CN211669322U

CN211669322U - Integrated main board FCT testing device

Info

Publication number: CN211669322U
Application number: CN201922325513.0U
Authority: CN
Inventors: 汪家柱; 朱荣惠
Original assignee: Wuxi Huayang Science And Technology Co ltd
Current assignee: Wuxi Huayang Science And Technology Co ltd
Priority date: 2019-12-23
Filing date: 2019-12-23
Publication date: 2020-10-13
Anticipated expiration: 2029-12-23

Abstract

The utility model discloses an integrated mainboard FCT testing device, which relates to the technical field of mainboard FCT testing devices and comprises a workbench with a cavity, wherein a mainboard carrier for placing a mainboard to be tested is arranged on the surface of the workbench; the test device comprises a workbench, a support frame, a C-shaped support arm, a pressing plate and a telescopic pressing column, wherein the surface of the workbench corresponds to one side of a mainboard carrier, the support frame is provided with the C-shaped support arm, the pressing plate above the mainboard carrier is controlled to vertically move through a transmission device connected with the C-shaped support arm, a plurality of groups of test probes for communicating a mainboard loop to be tested and the telescopic pressing column for testing a mainboard key are vertically penetrated through the pressing plate, and the pressing column for pressing the mainboard to be tested is vertically arranged on the bottom surface of the pressing plate. The device has the advantages of simple structure, convenient use and low cost, and can effectively improve the testing efficiency.

Description

Integrated main board FCT testing device

Technical Field

The utility model belongs to the technical field of mainboard FCT testing arrangement technique and specifically relates to an integral type mainboard FCT testing arrangement.

Background

FCT (functional Test) refers to a Test method in which a simulated operating environment (excitation and load) is provided for a Test target board (UUT: Unit Under Test) to operate in various design states, and parameters of each state are acquired to verify the performance of the UUT. Simply put, the UUT is loaded with the appropriate stimulus and the output response is measured for compliance.

At present, the PCB mainboard is before dispatching from the factory, needs to survey each parameter of mainboard, breaks down when avoiding using with the product equipment, and current detection mainly relies on artifical survey, because personnel's experience of working is different, in the production operation in-process, can lead to the PCB board variant to damage, can lead to the unstability of test result when the mainboard test, and the condition that no test can appear takes place, and the parameter value of output can not reach the technical drawing requirement.

Therefore, a technique for solving the above problems is urgently needed.

SUMMERY OF THE UTILITY MODEL

The utility model discloses to prior art's not enough, provide an integral type mainboard FCT testing arrangement, through will await measuring the mainboard and place in the mainboard carrier, through holding down the clamp plate will set up in test probe, scalable compression leg and compression leg on the clamp plate and the examination position direct contact that awaits measuring of the mainboard that awaits measuring reach the purpose that the follow-up test work of being convenient for goes on. The device has simple structure and convenient use, and can effectively improve the testing efficiency.

In order to realize the purpose of the utility model, the utility model provides a following technical scheme:

an integrated mainboard FCT testing device comprises a workbench with a cavity, wherein a mainboard carrier for placing a mainboard to be tested is arranged on the surface of the workbench; the test device comprises a workbench, a support frame, a C-shaped support arm, a pressing plate and a telescopic pressing column, wherein the surface of the workbench corresponds to one side of a mainboard carrier, the support frame is provided with the C-shaped support arm, the pressing plate above the mainboard carrier is controlled to vertically move through a transmission device connected with the C-shaped support arm, a plurality of groups of test probes for communicating a mainboard loop to be tested and the telescopic pressing column for testing a mainboard key are vertically penetrated through the pressing plate, and the pressing column for pressing the mainboard to be tested is vertically arranged on the bottom surface of the pressing plate.

Preferably, the C-shaped support arm comprises an open top end and an open bottom end, and the open bottom end is a sleeve; the transmission device comprises a connecting shaft vertically connected to the surface of the pressing plate, the connecting shaft penetrates through the sleeve and is movably connected with the lower ends of a group of bow-shaped connecting pieces which are symmetrical to each other, the upper ends of the bow-shaped connecting pieces are movably connected with the bottom of the handle, and the top of the handle is movably connected with the top end of the opening.

