CN102147435B - Method for measuring line width and frequency discrimination slope of physical system of Rubidium atom frequency scale - Google Patents
Method for measuring line width and frequency discrimination slope of physical system of Rubidium atom frequency scale Download PDFInfo
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- CN102147435B CN102147435B CN 201110044365 CN201110044365A CN102147435B CN 102147435 B CN102147435 B CN 102147435B CN 201110044365 CN201110044365 CN 201110044365 CN 201110044365 A CN201110044365 A CN 201110044365A CN 102147435 B CN102147435 B CN 102147435B
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Abstract
The invention discloses a method for measuring the line width and the frequency discrimination slope of the physical system of a Rubidium atom frequency scale, comprising the following steps: (1) causing a microwave polling signal to act on a physical system; (2) collecting and storing voltage values obtained after photoelectric detection signals output by a physical system are subjected to synchronous phase detection and microwave polling signal frequency values in one-to-one correspondence with the voltage values; (3) calculating the maximum value, the minimum value and the central value of the voltage values, and inquiring the frequency values in one-to-one correspondence with the maximum value, the minimum value and the central value of the voltage values, of the microwave polling signal; and (4) according to the frequency values in one-to-one correspondence with the maximum value and the minimum value of the voltage values, of the microwave polling signal, calculating the line width of the physical system; taking the central value of the voltage values as an original point; and according to the voltage values and the frequency values in one-to-one correspondence with the voltage values, of the microwave polling signal, carrying out curve fitting to obtain the frequency discrimination slope of the physical system. The method disclosed by the invention can conveniently, quickly and accurately measure the line width and the frequency discrimination slope of the physical system.
Description
Technical field
The present invention relates to the inactive type rubidium atom frequency scale field, relate in particular to a kind of live width of the physical system of measuring Rb atom frequency marking and the method for frequency discrimination slope.
Background technology
Atomic frequency standard is a kind of frequency source with good stable degree and accuracy, be widely used in location, the navigation of satellite and communicate by letter, instrument and meter and the field such as astronomical.And Rb atom frequency marking becomes because it has the advantages such as volume is little, lightweight, low in energy consumption, cost is low the atomic frequency standard that is most widely used at present.
Rb atom frequency marking comprises VCXO, physical system and electronic circuit.Wherein, physical system comprises that the spectrum lamp of generation pumping light, the integrated filtering resonance bubble of storage rubidium atom, the microwave cavity of storing microwave field, generation are parallel to the photoelectric cell of the C field coil (being uniform magnetic field coil) of the static magnetic field of described microwave cavity axis, sensed light signal, microwave coupling is advanced the coupling ring of described microwave cavity and prevents the magnetic cup that static magnetic field penetrates.Electronic circuit specifically comprises radio frequency times frequency module and comprehensive servo module.Comprehensive servo module comprises that the microprocessor for generation of frequency synthesis instruction, locking phase reference signal detection, the frequency synthesis instruction that is used for producing according to microprocessor produce the digital frequency synthesizer of comprehensive modulation signal and be used for carrying out according to the locking phase reference signal detection that microprocessor produces the phase sensitive detection module that locking phase detects.Radio frequency times frequency module comprises for the output frequency with VCXO and carries out the radio frequency frequency multiplication unit of frequency multiplication and be used for carrying out obtaining after SHG and THG through the output frequency of the VCXO after described radio frequency frequency multiplication unit frequency multiplication and comprehensive modulation signal that digital frequency synthesizer produces microwave times, the mixing unit of microwave interrogation signals.
During work, microwave doubly, the mixing unit acts on physical system with the microwave interrogation signals that produces, physical system is the output photoelectric detection signal under the effect of microwave interrogation signals, the phase sensitive detection module is carried out locking phase to photoelectric detecting signal and is detected the generation voltage signal, microprocessor carries out voltage signal to act on VCXO after D/A turns, circulation successively, until the locking of Rb atom frequency marking complete machine, namely the microwave interrogation signals is just in time aimed at the centre frequency of Rb atom frequency marking.
After the physical system moulding, next step will verify by tests such as parameter optimizations the performance of Rb atom frequency marking complete machine.Wherein, the live width of physical system can be selects the depth of modulation of modulation signal that reference is provided, the frequency discrimination slope of physical system can be in electronic circuit servo loop and selects gain amplifier that reference is provided, thereby, the live width of physical system and frequency discrimination slope are references weighing the Rb atom frequency marking short-term stability, thereby become the focus of concern.
