CN115144717B - Wide-application-range diode high-temperature reverse bias experimental equipment - Google Patents
Wide-application-range diode high-temperature reverse bias experimental equipment Download PDFInfo
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- CN115144717B CN115144717B CN202210692346.7A CN202210692346A CN115144717B CN 115144717 B CN115144717 B CN 115144717B CN 202210692346 A CN202210692346 A CN 202210692346A CN 115144717 B CN115144717 B CN 115144717B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
- G01R31/2632—Circuits therefor for testing diodes
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K13/00—Thermometers specially adapted for specific purposes
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K7/00—Constructional details common to different types of electric apparatus
- H05K7/20—Modifications to facilitate cooling, ventilating, or heating
- H05K7/20009—Modifications to facilitate cooling, ventilating, or heating using a gaseous coolant in electronic enclosures
- H05K7/20136—Forced ventilation, e.g. by fans
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
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Abstract
The invention relates to the technical field of high-temperature reverse bias test equipment, in particular to diode high-temperature reverse bias test equipment with wide application range, which comprises a rack and a supporting device; the frame comprises a first box body, a second box body and a cover body, wherein the first box body and the second box body are arranged on the frame, air holes are fixedly formed in the second box body, two cover bodies are arranged, the two cover bodies are respectively rotatably arranged on the first box body and the second box body, and a first handle is fixedly arranged on the cover body; the two supporting devices are respectively and fixedly arranged in the first box body and the second box body. The high-temperature reverse bias experiment comparison example is increased through the frame and the supporting device, the function of improving the test efficiency is achieved, and the defect that the existing high-temperature reverse bias experiment equipment is poor in controllability of the test environment and cannot meet the existing experiment requirements is overcome.
Description
Technical Field
The invention relates to the technical field of high-temperature reverse bias test equipment, in particular to diode high-temperature reverse bias test equipment with a wide application range.
Background
The high temperature reverse bias experiment is to continuously provide 80% of reverse voltage under the high temperature condition (the temperature of the acid washing chip and the aging environment is 125 ℃, the temperature of the glass passivation chip and the Schottky chip is 100 ℃). An experiment was performed to test whether the reverse leakage current of the test sample was stable over a range of values under prolonged (48/96/168 hours) operation. However, the existing experimental equipment is huge in volume and high in price, and the use conditions are greatly limited.
Therefore, chinese patent CN201721284515.4 discloses a schottky diode high-temperature reverse bias test device, which has low cost and small volume, and can conveniently and rapidly learn the longest working time of a triode/diode under the conditions of bearing a set temperature and a set current, thereby facilitating test use, analyzing product performance and improving product reliability.
However, the control of the test environment is poor, and the existing experimental requirements cannot be met.
Disclosure of Invention
Based on the above, it is necessary to provide a diode high-temperature reverse bias experimental device with a wide application range, aiming at the problems of the prior art.
In order to solve the problems in the prior art, the invention adopts the following technical scheme:
the diode high-temperature reverse bias experimental equipment with wide application range comprises a rack and a supporting device; the frame comprises a first box body, a second box body and a cover body, wherein the first box body and the second box body are arranged on the frame, air holes are fixedly formed in the second box body, two cover bodies are arranged, the two cover bodies are respectively rotatably arranged on the first box body and the second box body, and a first handle is fixedly arranged on the cover body; the two supporting devices are respectively and fixedly arranged in the first box body and the second box body.
Preferably, the supporting device comprises a sliding rail, a sliding block, a supporting component and a linear driving component; the sliding rails, the sliding blocks and the supporting components are all provided with a plurality of sliding rails which are in one-to-one correspondence, and the sliding rails are respectively and fixedly arranged in the first box body and the second box body; the sliding block is arranged on the sliding rail in a sliding way; the support component is fixedly arranged on the sliding block; the linear driving assembly is fixedly installed on the frame, and the driving end of the linear driving assembly is in transmission connection with the sliding block.
Preferably, the linear driving assembly comprises a connecting block, a rack, a rotating shaft, a rotating gear and a second handle; the two connecting blocks are respectively fixedly connected with the two sliding blocks; the two racks are respectively fixedly arranged on the two connecting blocks, and the rotating shaft is rotatably arranged on the frame; the rotary gear is fixedly sleeved on the rotary shaft and is in transmission connection with the two racks; the second handle is fixedly sleeved on the rotating shaft.
