CN115144717A - Wide diode high temperature reverse bias experimental facilities of application scope - Google Patents
Wide diode high temperature reverse bias experimental facilities of application scope Download PDFInfo
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- CN115144717A CN115144717A CN202210692346.7A CN202210692346A CN115144717A CN 115144717 A CN115144717 A CN 115144717A CN 202210692346 A CN202210692346 A CN 202210692346A CN 115144717 A CN115144717 A CN 115144717A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
- G01R31/2632—Circuits therefor for testing diodes
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K13/00—Thermometers specially adapted for specific purposes
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K7/00—Constructional details common to different types of electric apparatus
- H05K7/20—Modifications to facilitate cooling, ventilating, or heating
- H05K7/20009—Modifications to facilitate cooling, ventilating, or heating using a gaseous coolant in electronic enclosures
- H05K7/20136—Forced ventilation, e.g. by fans
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Abstract
The invention relates to the technical field of high-temperature reverse bias test equipment, in particular to diode high-temperature reverse bias test equipment with wide application range, which comprises a rack and a supporting device, wherein the rack is provided with a plurality of support devices; the frame comprises a first box body, a second box body and two cover bodies, wherein one of the first box body and the second box body is arranged on the frame, the second box body is fixedly provided with air holes, the two cover bodies are respectively and rotatably arranged on the first box body and the second box body, and a first handle is fixedly arranged on each cover body; the two supporting devices are fixedly arranged in the first box body and the second box body respectively. This application has realized increasing the high temperature through frame and strutting arrangement and has reversed inclined to one side experiment contrast example, improves test efficiency's function, and it is poor to test environment's controllability to have solved current high temperature and reversed inclined to one side experimental facilities, can't satisfy the defect that current experiment required.
Description
Technical Field
The invention relates to the technical field of high-temperature reverse bias test equipment, in particular to diode high-temperature reverse bias test equipment with a wide application range.
Background
The high temperature reverse bias test continuously provides 80% reverse voltage under high temperature (acid-washing chip, aging environment temperature is 125 deg.C; glass passivation chip, environment temperature is 150 deg.C; schottky chip environment temperature is 100 deg.C). The test samples were tested for reverse leakage current stability over a range of values for long periods of operation (48/96/168 hours). However, the existing experimental equipment is large in size, expensive in price and greatly limited in use conditions.
Therefore, chinese patent CN201721284515.4 discloses a schottky diode high-temperature reverse bias test device, which has low cost and small volume, can conveniently and quickly obtain the longest working time of a triode/diode under the conditions of bearing a set temperature and a set current, is convenient for test and use, can analyze the product performance, and improves the product reliability.
However, the controllability of the test environment is poor, and the existing experimental requirements cannot be met.
Disclosure of Invention
Therefore, it is necessary to provide a diode high-temperature reverse bias experimental apparatus with a wide application range in view of the problems in the prior art.
In order to solve the problems of the prior art, the invention adopts the technical scheme that:
a diode high-temperature reverse bias experimental device with wide application range comprises a frame and a supporting device; the frame comprises a first box body, a second box body and two cover bodies, wherein one of the first box body and the second box body is arranged on the frame, the second box body is fixedly provided with air holes, the two cover bodies are respectively and rotatably arranged on the first box body and the second box body, and a first handle is fixedly arranged on each cover body; the two supporting devices are fixedly arranged in the first box body and the second box body respectively.
Preferably, the supporting device comprises a slide rail, a slide block, a supporting assembly and a linear driving assembly; the sliding rails, the sliding blocks and the supporting components are all provided with a plurality of sliding rails which are in one-to-one correspondence, and the sliding rails are respectively and fixedly arranged in the first box body and the second box body; the sliding block is arranged on the sliding rail in a sliding manner; the supporting component is fixedly arranged on the sliding block; the linear driving assembly is fixedly arranged on the rack, and the driving end of the linear driving assembly is in transmission connection with the sliding block.