Usually, the method of traditional measurement physical system live width need to by sweep generator and registering instrument, during measurement, not exported different frequency signals and act on physical system by sweep generator in the same time, simultaneously, record the corresponding Photoelectric Detection output signal of physical system constantly by registering instrument.The live width of physical system is that the Photoelectric Detection output signal value is a peaked half, the difference of two frequencies of corresponding sweep generator.When measuring the frequency discrimination slope of physical system, need to measure by phase-locked instrument.
As from the foregoing, on the one hand, because the live width of traditional measurement physical system and frequency discrimination slope need to be by peripheral instruments, thereby make measuring process complicated; On the other hand, when measuring due to the traditional measuring method of employing, the photoelectric detecting signal of the frequency signal of sweep generator output and registering instrument record is stored respectively, and when calculating live width and frequency discrimination slope, the photoelectric detecting signal that must guarantee the frequency signal of sweep generator output and registering instrument record is relation one to one, thereby, when calculating live width and frequency discrimination slope, traditional measuring method more complicated, and easily make mistakes.
Therefore, be necessary to provide the measuring method of a kind of physical system live width and frequency discrimination slope to overcome defects.
Summary of the invention
The purpose of this invention is to provide a kind of live width of physical system and method for frequency discrimination slope measured, can be convenient, fast and measure accurately live width and the frequency discrimination slope of physical system.
To achieve these goals, the invention provides a kind of live width of the physical system of measuring Rb atom frequency marking and the method for frequency discrimination slope, comprising: (1) acts on the microwave interrogation signals physical system of Rb atom frequency marking; (2) gather and store photoelectric detecting signal to the output of described physical system adopt phase-sensitive detector (PSD) carry out locking phase detect after output magnitude of voltage and with described magnitude of voltage microwave interrogation signals frequency values one to one; (3) maximal value, minimum value and the central value of the described magnitude of voltage of calculating, and the maximal value of inquiry and described magnitude of voltage, minimum value and central value be described microwave interrogation signals frequency values one to one; (4) calculate and the maximal value of described magnitude of voltage and the minimum value difference of two described microwave interrogation signals frequency values one to one, calculated difference
Doubly obtain the live width of described physical system, and take the central value of described magnitude of voltage as initial point and according to described magnitude of voltage and with described magnitude of voltage one to one described microwave interrogation signals frequency values adopt least square method to carry out curve fitting, obtain the frequency discrimination slope of described physical system according to the slope of matched curve.
compared with prior art, the present invention be by directly utilize existing electronic circuit and VCXO in the Rb atom frequency marking system measure photoelectric detecting signal to physical system output carry out locking phase detect after output magnitude of voltage and with described magnitude of voltage microwave interrogation signals frequency values one to one, and come live width and the frequency discrimination slope of computational physics system according to the magnitude of voltage that records and microwave interrogation signals frequency values, thereby, the present invention measures the live width of physical system and the method for frequency discrimination slope can facilitate, fast and accurately measure live width and the frequency discrimination slope of physical system.
By following description also by reference to the accompanying drawings, it is more clear that the present invention will become, and these accompanying drawings are used for explaining embodiments of the invention.
Description of drawings
Fig. 1 is for adopting the present invention to measure the structural representation of Rb atom frequency marking of the method for the live width of physical system of Rb atom frequency marking and frequency discrimination slope.
Fig. 2 is the main flow chart of the method for the live width of the present invention's physical system of measuring Rb atom frequency marking and frequency discrimination slope.
The frequency discrimination S curve synoptic diagram that obtains after the step S2 of Fig. 3 for the method for the live width of physical system of measuring Rb atom frequency marking through the present invention and frequency discrimination slope.
Embodiment
With reference now to accompanying drawing, describe embodiments of the invention, in accompanying drawing, similar element numbers represents similar element.
