CN208297379U - A kind of Systems for optical inspection - Google Patents
A kind of Systems for optical inspection Download PDFInfo
- Publication number
- CN208297379U CN208297379U CN201821039522.2U CN201821039522U CN208297379U CN 208297379 U CN208297379 U CN 208297379U CN 201821039522 U CN201821039522 U CN 201821039522U CN 208297379 U CN208297379 U CN 208297379U
- Authority
- CN
- China
- Prior art keywords
- polarizer
- under test
- object under
- polarization direction
- systems
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Landscapes
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
This application discloses a kind of Systems for optical inspection, the object under test for detection part light-permeable, comprising: the first side of the object under test is arranged in light source, for providing irradiation light to the object under test;First polarizer is arranged in the optical path between the light source and the object under test;Second side of the object under test is arranged in second polarizer;The polarization direction of first polarizer and the polarization direction of second polarizer have certain angle.Due to the polarization direction of first polarizer and second polarizer difference, in object under test zero defect, finally pass through almost without light, the substantially black matrix that observer sees, but when object under test somewhere is defective, by the light at this, polarization direction can change, in defective place, it is seen that meeting be a bright spot, higher contrast is formd with the lighttight region of periphery black, so as to rapidly and accurately check the defect at this.
Description
Technical field
The utility model relates to defects detection fields, more particularly to a kind of Systems for optical inspection.
Background technique
Modern goods are varied, and various flaws can inevitably occur in process of production in various products, if any miscellaneous
Matter, dust, bubble, slight crack, scratch etc., therefore need to carry out defect inspection to product in process of production.Currently, traditional side
Method is using artificial rough inspection product, and with the specific defect of determination and defect type, such inspection method is consumed greatly
The manpower and material resources of amount, it is at high cost, and the review time is long, causes working efficiency and accuracy rate lower.
Therefore, the defect inspection for how rapidly and accurately carrying out product is those skilled in the art's technology urgently to be resolved
Problem.
Utility model content
In view of this, can rapidly and accurately be checked the purpose of this utility model is to provide a kind of Systems for optical inspection
Defect at this out.Its concrete scheme is as follows:
A kind of Systems for optical inspection, the object under test for detection part light-permeable, comprising:
The first side of the object under test is arranged in light source, for providing irradiation light to the object under test;
First polarizer is arranged in the optical path between the light source and the object under test;
Second side of the object under test is arranged in second polarizer;The polarization direction of first polarizer and institute
The polarization direction for stating second polarizer has certain angle.
Preferably, in above-mentioned Systems for optical inspection provided by the embodiment of the utility model, first polarizer it is inclined
Vibrationization direction and the polarization direction of second polarizer are mutually perpendicular to.
Preferably, in above-mentioned Systems for optical inspection provided by the embodiment of the utility model, first polarizer and institute
Stating second polarizer is polaroid.
Preferably, in above-mentioned Systems for optical inspection provided by the embodiment of the utility model, further includes:
The side of second polarizer far from the object under test is arranged in image acquisition device, for acquiring from described
The throw light that second polarizer comes out is formed by picture.
Preferably, in above-mentioned Systems for optical inspection provided by the embodiment of the utility model, described image collector is line
Property scanning camera.
Preferably, in above-mentioned Systems for optical inspection provided by the embodiment of the utility model, further includes:
Image processor is electrically connected with described image collector, picture for being acquired to described image collector into
Row processing, according to the defect of treated result the judges object under test.
A kind of Systems for optical inspection provided by the utility model, the object under test for detection part light-permeable, comprising:
The first side of the object under test is arranged in light source, for providing irradiation light to the object under test;First polarizer, if
It sets in the optical path between the light source and the object under test;Second side of the object under test is arranged in second polarizer;
The polarization direction of first polarizer and the polarization direction of second polarizer have certain angle.
It is last several in object under test zero defect due to the polarization direction of first polarizer and second polarizer difference
Pass through without light, the substantially black matrix that observer sees, but when object under test somewhere is defective, by this
Light, polarization direction can change, in defective place, it is seen that meeting be that a bright spot and periphery black are opaque
Region form higher contrast, so as to rapidly and accurately check the defect at this.
Detailed description of the invention
In order to illustrate the embodiment of the utility model or the technical proposal in the existing technology more clearly, below will be to embodiment
Or attached drawing needed to be used in the description of the prior art is briefly described, it should be apparent that, the accompanying drawings in the following description is only
It is the embodiments of the present invention, for those of ordinary skill in the art, without creative efforts, also
Other attached drawings can be obtained according to the attached drawing of offer.
