CN206450596U - A kind of albedo measurement platform of specified incidence angle - Google Patents
A kind of albedo measurement platform of specified incidence angle Download PDFInfo
- Publication number
- CN206450596U CN206450596U CN201720160634.2U CN201720160634U CN206450596U CN 206450596 U CN206450596 U CN 206450596U CN 201720160634 U CN201720160634 U CN 201720160634U CN 206450596 U CN206450596 U CN 206450596U
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- CN
- China
- Prior art keywords
- platform
- incidence angle
- height adjusting
- placement platform
- speculum
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Abstract
The utility model discloses a kind of albedo measurement platform of specified incidence angle, including placement platform, the placement platform both sides are provided with height adjusting blocks, in the utility model, by making a platform base corresponding with measurement orlop seat, the speculum microscope base of one adjustable angle is installed on base and the speculum group for the incident angle that meets the requirements is installed on microscope base, two pieces of height adjusting blocks for being located at microscope group both sides are installed on platform base, for matching measuring table height according to optical path distance.The placement platform of top is fixed on two tile height regulating blocks by screw mandrel and spring, and test is sized to be slightly smaller than with the light hole of plating piece to thang-kng in opening one on the corresponding focal position of placement platform, the light hole is pyramid structure, and gradient incidence angle as requested sets to ensure the light disturbance in thang-kng amount reduction measurement process.
Description
Technical field
The utility model is related to technical field of optical detection, more particularly to a kind of albedo measurement of specified incidence angle is put down
Platform.
Background technology
Spectrophotometer, also known as spectrometer (spectrometer), are the sections that the light of complicated component is decomposed into spectrum line
Learn instrument.It is 200~380 nm that measurement range, which generally comprises the visible region and wave-length coverage that wave-length coverage is 380 ~ 780 nm,
Ultraviolet region.Different light sources has its distinctive emission spectrum, therefore can be using light of the different illuminators as instrument
Source
Platinum Ai Ermo spectrophotometer acquiescence is provided as the incident albedo measurement platform in 6 ° of angles, when order requirements are surveyed
It can not then be completed during the amount larger reflectivity of incident angle, and the accessory of adjustable incidence angle is sufficiently expensive, it is necessary to a flexible
The subsidiary of coming together of variable-angle.
Utility model content
The purpose of this utility model is and a kind of specified incidence angle proposed in order to solve shortcoming present in prior art
Albedo measurement platform.
To achieve these goals, the utility model employs following technical scheme：A kind of reflectivity of specified incidence angle
Measuring table, including placement platform, the placement platform both sides are provided with height adjusting blocks, the side surface of height adjusting blocks one
Provided with chute, and detent surface is provided with height adjusting slider, and the placement platform top is provided with platform base, and the placement is put down
Platform side edge, which is provided with inside thang-kng aperture frame, and thang-kng aperture frame, is provided with light hole, and the thang-kng aperture frame anterior position is provided with anti-
Penetrate and speculum group is placed with above mirror microscope base, the speculum microscope base, the speculum microscope base both sides are provided with support bar, and reflection
Microscope group is connected by connecting rod with support bar, and the connecting rod is connected with number of degrees adjusting knob, and the placement platform passes through screw mandrel
It is connected with height adjusting blocks.
It is used as further describing for above-mentioned technical proposal：
The height adjusting blocks are provided with two altogether, and two height adjusting blocks are on placement platform Central Symmetry.
It is used as further describing for above-mentioned technical proposal：
The support bar is provided with two altogether, and two support bars are connected with connecting rod, and on speculum group center pair
Claim.
It is used as further describing for above-mentioned technical proposal：
The light hole is pyramid structure, and the clear aperature towards speculum group direction is logical much smaller than opposite side
Light aperture.
It is used as further describing for above-mentioned technical proposal：
Spring is cased with the screw mandrel.
In the utility model, by making a platform base corresponding with measurement orlop seat, one is installed on base
The speculum microscope base of adjustable angle and the speculum group that the incident angle that meets the requirements is installed on microscope base, pacify on platform base
Two pieces of height adjusting blocks for being located at microscope group both sides are filled, for matching measuring table height according to optical path distance.The placement of top is put down
Platform is fixed on two tile height regulating blocks by screw mandrel and spring, and in opening a size on the corresponding focal position of placement platform
It is slightly less than test and is used to thang-kng with the light hole of plating piece, the light hole is pyramid structure, and gradient incidence angle as requested is set
The fixed light disturbance to ensure in thang-kng amount reduction measurement process.
Brief description of the drawings
Fig. 1 be the utility model proposes a kind of specified incidence angle albedo measurement platform external structure schematic diagram；
Fig. 2 be the utility model proposes a kind of specified incidence angle albedo measurement platform cut-away view；
Fig. 3 be the utility model proposes a kind of specified incidence angle albedo measurement platform screw mandrel structural representation
Figure.
Marginal data：
1- placement platforms, 11- height adjusting blocks, 12- height adjusting slider, 13- chutes, 2- speculums microscope base, 21- reflections
Microscope group, 22- connecting rods, 23- support bars, 24- number of degrees adjusting knob, 3- thang-kngs aperture frame, 31- light holes, 4- platform bases, 5-
Bar, 51- springs.
Embodiment
Below in conjunction with the accompanying drawing in the utility model embodiment, the technical scheme in the utility model embodiment is carried out
Clearly and completely describe, it is clear that described embodiment is only a part of embodiment of the utility model, rather than whole
Embodiment.