Preferably, the device also comprises a temperature control device, wherein the temperature control device comprises a heat dissipation assembly, and the heat dissipation assembly comprises a first mounting frame and a heat dissipation fan; the first mounting frame is fixedly arranged on the second box body; the radiator fan is provided with a plurality of radiator fans which are arranged on the first installation frame.
Preferably, the temperature control device further comprises a heat insulation assembly, wherein the heat insulation assembly comprises a support plate and a heat insulation plate; the supporting plate is fixedly arranged on the frame and is positioned between the first box body and the second box body; the two heat insulating boards are respectively and fixedly arranged on the two sides of the supporting board.
Preferably, the temperature control device further comprises two temperature sensors, and the two temperature sensors are respectively and fixedly arranged in the first box body and the second box body.
Preferably, the support assembly comprises a first support table, a second support table and a fixed bracket; the first supporting table is fixedly arranged on the sliding block; the second supporting table is slidably arranged on the first supporting table; the fixed bracket is fixedly arranged at the top end of the second supporting table; the supporting device further comprises a locking component which is fixedly arranged on the first supporting table.
Preferably, the locking component comprises a clamping groove, a clamping block and an elastic piece; the clamping grooves are arranged in a plurality of ways and are equidistantly arranged on the second supporting table; the clamping block is slidably arranged on the clamping groove; the two ends of the elastic piece are fixedly connected with the clamping block and the first supporting table respectively.
Preferably, the supporting device further comprises a control assembly, wherein the control assembly comprises a second mounting frame, a driving roller, a second rack, a pressing block and a third rack; the second mounting frame is fixedly arranged on the first supporting table; the driving roller is rotatably arranged on the second mounting frame; the second rack is fixedly arranged on the clamping block, and the driving roller is in driving connection with the second rack; the pressing block is slidably arranged on the first supporting table; the third rack is fixedly arranged on the pressing block and is in transmission connection with the driving roller.
Preferably, the rack further comprises two multifunctional slots, and the two multifunctional slots are respectively and fixedly arranged in the first box body and the second box body.
Compared with the prior art, the beneficial effects of this application are:
1. the high-temperature reverse bias experiment comparison example is increased through the frame and the supporting device, the function of improving the test efficiency is achieved, and the defect that the existing high-temperature reverse bias experiment equipment is poor in controllability of the test environment and cannot meet the existing experiment requirements is overcome.
2. This application has realized the function of supporting fixed different length diodes through slide rail, slider, supporting component and linear drive subassembly, has solved different model diode size, leads to the defect that strutting arrangement can't adapt to overlength or too short diode.
3. The utility model discloses a drive slider has been realized along the gliding function of slide rail through connecting block, rack, rotation axis, rotary gear and second handle, has solved the technical problem of how the linear drive subassembly drive supporting component removal.
4. This application has realized improving the function of radiating effect in the second box through first mounting bracket and radiator fan, has solved the radiating effect of second box relatively poor, and its inside temperature is less with the temperature phase difference in the first box, leads to its limited defect of measurement data referential nature.
5. This application has realized reducing the function of heat transfer between first box and the second box through backup pad and heat insulating board, has solved in the heat in the first box can transfer the second box, leads to the unobvious defect of difference in temperature in first box and the second box.
6. The function of real-time temperature in first box of automatic measurement and the second box has been realized through temperature sensor to this application, has solved the defect that needs the manual real-time temperature numerical value of measuring in first box and the second box of operating personnel.
7. This application has realized adjusting diode mounting height's function through first brace table, second brace table, fixed bolster and locking subassembly, has solved different model diode size differences, and the unable adjustment mounting height of supporting component leads to its defect that can't be in box intermediate position.
8. The clamping device has the advantages that the clamping function of the second supporting table is achieved through the clamping groove, the clamping block and the elastic piece, and the defect of how the locking assembly fixes the second supporting table is overcome.
9. The application has realized the function of quick control locking subassembly unclamping and locking through second mounting bracket, driving roller, second rack, press briquetting and third rack, has solved when adjusting the second brace table position, needs the manual fixture block of stirring of operating personnel, makes fixture block and draw-in groove separation's defect.