Preferably, the linear driving assembly comprises a connecting block, a rack, a rotating shaft, a rotating gear and a second handle; the two connecting blocks are respectively and fixedly connected with the two sliding blocks; the two racks are respectively and fixedly arranged on the two connecting blocks, and the rotating shaft is rotatably arranged on the rack; the rotating gear is fixedly sleeved on the rotating shaft and is in transmission connection with the two racks; the second handle is fixedly sleeved on the rotating shaft.
Preferably, the temperature control device comprises a heat dissipation assembly, and the heat dissipation assembly comprises a first mounting frame and a heat dissipation fan; the first mounting frame is fixedly arranged on the second box body; the radiator fan is equipped with a plurality ofly, and radiator fan installs on first mounting bracket.
Preferably, the temperature control device further comprises an insulation assembly, wherein the insulation assembly comprises a support plate and an insulation plate; the support plate is fixedly arranged on the rack and is positioned between the first box body and the second box body; the heat insulating board is equipped with two, and two heat insulating boards are fixed mounting respectively in the both sides of backup pad.
Preferably, the temperature control device further comprises two temperature sensors, and the two temperature sensors are fixedly mounted in the first box body and the second box body respectively.
Preferably, the support assembly comprises a first support table, a second support table and a fixed bracket; the first supporting table is fixedly arranged on the sliding block; the second support table is slidably arranged on the first support table; the fixed support is fixedly arranged at the top end of the second support platform; the supporting device further comprises a locking assembly, and the locking assembly is fixedly mounted on the first supporting platform.
Preferably, the locking assembly comprises a clamping groove, a clamping block and an elastic piece; a plurality of clamping grooves are formed in the second supporting platform at equal intervals; the clamping block is slidably arranged on the clamping groove; the two ends of the elastic part are respectively fixedly connected with the clamping block and the first supporting platform.
Preferably, the supporting device further comprises a control assembly, and the control assembly comprises a second mounting frame, a transmission roller, a second rack, a pressing block and a third rack; the second mounting frame is fixedly arranged on the first supporting platform; the driving roller is rotatably arranged on the second mounting frame; the second rack is fixedly arranged on the clamping block, and the transmission roller is in transmission connection with the second rack; the pressing block is slidably arranged on the first supporting platform; the third rack is fixed to be set up on pressing the briquetting, and the third rack is connected with the driving roller transmission.
Preferably, the rack further comprises two multifunctional slots, and the two multifunctional slots are fixedly mounted in the first box body and the second box body respectively.
Compared with the prior art, the beneficial effect of this application is:
1. this application has realized increasing the high temperature through frame and strutting arrangement and has reversed inclined to one side experiment contrast example, improves test efficiency's function, and it is poor to test environment's controllability to have solved current high temperature and reversed inclined to one side experimental facilities, can't satisfy the defect that current experiment required.
2. This application has realized supporting the function of fixed different length diodes through slide rail, slider, supporting component and linear drive subassembly, has solved different model diode sizes differently, leads to the unable adaptation overlength of strutting arrangement or the defect of the diode of short excessively.
3. This application has realized through connecting block, rack, rotation axis, swing pinion and second handle that the drive slider follows the gliding function of slide rail, has solved the technical problem that how the linear drive subassembly drives the supporting component and removes.
4. This application has realized improving the function of radiating effect in the second box through first mounting bracket and radiator fan, and it is relatively poor to have solved the radiating effect of second box, and its inside temperature differs less with the internal temperature of first box, leads to the limited defect of its measured data reference.
5. This application has realized reducing the function of heat transfer between first box and the second box through backup pad and heat insulating board, has solved in the heat in the first box can transmit the second box, leads to the obscure defect of the difference in temperature in first box and the second box.
6. This application has realized the function of the interior real-time temperature of automatic measurement first box and second box through temperature sensor, has solved the defect that needs the interior real-time temperature numerical value of manual measurement first box of operating personnel and second box.
7. This application has realized the function of adjusting diode mounting height through first brace table, second brace table, fixed bolster and locking subassembly, and it is different to have solved different model diode sizes, and the unable mounting height of adjusting of supporting component leads to its unable defect that is in the box intermediate position.
