in one embodiment, test fixture 10 further includes location structure 500.Location structure 500 is set
It is placed between testing base 300 and testboard 400, location structure 500 includes first positioning hole 510 and guide pin second location hole
520, first positioning hole 510 is set to testing base 300, and the corresponding first positioning hole 510 of second location hole 520 is set to testboard
400, first positioning hole 510 and second location hole 520 are for being inserted into bolt.510 He of first positioning hole is successively penetrated using bolt
In second location hole 520, positioned with the connection to testboard 400 and testing base 300.By the way that location structure 500 is arranged,
Enable testing base 300 and testboard 400 that connection is accurately positioned, so as to be conducive to probe assembly 320 and standard pcb board
Accurate alignment connection between 100.
In other embodiments, location structure 500 may also include location hole and positioning pin, and location hole may be disposed at test bottom
In the one of them of seat 300 and testboard 400, positioning pin corresponds to location hole and is set to the another of testing base 300 and testboard 400
In one.Cooperated by positioning pin and location hole and realizes being located by connecting for testboard 400 and testing base 300.Wherein positioning pin
With location hole cooperation end may be designed as it is generally conical shape, so convenient for positioning pin enter location hole during, rise
To certain guiding role, positioning pin is gradually enter precisely intoed in location hole.
Testing base 300 is used to all test interfaces of test cabinet 20 being transferred to standard pcb board 100.Referring to fig. 4 and
Fig. 5, as a kind of enforceable mode, testing base 300 includes pinboard 310 and probe assembly 320, and probe assembly 320 is pacified
Loaded on pinboard 310, one end of probe assembly 320 is electrically connected with test cabinet 20, and the other end with standard pcb board 100 for being electrically connected
It connects.It is appreciated that the interface module being adapted to probe assembly 320 can be equipped on standard pcb board 100.Test cabinet 20 can pass through line
Cable or flexible PCB and probe assembly 320 are electrically connected.Pass through setting pinboard 310 and probe assembly 320, it is easy to accomplish survey
Try the connection between cabinet 20 and standard pcb board 100.
In one embodiment, testing base 300 further includes needle plate 330, and probe assembly 320 is fixedly installed in needle plate 330,
Needle plate 330 is installed on pinboard 310, and needle plate 330 can along the surface of pinboard 310 in default range relative to switching
Plate 310 slides.By the way that needle plate 330 is arranged, and needle plate 330 is enable to slide relative to pinboard 310, i.e., so that probe assembly
320 can have certain activity space relative to pinboard 310.Due to face different types of detected PCB 30 test when,
The structure of each component part of testboard 400 and position may have slight error.By slidable needle plate 330, so that
Probe assembly 320 has certain activity space, therefore probe assembly 320 can eliminate different testboards 400 in decentralization process
In error, probe assembly 320 is accurately docked with standard pcb board 100.
The sliding of needle plate 330 can be accomplished in several ways.Referring to fig. 4 to Fig. 6, in one embodiment, test fixture
10 further include guide frame 600, is set between needle plate 330 and standard pcb board 100.Guide frame 600 includes pilot hole 610
With guide pin 620, pilot hole 610 is set in the one of them of needle plate 330 and standard pcb board 100, and the correspondence of guide pin 620 is led
It is set to hole 610 in the another one of needle plate 330 and standard pcb board 100.By the way that guide frame 600 is arranged, in testboard 400
During decentralization, needle plate 330 is driven to slide relative to pinboard 310 with the cooperation of guide pin 620 and pilot hole 610,
So that the probe assembly 320 on needle plate 330 can accurately be docked with standard pcb board 100.Guide pin 620 and pilot hole
610 cooperation ends may be designed as it is generally conical shape, so convenient for guide pin 620 enter pilot hole 610.
