CN208432692U - A kind of high current specific pin chip testing socket - Google Patents
A kind of high current specific pin chip testing socket Download PDFInfo
- Publication number
- CN208432692U CN208432692U CN201820952483.9U CN201820952483U CN208432692U CN 208432692 U CN208432692 U CN 208432692U CN 201820952483 U CN201820952483 U CN 201820952483U CN 208432692 U CN208432692 U CN 208432692U
- Authority
- CN
- China
- Prior art keywords
- chip
- test
- pin
- hole
- high current
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 111
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims abstract description 21
- 229910052802 copper Inorganic materials 0.000 claims abstract description 21
- 239000010949 copper Substances 0.000 claims abstract description 21
- 230000011664 signaling Effects 0.000 claims abstract description 5
- 235000003392 Curcuma domestica Nutrition 0.000 claims description 6
- 244000008991 Curcuma longa Species 0.000 claims description 6
- 235000003373 curcuma longa Nutrition 0.000 claims description 6
- 235000013976 turmeric Nutrition 0.000 claims description 6
- 230000005611 electricity Effects 0.000 claims 1
- 238000000034 method Methods 0.000 description 3
- 238000005457 optimization Methods 0.000 description 3
- 210000001015 abdomen Anatomy 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000017525 heat dissipation Effects 0.000 description 2
- NMWSKOLWZZWHPL-UHFFFAOYSA-N 3-chlorobiphenyl Chemical compound ClC1=CC=CC(C=2C=CC=CC=2)=C1 NMWSKOLWZZWHPL-UHFFFAOYSA-N 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The utility model relates to a kind of high current specific pin chip testing socket, it includes the test lid for compressing chip, for positioning chip, the test bench of collection ground signalling, support base for receiving the pcb board of pin test signal and for collecting pin signal, wherein, the test bench, be provided with through-hole that position matches, passing through for chip pin on pcb board；The test bench is equipped with several testing current needles, and the testing current needle upper and lower ends extend respectively to the upper and lower edge of the through-hole on test bench；The support base is equipped with several jack copper posts to match with chip pin position in through-hole projected position, and the pcb board is welded on the support base upper surface, and the jack copper post extends to edge on the through-hole on the pcb board.This high current specific pin chip testing socket effectively can be positioned and be tested to high current specific pin chip, and have many advantages, such as that radiating rate is fast, contact reliability is high, and measuring stability is good.
Description
Technical field
The utility model relates to a kind of high current specific pin chip testing sockets.
Background technique
High current specific pin chip is tested, needs to test the signal of each pin of chip, and effectively radiate.But
Since chip pin is long, and test electric current is very big, and traditional test mode using testing needle has the hidden danger for burning needle, it is difficult to real
Existing validity test.
Utility model content
The technical problems to be solved in the utility model is how to overcome the drawbacks described above of the prior art, provides a kind of high current
Specific pin chip testing socket.
In order to solve the above technical problems, this high current specific pin chip testing socket successively includes for pressing from top to bottom
The test lid of tight chip, for positioning chip, the test bench of collection ground signalling, for receiving the pcb board of pin test signal
With the support base for collecting pin signal, wherein be provided on the test bench, pcb board it is that position matches, for chip pin
By through-hole；The test bench is equipped with several testing current needles, and the testing current needle upper and lower ends extend respectively to survey
Try the upper and lower edge of through-hole on seat；The support base is several slotting equipped with matching with chip pin position in through-hole projected position
Hole copper post, the pcb board are welded on the support base upper surface, and the jack copper post extends on the through-hole on the pcb board
Edge.Chip is inserted into jack copper post, test lid is covered, compresses chip downwards, the signal of chip pin passes through with electric current at this time
Jack copper post is directly passed to PCB, and ground signalling and electric current on shell are passed to PCB via more testing current needles, to be tested complete
Cheng Hou opens test lid, takes out chip, completes primary test.Jack copper post element, jack copper post is mounted on support base,
Further and support base is welded on PCB from jack copper post, can be shortened circuit loop, reduce resistance, it is electric effectively to increase test
Stream.When test, chip is inserted into jack copper post and collects test signal, completes signal collection and test.
As optimization, the test bench is symmetrically provided with two rows of pin holes in through-hole two sides, and the testing current needle is fixed on institute
It states in pin hole.The pcb board is equipped with turmeric band in testing current pin position.Testing current needle is arranged in test bench, can shift core
Piece housing currents simultaneously help to conduct heat, and electric current needle contact position is equipped with large area turmeric, can effective conducting electric current, moreover it is possible to which promotion is led
Heat.
As optimization, the test lid two sides are symmetrically opened there are two side channel.Top there are two upper parallel open is covered in the test
Slot.Covering two sides and top surface in test has big fluting, can spill cruelly chip large area, facilitate heat dissipation.
