CN208109385U - A kind of laser Response Time Test System - Google Patents
A kind of laser Response Time Test System Download PDFInfo
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- CN208109385U CN208109385U CN201820728972.6U CN201820728972U CN208109385U CN 208109385 U CN208109385 U CN 208109385U CN 201820728972 U CN201820728972 U CN 201820728972U CN 208109385 U CN208109385 U CN 208109385U
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Abstract
The utility model provides a kind of laser Response Time Test System, and the system comprises infrared laser, wedge-shaped mirrors, attenuator, infrared photoelectric detector, oscillograph voltage probe, oscillograph and laser power supply controllers；The infrared laser, wedge-shaped mirrors, attenuator, infrared photoelectric detector, oscillograph, oscillograph voltage probe and laser power supply controller are sequentially connected.The utility model has used wedge-shaped mirrors, attenuator to laser intensity adjusting, and infrared photoelectric detector, the oscillograph of adjustable gain have been used to the intensity adjustment for the electric signal that optical signal is converted to, and control measures are more various, has preferable flexibility and adaptability.The utility model can be with the time interval i.e. response time between laser signal that precise measurement host computer optical signals and infrared photoelectric detector detect；The utility model is fast using infrared photoelectric detector reaction speed, it is ensured that the accuracy of response time test.
Description
Technical field
The utility model relates to laser technology fields, and in particular to a kind of laser Response Time Test System.
Background technique
With the continuous development of laser technology, various types of lasers play increasingly heavier in military and civilian field
The effect wanted.The wavelength of infrared laser corresponds to the infra-red radiation spectrum of object, has and penetrates under contrast height, high humidity
The advantages that ability is strong has important application value in terms of laser radar, atmospheric remote sensing, laser medicine, military confrontation.With
On application scenarios in, certain require is proposed to the photoresponse time that goes out of laser.Such as in dirccted in frared countermeasures system,
Generally require infrared laser went out the photoresponse time less than 1 second, then laser was required to go out light under certain harsh military environments
Response time is shorter.The photoresponse time out of infrared laser directly determines the validity of infrared electro countermeasure system.It is infrared
Laser goes out that the photoresponse time is shorter, and infrared counteraction system more has sufficient time, and the effective distance of photoelectronic warfare is remoter,
Success rate is higher.Due to being influenced by factors such as thermal balances in laser power supply load delay, laser, solid state laser is opened
It originates and penetrates time of rated power laser and always lag behind optical signals, that is, be constantly present certain length goes out the photoresponse time.
The photoresponse time that goes out for accurately measuring laser will take technological means to shorten the time of photoresponse out, improving laser device to be subsequent
Quality, the validity for improving laser system, the demand of quick response practical application scene provide technical basis and reference data.
Go out currently, temperature-sensitive power probe is mainly placed on laser to the means of testing that laser goes out the photoresponse time
At optical port, estimate that power meter registration rises to the rated power time experienced since zero (or loading laser power supply).
In order to which more accurate records this process, the gauge outfit of power meter is connected into computer, passes through professional software, accurate read power
It counts registration and rises to the rated power time experienced since zero (or loading laser power supply).But due to by power
The limitation of meter itself response time of probe, above system have that response time test is not accurate, this is largely determined by
The characteristic of temperature-sensitive power probe itself, i.e. power resolution are low, and the disadvantage that the response time is long.Common temperature-sensitive power in the market
There is the temperature-sensitive time constant of a few tens of milliseconds in meter probe, power meter itself response time is close to 1s.Obviously, with temperature-sensitive power meter
It is inaccurate that laser to the photoresponse time out less than 1s, which carries out out the measurement of light time response,.
Utility model content
To be overcome the problems, such as present in the relevant technologies at least to a certain extent, the application provides a kind of laser response time
Test macro.
The purpose of this utility model adopts the following technical solutions realization：
A kind of laser Response Time Test System, it is improved in that the system comprises infrared lasers 1, wedge shape
Mirror 2, attenuator 3, infrared photoelectric detector 4, oscillograph voltage probe 5, oscillograph 6 and laser power supply controller 7；It is described red
Outer laser 1, wedge-shaped mirrors 2, attenuator 3, infrared photoelectric detector 4, oscillograph 6, oscillograph voltage probe 5 and laser power supply
Controller 7 is sequentially connected.
Further, the infrared photoelectric detector 4 and oscillograph voltage probe 5 are separately connected the of the oscillograph 6
One channel and second channel.
Further, the system also includes choppers 8；The infrared laser 1, chopper 8, wedge-shaped mirrors 2, attenuator
3 and infrared photoelectric detector 4 be sequentially connected.