As shown in Figure 1, the Rb atom frequency marking that adopts the present invention to measure the method for the live width of physical system of Rb atom frequency marking and frequency discrimination slope comprises: VCXO 10, isolated amplifier 11, radio frequency frequency multiplication unit 12, microwave doubly, mixing unit 13, physical system 14, phase-sensitive detector (PSD) 15, microprocessor 16, digital frequency synthesizer 17 and D/A converter 18.Wherein, isolated amplifier 11, radio frequency frequency multiplication unit 12, microwave are doubly, mixing unit 13, phase-sensitive detector (PSD) 15, microprocessor 16, digital frequency synthesizer 17 and D/A converter 18 consist of electronic circuits.During work, the output frequency of described VCXO 10 first sends to described radio frequency frequency multiplication unit 12 to carry out frequency multiplication through the isolation of described isolated amplifier 11 with after amplifying.Simultaneously, described microprocessor 16 transmission frequency synthetic instructions produce comprehensive modulation signals for described digital frequency synthesizer 17, and send the keying FM signal and make described digital frequency synthesizer 17 alternately export described comprehensive modulation signal take the frequency of described keying FM signal as the cycle.The output frequency of the described VCXO 10 of described comprehensive modulation signal and process frequency multiplication carries out producing the microwave interrogation signals after SHG and THG together.Described microwave interrogation signals produces quantum frequency discrimination signal through the frequency discrimination of described physical system 14, and enter described phase-sensitive detector (PSD) 15 and carry out phase demodulation, the voltage control signal U that synchronous phase demodulation produces carries out digital signal through described D/A converter 18 and can act on described VCXO 10 after the conversion of simulating signal, to adjust the output frequency f of described VCXO 10.
Fig. 2 is the process flow diagram of the method for the live width of the present invention's physical system of measuring Rb atom frequency marking and frequency discrimination slope.The present invention measures the live width of physical system of Rb atom frequency marking and the method for frequency discrimination slope comprises the steps:
Step S1 acts on the microwave interrogation signals physical system 14 of Rb atom frequency marking;
Step S2, gather and store photoelectric detecting signal to 14 outputs of described physical system adopt phase-sensitive detector (PSD) 15 carry out locking phase detect after output magnitude of voltage and with described magnitude of voltage microwave interrogation signals frequency values one to one;
Step S3 calculates maximal value, minimum value and the central value of described magnitude of voltage, and the maximal value of inquiry and described magnitude of voltage, minimum value and central value described microwave interrogation signals frequency values one to one;
Step S4, according to the maximal value of described magnitude of voltage and minimum value one to one two described microwave interrogation signals frequency values calculate the live width of described physical systems 14, and take the central value of described magnitude of voltage as initial point and according to described magnitude of voltage and with described magnitude of voltage one to one described microwave interrogation signals frequency values carry out curve fitting, obtain the frequency discrimination slope of described physical system 14.
As shown in Figure 3, the frequency discrimination S curve synoptic diagram that obtains after the step S2 for the method for the live width of physical system of measuring Rb atom frequency marking through the present invention and frequency discrimination slope.The absorption curve that frequency discrimination S curve and Photoelectric Detection output signal consist of is derived relation.In Fig. 3, what horizontal ordinate identified is microwave interrogation signals frequency values, and it is recording the change process of the voltage-controlled voltage U of D/A converter 18 outputs, and what ordinate identified is the magnitude of voltage that obtains through after phase-sensitive detector (PSD) 15 phase demodulations.When the live width of computational physics system 14, at first find the maximal value V of ordinate in frequency discrimination S curve
HWith minimum value V
L, and find and maximal value V
HWith minimum value V
LTwo of horizontal ordinate are worth f one to one
2And f
1, then according to formula
Can calculate the live width of physical system 14.When the frequency discrimination slope of computational physics system 14, at first find in frequency discrimination S curve on ordinate the some Ref near 0, i.e. central value, specifically by the value of ordinate in frequency discrimination S curve is done absolute value with zero respectively, the absolute value minimum be central value.After finding central value, take the position of point corresponding to this central value as initial point (0,0), respectively get 20 points to its left and right along horizontal ordinate respectively successively, then the data of these 41 points carried out curve fitting by least square method, the curvilinear equation that obtains match is y=Kx+b, and wherein the value of K is the frequency discrimination slope of physical system 14.
as mentioned above, the present invention be by directly utilize existing electronic circuit and VCXO 10 in the Rb atom frequency marking system measure photoelectric detecting signal to physical system 14 outputs carry out locking phase detect after output magnitude of voltage and with described magnitude of voltage microwave interrogation signals frequency values one to one, and come live width and the frequency discrimination slope of computational physics system 14 according to the magnitude of voltage that records and microwave interrogation signals frequency values, thereby, the present invention measures the live width of physical system 14 and the method for frequency discrimination slope can facilitate, fast and accurately measure live width and the frequency discrimination slope of physical system 14.
