CN208654202U - A kind of equipment for testing charging chip - Google Patents
A kind of equipment for testing charging chip Download PDFInfo
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- CN208654202U CN208654202U CN201821189064.0U CN201821189064U CN208654202U CN 208654202 U CN208654202 U CN 208654202U CN 201821189064 U CN201821189064 U CN 201821189064U CN 208654202 U CN208654202 U CN 208654202U
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Abstract
The utility model provides a kind of equipment for testing charging chip, comprising: test circuit and pedestal, the vertical support frame being fixed on the base and the fixation bracket connecting with vertical support frame；Fixed bracket is fixed with transmission mechanism, and transmission mechanism includes: transmission mechanism fixing piece, guide cylinder, universal driving shaft, connector and spanner；The handle end of rotating spanner, spanner turn power drive under, connector drive universal driving shaft slided up and down in guide cylinder, universal driving shaft drive lower platen push or rise；Limiting slot is provided on pedestal, limiting slot is limited in limiting slot for the disk that will quench, and disk of quenching is equipped with product accommodation groove；Elastic force probe is additionally provided on pedestal, two stitch of elastic force probe are electrically connected with two incoming ends of test circuit respectively, when trial product to be measured is placed in product accommodation groove, the test interface of the position face trial product to be measured of elastic force probe；In the lower pressure of lower platen, the test interface of trial product to be measured is pressed with elastic force probe to be contacted, to complete to treat the test of test product.
Description
Technical field
The utility model relates to a kind of electronic technology field more particularly to a kind of equipment for testing charging chip.
Background technique
In order to guarantee the network bank business safety of user, bank can also issue intelligence to user when handling bank card for user
Energy encryption device, assists user to handle network bank business.User only uses intelligent cipher equipment ability when carrying out network bank business
Various pecuniary exchanges are completed, otherwise, client can prompt user to be inserted into intelligent cipher equipment.
Dependence with the fast development and network bank business of intelligent cipher equipment to intelligent cipher equipment, intelligent cipher are set
It is standby frequently to be used by user, especially often handle the user of wholesale network bank business.But since intelligent cipher equipment can not
Disassembly in order to which that improves intelligent cipher equipment uses cruise duration, mostly uses in the industry charging chip therefore, it is impossible to replace battery
To realize that the battery to intelligent cipher equipment charges.
And charging chip is produced in enormous quantities by the production line of factory, before coming into operation, in order to guarantee using
Charging chip in intelligent cipher equipment can achieve good charging ability, be badly in need of a kind of simply to charging chip work
The whether normally equipment for testing charging chip.
In addition, how quickly test chip it is whether working properly be always apparatus field problem to be solved it
One.Currently, traditional test mode generally manually tests chip, still, above-mentioned test mode detection speed is slow, quasi-
True rate is lower, but also the problem of be easy to appear missing inspection.Therefore, being also badly in need of one kind can be improved test speed and accuracy rate, keeps away
Exempt from the equipment for testing charging chip of missing inspection.
Utility model content
The utility model aim to solve the problem that the above problem/one of.
The main purpose of the utility model is to provide a kind of equipment for testing charging chip.
In order to achieve the above objectives, the technical solution of the utility model is specifically achieved in that
On the one hand the utility model provides a kind of equipment for testing charging chip, comprising: pedestal and be located at institute
State the support frame on pedestal, support frame as described above include be vertically fixed on the pedestal two sides two vertical support frames and with two institutes
State the fixation bracket of vertical support frame connection；The fixed bracket is fixed with transmission mechanism, described for testing setting for charging chip
Standby further includes lower platen, in which: the transmission mechanism includes at least: transmission mechanism fixing piece, guide cylinder, universal driving shaft, connector
And spanner；Wherein, the transmission mechanism fixing piece is fixed on the fixed bracket；The guide cylinder is fixed on the driver
One free end of structure fixing piece；The universal driving shaft passes through the guide cylinder, and slides up and down along the guide cylinder, the linkage
One end of axis is connect with the lower platen, and the other end is connect with one end of the connector；The spanner is L-shaped, the spanner
Front end and another free end of the transmission mechanism fixing piece be rotatably connected, the bending place of the spanner and the connector
The other end be rotatably connected；The handle end for rotating the spanner, in turning under power drives for the spanner, the connector is driven
The universal driving shaft slides up and down in the guide cylinder, when the linkage is moved axially adjacent to the direction of the pedestal described in drive
Lower platen pushes, and the linkage drives the lower platen to rise when moving axially away from the direction of the pedestal；On the pedestal
It is provided with limiting slot, the position of the limiting slot is corresponding with the position of the lower platen；The limiting slot is for the disk restriction that will quench
In the limiting slot, the disk of quenching is equipped with product accommodation groove, for accommodating trial product to be measured；It is additionally provided on the pedestal
Elastic force probe, when the trial product to be measured is placed in the product accommodation groove, described in the position face of the elastic force probe