Further, the response wave length of the infrared photoelectric detector 4 is between 1.0~10.6 μm.
Further, the response frequency of the infrared photoelectric detector 4 selects within the scope of kHz-GHz.
Further, the wedge-shaped mirrors 2 and attenuator 3 constitute laser attenuator assembly.
Further, the system also includes double color plates 9, before shown double color plate 9 is placed in the infrared photoelectric detector 4
End.
In order to which some aspects of the embodiment to disclosure have a basic understanding, simple summary is shown below.It should
Summarized section is not extensive overview, nor to determine key/critical component or describe the protection scope of these embodiments.
Its sole purpose is that some concepts are presented with simple form, in this, as the preamble of following detailed description.
Compared with the immediate prior art, the excellent effect that technical solution provided by the utility model has is：
The utility model both can be applied to the test of pulsed infrared laser, it can also be used to the survey of continuous infrared laser
Examination；The utility model is compared with traditional thermal power probe test, and without the influence of temperature-sensitive time, reaction speed faster, is surveyed
It tries more accurate；The utility model has used wedge-shaped mirrors, attenuator to laser intensity adjusting, the electric signal being converted to optical signal
Intensity adjustment used the infrared photoelectric detector of adjustable gain, oscillograph, control measures are more various, have preferable spirit
Activity and adaptability.
The utility model strictly observes out the definition of photoresponse time, acquires both optical signals and power signal, measurement
Time interval obtain the size of response time, it follows that measurement result it is more accurate.
The laser signal that the utility model can be detected with precise measurement host computer optical signals and infrared photoelectric detector
Between time interval, that is, response time；The utility model is fast using infrared photoelectric detector reaction speed, it is ensured that when response
Between the accuracy tested.
For the above and related purposes, certain illustrative aspects are described in detail in the following description and the annexed drawings, and
What it was indicated is only some modes in the utilizable various modes of principle of each embodiment.Other benefits and novelty
Property feature will be considered in conjunction with the accompanying with following detailed description and become obvious, the disclosed embodiments be to include it is all this
A little aspects and they be equal.
Detailed description of the invention
The drawings herein are incorporated into the specification and forms part of this specification, and shows the implementation for meeting the application
Example, and together with specification it is used to explain the principle of the application.
Fig. 1 is a kind of the first optimal technical scheme of laser Response Time Test System structural representation provided by the utility model
Figure；
Fig. 2 is a kind of laser response time test signal schematic representation provided by the utility model；
Fig. 3 is a kind of the second optimal technical scheme of laser Response Time Test System structural representation provided by the utility model
Figure；
Fig. 4 is a kind of laser Response Time Test System third optimal technical scheme structural representation provided by the utility model
Figure.
In figure, 1- infrared laser；2- wedge-shaped mirrors；3- attenuator；4- infrared photoelectric detector；5- oscillograph voltage is visited
Head；6- oscillograph；7- laser power supply controller；8- chopper；9- infrared photoelectric detector；9- double color plate.
Specific embodiment
Specific embodiment of the present utility model is described in further detail with reference to the accompanying drawing.
The following description and drawings fully show the specific embodiment of the utility model, so that those skilled in the art
Them can be practiced.Other embodiments may include structure, logic, it is electrical, process and other change.It is real
It applies example and only represents possible variation.Unless explicitly requested, otherwise individual component and function are sequences that is optional, and operating
It can change.The part of embodiment and feature can be included in or replace part and the feature of other embodiments.This reality
Range with novel embodiment include claims entire scope and claims it is all obtainable etc.
Jljl.Herein, these embodiments of the utility model can be by individually or generally with term " utility model " come table
Show, this is not meant to automatically limit this just for the sake of convenient, and if in fact disclosing the utility model more than one
The range of application is that any single utility model or utility model are conceived.
First preferred embodiment
The utility model is not smart enough for the photoresponse testing time is gone out using temperature-sensitive power meter measurement infrared laser at present
Quasi- problem, and a kind of test macro that can quickly, accurately measure the laser device laser response time is provided.
