CN206788061U - Thin film testing light source and thin film testing system - Google Patents
Thin film testing light source and thin film testing system Download PDFInfo
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- CN206788061U CN206788061U CN201720425502.8U CN201720425502U CN206788061U CN 206788061 U CN206788061 U CN 206788061U CN 201720425502 U CN201720425502 U CN 201720425502U CN 206788061 U CN206788061 U CN 206788061U
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- film testing
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Abstract
The utility model discloses a kind of thin film testing light source and thin film testing system, belong to thin film testing field.The thin film testing light source includes obtaining light shell outer cover, light barrier, acrylic board, optically focused rod, LED lamp bar and fin；The optically focused rod, the LED light bar and the fin are inside the light shell outer cover；The LED light bar is connected with the fin, and the LED light bar is located above the fin；The optically focused rod is located above the LED light bar；The acrylic board is fixed on above the optically focused rod by the light shell outer cover；The light barrier is set in parallel in above the acrylic board, and the light barrier blocks a part for the acrylic board；Solve the problems, such as in the prior art because light diffusing reflection can not obtain the homochromy defect of film appearance；The homochromy defect that film occurs can be reflected by reaching the image for making camera obtain, and improve the effect of the degree of accuracy of thin film testing.
Description
Technical field
The utility model embodiment is related to thin film testing field, more particularly to a kind of thin film testing light source and thin film testing system
System.
Background technology
Film is a kind of thin and flexible thin slice, is widely used in the industries such as electronic apparatus, machinery, packaging, printing.In film
Actual production process in, the factor such as the unholiness of dust free room, production line roller can all influence the quality of film, therefore need
Film is detected.
In thin film testing, using the acquisition technology and image procossing discrimination technology of machine vision, detecting system profit
Make it that system is synchronous with the holding of actual production line with encoder transmission signal, real-time online detection, be when finding flaw defect
System automatic sectional drawing alarm immediately.
However, traditional film mechanical vision inspection technology uses transmitted light or reflected light, light field polishing or details in a play not acted out on stage, but told through dialogues polishing
Or the mode such as excessive field polishing, the defects of film surface foreign matter, fisheye, scuffing etc. are heterochromatic can be detected, can not but be examined
Measure the defects of holiday, slight pit etc. are homochromy.
Utility model content
In order to solve problem of the prior art, the utility model embodiment provides a kind of thin film testing light source and film inspection
Examining system.The technical scheme is as follows：
First aspect, there is provided a kind of thin film testing light source, the thin film testing light source include light shell outer cover, light barrier, Asia
Gram force plate, optically focused rod, LED lamp bar and fin；
The optically focused rod, the LED light bar and the fin are inside the light shell outer cover；
The LED light bar is connected with the fin, and the LED light bar is located above the fin；
The optically focused rod is located above the LED light bar；
The acrylic board is fixed on above the optically focused rod by the light shell outer cover；
The light barrier is set in parallel in above the acrylic board, and the light barrier blocks one of the acrylic board
Point.
Optionally, two acrylic boards are included in the light shell outer cover；
The both sides of each acrylic board are fixed by the groove on the inside of the light shell outer cover respectively；
Two acrylic boards do not contact.
Optionally, the light barrier is light tight, and one side of the light barrier is fixed by the groove on the inside of the light shell outer cover；
The optically focused rod is contacted with the LED light bar, and the optically focused rod is fixed by the flange in the light shell outer cover.
Second aspect, there is provided a kind of thin film testing system, the system include the thin film testing as described in above-mentioned first aspect
Light source, industrial camera, image pick-up card, industrial control computer, programmable logic controller (PLC) PLC and encoder；
The scan line of the industrial camera is directed at the edge of light barrier described in the thin film testing light source；
The thin film testing light source is located at the lower section of film or the top of the film；
The industrial camera is located at the top of the film；
The industrial control computer is connected with the PLC；
Described image capture card is distinguished with the industrial camera, the PLC, the Industrial Control Computer and the encoder
Connection；
The encoder is connected with the PLC.