The test interface of trial product to be measured；Lower pressure of the trial product to be measured in the lower platen, the test of the trial product to be measured
Interface is pressed with the elastic force probe and is contacted, to complete the test to the trial product to be measured；It is described to be used to test charging chip
Equipment further include the test circuit based on charging chip, wherein the test circuit based on charging chip include: simulation electricity
Pond circuit, slowdown monitoring circuit to be checked, charging chip and charging current measuring circuit；Wherein, the simulated battery circuit includes at least: supplying
Electric port, the first control port, the first PMOS tube, the first NMOS tube, first resistor, second resistance, 3rd resistor, two poles of rectification
Pipe, simulated battery internal resistance and first capacitor；Wherein: the supply port is electrically connected with power supply；First PMOS tube
Source electrode is electrically connected with the supply port, and the drain electrode of first PMOS tube and the positive incoming end of the rectifier diode are electrically connected
It connects, the grid of first PMOS tube is electrically connected with the drain electrode of first NMOS tube；The source electrode of first NMOS tube and institute
The ground terminal electrical connection of power supply is stated, the grid of first NMOS tube is electrically connected with one end of the 3rd resistor, and described the
The other end of three resistance is connected to first control port, under the control of the control signal of first control port output
First PMOS tube described on or off；The first resistor is connected electrically in the grid of the supply port Yu first PMOS tube
Between pole；The second resistance is connected electrically between the grid of first NMOS tube and the ground terminal of the power supply；It is described
Simulated battery internal resistance is in parallel with the first capacitor, and be connected electrically in the rectifier diode reversed incoming end and the power supply
Between the ground terminal of power supply；The slowdown monitoring circuit to be checked includes at least: the second control port, testing resistance, the second PMOS tube, second
NMOS pipe, the 4th resistance, the 5th resistance, the 6th resistance and second output terminal；Wherein: one end of the testing resistance with it is described
The reversed incoming end of rectifier diode is electrically connected, and the other end of the testing resistance and the drain electrode of second PMOS tube are electrically connected
It connects, the source electrode of second PMOS tube is electrically connected with the second output terminal, the grid of second PMOS tube and described second
The drain electrode of NMOS tube is electrically connected；The source electrode of second NMOS tube is electrically connected with the ground terminal of the power supply, and described second
The grid of NMOS tube is electrically connected with one end of the 6th resistance, and the other end of the 6th resistance is connected to second control
Port, the second PMOS tube described on or off under the control of the control signal of second control port output；Described
Four resistance are connected electrically between the grid of second NMOS tube and the ground terminal of the power supply；The 5th resistance electrical connection
Between the grid and the second output terminal of second PMOS tube；Two of the elastic force probe are for detecting charging chip
Stitch be electrically connected respectively with the ground terminal of the second output terminal and the power supply；The charging chip is connected to described
Between two output ends and the ground terminal of the power supply, to be institute in the charging chip for simulated battery circuit charging
When stating the charging of simulated battery circuit, generates electric current and flow through the testing resistance；First detection of the charging current measurement chip
Incoming end and the second detection incoming end are electrically connected to the both ends of the circuit under test；The output end of the charging current measurement chip
Output voltage measured value, the voltage measuring value are obtained according to the electric current for flowing through the testing resistance.
Optionally, equipment further include: sliding axle；The both ends of the sliding axle are fixed on the pedestal and the fixed branch
On frame；The sliding axle is vertical with the surface of the pedestal, parallel with the vertical support frame；The sliding axle passes perpendicularly through described
Lower platen, so that the lower platen is steadily run along the sliding axle.
Optionally, the fixed bracket includes sliding axle fixing piece, for fixing one end of the sliding axle, the sliding
The other end of axis is fixed on the surface of the pedestal.
Optionally, the sliding axle includes at least a pair, and the sliding axle fixing piece matches setting with the sliding axle.
Optionally, the disk of quenching is equipped with multiple product accommodation grooves, to accommodate multiple trial products to be measured.
Optionally, the elastic force probe includes multiple groups, and every group of elastic force probe includes more probes；The elastic force probe and institute
State the product accommodation groove matching setting for disk of quenching.
Optionally, equipment further include: the first gain setting resistor and the second gain setting resistor；The first gain tune
Economize on electricity resistance is connected electrically between the output end of the charging current measurement chip and the feedback end of charging current measurement chip,
Second gain setting resistor is connected electrically in the feedback end of the charging current measurement chip and the charging current measures core
Between the reference end of piece, the reference end is electrically connected with the ground terminal of the power supply.
Optionally, equipment further include: the second capacitor；Second capacitor is in parallel with first gain setting resistor,
It is connected between the output end of the charging current measurement chip and the feedback end of charging current measurement chip.
