CN207181612U - A kind of Schottky diode high temperature reverse bias experimental rig - Google Patents
A kind of Schottky diode high temperature reverse bias experimental rig Download PDFInfo
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- CN207181612U CN207181612U CN201721284515.4U CN201721284515U CN207181612U CN 207181612 U CN207181612 U CN 207181612U CN 201721284515 U CN201721284515 U CN 201721284515U CN 207181612 U CN207181612 U CN 207181612U
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- high temperature
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Abstract
The utility model discloses a kind of Schottky diode high temperature reverse bias experimental rig,Including testing mainboard,The lower end of the experiment mainboard is provided with support base,The equidistant annular backup pad provided with predetermined number in upper surface of the experiment mainboard,The equidistant through hole provided with predetermined number in upper surface of the experiment mainboard,And through hole is located at the inner side of the annular backup pad of predetermined number respectively,The also equidistant support column provided with predetermined number in upper surface of the experiment mainboard,Two sliding grooves are symmetrically offered in the side wall of the support column,The equidistant jack provided with predetermined number in inside of each sliding groove,The outside of each support column is arranged with first collar,The side of first collar is provided with contiguous block,The utility model cost is low,Small volume,It can conveniently learn that triode/diode is bearing design temperature,The most long working time under setting electric current,It is easy to experiment to use,Can be with analysis product performance,Improve product reliability.
Description
Technical field
It the utility model is related to high temperature reverse bias technical field of test equipment, more particularly to a kind of Schottky diode high temperature is anti-
Inclined experimental rig.
Background technology
Existing test diode, the high temperature reverse bias experimental rig of triode of being used for is by high temperature oven, biasing plate, reverse-biased electricity
The part such as source and its control system, display system forms, and the device includes power supply, master control system, supplementary controlled system, meter
Calculation machine, display, connector, biasing plate, thermostatic chamber, concentrate together, equipment volume is huge, expensive, for installation site
It is required that enter size and height have particular/special requirement, so the device use condition is very limited, but due to high temperature reverse bias
Performance is to assess the important tests equipment of semiconductor product reliability, and product is before specifically used, it is not known that it can hold
How long worked down under by design temperature and electric current, this brings very big inconvenience to the use of product.
The content of the invention
The purpose of this utility model is to solve the problems, such as in background technology, and a kind of Schottky diode proposed is high
The reverse-biased experimental rig of temperature, efficiently solves Schottky diode Performance Evaluation, the use to product brings larger convenience.
To achieve these goals, the utility model employs following technical scheme：
A kind of Schottky diode high temperature reverse bias experimental rig, including experiment mainboard, the lower end of the experiment mainboard are provided with
Support base, the equidistant annular backup pad provided with predetermined number in upper surface of the experiment mainboard, the upper table of the experiment mainboard
The equidistant through hole provided with predetermined number in face, and through hole is respectively positioned at the inner side of the annular backup pad of predetermined number, the experiment
The also equidistant support column provided with predetermined number in the upper surface of mainboard, two slips are symmetrically offered in the side wall of the support column
Groove, the equidistant jack provided with predetermined number in inside of each sliding groove, the outside of each support column are arranged
There is first collar, the side of first collar is provided with contiguous block, and side of the contiguous block away from first collar is provided with and ring
3rd collar of shape supporting plate position correspondence, the inner side of the 3rd collar are provided with second collar, and second collar and the 3rd set
Elastic construction is provided between ring.
Preferably, the side of the experiment mainboard is equiped with connecting line.
Preferably, the elastic construction forms by elastic rod and around the second spring being located on elastic rod.
Preferably, two gag lever posts are arranged with the outside of first collar, two are equipped with each gag lever post
Individual inserted link, and one end of inserted link through first collar and extends to the inside of jack, the one end of the inserted link away from jack is provided with
Arm-tie, the first spring of predetermined number is provided between the gag lever post and first collar.
Preferably, the experiment mainboard is cuboid hollow structure.
Preferably, the lower surface of the support base is provided with improved mat, and passes through locking between improved mat and support base
Mode connects for screw.
