CN205539243U - Atomic clock performance evaluation device - Google Patents

Abstract

The utility model discloses an atomic clock performance evaluation device belongs to the atomic clock field. The device includes: long -term stability aassessment module, short -term stability aassessment module and comprehensive assessment module, long -term stability aassessment module includes: the high accuracy frequency source, to the output signal of high accuracy frequency source carry on the square wave plastic first square wave circuit, to the output signal of atomic clock carry on the square wave plastic second square wave circuit, to the output of first square wave circuit and second square wave circuit carry on the phase comparison phase comparison curcuit, a processing unit of the long -term stability of atomic clock is calculated according to phase comparison curcuit's output, short -term stability aassessment module includes: the light that produces to the physical system of atomic clock output modulating signal's modulating signal source, according to physical system examine the signal obtain the frequently curved mirror of mirror frequently the unit, according to mirror the 2nd processing unit of the short -term stability of curve compute atomic clock frequently.

Description

A kind of atomic clock capability evaluating device

Technical field

The utility model relates to atomic clock field, particularly to a kind of atomic clock capability evaluating device.

Background technology

Passive-type atomic clock mainly includes VCXO, electronic circuit and quantized system three parts；Wherein, The signal of VCXO output produces microwave interrogation signals through the process of electronic circuit, and this microwave interrogation signals is made After quantized system, produce quantum frequency discrimination signal；Electronic circuit is by this quantum frequency discrimination signal and reference signal Carry out synchronizing phase demodulation, produce correction voltage and act on VCXO, thus change the output of VCXO, enter And VCXO output is locked in atomic ground state hyperfine 0-0 centre frequency.

And along with the development of atomic clock technology, how to detect long-term stability and the short-term of atomic clock output frequency Stability, and show intuitively, become the major issue of atomic clock technical research.

Utility model content

In order to solve problem of the prior art, the utility model embodiment provides a kind of atomic clock Performance Evaluation Device.Described technical scheme is as follows:

The utility model embodiment provides a kind of atomic clock capability evaluating device, and described device includes: long-term Stability evaluation module, short-term stability evaluation module and comprehensive assessment module；

Described long-term stability evaluation module includes:

High-precision frequency source, output signal to described high-precision frequency source carry out the first square wave of square wave shaping Circuit, output signal to atomic clock carry out the second party wave circuit of square wave shaping, to described first square wave electricity The output of road and described second party wave circuit carries out the phase-comparison circuit of phase bit comparison, according to described phase place ratio The output of relatively circuit calculates the first processing unit of the long-term stability of described atomic clock, described first square wave electricity Road electrically connects with described high-precision frequency source and described phase-comparison circuit respectively, and described phase-comparison circuit is also Electrically connecting with described second party wave circuit and described first processing unit, described second party wave circuit is also with described The output electrical connection of atomic clock；

Described short-term stability evaluation module includes:

The modulating signal source of modulated signal is exported, according to described physical system to the physical system of described atomic clock The light inspection signal produced obtains the frequency discrimination unit of frequency discrimination curve, calculates described atomic clock according to described frequency discrimination curve The second processing unit of short-term stability, described modulating signal source respectively with the physical system of described atomic clock And the electrical connection of described frequency discrimination unit, described second processing unit electrically connects with described frequency discrimination unit；

Described comprehensive assessment module electrically connects with described first processing unit and described second processing unit respectively.

In a kind of implementation of the utility model embodiment, described comprehensive assessment module includes:

The memory cell of the corresponding relation of storage long-term stability and short-term stability and Performance Score, with described Memory cell, described first processing unit and the computing unit of described second processing unit electrical connection.

In the another kind of implementation of the utility model embodiment, described comprehensive assessment module also includes: aobvious Show that unit, described display unit electrically connect with described computing unit.

In the another kind of implementation of the utility model embodiment, described display unit is display.

In the another kind of implementation of the utility model embodiment, described first processing unit, including:

The output of described phase-comparison circuit is converted to voltage signal integrating circuit, analog to digital conversion circuit and place Reason circuit, described integrating circuit electrically connects with described phase-comparison circuit and analog-digital conversion circuit as described respectively, Described process circuit electrically connects with analog-digital conversion circuit as described and described comprehensive assessment module respectively.

