CN206248785U - Volume production test module of the inside with analog-to-digital conversion interface chip - Google Patents
Volume production test module of the inside with analog-to-digital conversion interface chip Download PDFInfo
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- CN206248785U CN206248785U CN201621292945.6U CN201621292945U CN206248785U CN 206248785 U CN206248785 U CN 206248785U CN 201621292945 U CN201621292945 U CN 201621292945U CN 206248785 U CN206248785 U CN 206248785U
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Abstract
The utility model discloses a kind of volume production test module of inside with analog-to-digital conversion interface chip, including register control unit, multi-channel data selector mux_sel and n a two channel data selector mux；Register control unit receives the data of data/address bus, produces and enables signal, test signal and selection signal；One input of each two channel data selectors mux connects the corresponding modulus conversion signal of chip analog functional module, another input connects the test signal of register control unit, control end connects the enable signal of register control unit, and output end connects the corresponding digital-to-analogue interface signal input of chip digital functional module；The input of multi-channel data selector mux_sel connects the output end of each two channel data selectors mux and the digital test signal output end of chip digital functional module, control end connects the selection signal of register control unit, and output end is used as volume production test signal output end.The utility model can separate the test of chip analog portion and the test of numerical portion, substantially increase testing efficiency.
Description
Technical field
The utility model is related to chip testing technology field, more particularly to a kind of inside to carry analog-to-digital conversion interface chip
Volume production test module.
Background technology
The cost of a chip, affects the competitiveness of product, and in the case where chip area is certain, we will drop as far as possible
Low testing cost.At present, the method for reducing chip testing cost has two kinds:One is the testing time for reducing each chip；Two are
Increase the quantity (number of chips that can be tested simultaneously is determined by the port number of test equipment) of test chip simultaneously.That is, test
Core number is more, speed is faster, and testing cost is lower.
The test of a chip, often relates to the test of analog portion and test two parts of numerical portion.Simulation part
Dividing typically can individually test, but the test of numerical portion tends to rely on analog portion.Particularly, it is internal to carry analog-to-digital conversion
The chip of interface, derived digital signal is by analog-to-digital conversion, it would be desirable to the excitation of outside plus analog quantity, aptitude test number
The function of character segment.But, the shortcoming of such test chip numerical portion is：(1) excitation of analog quantity is added to chip under test,
Want the accurate power supply of engaged test equipment；Because the accurate number of power sources of test equipment is limited, can limit can be while test chip
Quantity.(2) excitation of analog quantity is added to chip under test, it is easily interfered by outside；(3) analog quantity excitation change after, it is necessary to
Stabilization time more long, and analog-to-digital conversion is also required to certain hour, causes the testing time very long.
Utility model content
The utility model aims to provide a kind of volume production test module of inside with analog-to-digital conversion interface chip, analog-to-digital conversion
Function can be tested individually, it is only necessary to plus a small amount of analog quantity test and excitation, test result can be by volume production test signal
Give tester table.The utility model is realized by following technical scheme：
A kind of inside with analog-to-digital conversion interface chip volume production test module, the chip include analog functional module,
Digital function module and data/address bus, analog functional module have n analog input end and n analog-to-digital conversion signal output
End, digital function module has n digital-to-analogue interface signal input and a digital test signal output end, and data/address bus includes
Data wire and clock cable；It is characterized in that：The volume production test module is integrated in chip, including register control is single
Unit, multi-channel data selector mux_sel and n a two channel data selector mux；Register control unit receives data/address bus
Data, produce enable signal cp_en, test signal cp_test_1 ... cp_test_n and selection signal cp_sel；Each two
One input of channel data selector mux connects the corresponding modulus conversion signal output end of chip analog functional module, separately
The test signal cp_test_1 of one input connection register control unit ... cp_test_n, control end connection deposit
The enable signal cp_en of device control unit, output end connects the corresponding digital-to-analogue interface signal input of chip digital functional module；
The input of multi-channel data selector mux_sel connects the output end and chip digital work(of each two channel data selectors mux
The digital test signal output end of energy module, control end connects the selection signal cp_sel of register control unit, and output end is made
It is volume production test signal output end.