10. The multifunctional slot has the advantages that the multifunctional slot is used for realizing the functions of diodes of different types such as two-leg diodes and three-leg diodes, and the defect that the diodes are also two-leg diodes and three-leg diodes but cannot be supported and fixed through the supporting component is overcome.
Drawings
FIG. 1 is a schematic perspective view of the present application;
FIG. 2 is a top view of the present application;
FIG. 3 is a schematic perspective view of the lid of the present application after closing;
FIG. 4 is a schematic perspective view of a second housing of the present application;
FIG. 5 is an exploded perspective view of the support device of the present application;
FIG. 6 is an exploded perspective view of a second housing of the present application;
FIG. 7 is a schematic perspective view of the support assembly of the present application;
FIG. 8 is an exploded perspective view of the support assembly of the present application;
FIG. 9 is an enlarged partial schematic view of FIG. 8A of the present application;
FIG. 10 is an exploded perspective view of the control assembly of the present application;
the reference numerals in the figures are:
1-a frame; 1 a-a first box; 1 b-a second box; 1b 1-ventilation holes; 1 c-a cover; 1c 1-a first handle; 1 d-a multifunctional slot;
2-supporting means; 2 a-a slide rail; 2 b-a slider; 2 c-a support assembly; 2c 1-a first support table; 2c 2-a second support table; 2c 3-fixing the bracket; 2 d-linear drive assembly; 2d 1-connecting blocks; 2d 2-rack; 2d 3-rotation axis; 2d 4-rotating gears; 2d 5-a second handle; 2 e-locking assembly; 2e 1-a clamping groove; 2e 2-clamping blocks; 2e 3-elastic member; 2 f-a control assembly; 2f 1-a second mounting frame; 2f 2-driving roller; 2f 3-a second rack; 2f 4-pressing the block; 2f 5-third rack;
3-a temperature control device; 3 a-a heat sink assembly; 3a 1-a first mount; 3a 2-a heat radiation fan; 3 b-an insulation assembly; 3b 1-a support plate; 3b 2-insulating panels; 3 c-temperature sensor.
Detailed Description
The invention will be further described in detail with reference to the drawings and the detailed description below, in order to further understand the features and technical means of the invention and the specific objects and functions achieved.
As shown in fig. 1-10:
the diode high-temperature reverse bias experimental equipment with wide application range comprises a frame 1 and a supporting device 2; the frame 1 comprises a first box body 1a, a second box body 1b and a cover body 1c, wherein the first box body 1a and the second box body 1b are arranged on the frame 1, ventilation holes 1b1 are fixedly formed in the second box body 1b, two cover bodies 1c are arranged, the two cover bodies 1c are respectively rotatably arranged on the first box body 1a and the second box body 1b, and a first handle 1c1 is fixedly arranged on the cover body 1 c; the two supporting devices 2 are arranged, and the two supporting devices 2 are respectively and fixedly arranged in the first box body 1a and the second box body 1 b.
Based on the above embodiments, the technical problem to be solved in the present application is how to improve the richness of the high temperature reverse bias experimental data. Therefore, the high-temperature reverse bias experiment comparison example is added through the frame 1 and the supporting device 2, and the test efficiency is improved. The operating personnel takes out two diodes respectively, then installs two diodes respectively in first box 1a and the second box 1b to support it fixedly through strutting arrangement 2, then cover lid 1c, then connect the electric test with it, do not set up the vent on the first box 1a, its inside diode operating temperature is higher, and be provided with the vent on the second box 1b, its inside diode operating temperature is lower, therefore the experimental data who obtains is richer, and the test result is more with the referential nature.
Further, the present application still has the defect that the sizes of the diodes of different models are different, so that the supporting device 2 cannot adapt to the diode with too long or too short, and in order to solve this problem, as shown in fig. 3-4:
the supporting device 2 comprises a sliding rail 2a, a sliding block 2b, a supporting component 2c and a linear driving component 2d; the sliding rails 2a, the sliding blocks 2b and the supporting components 2c are respectively provided with a plurality of sliding rails 2a and a plurality of sliding blocks 2b, which are in one-to-one correspondence, and the sliding rails 2a are respectively fixedly arranged in the first box body 1a and the second box body 1 b; the sliding block 2b is slidably arranged on the sliding rail 2 a; the support component 2c is fixedly arranged on the sliding block 2 b; the linear driving assembly 2d is fixedly arranged on the frame 1, and the driving end of the linear driving assembly 2d is in transmission connection with the sliding block 2 b.