Preferably, the surface of the workbench is provided with a group of mutually symmetrical limiting columns, and the same end of the pressing plate is sleeved with the limiting columns and can do vertical limiting motion relative to the limiting columns.

Preferably, carrier grooves with the same specification are formed in the mainboard carrier, and the corresponding carrier grooves are respectively matched with the test probes, the telescopic compression columns and the compression columns.

Preferably, the power supply device further comprises a power switch arranged on the side surface of the workbench and a knob arranged on the surface of the workbench, and the power switch and the knob are connected with a control main board arranged in the cavity of the workbench.

Preferably, air holes for heat dissipation are further formed along any side surface of the workbench.

Advantageous effects

The utility model provides an integral type mainboard FCT testing arrangement places in the mainboard carrier through the mainboard that will await measuring, will set up through pushing down the clamp plate in test probe, scalable compression leg and compression leg on the clamp plate and the examination position direct contact that awaits measuring the mainboard reach the purpose that the follow-up test work of being convenient for goes on. The device has simple structure and convenient use, and can effectively improve the testing efficiency.

Drawings

In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings needed to be used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the structures shown in the drawings without creative efforts.

Fig. 1 is a schematic structural diagram of an integrated motherboard FCT testing apparatus according to the present invention;

fig. 2 is a schematic structural view of a motherboard carrier and a pressing plate of the integrated motherboard FCT testing apparatus according to the present invention;

fig. 3 is a schematic structural view of a test probe, a retractable compression leg and a compression leg on a pressing plate of the integrated main board FCT testing device.

Graphic notation:

1-workbench, 2-mainboard carrier, 3-pressing plate, 4-pressing column, 5-testing probe, 6-telescopic pressing column, 7-transmission device, 7-1-connecting shaft, 7-2-bow-shaped connecting piece, 7-3-handle, 8-supporting frame, 9-C-shaped supporting arm, 9-1-open top end, 9-2-sleeve, 10-limiting column, 11-knob, 12-power switch and 13-air hole.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.

As shown in fig. 1, an integrated motherboard FCT testing apparatus includes a workbench 1 with a cavity, wherein a motherboard carrier 2 for placing a motherboard to be tested is arranged on the surface of the workbench 1; follow one side of mainboard carrier 2 corresponds the surface of workstation 1 is provided with support frame 8, install C shape support arm 9 on the support frame 8, set up in the clamp plate 3 of mainboard carrier 2 top do vertical motion through with the transmission 7 control that C shape support arm 9 is connected, run through perpendicularly on the clamp plate 3 and have a plurality of groups to be used for putting through the test probe 5 that awaits measuring the mainboard return circuit, and be used for the scalable compression leg 6 of the mainboard button that awaits measuring, the bottom surface of clamp plate 3 is provided with the compression leg 4 that is used for pushing down the mainboard that awaits measuring perpendicularly.

The pressure column 4 is used for pressing the back surface of the mainboard to be tested, so that the purpose of well fitting the test probe 5 and the telescopic pressure column 6 with the mainboard to be tested is achieved;

the test probe 5 is used for connecting a mainboard loop to be tested and testing the power-on condition;

the telescopic compression leg 6 is used for testing the sensitivity of the keys of the mainboard to be tested.

Specifically, the C-shaped support arm 9 comprises an open top end 9-1 and an open bottom end, and the open bottom end is a sleeve 9-2; the transmission device 7 comprises a connecting shaft 7-1 vertically connected to the surface of the pressing plate 3, the connecting shaft 7-1 penetrates through the sleeve 9-2 and is movably connected with the lower ends of a group of symmetrical arched connecting pieces 7-2, the upper end of each arched connecting piece 7-2 is movably connected with the bottom of the handle 7-3 (the two arched connecting pieces 5-2 are mutually symmetrical to form a movable space for the handle 5-3 to do rotary motion), and the top of the handle 7-3 is movably connected with the top end 9-1 of the opening.