Optionally,Wherein, VOUTFor the voltage measuring value, IsampleFor
Flow through the electric current of the testing resistance, R22For testing resistance, Ra1First gain setting resistor, Ra2For second gain
Adjust resistance.
Optionally, the charging current measurement chip uses MAX9922 chip.
The utility model provides one kind and fills for testing it can be seen from above-mentioned technical solution provided by the utility model
Product to be measured is fixed on the product accommodation groove of pedestal by mechanical structures such as transmission mechanism and lower platens by the equipment of electrical chip
In, facilitate elastic force probe to complete the test to product, elastic force probe is connected to test circuit, and machine test may be implemented, improve
Testing efficiency and accuracy rate, and can be avoided the missing inspection to product；And the voltage exported by charging current measuring circuit
Measured value, can monitor whether charging chip is in normal working condition, to find problematic charging chip in time.
Detailed description of the invention
It, below will be to required in embodiment description in order to illustrate more clearly of the technical solution of the utility model embodiment
The attached drawing used is briefly described, it should be apparent that, the accompanying drawings in the following description is only some implementations of the utility model
Example, for those of ordinary skill in the art, without creative efforts, can also be according to these attached drawings
Obtain other accompanying drawings.
Fig. 1 is the structural schematic diagram for the equipment for testing charging chip that the utility model embodiment 1 provides；
Fig. 2 is the structural schematic diagram for the test circuit based on charging chip that the utility model embodiment 1 provides.
Specific embodiment
Below with reference to the attached drawing in the utility model embodiment, the technical scheme in the embodiment of the utility model is carried out clear
Chu is fully described by, it is clear that the described embodiments are only a part of the embodiments of the utility model, rather than whole realities
Apply example.Based on the embodiments of the present invention, those of ordinary skill in the art are obtained without making creative work
The every other embodiment obtained, belongs to the protection scope of the utility model.
In the description of the present invention, it should be understood that term " center ", " longitudinal direction ", " transverse direction ", "upper", "lower",
The orientation or positional relationship of the instructions such as "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outside" is
It is based on the orientation or positional relationship shown in the drawings, is merely for convenience of describing the present invention and simplifying the description, rather than indicate
Or imply that signified device or element must have a particular orientation, be constructed and operated in a specific orientation, therefore cannot understand
For limitations of the present invention.In addition, term " first ", " second " are used for description purposes only, and should not be understood as instruction or
Imply relative importance or quantity or position.
In the description of the present invention, it should be noted that unless otherwise clearly defined and limited, term " is pacified
Dress ", " connected ", " connection " shall be understood in a broad sense, for example, it may be being fixedly connected, may be a detachable connection, or integrally
Connection；It can be mechanical connection, be also possible to be electrically connected；Can be directly connected, can also indirectly connected through an intermediary,
It can be the connection inside two elements.For the ordinary skill in the art, above-mentioned art can be understood with concrete condition
The concrete meaning of language in the present invention.
The utility model embodiment is described in further detail below in conjunction with attached drawing.
Embodiment 1
A kind of equipment for testing charging chip is present embodiments provided, this is used to test the equipment packet of charging chip
It includes: tool structure and the test circuit based on charging chip.Wherein: Fig. 1 is used for according to the utility model one embodiment
Test the structural schematic diagram of the equipment of charging chip.Whether the equipment is normal for testing charging chip work.
As shown in Figure 1, tool structure includes: pedestal 1 and the support frame 2 that is located on pedestal 1, support frame includes vertical solid
Be scheduled on pedestal two sides two vertical support frames 21 (side stand only being shown on figure, the other side is not shown) and with two vertical support frames
The fixation bracket 22 of connection；
Fixed bracket 22 is fixed with transmission mechanism 3, and the tool structure further includes lower platen 4, in which: transmission mechanism 3 to
It less include: transmission mechanism fixing piece 301, guide cylinder 302, universal driving shaft 303, connector 304 and spanner 305；Wherein, transmission mechanism
Fixing piece 301 is fixed on fixed bracket 22；Guide cylinder 302 is fixed on a free end of transmission mechanism fixing piece 301；Linkage
Axis 303 passes through guide cylinder 302, and slides up and down along guide cylinder 302, and one end of universal driving shaft 303 is connect with lower platen 4, the other end
It is connect with one end of connector 304；Spanner 305 is L-shaped, the front end of spanner 305 and transmission mechanism fixing piece 301 it is another from
It is rotatably connected by end, the bending place of spanner 305 and the other end of connector 304 are rotatably connected；The handle of rotating spanner 305
End, spanner 305 turn power drive under, connector 304 drive universal driving shaft 303 slided up and down in guide cylinder 302, universal driving shaft
303 drive lower platen 4 to push when moving to the direction close to pedestal 1, band when universal driving shaft 303 is moved to the direction far from pedestal 1
Dynamic lower platen 4 rises；
Limiting slot 5 is provided on pedestal 1, the position of limiting slot 5 is corresponding with the position of lower platen 4；Limiting slot 5 will be for that will quench
Disk 6 is limited in limiting slot 5, and disk 6 of quenching is equipped with product accommodation groove 7, for accommodating trial product to be measured；
It is additionally provided with elastic force probe (not shown) on pedestal 1, is placed in product accommodation groove 7 in trial product to be measured
When, the test interface of the position face trial product to be measured of elastic force probe；Trial product to be measured lower platen 4 lower pressure, it is to be tested
The test interface of product is pressed with elastic force probe and is contacted, to complete to treat the test of test product.