Based on the above embodiments, the technical problem to be solved by the present application is how to improve. For this purpose, the present application realizes the function of supporting and fixing diodes of different lengths through the slide rail 2a, the slide block 2b, the support assembly 2c and the linear driving assembly 2 d. The operating personnel takes out two diodes, then installs two diodes respectively in first box 1a and the second box 1b, adjusts the position of slider 2b according to the length of diode, and operating personnel is straight line drive assembly 2d drive slider 2b and removes along slide rail 2a earlier, and slider 2b drives supporting component 2c and removes in step, and after the interval adjustment between the supporting component 2c was accomplished, supports it fixedly through supporting component 2c, then covers lid 1c, then connects it and carries out the test, does not set up the vent on the first box 1a, and its inside diode operating temperature is higher, and is provided with the vent on the second box 1b, and its inside diode operating temperature is lower to obtain two sets of data.
Further, in order to solve the technical problem of how to drive the support assembly 2c to move by the linear driving assembly 2d, as shown in fig. 5:
the linear driving assembly 2d includes a connection block 2d1, a rack 2d2, a rotation shaft 2d3, a rotation gear 2d4, and a second handle 2d5; the two connecting blocks 2d1 are arranged, and the two connecting blocks 2d1 are fixedly connected with the two sliding blocks 2b respectively; the two racks 2d2 are arranged, the two racks 2d2 are respectively and fixedly arranged on the two connecting blocks 2d1, and the rotating shaft 2d3 is rotatably arranged on the frame 1; the rotary gear 2d4 is fixedly sleeved on the rotary shaft 2d3, and the rotary gear 2d4 is in transmission connection with the two racks 2d 2; the second handle 2d5 is fixedly sleeved on the rotating shaft 2d 3.
Based on the above embodiments, the technical problem to be solved by the present application is how to adjust the spacing between the support members 2 c. For this purpose, the present application realizes the function of driving the slider 2b to slide along the slide rail 2a through the connection block 2d1, the rack 2d2, the rotation shaft 2d3, the rotation gear 2d4, and the second handle 2d 5. When the operator needs to adjust the position of the support component 2c, the second handle 2d5 is rotated firstly, the second handle 2d5 drives the rotating shaft 2d3 to rotate, the rotating shaft 2d3 drives the rotating gear 2d4 to rotate, the rotating gear 2d4 drives the two racks 2d2 connected with the rotating gear to move, the racks 2d2 drive the connecting block 2d1 and the sliding block 2b to move along the sliding rail 2a, and the sliding block 2b drives the support component 2c to move, so that the distance between the two support components 2c is adjusted.
Further, the application still has the defect that the heat dissipation effect of the second box 1b is poor, and the difference between the internal temperature of the second box 1b and the internal temperature of the first box 1a is small, so that the reference of the measurement data is limited, and in order to solve the problem, as shown in fig. 1, 2, 4 and 6:
the temperature control device 3 is further included, the temperature control device 3 comprises a heat dissipation assembly 3a, and the heat dissipation assembly 3a comprises a first mounting frame 3a1 and a heat dissipation fan 3a2; the first mounting frame 3a1 is fixedly mounted on the second box body 1 b; the heat radiation fans 3a2 are provided in plurality, and the heat radiation fans 3a2 are mounted on the first mounting frame 3a 1.
Based on the above-described embodiments, the technical problem to be solved by the present application is how to increase the temperature difference between the internal temperatures of the first casing 1a and the second casing 1 b. For this reason, the present application realizes a function of improving the heat radiation effect in the second casing 1b by the first mounting bracket 3a1 and the heat radiation fan 3a 2. The heat radiation fan 3a2 is electrically connected with the controller; after two diodes are respectively installed in the first box body 1a and the second box body 1b by an operator, the sliding block 2b is driven to move through the linear driving component 2d, the supporting component 2c is adjusted to a proper position, then the cover body 1c is covered, then a signal is sent to the cooling fan 3a2 through the controller, the cooling fan 3a2 blows out air flow after receiving the signal, heat in the second box body 1b is taken away, and therefore the temperature difference between the first box body 1a and the second box body 1b is improved, and the data contrast is increased.