Optionally, the system also includes several output equipments, several solid-state relays, voltage-stablizer and switch electricity
Source；
The solid-state relay is connected with the PLC, and the output equipment is connected with the solid-state relay；
The input of the voltage-stablizer is connected with the power supply, and the output end of the voltage-stablizer calculates with the Industry Control
Machine and PLC connections；
The input of first switch power supply is connected with the voltage-stablizer, output end and the work of the first switch power supply
Industry camera connects with the encoder；
The input of second switch power supply is connected with the voltage-stablizer, the output end of the second switch power supply with it is described thin
Film detection light source connection
The beneficial effect brought of technical scheme that the utility model embodiment provides is：
Thin film testing light source, including light shell outer cover, light barrier, acrylic board, optically focused rod, LED light bar and fin, gear
Tabula rasa is located above LED light bar, and the light that LED light bar is sent is blocked in the position where light barrier；Using including increasing light barrier
The thin film testing system of thin film testing light source the defects of film, is detected, when film surface is present it is raised or sunken when,
The light of depression or the high spot reflection of film can not be by cameras capture；Solve in the prior art because light diffusing reflection can not
The problem of obtaining the homochromy defect that film occurs；Reaching the image for making camera obtain can reflect that the homochromy of film appearance lacks
Fall into, improve the effect of the degree of accuracy of thin film testing.
Brief description of the drawings
, below will be to needed for embodiment description in order to illustrate more clearly of the technical scheme in the embodiment of the utility model
The accompanying drawing to be used is briefly described, it should be apparent that, drawings in the following description are only some realities of the present utility model
Example is applied, for those of ordinary skill in the art, on the premise of not paying creative work, can also be according to these accompanying drawings
Obtain other accompanying drawings.
Fig. 1 is a kind of profile of thin film testing light source according to an exemplary embodiment；
Fig. 2 is a kind of side view of thin film testing light source according to an exemplary embodiment；
Fig. 3 is a kind of electrical connection diagram of thin film testing system according to an exemplary embodiment；
Fig. 4 is a kind of structural representation of thin film testing system according to an exemplary embodiment；
Fig. 5 is a kind of structural representation of thin film testing system according to an exemplary embodiment；
Fig. 6 is a kind of structural representation of thin film testing system according to another exemplary embodiment；
Fig. 7 is a kind of structural representation of thin film testing system according to another exemplary embodiment；
Fig. 8 (a) is a kind of fundamental diagram of thin film testing system according to an exemplary embodiment；
Fig. 8 (b) is a kind of fundamental diagram of thin film testing system according to an exemplary embodiment；
Fig. 8 (c) is a kind of fundamental diagram of thin film testing system according to an exemplary embodiment；
Fig. 9 (e) is the film graphics that the thin film testing system of the not thin film testing light source using increase light barrier obtains；
Fig. 9 (f) is the film graphics that the thin film testing system of the not thin film testing light source using increase light barrier obtains；
Fig. 9 (g) is the film graphics that the thin film testing system that the utility model embodiment provides obtains；
Fig. 9 (h) is the film graphics that the thin film testing system that the utility model embodiment provides obtains.
Embodiment
It is new to this practicality below in conjunction with accompanying drawing to make the purpose of this utility model, technical scheme and advantage clearer
Type embodiment is described in further detail.In the following description when referring to the accompanying drawings, unless otherwise indicated, the phase in different accompanying drawings
Same or analogous key element is represented with numeral.
Fig. 1 shows the profile for the thin film testing light source that the utility model embodiment provides；Fig. 2 shows that this practicality is new
The side view for the thin film testing light source that type embodiment provides.
As shown in figure 1, the thin film testing light source include light shell outer cover 110, light barrier 120, acrylic board, optically focused rod 140,
LED (Light Emitting Diode, light emitting diode) lamp bars 150 and fin 160.
Optically focused rod 140, LED light bar 150 and fin 160 are located inside light shell outer cover 110.
Optionally, optically focused rod 140 is acrylic solar panel, for adjusting light, makes light ray parallel.
LED150 lamp bars are connected with fin 160, and LED light bar 150 is located at the top of fin 160.
Optically focused rod 140 is located at the top of LED light bar 150.