Used as specific technical scheme, the data/address bus is I2C buses, including data wire SDA and clock cable
SCL。
The volume production test module that the utility model passes through built-in chip type, under volume production test pattern, makes chip analog portion
Test and numerical portion test separate.The test and excitation of derived digital signal is directly provided by data/address bus, makes digital section
The test and excitation for dividing does not rely on analog portion, substantially increases testing efficiency.The test and excitation of numerical portion, it is total by data
The advantage that line is directly provided has：(1) port number of test equipment, is not only restricted to the accurate number of power sources of test equipment, can be significantly
Increase multi-chip with the quantity surveyed.(2) test and excitation is directly provided by data/address bus, is difficult interfered by outside；(3) can save
Analog signal stabilization and the time of analog-to-digital conversion, shorten the testing time.
Brief description of the drawings
Fig. 1 is applied to the schematic diagram in chip for volume production test module that the utility model embodiment is provided.
The structure chart of the volume production test module that Fig. 2 is provided for the utility model embodiment.
Specific embodiment
Specific embodiment of the present utility model is described further below in conjunction with the accompanying drawings：
As shown in figure 1, the volume production test module that the present embodiment is provided is applied in chip, the chip carries modulus for internal
The chip of translation interface, including analog functional module, digital function module and I2C buses, analog functional module has n simulation
Amount input and n analog-to-digital conversion signal output part, digital function module have n digital-to-analogue interface signal input and a number
Word test signal output end, I2C buses include data wire SDA and clock cable SCL.
As shown in Fig. 2 volume production test module includes：Register control unit, n two channel data selector mux, lead to more
Track data selector mux_sel.Wherein, register control unit receives I2The data of C buses, produce and enable signal cp_en, survey
Trial signal cp_test (cp_test_1, cp_test_2 ... cp_test_n), selection signal cp_sel.Each two channel datas choosing
An input for selecting device mux connects the corresponding modulus conversion signal output end of chip analog functional module, another input
Connect the test signal cp_test (cp_test_1, cp_test_2 ... cp_test_n) of register control unit, control end
Connect the enable signal cp_en of register control unit, the corresponding digital analog interface letter of output end connection chip digital functional module
Number input.The input of multi-channel data selector mux_sel connects the output end and core of each two channel data selectors mux
The digital test signal output end of piece digital function module, control end connects the selection signal cp_sel of register control unit,
Output end is used as volume production test signal output end.
With reference to Fig. 1 and Fig. 2, the operation principle of above-mentioned volume production test module is described as follows：
Each two channel data selectors mux is controlled by signal cp_en is enabled, and as cp_en=0, selects corresponding mould
Number conversion signal；As cp_en=1, the corresponding test signal cp_test that mask register control unit is produced.Multichannel number
According to selector mux_sel, controlled by selection signal cp_sel, one signal path of selection is used as volume production test signal.Modulus
Conversion signal is what chip analog functional module was produced, can be one or more according to the actual requirements；Digital analog interface signal send
Give chip digital functional module；The signal that digital test signal feeds back for digital module, for checking digital module function
It is whether correct；Volume production test signal gives tester table.
In the present embodiment, digital analog interface signal is sent out after two channel data selector mux are selected.During normal function,
Cp_en=0, selects analog-to-digital conversion signal, does not influence normal function.Under volume production test pattern, cp_en=1, selection passes through I2C
The test signal cp_test of bus write-in.So, test signal during digital function part is tested, chip can not be passed through
Analog module, and select I2The data of C buses.When analog-digital conversion function is tested, make cp_en=0, selection analog-to-digital conversion letter
Number, then by multi-channel data selector mux_sel, select the volume production test signal to be tested.So, analog portion modulus turns
The function of changing, is encouraged by outside plus a small amount of analog quantity, and tester table is given from volume production test signal again result.
Compared to existing technology, the beneficial effects of the utility model are：
If not having volume production test module, the digital analog interface signal of digital function module is directly carried by analog functional module
For.The excitation of test digital function part, it is necessary to outside plus analog quantity, by being produced after analog-to-digital conversion.Numerical portion test
Coverage rate to reach it is very high if, to add the analog quantity pumping signals of many group various combinations, such testing time will be very long.
The utility model adds volume production test module in chip internal, and the volume production test module simple structure, design are ingenious, substantially will not
Increase extra cost to chip.But it realizes chip analog portion and numerical portion test and independently carries out, and improves survey
Examination efficiency, reduces testing cost.Analog-digital conversion function can be tested individually, it is only necessary to plus analog quantity test and excitation is on a small quantity
Can, test result can give tester table by volume production test signal.Numerical portion test and excitation can be by I2C buses are straight
Write-in is connect, it is convenient and swift.