Further, the present application still has the defect that heat in the first case 1a is transferred to the second case 1b, resulting in an insignificant temperature difference between the first case 1a and the second case 1b, and in order to solve this problem, as shown in fig. 2 and 6:
the temperature control device 3 further comprises a heat insulation assembly 3b, wherein the heat insulation assembly 3b comprises a support plate 3b1 and a heat insulation plate 3b2; the supporting plate 3b1 is fixedly arranged on the frame 1, and the supporting plate 3b1 is positioned between the first box body 1a and the second box body 1 b; the two heat insulation plates 3b2 are arranged, and the two heat insulation plates 3b2 are respectively and fixedly arranged on two sides of the supporting plate 3b 1.
Based on the above-described embodiments, the technical problem to be solved by the present application is how to prevent heat in the first casing 1a from being transferred into the second casing 1 b. For this reason, the present application realizes a function of reducing heat transfer between the first casing 1a and the second casing 1b by the support plate 3b1 and the heat insulating plate 3b 2. The heat insulation plate 3b2 is preferably made of plastic foam; because the heat in the first box 1a can be transferred into the second box 1b, the heat is dissipated through the heat dissipation component 3a and the air holes 1b1 which are arranged on the second box 1b, so that the first box 1a cannot gather enough heat, experimental data are limited, the support plate 3b1 and the heat insulation plate 3b2 are arranged, the heat insulation plate 3b2 is supported through the support plate 3b1, and the heat transfer between the first box 1a and the second box 1b is isolated through the heat insulation plate 3b2, so that the reliability of the data is further improved.
Further, the present application still has the disadvantage of requiring the operator to manually measure the real-time temperature values in the first and second tanks 1a and 1b, as shown in fig. 3 for solving the problem:
the temperature control device 3 further comprises two temperature sensors 3c, wherein the two temperature sensors 3c are fixedly arranged in the first box body 1a and the second box body 1b respectively.
Based on the above embodiments, the technical problem to be solved by the present application is how to reduce the labor intensity of operators. For this purpose, the present application realizes a function of automatically measuring the real-time temperature in the first casing 1a and the second casing 1b by the temperature sensor 3 c. The temperature sensor 3c is electrically connected with the controller; when an operator performs a high-temperature reverse bias experiment, the temperature sensor 3c detects temperature data and feeds the temperature data back to the controller, and the operator obtains real-time data through the controller and records the real-time data for subsequent comparison and reference.
Further, this application still has different model diode sizes, and the unable adjustment mounting height of supporting component 2c, leads to it unable being in box intermediate position, for solving this technical problem, as shown in fig. 7-8:
the support assembly 2c includes a first support table 2c1, a second support table 2c2, and a fixing bracket 2c3; the first support table 2c1 is fixedly mounted on the slider 2 b; the second support table 2c2 is slidably mounted on the first support table 2c 1; the fixed bracket 2c3 is fixedly arranged at the top end of the second supporting table 2c 2; the support device 2 further comprises a locking assembly 2e, the locking assembly 2e being fixedly mounted on the first support table 2c 1.
Based on the above embodiments, the technical problem to be solved by the present application is how to fix the diode more flexibly. For this reason, the present application realizes a function of adjusting the mounting height of the diode through the first support table 2c1, the second support table 2c2, the fixing bracket 2c3, and the locking assembly 2 e. The operator slides the second support table 2c2 so that the fixing support 2c3 is at a proper height, and fixes the second support table 2c2 through the locking assembly 2e, then the operator mounts the diode on the fixing support 2c3, primarily fixes the diode on the fixing support 2c3 through friction, then supports the diode through the first support table 2c1 and the second support table 2c2, and finally performs an experimental test.