As optimization, the test lid two sides be symmetrically arranged with it is a pair of for buckling the fastener of the test bench, on two fasteners
Several anti-sliding burrs are equipped with equipped with squeezing handle, and in squeezing handle end.Test lid is fixed on survey after test covers and compresses chip by fastener
It tries on seat, squeezing handle is used to pinch the connection for holding release fastener to test bench, and anti-sliding burr exerts a force convenient for pinching finger belly when holding squeezing handle.
A kind of high current specific pin chip testing socket of the utility model can carry out high current specific pin chip
Effective positioning and test, and have many advantages, such as that radiating rate is fast, contact reliability is high, measuring stability is good.
Detailed description of the invention
A kind of high current specific pin chip testing socket of the utility model is described further with reference to the accompanying drawing:
Fig. 1 is the schematic perspective view of this high current specific pin chip testing socket；
Fig. 2 is the vertical profile structural schematic diagram (chip to be measured is shown in figure) of this high current specific pin chip testing socket；
Fig. 3 is the configuration schematic diagram (chip to be measured is shown in figure) of this high current specific pin chip testing socket.
In figure: 1- tests lid, 2- test bench, 3-PCB plate, 4- support base, 5- through-hole, 6- testing current needle, 7- jack copper
Column；101- side channel, 102- inverted draw cut, 103- fastener, 104- squeezing handle, the anti-sliding burr of 105-, 201- pin hole, 301- turmeric band.
Specific embodiment
As shown in Figures 1 to 3, this high current specific pin chip testing socket includes the specific pin chip testing of this high current
Socket successively includes the test lid 1 for compressing chip from top to bottom, for positioning chip, collect ground signalling test bench 2,
Support base 4 for receiving the pcb board 3 of pin test signal and for collecting pin signal, wherein the test bench 2, PCB
Through-hole 5 that position matches, passing through for chip pin is provided on plate 3；The test bench 2 is equipped with several testing current needles 6,
6 upper and lower ends of testing current needle extend respectively to the upper and lower edge of through-hole 5 on test bench 2；The support base 4 is thrown in through-hole 5
Shadow position is equipped with several jack copper posts 7 to match with chip pin position, and the pcb board 3 is welded on table on the support base 4
Face, the jack copper post 7 extend to edge on the through-hole 5 on the pcb board 3.Chip is inserted into jack copper post, test is covered
Lid, compresses downwards chip, and the signal of chip pin and electric current pass through the directly incoming PCB of jack copper post, the ground connection on shell at this time
Signal and electric current are passed to PCB via more testing current needles, after the completion of to be tested, open test lid, take out chip, complete one
Secondary test.Jack copper post element, jack copper post is mounted on support base, is welded on further and from jack copper post support base
On PCB, circuit loop can be shortened, reduce resistance, effectively increase test electric current.When test, chip is inserted into jack copper post and is received
Collection test signal, completes signal collection and test.
The test bench 2 is symmetrically provided with two rows of pin holes 201 in 5 two sides of through-hole, and the testing current needle 6 is fixed on the needle
In hole 201.The pcb board 3 is equipped with turmeric band 301 in 6 position of testing current needle.Testing current needle, Neng Gouzhuan is arranged in test bench
It moves chip housing electric current simultaneously to help to conduct heat, electric current needle contact position is equipped with large area turmeric, can effective conducting electric current, moreover it is possible to promote
Into thermally conductive.
It symmetrically opens there are two side channel 101 1 two sides of test lid.The test lid 1 is upper parallel to open that there are two inverted draw cuts
102.Covering two sides and top surface in test has big fluting, can spill cruelly chip large area, facilitate heat dissipation.
Test 1 two sides of lid are symmetrically arranged with a pair of fastener 103 for being used to buckle the test bench 2, set on two fasteners 103
There is squeezing handle 104, and is equipped with several anti-sliding burrs 105 in 104 end of squeezing handle.Fastener is solid by test lid after test covers and compresses chip
It is scheduled on test bench, squeezing handle is used to pinch the connection for holding release fastener to test bench, and anti-sliding burr is applied convenient for pinching finger belly when holding squeezing handle
Power.
Above embodiment is intended to illustrate the utility model and can realize or use for professional and technical personnel in the field, right
Above embodiment, which is modified, will be readily apparent to those skilled in the art, therefore the utility model includes
But it is not limited to above embodiment, it is any to meet the claims or specification description, meet and principles disclosed herein
With novelty, the method for inventive features, technique, product, each fall within the protection scope of the utility model.
