CN207133208U - A kind of transmission-type EBSD sample stage - Google Patents

A kind of transmission-type EBSD sample stage Download PDF

Info

Publication number
CN207133208U
CN207133208U CN201720447598.8U CN201720447598U CN207133208U CN 207133208 U CN207133208 U CN 207133208U CN 201720447598 U CN201720447598 U CN 201720447598U CN 207133208 U CN207133208 U CN 207133208U
Authority
CN
China
Prior art keywords
sample
holding piece
transmission
screw
base
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201720447598.8U
Other languages
Chinese (zh)
Inventor
许峰
金传伟
张珂
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jiangsu Shagang Iron and Steel Research Institute Co Ltd
Original Assignee
Jiangsu Shagang Iron and Steel Research Institute Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jiangsu Shagang Iron and Steel Research Institute Co Ltd filed Critical Jiangsu Shagang Iron and Steel Research Institute Co Ltd
Priority to CN201720447598.8U priority Critical patent/CN207133208U/en
Application granted granted Critical
Publication of CN207133208U publication Critical patent/CN207133208U/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Landscapes

  • Analysing Materials By The Use Of Radiation (AREA)
  • Sampling And Sample Adjustment (AREA)

Abstract

It the utility model is related to a kind of transmission-type EBSD sample stage, including base, lower holding piece, pad, upper holding piece, fixed screw.Base is the bicylindrical for being provided with inclined-plane and screw, and inclined-plane is 60 ° with horizontal plane angle.Lower holding piece rear portion is provided with through hole, is engaged with the screw on base inclined-plane, is fastened by fixed screw and base;Front medial location is provided with diameter 2mm sample peephole, and the groove that the upper surface in hole is provided with diameter 3mm, depth 0.2mm above puts pad to place sample.Groove both sides are provided with screw, are engaged with the through hole on upper holding piece, are fastened by fixed screw and upper holding piece, so as to which sample be completely fixed.Upper holding piece is provided with diameter 2mm sample well, and its upper end is provided with 45 ° of chamferings.The utility model is designed reasonably, simple in construction, sample clamping stability is good, carries out transmission-type EBSD experiment available for transmission sample, obtains good diffraction pattern.

