CN209117739U - Mobile phone LED drives test probe card - Google Patents
Mobile phone LED drives test probe card Download PDFInfo
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- CN209117739U CN209117739U CN201821769123.1U CN201821769123U CN209117739U CN 209117739 U CN209117739 U CN 209117739U CN 201821769123 U CN201821769123 U CN 201821769123U CN 209117739 U CN209117739 U CN 209117739U
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Abstract
The utility model discloses a kind of mobile phone LEDs to drive test probe card, test module is driven including the probe docked with device under test and at least one mobile phone LED, each mobile phone LED driving test module is directly mounted at interface card, each mobile phone LED driving test module is connected with probe simultaneously, and the mobile phone LED driving test module includes first to third switch K1~K3, bus control module and two-channel LED correction module.Mobile phone LED disclosed by the utility model drives test probe card, based on the existing test electromechanical source instrument of testing factory and signal occurs and analysis meter, and high-precision mobile phone LED driving test module is added, complete mobile phone LED driving chip Multi-station parallel test, improve test degree of parallelism, the testing time is saved, testing cost is reduced.
Description
Technical field
The utility model belongs to semiconductor fabrication techniques field, and in particular to a kind of mobile phone LED driving test probe card.
Background technique
It is that a kind of package dimension is minimum that mobile phone LED, which drives class chip, for driving the low function of mobile device light emitting diode
Chip is consumed, is widely used in various mobile devices, annual shipment amount is all very huge.Therefore, for chip manufacturer, core
The volume production test of piece is also suggested higher requirement.
Mobile phone LED drives the test of class chip die grade other than routine test, and Major Difficulties are its integrated high-precision
The correcting current of current source is tested.Currently, this partial test is mainly completed by self contained instrument.
Chip manufacturer finds that there are following defects for above-mentioned traditional test scheme in production practice.
1. integrated based on various self contained instruments, system communication expense is big, causes the testing time long；
2. the system integration and Secondary Development Work are needed, it is at high cost；
3. installation configuration bothers, poor reliability since it is desired that integrating various instrument；
4. Multi-station parallel test is difficult by self contained instrument resource constraint.
Utility model content
The utility model is directed to the situation of the prior art, overcomes drawbacks described above, provides a kind of mobile phone LED driving test probe
Card.
The utility model uses following technical scheme, and the mobile phone LED driving test probe card is for obtaining and sharing
The input information of existing equipment from tester table, the existing equipment of above-mentioned tester table include power channel module, number
Signal generating module and Current Voltage acquisition module, the mobile phone LED driving test probe card includes docking with device under test
Probe and at least one mobile phone LED drive test module, and each mobile phone LED driving test module is directly mounted at interface circuit
Plate, each mobile phone LED driving test module are connected with probe simultaneously, and the mobile phone LED driving test module includes:
First switch K1, the first switch K1 are between conducting or power cutoff channel module and device under test
Access；
Bus control module, module occurs with digital signal simultaneously for the bus control module and device under test is connected；
Second switch K2, the second switch K2 for be connected or turn off voltage and current acquisition module and device under test it
Between access；
Third switch K3 and two-channel LED calibration module, being total between the two-channel LED correction module and device under test
Two-channel LED correction module is accessed by third switch K3 with end.
According to the above technical scheme, the bus control module includes data pins lead SDA_1, clock signal lead
SCL_1, enable signal lead HWEN_1, in which:
An end of the data pins lead SDA_1 is connected to the digital signal originating port that module occurs for digital signal, separately
One end is connected to measured device；
An end of the clock signal lead SCL_1 is connected to the above-mentioned digital signal generation end that module occurs for digital signal
Mouthful, it is another to be terminated at measured device；
An end of the clock signal lead HWEN_1 is connected to the above-mentioned digital signal generation end that module occurs for digital signal
Mouthful, it is another to be terminated at measured device.
According to the above technical scheme, the bus control module further includes pull-up resistor S1_R2, the data pins lead
SDA_1 passes through pull-up resistor S1_R2 simultaneously and is connected to 5V regulated power supply.
According to the above technical scheme, the pull-up resistor S1_R2 is 100 ohm.
According to the above technical scheme, the inductance boost module includes relay K10, in which:
4 feet of the relay K10 are connected to the output port of power channel module；
3 feet of the relay K10 are connected to device under test by inductance L2；
Above-mentioned device under test is grounded by capacitor C7.
According to the above technical scheme, the inductance L2 is 10 microhenrys.
According to the above technical scheme, the capacitor C7 is 7 microfarads.