In the another kind of implementation of the utility model embodiment, described first processing unit is computer.

In the another kind of implementation of the utility model embodiment, described second processing unit is computer.

The technical scheme that the utility model embodiment provides has the benefit that

The utility model embodiment is respectively by the first processing unit in long-term stability evaluation module and short-term The second processing unit in stability evaluation module, calculates long-term stability and short-term stability, then basis The combination property of atomic clock is estimated by long-term stability and short-term stability, thus provides visual evaluation, It is easy to technical staff's selection to atomic clock.

Accompanying drawing explanation

In order to be illustrated more clearly that the technical scheme in the utility model embodiment, embodiment will be described below The accompanying drawing used required in is briefly described, it should be apparent that, the accompanying drawing in describing below is only this Some embodiments of utility model, for those of ordinary skill in the art, are not paying creative work On the premise of, it is also possible to other accompanying drawing is obtained according to these accompanying drawings.

Fig. 1 is the structural representation of the atomic clock capability evaluating device that the utility model embodiment provides；

Fig. 2 is the frequency discrimination curve that the utility model embodiment provides；

Fig. 3 is the Absorption Line that the utility model embodiment provides.

Detailed description of the invention

For making the purpose of this utility model, technical scheme and advantage clearer, below in conjunction with accompanying drawing to this Utility model embodiment is described in further detail.

Fig. 1 is the structural representation of a kind of atomic clock capability evaluating device that the utility model embodiment provides, Seeing Fig. 1, device includes: long-term stability evaluation module 11, short-term stability evaluation module 12 and comprehensive Evaluation module 13；

Long-term stability evaluation module 11 includes:

High-precision frequency source 111, output signal to high-precision frequency source 111 carry out the first party of square wave shaping Wave circuit 112, output signal to atomic clock carry out the second party wave circuit 113 of square wave shaping, to first party The output of wave circuit 112 and second party wave circuit 113 carries out the phase-comparison circuit 114 of phase bit comparison, basis The output of phase-comparison circuit 114 calculates the first processing unit 115 of the long-term stability of atomic clock, first party Wave circuit 112 electrically connects with high-precision frequency source 111 and phase-comparison circuit 114 respectively, phase-comparison circuit 114 also electrically connect with second party wave circuit 113 and the first processing unit 115, second party wave circuit 113 also with The output electrical connection of atomic clock；

Short-term stability evaluation module 12 includes:

The modulating signal source 121 of modulated signal is exported, according to physical system generation to the physical system of atomic clock Light inspection signal obtains the frequency discrimination unit 122 of frequency discrimination curve, calculates the short-term stability of atomic clock according to frequency discrimination curve The second processing unit 123, modulating signal source 121 respectively with physical system and the frequency discrimination unit 122 of atomic clock Electrical connection, the second processing unit 123 electrically connects with frequency discrimination unit 122；

Comprehensive assessment module 13, for calculating according to the first processing unit 115 and the second processing unit 123 Long-term stability and the combination property of short-term stability output atomic clock, comprehensive assessment module 13 is respectively with the One processing unit 115 and the second processing unit 123 electrically connect.

The utility model embodiment is respectively by the first processing unit in long-term stability evaluation module and short-term The second processing unit in stability evaluation module, calculates long-term stability and short-term stability, then basis The combination property of atomic clock is estimated by long-term stability and short-term stability, thus provides visual evaluation, It is easy to technical staff's selection to atomic clock.

In a kind of possible implementation, comprehensive assessment module 13 includes:

Memory cell 131, for storing the corresponding relation of long-term stability and short-term stability and Performance Score；

Computing unit 132, for according to corresponding relation, calculates the first processing unit and the second processing unit Long-term stability and short-term stability be converted to Performance Score, and calculated performance scoring sum, to represent former The combination property of secondary clock.

Computing unit 132 is electrically connected with memory cell the 131, first processing unit 115 and the second processing unit 123 Connect.