Reference picture 1-3, a kind of albedo measurement platform of specified incidence angle, including placement platform 1, the both sides of placement platform 1
Height adjusting blocks 11 are provided with, the side surface of height adjusting blocks 11 1 is provided with chute 13, and the surface of chute 13 is provided with height and adjusted
Sliding block 12, the top of placement platform 1 is provided with platform base 4, and the side edge of placement platform 1 is provided with thang-kng aperture frame 3, and thang-kng aperture frame
3 inside are provided with light hole 31, and the anterior position of thang-kng aperture frame 3 is provided with speculum microscope base 2, and the top of speculum microscope base 2 is placed with reflection
Microscope group 21, the both sides of speculum microscope base 2 are provided with support bar 23, and speculum group 21 is connected by connecting rod 22 with support bar 23, even
Extension bar 22 is connected with number of degrees adjusting knob 24, and placement platform 1 is connected by screw mandrel 5 with height adjusting blocks 11.
Height adjusting blocks 11 are provided with two altogether, and two height adjusting blocks 11 are on the Central Symmetry of placement platform 1.
Support bar 23 is provided with two altogether, and two support bars 23 are connected with connecting rod 22, and in speculum group 21
The heart is symmetrical.
Light hole 31 is pyramid structure, and the clear aperature towards the direction of speculum group 21 is logical much smaller than opposite side
Light aperture.
Spring 51 is cased with screw mandrel 5.
Screw mandrel 5 is used for connecting height adjusting blocks 11 and placement platform 1, and is connected on height adjusting slider 12, by adjusting
The height adjusting slider 12 in chute 13 is saved to adjust the height of platform.
Operation principle：In use, first spectrophotometer is put into platform base 4, by focal position correspondence thang-kng aperture frame 3
Light hole 31, regulation number of degrees adjusting knob 24, to reach the incident angle of needs, and passes through regulation to adjust speculum group 21
Height adjusting slider 12 on height adjusting blocks 11 adjusts the height of placement platform 1, completes measurement.
It is described above, only the utility model preferably embodiment, but protection domain of the present utility model is not
This is confined to, any one skilled in the art is in the technical scope that the utility model is disclosed, according to this practicality
New technical scheme and its utility model design are subject to equivalent substitution or change, should all cover in protection model of the present utility model
Within enclosing.
Claims (5)
1. a kind of albedo measurement platform of specified incidence angle, including placement platform（1）, it is characterised in that the placement platform
（1）Both sides are provided with height adjusting blocks（11）, the height adjusting blocks（11）One side surface is provided with chute（13）, and chute（13）
Surface is provided with height adjusting slider（12）, the placement platform（1）Top is provided with platform base（4）, the placement platform（1）
Side edge is provided with thang-kng aperture frame（3）, and thang-kng aperture frame（3）Inside is provided with light hole（31）, the thang-kng aperture frame（3）Front
Position is provided with speculum microscope base（2）, the speculum microscope base（2）Top is placed with speculum group（21）, the speculum microscope base
（2）Both sides are provided with support bar（23）, and speculum group（21）Pass through connecting rod（22）With support bar（23）Connection, the connecting rod
（22）With number of degrees adjusting knob（24）Connection, the placement platform（1）Pass through screw mandrel（5）With height adjusting blocks（11）Connection.
2. the albedo measurement platform of a kind of specified incidence angle according to claim 1, it is characterised in that the height is adjusted
Locking nub（11）Two, and two height adjusting blocks are provided with altogether（11）On placement platform（1）Central Symmetry.
3. a kind of albedo measurement platform of specified incidence angle according to claim 1, it is characterised in that the support bar
（23）Two, and two support bars are provided with altogether（23）And connecting rod（22）Connection, and on speculum group（21）Central Symmetry.
4. a kind of albedo measurement platform of specified incidence angle according to claim 1, it is characterised in that the light hole
（31）For pyramid structure, and towards speculum group（21）The clear aperature in direction is much smaller than the clear aperature of opposite side.
5. a kind of albedo measurement platform of specified incidence angle according to claim 1, it is characterised in that the screw mandrel
（5）On be cased with spring（51）.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201720160634.2U CN206450596U (en) | 2017-02-22 | 2017-02-22 | A kind of albedo measurement platform of specified incidence angle |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201720160634.2U CN206450596U (en) | 2017-02-22 | 2017-02-22 | A kind of albedo measurement platform of specified incidence angle |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN206450596U true CN206450596U (en) | 2017-08-29 |
Family
ID=59665108
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201720160634.2U Expired - Fee Related CN206450596U (en) | 2017-02-22 | 2017-02-22 | A kind of albedo measurement platform of specified incidence angle |
Country Status (1)
| Country | Link |
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| CN (1) | CN206450596U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109612968A (en) * | 2019-01-10 | 2019-04-12 | 北京创思工贸有限公司 | A kind of albedo measurement debugging apparatus, method and method for measuring reflectance |
-
2017
- 2017-02-22 CN CN201720160634.2U patent/CN206450596U/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109612968A (en) * | 2019-01-10 | 2019-04-12 | 北京创思工贸有限公司 | A kind of albedo measurement debugging apparatus, method and method for measuring reflectance |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20170829 Termination date: 20210222 |
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| CF01 | Termination of patent right due to non-payment of annual fee |