Tool structure provided in this embodiment is fixed product to be measured by mechanical structures such as transmission mechanism and lower platens
In the product accommodation groove of pedestal, elastic force probe is facilitated to complete test to product, elastic force probe is connected to test circuit, can be with
It realizes machine test, improves testing efficiency and accuracy rate, and can be avoided the missing inspection to product.
In addition, the equipment for being used to test charging chip further includes the test circuit based on charging chip (Fig. 1 is not shown).
Wherein, connecting pin there are two having is tested in circuit, is used to detect the stitch of charging chip with two of the elastic force probe respectively
Electrical connection.Fig. 2 is the structural schematic diagram of the test circuit provided in this embodiment based on charging chip, is specifically seen below
To the specific descriptions of Fig. 2.
In the present embodiment, as shown in Figure 1, fixed bracket 22 can be set to connect with two vertical support frames 21, and with
The vertical fixation panel (as shown in Figure 1) in the surface of pedestal 1, may be set to be the fixation panel parallel with the surface of pedestal 1
(being not shown on Fig. 1).Former is arranged, transmission mechanism fixing piece 301 can be as shown in Figure 1, its fixing end be fixed on
On fixed rack 22, for latter arrangement, the fixing end of transmission mechanism fixing piece 301 is fixed on fixed bracket 22 towards pedestal 1
One side on, the front end of two free ends difference fixed guide cylinder 302 and spanner 305, but no matter transmission mechanism fixing piece 301
Fixed bracket 22 is fixed on using which kind of above-mentioned mode, the linkage part that guide cylinder 302 and universal driving shaft 303 are constituted all with pedestal
1 surface is vertical, so as to vertically lower platen be driven to rise or fall.
As an alternative embodiment, as shown in Figure 1, tool structure further include: sliding axle 8；The both ends of sliding axle 8
It is fixed on pedestal 1 and fixed bracket 22；Sliding axle 8 is vertical with the surface of pedestal 1, parallel with vertical support frame 21；Sliding axle 8
Lower platen is passed perpendicularly through, so that lower platen is steadily run along sliding axle, so that lower platen 4 is steadily transported along sliding axle 8
Row.Optionally, sliding axle 8 includes at least a pair of (as shown in Figure 1 801 and 802), and certainly, sliding axle can be set to multiple groups,
It can be configured according to the demand of designer.It can guarantee lower platen 4 under the drive of universal driving shaft 303 by multiple groups sliding axle
Pushing or rising that can be more stable.
As an alternative embodiment, as shown in Figure 1, fixed bracket 22 includes sliding axle fixing piece 221, for solid
Determine one end of sliding axle 8 (801 and 802), the other end of sliding axle is fixed on pedestal 1.The sliding axle fixing piece 221 and sliding
Axis matching setting, as shown in Figure 1, being provided with pair of sliding axis fixing piece 221 on fixed bracket 22.It can by fixing axle fixing piece
With stronger fixation sliding axle, keep its more stable.
As an alternative embodiment, disk 6 of quenching is equipped with multiple product accommodation grooves, to accommodate multiple trial products to be measured,
So as to test multiple products simultaneously, testing efficiency is improved.
As a kind of optional embodiment of the present embodiment, elastic force probe includes multiple groups, and every group of elastic force probe includes more
Probe；Elastic force probe matches setting with the product accommodation groove for disk of quenching, to complete the survey of the product accommodated to each product accommodation groove
Examination.
As a kind of optional embodiment of the present embodiment, as shown in Figure 1, limiting slot 5 includes that limit edge (does not show as above
Out), it limits along the edge for blocking disk 6 of quenching, with fixed disk 6 of quenching；Disk 6 of quenching is additionally provided with handle 9, pulls handle 9 with the disk 6 that will quench
Along limit along pulling out or being pushed into limiting slot 5, technical staff is facilitated to operate.