Further, comprehensive assessment module 13 also includes:

Display unit 133, for display performance scoring sum.

Specifically, display unit 133 can be display.Display can be light emitting diode (Light Emitting Diode, be called for short LED) display, liquid crystal display (Liquid Crystal Display, letter Claim LCD) or Organic Light Emitting Diode (Organic Light-Emitting Diode, be called for short OLED) aobvious Show device.

In a kind of possible implementation, the first processing unit 115, including:

Integrating circuit, for being converted to voltage signal by the output of phase-comparison circuit；

Analog to digital conversion circuit, for sampling to voltage signal with T for the cycle, by the voltage signal of sampling Be converted to data signal, obtain multiple sampled point；

Process circuit, for taking a sampled value by sample time order every N number of point, according to sampled value meter Calculate frequency difference, calculate long-term stability according to frequency difference and Allan variance computing formula or Hadamard Variance computing formula.

Integrating circuit electrically connects with phase-comparison circuit and analog to digital conversion circuit respectively, process circuit respectively with mould Number conversion circuit and the electrical connection of comprehensive assessment module.

Wherein, the first processing unit 115 can be computer.

Wherein, T can be 10S.N can be 1000.

Below with T as 10S, N is 1000 to illustrate, and enters the specific works of the first processing unit 115 Row explanation:

As a example by 8 modulus A/D change-over circuit samplings, the number range that it can represent in data signal For 0-255, we give a calibration value (such as 122) the most before testing, and it is used for defining 0 degree of phase place Time corresponding A/D data signal value, can be easily computed accordingly corresponding-180 degree ,+180 The A/D value corresponding to phase value of degree is 61 and 186.As it has been described above, calibration value 122, acquisition time is As a example by 10S, N are 1000, then the time difference choosing sampled value for twice is 10,000 seconds, and therefore calculate is long-term Stability namely one time ten thousand seconds stabilitys.Take in sampled point the 1st, the 1001st, the 2001st ... As sampled value, the voltage value of ith sample value is Vi, is translated into phase value φ_i, concrete conversion Formula is:

360 degree of complete number of cycles that wherein N is experienced in ten thousand seconds by i-th, Vi is i-th ten thousand seconds Moment deducts the A/D numerical value (having positive and negative dividing) corresponding to the i-th-1 ten thousand second moment, φ_iIt is required i-th The total phase value experienced for individual ten thousand seconds, then ten thousand seconds frequency differences fi of i-th are:

Calculate corresponding fi value, then can be substituted into Allan variance computing formula or Hadamard Variance calculates Formula calculates long-term stability.

Wherein, Allan variance computing formula calculating long-term stability:

${\mathrm{\σ}}_y(2,\mathrm{\τ},\mathrm{\τ},f)=\sqrt{\frac{1}{2(n-1)}\underset{i=1}{\overset{N-1}{\Σ}}{\[y\left({\mathrm{\τ}}_{i+1}\right)-y\left({\mathrm{\τ}}_i\right)\]}^2}$

Wherein, y is frequency difference, and n is number of samples, and τ is the sampling time.

Wherein, Hadamard Variance computing formula calculating long-term stability:

${\mathrm{H\σ}}_y(3,\mathrm{\τ})=\sqrt{\frac{1}{6(m-2)}\underset{k=1}{\overset{m-2}{\Σ}}{(y_{k+2}-2y_{k+1}+y_k)}^2}$

Wherein, m is pendulous frequency.

In a kind of possible implementation, the second processing unit 123, it is used for:

Absorption factor, modulation depth and live width is determined according to frequency discrimination curve；

Utilize signal to noise ratio S/N theoretical calculation formula and absorption factor, modulation depth and live width, calculate system Signal to noise ratio；

The short-term stability of the signal-to-noise ratio computation atomic clock according to system.

Wherein, the second processing unit 123 can be computer.

Specifically, the appraisal procedure of short-term is: little plus one to microwave signal by modulating signal source 121 Fm role, in physical system, then carries out frequency sweep, the photocell of physical system the light inspection signal obtained send Enter in frequency discrimination unit 122, through the detection of locking phase, obtain frequency discrimination curve, as shown in Figure 2；According to The Absorption Line that frequency discrimination curve can be derived, as shown in Figure 3.