8. This application has realized the function of chucking second brace table through draw-in groove, fixture block and elastic component, has solved the defect of how fixed second brace table's of locking subassembly technical problem.
9. This application has realized that quick control locking subassembly loosens and lock dead function through second mounting bracket, driving roller, second rack, according to briquetting and third rack, when having solved the regulation second brace table position, needs operating personnel to stir the fixture block manually, makes the defect of fixture block and draw-in groove separation.
10. This application has realized the function that adapts to different model diodes such as two-pin diode, three-pin diode through multi-functional slot, has solved the diode and has had two-pin diode and three-pin diode in addition, but it can't support fixed defect through supporting component.
Drawings
FIG. 1 is a perspective view of the present application;
FIG. 2 is a top view of the present application;
FIG. 3 is a perspective view of the present application with the cover closed;
FIG. 4 is a perspective view of a second housing of the present application;
FIG. 5 is a schematic perspective exploded view of the support device of the present application;
FIG. 6 is an exploded perspective view of a second housing of the subject application;
FIG. 7 is a perspective view of the support assembly of the present application;
FIG. 8 is an exploded isometric view of the support assembly of the present application;
FIG. 9 is an enlarged partial schematic view at A of FIG. 8 of the present application;
FIG. 10 is an exploded isometric view of the control assembly of the present application;
the reference numbers in the figures are:
1-a frame; 1 a-a first box; 1 b-a second box; 1b 1-air holes; 1 c-a lid; 1c1 — a first handle; 1 d-a multifunctional slot;
2-a support device; 2 a-a slide rail; 2 b-a slide block; 2 c-a support assembly; 2c1 — a first support table; 2c 2-a second support table; 2c 3-a fixed support; 2 d-linear drive assembly; 2d 1-connecting block; 2d 2-rack; 2d 3-rotation axis; 2d 4-rotating gear; 2d 5-a second handle; 2 e-a locking assembly; 2e 1-card slot; 2e 2-fixture block; 2e 3-an elastic member; 2 f-a control component; 2f 1-a second mount; 2f 2-driving roller; 2f 3-second rack; 2f 4-pressing block; 2f 5-third rack;
3-a temperature control device; 3 a-a heat sink assembly; 3a 1-a first mounting frame; 3a 2-radiator fan; 3 b-an insulating assembly; 3b 1-a support plate; 3b 2-a heat insulation plate; 3 c-temperature sensor.
Detailed Description
For further understanding of the features and technical means of the present invention, as well as the specific objects and functions attained by the present invention, the present invention will be described in further detail with reference to the accompanying drawings and detailed description.
As shown in fig. 1-10:
a diode high-temperature reverse bias experimental device with wide application range comprises a frame 1 and a supporting device 2; the rack 1 comprises a first box body 1a, a second box body 1b and two cover bodies 1c, wherein one of the first box body 1a and the second box body 1b is installed on the rack 1, the second box body 1b is fixedly provided with air holes 1b1, the two cover bodies 1c are respectively and rotatably installed on the first box body 1a and the second box body 1b, and a first handle 1c1 is fixedly installed on the cover body 1 c; the number of the supporting devices 2 is two, and the two supporting devices 2 are respectively and fixedly installed in the first box body 1a and the second box body 1 b.
Based on the above embodiments, the technical problem to be solved by the present application is how to improve the richness of the high temperature back bias experimental data. Therefore, the high-temperature reverse-bias experiment comparison example is added by the aid of the frame 1 and the supporting device 2, and the function of improving the experiment efficiency is improved. An operator takes out two diodes respectively, then install two diodes respectively in first box 1a and the second box 1b, and support it fixedly through strutting arrangement 2, then cover lid 1c, connect electricity with it and carry out the detection experiment, do not set up the vent on the first box 1a, its inside diode operating temperature is higher, and be provided with the vent on the second box 1b, its inside diode operating temperature is lower, therefore the experimental data who obtains is abundanter, the test result more has the referential.