Acrylic board is fixed on the top of optically focused rod 140 by light shell outer cover.Acrylic board is used to make uniform light.
Light barrier 120 is set in parallel in above acrylic board, and light barrier 120 blocks a part for the acrylic board.
In summary, the thin film testing light source that the utility model embodiment provides, including light shell outer cover, light barrier, Ya Ke
Power plate, optically focused rod, LED light bar and fin, light barrier are located above LED light bar, and LED is blocked in the position where light barrier
The light that bar is sent, when film surface is present it is raised or sunken when, film depression or high spot reflection light can not be by phase
Machine is caught；Solve the problems, such as in the prior art because light diffusing reflection can not obtain the homochromy defect of film appearance；Reach
The image for making camera obtain can reflect the homochromy defect that film occurs, and improve the effect of the degree of accuracy of thin film testing.
As shown in figure 1, include two acrylic boards in light shell outer cover 110, respectively can be with acrylic board 131 and second
Acrylic board 132；
The both sides of each acrylic board are fixed by the groove on the inside of light shell outer cover respectively.
Two acrylic boards do not contact.
First acrylic board 131 is parallel with the second acrylic board 132.
Light barrier in thin film testing light source is light tight, and one side of light barrier is fixed by the groove on the inside of light shell outer cover.It is poly-
Optical wand is contacted with LED light bar, and optically focused rod is fixed by the flange in light shell outer cover.
Optionally, light barrier is high-precision light barrier.
The width of light barrier is less than the width of acrylic board.
As shown in figure 1, the side of light barrier 120 is fixed by the groove of the inner side of light shell outer cover 110, light barrier 120 is not consolidated
The edge of fixed opposite side is in the top of acrylic board 131；Optically focused rod 140 contacts with LED light bar 150, and the quilt of optically focused rod 140
Flange 170 in light shell outer cover 110 is fixed.
Fig. 3 schematically illustrates the electrical connection diagram of the thin film testing system of the utility model one embodiment offer.
The thin film testing system includes thin film testing light source 310 as shown in Figure 1 or 2, industrial camera 320, image pick-up card 390,
Industrial control computer 370, PLC (Programmable Logic Controller, programmable logic controller (PLC)) 380 and
Encoder 330.
When mounted, the scan line alignment thin film of industrial camera detects the edge of light barrier in light source；
Thin film testing light source is located at the lower section of film or the top of film.
Industrial camera is located at the top of film.Optionally, the quantity of industrial camera and the width of film are relevant.Multiple industry
The coverage of camera can cover the width of non-woven fabrics.
As shown in Figure 4 and Figure 5, film 410 is placed on two carrying rollers 450, and thin film testing light source 420 is located at film
410 lower section, the top of film 410 are provided with two industrial cameras, respectively industrial camera 430 and industrial camera 440.
Optionally, when mounted, the outermost scan line alignment thin film of industrial camera is made to detect light barrier in light source
Edge.
When thin film testing light source is located at the lower section of film, what is utilized is the transmission principle of light.
As shown in Figure 6 and Figure 7, film 510 is placed on two carrying rollers 550, and thin film testing light source 520 is located at film
510 top, the top of film 510 are provided with two industrial cameras, respectively industry camera 530 and industrial camera 540.
When thin film testing light source is located at the top of film, what is utilized is the principle of reflection of light.
Optionally, when thin film testing light source is arranged on the top of film, thin film testing light source incline irradiation film.
Industrial control computer is connected with PLC；
Image pick-up card is connected respectively with industrial camera, PLC, Industrial Control Computer and encoder；
Encoder is connected with PLC.
In the alternative embodiment based on embodiment illustrated in fig. 3, the thin film testing system also include several output equipments,
Several solid-state relays, voltage-stablizer and Switching Power Supply.
Solid-state relay is connected with PLC, and output equipment is connected with solid-state relay；
The input of voltage-stablizer is connected with power supply, and the output end of voltage-stablizer is connected with industrial control computer and PLC；
The input of first switch power supply is connected with voltage-stablizer, output end and industrial camera and the coding of first switch power supply
Device connects；
Optionally, first switch power supply is 12V Switching Power Supplies.