Description

A kind of transmission-type EBSD sample stage
Technical field
EBSD sample stage is the utility model is related to, more particularly to a kind of ESEM carries out the transmission-type back of the body and dissipated The sample stage that the sub- diffraction experiment of radio uses.
Background technology
EBSD technologies have been widely used for various crystal structure materials, including steel, nonferrous metal and alloy, pottery at present Porcelain, semiconductor, ore etc., study the forming core of its heat treatment process and grow up phenomenon, deformation twinning in plastic history and Dislocation movement by slip, microcell texture and orientation analysis, the identification of phases etc..Traditional EBSD systems use bounce technique, the pole that can reach It is about 100nm to limit resolution ratio.But characterized for large plastometric set sample, nanoscale grain size material and fine structure, pass The lack of resolution for EBSD systems of uniting is, it is necessary to use new transmission-type EBSD (T-EBSD) method.New method makes T-EBSD signs are carried out in ESEM with example of transmission electron microscope, sample diameter 3mm, thickness is typically in 50~100 μ M, penetration of electrons thickness of sample is thin, and energy loss is small, and spatial resolution is up to 10~12nm.Typical reflection method EBSD experiment samples Sample platform mainly has two kinds, respectively plain scan Electronic Speculum sample stage and 70 ° of EBSD pre-dumping platforms.In patent CN 204575570U Scanning electron microscope electron disclosed in disclosed scanning electron microscope electron back scattering diffraction sample sample stage, patent CN 201556600U It is used for the multi-functional of EBSD measurement disclosed in back scattering diffraction sample sample stage, patent CN 201697885U In a kind of sample stage for EBSD tests disclosed in sample stage and patent CN 204694653U, EBSD sample stages belong to normal Bounce technique EBSD sample stages are advised, are not suitable for the experiment of transmission-type EBSD.Disclosed in patent CN 203824939U thoroughly T-EBSD experiments, but sample clamping branch can be carried out with transmission beam method EBSD sample stages in sample stage by penetrating the experiment of formula EBSD Frame is complicated, and the non-chamfering of tabletting, sample diffraction style may be blocked, so as to influence EBSD demarcation rates.
Utility model content
Technical problem to be solved in the utility model is overcome the deficiencies in the prior art, there is provided a kind of simple in construction, sample Product clamping stability is good, diffraction pattern blocks the small transmission-type EBSD laboratory sample platform of possibility.
In order to solve the above technical problems, the utility model uses following technical scheme:
A kind of transmission-type EBSD sample stage, including base, lower holding piece, pad, upper holding piece, fixed spiral shell Silk;Base is the bicylindrical for being provided with inclined-plane and screw;Lower holding piece rear portion is provided with through hole, matches with the screw on base inclined-plane Close, be fixed on by fixed screw on base;Lower holding piece front medial location is provided with sample peephole, sample peephole it is upper End is provided with chamfering, and the upper surface of sample peephole is provided with groove to place sample, above puts pad;Groove both sides are provided with screw, with The through hole of upper holding piece both sides is engaged, and is completely fixed sample by fixed screw.
Preferably, the inclined-plane of the base of described transmission-type EBSD sample stage and horizontal plane angle are 60 °, Material is advisable with light-alloy.
Preferably, the sample observation bore dia 2mm of described transmission-type EBSD sample stage, positioned at lower clamping Piece front medial location, the groove diameter 3mm of its upper surface, depth 0.2mm, 45 ° of chamfer on sample peephole.
Preferably, the size of the annular gasket of described transmission-type EBSD sample stage is external diameter 3mm, interior Footpath 2.5mm, thickness 0.18mm;Upper holding piece thickness is 1mm.
Compared with prior art, the utility model at least has the advantages that:
(1) the utility model is designed reasonably, it is simple in construction, it is easy to operate, directly carry out T-EBSD available for transmission sample Experiment;
(2) sample aids in clamping through pad, and stability is good, it is ensured that sample does not shift in experimentation;
(3) holding piece sample well upper end is provided with chamfering on, greatly reduces the probability that diffraction pattern is blocked, and diffraction pattern is distinguished It is clear to know, and significantly improves EBSD system calibrating rates.
Brief description of the drawings
Fig. 1 is transmission-type EBSD sample stage schematic diagram;
Fig. 2 is understructure schematic diagram of the present utility model;
Fig. 3 is sample clamping partial schematic diagram of the present utility model.
Embodiment
The utility model is described in further detail below in conjunction with Figure of description and specific embodiment, but the embodiment It should not be construed as to limitation of the present utility model.
Fig. 1 is a kind of embodiment of the present utility model, and transmission-type EBSD sample stage includes base 1, lower folder Hold piece 2-1, pad 2-2, upper holding piece 2-3 and fixed screw 3.Illustrate with reference to Fig. 2, the material selection aluminium alloy of base 1, base Bottom is cylindrical type, is adapted to be placed in " 12.5mm " standard sample sample platform of JEOL companies.The upper inclined surface 8 of base 1 and horizontal plane Angle be 60 °, two screws 7 are provided with inclined-plane, for being fixed by two root long fixed screws 3 and lower holding piece 2-1.With reference to Fig. 3 illustrates that lower holding piece 2-1 rear portions thickness is 2mm, and is provided with two diameter 3mm through hole 4, position of opening and the inclined-plane of base 1 Screw 7 on 8 is engaged;Lower holding piece 2-1 front part sides are provided with two screws, logical with upper holding piece 2-3 both sides diameter 3mm Hole 4 is engaged, for being fixed by two short fixed screw 3 with upper holding piece 2-3.Sample can be reduced from short fixed screw Platform overall height, sample is set to use smaller WD parameters when testing close to pole shoe, T-EBSD as far as possible.Lower clamping Piece 2-1 front medial locations are provided with diameter 2mm sample peephole 5, pass through for electron beam.The upper surface of sample peephole 5 Diameter 3mm, depth 0.2mm groove 6 are provided with to place transmission sample, pad 2-2 is placed on sample, passes through the screw that is tightened 3 clamp upper and lower holding piece, so as to which transmission sample be completely fixed.Pad 2-2 is annular, and its size is external diameter 3mm, internal diameter 2.5mm, thickness 0.18mm.Upper holding piece 2-3 thickness is 1mm, and the upper end of sample peephole 5 is provided with 45 ° of chamferings, it is possible to reduce spreads out The possibility that style is blocked is penetrated, so as to obtain good diffraction pattern, so as to improve EBSD system calibrating rates.Use this sample Platform, unobstructed EBSD style can be obtained in the range of larger vert, by Optimal Experimental parameter, obtained The T-EBSD characterization results of higher demarcation rate.
The utility model has illustrated as above, to be not limited to the utility model with a kind of embodiment.This reality is not being departed from In the case of with new technique aspects, when making many to technical solutions of the utility model using above-mentioned technology contents Possible modification and variation, or change into the equivalent embodiment of equivalent variations.But these are without departing from technical solutions of the utility model Content, any simple modification made according to the utility model technical spirit to it, equivalent variations, belong to the utility model The protection domain of technical scheme.If there is the content not being described in detail in this specification, those skilled in the art are should be Technology that is known or should knowing, here is omitted.