As the optimization of the device, in order to enable the pressure plate 3 to keep X, Y axial position stability all the time in the working process and better move on the Z axis, a group of mutually symmetrical limiting columns 10 are arranged on the surface of the workbench 1 corresponding to the two sides of the support frame 8, the limiting columns 10 are sleeved on the two sides of the same end of the pressure plate 3, and the pressure plate can do vertical limiting movement relative to the limiting columns 10.

As shown in fig. 2 and 3, as a further optimization of the apparatus, 4 sets of carrier grooves 2-1 with the same specification are provided in the motherboard carrier 2, the carrier grooves 2-1 are used for placing a motherboard to be tested, and the corresponding carrier grooves 2-1 are respectively matched with the test probes 5, the retractable compression columns 6 and the compression columns 4. Therefore, the test of 4 main boards to be tested can be simultaneously realized, and the test efficiency is effectively improved.

This device is in being provided with the switch 12 who realizes the purpose of outage power supply and the knob 11 that is used for adjusting the test position of the side of workstation 1, switch 12 with knob 11 with install in control mainboard connection in the 1 cavity of workstation, and then realize automatic intelligent test.

Because this device can produce the heat at the test in-process, follow any side of workstation 1 still offers and is used for radiating bleeder vent 13 for the use of device is safer, and the life-span is more permanent.

The foregoing is only a preferred embodiment of the present invention, and it should be noted that, for those skilled in the art, a plurality of modifications and decorations can be made without departing from the principle of the present invention, and these modifications and decorations should also be regarded as the protection scope of the present invention.

Claims

1. The utility model provides an integral type mainboard FCT testing arrangement which characterized in that: the test device comprises a workbench (1) with a cavity, wherein a mainboard carrier (2) for placing a mainboard to be tested is arranged on the surface of the workbench (1); follow one side of mainboard carrier (2) corresponds the surface of workstation (1) is provided with support frame (8), install C shape support arm (9) on support frame (8), set up in clamp plate (3) of mainboard carrier (2) top through with transmission (7) control that C shape support arm (9) are connected is vertical motion from top to bottom, it has test probe (5) that a plurality of groups are used for putting through the mainboard return circuit that awaits measuring to run through perpendicularly on clamp plate (3) and scalable compression leg (6) that are used for the mainboard button that awaits measuring, the bottom surface of clamp plate (3) is provided with compression leg (4) that are used for pushing down the mainboard that awaits measuring perpendicularly.

2. The integrated motherboard FCT testing apparatus of claim 1, wherein:

the C-shaped support arm (9) comprises an open top end (9-1) and an open bottom end, and the open bottom end is a sleeve (9-2);

the transmission device (7) comprises a connecting shaft (7-1) vertically connected to the surface of the pressing plate (3), the connecting shaft (7-1) penetrates through the sleeve (9-2) and is movably connected with the lower ends of a group of bow-shaped connecting pieces (7-2) which are symmetrical to each other, the upper ends of the bow-shaped connecting pieces (7-2) are movably connected with the bottom of the handle (7-3), and the top of the handle (7-3) is movably connected with the top end (9-1) of the opening.

3. The integrated motherboard FCT testing apparatus of claim 2, wherein: the surface of the workbench (1) is provided with a group of mutually symmetrical limiting columns (10), the same end of the pressing plate (3) is sleeved with the limiting columns (10) and can move vertically and vertically relative to the limiting columns (10).

4. The integrated motherboard FCT testing apparatus of claim 1, wherein: the mainboard carrier (2) is internally provided with 4 sets of carrier grooves (2-1) with the same specification, and the corresponding carrier grooves (2-1) are respectively matched with the test probes (5), the telescopic compression columns (6) and the compression columns (4).

5. The integrated motherboard FCT testing apparatus of claim 1, wherein: the power supply device is characterized by further comprising a power switch (12) arranged on the side face of the workbench (1) and a knob (11) on the surface of the workbench (1), wherein the power switch (12) and the knob (11) are connected with a control main board installed in the cavity of the workbench (1).

6. The integrated motherboard FCT testing apparatus of claim 1, wherein: air holes (13) used for heat dissipation are further formed along any side surface of the workbench (1).