The input of second switch power supply is connected with voltage-stablizer, and output end and the thin film testing light source of second switch power supply connect
Connect.
Optionally, second switch power supply is 24V Switching Power Supplies.
In figure 3, thin film testing light source 310 is connected by 24V Switching Power Supplies 350 with voltage-stablizer 340.
The input of voltage-stablizer 340 connects single-phase 220V alternating currents, and the output end of voltage-stablizer 340 also calculates with Industry Control
Machine 370 connects with PLC380.
Industrial control computer 370 is connected by RS-485 buses with PLC380.
Thin film testing light source 310 is connected by light source power line with the output end of 24V Switching Power Supplies 350；Industrial camera 320
It is connected by camera power supply line with the output end of 12V Switching Power Supplies 360.
The input of 12V Switching Power Supplies 360 is connected with the output end of voltage-stablizer 340, the output end of 12V Switching Power Supplies 360
Also it is connected with encoder 330；Encoder 330 is connected by encoder power line with 12V Switching Power Supplies 360.Encoder is used to drive
Dynamic industrial camera.
Industrial camera 320 is connected by camera data line with image pick-up card 390, and image pick-up card 390 inserts industrial control
The PCIe card groove of computer 370 processed.Image pick-up card 390 is also connected by two paths of signals line with encoder 330.
Output equipment can be alarm lamp, marking machine etc.；The output end of solid-state relay 391 can connect alarm lamp, Gu
The output end of state relay 392 can connect marking machine, and the output end of solid-state relay 393 and the connected mode of input please join
See Fig. 3, repeat no more here.
Heavy line in Fig. 3 represents RS-485 buses, and dotted line represents power line, and chain-dotted line represents the data wire of camera.
It should be noted that each component in the non-woven fabrics blot detecting system that the utility model embodiment provides is all
For commercial devices, model, the brand of component used by table one schematically illustrates.
Table one
| Type of device | Brand | Model |
| Industrial control computer | Grind China | 510/610 series |
| Image pick-up card | Dalsa | OR-X1C0-XPD10 |
| Industrial camera | Dalsa | SF-20-04K40-00-R |
| Camera data line | CEI | MVC-1-1-1-10M |
| Voltage-stablizer | De Lixi | TND-1500VA |
| PLC | Mitsubishi | FX3U-16MR/ES-A |
| Encoder | Interior close control | OVW2-1024-2MHT |
| 24V Switching Power Supplies | Bright latitude | NES-50-24 |
| 12V Switching Power Supplies | Bright latitude | NED-75A |
The light shell outer cover of thin film testing light source in the thin film testing system that the utility model embodiment provides according to Fig. 1 and
Fig. 2 is customized, and the brand that LED light bar uses is CREE, and the brand that model Q5, LED accessory uses is Ao Pute, model
QPT-LSG series accessories.
So that thin film testing light source is arranged on the top of film as an example, the operation principle of the thin film testing system is explained
State.
As shown in figure 8, thin film testing light source 810 is located at the top of film 840, industrial camera 830 is located at the top of film 840,
There is slight convex in the surface of film 840, and the film is considered as defective.
In detection process, film 840 moves from left to right；
(a) is represented in Fig. 8：Light is reflected by the right side of high spot, and reflection light can be received by industrial camera 830；
(b) is represented in Fig. 8：Light is reflected by the surface of high spot, and reflection light can be received by industrial camera 830；
(c) is represented in Fig. 8：After light barrier 820 in thin film testing light source 810 being present, one in thin film testing light source 810
Some light is blocked, the left side of high spot can not regular reflection light, industrial camera 830 also can not be just received by high spot
The light of left side reflection；
Now, the difference of light and shade just occurs in the image that industrial camera 830 is shot, and the high spot of film surface is in shooting
Can occur third dimension in image.
In an exemplary example, the thin film testing system that is provided using the utility model embodiment and do not make
The defects of film surface, is detected with the thin film testing system of the thin film testing light source of increase light barrier.