Claims (4)

1. a kind of transmission-type EBSD sample stage, including base (1), lower holding piece (2-1), pad (2-2), upper folder Hold piece (2-3) and fixed screw (3);It is characterized in that:Base (1) is the bicylindrical for being provided with inclined-plane (8) and screw (7);Lower folder Hold piece (2-1) rear portion and be provided with through hole (4), be engaged with the screw (7) on base (1) inclined-plane (8), it is solid by fixed screw (3) It is scheduled on base (1);Lower holding piece (2-1) front medial location is provided with sample peephole (5), the upper end of sample peephole (5) Chamfering is provided with, the upper surface of sample peephole (5) is provided with groove (6) to place sample, above puts pad (2-2);Groove (6) both sides Screw (7) is provided with, is engaged with the through hole (4) of upper holding piece (2-3) both sides, is completely fixed sample by fixed screw (3).
2. transmission-type EBSD sample stage according to claim 1, it is characterised in that:Described base (1) Inclined-plane (8) and horizontal plane angle be 60 °, material is advisable with light-alloy.
3. transmission-type EBSD sample stage according to claim 1, it is characterised in that:Described sample observation Hole (5) diameter 2mm, positioned at lower holding piece (2-1) front medial location, groove (6) diameter 3mm of its upper surface, depth 0.2mm, 45 ° of chamfer on sample peephole (5).
4. transmission-type EBSD sample stage according to claim 1, it is characterised in that:Described pad (2- 2) it is annular, its size is external diameter 3mm, internal diameter 2.5mm, thickness 0.18mm;Upper holding piece (2-3) thickness is 1mm.
CN201720447598.8U 2017-04-26 2017-04-26 A kind of transmission-type EBSD sample stage Active CN207133208U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201720447598.8U CN207133208U (en) 2017-04-26 2017-04-26 A kind of transmission-type EBSD sample stage

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201720447598.8U CN207133208U (en) 2017-04-26 2017-04-26 A kind of transmission-type EBSD sample stage

Publications (1)

Publication Number Publication Date
CN207133208U true CN207133208U (en) 2018-03-23

Family

ID=61630961

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201720447598.8U Active CN207133208U (en) 2017-04-26 2017-04-26 A kind of transmission-type EBSD sample stage

Country Status (1)

Country Link
CN (1) CN207133208U (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109709121A (en) * 2019-03-06 2019-05-03 内蒙古科技大学 Sample stage and transmission mode electron backscatter diffraction (T-EBSD) system and method
CN115128109A (en) * 2022-09-02 2022-09-30 北京化工大学 EBSD sample stage based on orientation calibration and correction and image acquisition method

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109709121A (en) * 2019-03-06 2019-05-03 内蒙古科技大学 Sample stage and transmission mode electron backscatter diffraction (T-EBSD) system and method
CN115128109A (en) * 2022-09-02 2022-09-30 北京化工大学 EBSD sample stage based on orientation calibration and correction and image acquisition method
CN115128109B (en) * 2022-09-02 2022-11-25 北京化工大学 EBSD sample stage based on orientation calibration and correction and image acquisition method

Similar Documents

Publication Publication Date Title
CN207133208U (en) A kind of transmission-type EBSD sample stage
Kim et al. Dynamic visualization of crack propagation and bridging stress using the mechano-luminescence of SrAl2O4:(Eu, Dy, Nd)
CN106935464B (en) For transmiting-tool and diffraction image imaging method of electron backscatter diffraction
CN108333203B (en) Method for in-situ detection of EBSD (Electron Back-scattered diffraction) image of mineral micro-area
CN111289546A (en) Preparation and characterization method of precious metal superfine wire EBSD test sample
CN203824939U (en) Transmission-type sample table for electron back scattering diffraction (EBSD) experiment
Yuan et al. On‐axis versus off‐axis Transmission Kikuchi Diffraction technique: application to the characterisation of severe plastic deformation‐induced ultrafine‐grained microstructures
Nasdala et al. Constraining a SHRIMP U-Pb age: micro-scale characterization of zircons from Saxonian Rotliegend rhyolites
Day et al. A comparison of grain imaging and measurement using horizontal orientation and colour orientation contrast imaging, electron backscatter pattern and optical methods
CN111208162A (en) Quantitative characterization method for rapidly determining organic matter pores based on scanning electron microscope and application
Bingert et al. Microtextural investigation of hydrided α-uranium
JP2013235778A (en) Sample table for scanning type electron microscope, and method for locating sample on scanning type electron microscope
Tamura et al. Strain and Texture in Al-Interconnect Wires Weasured by X-Xay Microbeam Diffraction
CN109270096B (en) EBSD sample preparation method
Schmidt et al. Band positions used for on-line crystallographic orientation determination from electron back scattering patterns
Falkenberg et al. Localization and preparation of recombination-active extended defects for transmission electron microscopy analysis
Proust et al. Characterization of ultra-fine grained and nanocrystalline materials using transmission Kikuchi diffraction
Vespucci et al. Exploring transmission Kikuchi diffraction using a Timepix detector
CN110312691A (en) Oxidesintering material, method, the method for sputtering target and manufacturing semiconductor devices for manufacturing oxidesintering material
CN206697444U (en) The multifunctional sample platform of ESEM
CN110618155A (en) Method for detecting eutectic carbide of Cr12 type cold work die steel
Seyring et al. Characterization of grain structure in nanocrystalline gadolinium by high-resolution transmission electron microscopy
Gemmi et al. Quantitative texture analysis from powder-like electron diffraction data
Grossin et al. EBSD study on YBCO textured bulk samples: correlation between crystal growth and ‘microtexture’
CN206225315U (en) ESEM Multifunctional nonstandard sample stage

Legal Events

Date Code Title Description
GR01 Patent grant
GR01 Patent grant