Specifically, during testboard 400 is connect with testing base 300, make to test by location structure 500 first
Between platform 400 and testing base 300 can precise positioning, thus the position between standard pcb board 100 and pinboard 310 is opposite
It is fixed.Then during testboard 400 is transferred, guide needle plate 330 and standard pcb board 100 right by guide frame 600
Standard, thus the probe assembly 320 on needle plate 330 can be properly inserted into the interface of standard pcb board 100.So as to essence
All test interfaces of test cabinet 20 accurately really are transferred to standard pcb board 100, guarantee going on smoothly for test.
The structure type that needle plate 330 is slidably mounted on pinboard 310 can be a variety of.In one embodiment, needle
Plate 330 is equipped with fixation hole, and correspond to fixation hole on pinboard 310 is provided with screw hole, using screw across fixation hole and by screw
It is anchored on screw hole, the aperture of fixation hole is greater than the outer diameter of screw.It is appreciated that fixation hole and corresponding screw hole all can be more
A, needle plate 330 can realize the connection of multiple tie points with pinboard 310 by multiple screws.Since the aperture of fixation hole is big
In the outer diameter of screw, thus needle plate 330 can under the action of guide frame 600 relative to pinboard 310 in preset range
Interior generation slide displacement.
Each technical characteristic of embodiment described above can be combined arbitrarily, for simplicity of description, not to above-mentioned reality
It applies all possible combination of each technical characteristic in example to be all described, as long as however, the combination of these technical characteristics is not deposited
In contradiction, all should be considered as described in this specification.
Above-described embodiments merely represent several embodiments of the utility model, the description thereof is more specific and detailed,
But it cannot be understood as the limitations to utility model patent range.It should be pointed out that for the common skill of this field
For art personnel, without departing from the concept of the premise utility, various modifications and improvements can be made, these are belonged to
The protection scope of the utility model.Therefore, the scope of protection shall be subject to the appended claims for the utility model patent.
Claims (10)
1. a kind of PCB test fixture characterized by comprising
Standard pcb board (100) is electrically connected with test cabinet (20), and the standard pcb board (100) has and the test cabinet
(20) the corresponding test point of all test interfaces；And
Test board (200), the test board (200) filter out needed for detected PCB (30) from the standard pcb board (100)
Test point, each test point of the detected PCB (30) pass through the survey to the corresponding test point of the standard pcb board (100)
Test plate (panel) (200) conducting connection.
2. PCB test fixture according to claim 1, which is characterized in that the test board (200) is equipped with multiple spies
Needle, each probe are separately connected the test point of the detected PCB (30) and the corresponding survey of the standard pcb board (100)
Pilot.
3. PCB test fixture according to claim 1, which is characterized in that further include testing base (300) and testboard
(400), the testing base (300) and the testboard (400) are detachably connected, and the testing base (300) will be described
All test interfaces of test cabinet (20) are transferred to the standard pcb board (100), and the testboard (400) is for placing institute
It states detected PCB (30), the test board (200) is set to the testboard (400).
4. PCB test fixture according to claim 3, which is characterized in that the test board (200) includes the first test board
(210) and the second test board (220), first test board (210) and second test board (220) are mounted on the survey
Test stand (400), first test board (210) have test point corresponding with standard pcb board (100), and described second surveys
Test plate (panel) (220) has test point corresponding with the detected PCB (30).
5. PCB test fixture according to claim 3, which is characterized in that the standard pcb board (100) is set to described
Testboard (400), the standard pcb board (100) is oppositely arranged with the test board (200), and the standard pcb board (100)
The two sides of the test board (200) are located at the detected PCB (30), when the testboard (400) and the test
When pedestal (300) connects, probe assembly (320) is electrically connected with the standard pcb board (100).
6. PCB test fixture according to claim 3, which is characterized in that further include location structure (500), be set to institute
It states between testing base (300) and the testboard (400), the location structure (500) includes first positioning hole (510) and
Two location holes (520), the first positioning hole (510) are set to the testing base (300), the second location hole (520)
The corresponding first positioning hole (510) is set to the testboard (400), and the first positioning hole (510) and described second is determined
Position hole (520) is for being inserted into bolt.
