CN205748876U - A kind of integrating sphere measurement device for LM-80 - Google Patents
A kind of integrating sphere measurement device for LM-80 Download PDFInfo
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- CN205748876U CN205748876U CN201620416739.5U CN201620416739U CN205748876U CN 205748876 U CN205748876 U CN 205748876U CN 201620416739 U CN201620416739 U CN 201620416739U CN 205748876 U CN205748876 U CN 205748876U
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Abstract
The utility model discloses a kind of integrating sphere measurement device for LM 80, including: for the integrating sphere forming uniform illumination, be removably attached on described integrating sphere ball wall test substrate, be fixed on test substrate towards first switch and power supply in sequential series with described test substrate with the described spectrogrph spectrogrph that electrically connect of probe of the multiple LED test specimens in integrating sphere centre of sphere one side, the spectrogrph probe that is fixed on the opposite side ball wall relative with LED test specimen.Multiple LED test specimens are welded on test substrate by the integrating sphere measurement device that the utility model proposes, after aging under same temperature completes, test substrate imposite is inserted in integrating sphere, once load and multiple LED test specimen can be installed simultaneously, avoid one LED test specimen of test in prior art and be accomplished by opening the problem of an integrating sphere LED test specimen of installation, improve the efficiency of LED test specimen test.
Description
Technical field
This utility model relate to LED aging and aging after technical field of measurement and test, particularly relate to a kind of integrating sphere measurement device for LM-80.
Background technology
Led lamp, because having environmental protection, the energy-conservation and advantage of life-span length, obtains rapid promotion and application in each field, has progressively replacement traditional lighting to become the trend of principal light source.Led lamp (such as carries out LM80 standard authentication) when certification to carry out strict light decay and life test.nullLM-80 standard authentication is the identification measured about LED light source lumen maintenance rate，Altogether to carry out the aging of 3 temperature and test，Ageing process is generally carried out in ageing oven，Test process is generally carried out in integrating sphere，Each temperature is it is necessary to have 20-30 lamp bead，And the process tested needs to take out lamp bead from ageing oven and puts into integrating sphere one by one and test，Efficiency is the lowest，In addition to initial value must test 1 time，Within every 1000 hours, it is required to take out test from aging equipment，Total testing time is 6000 hours，Therefore in the case of not dead lamp，The total amount at least needing test is: 3(temperature) * 20 (lamp bead) * 7 times=420 times，This is a hard work，So needing in the industry a kind of integrating sphere measurement device that can efficiently test LED lamp bead light decay and life-span of exploitation badly.
Utility model content
The purpose of this utility model is to provide a kind of integrating sphere measurement device for LM-80, needs to carry out testing by LED test specimen loading integrating sphere one by one and the problem of inefficiency that causes solving integrating sphere measurement device in prior art.
The purpose of this utility model is realized in, a kind of integrating sphere measurement device for LM-80 is provided, including: for the integrating sphere forming uniform illumination, be removably attached on described integrating sphere ball wall test substrate, be fixed on test substrate and switch and power supply with the described spectrogrph spectrogrph that electrically connect of probe and in sequential series with described test substrate first towards the multiple LED test specimens in integrating sphere centre of sphere one side, the spectrogrph probe that is fixed on the opposite side ball wall relative with LED test specimen.
Further, the side that described test substrate deviates from the integrating sphere centre of sphere is provided with a refrigeration module, and described refrigeration module is sequentially connected with second switch and power supply.
Further, described first switch is one group of switch identical with LED test specimen quantity, one LED test specimen of an on-off control.
Further, described first switch is programmable logic controller (PLC).
Further, described test substrate is provided with at least equal with LED test specimen quantity multiple welding positions, each welding position includes that a positive terminal and a negative pole end, the positive pole of LED test specimen weld with the positive terminal of test substrate, and the negative pole of LED test specimen welds with the negative pole end of test substrate.
Further, described test substrate is aluminium base.
Further, described refrigeration module is semiconductor chilling plate.