According to the above technical scheme, the two-channel LED correction module includes relay K11, relay K12, relay
K13 and relay K14 and photodiode LED1 and photodiode LED2, in which:
3 feet of the relay K11 are grounded by resistance R9, and 3 feet of the relay K12 are grounded by resistance R10, institute
3 feet for stating relay K13 are grounded by resistance R11, and 3 feet of the relay K14 are grounded by resistance R12；
4 feet of the relay K11 and 4 feet of relay K12 are connected to the cathode and voltage of photodiode LED1 simultaneously
The output port of current acquisition module, 4 feet of the relay K13 and 4 feet of relay K14 are connected to photodiode simultaneously
The output port of the cathode of LED2 and above-mentioned voltage and current acquisition module；
The anode of the photodiode LED1 and the anode of photodiode LED2 are connected to device under test respectively.
According to the above technical scheme, the resistance R9 is 1 ohm, and the resistance R10 is 3.33 ohm, the resistance R11
It is 1 ohm, the resistance R12 is 10 ohm.
Mobile phone LED disclosed by the utility model drives test probe card, the beneficial effect is that, it is based on the existing survey of testing factory
Test-run a machine power supply instrument and signal generation and analysis meter, and high-precision mobile phone LED driving test module is added, complete mobile phone
LED drive chip Multi-station parallel test improves test degree of parallelism, saves the testing time, reduces testing cost.
Detailed description of the invention
Fig. 1 is the schematic diagram of existing mobile phone LED driving chip traditional test scheme.
Fig. 2 is the integrated testability scheme schematic diagram of the mobile phone LED driving chip of the preferred embodiment in the utility model.
Fig. 3 is the structural schematic diagram of the high-precision mobile phone LED driving test module of the preferred embodiment in the utility model.
Fig. 4 is the electrical block diagram of the bus control module of Fig. 3.
Fig. 5 is the electrical block diagram of the inductance boost module of Fig. 3.
Fig. 6 is the electrical block diagram of the two-channel LED correction module of Fig. 3.
Specific embodiment
The utility model discloses a kind of mobile phone LEDs to drive test probe card, practical to this below with reference to preferred embodiment
Novel specific embodiment is further described.
Referring to Fig. 2 to Fig. 6 of attached drawing, Fig. 2 shows the integrated testability scheme of mobile phone LED driving test probe card,
Fig. 3 shows the modular structure of the mobile phone LED driving test module of the mobile phone LED driving test probe card, and Fig. 4 shows institute
The circuit structure of the bus control module of the mobile phone LED driving test module of mobile phone LED driving test probe card is stated, Fig. 5 is shown
The circuit structure of the inductance boost module of the mobile phone LED driving test module of the mobile phone LED driving test probe card, Fig. 6
Show the circuit of the two-channel LED correction module of the mobile phone LED driving test module of the mobile phone LED driving test probe card
Structure.
Preferably, mobile phone LED driving test probe card is used to obtain and shared existing from tester table is set
Standby input information, the existing equipment of above-mentioned tester table includes power channel module, module occurs for digital signal and electric current is electric
Acquisition module is pressed, the mobile phone LED driving test probe card includes and device under test (for example, mobile phone LED driving chip, similarly hereinafter)
The probe of docking and at least one mobile phone LED drive test module, and each mobile phone LED driving test module is directly mounted at interface
Circuit board (pcb board), each mobile phone LED driving test module are connected with probe simultaneously, and the mobile phone LED drives test module packet
It includes:
First switch K1, the first switch K1 are between conducting or power cutoff channel module and device under test
Access；
Bus control module, module occurs with digital signal simultaneously for the bus control module and device under test is connected；
Second switch K2, the second switch K2 for be connected or turn off voltage and current acquisition module and device under test it
Between access；
Third switch K3 and two-channel LED calibration module, being total between the two-channel LED correction module and device under test
Two-channel LED correction module is accessed by third switch K3 with end.
Further, the bus control module includes data pins lead SDA_1, clock signal lead SCL_1, enables
Signal lead HWEN_1, in which:
An end of the data pins lead SDA_1 is connected to the digital signal originating port that module occurs for digital signal, separately
One end is connected to measured device；
An end of the clock signal lead SCL_1 is connected to the above-mentioned digital signal generation end that module occurs for digital signal
Mouthful, it is another to be terminated at measured device；
An end of the clock signal lead HWEN_1 is connected to the above-mentioned digital signal generation end that module occurs for digital signal
Mouthful, it is another to be terminated at measured device.