Claims (6)
1. a kind of high current specific pin chip testing socket, it is characterized in that: the test jack successively includes being used for from top to bottom
The test lid (1) for compressing chip, for positioning chip, the test bench (2) of collection ground signalling, for receiving pin test signal
Pcb board (3) and support base (4) for collecting pin signal, wherein
Through-hole (5) that position matches, passing through for chip pin is provided on the test bench (2), pcb board (3)；
The test bench (2) is equipped with several testing current needles (6), and testing current needle (6) upper and lower ends extend respectively to
Through-hole (5) upper and lower edge on test bench (2)；
The support base (4) is equipped with several jack copper posts (7) to match with chip pin position in through-hole (5) projected position,
The pcb board (3) is welded on the support base (4) upper surface, and the jack copper post (7) extends to logical on the pcb board (3)
Edge on hole (5).
2. high current specific pin chip testing socket according to claim 1, it is characterized in that: the test bench (2) in
Through-hole (5) two sides are symmetrically provided with two rows of pin holes (201), and the testing current needle (6) is fixed in the pin hole (201).
3. high current specific pin chip testing socket according to claim 2, it is characterized in that: the pcb board (3) is in electricity
Current test needle (6) position is equipped with turmeric band (301).
4. high current specific pin chip testing socket according to claim 3, it is characterized in that: test lid (1) two
It symmetrically opens there are two side channel (101) side.
5. high current specific pin chip testing socket according to claim 3, it is characterized in that: on test lid (1)
It is opened in parallel there are two inverted draw cut (102) in portion.
6. high current specific pin chip testing socket according to claim 1, it is characterized in that: test lid (1) two
Side is symmetrically arranged with a pair of fastener (103) for being used to buckle the test bench (2), and two fasteners (103) are equipped with squeezing handle (104), and
Several anti-sliding burrs (105) are equipped in squeezing handle (104) end.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820952483.9U CN208432692U (en) | 2018-06-20 | 2018-06-20 | A kind of high current specific pin chip testing socket |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820952483.9U CN208432692U (en) | 2018-06-20 | 2018-06-20 | A kind of high current specific pin chip testing socket |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN208432692U true CN208432692U (en) | 2019-01-25 |
Family
ID=65102208
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201820952483.9U Active CN208432692U (en) | 2018-06-20 | 2018-06-20 | A kind of high current specific pin chip testing socket |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN208432692U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI785920B (en) * | 2020-12-29 | 2022-12-01 | 南韓商李諾工業股份有限公司 | Test device |
-
2018
- 2018-06-20 CN CN201820952483.9U patent/CN208432692U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI785920B (en) * | 2020-12-29 | 2022-12-01 | 南韓商李諾工業股份有限公司 | Test device |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN105869962B (en) | Earth leakage protective device structure suitable for Automated assembly | |
| CN208432692U (en) | A kind of high current specific pin chip testing socket | |
| CN210323125U (en) | BTB module with space less than 0.5mm for high-current test | |
| WO2010133082A1 (en) | Electrical connector | |
| CN203179967U (en) | Lithium battery structure | |
| CN203859246U (en) | Surface-mounted network module without tool | |
| CN210572701U (en) | Meter cover for quickly wiring during verification of intelligent electric energy meter accessed through mutual inductor | |
| CN217522871U (en) | Mobile phone motherboard detects fixed establishment | |
| CN105048217B (en) | Multifunctional audio compression bonding apparatus | |
| CN211958677U (en) | Electric junction box capable of achieving rapid wiring | |
| CN201449400U (en) | Test fixture for SOT series patch product of semi-conductor triode | |
| CN201018075Y (en) | Safety socket | |
| CN209878823U (en) | Automatic locking type BGA aging testing device | |
| CN210876341U (en) | LED chip testing device | |
| CN209590098U (en) | A kind of detection device of lithium ion soft-package battery | |
| CN213845224U (en) | Chip testing seat | |
| CN208224436U (en) | A kind of chip ageing test device | |
| CN207440199U (en) | Radio-frequency transformer test fixture | |
| CN207896188U (en) | A kind of connecting terminal and battery case applied to battery case | |
| CN208208719U (en) | A kind of chip testing Screening Platform | |
| CN207319200U (en) | A kind of mouse | |
| CN205178037U (en) | Use in shell fragment binding post in LED field | |
| CN216957780U (en) | Opening-shaped riveting line fillet switch | |
| CN211018763U (en) | Double-glass assembly testing tool | |
| CN208638725U (en) | Loudspeaker short-circuit test system with BTB connector |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CP03 | Change of name, title or address | ||
| CP03 | Change of name, title or address |
Address after: Room 103, Building 3, No. 18 Dongchang Road, Suzhou Industrial Park, Suzhou City, Jiangsu Province, 215000 Patentee after: Suzhou Fatedi Technology Co.,Ltd. Country or region after: China Address before: Room 103, Building 3, No. 18 Dongchang Road, Suzhou Industrial Park, Suzhou City, Jiangsu Province, 215000 Patentee before: FTDEVICE TECHNOLOGY (SUZHOU) CO.,LTD. Country or region before: China |