Product to be measured is fixed on pedestal by above-mentioned transmission mechanism and lower platen by tool structure provided in this embodiment
Product accommodation groove in, facilitate elastic force probe to complete test to product, elastic force probe is connected to test circuit, machine may be implemented
Device test, improves testing efficiency and accuracy rate, and can be avoided the missing inspection to product.
Present embodiments provide a kind of test circuit based on charging chip.As shown in Fig. 2, the test circuit includes: mould
Quasi- battery circuit 10, slowdown monitoring circuit to be checked 20, charging chip 30 and charging current measuring circuit 40；Wherein:
Simulated battery circuit 10 includes: supply port VBAT-OUT, the first control port CHAR-TEST_EN, first
PMOS tube Q1, the first NMOS tube Q2, first resistor R1, second resistance R2,3rd resistor R3, rectifier diode D1, simulated battery
Internal resistance R11 and first capacitor C1；Wherein, the first PMOS tube Q1, the first NMOS tube Q2, first resistor R1, second resistance R2, third
Resistance R3 constitutes first switch circuit, and the first PMOS tube Q1 is first switch unit, and the first NMOS tube Q2 is second switch unit.
Wherein: supply port VBAT-OUT is electrically connected to power supply；The source electrode (S) of first PMOS tube Q1 is electrically connected with supply port,
The drain electrode (D) of first PMOS tube Q1 is electrically connected with the positive incoming end (1) of rectifier diode D1, the grid of the first PMOS tube Q1
(G) it is electrically connected with the drain electrode (D) of the first NMOS tube Q2；The source electrode (S) and the ground terminal GND of power supply of first NMOS tube Q2 is electrically connected
It connects, the grid (G) of the first NMOS pipe Q2 is electrically connected with one end of 3rd resistor R3, and the other end of 3rd resistor R3 is connected to
One control port CHAR-TEST_EN, the first control port CHAR-TEST_EN output control signal control under be connected or
Turn off the first PMOS tube Q1；First resistor R1 be connected electrically in supply port VBAT-OUT and the first PMOS tube grid (G) it
Between；Second resistance R2 is connected electrically between the grid (G) of the first NMOS tube Q2 and the ground terminal GND of power supply；Rectifier diode
The reversed incoming end (2) of D1 is electrically connected to one end of testing resistance R22；Simulated battery internal resistance R11 is in parallel with first capacitor C1, and
It is connected electrically between the reversed incoming end (2) of rectifier diode D1 and the ground terminal GND of power supply；It is needing to charging to be measured
When chip is tested, simulated battery circuit 10 just needs work, so, when controlling signal is high level, the first NMOS tube
Q2 is connected with the first PMOS tube Q1, the conducting of first switch circuit, and simulated battery circuit 10 is working properly.When control signal is low
When level, the first NMOS tube Q2 and the first PMOS tube Q1 are turned off, and first switch circuit shutdown, simulated battery circuit 10 stops work
Make.When not needing to be tested, simulated battery circuit can be controlled by control signal and stopped working, so as to reduce pair
The loss of circuit.
Slowdown monitoring circuit 20 to be checked includes: the second control port CHAR-TEST_EN, testing resistance R22, the second PMOS tube Q3,
Two NMOS tube Q4, the 4th resistance R4, the 5th resistance R5, the 6th resistance R6 and second output terminal VBAT-OUT1；Wherein: rectification two
The reversed incoming end (2) of pole pipe D1 is electrically connected to one end of testing resistance R22；The other end of testing resistance R22 and the 2nd PMOS
The drain electrode (D) of pipe Q3 is electrically connected, and the source electrode (S) of the second PMOS tube Q3 is electrically connected with second output terminal VBAT-OUT1, and second
The grid (G) of PMOS tube Q3 is electrically connected with the drain electrode (D) of the second NMOS tube Q4；The source electrode (S) and power supply electricity of second NMOS tube Q4
The ground terminal GND in source is electrically connected, and the grid (G) of the second NMOS tube Q4 is electrically connected with one end of the 6th resistance R6, the 6th resistance R6's
The other end is connected to the second control port CHAR- TEST_EN, in the control letter of the second control port CHAR-TEST_EN output
Number control under the 2nd PMOS of on or off manage；4th resistance R4 is connected electrically in grid (G) and the power supply of the second NMOS tube Q4
Between the ground terminal GND of power supply；5th resistance electricity R5 is connected to the grid (G) and second output terminal VBAT- of the second PMOS tube Q3
Between OUT1.Only when needing to test charging chip to be measured, slowdown monitoring circuit 20 to be checked just needs work, so, when
When the control signal of second control port CHAR- TEST_EN output is high level, the second NMOS tube Q4 and the second PMOS tube Q3
Conducting, the conducting of second switch circuit, slowdown monitoring circuit 20 to be checked are working properly.When controlling signal is low level, the second NMOS tube Q4
It is turned off with the second PMOS tube Q3, second switch circuit shutdown, slowdown monitoring circuit 20 to be checked stops working.When not needing to be tested,
Slowdown monitoring circuit 20 to be checked can be controlled by control signal to stop working, so as to reduce the loss to circuit.Elastic force probe
Two ground terminal GNDs of the stitch respectively with second output terminal VBAT-OUT1 and power supply for detecting charging chip 30 are electrically connected
It connects, so that whether detect charging chip work normal.Two in circuit are tested with the elastic force probe for detecting charging
The connecting pin of the stitch electrical connection of chip is the ground terminal GND of second output terminal VBAT-OUT1 and power supply.