Multiple LED test specimens are integrated by the integrating sphere measurement device for LM-80 that the utility model proposes, all it is welded on test substrate, after aging under same temperature completes, test substrate imposite is inserted in integrating sphere, by once loading test substrate, multiple LED test specimen can be installed simultaneously, now open the first switch, light LED test specimen one by one, the luminous flux of LED test specimen can be tested, this utility model avoids tests the problem that a LED test specimen is accomplished by opening an integrating sphere LED test specimen of installation in prior art, directly multiple LED test specimens are welded on test substrate, greatly facilitate the aging of LED test specimen and test, improve the efficiency of test LED test specimen luminous flux.Additionally, the side that this utility model deviates from the centre of sphere at test substrate is provided with a refrigeration module, LED test specimen and test substrate can be maintained the temperature of setting by refrigeration module, it is ensured that the lumen maintenance rate of the LED test specimen measured is more accurate.
Accompanying drawing explanation
Fig. 1 is the structural representation of this utility model one embodiment；
Fig. 2 is the wiring diagram of test substrate.
Detailed description of the invention
With specific embodiment, this utility model is further illustrated below in conjunction with the accompanying drawings.
As shown in Figure 1, the integrating sphere measurement device for LM-80 that this utility model one embodiment proposes includes: integrating sphere 1, spectrogrph 2, test substrate 3 and refrigeration module 4, test substrate 3 is detachably secured on integrating sphere ball wall, test substrate 3 fixes multiple LED test specimen 5 towards the side of the centre of sphere, and the probe 6 of spectrogrph 2 is arranged on the center of the opposite side ball wall relative with LED test specimen, is provided with and controls the first switch 8 that LED test specimen is opened and closed between test substrate and power supply 7.Refrigeration module 4 is arranged on test substrate 3 and deviates from the side of the centre of sphere, and refrigeration module is sequentially connected with second switch 9 and power supply.The step of concrete test LED test specimen luminous flux is: opening integration goal 10, the test substrate having welded LED test specimen is loaded integrating sphere, presses the first switch, LED test specimen is lighted one by one, and the luminous flux of LED test specimen is tested by spectrogrph.Press second switch, refrigeration module is started working, temperature is automatically maintained at the temperature of setting, and in the present embodiment, refrigeration module is semiconductor chilling plate, and the heat produced because of LED test specimen luminescence inside integrating sphere is transferred to outside integrating sphere in integrating sphere by semiconductor chilling plate along fin 11.The effect of integrating sphere is the light uniformization sent by LED test specimen so that ball inner surface light everywhere is consistent, so, and the brightness value on units of measurement area, is multiplied by internal surface area, just obtains the luminous flux of light source.
In conjunction with Fig. 2, operation principle of the present utility model is illustrated.Testing substrate in the present embodiment is aluminium base, and LED test specimen is LED lamp bead.At a temperature of LM80 standard-required three test, being still to 20 aging lamp bead after 6000 hours, therefore, during beginning, the LED lamp bead of each aging at temperature should be 25-30, to prevent from occurring dead lamp in ageing process.First, this 25-30 LED lamp bead weld is connected on the aluminium base that test uses, imposite LED lamp bead is placed in aging equipment aging, the when of being aged to 1000 hours, from aging equipment, imposite takes out, and install in integrating sphere of the present utility model, opening the first switch, spectrogrph starts to test the luminous flux of LED lamp bead.Having 30 welding positions in the present embodiment on aluminium base, numbered No. 01-30 respectively, each welding position includes that a positive terminal and a negative pole end, the positive pole of LED lamp bead weld with the positive terminal of test substrate, and the negative pole of LED lamp bead welds with the negative pole end of test substrate.+ 1 ,+2 ,+3 ,+4 ... represent LED lamp bead 1 respectively, 2,3,4 ... positive pole,-1 ,-2 ,-3,-4 ... represent LED lamp bead 1,2,3 respectively, 4 ... negative pole, in the present embodiment first switch by 30 respectively control 01-30 welding position switches form, when pressing the switch of a certain sequence number, the welding position of corresponding sequence number and power on, the LED lamp bead in corresponding welding position is lighted, and proceeds by test.After the LED lamp bead of this sequence number is completed, it is not necessary to opening integrating sphere and change LED lamp bead, close the switch of this welding position, the switch opening next sequence number i.e. can proceed with test.Additionally, the order of LED lamp bead test can be carried out according to the order that 1,2,3,4 sequence numbers are incremented by, it is also possible to carry out according to certain rule, as first according to 1,3,5 ... be incremented by odd number order and carry out；30,28,26 ... the even column that successively decreases is carried out；Or unordered carry out etc., but when basic requirement is test, have and only the LED lamp bead in a welding position in luminescence.First switch can also be PLC(programmable logic controller (PLC)), set quantity and the lighting time of each LED lamp bead of LED lamp bead in advance, after starting PLC, LED lamp bead test enters automatic mode, all LED lamp bead are lighted one by one, if needing circulation to light, PLC are set to loop start.