7. PCB test fixture according to claim 3, which is characterized in that the testing base (300) includes pinboard
(310) it is installed on the pinboard (310) with probe assembly (320), the probe assembly (320), the probe assembly (320)
One end be electrically connected with the test cabinet (20), the other end with the standard pcb board (100) for being electrically connected.
8. PCB test fixture according to claim 7, which is characterized in that the testing base (300) further includes needle plate
(330), the probe assembly (320) is fixedly installed in the needle plate (330), and the needle plate (330) is installed on the pinboard
(310), and the needle plate (330) can along the surface of the pinboard (310) in default range relative to the switching
Plate (310) sliding.
9. PCB test fixture according to claim 8, which is characterized in that further include guide frame (600), be set to institute
It states between needle plate (330) and the standard pcb board (100), the guide frame (600) includes pilot hole (610) and guide pin
(620), the pilot hole (610) is set in the one of them of the needle plate (330) and the standard pcb board (100), described
The corresponding pilot hole (610) of guide pin (620) is set to the another one of the needle plate (330) and the standard pcb board (100)
On.
10. PCB test fixture according to claim 8, which is characterized in that the needle plate (330) is equipped with fixation hole, institute
State and correspond to the fixation hole on pinboard (310) and be provided with screw hole, using screw pass through the fixation hole and by the screw it is tight
It is fixed in the screw hole, the aperture of the fixation hole is greater than the outer diameter of the screw.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201821384009.7U CN208766207U (en) | 2018-08-24 | 2018-08-24 | PCB test fixture |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201821384009.7U CN208766207U (en) | 2018-08-24 | 2018-08-24 | PCB test fixture |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN208766207U true CN208766207U (en) | 2019-04-19 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201821384009.7U Active CN208766207U (en) | 2018-08-24 | 2018-08-24 | PCB test fixture |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110389297A (en) * | 2019-08-22 | 2019-10-29 | 上海泽丰半导体科技有限公司 | A kind of novel measuring test plate (panel) and test device |
| CN110501534A (en) * | 2019-08-23 | 2019-11-26 | 深圳市精泰达科技有限公司 | A kind of PCBA test macro and its control method |
| CN110888042A (en) * | 2019-12-09 | 2020-03-17 | 青岛歌尔微电子研究院有限公司 | Method and equipment for testing ASIC chip wafer and computer storage medium |
| CN113805034A (en) * | 2020-06-12 | 2021-12-17 | 神讯电脑(昆山)有限公司 | Keyboard circuit board detection device with FFC winding displacement |
-
2018
- 2018-08-24 CN CN201821384009.7U patent/CN208766207U/en active Active
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110389297A (en) * | 2019-08-22 | 2019-10-29 | 上海泽丰半导体科技有限公司 | A kind of novel measuring test plate (panel) and test device |
| CN110501534A (en) * | 2019-08-23 | 2019-11-26 | 深圳市精泰达科技有限公司 | A kind of PCBA test macro and its control method |
| CN110888042A (en) * | 2019-12-09 | 2020-03-17 | 青岛歌尔微电子研究院有限公司 | Method and equipment for testing ASIC chip wafer and computer storage medium |
| CN110888042B (en) * | 2019-12-09 | 2022-02-25 | 青岛歌尔微电子研究院有限公司 | Method and equipment for testing ASIC chip wafer and computer storage medium |
| CN113805034A (en) * | 2020-06-12 | 2021-12-17 | 神讯电脑(昆山)有限公司 | Keyboard circuit board detection device with FFC winding displacement |
| CN113805034B (en) * | 2020-06-12 | 2024-03-19 | 神讯电脑(昆山)有限公司 | Keyboard circuit board detection device with FFC flat cable |
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