Charging chip 30 is connected between second output terminal VBAT-OUT1 and the ground terminal GND of power supply, for simulation electricity
Pond circuit 10 charges, and when charging chip 30 is that simulated battery circuit 10 charges, generates electric current and flows through testing resistance R22.Such as Fig. 2
It is shown, the ground terminal GND forming circuit of charging chip 30 and testing resistance R22, simulated battery internal resistance R11, power supply.It is charging
When chip 30 detects that the voltage value of simulated battery circuit 10 is less than preset value, charge mode is opened, electric current is from VBAT-OUT1
R22, R11 are flowed through, ground terminal GND is finally flowed into.At this point, there is electric current to flow through testing resistance R22, charging current measuring circuit 40 passes through
The electric current of detection circuit under test R22 obtains output voltage measured value, exists by the way that whether detection voltage measuring value meets charging chip
The voltage range worked normally to the internal cell charging of product, so that it may test out whether the charging chip is qualified core
Piece.
Charging current measures chip and includes the first detection incoming end RS+, the second detection incoming end RS- and output end OUT, the
One detection incoming end RS+ and the second detection incoming end RS- is connected electrically in the both ends of testing resistance R22, output end OUT output voltage
Measured value, voltage measuring value are obtained according to the electric current for flowing through testing resistance.
Test circuit provided by the embodiment of the utility model based on charging chip as a result, measures electricity by charging current
The voltage measuring value of road output, can monitor whether charging chip is in normal working condition, problematic to find in time
Charging chip.
As an alternative embodiment, as shown in Fig. 2, the test circuit further include: the first gain setting resistor Ra1
With the second gain setting resistor Ra2；Wherein, the first gain setting resistor Ra1It is connected electrically in the output end of charging current measurement chip
Between OUT and the feedback end FB of charging current measurement chip, the second gain setting resistor Ra2It is connected electrically in charging current measurement core
Between the reference end REF of feedback end FB and charging current the measurement chip of piece, the ground terminal electricity GND of reference end REF and power supply
Connection.In the present embodiment, optionally, high side current detection amplifier can use MAX9922 chip.It is obtained by following formula
To voltage measuring value:Wherein, VOUTFor voltage measuring value, IsampleFor flow through to
The electric current of measuring resistance, R22For testing resistance, Ra1For the first gain setting resistor, Ra2For the second gain setting resistor.Pass through first
Gain setting resistor and the second gain setting resistor determine the amplification factor of output voltageSo that output end OUT is defeated
Voltage measuring value out is convenient for observation.
As an alternative embodiment, as shown in Fig. 2, the test circuit further include: the second capacitor C2, in which: the
Two capacitor C2 and the first gain setting resistor Ra1Parallel connection is connected to the output end OUT and charging current of charging current measurement chip
Between the feedback end FB for measuring chip, isolated DC signal is played, it is remaining in the power supply that supply port VBAT-OUT is inputted
Exchange and Resonance Wave Composition circuit enter the effect on ground.
In the present embodiment, when normal work, by control terminal CHAR-TEST_EN export high level so that Q1, Q2, Q3,
Q4 is both turned on, charging chip detect need for simulated battery circuit charging when, for simulated battery circuit charge, circuit under test
Electric current is flowed through on R22, measurement chip, should for technical staff's analysis with this according to the current output voltage measured value flowed through on R22
Whether charging chip works in normal charge voltage range.It is defeated by control terminal CHAR-TEST_EN when not needing work
Low level out, so that Q1, Q2, Q3, Q4 are turned off, the voltage measuring value of measurement chip output is zero.
Any process described otherwise above or method description are construed as in flow chart or herein, and expression includes
It is one or more for realizing specific logical function or process the step of executable instruction code module, segment or portion
Point, and the range of preferred embodiments of the present invention includes other realization, wherein can not be by shown or discussion
Sequence, including according to related function by it is basic simultaneously in the way of or in the opposite order, Lai Zhihang function, this should be by this
The embodiment person of ordinary skill in the field of utility model is understood.
It should be appreciated that each section of the utility model can be realized with hardware, software, firmware or their combination.?