Fig. 1 is the structural schematic diagram of Systems for optical inspection provided by the embodiment of the utility model.
Specific embodiment
The following will be combined with the drawings in the embodiments of the present invention, carries out the technical scheme in the embodiment of the utility model
Clearly and completely describe, it is clear that the described embodiments are only a part of the embodiments of the utility model, rather than whole
Embodiment.Based on the embodiments of the present invention, those of ordinary skill in the art are without making creative work
Every other embodiment obtained, fall within the protection scope of the utility model.
The utility model provides a kind of Systems for optical inspection, for the object under test of detection part light-permeable, such as Fig. 1 institute
Show, comprising:
The first side of the object under test 2 is arranged in light source 1, for providing irradiation light to the object under test 2;
First polarizer 3 is arranged in the optical path between the light source 1 and the object under test 2;
Second side of the object under test 2 is arranged in second polarizer 4;The polarization direction of first polarizer 3 with
The polarization direction of second polarizer 4 has certain angle.
In above-mentioned Systems for optical inspection provided by the embodiment of the utility model, object under test must be part light-permeable
Product, in object under test zero defect, does not almost have finally due to the polarization direction of first polarizer and second polarizer difference
There is light to pass through, the substantially black matrix that observer sees, but when object under test somewhere is defective, by the light at this
Line, polarization direction can change, in defective place, it is seen that meeting be that a bright spot and periphery black are lighttight
Region forms higher contrast, so as to rapidly and accurately check the defect at this.
Further, in the specific implementation, in above-mentioned Systems for optical inspection provided by the embodiment of the utility model, such as scheme
Shown in 1, the polarization direction of the polarization direction of first polarizer 3 and second polarizer 4, which can be set, mutually hangs down
Directly, it is may further ensure that in this way when object under test zero defect, is finally passed through without light, what observer saw is entirely one
A black matrix, when object under test somewhere is defective, by the light at this, polarization direction can change, and see at this
Meeting be that contrast between a bright spot, with the lighttight region of periphery black is very high, and then improves and check lacking at this
Sunken accuracy rate.
Further, in the specific implementation, in above-mentioned Systems for optical inspection provided by the embodiment of the utility model, it is
Simplify system, first polarizer and second polarizer all can be polaroids.Certainly, it described first is polarized
Device and second polarizer are also possible to other devices, can according to the actual situation depending on, this will not be repeated here.
In addition, showing observer in Fig. 1 is people, in addition to this, observer can also be that can collect a bright spot
With the device of black region picture, therefore in the specific implementation, in above-mentioned optical detection system provided by the embodiment of the utility model
It can also include: image acquisition device in system, the side of second polarizer far from the object under test is set, for adopting
Collect from the throw light that second polarizer comes out and is formed by picture.Specifically, described image collector can be linear
Scanning camera.
In practice, people can directly observe the picture of described image collector acquisition, can also pass through its other party
Formula handles the picture, therefore in the specific implementation, in above-mentioned Systems for optical inspection provided by the embodiment of the utility model
In, it can also include: image processor, be electrically connected with described image collector, for what is acquired to described image collector
Picture is handled, and according to the defect of treated result the judges object under test, can save manpower in this way, further
It improves work efficiency and accuracy rate.
A kind of Systems for optical inspection provided by the embodiment of the utility model, for the object under test of detection part light-permeable,
Include: light source, the first side of the object under test is set, for providing irradiation light to the object under test;First is polarized
Device is arranged in the optical path between the light source and the object under test;The of the object under test is arranged in second polarizer
Two sides;The polarization direction of first polarizer and the polarization direction of second polarizer have certain angle.Due to
The polarization direction of first polarizer and second polarizer is different, finally logical almost without light in object under test zero defect
It crosses, the substantially black matrix that observer sees, but when object under test somewhere is defective, by the light at this, polarization
Direction can change, in defective place, it is seen that meeting be that a bright spot and the lighttight region of periphery black form
Higher contrast, so as to rapidly and accurately check the defect at this.
Finally, it is to be noted that, herein, relational terms such as first and second and the like be used merely to by
One entity or operation are distinguished with another entity or operation, without necessarily requiring or implying these entities or operation
Between there are any actual relationship or orders.Moreover, the terms "include", "comprise" or its any other variant meaning
Covering non-exclusive inclusion, so that the process, method, article or equipment for including a series of elements not only includes that
A little elements, but also including other elements that are not explicitly listed, or further include for this process, method, article or
The intrinsic element of equipment.In the absence of more restrictions, the element limited by sentence "including a ...", is not arranged
Except there is also other identical elements in the process, method, article or apparatus that includes the element.