Wherein, the bus control module further includes pull-up resistor S1_R2, and the data pins lead SDA_1 leads to simultaneously
It crosses pull-up resistor S1_R2 and is connected to 5V regulated power supply.
Wherein, the pull-up resistor S1_R2 is preferably 100 ohm.
Wherein, occur referring to the digital signal that module occurs for the digital signal that Fig. 4 of attached drawing, left side ATE are tester table
Port, right side DUT are chip under test.Resistance S1_R2 is pull-up resistor, for carrying out upper pulling process to data pins SDA.SCL
It is inputted for the signal always of bus, HWEN access is the enable signal of chip.By this bus module, we can be to chip
Carry out the read-write of register and the burning of calibration data.
Further, the inductance boost module includes relay K10, in which:
4 feet of the relay K10 are connected to the output port of power channel module；
3 feet of the relay K10 are connected to device under test by inductance L2；
Above-mentioned device under test is grounded by capacitor C7.
Wherein, the inductance L2 is preferably 10 microhenrys.
Wherein, the capacitor C7 is preferably 7 microfarads.
Wherein, L2 is the inductance of 10 microhenrys in circuit, and C7 is the capacitor of 1 microfarad.Chip is opened by internal
Powered-down road can make power storage inside inductance, the use of the electric current of inductance is then that capacitor carries out continuing charging, drives for chip
Dynamic external LED provides energy.
Further, the two-channel LED correction module includes relay K11, relay K12, relay K13 and relay
Device K14 and photodiode LED1 and photodiode LED2, in which:
3 feet of the relay K11 are grounded by resistance R9, and 3 feet of the relay K12 are grounded by resistance R10, institute
3 feet for stating relay K13 are grounded by resistance R11, and 3 feet of the relay K14 are grounded by resistance R12；
4 feet of the relay K11 and 4 feet of relay K12 are connected to the cathode and voltage of photodiode LED1 simultaneously
The output port of current acquisition module, 4 feet of the relay K13 and 4 feet of relay K14 are connected to photodiode simultaneously
The output port of the cathode of LED2 and above-mentioned voltage and current acquisition module；
The anode of the photodiode LED1 and the anode of photodiode LED2 are connected to device under test respectively.
Wherein, the resistance R9 is preferably 1 ohm, and the resistance R10 is preferably 3.33 ohm, and the resistance R11 is preferred
It is 1 ohm, the resistance R12 is preferably 10 ohm.
Wherein, simulate double flashing light application model popular on mobile phone at present using a pair of of LED, and with resistance R9,
Resistance R10, resistance R11, resistance R12 match to carry out different end resistances, so as to carry out accurate electric current to chip
Calibration.
Further, the mobile phone LED driving test probe card is also visually actually needed is arranged multiple mobile phone LEDs drives parallel
Dynamic test module, to substantially reduce the testing time, reduces testing cost to realize Multi-station parallel test.
According to above preferred embodiment, mobile phone LED disclosed in the utility model patent application drives test probe card, is based on
The existing test electromechanical source instrument of testing factory and signal generation and analysis meter, and high-precision mobile phone LED driving test mould is added
Block completes mobile phone LED driving chip Multi-station parallel test, improves test degree of parallelism, save the testing time, reduce survey
Try cost.
It is noted that mobile phone LED disclosed in the utility model patent application drives test probe card, its advantages
It is summarized as follows.
1. a kind of novel mobile phone LED drive chip testing scheme can be used for mobile phone LED driving chip wafer scale and survey eventually
In；
2. replacing introducing new equipment using existing equipment, purchase and maintenance cost are reduced；
3. improving test degree of parallelism and flexibility by way of onboard test module, testing cost is reduced.
For a person skilled in the art, technical solution documented by foregoing embodiments can still be repaired
Change or equivalent replacement of some of the technical features, it is within the spirit and principle of the utility model, made any
Modification, equivalent replacement, improvement etc., should be included in the protection scope of the utility model.
Claims (6)
1. a kind of mobile phone LED drives test probe card, for obtaining and sharing the input of the existing equipment from tester table
Information, the existing equipment of above-mentioned tester table includes power channel module, module occurs for digital signal and Current Voltage acquires mould
Block, which is characterized in that the mobile phone LED driving test probe card includes the probe docked with device under test and at least one mobile phone
LED drives test module, and each mobile phone LED driving test module is directly mounted at interface card, and each mobile phone LED driving is surveyed
Die trial block is connected with probe simultaneously, and the mobile phone LED driving test module includes:
First switch K1, the first switch K1 be used to be connected or power cutoff channel module and device under test between lead to
Road；
Bus control module, module occurs with digital signal simultaneously for the bus control module and device under test is connected；
Second switch K2, the second switch K2 are for being connected or turning off between voltage and current acquisition module and device under test
Access；
Third switch K3 and two-channel LED calibration module, the common end between the two-channel LED correction module and device under test
Two-channel LED correction module is accessed by third switch K3.