As shown in Figure 1, the effect of wedge-shaped mirrors 2 and laser attenuation piece 3 is to weaken laser power, damage from laser infrared light is prevented
The detection face element of electric explorer 4.The laser signal detected is converted to electric signal by infrared photoelectric detector 4, can be differentiated and be received
The short pulse of second grade range.The effect of oscillograph voltage probe 5 is the optical signals of acquisition, processing host computer；Oscillograph 6 is used to
It reads, the optical signals that the electric signal that processing infrared photoelectric detector 4 is converted and oscillograph voltage probe 5 detect, and
It is showed on its screen, to analyze, to calculate.The setting of the bandwidth of infrared photoelectric detector 4 and oscillograph 6 will affect certain
The reading of response time under pulse wavelength and repetition rate needs the infrared light electrical resistivity survey of selection to achieve the purpose that precise measurement
The high bandwidth shelves of device 4 and oscillograph 6 are surveyed, and the bandwidth of the two needs to match.1 emission pulse laser of infrared laser to be measured.Swash
Light is divided after reaching wedge-shaped mirrors 2.Test beams pass through attenuator 3, by attenuator 3 decaying after laser power mW very
To μ W magnitude.Infrared photoelectric detector 4, oscillograph voltage probe 5 are separately connected the first passage of the oscillograph 6 and second and lead to
Road.Wherein, the bandwidth of infrared photoelectric detector 4 and gain have multi gear optional respectively, and 1~10.6 μm of response wave length scope.First
Channel is laser signal, and second channel is optical signals.Two paths of signals is synchronous in oscillograph 6.It can be by using suitable ND value
Attenuator 3 selects the suitable gain of photodetector 4 and adjusts the horizontal and vertical scale of oscillograph 6 to adapt to test needs.
The process of the two paths of signals that fixed on oscillograph 6 using " Run/Stop " button variation is swashed by measuring vernier measurement
Light device 1 goes out the photoresponse time.
As shown in Fig. 2, solid black lines are when the laser power that detects of photodetector increases from zero to rated power
Laser signal, black dotted lines are the optical signals that the laser power supply controller that oscillograph voltage probe 5 detects issues.In figure
It is that infrared laser goes out light that optical signals starting point and laser signal, which reach the Δ t between 90% time point of normal amplitude,
Response time.Specific measurement method：Laser power supply controller 7 issues optical signals, the detected on observation oscilloscope 6
The optical signals in two channels, and using this signal as the reference point of initial time.When laser output reaches rated power, according to
The specified laser amplitude of the second channel shown on oscillograph 6 carries out the corresponding tune of laser attenuator assembly and 6 field amplitude of oscillograph
Section, and record the amplitude that oscillograph 6 is shown at this time.In infrared laser 1 later out photoresponse time test, optical path, laser
The parameter setting of attenuator and oscillograph 6 cannot all change.After the completion of the preparation debugged above, laser power supply controller
7 issue optical signals again.Waveforms amplitude reaches from zero on oscillograph 6 clicks 6 " Run/ of oscillograph after specified laser amplitude
Stop " button.Using test vernier measure first passage reference point and the specified laser amplitude of second channel 90% between
Time interval, as laser goes out the photoresponse time.
Wherein, the response wave length of infrared photoelectric detector 4 covers the red of electro-optical countermeasure svstem between 1.0~10.6 μm
Outer optical maser wavelength；
Wherein, the rising edge response time of infrared photoelectric detector 4 is nanosecond order；
Wherein, the response frequency of infrared photoelectric detector 4 selects within the scope of kHz-GHz, is suitable for pulsed infrared laser light
Test；
Wherein, infrared photoelectric detector 4 has gain selectable functions, to optimize performance, convenient for test；
Wherein, the bandwidth selection of oscillograph 6 matches the bandwidth of infrared photoelectric detector 4 in 500MHz or more, makes test more
Add accurate；
Wherein, laser attenuator assembly includes wedge-shaped mirrors 2 and attenuator 3；One or more group in round gradual filter
At.
Wherein, the horizontal scale (time/lattice) of oscillograph 6 selects 200ms-400ms, below out accurately to read 1s
The photoresponse time；
The utility model measures using two paths of signals, calculates the photoresponse time out of laser.All the way signal be from
The collected light instruction out of host computer, this signal is as reference signal.Another way signal is what infrared photoelectric detector 4 detected
Laser signal.Two paths of signals is synchronous on high-resolution oscillograph 6.4 initial probe of infrared photoelectric detector is to specified laser
The time interval of the rising edge or failing edge of power signal and reference signal is the photoresponse time out of laser.Due to infrared
4 reaction speed of photodetector is fast, and the response time is very short, and using between high-precision oscillograph 6 calculating two ways of optical signals
Every, therefore can accurately measure very much the photoresponse time out of infrared laser 1, it is ensured that the response time tests accurate
Property.
Second optimal technical scheme
As shown in figure 3, laser is dual laser, the laser that laser exports is divided into wavelength using double color plate 9
Different two-way.Per the test macro for going out the photoresponse time all the way with the first optimal technical scheme.Present embodiment can determine
Two kinds of wavelength of measurement dual laser go out light speed difference.Wherein, attenuator 3 is round gradual filter.It is round
Optical filter operates more simple and convenient instead of attenuator 3.Infrared photoelectric detector 4 is InAsSb detector, is had broader
Sensitive volume, i.e. 1.0um-5.8um, bandwidth and gain have multi gear optional respectively.