Above invention has been described in conjunction with most preferred embodiment, but the present invention is not limited to the embodiment of above announcement, and should contain various modification, equivalent combinations of carrying out according to essence of the present invention.
Claims (1)
1. the live width of a physical system of measuring Rb atom frequency marking and the method for frequency discrimination slope comprise:
(1) the microwave interrogation signals is acted on the physical system of Rb atom frequency marking;
(2) gather and store photoelectric detecting signal to the output of described physical system adopt phase-sensitive detector (PSD) carry out locking phase detect after output magnitude of voltage and with described magnitude of voltage microwave interrogation signals frequency values one to one;
(3) maximal value, minimum value and the central value of the described magnitude of voltage of calculating, and the maximal value of inquiry and described magnitude of voltage, minimum value and central value be described microwave interrogation signals frequency values one to one;
(4) calculate and the maximal value of described magnitude of voltage and the minimum value difference of two described microwave interrogation signals frequency values one to one, calculated difference
Doubly obtain the live width of described physical system, and take the central value of described magnitude of voltage as initial point and according to described magnitude of voltage and with described magnitude of voltage one to one described microwave interrogation signals frequency values adopt least square method to carry out curve fitting, obtain the frequency discrimination slope of described physical system according to the slope of matched curve.
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| CN 201110044365 CN102147435B (en) | 2011-02-21 | 2011-02-21 | Method for measuring line width and frequency discrimination slope of physical system of Rubidium atom frequency scale |
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| CN 201110044365 CN102147435B (en) | 2011-02-21 | 2011-02-21 | Method for measuring line width and frequency discrimination slope of physical system of Rubidium atom frequency scale |
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| CN103067000B (en) * | 2012-12-17 | 2016-02-10 | 江汉大学 | Based on the servo system models of quantized system |
| CN104539289B (en) * | 2014-11-26 | 2018-04-27 | 江汉大学 | A kind of appraisal procedure and device of atomic frequency standard frequency short-term stability |
| CN105738709A (en) * | 2016-02-01 | 2016-07-06 | 江汉大学 | Measurement system based on phase sensitive detection, photoelectric equipment, measurement method and device |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5721514A (en) * | 1995-11-22 | 1998-02-24 | Efratom Time And Frequency Products, Inc. | Digital frequency generation in atomic frequency standards using digital phase shifting |
| US6130583A (en) * | 1997-09-01 | 2000-10-10 | Accubeat Ltd | Atomic frequency standard using digital processing in its frequency lock loop |
| CN101079633A (en) * | 2007-05-17 | 2007-11-28 | 江汉大学 | Improved passive Rb atomic frequency standard servo control method and servo control circuit |
-
2011
- 2011-02-21 CN CN 201110044365 patent/CN102147435B/en not_active Expired - Fee Related
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5721514A (en) * | 1995-11-22 | 1998-02-24 | Efratom Time And Frequency Products, Inc. | Digital frequency generation in atomic frequency standards using digital phase shifting |
| US6130583A (en) * | 1997-09-01 | 2000-10-10 | Accubeat Ltd | Atomic frequency standard using digital processing in its frequency lock loop |
| CN101079633A (en) * | 2007-05-17 | 2007-11-28 | 江汉大学 | Improved passive Rb atomic frequency standard servo control method and servo control circuit |
Non-Patent Citations (2)
| Title |
|---|
| 高稳铷原子频标的参数优化及激光抽运铷原子频标研究;黄学人;《中国优秀博硕士学位论文全文数据库(博士)基础科学辑》;20061215(第12期);第25,26,40,41页 * |
| 黄学人.高稳铷原子频标的参数优化及激光抽运铷原子频标研究.《中国优秀博硕士学位论文全文数据库(博士)基础科学辑》.2006,(第12期),第25,26,40,41页. |
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