Further, in order to solve the technical problem of how to fix the second support table 2c2 by the locking assembly 2e, as shown in fig. 8-9:
the locking component 2e comprises a clamping groove 2e1, a clamping block 2e2 and an elastic piece 2e3; the clamping grooves 2e1 are arranged in a plurality, and the clamping grooves 2e1 are equidistantly arranged on the second supporting table 2c 2; the clamping block 2e2 is slidably arranged on the clamping groove 2e 1; the two ends of the elastic piece 2e3 are respectively fixedly connected with the clamping block 2e2 and the first supporting table 2c 1.
Based on the above-described embodiment, the technical problem to be solved by the present application is how to fix the second support table 2c2. For this purpose, the present application realizes the function of clamping the second support table 2c2 through the clamping groove 2e1, the clamping block 2e2 and the elastic member 2e 3. The operator slides the second supporting table 2c2 upwards, then loosens the second supporting table 2c2, the clamping block 2e2 is clamped into the clamping groove 2e1 on the first supporting table 2c1 under the action of the elastic force of the elastic piece 2e3, so that the position of the second supporting table 2c2 is fixed, the operator needs to adjust the second supporting table 2c2, slides the clamping block 2e2, separates the clamping block 2e2 from the clamping groove 2e1, slides the second supporting table 2c2, adjusts the second supporting table 2c2 to a specified position, loosens the clamping block 2e2 again, and fixes the second supporting table 2c2 through the clamping block 2e 2.
Further, when the second support table 2c2 is still adjusted, the operator needs to manually toggle the clamping block 2e2, so that the clamping block 2e2 is separated from the clamping groove 2e1, and in order to solve this problem, as shown in fig. 7 and 10:
the supporting device 2 further comprises a control assembly 2f, wherein the control assembly 2f comprises a second mounting frame 2f1, a driving roller 2f2, a second rack 2f3, a pressing block 2f4 and a third rack 2f5; the second mounting frame 2f1 is fixedly mounted on the first support table 2c 1; the driving roller 2f2 is rotatably mounted on the second mounting frame 2f 1; the second rack 2f3 is fixedly arranged on the clamping block 2e2, and the driving roller 2f2 is in driving connection with the second rack 2f 3; the pressing block 2f4 is slidably mounted on the first support table 2c 1; the third rack 2f5 is fixedly arranged on the pressing block 2f4, and the third rack 2f5 is in transmission connection with the transmission roller 2f 2.
Based on the above embodiments, the technical problem to be solved by the present application is how to further improve the operation portability of the experimental apparatus. For this reason, the present application realizes the function of rapidly controlling the release and locking of the locking assembly 2e through the second mounting bracket 2f1, the driving roller 2f2, the second rack 2f3, the pressing block 2f4 and the third rack 2f 5. When the operator needs to adjust the height of the second supporting table 2c2, the pressing block 2f4 is pressed firstly, the pressing block 2f4 adjusts the third rack 2f5 to synchronously move, the third rack 2f5 drives the driving roller 2f2 in transmission connection with the third rack 2f to rotate, the driving roller 2f2 drives the second rack 2f3 in transmission connection with the driving roller 2f to move, the second rack 2f3 drives the clamping block 2e2 to slide, so that the clamping block 2e2 is separated from the clamping groove 2e1, then the second supporting table 2c2 is slid, after the second supporting table 2c2 is adjusted, the pressing block 2f4 is loosened, and the clamping block 2e2 is clamped into the clamping groove 2e1 under the elastic force drive of the elastic piece 2e3, so that the position of the second supporting table 2c2 is fixed.
Further, the present application still has the drawbacks of diodes, two-pin diodes and three-pin diodes, but they cannot be supported and fixed by the support component 2c, so as to solve this problem, as shown in fig. 2:
the rack 1 further comprises two multifunctional slots 1d, wherein the two multifunctional slots 1d are respectively and fixedly arranged in the first box body 1a and the second box body 1 b.
Based on the above embodiments, the technical problem to be solved by the present application is how to further expand the application range of the experimental apparatus. Therefore, the multifunctional slot 1d has the function of adapting to diodes of different types such as two-pin diodes, three-pin diodes and the like. Since diodes of different types have different shapes, a multifunctional socket 1d is provided for this purpose, and when a diode of a specific type is tested, it is mounted through the multifunctional socket 1d and tested.