Third optimal technical scheme
As shown in figure 4, it is continuous laser that infrared laser 1, which exports laser, continuous laser is changed into arteries and veins after chopper 8
Impulse light.The light-emitting window apart from infrared laser be sequentially placed chopper 8 when continuous wave laser (testing laser device be use),
Laser attenuator assembly (can be made of) wedge-shaped mirrors 2 and attenuator 3.Infrared photoelectric detector 4 is adjusted, laser beam normal incidence is arrived
The detection face element of photodetector.The test method of photoresponse time is the same as the first optimal technical scheme out.
Chopper 8 is only used when testing continuous laser, and effect is that continuous laser is changed into pulse laser, to adapt to AC
The infrared photoelectric detector 4 of coupling.
In above-mentioned detailed description, various features are combined together in single embodiment, to simplify the disclosure.
That is, the feature that the embodiment of theme claimed needs clearly to be stated in each claim is more special
Sign.On the contrary, as reflected in the appended claims, the utility model is in than disclosed single embodiment
The few state of whole features.Therefore, appended claims is hereby expressly incorporated into detailed description, wherein each right
It is required that being used as the individual preferred embodiment of the utility model alone.
Finally it should be noted that：Above embodiments are only to illustrate the technical solution of the utility model rather than limit it
System, although the utility model is described in detail referring to above-described embodiment, those of ordinary skill in the art are still
Specific implementation of the utility model can be modified or equivalent replacement, these without departing from the spirit of the present invention and
Any modification of range or equivalent replacement, within the claims for applying for pending the utility model.
Claims (7)
1. a kind of laser Response Time Test System, which is characterized in that the system comprises infrared lasers (1), wedge-shaped mirrors
(2), attenuator (3), infrared photoelectric detector (4), oscillograph voltage probe (5), oscillograph (6) and laser power supply controller
(7)；The infrared laser (1), wedge-shaped mirrors (2), attenuator (3), infrared photoelectric detector (4), oscillograph (6), oscillograph
Voltage probe (5) and laser power supply controller (7) are sequentially connected.
2. a kind of laser Response Time Test System as described in claim 1, which is characterized in that the infrared photoelectric detector
(4) and oscillograph voltage probe (5) is separately connected the first passage and second channel of the oscillograph (6).
3. a kind of laser Response Time Test System as described in claim 1, which is characterized in that the system also includes copped waves
Device (8)；The infrared laser (1), chopper (8), wedge-shaped mirrors (2), attenuator (3) and infrared photoelectric detector (4) are successively
Connection.
4. a kind of laser Response Time Test System as described in claim 1, which is characterized in that the infrared photoelectric detector
(4) response wave length is between 1.0~10.6 μm.
5. a kind of laser Response Time Test System as described in claim 1, which is characterized in that the infrared photoelectric detector
(4) response frequency selects within the scope of kHz-GHz.
6. a kind of laser Response Time Test System as described in claim 1, which is characterized in that the wedge-shaped mirrors (2) and decline
Subtract piece (3) and constitutes laser attenuator assembly.
7. a kind of laser Response Time Test System as described in claim 1, which is characterized in that the system also includes double-colored
Piece (9), shown double color plate (9) are placed in the infrared photoelectric detector (4) front end.
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| CN201820728972.6U CN208109385U (en) | 2018-05-16 | 2018-05-16 | A kind of laser Response Time Test System |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110865389A (en) * | 2019-10-29 | 2020-03-06 | 浙江大学 | Response optimization processing method for marine laser radar system |
| CN111830523A (en) * | 2020-07-24 | 2020-10-27 | 中国电子科技集团公司第四十四研究所 | Photoelectric detector flight time correction system and method |
| CN112863153A (en) * | 2021-01-04 | 2021-05-28 | 电子科技大学 | Device and method for testing reaction time of photoelectric alarm system |
-
2018
- 2018-05-16 CN CN201820728972.6U patent/CN208109385U/en active Active
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110865389A (en) * | 2019-10-29 | 2020-03-06 | 浙江大学 | Response optimization processing method for marine laser radar system |
| CN111830523A (en) * | 2020-07-24 | 2020-10-27 | 中国电子科技集团公司第四十四研究所 | Photoelectric detector flight time correction system and method |
| CN111830523B (en) * | 2020-07-24 | 2023-07-04 | 中国电子科技集团公司第四十四研究所 | Photoelectric detector flight time correction system and method |
| CN112863153A (en) * | 2021-01-04 | 2021-05-28 | 电子科技大学 | Device and method for testing reaction time of photoelectric alarm system |
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