Further, the present application still has the drawback of different sizes of diodes, resulting in the support device 2 not being able to adapt to diodes that are too long or too short, in order to solve this problem, as shown in fig. 3-4:
the supporting device 2 comprises a slide rail 2a, a slide block 2b, a supporting component 2c and a linear driving component 2d; the slide rails 2a, the slide blocks 2b and the support components 2c are arranged in a plurality and are in one-to-one correspondence, and the slide rails 2a are respectively and fixedly arranged in the first box body 1a and the second box body 1 b; the sliding block 2b is arranged on the sliding rail 2a in a sliding manner; the supporting component 2c is fixedly arranged on the sliding block 2 b; the linear driving component 2d is fixedly arranged on the frame 1, and the driving end of the linear driving component 2d is in transmission connection with the sliding block 2 b.
Based on the above embodiments, how to improve the technical problem that the present application intends to solve. Therefore, the function of supporting and fixing diodes with different lengths is achieved through the sliding rail 2a, the sliding block 2b, the supporting component 2c and the linear driving component 2 d. An operator takes out the two diodes, then the two diodes are respectively installed in the first box body 1a and the second box body 1b, the position of the sliding block 2b is adjusted according to the length of the diodes, the operator firstly drives the sliding block 2b to move along the sliding rail 2a by the linear driving assembly 2d, the sliding block 2b drives the supporting assembly 2c to synchronously move, after the distance between the supporting assemblies 2c is adjusted, the supporting assemblies are supported and fixed by the supporting assemblies 2c, then the cover body 1c is covered, the electric connection is carried out for detection experiments, the first box body 1a is not provided with a vent, the working temperature of the internal diode is higher, the second box body 1b is provided with a vent, the working temperature of the internal diode is lower, and therefore two sets of data are obtained.
Further, in order to solve the technical problem of how the linear driving assembly 2d drives the supporting assembly 2c to move, as shown in fig. 5:
the linear driving assembly 2d comprises a connecting block 2d1, a rack 2d2, a rotating shaft 2d3, a rotating gear 2d4 and a second handle 2d5; two connecting blocks 2d1 are arranged, and the two connecting blocks 2d1 are respectively fixedly connected with the two sliding blocks 2 b; two racks 2d2 are arranged, the two racks 2d2 are respectively and fixedly arranged on the two connecting blocks 2d1, and the rotating shaft 2d3 is rotatably arranged on the rack 1; the rotating gear 2d4 is fixedly sleeved on the rotating shaft 2d3, and the rotating gear 2d4 is in transmission connection with the two racks 2d 2; the second handle 2d5 is fixedly sleeved on the rotating shaft 2d 3.
Based on the above-described embodiments, the technical problem that the present application intends to solve is how to adjust the spacing between the support members 2 c. For this reason, the present application realizes the function of driving the slider 2b to slide along the slide rail 2a through the connecting block 2d1, the rack 2d2, the rotating shaft 2d3, the rotating gear 2d4, and the second handle 2d 5. When operating personnel need adjust supporting component 2c position, rotatory second handle 2d5 earlier, second handle 2d5 drives rotation axis 2d3 rotatoryly, rotation axis 2d3 drives rotatory gear 2d4 rotatoryly, two rack 2d2 removal that rotatory gear 2d4 drive is connected rather than the transmission, rack 2d2 drives connecting block 2d1 and slider 2b and removes along slide rail 2a, slider 2b drives supporting component 2c and removes, thereby accomplish the interval between two supporting component 2c and adjust.
Further, the present application still has the defect that the heat dissipation effect of the second case 1b is poor, and the difference between the internal temperature of the second case and the internal temperature of the first case 1a is small, so that the reference of the measurement data is limited, and in order to solve the problem, as shown in fig. 1, fig. 2, fig. 4, and fig. 6:
the temperature control device 3 is further included, the temperature control device 3 comprises a heat dissipation assembly 3a, and the heat dissipation assembly 3a comprises a first mounting frame 3a1 and a heat dissipation fan 3a2; the first mounting rack 3a1 is fixedly arranged on the second box body 1 b; the plurality of heat radiation fans 3a2 are provided, and the heat radiation fans 3a2 are mounted on the first mounting frame 3a 1.