The foregoing examples merely illustrate one or more embodiments of the invention, which are described in greater detail and are not to be construed as limiting the scope of the invention. It should be noted that it will be apparent to those skilled in the art that several variations and modifications can be made without departing from the spirit of the invention, which are all within the scope of the invention. Accordingly, the scope of protection of the present invention is to be determined by the appended claims.
Claims (6)
1. The diode high-temperature reverse bias experimental equipment with wide application range is characterized by comprising a rack (1) and a supporting device (2);
the frame (1) comprises a first box body (1 a), a second box body (1 b) and cover bodies (1 c), wherein the first box body (1 a) and the second box body (1 b) are arranged on the frame (1), ventilation holes (1 b 1) are fixedly formed in the second box body (1 b), two cover bodies (1 c) are arranged, the two cover bodies (1 c) are respectively rotatably arranged on the first box body (1 a) and the second box body (1 b), and a first handle (1 c 1) is fixedly arranged on the cover body (1 c);
the two supporting devices (2) are arranged, and the two supporting devices (2) are respectively and fixedly arranged in the first box body (1 a) and the second box body (1 b);
the supporting device (2) comprises a sliding rail (2 a), a sliding block (2 b), a supporting component (2 c) and a linear driving component (2 d);
the sliding rails (2 a), the sliding blocks (2 b) and the supporting components (2 c) are all provided with a plurality of sliding rails (2 a) which are in one-to-one correspondence, and the sliding rails (2 a) are respectively fixedly arranged in the first box body (1 a) and the second box body (1 b);
the sliding block (2 b) is slidably arranged on the sliding rail (2 a);
the support component (2 c) is fixedly arranged on the sliding block (2 b);
the linear driving assembly (2 d) is fixedly arranged on the frame (1), and the driving end of the linear driving assembly (2 d) is in transmission connection with the sliding block (2 b);
the support assembly (2 c) comprises a first support table (2 c 1), a second support table (2 c 2) and a fixed bracket (2 c 3);
the first supporting table (2 c 1) is fixedly arranged on the sliding block (2 b);
the second supporting table (2 c 2) is slidably mounted on the first supporting table (2 c 1);
the fixed bracket (2 c 3) is fixedly arranged at the top end of the second supporting table (2 c 2);
the supporting device (2) further comprises a locking assembly (2 e), and the locking assembly (2 e) is fixedly arranged on the first supporting table (2 c 1);
the locking component (2 e) comprises a clamping groove (2 e 1), a clamping block (2 e 2) and an elastic piece (2 e 3);
the clamping grooves (2 e 1) are arranged in a plurality, and the clamping grooves (2 e 1) are equidistantly arranged on the second supporting table (2 c 2);
the clamping block (2 e 2) is slidably arranged on the clamping groove (2 e 1);
two ends of the elastic piece (2 e 3) are fixedly connected with the clamping block (2 e 2) and the first supporting table (2 c 1) respectively;
the supporting device (2) further comprises a control assembly (2 f), wherein the control assembly (2 f) comprises a second mounting frame (2 f 1), a driving roller (2 f 2), a second rack (2 f 3), a pressing block (2 f 4) and a third rack (2 f 5);
the second mounting frame (2 f 1) is fixedly arranged on the first supporting table (2 c 1);
the driving roller (2 f 2) is rotatably arranged on the second mounting frame (2 f 1);
the second rack (2 f 3) is fixedly arranged on the clamping block (2 e 2), and the driving roller (2 f 2) is in driving connection with the second rack (2 f 3);
the pressing block (2 f 4) is slidably arranged on the first supporting table (2 c 1);
the third rack (2 f 5) is fixedly arranged on the pressing block (2 f 4), and the third rack (2 f 5) is in transmission connection with the transmission roller (2 f 2).