In the utility model, triode/diode is placed on to the inner side of second collar made of rubber, and it is contractile
Elastic construction can facilitate second collar to change size, and different size of triode/diode is adapted to this, then pull and draw
Plate so that inserted link is removed from jack, then moves up and down first collar, and first set annulus is moved on second collar and the 3rd collar
Lower movement, when being moved to suitable position, arm-tie is unclamped, in the presence of the first spring, inserted link is inserted into jack, is played solid
Fixed effect, then triode/diode plug-in unit is tested into through hole, and annular backup pad can also play the work of support
With, and be not directed to partly same as the prior art in the device or can be realized using prior art, the utility model
Cost is low, small volume, can conveniently learn that triode/diode is most long in the case where bearing design temperature, setting electric current
Working time, it is easy to experiment to use, product reliability can be improved with analysis product performance.
Brief description of the drawings
Fig. 1 be the utility model proposes a kind of Schottky diode high temperature reverse bias experimental rig structural representation；
Fig. 2 be the utility model proposes a kind of Schottky diode high temperature reverse bias experimental rig part-structure vertical view
Figure.
In figure：1 experiment mainboard, 2 support bases, 3 support columns, 4 annular backup pads, 5 through holes, 6 connecting lines, 7 jacks, 8 are slided
Groove, 9 first collars, 10 gag lever posts, 11 arm-ties, 12 first springs, 13 second collars, 14 the 3rd collars, 15 elastic mechanisms, 16 connect
Connect block.
Embodiment
Below in conjunction with the accompanying drawing in the utility model embodiment, the technical scheme in the embodiment of the utility model is carried out
Clearly and completely describing, it is clear that described embodiment is only the utility model part of the embodiment, rather than whole
Embodiment.
In description of the present utility model, it is to be understood that term " on ", " under ", "front", "rear", "left", "right",
The orientation or position relationship of the instruction such as " top ", " bottom ", " interior ", " outer " are based on orientation shown in the drawings or position relationship, are only
Described for the ease of description the utility model and simplifying, rather than instruction or imply signified device or element must have it is specific
Orientation, with specific azimuth configuration and operation, therefore it is not intended that to limitation of the present utility model.
Reference picture 1-2, a kind of Schottky diode high temperature reverse bias experimental rig, including experiment mainboard 1, experiment mainboard 1
Lower end is provided with support base 2, tests the equidistant annular backup pad 4 provided with predetermined number in upper surface of mainboard 1, experiment mainboard 1
The equidistant through hole 5 provided with predetermined number in upper surface, and through hole 5 is located at the inner side of the annular backup pad 4 of predetermined number respectively, it is real
The also equidistant support column 3 provided with predetermined number in upper surface of mainboard 1 is tested, two cunnings are symmetrically offered in the side wall of support column 3
Dynamic groove 8, the equidistant jack 7 provided with predetermined number in inside of each sliding groove 8, the outside of each support column 3 is arranged with
First collar 9, the side of first collar 9 are provided with contiguous block 16, and side of the contiguous block 16 away from first collar 9 is provided with props up with annular
3rd collar 14 of the position correspondence of fagging 4, the inner side of the 3rd collar 14 are provided with second collar 13, and second collar 13 and the 3rd set
Elastic construction 15 is provided between ring 14；
The side of experiment mainboard 1 is equiped with connecting line 6, and elastic construction 15 is by elastic rod and around second be located on elastic rod
Spring forms, and the outside of first collar 9 is arranged with two gag lever posts 10, two inserted links are equipped with each gag lever post 10, and
One end of inserted link is through first collar 9 and extends to the inside of jack 7, and the one end of inserted link away from jack 7 is provided with arm-tie 11, spacing
The first spring 12 of predetermined number is provided between the collar 9 of bar 10 and first, experiment mainboard 1 is cuboid hollow structure, support base 2
Lower surface be provided with improved mat, and connected between improved mat and support base 2 by lock-screw.
In the utility model, triode/diode is placed on to the inner side of second collar 13 made of rubber, and it is collapsible
Elastic construction 15 second collar 13 can be facilitated to change size, different size of triode/diode is adapted to this, then
Pull arm-tie 11 so that inserted link removes from jack 7, then moves up and down first collar 9, and first collar 9 drives second collar
13 and the 3rd the collar 14 move up and down, when being moved to suitable position, unclamp arm-tie 11, in the presence of the first spring 12,
Inserted link is inserted into jack 7, plays fixed effect, and then triode/diode plug-in unit is tested into through hole 5, and annular
Supporting plate 4 can also play a part of support.