Above example is only fully open and unrestricted the utility model, it is all based on creation purport of the present utility model,
The replacement of the equivalence techniques feature without creative work, should be considered as the scope of the application exposure.
Claims (2)
1. a kind of inside carries the volume production test module of analog-to-digital conversion interface chip, and the chip includes analog functional module, number
Word functional module and data/address bus, analog functional module have n analog input end and n analog-to-digital conversion signal output part,
Digital function module has n digital-to-analogue interface signal input and a digital test signal output end, and data/address bus includes number
According to line and clock cable；It is characterized in that：The volume production test module is integrated in chip, including register control unit,
Multi-channel data selector mux_sel and n two channel data selector mux；Register control unit receives data/address bus
Data, produce enable signal cp_en, test signal cp_test_1 ... cp_test_n and selection signal cp_sel；Each two-way
One input of track data selector mux connects the corresponding modulus conversion signal output end of chip analog functional module, another
The test signal cp_test_1 of individual input connection register control unit ... cp_test_n, control end connection register
The enable signal cp_en of control unit, output end connects the corresponding digital-to-analogue interface signal input of chip digital functional module；It is many
The input of channel data selector mux_sel connects the output end and chip digital function of each two channel data selectors mux
The digital test signal output end of module, control end connects the selection signal cp_sel of register control unit, output end conduct
Volume production test signal output end.
2. volume production test module according to claim 1, it is characterised in that the data/address bus is I2C buses, including number
According to line SDA and clock cable SCL.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201621292945.6U CN206248785U (en) | 2016-11-29 | 2016-11-29 | Volume production test module of the inside with analog-to-digital conversion interface chip |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201621292945.6U CN206248785U (en) | 2016-11-29 | 2016-11-29 | Volume production test module of the inside with analog-to-digital conversion interface chip |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN206248785U true CN206248785U (en) | 2017-06-13 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201621292945.6U Withdrawn - After Issue CN206248785U (en) | 2016-11-29 | 2016-11-29 | Volume production test module of the inside with analog-to-digital conversion interface chip |
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| Country | Link |
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| CN (1) | CN206248785U (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106990350A (en) * | 2016-11-29 | 2017-07-28 | 珠海市微半导体有限公司 | Inside carries the volume production test module and method of analog-to-digital conversion interface chip |
| CN111381148A (en) * | 2018-12-29 | 2020-07-07 | 无锡华润矽科微电子有限公司 | System and method for realizing chip test |
| CN114638183A (en) * | 2022-05-10 | 2022-06-17 | 上海泰矽微电子有限公司 | Device and method for observing multiple signals in chip by adopting single PIN PIN |
| CN117031256A (en) * | 2023-10-07 | 2023-11-10 | 紫光同芯微电子有限公司 | Chip testing system and method |
-
2016
- 2016-11-29 CN CN201621292945.6U patent/CN206248785U/en not_active Withdrawn - After Issue
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106990350A (en) * | 2016-11-29 | 2017-07-28 | 珠海市微半导体有限公司 | Inside carries the volume production test module and method of analog-to-digital conversion interface chip |
| CN111381148A (en) * | 2018-12-29 | 2020-07-07 | 无锡华润矽科微电子有限公司 | System and method for realizing chip test |
| CN114638183A (en) * | 2022-05-10 | 2022-06-17 | 上海泰矽微电子有限公司 | Device and method for observing multiple signals in chip by adopting single PIN PIN |
| CN114638183B (en) * | 2022-05-10 | 2022-08-26 | 上海泰矽微电子有限公司 | Device and method for observing multiple signals in chip by adopting single PIN PIN |
| CN117031256A (en) * | 2023-10-07 | 2023-11-10 | 紫光同芯微电子有限公司 | Chip testing system and method |
| CN117031256B (en) * | 2023-10-07 | 2024-03-01 | 紫光同芯微电子有限公司 | Chip testing system and method |
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| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| AV01 | Patent right actively abandoned | ||
| AV01 | Patent right actively abandoned | ||
| AV01 | Patent right actively abandoned |
Granted publication date: 20170613 Effective date of abandoning: 20230609 |
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| AV01 | Patent right actively abandoned |
Granted publication date: 20170613 Effective date of abandoning: 20230609 |