Based on the above-described embodiment, the technical problem that the present application intends to solve is how to increase the temperature difference between the internal temperatures of the first casing 1a and the second casing 1 b. For this reason, this application has realized improving the function of radiating effect in the second box 1b through first mounting bracket 3a1 and radiator fan 3a 2. The heat radiation fan 3a2 is electrically connected with the controller; after in first box 1a and the second box 1b were installed respectively to operating personnel, remove through sharp drive assembly 2d drive slider 2b, adjust supporting component 2c to suitable position, then cover lid 1c, send signal for radiator fan 3a2 through the controller after that, radiator fan 3a2 blows off the air current after receiving the signal, takes away the heat in the second box 1b, thereby improve the difference in temperature in first box 1a and the second box 1b, increase the contrast of data.
Further, the present application still has the defect that the heat in the first casing 1a can be transferred into the second casing 1b, which results in insignificant temperature difference between the first casing 1a and the second casing 1b, and in order to solve this problem, as shown in fig. 2 and fig. 6:
the temperature control device 3 also comprises an insulation assembly 3b, and the insulation assembly 3b comprises a support plate 3b1 and an insulation plate 3b2; the supporting plate 3b1 is fixedly arranged on the frame 1, and the supporting plate 3b1 is positioned between the first box body 1a and the second box body 1 b; two heat insulation plates 3b2 are arranged, and the two heat insulation plates 3b2 are respectively and fixedly arranged at two sides of the supporting plate 3b 1.
Based on the above-described embodiment, the technical problem that the present application intends to solve is how to prevent heat inside the first casing 1a from being transferred into the second casing 1 b. For this reason, the present application achieves the function of reducing the heat transfer between the first casing 1a and the second casing 1b by the support plate 3b1 and the heat insulating plate 3b 2. The heat insulation plate 3b2 is preferably made of plastic foam; because in the heat in the first box 1a can transmit the second box 1b, radiator unit 3a and bleeder vent 1b1 of installation distribute away the heat on the rethread second box 1b, lead to unable enough heat of gathering in the first box 1a, lead to the experimental data to have the limitation, backup pad 3b1 and heat insulating board 3b2 have been set up for this reason, support heat insulating board 3b2 through backup pad 3b1, and through the heat transfer between the isolated first box 1a of heat insulating board 3b2 and the second box 1b, the reliability of data has further been improved.
Further, the present application still has the drawback that the operator is required to manually measure the real-time temperature values in the first box 1a and the second box 1b, and in order to solve this problem, as shown in fig. 3:
the temperature control device 3 further comprises two temperature sensors 3c, and the two temperature sensors 3c are fixedly arranged in the first box body 1a and the second box body 1b respectively.
Based on the above embodiments, the technical problem that the present application intends to solve is how to reduce the labor intensity of the operator. For this reason, this application has realized the function of automatic measurement real-time temperature in first box 1a and the second box 1b through temperature sensor 3 c. The temperature sensor 3c is electrically connected with the controller; when an operator performs a high-temperature reverse-bias experiment, the temperature sensor 3c detects temperature data and feeds the temperature data back to the controller, and the operator learns the real-time data through the controller and records the real-time data so as to provide follow-up comparison reference.
Further, the present application still has different sizes of diodes with different models, and the supporting component 2c cannot adjust the installation height, so that it cannot be located at the middle position of the box body, in order to solve the technical problem, as shown in fig. 7 to 8:
the support assembly 2c comprises a first support table 2c1, a second support table 2c2 and a fixed bracket 2c3; the first supporting platform 2c1 is fixedly arranged on the sliding block 2 b; the second support table 2c2 is slidably mounted on the first support table 2c 1; the fixed bracket 2c3 is fixedly arranged at the top end of the second support platform 2c 2; the support device 2 further comprises a locking assembly 2e, and the locking assembly 2e is fixedly mounted on the first support table 2c 1.