In above embodiment, what multiple steps or method can be executed in memory and by suitable instruction execution system with storage
Software or firmware are realized.It, and in another embodiment, can be with known in this field for example, if realized with hardware
Any one of following technology or their combination realize: there is the logic gate for realizing logic function to data-signal
The discrete logic of circuit, the specific integrated circuit with suitable combinational logic gate circuit, programmable gate array (PGA),
Field programmable gate array (FPGA) etc..
Those skilled in the art are understood that realize all or part of step that above-described embodiment method carries
It suddenly is that relevant hardware can be instructed to complete by program, the program can store in a kind of computer-readable storage medium
In matter, which when being executed, includes the steps that one or a combination set of embodiment of the method.
In addition, can integrate in a processing module in each functional unit in each embodiment of the utility model,
It can be each unit to physically exist alone, can also be integrated in two or more units in a module.It is above-mentioned integrated
Module both can take the form of hardware realization, can also be realized in the form of software function module.The integrated mould
If block is realized and when sold or used as an independent product in the form of software function module, it also can store and counted at one
In calculation machine read/write memory medium.
Storage medium mentioned above can be read-only memory, disk or CD etc..
In the description of this specification, reference term " one embodiment ", " some embodiments ", " example ", " specifically show
The description of example " or " some examples " etc. means specific features, structure, material or spy described in conjunction with this embodiment or example
Point is contained at least one embodiment or example of the utility model.In the present specification, to the schematic table of above-mentioned term
Stating may not refer to the same embodiment or example.Moreover, particular features, structures, materials, or characteristics described can be
It can be combined in any suitable manner in any one or more embodiment or examples.
Although the embodiments of the present invention have been shown and described above, it is to be understood that above-described embodiment is
Illustratively, it should not be understood as limiting the present invention, those skilled in the art are not departing from the utility model
Principle and objective in the case where above-described embodiment can be changed in the scope of the utility model, modify, replace and
Modification.The scope of the utility model is by appended claims and its equivalent limits.
Claims (10)
1. a kind of equipment for testing charging chip characterized by comprising
Pedestal and the support frame being located on the pedestal, support frame as described above includes two for being vertically fixed on the pedestal two sides
Vertical support frame and the fixation bracket being connect with two vertical support frames；
The fixed bracket is fixed with transmission mechanism, and the equipment for testing charging chip further includes lower platen, in which: institute
It states transmission mechanism to include at least: transmission mechanism fixing piece, guide cylinder, universal driving shaft, connector and spanner；Wherein, the driver
Structure fixing piece is fixed on the fixed bracket；The guide cylinder is fixed on a free end of the transmission mechanism fixing piece；
The universal driving shaft passes through the guide cylinder, and slides up and down along the guide cylinder, one end of the universal driving shaft and the lower platen
Connection, the other end are connect with one end of the connector；The spanner is L-shaped, the front end of the spanner and the transmission mechanism
Another free end of fixing piece is rotatably connected, and the bending place of the spanner and the other end of the connector are rotatably connected；
The handle end for rotating the spanner, in turning under power drives for the spanner, the connector drives the universal driving shaft to lead described
It is slided up and down into cylinder, the linkage drives the lower platen to push when moving axially adjacent to the direction of the pedestal, described
The dynamic direction axially away from the pedestal drives the lower platen to rise when moving；
Limiting slot is provided on the pedestal, the position of the limiting slot is corresponding with the position of the lower platen；The limiting slot
For that will quench, disk is limited in the limiting slot, and the disk of quenching is equipped with product accommodation groove, for accommodating trial product to be measured；
Elastic force probe is additionally provided on the pedestal, it is described when the trial product to be measured is placed in the product accommodation groove
The test interface of trial product to be measured described in the position face of elastic force probe；Pushing of the trial product to be measured in the lower platen
Under, the test interface of the trial product to be measured is pressed with the elastic force probe and is contacted, to complete the survey to the trial product to be measured
Examination；
The equipment for testing charging chip further includes the test circuit based on charging chip, wherein described based on charging
The test circuit of chip includes: simulated battery circuit, slowdown monitoring circuit to be checked, charging chip and charging current measuring circuit；Wherein,
The simulated battery circuit includes at least: supply port, the first control port, the first PMOS tube, the first NMOS tube, first
Resistance, second resistance, 3rd resistor, rectifier diode, simulated battery internal resistance and first capacitor；Wherein: the supply port with
Power supply electrical connection；The source electrode of first PMOS tube is electrically connected with the supply port, the drain electrode of first PMOS tube
It is electrically connected with the positive incoming end of the rectifier diode, the drain electrode of the grid of first PMOS tube and first NMOS tube