When pressing second switch, the refrigeration module that aluminium base rear is arranged is started working, and the temperature of aluminium base and LED lamp bead can maintain the temperature of setting, it is ensured that test result accurate.
The luminous flux often testing a LED lamp bead in the past under same temperature will open an integrating sphere, pull down the LED lamp bead surveyed, another LED lamp bead in changing-over, the LED lamp bead of at least 20, (total time of test is 6000 hours in detection with 7 times, within every 1000 hours, surveying once, original state is surveyed once, 7 times altogether), add up to the handling no less than 140 times, loaded down with trivial details work will be brought, it is also possible to bring pollution to LED lamp bead, affect luminous flux.Use this patent by the handling of only 7 times, be greatly saved the time, reduce labor intensity and the pollution to LED lamp bead, reflect the change of LED test specimen luminous flux truly.
Know-why of the present utility model is described above in association with specific embodiment.These descriptions are intended merely to explain principle of the present utility model, and can not be construed to the restriction to this utility model protection domain by any way.Based on explanation herein, those skilled in the art need not pay performing creative labour can associate other detailed description of the invention of the present utility model, within these modes fall within protection domain of the present utility model.
Claims (7)
1. the integrating sphere measurement device for LM-80, it is characterized in that, including: for the integrating sphere (1) forming uniform illumination, the test substrate (3) being removably attached on described integrating sphere (1) ball wall, it is fixed on spectrogrph (2) and the in sequential series with described test substrate first switch (8) and power supply (7) that test substrate (3) electrically connects towards the multiple LED test specimens (5) in integrating sphere centre of sphere one side, spectrogrph probe (6) and described spectrogrph probe (6) that is fixed on the opposite side ball wall relative with LED test specimen.
2. as claimed in claim 1 for the integrating sphere measurement device of LM-80, it is characterised in that the side that described test substrate deviates from the integrating sphere centre of sphere is provided with a refrigeration module (4), and described refrigeration module is sequentially connected with second switch and power supply.
3. as claimed in claim 1 or 2 for the integrating sphere measurement device of LM-80, it is characterised in that described first switch is one group of switch identical with LED test specimen quantity, one LED test specimen of an on-off control.
4. as claimed in claim 1 or 2 for the integrating sphere measurement device of LM-80, it is characterised in that described first switch is programmable logic controller (PLC).
5. as claimed in claim 1 for the integrating sphere measurement device of LM-80, it is characterized in that, described test substrate is provided with at least equal with LED test specimen quantity multiple welding positions, each welding position includes a positive terminal and a negative pole end, the positive pole of LED test specimen welds with the positive terminal of test substrate, and the negative pole of LED test specimen welds with the negative pole end of test substrate.
6. as claimed in claim 1 for the integrating sphere measurement device of LM-80, it is characterised in that described test substrate is aluminium base.
7. as claimed in claim 2 for the integrating sphere measurement device of LM-80, it is characterised in that described refrigeration module is semiconductor chilling plate.
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| CN201620416739.5U CN205748876U (en) | 2016-05-10 | 2016-05-10 | A kind of integrating sphere measurement device for LM-80 |
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| CN201620416739.5U CN205748876U (en) | 2016-05-10 | 2016-05-10 | A kind of integrating sphere measurement device for LM-80 |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114441148A (en) * | 2022-04-02 | 2022-05-06 | 常州市润达照明电器有限公司 | Courtyard lamp illumination detection feedback marking device and method |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114441148A (en) * | 2022-04-02 | 2022-05-06 | 常州市润达照明电器有限公司 | Courtyard lamp illumination detection feedback marking device and method |
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