Based on the above embodiments, the technical problem that the present application intends to solve is how to fix a diode more flexibly. For this reason, this application has realized the function of adjusting diode mounting height through first brace table 2c1, second brace table 2c2, fixed bolster 2c3 and locking subassembly 2 e. The operator slides the second supporting platform 2c2 to make the fixed support 2c3 be at a suitable height, and fix the second supporting platform 2c2 through the locking assembly 2e, then the operator installs the diode on the fixed support 2c3, makes it tentatively fix on the fixed support 2c3 through frictional force, then supports the diode through the first supporting platform 2c1 and the second supporting platform 2c2, carries out experimental test at last.
Further, in order to solve the technical problem of how the locking assembly 2e fixes the second supporting platform 2c2, as shown in fig. 8-9:
the locking assembly 2e comprises a clamping groove 2e1, a clamping block 2e2 and an elastic piece 2e3; a plurality of card slots 2e1 are arranged, and the card slots 2e1 are equidistantly arranged on the second support platform 2c 2; the clamping block 2e2 is slidably arranged on the clamping groove 2e 1; two ends of the elastic element 2e3 are respectively fixedly connected with the clamping block 2e2 and the first supporting platform 2c 1.
Based on the above-described embodiment, the technical problem to be solved by the present application is how to fix the second support 2c2. For this reason, this application has realized the function of chucking second brace table 2c2 through draw-in groove 2e1, fixture block 2e2 and elastic component 2e 3. Operator's upward slip second brace table 2c2, then loosen second brace table 2c2, draw-in groove 2e1 on the first brace table 2c1 of card income under the elastic action of elastic component 2e3 of fixture block 2e2, thereby fixed second brace table 2c 2's position, operator need adjust on the second brace table 2c2, slide fixture block 2e2, make fixture block 2e2 and draw-in groove 2e1 separate, slide second brace table 2c2 after that, adjust second brace table 2c2 to the assigned position after, loosen fixture block 2e2 again, prop up brace table 2c2 through the fixed second of fixture block 2e 2.
Further, this application still has when adjusting second brace table 2c2 position, needs operating personnel to stir fixture block 2e2 manually, makes the defect of fixture block 2e2 and draw-in groove 2e1 separation, in order to solve this problem, as shown in fig. 7 and fig. 10:
the supporting device 2 further comprises a control assembly 2f, and the control assembly 2f comprises a second mounting frame 2f1, a driving roller 2f2, a second rack 2f3, a pressing block 2f4 and a third rack 2f5; the second mounting rack 2f1 is fixedly mounted on the first supporting table 2c 1; the driving roller 2f2 is rotatably arranged on the second mounting frame 2f 1; the second rack 2f3 is fixedly arranged on the clamping block 2e2, and the transmission roller 2f2 is in transmission connection with the second rack 2f 3; the pressing block 2f4 is slidably mounted on the first support table 2c 1; the third rack 2f5 is fixedly arranged on the pressing block 2f4, and the third rack 2f5 is in transmission connection with the transmission roller 2f 2.
Based on the above embodiments, the technical problem that the present application intends to solve is how to further improve the operational portability of the experimental apparatus. For this reason, the present application realizes the function of rapidly controlling the locking component 2e to release and lock through the second mounting frame 2f1, the driving roller 2f2, the second rack 2f3, the pressing block 2f4 and the third rack 2f 5. When an operator needs to adjust the height of the second supporting platform 2c2, the pressing block 2f4 is pressed firstly, the pressing block 2f4 transfers the third rack 2f5 to move synchronously, the third rack 2f5 drives the transmission roller 2f2 connected with the transmission roller to rotate, the transmission roller 2f2 drives the second rack 2f3 connected with the transmission roller to move, the second rack 2f3 drives the fixture block 2e2 to slide, so that the fixture block 2e2 is separated from the clamping groove 2e1, then the second supporting platform 2c2 slides, after the second supporting platform 2c2 is adjusted, the pressing block 2f4 is loosened, the fixture block 2e2 is clamped into the clamping groove 2e1 under the elastic force of the elastic piece 2e3, and the position of the second supporting platform 2c2 is fixed.
