CN213302290U

CN213302290U - Mainboard FCT testing arrangement

Info

Publication number: CN213302290U
Application number: CN202022107362.4U
Authority: CN
Inventors: 汪家柱; 朱荣惠
Original assignee: Wuxi Huayang Science And Technology Co ltd
Current assignee: Wuxi Huayang Science And Technology Co ltd
Priority date: 2020-09-23
Filing date: 2020-09-23
Publication date: 2021-05-28
Anticipated expiration: 2030-09-23

Abstract

The utility model discloses a mainboard FCT testing device, which relates to the technical field of mainboard FCT testing devices, and comprises a workbench with a cavity, wherein a mainboard carrier is arranged on the surface of the workbench, and a plurality of testing probes for testing a mainboard are arranged on the inner side of the mainboard carrier; the edge one side of mainboard carrier corresponds the surface of workstation is provided with the support frame, install C shape support arm on the support frame, set up in the tucking device of mainboard carrier top passes through C shape support arm control makes vertical motion from top to bottom. The device has the advantages of simple structure, convenient use and low cost, and can effectively submit the test efficiency.

Description

Mainboard FCT testing arrangement

Technical Field

The utility model belongs to the technical field of mainboard FCT testing arrangement technique and specifically relates to a mainboard FCT testing arrangement.

Background

At present, a mainboard test fixture is not used, and a PCB is deformed and damaged in the production operation process; the mainboard test fixture is not used, the test result is unstable when the mainboard is tested, the situation of no test can occur, the output parameter value cannot meet the requirement of a technical drawing, the mainboard test fixture is not used, and the condition of damage caused by crushing of components on the PCB can be caused by workers during operation.

Therefore, a new technical solution is urgently needed to solve the above problems.

SUMMERY OF THE UTILITY MODEL

The utility model discloses to prior art's not enough, provide a mainboard FCT testing arrangement, through will await measuring the mainboard and place in the mainboard carrier, the test probe contact in the direct and mainboard carrier of examination position that awaits measuring, then contradicts the back of the examination mainboard that awaits measuring through handle control tucking device, reach the suppression and await measuring mainboard, make its bottom and probe fully contact, and then the work of the follow-up test operation of being convenient for. The device has simple structure and convenient use, and can effectively submit the test efficiency.

In order to realize the purpose of the utility model, the utility model provides a following technical scheme:

a mainboard FCT testing device comprises a workbench with a cavity, wherein a mainboard carrier is arranged on the surface of the workbench, and a plurality of testing probes for testing a mainboard are arranged on the inner side of the mainboard carrier; the edge one side of mainboard carrier corresponds the surface of workstation is provided with the support frame, install C shape support arm on the support frame, set up in the tucking device of mainboard carrier top passes through C shape support arm control makes vertical motion from top to bottom.

Preferably, the pin pressing device comprises a pressing plate matched with the mainboard carrier, a plurality of vertically downward pressing pins are arranged at the bottom, and a connecting shaft is vertically connected to the top; the upper end of the opening of the C-shaped support arm is movably connected with the upper end of the handle, and the lower end of the opening of the C-shaped support arm is provided with a sleeve; two sides of the lower end of the handle are connected with a group of bow-shaped connecting pieces which are symmetrical to each other, and the bottom ends of the bow-shaped connecting pieces are movably connected with the connecting shaft; the connecting shaft penetrates through the sleeve.

Preferably, a group of mutually symmetrical limiting columns are arranged on the surface of the workbench corresponding to the two sides of the supporting frame, and the limiting columns are sleeved on the two sides of the pressing plate and can vertically limit the movement relative to the limiting columns.

Preferably, the mainboard carrier comprises a groove for placing a mainboard to be tested, and the test probe is installed in the groove.

Preferably, the test device further comprises a power switch, a test button and an adjusting knob which are arranged on the surface of the workbench, wherein the power switch, the test button and the adjusting knob are respectively connected with a control main board arranged in the cavity of the workbench; the bottom of the test probe is connected with the control main board through an electric wire.

Preferably, air holes for heat dissipation are further formed along any side surface of the workbench.

Advantageous effects

The utility model provides a mainboard FCT testing arrangement places in the mainboard carrier through the mainboard that will await measuring, and the test probe contact in the direct and mainboard carrier of examination position that awaits measuring then contradicts the back of the examination mainboard that awaits measuring through handle control tucking device, reaches the suppression and awaits measuring mainboard, makes its bottom and probe fully contact, and then the work of the follow-up test operation of being convenient for. The device has the advantages of simple structure, convenient use and low cost, and can effectively submit the test efficiency.

Drawings

In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings needed to be used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the structures shown in the drawings without creative efforts.

Fig. 1 is a schematic structural diagram of a main board FCT testing apparatus according to the present invention;

fig. 2 is a side view of the main board FCT testing apparatus of the present invention.

Graphic notation:

1-workbench, 2-mainboard carrier, 2-1-test probe, 2-2-groove, 3-support frame, 4-C-shaped support arm, 4-1-top end, 4-2-sleeve, 5-needle pressing device, 5-1-pressing plate, 5-2-needle pressing, 5-3-connecting shaft, 5-4-bow-shaped connecting piece, 5-5-handle, 6-limit column, 7-switch, 8-test button, 9-adjusting knob and 10-air vent.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.