As shown in figure 9, e and f are the thin film testing system photographs of the not thin film testing light source using increase light barrier
Film graphics, g and h are the film graphics of the thin film testing system photographs provided using the utility model embodiment；
As seen from Figure 9, after the thin film testing light source increase light barrier in thin film testing system, then during shooting image,
The defects of the more details, image that film surface can be caught more have third dimension；More tiny defects, g can also be presented
In it can be seen that pit in circle 91, and the corresponding position in e can't see pit, it can be seen that pit in circle 92 in h,
And the corresponding position in f is stain, can not judge it is pit.
The thin film testing system that the utility model embodiment provides, by using the thin film testing light for adding light barrier
Source, solve the problems, such as in the prior art because light diffusing reflection can not obtain the homochromy defect of film appearance；Reach and make phase
The image that machine obtains can reflect the homochromy defect that film occurs, and the details of film surface is become apparent from, three-dimensional
Present, improve the effect of the degree of accuracy of thin film testing.
It should be noted that：Above-mentioned the utility model embodiment sequence number is for illustration only, does not represent the quality of embodiment.
Preferred embodiment of the present utility model is the foregoing is only, it is all in this practicality not to limit the utility model
Within new spirit and principle, any modification, equivalent substitution and improvements made etc., guarantor of the present utility model should be included in
Within the scope of shield.
Claims (5)
1. a kind of thin film testing light source, it is characterised in that the thin film testing light source includes light shell outer cover, light barrier, acrylic
Plate, optically focused rod, LED lamp bar and fin；
The optically focused rod, the LED light bar and the fin are inside the light shell outer cover；
The LED light bar is connected with the fin, and the LED light bar is located above the fin；
The optically focused rod is located above the LED light bar；
The acrylic board is fixed on above the optically focused rod by the light shell outer cover；
The light barrier is set in parallel in above the acrylic board, and the light barrier blocks a part for the acrylic board.
2. thin film testing light source according to claim 1, it is characterised in that include two Asias in the light shell outer cover
Gram force plate；
The both sides of each acrylic board are fixed by the groove on the inside of the light shell outer cover respectively；
Two acrylic boards do not contact.
3. thin film testing light source according to claim 1 or 2, it is characterised in that the light barrier is light tight, described to be in the light
One side of plate is fixed by the groove on the inside of the light shell outer cover；
The optically focused rod is contacted with the LED light bar, and the optically focused rod is fixed by the flange in the light shell outer cover.
4. a kind of thin film testing system, it is characterised in that the system includes the film inspection as described in claims 1 to 3 is any
Light-metering source, industrial camera, image pick-up card, industrial control computer, programmable logic controller (PLC) PLC and encoder；
The scan line of the industrial camera is directed at the edge of light barrier described in the thin film testing light source；
The thin film testing light source is located at the lower section of film or the top of the film；
The industrial camera is located at the top of the film；
The industrial control computer is connected with the PLC；
Described image capture card connects respectively with the industrial camera, the PLC, the Industrial Control Computer and the encoder
Connect；
The encoder is connected with the PLC.
5. system according to claim 4, it is characterised in that the system also include several output equipments, several
Solid-state relay, voltage-stablizer and Switching Power Supply；
The solid-state relay is connected with the PLC, and the output equipment is connected with the solid-state relay；
The input of the voltage-stablizer is connected with the power supply, the output end of the voltage-stablizer and the industrial control computer with
And the PLC connections；
The input of first switch power supply is connected with the voltage-stablizer, the output end of the first switch power supply and the industrial phase
Machine connects with the encoder；
The input of second switch power supply is connected with the voltage-stablizer, and output end and the film of the second switch power supply are examined
Light-metering source connects.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201720425502.8U CN206788061U (en) | 2017-04-21 | 2017-04-21 | Thin film testing light source and thin film testing system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201720425502.8U CN206788061U (en) | 2017-04-21 | 2017-04-21 | Thin film testing light source and thin film testing system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN206788061U true CN206788061U (en) | 2017-12-22 |
Family
ID=60707608
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201720425502.8U Active CN206788061U (en) | 2017-04-21 | 2017-04-21 | Thin film testing light source and thin film testing system |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN206788061U (en) |
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2017
- 2017-04-21 CN CN201720425502.8U patent/CN206788061U/en active Active
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