Further, the present application still has the disadvantage that the diode, and also the two-pin diode and the three-pin diode, cannot be supported and fixed by the supporting component 2c, and in order to solve this problem, as shown in fig. 2:
the rack 1 further comprises two multifunctional slots 1d, and the two multifunctional slots 1d are respectively and fixedly installed in the first box body 1a and the second box body 1 b.
Based on the above embodiments, the technical problem that the present application intends to solve is how to further expand the application range of the experimental device. Therefore, the multifunctional socket 1d is used for realizing the function of adapting to diodes with different types such as a two-pin diode and a three-pin diode. Because the diodes with different models have different shapes, the multifunctional slot 1d is arranged, and when the diodes with special models are tested, the multifunctional slot 1d is installed and tested.
The above examples, which are intended to represent only one or more embodiments of the present invention, are described in greater detail and with greater particularity, and are not to be construed as limiting the scope of the invention. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the inventive concept, which falls within the scope of the present invention. Therefore, the protection scope of the present patent should be subject to the appended claims.
Claims (10)
1. A diode high-temperature reverse bias experimental device with wide application range is characterized by comprising a rack (1) and a supporting device (2);
the rack (1) comprises a first box body (1 a), a second box body (1 b) and cover bodies (1 c), one of the first box body (1 a) and the second box body (1 b) is installed on the rack (1), the second box body (1 b) is fixedly provided with air holes (1 b 1), two cover bodies (1 c) are arranged, the two cover bodies (1 c) are respectively and rotatably installed on the first box body (1 a) and the second box body (1 b), and a first handle (1 c 1) is fixedly installed on each cover body (1 c);
the two supporting devices (2) are arranged, and the two supporting devices (2) are fixedly arranged in the first box body (1 a) and the second box body (1 b) respectively.
2. The wide-application-range diode high-temperature reverse bias experimental equipment is characterized in that the supporting device (2) comprises a sliding rail (2 a), a sliding block (2 b), a supporting assembly (2 c) and a linear driving assembly (2 d);
the sliding rails (2 a), the sliding blocks (2 b) and the supporting components (2 c) are arranged in a plurality of corresponding one-to-one correspondence, and the sliding rails (2 a) are fixedly arranged in the first box body (1 a) and the second box body (1 b) respectively;
the sliding block (2 b) is arranged on the sliding rail (2 a) in a sliding way;
the supporting component (2 c) is fixedly arranged on the sliding block (2 b);
the linear driving assembly (2 d) is fixedly installed on the rack (1), and the driving end of the linear driving assembly (2 d) is in transmission connection with the sliding block (2 b).
3. The wide-application-range diode high-temperature reverse bias experimental equipment is characterized in that the linear driving assembly (2 d) comprises a connecting block (2 d 1), a rack (2 d 2), a rotating shaft (2 d 3), a rotating gear (2 d 4) and a second handle (2 d 5);
two connecting blocks (2 d 1) are arranged, and the two connecting blocks (2 d 1) are respectively and fixedly connected with the two sliding blocks (2 b);
two racks (2 d 2) are arranged, the two racks (2 d 2) are respectively and fixedly arranged on the two connecting blocks (2 d 1),
the rotating shaft (2 d 3) is rotatably arranged on the frame (1);
the rotating gear (2 d 4) is fixedly sleeved on the rotating shaft (2 d 3), and the rotating gear (2 d 4) is in transmission connection with the two racks (2 d 2);
the second handle (2 d 5) is fixedly sleeved on the rotating shaft (2 d 3).
4. The wide-application-range diode high-temperature reverse bias experimental equipment as claimed in claim 1, further comprising a temperature control device (3), wherein the temperature control device (3) comprises a heat dissipation assembly (3 a), and the heat dissipation assembly (3 a) comprises a first mounting frame (3 a 1) and a heat dissipation fan (3 a 2);
the first mounting rack (3 a 1) is fixedly mounted on the second box body (1 b);
the heat radiation fans (3 a 2) are arranged in a plurality, and the heat radiation fans (3 a 2) are installed on the first installation frame (3 a 1).