As shown in fig. 1 and 2, a motherboard FCT testing apparatus includes a workbench 1 with a cavity, a motherboard carrier 2 is disposed on the surface of the workbench 1, and a plurality of test probes 2-1 for testing a motherboard are mounted on the inner side of the motherboard carrier 2; follow one side of mainboard carrier 2 corresponds the surface of workstation 1 is provided with support frame 3, install C shape support arm 4 on the support frame 3, set up in the tucking device 5 of mainboard carrier 2 top passes through vertical motion about C shape support arm 4 control is.

Specifically, the pin pressing device 5 comprises a pressing plate 5-1 matched with the mainboard carrier 2, a plurality of vertically downward pressing pins 5-2 are arranged at the bottom, and a connecting shaft 5-3 is vertically connected to the top; the upper end 4-1 of the opening of the C-shaped support arm 4 is movably connected with the upper end of a handle 5-5, and the lower end is provided with a sleeve 4-2; two sides of the lower end of the handle 5-5 are connected with a group of bow-shaped connecting pieces 5-4 which are symmetrical with each other (the two bow-shaped connecting pieces 5-4 are symmetrical with each other to form a movable space for the handle 5-5 to rotate), and the bottom end of the bow-shaped connecting piece 5-4 is movably connected with the connecting shaft; the connecting shaft penetrates through the sleeve 4-2.

When the handle 5-5 is parallel to the workbench (1), the press pin 5-1 props against the back face of the mainboard to be tested, the bottom face of the mainboard to be tested is pressed and attached to the test probe 2-1, and then subsequent test work can be carried out. In the device, the mainboard carrier 2 comprises a groove 2-2 for placing a mainboard to be tested, the test probe 2-1 is arranged in the groove 2-2, and the design of the groove 2-2 is matched with the appearance of the mainboard to be tested, so that the placement of the mainboard to be tested is more convenient, and the test efficiency can be well improved.

As the optimization of the device, in order to enable the pressure plate 5-1 to be capable of keeping X, Y axial positions stable all the time in the working process and better moving in the Z axis, a group of mutually symmetrical limiting columns 6 are arranged on the surface of the workbench 1 corresponding to two sides of the supporting frame 3, and the limiting columns 6 are sleeved on two sides of the pressure plate 5-1 and can vertically limit the movement relative to the limiting columns 6.

The testing function of the device is controlled by a power switch 7, a testing button 8 and an adjusting knob 9 which are arranged on the surface of the workbench 1, wherein the power switch 7, the testing button 8 and the adjusting knob 9 are respectively connected with a control mainboard which is arranged in a cavity of the workbench 1; the bottom of the test probe 2-1 is connected with the control mainboard through an electric wire.

The purpose of power-off and power supply is realized through the power switch 7;

the test of the designated position is realized through the test button 8;

the purpose of adjusting different testing positions is achieved by adjusting the knob 9.

Because this device returns the production of heat in the test process, follows any side of workstation 1 still offers and is used for radiating bleeder vent 10 for the use of device is safer, and the life-span is more permanent.

The foregoing is only a preferred embodiment of the present invention, and it should be noted that, for those skilled in the art, a plurality of modifications and decorations can be made without departing from the principle of the present invention, and these modifications and decorations should also be regarded as the protection scope of the present invention.

Claims

1. A mainboard FCT testing arrangement which characterized in that: the test device comprises a workbench (1) with a cavity, wherein a mainboard carrier (2) is arranged on the surface of the workbench (1), and a plurality of test probes (2-1) for testing a mainboard are arranged on the inner side of the mainboard carrier (2); follow one side of mainboard carrier (2) corresponds the surface of workstation (1) is provided with support frame (3), install C shape support arm (4) on support frame (3), set up in the tucking device (5) of mainboard carrier (2) top passes through vertical motion about C shape support arm (4) control is done.

2. The motherboard FCT testing apparatus of claim 1, wherein: the needle pressing device (5) comprises a pressing plate (5-1) matched with the mainboard carrier (2), a plurality of vertically downward pressing needles (5-2) are arranged at the bottom, and a connecting shaft (5-3) is vertically connected to the top;

the upper end (4-1) of the opening of the C-shaped support arm (4) is movably connected with the upper end of a handle (5-5), and the lower end is provided with a sleeve (4-2); two sides of the lower end of the handle (5-5) are connected with a group of bow-shaped connecting pieces (5-4) which are symmetrical with each other, and the bottom ends of the bow-shaped connecting pieces (5-4) are movably connected with the connecting shaft; the connecting shaft penetrates through the sleeve (4-2).

3. The motherboard FCT testing apparatus of claim 2, wherein: a group of mutually symmetrical limiting columns (6) are arranged on the surface of the workbench (1) corresponding to the two sides of the support frame (3), the limiting columns (6) are sleeved on the two sides of the pressing plate (5-1) and can move vertically and vertically relative to the limiting columns (6).

4. The motherboard FCT testing apparatus of claim 1, wherein: the mainboard carrier (2) comprises a groove (2-2) for placing a mainboard to be tested, and the test probe (2-1) is arranged in the groove (2-2).

5. The motherboard FCT testing apparatus of claim 1, wherein: the testing device is characterized by further comprising a power switch (7), a testing button (8) and an adjusting knob (9) which are arranged on the surface of the workbench (1), wherein the power switch (7), the testing button (8) and the adjusting knob (9) are respectively connected with a control main board arranged in a cavity of the workbench (1); the bottom of the test probe (2-1) is connected with the control main board through an electric wire.

6. The motherboard FCT testing apparatus of claim 1, wherein: air holes (10) used for heat dissipation are further formed along any side surface of the workbench (1).