It is described above, the only preferable embodiment of the utility model, but the scope of protection of the utility model is not
This is confined to, any one skilled in the art is in the technical scope that the utility model discloses, according to this practicality
New technical scheme and its utility model design are subject to equivalent substitution or change, should all cover in protection model of the present utility model
Within enclosing.
Claims (6)
1. a kind of Schottky diode high temperature reverse bias experimental rig, including experiment mainboard（1）, it is characterised in that the experiment master
Plate（1）Lower end be provided with support base（2）, the experiment mainboard（1）The equidistant annular brace provided with predetermined number in upper surface
Plate（4）, the experiment mainboard（1）The equidistant through hole provided with predetermined number in upper surface（5）, and through hole（5）Respectively positioned at pre-
If the annular backup pad of quantity（4）Inner side, the experiment mainboard（1）The also equidistant support provided with predetermined number in upper surface
Post（3）, the support column（3）Side wall on symmetrically offer two sliding grooves（8）, each sliding groove（8）Inside it is equal
The equidistant jack provided with predetermined number（7）, each support column（3）Outside be arranged with first collar（9）, described
One collar（9）Side be provided with contiguous block（16）, the contiguous block（16）Away from first collar（9）Side be provided with and annular prop up
Fagging（4）3rd collar of position correspondence（14）, the 3rd collar（14）Inner side be provided with second collar（13）, and second set
Ring（13）With the 3rd collar（14）Between be provided with elastic construction（15）.
A kind of 2. Schottky diode high temperature reverse bias experimental rig according to claim 1, it is characterised in that the experiment
Mainboard（1）Side be equiped with connecting line（6）.
A kind of 3. Schottky diode high temperature reverse bias experimental rig according to claim 1, it is characterised in that the elasticity
Structure（15）Formed by elastic rod and around the second spring being located on elastic rod.
4. a kind of Schottky diode high temperature reverse bias experimental rig according to claim 1, it is characterised in that described first
The collar（9）Outside be arranged with two gag lever posts（10）, each gag lever post（10）On be equipped with two inserted links, and inserted link
One end run through first collar（9）And extend to jack（7）Inside, the inserted link is away from jack（7）One end be provided with arm-tie
（11）, the gag lever post（10）With first collar（9）Between be provided with predetermined number the first spring（12）.
A kind of 5. Schottky diode high temperature reverse bias experimental rig according to claim 1, it is characterised in that the experiment
Mainboard（1）For cuboid hollow structure.
A kind of 6. Schottky diode high temperature reverse bias experimental rig according to claim 1, it is characterised in that the support
Seat（2）Lower surface be provided with improved mat, and improved mat and support base（2）Between connected by lock-screw.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201721284515.4U CN207181612U (en) | 2017-10-03 | 2017-10-03 | A kind of Schottky diode high temperature reverse bias experimental rig |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201721284515.4U CN207181612U (en) | 2017-10-03 | 2017-10-03 | A kind of Schottky diode high temperature reverse bias experimental rig |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN207181612U true CN207181612U (en) | 2018-04-03 |
Family
ID=61749633
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201721284515.4U Active CN207181612U (en) | 2017-10-03 | 2017-10-03 | A kind of Schottky diode high temperature reverse bias experimental rig |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN207181612U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115144717A (en) * | 2022-06-17 | 2022-10-04 | 先之科半导体科技(东莞)有限公司 | Wide diode high temperature reverse bias experimental facilities of application scope |
-
2017
- 2017-10-03 CN CN201721284515.4U patent/CN207181612U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115144717A (en) * | 2022-06-17 | 2022-10-04 | 先之科半导体科技(东莞)有限公司 | Wide diode high temperature reverse bias experimental facilities of application scope |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CP03 | Change of name, title or address |
Address after: 273100 No. 166 Chunqiu East Road, Qufu City, Jining City, Shandong Province Patentee after: Shandong crystal guided microelectronic Limited by Share Ltd Address before: 273100 Taiwan City Industrial Park, Qufu City, Jining, Shandong. Patentee before: Shandong Jing Dao Microtronics A/S |
|
| CP03 | Change of name, title or address |