5. The wide-application-range diode high-temperature reverse bias experimental equipment is characterized in that the temperature control device (3) further comprises a heat insulation assembly (3 b), and the heat insulation assembly (3 b) comprises a supporting plate (3 b 1) and a heat insulation plate (3 b 2);
the supporting plate (3 b 1) is fixedly arranged on the rack (1), and the supporting plate (3 b 1) is positioned between the first box body (1 a) and the second box body (1 b);
two heat insulation plates (3 b 2) are arranged, and the two heat insulation plates (3 b 2) are respectively and fixedly arranged at two sides of the supporting plate (3 b 1).
6. The wide-application-range diode high-temperature reverse bias experimental equipment as claimed in claim 4, wherein the temperature control device (3) further comprises two temperature sensors (3 c), and the two temperature sensors (3 c) are fixedly installed in the first box body (1 a) and the second box body (1 b) respectively.
7. The wide-application-range diode high-temperature reverse-bias experimental equipment as claimed in claim 2, wherein the support assembly (2 c) comprises a first support table (2 c 1), a second support table (2 c 2) and a fixed support (2 c 3);
the first supporting platform (2 c 1) is fixedly arranged on the sliding block (2 b);
the second supporting platform (2 c 2) is slidably arranged on the first supporting platform (2 c 1);
the fixed support (2 c 3) is fixedly arranged at the top end of the second support platform (2 c 2);
the supporting device (2) further comprises a locking assembly (2 e), and the locking assembly (2 e) is fixedly mounted on the first supporting platform (2 c 1).
8. The wide-application-range diode high-temperature reverse bias experimental equipment as claimed in claim 7, wherein the locking assembly (2 e) comprises a clamping groove (2 e 1), a clamping block (2 e 2) and an elastic piece (2 e 3);
a plurality of clamping grooves (2 e 1) are arranged, and the plurality of clamping grooves (2 e 1) are arranged on the second supporting platform (2 c 2) at equal intervals;
the clamping block (2 e 2) is slidably arranged on the clamping groove (2 e 1);
two ends of the elastic piece (2 e 3) are respectively fixedly connected with the clamping block (2 e 2) and the first supporting platform (2 c 1).
9. The wide-application-range diode high-temperature reverse bias experimental equipment as claimed in claim 8, wherein the supporting device (2) further comprises a control assembly (2 f), and the control assembly (2 f) comprises a second mounting rack (2 f 1), a driving roller (2 f 2), a second rack (2 f 3), a pressing block (2 f 4) and a third rack (2 f 5);
the second mounting rack (2 f 1) is fixedly arranged on the first supporting platform (2 c 1);
the driving roller (2 f 2) is rotatably arranged on the second mounting frame (2 f 1);
the second rack (2 f 3) is fixedly arranged on the clamping block (2 e 2), and the transmission roller (2 f 2) is in transmission connection with the second rack (2 f 3);
the pressing block (2 f 4) is slidably mounted on the first supporting table (2 c 1);
the third rack (2 f 5) is fixedly arranged on the pressing block (2 f 4), and the third rack (2 f 5) is in transmission connection with the transmission roller (2 f 2).
10. The wide-application-range diode high-temperature reverse bias experimental equipment is characterized in that the rack (1) further comprises two multifunctional slots (1 d), and the two multifunctional slots (1 d) are fixedly installed in the first box body (1 a) and the second box body (1 b) respectively.
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| Application Number | Priority Date | Filing Date | Title |
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| CN202210692346.7A CN115144717B (en) | 2022-06-17 | 2022-06-17 | Wide-application-range diode high-temperature reverse bias experimental equipment |
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| CN115144717B CN115144717B (en) | 2023-05-02 |
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| CN115144717B (en) | 2023-05-02 |
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