In figs. 2 and 3, there is following definition:

Absorption factor:Modulation depth: 2 ε；Live width:

According to these define, utilize signal to noise ratio S/N theoretical calculation formula calculate system signal to noise ratio:

${\left(\frac{S}{N}\right)}^2=\frac{{I_0}^2/2}{2{\mathrm{eI}}_0}=\frac{3^3{\mathrm{\α}}^2{\mathrm{\ϵ}}^2{I}_0}{2^6{\mathrm{e\Δ\ν}}^2}$

For relevant parameter α, ε, I in formula₀, e, Δ ν can be directly or by being calculated.

Short-term stability can be estimated according to signal to noise ratio S/N and equation below:

${\mathrm{\σ}}_y\left(\mathrm{\τ}\right)=\frac{0.11}{Q(S/N)}\·\frac{1}{\sqrt{\mathrm{\τ}}}$

One of ordinary skill in the art will appreciate that all or part of step realizing above-described embodiment can be passed through Hardware completes, it is also possible to instructing relevant hardware by program and complete, described program can be stored in In a kind of computer-readable recording medium, storage medium mentioned above can be read-only storage, disk or CD etc..

The foregoing is only preferred embodiment of the present utility model, not in order to limit the utility model, all Within spirit of the present utility model and principle, any modification, equivalent substitution and improvement etc. made, all should wrap Within being contained in protection domain of the present utility model.

Claims (7)

1. an atomic clock capability evaluating device, it is characterised in that described device includes: long-term stability is commented Estimate module, short-term stability evaluation module and comprehensive assessment module；

Described long-term stability evaluation module includes:

High-precision frequency source, output signal to described high-precision frequency source carry out the first square wave of square wave shaping Circuit, output signal to atomic clock carry out the second party wave circuit of square wave shaping, to described first square wave electricity The output of road and described second party wave circuit carries out the phase-comparison circuit of phase bit comparison, according to described phase place ratio The output of relatively circuit calculates the first processing unit of the long-term stability of described atomic clock, described first square wave electricity Road electrically connects with described high-precision frequency source and described phase-comparison circuit respectively, and described phase-comparison circuit is also Electrically connecting with described second party wave circuit and described first processing unit, described second party wave circuit is also with described The output electrical connection of atomic clock；

Described short-term stability evaluation module includes:

The modulating signal source of modulated signal is exported, according to described physical system to the physical system of described atomic clock The light inspection signal produced obtains the frequency discrimination unit of frequency discrimination curve, calculates described atomic clock according to described frequency discrimination curve The second processing unit of short-term stability, described modulating signal source respectively with the physical system of described atomic clock And the electrical connection of described frequency discrimination unit, described second processing unit electrically connects with described frequency discrimination unit；

Described comprehensive assessment module electrically connects with described first processing unit and described second processing unit respectively.

Device the most according to claim 1, it is characterised in that described comprehensive assessment module includes:

The memory cell of the corresponding relation of storage long-term stability and short-term stability and Performance Score, with described Memory cell, described first processing unit and the computing unit of described second processing unit electrical connection.

Device the most according to claim 2, it is characterised in that described comprehensive assessment module also includes: Display unit, described display unit electrically connects with described computing unit.

Device the most according to claim 3, it is characterised in that described display unit is display.

5. according to the device described in any one of Claims 1-4, it is characterised in that described first processes list Unit, including:

The output of described phase-comparison circuit is converted to voltage signal integrating circuit, analog to digital conversion circuit and place Reason circuit, described integrating circuit electrically connects with described phase-comparison circuit and analog-digital conversion circuit as described respectively, Described process circuit electrically connects with analog-digital conversion circuit as described and described comprehensive assessment module respectively.

Device the most according to claim 5, it is characterised in that described first processing unit is computer.

7. according to the device described in any one of Claims 1-4, it is characterised in that described second processes list Unit is computer.