2. The wide-application diode high-temperature reverse bias experimental equipment according to claim 1, wherein the linear driving assembly (2 d) comprises a connecting block (2 d 1), a rack (2 d 2), a rotating shaft (2 d 3), a rotating gear (2 d 4) and a second handle (2 d 5);
two connecting blocks (2 d 1) are arranged, and the two connecting blocks (2 d 1) are fixedly connected with two sliding blocks (2 b) respectively;
two racks (2 d 2) are arranged, the two racks (2 d 2) are respectively and fixedly arranged on the two connecting blocks (2 d 1),
the rotating shaft (2 d 3) is rotatably arranged on the frame (1);
the rotary gear (2 d 4) is fixedly sleeved on the rotary shaft (2 d 3), and the rotary gear (2 d 4) is in transmission connection with the two racks (2 d 2);
the second handle (2 d 5) is fixedly sleeved on the rotating shaft (2 d 3).
3. The wide-application range diode high-temperature reverse bias experimental equipment according to claim 1, further comprising a temperature control device (3), wherein the temperature control device (3) comprises a heat dissipation assembly (3 a), and the heat dissipation assembly (3 a) comprises a first mounting frame (3 a 1) and a heat dissipation fan (3 a 2);
the first mounting frame (3 a 1) is fixedly arranged on the second box body (1 b);
a plurality of heat dissipation fans (3 a 2) are provided, and the heat dissipation fans (3 a 2) are mounted on the first mounting frame (3 a 1).
4. The wide-application diode high-temperature reverse bias experimental equipment according to claim 3, wherein the temperature control device (3) further comprises a heat insulation component (3 b), and the heat insulation component (3 b) comprises a support plate (3 b 1) and a heat insulation plate (3 b 2);
the supporting plate (3 b 1) is fixedly arranged on the frame (1), and the supporting plate (3 b 1) is positioned between the first box body (1 a) and the second box body (1 b);
the two heat insulation boards (3 b 2) are arranged, and the two heat insulation boards (3 b 2) are respectively and fixedly arranged on the two sides of the supporting board (3 b 1).
5. The wide-application diode high-temperature reverse bias experimental equipment according to claim 3, wherein the temperature control device (3) further comprises two temperature sensors (3 c), and the two temperature sensors (3 c) are fixedly arranged in the first box body (1 a) and the second box body (1 b) respectively.
6. The wide-application diode high-temperature reverse bias experimental equipment according to claim 1, wherein the rack (1) further comprises two multifunctional slots (1 d), and the two multifunctional slots (1 d) are fixedly arranged in the first box body (1 a) and the second box body (1 b) respectively.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210692346.7A CN115144717B (en) | 2022-06-17 | 2022-06-17 | Wide-application-range diode high-temperature reverse bias experimental equipment |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210692346.7A CN115144717B (en) | 2022-06-17 | 2022-06-17 | Wide-application-range diode high-temperature reverse bias experimental equipment |
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| CN115144717A CN115144717A (en) | 2022-10-04 |
| CN115144717B true CN115144717B (en) | 2023-05-02 |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| KR101466608B1 (en) * | 2008-06-09 | 2014-12-01 | 삼성전자주식회사 | Light-Emitting Diode Properties Measuring Apparatus |
| KR20180120134A (en) * | 2015-10-31 | 2018-11-05 | 뉴포트 코포레이션 | High Power Laser Diode Test System and Manufacturing Method |
| CN207181612U (en) * | 2017-10-03 | 2018-04-03 | 山东晶导微电子有限公司 | A kind of Schottky diode high temperature reverse bias experimental rig |
| CN108745439A (en) * | 2018-06-04 | 2018-11-06 | 湖南工学院 | A kind of experimental bench carrying out multi-group data control |
| CN109781613B (en) * | 2019-01-24 | 2021-07-20 | 中国大唐集团科学技术研究院有限公司火力发电技术研究院 | Metal corrosion accelerated experiment device for test |
| CN112394271A (en) * | 2020-12-01 | 2021-02-23 | 慈溪柏达电子科技有限公司 | Small-size semiconductor triode electrode detection device |
| CN215375658U (en) * | 2021-03-25 | 2021-12-31 | 深圳市创达电子有限公司 | Full-automatic LED aging testing device |
| CN215813174U (en) * | 2021-09-06 | 2022-02-11 | 天津海瑞电子科技有限公司 | Make things convenient for high temperature anti-tester that partially inclines of dismouting |
| CN216209465U (en) * | 2021-10-15 | 2022-04-05 | 淮安嘉程电子有限公司 | Semiconductor performance detection equipment under different temperatures |
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