Electrical connection；The source electrode of first NMOS tube is electrically connected with the ground terminal of the power supply, the grid of first NMOS tube with
One end of the 3rd resistor is electrically connected, and the other end of the 3rd resistor is connected to first control port；Described first
Resistance is connected electrically between the supply port and the grid of first PMOS tube；The second resistance is connected electrically in described
Between the grid of one NMOS tube and the ground terminal of the power supply；The simulated battery internal resistance is in parallel with the first capacitor, and
It is connected electrically between the reversed incoming end of the rectifier diode and the ground terminal of the power supply；
The slowdown monitoring circuit to be checked includes at least: the second control port, testing resistance, the second PMOS tube, the second NMOS tube, the 4th electricity
Resistance, the 5th resistance, the 6th resistance and second output terminal；Wherein: one end of the testing resistance is anti-with the rectifier diode
It is electrically connected to incoming end, the other end of the testing resistance is electrically connected with the drain electrode of second PMOS tube, the 2nd PMOS
The source electrode of pipe is electrically connected with the second output terminal, and the grid of second PMOS tube and the drain electrode of second NMOS tube are electrically connected
It connects；The source electrode of second NMOS tube is electrically connected with the ground terminal of the power supply, the grid of second NMOS tube with it is described
One end of 6th resistance is electrically connected, and the other end of the 6th resistance is connected to second control port；4th resistance
It is connected electrically between the grid of second NMOS tube and the ground terminal of the power supply；5th resistance is connected electrically in described
Between the grid of second PMOS tube and the second output terminal；Two of the elastic force probe are used to detect the stitch of charging chip
It is electrically connected respectively with the ground terminal of the second output terminal and the power supply；
The charging chip is connected between the second output terminal and the ground terminal of the power supply；
First detection incoming end of the charging current measurement chip and the second detection incoming end are electrically connected to the circuit under test
Both ends；The output end output voltage measured value of the charging current measurement chip.
2. the equipment according to claim 1 for testing charging chip, which is characterized in that further include: sliding axle；
The both ends of the sliding axle are fixed on the pedestal and the fixed bracket；The surface of the sliding axle and the pedestal
Vertically, parallel with the vertical support frame；The sliding axle passes perpendicularly through the lower platen, so that the lower platen steadily edge
The sliding axle operation.
3. the equipment according to claim 2 for testing charging chip, which is characterized in that
The fixed bracket includes sliding axle fixing piece, for fixing one end of the sliding axle, the other end of the sliding axle
It is fixed on the surface of the pedestal.
4. the equipment according to claim 3 for testing charging chip, which is characterized in that
The sliding axle includes at least a pair, and the sliding axle fixing piece matches setting with the sliding axle.
5. the equipment according to any one of claims 1 to 4 for testing charging chip, which is characterized in that the disk of quenching
Equipped with multiple product accommodation grooves, to accommodate multiple trial products to be measured.
6. the equipment according to claim 5 for testing charging chip, which is characterized in that
The elastic force probe includes multiple groups, and every group of elastic force probe includes more probes；The production of the elastic force probe and the disk of quenching
The matching setting of product accommodation groove.
7. the equipment according to claim 6 for testing charging chip, which is characterized in that further include: the first gain tune
Economize on electricity resistance and the second gain setting resistor；
First gain setting resistor is connected electrically in the output end of the charging current measurement chip and the charging current is surveyed
Between the feedback end for measuring chip, second gain setting resistor be connected electrically in the feedback end of charging current measurement chip with
Between the reference end of the charging current measurement chip, the reference end is electrically connected with the ground terminal of the power supply.
8. the equipment according to claim 7 for testing charging chip, which is characterized in that further include: the second capacitor；
Second capacitor is in parallel with first gain setting resistor, is connected to the output end of the charging current measurement chip
Between the feedback end of charging current measurement chip.
9. the equipment according to claim 7 or 8 for testing charging chip, which is characterized in that
Wherein, VOUTFor the voltage measuring value, IsampleIt is described to be measured to flow through
The electric current of resistance, R22For testing resistance, Ra1First gain setting resistor, Ra2For second gain setting resistor.
10. according to claim 1 to the equipment described in any one of 4,6 to 8 for testing charging chip, which is characterized in that
The charging current measurement chip uses MAX9922 chip.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201821189064.0U CN208654202U (en) | 2018-07-25 | 2018-07-25 | A kind of equipment for testing charging chip |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201821189064.0U CN208654202U (en) | 2018-07-25 | 2018-07-25 | A kind of equipment for testing charging chip |
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| CN208654202U true CN208654202U (en) | 2019-03-26 |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109061236A (en) * | 2018-07-25 | 2018-12-21 | 天地融电子（天津）有限公司 | A kind of equipment for testing charging chip |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109061236A (en) * | 2018-07-25 | 2018-12-21 | 天地融电子（天津）有限公司 | A kind of equipment for testing charging chip |
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