2. mobile phone LED according to claim 1 drives test probe card, which is characterized in that the bus control module packet
Include data pins lead SDA_1, clock signal lead SCL_1, enable signal lead HWEN_1, in which:
An end of the data pins lead SDA_1 is connected to the digital signal originating port that module occurs for digital signal, the other end
It is connected to measured device；
An end of the clock signal lead SCL_1 is connected to the above-mentioned digital signal originating port that module occurs for digital signal, separately
One end is connected to measured device；
An end of the clock signal lead HWEN_1 is connected to the above-mentioned digital signal originating port that module occurs for digital signal, separately
One end is connected to measured device.
3. mobile phone LED according to claim 2 drives test probe card, which is characterized in that the bus control module is also
Including pull-up resistor S1_R2, pass through pull-up resistor S1_R2 is connected to 5V regulated power supply to the data pins lead SDA_1 simultaneously.
4. mobile phone LED according to claim 3 drives test probe card, which is characterized in that the pull-up resistor S1_R2 is
100 ohm.
5. mobile phone LED according to claim 1 drives test probe card, which is characterized in that the two-channel LED straightening die
Block includes relay K11, relay K12, relay K13 and relay K14 and photodiode LED1 and photodiode
LED2, in which:
3 feet of the relay K11 are grounded by resistance R9, and 3 feet of the relay K12 are grounded by resistance R10, it is described after
3 feet of electric appliance K13 are grounded by resistance R11, and 3 feet of the relay K14 are grounded by resistance R12；
4 feet of the relay K11 and 4 feet of relay K12 are connected to the cathode and voltage and current of photodiode LED1 simultaneously
The output port of acquisition module, 4 feet of the relay K13 and 4 feet of relay K14 are connected to photodiode LED2's simultaneously
The output port of cathode and above-mentioned voltage and current acquisition module；
The anode of the photodiode LED1 and the anode of photodiode LED2 are connected to device under test respectively.
6. mobile phone LED according to claim 5 drives test probe card, which is characterized in that the resistance R9 is 1 ohm,
The resistance R10 is 3.33 ohm, and the resistance R11 is 1 ohm, and the resistance R12 is 10 ohm.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201821769123.1U CN209117739U (en) | 2018-10-30 | 2018-10-30 | Mobile phone LED drives test probe card |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201821769123.1U CN209117739U (en) | 2018-10-30 | 2018-10-30 | Mobile phone LED drives test probe card |
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| Publication Number | Publication Date |
|---|---|
| CN209117739U true CN209117739U (en) | 2019-07-16 |
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ID=67202907
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| CN201821769123.1U Active CN209117739U (en) | 2018-10-30 | 2018-10-30 | Mobile phone LED drives test probe card |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2021169317A1 (en) * | 2020-02-24 | 2021-09-02 | 上海御渡半导体科技有限公司 | Chip shared resource serial test device and method |
| CN114256730A (en) * | 2020-09-24 | 2022-03-29 | 华为技术有限公司 | Chip testing device |
| CN115656770A (en) * | 2022-10-19 | 2023-01-31 | 杭州国磊半导体设备有限公司 | Method and device for testing power driving chip, computer equipment and storage medium |
-
2018
- 2018-10-30 CN CN201821769123.1U patent/CN209117739U/en active Active
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2021169317A1 (en) * | 2020-02-24 | 2021-09-02 | 上海御渡半导体科技有限公司 | Chip shared resource serial test device and method |
| CN114256730A (en) * | 2020-09-24 | 2022-03-29 | 华为技术有限公司 | Chip testing device |
| CN114256730B (en) * | 2020-09-24 | 2024-03-26 | 华为技术有限公司 | Chip testing device |
| CN115656770A (en) * | 2022-10-19 | 2023-01-31 | 杭州国磊半导体设备有限公司 | Method and device for testing power driving chip, computer equipment and storage medium |
| CN115656770B (en) * | 2022-10-19 | 2023-09-01 | 杭州国磊半导体设备有限公司 | Power supply driving chip testing method and device, computer equipment and storage medium |
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