Systems for optical inspection provided by the utility model is described in detail above, it is used herein specifically a
Example is expounded the principles of the present invention and embodiment, this reality that the above embodiments are only used to help understand
With novel method and its core concept;At the same time, for those skilled in the art, based on the idea of the present invention,
There will be changes in the specific implementation manner and application range, in conclusion the content of the present specification should not be construed as to this
The limitation of utility model.
Claims (6)
1. a kind of Systems for optical inspection, the object under test for detection part light-permeable characterized by comprising
The first side of the object under test is arranged in light source, for providing irradiation light to the object under test;
First polarizer is arranged in the optical path between the light source and the object under test;
Second side of the object under test is arranged in second polarizer;The polarization direction of first polarizer and described the
The polarization direction of two polarizers has certain angle.
2. Systems for optical inspection according to claim 1, which is characterized in that the polarization direction of first polarizer with
The polarization direction of second polarizer is mutually perpendicular to.
3. Systems for optical inspection according to claim 2, which is characterized in that first polarizer and described second is polarized
Device is polaroid.
4. Systems for optical inspection according to any one of claims 1 to 3, which is characterized in that further include:
The side of second polarizer far from the object under test is arranged in image acquisition device, for acquiring from described second
The throw light that the polarizer comes out is formed by picture.
5. Systems for optical inspection according to claim 4, which is characterized in that described image collector is linear scan phase
Machine.
6. Systems for optical inspection according to claim 5, which is characterized in that further include:
Image processor is electrically connected with described image collector, at the picture for acquiring to described image collector
Reason, according to the defect of treated result the judges object under test.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201821039522.2U CN208297379U (en) | 2018-06-29 | 2018-06-29 | A kind of Systems for optical inspection |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201821039522.2U CN208297379U (en) | 2018-06-29 | 2018-06-29 | A kind of Systems for optical inspection |
Publications (1)
Publication Number | Publication Date |
---|---|
CN208297379U true CN208297379U (en) | 2018-12-28 |
Family
ID=64700130
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201821039522.2U Active CN208297379U (en) | 2018-06-29 | 2018-06-29 | A kind of Systems for optical inspection |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN208297379U (en) |
-
2018
- 2018-06-29 CN CN201821039522.2U patent/CN208297379U/en active Active
Similar Documents
Publication | Publication Date | Title |
---|---|---|
TW546754B (en) | On-the-fly automatic defect classification for substrates using signal attributes | |
JP5274622B2 (en) | Defect inspection apparatus and method | |
KR101125997B1 (en) | A method for examinning a foreign substance on a transparent film | |
CN107003254A (en) | Equipment, method and computer program product for the defects detection in workpiece | |
TWI502186B (en) | A bright spot detection device for filtering foreign matter noise and its method | |
CN103389312B (en) | Copper pipe detection system | |
CN106030283B (en) | For examining the apparatus and method of semiconductor packages | |
WO2020098181A1 (en) | Liquid crystal panel defect detection method and system thereof | |
Fu et al. | Medicine glass bottle defect detection based on machine vision | |
CN101464417A (en) | Glass detection method and equipment thereof | |
TWI622764B (en) | An automatic optical inspecting system for particle inspection from the surface | |
CN104101614B (en) | A kind of detection method and device | |
TWI598785B (en) | Detection method and device for touch panel | |
CN208297379U (en) | A kind of Systems for optical inspection | |
JP2020106295A (en) | Sheet defect inspection device | |
JPS6348444A (en) | Method and device for automatic inspection of surface of glass substrate | |
TWM443849U (en) | Optical defect detection device | |
CN204924960U (en) | Soft packing identification code detecting system | |
JP3977503B2 (en) | Film inspection method and film inspection apparatus using the same | |
WO2023164809A1 (en) | Bubble detection method and detection system for curved substrate | |
CN101424646A (en) | Glass foreign bubble detecting method | |
JP2019023588A (en) | Defect inspection system and defect inspection method | |
CN108267453B (en) | Defect detection method of switchable 3D module | |
KR100971081B1 (en) | Defect Inspection Method of Polarizing Film | |
CN112634251A (en) | Detection system for printed circuit |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
GR01 | Patent grant | ||
GR01 | Patent grant |